CN108037365B - Parallel reactor test board - Google Patents
Parallel reactor test board Download PDFInfo
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- CN108037365B CN108037365B CN201810052082.2A CN201810052082A CN108037365B CN 108037365 B CN108037365 B CN 108037365B CN 201810052082 A CN201810052082 A CN 201810052082A CN 108037365 B CN108037365 B CN 108037365B
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- 238000012360 testing method Methods 0.000 title claims abstract description 223
- 238000006243 chemical reaction Methods 0.000 claims abstract description 52
- 230000009471 action Effects 0.000 claims abstract description 33
- 238000002955 isolation Methods 0.000 claims description 122
- 238000009413 insulation Methods 0.000 claims description 55
- 238000004804 winding Methods 0.000 claims description 17
- 239000011810 insulating material Substances 0.000 claims description 4
- 230000003068 static effect Effects 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 17
- 230000008569 process Effects 0.000 abstract description 8
- 238000010586 diagram Methods 0.000 description 10
- 230000007935 neutral effect Effects 0.000 description 7
- 230000001629 suppression Effects 0.000 description 3
- 230000033228 biological regulation Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 238000012163 sequencing technique Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
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- 238000009434 installation Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
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- 239000000047 product Substances 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/025—Measuring very high resistances, e.g. isolation resistances, i.e. megohm-meters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
This application belongs to the check out test set field, provides a shunt reactor testboard, includes: the testing device comprises a singlechip, a relay group, a wiring conversion circuit, a wiring terminal and at least two testing devices; the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal and the testing device, and the wiring terminal is externally connected with the shunt reactor; the single chip microcomputer sends a test instruction to control the switching action of the relay group, the relay group transmits the switching action of the relay group to the wiring conversion circuit, and the wiring conversion circuit enables the wiring terminal to be in the wiring conversion circuit, and the test lead in the wiring conversion circuit is connected to the test device corresponding to the test instruction and tests. The process of testing the shunt reactor by the shunt reactor test bench does not need to replace a lead, and various electrical tests of the shunt reactor are completed quickly, safely and conveniently.
Description
Technical Field
The application belongs to the technical field of power detection equipment, and particularly relates to a paralleling reactor test bench.
Background
In the long-distance transmission process of the power grid, because the ultrahigh voltage alternating current transmission line has huge capacitive charging power, severe tidal current change and limited insulation margin, higher requirements are provided for reactive power regulation and overvoltage suppression of a power grid system; particularly, reactive power compensation devices such as a high-voltage shunt reactor and the like have important and wide popularization value for voltage suppression and reactive power regulation of a power grid.
The performance of the related parameters of the shunt reactor is directly related to the charging capacitive reactive power and voltage suppression of the power grid. However, in the existing parallel reactor, different test equipment must be selected according to different parameters, so that the test process is complicated and the efficiency is low.
Disclosure of Invention
In view of this, the embodiment of the present application provides a paralleling reactor test bench, so as to solve the problems that different test devices must be selected for different parameters in the test of related parameters of the existing paralleling reactor, the test process is complicated, and the efficiency is low.
The first aspect of the embodiment of the present application provides a shunt reactor test bench, including:
the testing device comprises a singlechip, a relay group, a wiring conversion circuit, a wiring terminal and at least two testing devices;
the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal and the testing device, and the wiring terminal is externally connected with the shunt reactor;
the single chip microcomputer sends a test instruction to control the relay group to perform switching action, the relay group transmits the switching action to the wiring conversion circuit, and the wiring conversion circuit enables the wiring terminal to be in the wiring conversion circuit, and the test lead in the wiring conversion circuit is connected to the test device corresponding to the test instruction and is tested.
Further, the test device includes:
a direct current resistance tester, an insulation resistance meter and a dielectric loss tester;
the direct current resistance tester is used for testing the direct current resistance of the reactor of the parallel reactor;
the insulation resistance meter is used for testing the body insulation resistance and the sleeve insulation resistance of the shunt reactor;
the dielectric loss tester is used for testing the dielectric loss factor and the capacitance of the body of the shunt reactor, and the dielectric loss factor and the capacitance of the sleeve.
Further, the paralleling reactor test bench further includes:
a mouse and a display;
the mouse is connected with the single chip microcomputer, and the display is connected with the single chip microcomputer;
the single chip microcomputer receives a test instruction sent by a user through a mouse and a display.
Further, the relay set includes:
25 relay branches with the same structure;
and the single chip microcomputer controls the relays in the 25 relay branches with the same structure to perform switching actions respectively.
Further, the relay branch includes:
a resistor, a triode and a relay;
the resistor is connected between the singlechip and the base electrode of the triode, the coil of the relay is connected between the collector electrode of the triode and an external power supply, and the emitter electrode of the triode is grounded;
when the single chip microcomputer outputs a high-level test instruction, the base level of the triode becomes high, the collector and the emitter of the triode are conducted, the coil of the relay is electrified, and the relay is switched on and off.
Further, the wiring switching circuit further includes:
the high-voltage isolation special switch group and the testing device interface;
the high-voltage isolation special switch group is connected with the relay group, and the testing device interface is connected with the testing device;
and the high-voltage isolation special switch group receives the switching action of the relay group and controls the test lead to be connected to the test device interface corresponding to the test instruction through the switching action.
Further, the connection terminal includes:
the parallel reactor winding lead-out wire terminal and the parallel reactor sleeve end screen lead-out wire terminal.
Further, the test device interface includes:
the testing interface of the direct current resistance tester, the testing interface of the insulation resistance meter and the testing interface of the dielectric loss tester.
Further, the high-voltage isolation special switch group comprises:
25 high-voltage isolation special switches with the same structure;
the high-voltage isolation special switch is connected with the relay branch circuits in the relay group in a one-to-one correspondence mode.
Further, the high voltage isolation special switch comprises:
the direct current motor, the gear, the rack, the first switch connecting terminal, the second switch connecting terminal, the movable contact, the stationary contact, the first microswitch, the second microswitch and the switch shell;
the gear, the rack and the switch shell are made of insulating materials, a rotating shaft of the direct current motor is linked with the gear, the movable contact is connected with the rack, the static contact is connected with the second microswitch, and the gear drives the rack to move between the first microswitch and the static contact; the movable contact and the fixed contact are respectively connected with the first switch wiring terminal and the second switch wiring terminal by leads;
when the motor rotates in the forward direction, the gear is driven to drive the rack to move rightwards, when the movable contact contacts the fixed contact, the fixed contact triggers the second microswitch to perform inching, the motor is powered off to stop rotating, and after the switch-on is finished, the first wiring terminal and the second wiring terminal are conducted; when the motor rotates reversely, the gear is driven to drive the rack to move leftwards, when the rack touches the first microswitch, the motor is powered off, the brake is switched off, and the first connecting terminal and the second connecting terminal are disconnected.
Compared with the prior art, the technical scheme of the embodiment of the application has the beneficial effects that:
the parallel reactor testboard that this application embodiment provided includes: the testing device comprises a singlechip, a relay group, a wiring conversion circuit, a wiring terminal and at least two testing devices; the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal and the testing device, and the wiring terminal is externally connected with the shunt reactor; the single chip microcomputer sends a test instruction to control the switching action of the relay group, the relay group transmits the switching action of the relay group to the wiring conversion circuit, and the wiring conversion circuit is connected to the test device corresponding to the test instruction in a gating mode and tests. The process of testing the shunt reactor by the shunt reactor test bench does not need to replace a lead, and various electrical tests of the shunt reactor are completed quickly, safely and conveniently.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
Fig. 1 is a schematic block diagram of a paralleling reactor test bench according to an embodiment of the present application;
fig. 2 is a circuit diagram of a relay branch control portion provided in an embodiment of the present application;
fig. 3 is a structural diagram of a high-voltage isolation dedicated switch provided in an embodiment of the present application;
FIG. 4 is a schematic block diagram of a shunt reactor test station provided in another embodiment of the present application;
fig. 5 is a schematic diagram of the mutual positions and connection relations of the high-voltage isolation dedicated switches in the connection converting circuit according to an embodiment of the present application;
FIG. 6 is an equivalent circuit of the phase A dielectric loss test provided in an embodiment of the present application;
FIG. 7 is an equivalent circuit of the phase A insulation resistance test provided in an embodiment of the present application;
fig. 8 is an equivalent circuit of the dielectric loss test of the phase a high-voltage bushing according to an embodiment of the present disclosure;
fig. 9 is an equivalent circuit of the insulation resistance test of the phase a high voltage bushing provided in an embodiment of the present application;
fig. 10 is an equivalent circuit of the a-phase dc resistance test provided in an embodiment of the present application.
Wherein, in the figures, the respective reference numerals:
1-a switch housing; 2-a gear; 3-a direct current motor; 4-a rack; 5-moving contact; 6-stationary contact; 7-a first microswitch; 8-a second microswitch; 9-a first switch connection terminal; 10-second switch connection terminal.
Detailed Description
In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.
In order to explain the technical solution described in the present application, the following description will be given by way of specific examples.
Referring to fig. 1, a schematic block diagram of a parallel reactor test bench according to an embodiment of the present application is shown, including:
the testing device comprises a singlechip, a relay group, a wiring conversion circuit, a wiring terminal and at least two testing devices;
the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal and the testing device, and the wiring terminal is externally connected with the shunt reactor;
the single chip microcomputer sends a test instruction to control the relay group to perform switching action, the relay group transmits the switching action to the wiring conversion circuit, and the wiring conversion circuit enables the wiring terminal to be in the wiring conversion circuit, and the test lead in the wiring conversion circuit is connected to the test device corresponding to the test instruction and is tested.
In the embodiment of the present application, the single chip microcomputer (Microcontrollers) is an integrated circuit chip, and is a small and complete microcomputer system formed by integrating a Central Processing Unit (CPU), a Random Access Memory (RAM), a Read-Only Memory (ROM), various I/O ports, an interrupt system, a timer/counter and other functions (which may further include a display driving circuit, a pulse width modulation circuit, an analog multiplexer, an a/D converter and other circuits) with data Processing capability onto a silicon chip by using a very large scale integrated circuit technology.
In an embodiment of the present application, the relay set includes: 25 relay branches with the same structure and relays controlled by the relay branches; and the single chip microcomputer controls the relays in the 25 relay branches with the same structure to perform switching actions respectively.
Further, the relay branch includes: a resistor, a triode and a relay; the relay branch circuit controls the change of the coil voltage of the relay through the single chip microcomputer and controls the on-off action of the relay.
Further, please refer to fig. 2, which is a circuit diagram of a control portion of a relay branch according to an embodiment of the present application.
The branch control part of the relay consists of a single chip microcomputer, a resistor R1, a triode VT1 and a coil KA1 of the relay, wherein the resistor R1 is connected between the single chip microcomputer and the base electrode of the triode VT1, the coil KA1 of the relay is connected between an external power supply and the collector electrode of the triode VT1, and the emitting electrode of the triode VT1 is grounded.
When the single chip microcomputer outputs a high-level test command, the base level of the triode VT1 becomes high, the collector of the triode VT1 is conducted with the emitter of the triode VT1, the coil KA1 of the relay is electrified, and the relay is switched on and off.
Further, the external power supply is a 24V direct current power supply.
Furthermore, the corresponding relay group consists of resistors R1-R25, triodes VT1-VT25 and relays KA1-KA 25.
In an embodiment of the present application, the wiring conversion circuit includes: the test device comprises a test lead, a high-voltage isolation special switch group and a test device interface; the test lead is externally connected with the wiring terminal through the high-voltage isolation special switch group and is connected with the testing device interface through the high-voltage isolation special switch group; the high-voltage isolation special switch group is connected with the relay group, and the testing device interface is connected with the testing device; the high-voltage isolation special switch group receives the switching action of the relay group and controls the test lead to be connected with the test device interface corresponding to the test instruction and the external wiring terminal through the switching action.
Furthermore, the wiring terminal comprises a parallel reactor winding outgoing line terminal and a parallel reactor sleeve end screen outgoing line terminal.
The parallel reactor winding outgoing line terminal is used for connecting the parallel reactor winding outgoing line; the parallel reactor winding outgoing line is an outgoing line between coils of windings in the parallel reactor, and is used for measuring the body dielectric loss factor and the capacitance of the parallel reactor, the body insulation resistance of the parallel reactor and the reactor direct current resistance of the parallel reactor.
The lead-out wire of the end screen of the parallel reactor sleeve is also called a test tap and is used for measuring the dielectric loss factor and the capacitance of the sleeve and the insulation resistance of the sleeve.
Further, the test device includes: a direct current resistance tester, an insulation resistance meter and a dielectric loss tester;
the direct current resistance tester is used for testing the direct current resistance of the reactor of the parallel reactor;
the insulation resistance meter is used for testing the body insulation resistance and the sleeve insulation resistance of the shunt reactor;
the dielectric loss tester is used for testing the dielectric loss factor and the capacitance of the body of the shunt reactor, and the dielectric loss factor and the capacitance of the sleeve.
The direct-current resistance tester measures the direct-current resistance of semi-finished products, finished products delivery tests, installation and handover tests and preventive tests of an electric power department in the manufacturing process of high-voltage devices such as transformers, reactors, capacitive reactors and the like, and can effectively find manufacturing defects such as looseness, strand missing, wire breakage and the like of windings and coils and hidden dangers existing after operation.
The insulation resistance meter mainly comprises three parts; the first is a direct-current high-voltage generator used for generating direct-current high voltage; second, a measurement loop; and the third is display. The special instrument for measuring maximum resistance, insulation resistance, absorption ratio and polarization index is megaohm and has high voltage power supply.
The dielectric loss tester is mainly used for measuring the dielectric loss and capacitance capacity of high-voltage equipment such as various insulating materials, insulating sleeves, power cables, capacitors, transformers and the like under the condition of power frequency and high voltage.
In the embodiment of the application, the wiring conversion circuit is connected with at least two testing devices;
the testing device can be any two of the direct current resistance tester, the insulation resistance meter and the dielectric loss tester; the device can also be other measuring instruments capable of measuring the performance indexes of the shunt reactor.
The wiring conversion circuit can connect all the direct current resistance tester, the insulation resistance meter and the dielectric loss tester, and can also connect other measuring instruments capable of measuring the performance indexes of the shunt reactor.
Further, please refer to fig. 3, which is a structural diagram of a high-voltage isolation dedicated switch of the high-voltage isolation dedicated switch according to an embodiment of the present application.
The high-voltage isolation special switch comprises: the switch comprises a direct current motor 3, a gear 2, a rack 4, a first switch wiring terminal 9, a second switch wiring terminal 10, a movable contact 5, a fixed contact 6, a first microswitch 7, a second microswitch 8 and a switch shell 1;
the gear 2, the rack 4 and the switch shell 1 are made of insulating materials, a rotating shaft of the direct current motor 3 is linked with the gear 2, the movable contact 5 is connected with the rack 4, the fixed contact 6 is connected with the second microswitch 8, and the gear 2 drives the rack 4 to move between the first microswitch 7 and the fixed contact 6; the movable contact 5 and the fixed contact 6 are respectively connected with the first switch wiring terminal 9 and the second switch wiring terminal 10 by conducting wires;
when the direct current motor 3 rotates in the forward direction, the gear 2 is driven to drive the rack 4 to move rightwards, when the movable contact 5 contacts the fixed contact 6, the fixed contact 6 triggers the second microswitch micro-switch 8, the direct current motor 3 loses power and stops rotating, and after closing is finished, the first wiring terminal 9 and the second wiring terminal 10 are connected; when the direct current motor 3 rotates reversely, the gear 2 is driven to drive the rack 4 to move leftwards, and when the rack 4 touches the first microswitch 7, the direct current motor 3 is powered off, the brake is switched off, and the first connecting terminal 9 and the second connecting terminal 10 are disconnected.
Further, the high-voltage isolation special switch group comprises: 25 high-voltage isolation special switches with the same structure; the high-voltage isolation special switch is connected with the relay branches in the relay group in a one-to-one correspondence mode.
The high-voltage isolation special switch and the corresponding relay branch circuit are numbered and sequenced in the single chip microcomputer, and the position of the high-voltage isolation special switch which finishes the numbering and sequencing is logically judged: the high-voltage isolation special switch is positioned at a switching-on position, and meanwhile, the relay switch in the relay branch is coded to be 1 in a switching-off state; and the high-voltage isolation special switch is positioned at a switching-off position, and meanwhile, the off-state code of the relay switch in the relay branch is 0.
The parallel reactor testboard that this application embodiment provided includes: the testing device comprises a singlechip, a relay group, a wiring conversion circuit, a wiring terminal and at least two testing devices; the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal and the testing device, and the wiring terminal is externally connected with the shunt reactor; the single chip microcomputer sends a test instruction to control the switching action of the relay group, the relay group transmits the switching action of the relay group to the wiring conversion circuit, and the wiring conversion circuit is in gating connection with a test device corresponding to the test instruction to perform testing. The process of testing the shunt reactor by the shunt reactor test bench does not need to replace a lead, and various electrical tests of the shunt reactor are completed quickly, safely and conveniently.
Further, the paralleling reactor test bench further includes: a mouse and a display;
the mouse is connected with the single chip microcomputer, and the display is connected with the single chip microcomputer;
the single chip microcomputer receives a test instruction sent by a user through a mouse and a display.
Referring to fig. 4, a schematic block diagram of a parallel reactor testing platform according to another embodiment of the present application is shown, including:
the device comprises a singlechip, a mouse, a display, a relay group, a wiring conversion circuit, a wiring terminal, a direct current resistance tester, an insulation resistance meter and a dielectric loss tester;
the mouse is connected with the single chip microcomputer, the display is connected with the single chip microcomputer, the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal, the direct current resistance tester, the insulation resistance meter and the dielectric loss tester, and the wiring terminal is used for being externally connected with the shunt reactor;
the singlechip receives the test instruction that the user sent through mouse and display, the singlechip sends test instruction control relay unit switching action, relay unit will switching action conveys the switching action wiring converting circuit, wiring converting circuit will binding post is in wiring converting circuit inside experimental pin joint be in test instruction corresponds the direct current resistance tester insulation resistance table or test on the loss of mediacy tester.
In this application embodiment, when the paralleling reactor test bench tests the paralleling reactor, at first select concrete test item on the display through mouse, the singlechip is according to concrete test item, the corresponding pin output high level of control, drive the action of relay group switch, relay group drive the interior correspondence of high-pressure isolation special switch group high-pressure isolation special switch closes a floodgate, accomplishes in the switching circuit of working a telephone switchboard the wiring switching of experimental lead wire, simultaneously the singlechip judges through receiving corresponding micro-gap switch's in the high-pressure isolation special switch that has the switching action whether switching of switching circuit finishes. When the switching is not finished, the display prompts that the test is not required to be switched; after the switching is finished, the display prompts that the A-phase dielectric loss test can be carried out (when the A-phase dielectric loss test is carried out). The test result can be obtained by the test device: the direct current resistance tester, the insulation resistance meter and the dielectric loss tester are directly obtained.
In the embodiment of the application, the test bench of the shunt reactor completes the test of the related indexes of the shunt reactor through mouse operation and display of a display, and can complete the test of different indexes at one time without replacing related wiring leads, and the test process and the test result are directly and clearly prompted and indicated; various electrical tests of the shunt reactor are completed quickly, safely and conveniently.
In the embodiment of the application, the single chip microcomputer carries out position numbering and sequencing on 25 high-voltage isolation special switches; the 25 high-voltage isolation special switches are in one-to-one correspondence with the relay switches in the relay branch circuits; the 25 relay branches form the relay group.
Fig. 5 is a schematic diagram illustrating the mutual positions and connection relationships of the high-voltage isolation switch sets in the connection converting circuit according to an embodiment of the present application.
The position numbers of the high-voltage isolation special switches are from number K1 to number K25; the mutual position and the connection relation of the high-voltage isolation special switch group are stored in the single chip microcomputer.
According to specific test items, the specific switching-on and switching-off of the high-voltage isolation special switch group in the wiring conversion circuit is controlled by a high-level instruction output by the single chip microcomputer. When the single chip microcomputer encodes the switching signal of the high-voltage isolation special switch, the single chip microcomputer carries out logic judgment on the position signal of the high-voltage isolation special switch: the closing state of the high-voltage isolation special switch corresponding to each serial number is 1, and the opening state is 0; the single chip microcomputer collects and transmits back the position signal of the high-voltage isolation special switch, and the single chip microcomputer sends out a corresponding prompt when the collected and transmitted back signal is used as a code to move the next high-voltage isolation special switch, and the prompt is displayed through the display.
In this application embodiment, the specific test index that shunt reactor testboard tested the shunt reactor includes: the method comprises the following steps of A phase dielectric loss test, B phase dielectric loss test, C phase dielectric loss test, A phase insulation resistance test, B phase insulation resistance test, C phase insulation resistance test, A phase high-voltage bushing dielectric loss test, B phase high-voltage bushing dielectric loss test, C phase high-voltage bushing dielectric loss test, A phase neutral point bushing dielectric loss test, B phase neutral point bushing dielectric loss test, C phase neutral point bushing dielectric loss test, A phase high-voltage bushing insulation resistance test, B phase high-voltage bushing insulation resistance test, C phase high-voltage bushing insulation resistance test, A phase neutral point bushing insulation resistance test, B phase neutral point bushing insulation resistance test, C phase neutral point bushing insulation resistance test, A phase direct current resistance test, B phase direct current resistance test and C phase direct current resistance test.
Please refer to table 1, which is a table showing the correspondence between specific test items and the switch states of the high-voltage isolation switch bank according to an embodiment of the present application.
TABLE 1
And the action of the high-voltage isolation special switch group stored in the singlechip refers to the corresponding relation between the specific test item and the switch state corresponding table of the high-voltage isolation special switch group.
In the embodiment of the present invention, when performing the phase a dielectric loss test, the state codes of 25 high-voltage isolation dedicated switches are as shown in table 2:
| switch number K (KX) | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 | 22 | 23 | 24 | 25 |
| Dielectric loss test of phase A | 1 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 0 | 0 | 1 | 1 | 1 | 1 | 1 | 1 | 1 |
TABLE 2
Further, please refer to fig. 6, which shows an equivalent circuit of the phase a dielectric loss test according to an embodiment of the present application.
Specifically, when the A-phase dielectric loss test is carried out, the mouse is used for selecting the A-phase dielectric loss test on the display, the single chip microcomputer refers to the stored high-voltage isolation special switch group action, and the wiring conversion circuit is controlled by controlling the relay group: and controlling the relay branch switches in the relay groups with the corresponding numbers to be closed, outputting high level, and controlling the high-voltage isolation special switch with the same number as the relay branch to be switched on. The method specifically comprises the following steps: the special high-voltage isolation switch numbered K1, the special high-voltage isolation switch numbered K13, the special high-voltage isolation switch numbered K19, the special high-voltage isolation switch numbered K20, the special high-voltage isolation switch numbered K21, the special high-voltage isolation switch numbered K22, the special high-voltage isolation switch numbered K23, the special high-voltage isolation switch numbered K24 and the special high-voltage isolation switch numbered K25 are all switched on.
The bridge high-voltage line is reversely connected with two ends of the A-phase winding and is connected to the dielectric loss tester; and the single chip microcomputer compares the stored specific test items with the table 2 read from the switch state corresponding table of the high-voltage isolation special switch group, and detects the state information of the high-voltage isolation special switch with the corresponding number to judge whether the wiring conversion circuit is switched completely. And after the switching is finished, the singlechip controls and displays that the A-phase dielectric loss test can be carried out on the display. And operating the dielectric loss tester to apply 10kV voltage to the winding by using an inverse wiring method to generate a high-voltage bridge to finish the A-phase dielectric loss test.
In the embodiment of the invention, when the phase a insulation resistance test is performed, the state codes of 25 high-voltage isolation special switches are as shown in table 3:
| switch number K (KX) | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 | 22 | 23 | 24 | 25 |
| Insulation resistance test of phase A | 1 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 1 | 1 | 1 | 1 | 1 | 1 | 1 | 1 |
TABLE 3
Further, please refer to fig. 7, which is an equivalent circuit of the phase a insulation resistance test according to an embodiment of the present application.
Specifically, when the insulation resistance test of the phase a is performed, the insulation resistance test of the phase a is selected on the display by using the mouse, the single chip microcomputer controls the wiring switching circuit by controlling the relay group with reference to the stored action of the high-voltage isolation special switch group: and controlling the relay branch switches in the relay groups with the corresponding numbers to be closed, outputting high level, and controlling the high-voltage isolation special switch with the same number as the relay branch to be switched on. The method specifically comprises the following steps: the special high-voltage isolation switch numbered K1, the special high-voltage isolation switch numbered K13, the special high-voltage isolation switch numbered K17, the special high-voltage isolation switch numbered K20, the special high-voltage isolation switch numbered K21, the special high-voltage isolation switch numbered K22, the special high-voltage isolation switch numbered K23, the special high-voltage isolation switch numbered K24 and the special high-voltage isolation switch numbered K25 are all switched on.
One end of the insulation resistance meter is connected to short-circuit wires at two ends of the A-phase winding, and the other end of the insulation resistance meter is grounded; and the single chip microcomputer compares the stored specific test items with the table 3 read from the switch state corresponding table of the high-voltage isolation special switch group, and detects the state information of the high-voltage isolation special switch with the corresponding number to judge whether the wiring conversion circuit is switched completely. After the switching is finished, the singlechip controls and displays the 'A-phase insulation resistance test on the display to carry out the test'. And operating the insulation resistance meter to complete the insulation resistance test of the A-phase winding.
In the embodiment of the present invention, when performing the dielectric loss test of the phase a high-voltage bushing, the state codes of the 25 high-voltage isolation special switches are as shown in table 4:
| switch number K (KX) | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 | 22 | 23 | 24 | 25 |
| Dielectric loss test for A-phase high-voltage bushing | 1 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 1 | 0 | 0 | 1 | 1 | 1 | 1 | 1 | 1 |
TABLE 4
Further, please refer to fig. 8, which shows an equivalent circuit of the dielectric loss test of the phase a high voltage bushing according to an embodiment of the present application.
Specifically, when carrying out A looks high-voltage bushing and intervene and decrease the test, use mouse is in select A looks high-voltage bushing and intervene and decrease the test on the display, the singlechip refers to the storage high pressure isolation private switch group action, through control the relay group, control wiring converting circuit: and controlling the relay branch switches in the relay groups with the corresponding numbers to be closed, outputting high level, and controlling the high-voltage isolation special switch with the same number as the relay branch to be switched on. The method specifically comprises the following steps: the special high-voltage isolation switch numbered K1, the special high-voltage isolation switch numbered K13, the special high-voltage isolation switch numbered K17, the special high-voltage isolation switch numbered K20, the special high-voltage isolation switch numbered K21, the special high-voltage isolation switch numbered K22, the special high-voltage isolation switch numbered K23, the special high-voltage isolation switch numbered K24 and the special high-voltage isolation switch numbered K25 are all switched on.
The high-voltage wire of the dielectric loss tester is connected with an outgoing line of the A-phase winding high-voltage bushing, and the signal wire is connected with an outgoing line of the A-phase high-voltage bushing end screen; and the single chip microcomputer compares the stored specific test items with the table 4 read from the switch state corresponding table of the high-voltage isolation special switch group, and detects the state information of the high-voltage isolation special switch with the corresponding number to judge whether the wiring conversion circuit is switched completely. After the switching is finished, the single chip microcomputer controls and displays 'A-phase high-voltage bushing dielectric loss test can be tested' on the display. And operating the dielectric loss tester to finish the dielectric loss test of the A-phase high-voltage bushing.
In the embodiment of the present invention, when the insulation resistance test of the phase a high-voltage bushing is performed, the state codes of the 25 high-voltage isolation dedicated switches are as shown in table 5:
| switch number K (KX) | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 | 22 | 23 | 24 | 25 |
| Insulation resistance test of A-phase high-voltage bushing | 1 | 0 | 0 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 0 | 0 | 0 | 1 | 0 | 1 | 1 | 1 | 1 | 1 | 1 |
TABLE 5
Further, please refer to fig. 9, which is an equivalent circuit for testing the insulation resistance of the phase a high voltage bushing according to an embodiment of the present application.
Specifically, when the insulation resistance test of the phase a high-voltage bushing is performed, the mouse is used to select the insulation resistance test of the phase a high-voltage bushing on the display, and the single chip microcomputer controls the wiring conversion circuit by controlling the relay group with reference to the stored action of the high-voltage isolation special switch group: and controlling the relay branch switches in the relay groups with the corresponding numbers to be closed, outputting high level, and controlling the high-voltage isolation special switch with the same number as the relay branch to be switched on. The method specifically comprises the following steps: the special high-voltage isolation switch numbered K1, the special high-voltage isolation switch numbered K7, the special high-voltage isolation switch numbered K14, the special high-voltage isolation switch numbered K18, the special high-voltage isolation switch numbered K20, the special high-voltage isolation switch numbered K21, the special high-voltage isolation switch numbered K22, the special high-voltage isolation switch numbered K23, the special high-voltage isolation switch numbered K24 and the special high-voltage isolation switch numbered K25 are all switched on.
Two ends of the insulation resistance meter are respectively connected with an A-phase winding high-voltage bushing outgoing line and an A-phase high-voltage bushing end screen outgoing line; and the single chip microcomputer compares the stored specific test items with the table 5 read from the switch state corresponding table of the high-voltage isolation special switch group, and detects the state information of the high-voltage isolation special switch with the corresponding number to judge whether the wiring conversion circuit is switched completely. After the switching is finished, the singlechip controls and displays 'A-phase high-voltage bushing insulation resistance test can be tested' on the display. And operating the insulation resistance meter to finish the insulation resistance test of the A-phase high-voltage bushing.
In the embodiment of the present invention, when performing the a-phase dc resistance test, the state codes of 25 high-voltage isolation dedicated switches are as shown in table 6:
| switch number K (KX) | 1 | 2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | 10 | 11 | 12 | 13 | 14 | 15 | 16 | 17 | 18 | 19 | 20 | 21 | 22 | 23 | 24 | 25 |
| A-phase DC resistance test | 1 | 0 | 0 | 1 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 0 | 1 | 1 | 0 | 0 | 1 | 1 | 1 | 1 | 1 | 1 | 0 |
TABLE 6
Further, please refer to fig. 10, which shows an equivalent circuit of the phase a dc resistance test according to an embodiment of the present application.
Specifically, when the a-phase direct current resistance test is performed, the mouse is used for selecting the a-phase direct current resistance test on the display, the single chip microcomputer refers to the stored action of the high-voltage isolation special switch group, and controls the wiring conversion circuit by controlling the relay group: and controlling the relay branch switches in the relay groups with the corresponding numbers to be closed, outputting high level, and controlling the high-voltage isolation special switch with the same number as the relay branch to be switched on. The method specifically comprises the following steps: the special high-voltage isolation switch numbered K1, the special high-voltage isolation switch numbered K4, the special high-voltage isolation switch numbered K15, the special high-voltage isolation switch numbered K16, the special high-voltage isolation switch numbered K19, the special high-voltage isolation switch numbered K20, the special high-voltage isolation switch numbered K21, the special high-voltage isolation switch numbered K22, the special high-voltage isolation switch numbered K23 and the special high-voltage isolation switch numbered K24 are all switched on.
Two ends of the direct resistance tester are respectively connected with an A-phase winding high-voltage bushing outgoing line and an A-phase winding neutral point outgoing line; and the single chip microcomputer compares the stored specific test items with the table 6 read from the switch state corresponding table of the high-voltage isolation special switch group, and detects the state information of the high-voltage isolation special switch with the corresponding number to judge whether the wiring conversion circuit is switched completely. After the switching is finished, the single chip microcomputer controls and displays that the A-phase direct current resistance test can be tested on the display. And operating the direct current resistance tester to finish the A-phase direct current resistance test.
The above embodiment has only explained the testing process of the phase a of the parallel reactor, the testing processes of the remaining phase B and phase C are the same as the phase a, and only the serial numbers of the high-voltage isolation dedicated switches corresponding to the terminals of the winding outgoing lines of the parallel reactor externally connected to the phase a, the phase B and the phase C of the parallel reactor in the connection converting circuit or the terminals of the end screen outgoing lines of the sleeve of the parallel reactor are different.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (6)
1. A shunt reactor test bench is characterized by comprising:
the device comprises a singlechip, a relay group, a wiring conversion circuit, a wiring terminal, at least two testing devices, a mouse and a display;
the single chip microcomputer is connected with the relay group, the relay group is connected with the wiring conversion circuit, the wiring conversion circuit is respectively connected with the wiring terminal and the testing device, and the wiring terminal is externally connected with the shunt reactor;
the single chip microcomputer sends a test instruction to control the switching action of the relay group, the relay group transmits the switching action to the wiring conversion circuit, and the wiring conversion circuit connects a test lead of the wiring terminal in the wiring conversion circuit to a test device corresponding to the test instruction and tests the test lead;
the mouse is connected with the single chip microcomputer, and the display is connected with the single chip microcomputer;
the single chip microcomputer receives a test instruction sent by a user through a mouse and a display;
wherein, the wiring converting circuit includes:
the high-voltage isolation special switch group and the testing device interface;
the high-voltage isolation special switch group is connected with the relay group, and the testing device interface is connected with the testing device;
the high-voltage isolation special switch group receives the switching action of the relay group and controls the test lead to be connected to the test device interface corresponding to the test instruction through the switching action;
wherein, the special switch block of high voltage isolation includes:
25 high-voltage isolation special switches with the same structure;
the high-voltage isolation special switch is connected with the relay branches in the relay group in a one-to-one correspondence manner;
wherein, special switch high voltage isolation of high voltage isolation includes:
the direct current motor, the gear, the rack, the first switch connecting terminal, the second switch connecting terminal, the movable contact, the stationary contact, the first microswitch, the second microswitch and the switch shell;
the gear, the rack and the switch shell are made of insulating materials, a rotating shaft of the direct current motor is linked with the gear, the movable contact is connected with the rack, the static contact is connected with the second microswitch, and the gear drives the rack to move between the first microswitch and the static contact; the movable contact and the fixed contact are respectively connected with the first switch wiring terminal and the second switch wiring terminal by leads;
when the motor rotates in the forward direction, the gear is driven to drive the rack to move rightwards, when the movable contact contacts the fixed contact, the fixed contact triggers the second microswitch to perform inching, the motor is powered off to stop rotating, and after the switch is closed, the first switch wiring terminal and the second switch wiring terminal are conducted; when the motor rotates reversely, the gear is driven to drive the rack to move leftwards, when the rack touches the first microswitch, the motor is powered off, the brake is switched off, and the first switch wiring terminal and the second switch wiring terminal are disconnected.
2. The shunt reactor test stand of claim 1, wherein said test device comprises:
a direct current resistance tester, an insulation resistance meter and a dielectric loss tester;
the direct current resistance tester is used for testing the direct current resistance of the reactor of the parallel reactor;
the insulation resistance meter is used for testing the body insulation resistance and the sleeve insulation resistance of the shunt reactor;
the dielectric loss tester is used for testing the dielectric loss factor and the capacitance of the body of the shunt reactor, and the dielectric loss factor and the capacitance of the sleeve.
3. The shunt reactor test stand of claim 1, wherein said relay bank comprises:
25 relay branches with the same structure;
and the single chip microcomputer controls the relays in the 25 relay branches with the same structure to perform switching actions respectively.
4. The shunt reactor test stand of claim 3, wherein said relay branch comprises:
a resistor, a triode and a relay;
the resistor is connected between the singlechip and the base electrode of the triode, the coil of the relay is connected between the collector electrode of the triode and an external power supply, and the emitter electrode of the triode is grounded;
when the single chip microcomputer outputs a high-level test instruction, the base level of the triode becomes high, the collector and the emitter of the triode are conducted, the coil of the relay is electrified, and the relay is switched on and off.
5. The shunt reactor test stand of claim 1, wherein said terminal comprises:
the parallel reactor winding lead-out wire terminal and the parallel reactor sleeve end screen lead-out wire terminal.
6. The shunt reactor test stand of claim 1, wherein said test device interface comprises:
the testing interface comprises a direct current resistance tester testing interface, an insulation resistance meter testing interface and a dielectric loss tester testing interface.
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| CN108037365B true CN108037365B (en) | 2019-12-31 |
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| CN110441633A (en) * | 2019-08-14 | 2019-11-12 | 青岛云路特变智能科技有限公司 | Reactor test macro and method |
| CN111458565A (en) * | 2020-05-11 | 2020-07-28 | 国家电网有限公司 | Medium loss and insulation resistance test conversion device |
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