CN107976415B - Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide - Google Patents
Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide Download PDFInfo
- Publication number
- CN107976415B CN107976415B CN201711258952.3A CN201711258952A CN107976415B CN 107976415 B CN107976415 B CN 107976415B CN 201711258952 A CN201711258952 A CN 201711258952A CN 107976415 B CN107976415 B CN 107976415B
- Authority
- CN
- China
- Prior art keywords
- titanium dioxide
- organic silicon
- carbon content
- coating amount
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 title claims abstract description 92
- 239000004408 titanium dioxide Substances 0.000 title claims abstract description 46
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 37
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 37
- 239000010703 silicon Substances 0.000 title claims abstract description 37
- 239000011248 coating agent Substances 0.000 title claims abstract description 23
- 238000000576 coating method Methods 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims abstract description 21
- 239000003795 chemical substances by application Substances 0.000 title claims abstract description 19
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 29
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 29
- 239000000654 additive Substances 0.000 claims abstract description 19
- 239000000463 material Substances 0.000 claims abstract description 16
- 230000000996 additive effect Effects 0.000 claims abstract description 9
- 238000005259 measurement Methods 0.000 claims abstract description 8
- YQCIWBXEVYWRCW-UHFFFAOYSA-N methane;sulfane Chemical compound C.S YQCIWBXEVYWRCW-UHFFFAOYSA-N 0.000 claims description 7
- 238000004458 analytical method Methods 0.000 claims description 2
- 238000012360 testing method Methods 0.000 abstract description 6
- 238000007792 addition Methods 0.000 description 9
- 238000004381 surface treatment Methods 0.000 description 4
- 238000001035 drying Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 2
- 230000008020 evaporation Effects 0.000 description 2
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 1
- 239000012752 auxiliary agent Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000002612 dispersion medium Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000002572 peristaltic effect Effects 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 150000003077 polyols Chemical class 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- QXJQHYBHAIHNGG-UHFFFAOYSA-N trimethylolethane Chemical compound OCC(C)(CO)CO QXJQHYBHAIHNGG-UHFFFAOYSA-N 0.000 description 1
- 238000005303 weighing Methods 0.000 description 1
- 238000004383 yellowing Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
Abstract
The invention discloses a method for measuring the coating amount of an organic silicon treating agent on the surface of titanium dioxide, which comprises the following steps: 1) determining the carbon content C0 in the base material of the titanium dioxide to be detected; 2) adding organic silicon additives with different amounts into the base material of the titanium dioxide to be detected, and respectively detecting the carbon content Ci of the titanium dioxide; 3) calculating the carbon content C = Ci-C0 of different organic silicon additive amounts according to the measurement results of the step 1) and the step 2), and calculating the carbon content corresponding to each thousandth of organic silicon additive; 4) measuring the carbon content Cy in the titanium dioxide to be measured; 5) and (3) calculating the organic silicon coating amount in the titanium dioxide to be detected according to the measurement results of the step 1), the step 3) and the step 4). The method can be used for measuring the coating amount of the organic silicon additive in the titanium dioxide, and is simple and convenient to operate and accurate in test result.
Description
Technical Field
The invention belongs to the field of material analysis and detection, and particularly relates to a method for measuring the coating amount of an organic silicon treating agent on the surface of titanium dioxide.
Background
The surface treatment of titanium dioxide can be generally divided into inorganic surface treatment and organic surface treatment, wherein the organic surface treatment is to adsorb or bond polar groups of organic matters on the particle surface of titanium dioxide, and the wettability, dispersibility and rheological property of titanium dioxide in various dispersion media are improved by means of electric repulsion and steric hindrance effect. Most of the organic surface treating agents generally adopted by titanium dioxide manufacturers are polyol series (generally trimethylolpropane, trimethylolethane and the like) and organosilicon series. The addition amount of the organic surface treating agent of the titanium dioxide not only affects the dispersibility of the titanium dioxide, but also affects the temperature resistance and yellowing resistance of the titanium dioxide, so that the coating amount of the organic surface treating agent in the titanium dioxide is particularly important for different application fields of the titanium dioxide.
Particularly, in the aspect of production control of the organic silicon additive, a titanium dioxide manufacturer basically adds the organic silicon additive by using a peristaltic pump, and the added organic silicon additive is adhered to steam grinding powder due to the influence of the surface performance of the organic silicon additive, so that the actual addition amount and the preset addition amount are in and out, and the coating amount of the organic silicon of the titanium dioxide must be accurately measured.
Therefore, a determination method capable of accurately measuring the coating amount of the organic silicon treatment agent on the surface of the titanium dioxide is needed.
Disclosure of Invention
Aiming at the defects in the prior art, the invention aims to provide the method for measuring the coating amount of the organic silicon surface treating agent on the surface of titanium dioxide, and the coating amount of the organic silicon surface treating agent can be more accurately measured by combining the established method with the measurement of the carbon content by adopting an infrared carbon-sulfur analyzer.
The invention provides a method for measuring the coating amount of an organic silicon treating agent on the surface of titanium dioxide, which comprises the following steps:
1) determining the carbon content C0 in the base material of the titanium dioxide to be detected;
2) adding organic silicon additives with different amounts into the base material of the titanium dioxide to be detected, and respectively detecting the carbon content Ci of the titanium dioxide;
3) calculating the carbon content C = Ci-C0 of different organic silicon additive amounts according to the measurement results of the step 1) and the step 2), and calculating the carbon content C corresponding to each thousandth of organic silicon additive1 per mill of organosilicon；
4) Measuring the carbon content Cy in the titanium dioxide to be measured;
5) calculating the organic silicon coating amount Y in the titanium dioxide to be measured according to the measurement results of the step 1), the step 3) and the step 4)Organosilicon/% oas shown in formula (i):
in the invention, the carbon content can be measured by adopting the technical means commonly used in the field. Preferably, the carbon content in each sample is determined using an infrared carbon sulfur analyzer.
According to the invention, in order to increase the accuracy of the test, at least three sample points are analyzed in the determination of the carbon content, and finally the average value is taken.
According to the invention, in the step 2), at least three groups of base materials with different addition amounts of the organic silicon additives are measured, the addition amount of the organic silicon additives can be 1-100 per thousand, preferably 1-50 per thousand, and the addition amount can be specifically adjusted according to the approximate addition amount of the organic silicon additives in an actual sample. In addition, at least three sample points were taken for each amount of added base material.
In the invention, the pretreatment of the sample to be measured adopts the conventional technical means in the field, for example, a universal pulverizer is adopted to pulverize the base material, and an oven is used for drying and the like.
The determination method has the following beneficial effects:
1. the invention establishes a method capable of measuring the surface coating amount of the organic silicon treating agent, and simultaneously combines an infrared carbon-sulfur analyzer to accurately measure the carbon content, thereby realizing the measurement of the surface coating amount of the organic silicon treating agent used in the production of titanium dioxide manufacturers.
2. The determination method of the invention has simple and convenient operation and small error of the test result.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the following embodiments, and it should be understood that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments.
Example 1
This example is used to illustrate the method for measuring the coating amount of the titanium dioxide surface organosilicon treating agent.
The method specifically comprises the following steps:
1. drying the qualified flash evaporation material, crushing the flash evaporation material for 30s by using a universal crusher to obtain a titanium dioxide base material, and testing the carbon content of three sample points of the base material by using an infrared carbon-sulfur analyzer, wherein the carbon content is respectively 0.021%, 0.020% and 0.018%, and the average value is 0.020% (marked as C0);
2. accurately weighing 200g of base material (accurate to 0.0001 g), respectively adding 3 per mill, 4 per mill, 5 per mill and 6 per mill of organic silicon, crushing for 2min by using a universal crusher, drying for 30min at 90 ℃, crushing for 30s by using the universal crusher again, respectively taking three sample points of a processed sample, testing the total carbon content of each processed sample by using an infrared carbon-sulfur analyzer, and taking the average value (marked as Ci) of each processed sample. Calculating the carbon content C (C = Ci-C0) of different organic silicon addition amounts, and concretely referring to Table 1;
3. calculating the carbon content corresponding to each thousandth of the organosilicon auxiliary agent to be 0.024% according to the result of the step 2, and concretely referring to table 1;
4. taking the finished product titanium dioxide to be tested in a titanium dioxide production workshop, testing the carbon content of three sample points of the finished product titanium dioxide by using an external red carbon-sulfur analyzer to be 0.163 percent, 0.165 percent and 0.167 percent respectively, taking the average Cy of 0.165 percent and subtracting C0 to be 0.145 percent, combining the data obtained in the step 3, and calculating the coating amount of the organic silicon of the titanium dioxide to be 6.04 per thousand according to a calculation formula.
TABLE 1 carbon content for different organosilicon additions
According to the specific steps and the data in the table 1, the surface coating amount of the titanium dioxide surface organosilicon treating agent is measured to be 6.04 per mill.
Having described embodiments of the present invention, the foregoing description is intended to be exemplary, not exhaustive, and not limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the illustrated embodiments.
Claims (4)
1. A method for measuring the coating amount of an organic silicon treating agent on the surface of titanium dioxide is characterized by comprising the following steps:
1) determining the carbon content C0 in the base material of the titanium dioxide to be detected;
2) adding organic silicon additives with different known amounts into the base material of the titanium dioxide to be detected, and respectively detecting the carbon content Ci of the titanium dioxide;
3) calculating the carbon content C of different organic silicon additive amounts, namely Ci-C0 according to the measurement results of the step 1) and the step 2), and calculating the carbon content C corresponding to one thousandth of organic silicon additive1 per mill of organosilicon；
4) Measuring the carbon content Cy in the titanium dioxide to be measured;
5) calculating the organic silicon coating amount Y in the titanium dioxide to be measured according to the measurement results of the step 1), the step 3) and the step 4)Organosilicon/% oas shown in formula (i):
Yorganosilicon/% o＝(Cy-C0)/C1 per mill of organosilicon①。
2. The method for measuring the coating amount of the titanium dioxide surface organosilicon treating agent according to claim 1, wherein the method comprises the following steps: the carbon content in each sample was determined using an infrared carbon sulfur analyzer.
3. The method for measuring the coating amount of the titanium dioxide surface organosilicon treating agent according to claim 1, wherein the method comprises the following steps: at least three sample points were taken for analysis in the determination of carbon content, and finally the average value was taken.
4. The method for measuring the coating amount of the titanium dioxide surface organosilicon treating agent according to claim 1, wherein the method comprises the following steps: in the step 2), at least three groups of base materials with different addition amounts of organic silicon additives are measured, wherein the addition amount of the organic silicon additives is 1-100 per mill.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711258952.3A CN107976415B (en) | 2017-12-04 | 2017-12-04 | Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711258952.3A CN107976415B (en) | 2017-12-04 | 2017-12-04 | Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107976415A CN107976415A (en) | 2018-05-01 |
| CN107976415B true CN107976415B (en) | 2020-05-19 |
Family
ID=62009094
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711258952.3A Active CN107976415B (en) | 2017-12-04 | 2017-12-04 | Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107976415B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108801953A (en) * | 2018-06-28 | 2018-11-13 | 四川龙蟒钛业股份有限公司 | The assay method of titanium coating content in a kind of titanium dioxide |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6663851B1 (en) * | 1999-06-29 | 2003-12-16 | Degussa Ag | Surface-modified titanium dioxide |
| CN106118140A (en) * | 2016-06-13 | 2016-11-16 | 四川龙蟒钛业股份有限公司 | A kind of preparation method of high whiteness high-temperature resistant color masterbatch level titanium dioxide |
-
2017
- 2017-12-04 CN CN201711258952.3A patent/CN107976415B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6663851B1 (en) * | 1999-06-29 | 2003-12-16 | Degussa Ag | Surface-modified titanium dioxide |
| CN106118140A (en) * | 2016-06-13 | 2016-11-16 | 四川龙蟒钛业股份有限公司 | A kind of preparation method of high whiteness high-temperature resistant color masterbatch level titanium dioxide |
Non-Patent Citations (1)
| Title |
|---|
| TiO2 颗粒表面包覆机理的研究进展;杜凤;《民营科技》;20170520;全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107976415A (en) | 2018-05-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107271312A (en) | A kind of method that stem content in pipe tobacco is determined based on thermoanalysis technology | |
| CN104502298B (en) | A kind of measure cadmium and the method for micro lead in iron ore | |
| CN104390932B (en) | Moisture content detection method based on Subtractive Infrared Spectroscopy | |
| CN107976415B (en) | Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide | |
| CN109030335A (en) | Titanium dioxide primary product weatherability evaluation method | |
| CN108627468A (en) | A kind of prediction technique of feeding Boehmeria nivea leaves crude fiber content | |
| CN107941835B (en) | Method for measuring coating amount of organic silicon treating agent on surface of titanium dioxide | |
| CN107703088A (en) | Carbon, the assay method of sulfur content in a kind of chrome ore | |
| CN106290180A (en) | A kind of Pb in food, chromium, cadmium and the detection method of copper content | |
| CN205027658U (en) | Material spectral emissivity measuring device | |
| CN106769274A (en) | A kind of preparation method of the ABS standard samples for X-ray fluorescence spectra analysis | |
| Stoček et al. | Heat build-up characterization under realistic load | |
| CN106644812B (en) | The quantitative detecting method of graphene in a kind of solution | |
| CN107656024B (en) | A kind of measuring method of titanium dioxide surface organosilicon stearic acid organic agent covering amount | |
| CN104359751B (en) | Trace uranium in micro-wave digestion Soil by Flurescence | |
| CN106442592A (en) | Method for X-ray fluorescent tableting detection on phosphorus content in manganese-silicon alloy | |
| CN103398955B (en) | A kind of detection method of glutinous rice flour amylose content | |
| CN107561104A (en) | A kind of equipment for nuclear power plant's boron aluminum alloy materials neutron-absorbing performance detection | |
| CN105954262A (en) | {0><}0{>ICP-AES method for measuring sulfur content of lead sulfate in waste storage battery | |
| EP3133384A2 (en) | Device and method for the thermo-optical examination of samples | |
| CN207232046U (en) | A kind of equipment for nuclear power plant's boron aluminum alloy materials neutron-absorbing performance detection | |
| CN111189866A (en) | Detection method for monitoring direct-reading spectrometer by X-ray fluorescence spectrometer | |
| Zhou Ying et al. | Application of quality control chart in the determination of cadmium in food. | |
| CN111458361B (en) | Portable XRF-based method for measuring content of elements in leech | |
| CN111579576B (en) | Method for detecting carbon content of coal-series kaolinite rock and calcined product by thermal analysis-infrared combined method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: 454150 longmang Bailian Group Co., Ltd., Fengfeng office, zhongzhan District, Jiaozuo City, Henan Province Patentee after: Longbai Group Co.,Ltd. Address before: 454150 longmang Bailian Group Co., Ltd., Fengfeng office, zhongzhan District, Jiaozuo City, Henan Province Patentee before: LOMON BILLIONS GROUP Co.,Ltd. |
|
| CP01 | Change in the name or title of a patent holder |