CN107886565B - Method for ordering rock section optical scanning disordered point cloud - Google Patents
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Abstract
The invention discloses a rock section optical scanning disordered point cloud ordering processing method. The method comprises the steps of obtaining a rock fracture surface point cloud file, calculating the point cloud length, adjusting deviation, readjusting coordinates, selecting a calculation range, obtaining a z coordinate of a sampling point through linear interpolation and the like. The method can select an ordering processing region, can arrange the ordered point cloud according to the coordinate sequence, and can directly calculate the subsequent fracture surface parameters without readjusting. After the method is adopted to carry out the disordered point cloud ordering treatment, the shape of the rock section is not changed, and the method has stronger practicability in the research of the shape of the rock joint surface and mechanics.
Description
Technical Field
The invention relates to the field of rock fracture mechanics, in particular to a rock section optical scanning disordered point cloud ordering processing method.
Background
The rock is broken under the action of tension, compression and shearing force to form a rock fracture surface. The shape of the fracture surface of the rock has important influence on the strength and deformation characteristics of the joint surface, and is a hot point of research of current scholars. At present, the calculation of the profile morphology characteristics mainly focuses on the three-dimensional average dip angle, roughness parameters, apparent anisotropy, average gradient distortion parameters, JRC and fractal characteristics of a fracture surface. The basic principle is that an optical scanner is used for scanning a rock section to obtain x, y and z coordinates of a series of points on the surface of the fracture surface, namely point cloud, and then calculation is carried out according to the point cloud data of the section. The rough parameters and fractal calculation of the rock fracture surface are carried out based on the ordered point cloud of the rock fracture surface. However, many optical scanners produce point cloud data as a disordered point cloud, which must be converted to an ordered point cloud in the above section parameter calculations.
The existing ordering processing method adopts a local point cloud quadric surface fitting method to calculate the coordinates of a target point, and the processed ordered point cloud is a smooth curved surface and is not suitable for the analysis of the topography characteristics of a rock section.
Disclosure of Invention
The invention aims to provide a rock section disordered point cloud ordering processing method which is simple in algorithm, reliable in result and capable of selecting a processing area, so as to solve the problem that the prior art cannot adopt disordered point cloud to calculate the shape and appearance characteristics of the rock section.
The technical scheme adopted for achieving the purpose of the invention is that the method for ordering the disordered point cloud by the optical scanning of the rock section comprises the following steps:
1) and (3) carrying out optical scanning on the rock fracture surface by adopting an optical scanner to obtain x, y and z coordinates of the rock fracture surface series points in a coordinate system o-xyz. And exporting scanning data to obtain a rock fracture surface point cloud file. Wherein, the x coordinate direction is the rock sample length direction, the y coordinate direction is the rock sample width direction, and the z coordinate is the height of point.
2) And reading the point cloud file, and assigning the data of the point cloud to an array Original. The first row of the array origin is a point cloud x coordinate, the second row is a point cloud y coordinate, and the third row is a point cloud z coordinate.
3) Traversing the first column and the second column of the array origin, searching the maximum value and the minimum value of the x coordinate and the y coordinate, and calculating according to the formula (1) to obtain the length x of the point cloud in the x directionwidthAnd length y in the y directionwidth. Wherein,
in the formula, xmaxIs the maximum value of the x coordinate, xminIs the minimum value of the x coordinate, ymaxIs the maximum value of the y coordinate, yminIs the minimum value of the y coordinate.
4) And adjusting the deviation of the scanning data and the actual sample and readjusting the coordinates to enable the center coordinates of the sample to be zero. And calculating the adjusted x coordinate x according to the formula (2)afteramendAnd the adjusted y-coordinate yafteramend。
In the formula, specimenxlength is the length of the sample in the x direction. specimenylength is the length of the specimen in the y-direction. x is the number ofratioThe length of the sample in the x direction specimenxlength and the length x of the scanning point cloud in the x direction are shown in the specificationwidthThe ratio of (a) to (b). y isratioFor the length y of the sample in the y directionafteramendLength y of scanning point cloud in y directionwidthThe ratio of (a) to (b).
5) The adjusted point coordinates are recorded in the array Amend. Wherein the first column of the array Amend is the adjusted x coordinate xafteramendAnd the second column is the adjusted y coordinate yafteramendAnd the third column is the z coordinate of the point corresponding to the x, y coordinates.
6) And selecting a calculation range. Traversing the array Amend, and writing the ith row of the array Amend into the array Calculatarea if the point represented by the ith row is in the calculation range. The calculation range is a rectangular area which takes the center of the sample as the origin of coordinates and is defined by x and y coordinates. The minimum value of the x coordinate of the rectangular area is mincalvulatex, the maximum value of the x coordinate is maxcalculatatex, the minimum value of the y coordinate is mincalvulatey, and the maximum value of the y coordinate is maxcalculatatey.
7) And performing linear interpolation according to the sampling interval of the ordered point cloud to obtain the z coordinate of the sampling point, and writing the z coordinate into an array Final. Wherein the array Final comprises xsamplingumber rows and ysamplingnumber columns. xsamplingumber is the number of samples of the ordered point cloud in the x-direction, and ysamplingnumber is the number of samples of the ordered point cloud in the y-direction. The values of xsamplingnumber and ysampllingnnumber are calculated using equation (3):
in the formula, xsamplingstep is the sampling interval of the ordered point cloud in the x direction, and ysamplingstep is the sampling interval of the ordered point cloud in the y direction.
Further, the implementation method of the linear interpolation in step 7) is as follows:
1) and (4) calculating the coordinates (samplingx and samplingy) of the sampling point at the ith row and the jth column of the ordered point cloud. Wherein,
2) and (5) calculating the distance D between the projection of each point in the point cloud in the xoy plane and the projection of the sampling point in the xoy plane according to the formula (5). And writes the x, y, z coordinates and Distance D of the point into the 1 st to 4 th columns of the array Distance, respectively. Wherein,
3) traversing the Distance of the array, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point A; and records the x, y, z coordinates of point A and the row number R in the Distance arrayA(ii) a Assigning the array Distance to the array Interdistance, and assigning the array Interdistance to the 4 th column R in the array InterdistanceAThe row has a large value.
4) Traversing the array InterDistance, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point B; and records the x, y, z coordinates of point B and the line number R in the Interdistance arrayB(ii) a Assigning to the 4 th column R in the array InterDistanceBThe row has a large value.
5) Checking the x coordinates and the y coordinates of the sampling point, the point A and the point B; if the x coordinate and the y coordinate of the point B are the same as those of the point A, repeating the step 4) until the x coordinate or the y coordinate of the point B is different from that of the point A.
6) Traversing the array InterDistance, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point C; and records the x, y, z coordinates of point C and the line number R in the Interdistance arrayC(ii) a Assigning to the 4 th column R in the array InterDistanceCThe row has a large value.
7) And calculating projection areas S1, S2 and S3 of three triangles with the sampling point, the point A and the point B, the sampling point, the point B and the point C as vertexes in the xoy plane, and calculating the projection area S of the triangle with the point A, the point B and the point C as vertexes in the xoy plane.
8) If S is 0 or S1+ S2+ S3 ≠ S, steps 6) and 7) are repeated until S > 0 and S1+ S2+ S3 ═ S.
9) And solving a plane equation passing through the point A, the point B and the point C at the same time.
10) And substituting the x and y coordinates of the sampling points into the plane equation in the step 9), and solving the z coordinate of the sampling points.
11) Writing the z coordinate of the sampling point in the step 10) into the ith row and the jth column of the array Final.
12) Repeating the steps 1) to 11) to calculate the z coordinate of the next sampling point until the last sampling point. The data in the array Final is the z coordinate of the ordered points with the x-direction interval of xsampling and the y-direction interval of ysampling.
The technical effects of the invention are undoubted:
A. the principle is simple, the result is reliable, and disordered point cloud can be converted into ordered point cloud;
B. the sampling interval of the ordered point cloud can be freely defined and does not depend on the existing unordered point cloud;
C. the ordering processing area can be selected freely through the coordinate;
D. the ordered point clouds can be arranged according to the coordinate sequence, and the subsequent fracture surface parameters can be directly calculated without readjustment.
Drawings
FIG. 1 is a flow chart of a point cloud ordering process;
FIG. 2 is a schematic diagram of an optical scanning disordered point cloud image of a rock section;
FIG. 3 is an enlarged view of the partial point cloud of FIG. 2;
FIG. 4 is a diagram showing the relative position relationship of the projection of the sampling point to the point A, the point B and the point C in the xoy plane;
FIG. 5 is a schematic diagram of an image after the ordering process of the disordered point cloud;
fig. 6 is an enlarged view of the partial point cloud of fig. 5.
Detailed Description
The present invention is further illustrated by the following examples, but it should not be construed that the scope of the above-described subject matter is limited to the following examples. Various substitutions and alterations can be made without departing from the technical idea of the invention and the scope of the invention is covered by the present invention according to the common technical knowledge and the conventional means in the field.
The embodiment discloses a rock section optical scanning disordered point cloud ordering processing method, and referring to fig. 1, the method comprises the following steps:
1) and (3) carrying out optical scanning on the rock fracture surface by adopting an optical scanner to obtain x, y and z coordinates of the rock fracture surface series points in a coordinate system o-xyz. And exporting scanning data to obtain a rock fracture surface point cloud file. The schematic diagram of the disordered point cloud image and its partial enlarged view are shown in fig. 2 and 3. Wherein, the x coordinate direction is the rock sample length direction, the y coordinate direction is the rock sample width direction, and the z coordinate is the height of point.
2) And reading the point cloud file, and assigning the data of the point cloud to an array Original. The first row of the array origin is a point cloud x coordinate, the second row is a point cloud y coordinate, and the third row is a point cloud z coordinate.
3) Traversing the first column and the second column of the array origin, searching the maximum value and the minimum value of the x coordinate and the y coordinate, and calculating according to the formula (1) to obtain the length x of the point cloud in the x directionwidthAnd length y in the y directionwidth. Wherein,
in the formula, xmaxIs the maximum value of the x coordinate, xminIs the minimum value of the x coordinate, ymaxIs the maximum value of the y coordinate, yminIs the minimum value of the y coordinate.
4) And adjusting the deviation of the scanning data and the actual sample and readjusting the coordinates to enable the center coordinates of the sample to be zero. And calculating the adjusted x coordinate x according to the formula (2)afteramendAnd the adjusted y-coordinate yafteramend。
In the formula, specimenxlength is the length of the sample in the x direction. specimenylength is the length of the specimen in the y-direction. x is the number ofratioThe length of the sample in the x direction specimenxlength and the length x of the scanning point cloud in the x direction are shown in the specificationwidthThe ratio of (a) to (b). y isratioFor the length y of the sample in the y directionafteramendLength y of scanning point cloud in y directionwidthThe ratio of (a) to (b).
5) The adjusted point coordinates are recorded in the array Amend. Wherein the first column of the array Amend is the adjusted x coordinate xafteramendAnd the second column is the adjusted y coordinate yafteramendAnd the third column is the z coordinate of the point corresponding to the x, y coordinates.
6) And selecting a calculation range, namely selecting an ordering processing area. Traversing the array Amend, and writing the ith row of the array Amend into the array Calculatarea if the point represented by the ith row is in the calculation range. The calculation range is a rectangular area which takes the center of the sample as the origin of coordinates and is defined by x and y coordinates. The minimum value of the x coordinate of the rectangular area is mincalvulatex, the maximum value of the x coordinate is maxcalculatatex, the minimum value of the y coordinate is mincalvulatey, and the maximum value of the y coordinate is maxcalculatatey.
7) And setting a sampling interval, performing linear interpolation according to the ordered point cloud sampling interval to obtain a z coordinate of a sampling point, and writing the z coordinate into an array Final. Wherein the array Final comprises xsamplingumber rows and ysamplingnumber columns. xsamplingumber is the number of samples of the ordered point cloud in the x-direction, and ysamplingnumber is the number of samples of the ordered point cloud in the y-direction. The values of xsamplingnumber and ysampllingnnumber are calculated using equation (3):
in the formula, xsamplingstep is the sampling interval of the ordered point cloud in the x direction, and ysamplingstep is the sampling interval of the ordered point cloud in the y direction.
The implementation method of the linear interpolation in the step 7) comprises the following steps:
1) and (4) calculating the coordinates (samplingx and samplingy) of the sampling point at the ith row and the jth column of the ordered point cloud. Wherein,
2) and (5) calculating the distance D between the projection of each point in the point cloud in the xoy plane and the projection of the sampling point in the xoy plane according to the formula (5). And writes the x, y, z coordinates and Distance D of the point into the 1 st to 4 th columns of the array Distance, respectively. Wherein,
3) traversing the Distance of the array, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point A; and records the x, y, z coordinates of point A and the row number R in the Distance arrayA(ii) a Assigning the array Distance to the array Interdistance, and assigning the array Interdistance to the 4 th column R in the array InterdistanceAThe row has a large value. The step can find the point A with the minimum projection distance with the sampling point in the xoy plane.
4) Traversing the array InterDistance, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point B; and records the x, y, z coordinates of point B and the line number R in the Interdistance arrayB(ii) a Assigning to the 4 th column R in the array InterDistanceBThe row has a large value.
5) Checking the x coordinates and the y coordinates of the sampling point, the point A and the point B; if the x coordinate and the y coordinate of the point B are the same as those of the point A, repeating the step 4) until the x coordinate or the y coordinate of the point B is different from that of the point A.
Through the steps 4) and 5), the point B with the second smallest projection distance with the sampling point in the xoy plane can be found, and the point B, the sampling point and the projection of the point A in the xoy plane are not overlapped.
6) Traversing the array InterDistance, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point C; and recording the x, y, z coordinates of point C and the position of point C in InterLine number R in Distance arrayC(ii) a Assigning to the 4 th column R in the array InterDistanceCThe row has a large value.
7) Referring to fig. 4, projection areas S1, S2, and S3 in the xoy plane of three triangles having the sampling point, the point a, the point B, the sampling point, the point B, the point C, and the point a as vertexes are calculated, respectively, and a projection area S in the xoy plane of a triangle having the point a, the point B, and the point C as vertexes is calculated.
8) If S is 0 or S1+ S2+ S3 ≠ S, steps 6) and 7) are repeated until S > 0 and S1+ S2+ S3 ═ S.
Through the steps 6), 7) and 8), the point C with the third small projection distance from the sampling point in the xoy plane can be found. Points A, B, C are not collinear, and there is only one plane through point A, B, C. The projections of the sample points in the xoy plane are inside or on the boundaries of a triangle having as vertices the projections of points a, B and C in the xoy plane.
9) And solving a plane equation passing through the point A, the point B and the point C at the same time.
10) And substituting the x and y coordinates of the sampling points into the plane equation in the step 9, and solving the z coordinate of the sampling points.
11) Writing the z coordinate of the sampling point in the step 10) into the ith row and the jth column of the array Final.
12) Repeating the steps 1) to 11) to calculate the z coordinate of the next sampling point until the last sampling point. The data in the array Final is the z coordinate of the ordered points with the x-direction interval of xsampling and the y-direction interval of ysampling.
The schematic diagram of the ordered point cloud and its enlarged partial point cloud obtained through the above steps are shown in fig. 5 and 6. Referring to fig. 2 and 5, the cross-sectional morphology does not change before and after the ordering treatment, the influence on the calculation result is small, and the method has strong practicability in the morphology of the rock joint surface and the mechanical research.
Claims (1)
1. An optical scanning disordered point cloud ordering processing method for a rock section is characterized by comprising the following steps:
1) performing optical scanning on the rock fracture surface by adopting an optical scanner to obtain x, y and z coordinates of the rock fracture surface series points in a coordinate system o-xyz; exporting scanning data to obtain a rock fracture surface point cloud file; the method comprises the following steps of firstly, obtaining a point cloud file, wherein the x coordinate direction is the length direction of a rock sample, the y coordinate direction is the width direction of the rock sample, and the z coordinate is the height of the midpoint of the point cloud file;
2) reading a point cloud file, and assigning the data of the point cloud to an array Original; wherein, the first row of the array origin is a point cloud x coordinate, the second row is a point cloud y coordinate, and the third row is a point cloud z coordinate;
3) traversing the first column and the second column of the array origin, searching the maximum value and the minimum value of the x coordinate and the y coordinate, and calculating according to the formula (1) to obtain the length x of the point cloud in the x directionwidthAnd length y in the y directionwidth；
In the formula, xmaxIs the maximum value of the x coordinate, xminIs the minimum value of the x coordinate, ymaxIs the maximum value of the y coordinate, yminIs the minimum value of the y coordinate;
4) adjusting the deviation of the scanning data and the actual sample and readjusting the coordinates to make the central coordinate of the sample zero; and calculating the adjusted x coordinate x according to the formula (2)afteramendAnd the adjusted y-coordinate yafteramend；
In the formula, specimenxlength is the length of the sample in the x direction; the specimenylength is the length of the sample in the y direction; x is the number ofratioThe length of the sample in the x direction specimenxlength and the length x of the scanning point cloud in the x direction are shown in the specificationwidthThe ratio of (A) to (B); y isratioFor the length y of the sample in the y directionafteramendLength y of scanning point cloud in y directionwidthThe ratio of (A) to (B);
5) recording the adjusted point coordinates into an array Amend; wherein the first column of the array Amend is toneIntegrated x coordinate xafteramendAnd the second column is the adjusted y coordinate yafteramendThe third column is the z coordinate of the point corresponding to the x and y coordinates;
6) selecting a calculation range; traversing the array Amend, and writing the ith row of the array Amend into an array Calculatarea if the point represented by the ith row is within the calculation range; the calculation range is a rectangular area which takes the center of the sample as the origin of coordinates and is defined by x and y coordinates; the minimum value of the x coordinate of the rectangular area is mincalvulatex, the maximum value of the x coordinate is maxcalculatex, the minimum value of the y coordinate is mincalvulatey, and the maximum value of the y coordinate is maxcalculatey;
7) performing linear interpolation according to the sampling interval of the ordered point cloud to obtain the z coordinate of the sampling point, and writing the z coordinate into an array Final; wherein the array Final comprises xsamplingumber rows and ysamplingnumber columns; xsamplingumber is the sampling number of the ordered point cloud in the x direction, and ysamplingnumber is the sampling number of the ordered point cloud in the y direction; the values of xsamplingnumber and ysampllingnnumber are calculated using equation (3):
in the formula, xsamplingstep is the sampling interval of the ordered point cloud in the x direction, and ysamplingstep is the sampling interval of the ordered point cloud in the y direction;
step 7) the method for realizing the linear interpolation comprises the following steps:
7-1) calculating coordinates (samplingx and samplingy) of a sampling point at the jth column of the ith row of the ordered point cloud according to a formula (4); wherein,
7-2) calculating the distance D between the projection of each point in the point cloud in the xoy plane and the projection of the sampling point in the xoy plane according to a formula (5); respectively writing the x, y, z coordinates and the Distance D of the point into the 1 st to 4 th columns of the array Distance; wherein,
7-3) traversing the Distance of the array, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point A; and records the x, y, z coordinates of point A and the row number R in the Distance arrayA(ii) a Assigning the array Distance to the array Interdistance, and assigning the array Interdistance to the 4 th column R in the array InterdistanceALine one large value;
7-4) traversing the array InterDistance, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point B; and records the x, y, z coordinates of point B and the line number R in the Interdistance arrayB(ii) a Assigning to the 4 th column R in the array InterDistanceBLine one large value;
7-5) checking the x coordinates and the y coordinates of the sampling point, the point A and the point B; if the x coordinate and the y coordinate of the point B are the same as those of the point A, repeating the step 7-4) until the x coordinate or the y coordinate of the point B is different from that of the point A;
7-6) traversing the array InterDistance, searching the minimum value in the 4 th column of the array, and recording the corresponding point as a point C; and records the x, y, z coordinates of point C and the line number R in the Interdistance arrayC(ii) a Assigning to the 4 th column R in the array InterDistanceCLine one large value;
7-7) respectively calculating projection areas S1, S2 and S3 of three triangles taking the sampling point, the point A and the point B, the sampling point, the point B and the point C as vertexes in the xoy plane, and calculating the projection area S of the triangle taking the point A, the point B and the point C as vertexes in the xoy plane;
7-8) if S ═ 0 or S1+ S2+ S3 ≠ S, repeating steps 7-6) and 7-7) until S > 0 and S1+ S2+ S3 ═ S;
7-9) solving a plane equation passing through the point A, the point B and the point C simultaneously;
7-10) substituting the x and y coordinates of the sampling points into the plane equation in the step 7-9), and solving the z coordinate of the sampling points;
7-11) writing the z coordinate of the sampling point in the step 7-10) into the ith row and the jth column of the array Final;
7-12) repeating the steps 7-1) to 7-11) to calculate the z coordinate of the next sampling point until the last sampling point; the data in the array Final is the z coordinate of the ordered points with the x-direction interval of xsampling and the y-direction interval of ysampling.
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