CN107807870A - A kind of method of testing and system of storage server mainboard power-down protection - Google Patents
A kind of method of testing and system of storage server mainboard power-down protection Download PDFInfo
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- CN107807870A CN107807870A CN201711052354.0A CN201711052354A CN107807870A CN 107807870 A CN107807870 A CN 107807870A CN 201711052354 A CN201711052354 A CN 201711052354A CN 107807870 A CN107807870 A CN 107807870A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
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Abstract
The application is that, for supporting NVDIMM storage server, this method includes on a kind of method of testing and system of storage server mainboard power-down protection：Before storage server mainboard power down, the first data are write in NVDIMM memory headroom by memset2.efi orders；Make storage server mainboard power down；After separated in time threshold value, re-power storage server mainboard；The second data in NVDIMM memory headrooms are exported by memcheck2.efi orders, and the first data and the second data are contrasted；If the first data are identical with the second data, judge that storage server mainboard power-down protection is qualified, otherwise judge that storage server mainboard power-down protection is unqualified.The system includes Data write. module, power down control module, re-powers module, data output and contrast module and power-down protection judge module.Method of testing in the application and system testing coverage rate is high, test transplantability is good and simple to operate is easy to promote.
Description
Technical field
The application is related to storage server technical field of power-down protection, more particularly to a kind of storage server mainboard power down is protected
The method of testing and system of protective function.
Background technology
Storage server is a kind of important server, predominantly specific objective and being deposited for data for designing in server
The server of storage.There is the significant data of client in the write buffer of storage server, is possible to lose after equipment burst power-off
These significant datas are lost, NVDIMM (Non-Volatile DIMM, Nonvolatile memory bar) is that one kind of data protection there are efficacious prescriptions
Case.Mainboard is the visual plant for being used for data storage in storage server again.Therefore, for support NVDIMM storage server
For, the power-down protection of storage server mainboard is tested, whether can with storage server used in checking
Data are reliably stored, the problem of being important.
In the prior art, there are some method of testings for being directed to storage server mainboard power-down protection, generally these surveys
Method for testing is based on operating system, is tested in an operating system, and testing tool used takes to storage in these method of testings
All memory spaces are tested in business device, and the workload of test is big.
However, these method of testings are because based on operating system, test transplantability is poor, method of testing behaviour in the prior art
It is inconvenient to make.And although the testing tool in these method of testings can be surveyed to all memory spaces in storage server
Examination, but NVDIMM memory headroom test coverages are not high enough, therefore testing efficiency is not high enough.
The content of the invention
Test that transplantability is poor and test coverage to NVDIMM memory headrooms present in correlation technique to overcome
The problem of not high enough, the application provide a kind of method of testing and system of storage server mainboard power-down protection.
A kind of method of testing of storage server mainboard power-down protection, for supporting NVDIMM storage server,
Comprise the following steps：
S101：Before storage server mainboard power down, write by memset2.efi orders in NVDIMM memory headroom
First data；
S102：Make storage server mainboard power down；
S103：After separated in time threshold value, re-power storage server mainboard, the time threshold is more than storage
NVDIMM carries out the time of data storage during server master board power down；
S104：The second data in NVDIMM memory headrooms are exported by memcheck2.efi orders, and by described first
Data are contrasted with the second data；
S105：If first data are identical with the second data, storage server mainboard power down protection work(is judged
Can be qualified, otherwise judge that storage server mainboard power-down protection is unqualified.
Alternatively, before step S101, methods described also includes：
S106：By memset2.efi orders and memcheck2.efi orders storage into USB flash disk；
S107：Enter USB flash disk catalogue under UEFI shell.
Alternatively, before step S101, methods described also includes：
S108：The address of all memory headrooms in storage server mainboard is inquired about by memmap orders；
S109：According to UNknow-DES-Tydpe addresses, the determination NVDIMM internal memory from the address of all memory headrooms
Space.
Alternatively, before step S101, methods described also includes：
S110：Check in NVDIMM memory headroom whether there are data by mem orders；
S111：If there are data in NVDIMM memory headroom, data are deleted；
If there is no data in NVDIMM memory headroom, step S101 is performed.
Alternatively, before the power down of storage server mainboard, after step S101, methods described also includes：
S112：Judge whether first data are partial data；
If first data are partial datas, step S102 is performed；
If first data are not partial datas, return to step S101.
System described in a kind of test system of storage server mainboard power-down protection includes：
Data write. module, for before storage server mainboard power down, by memset2.efi orders NVDIMM's
The first data are write in memory headroom；
Power down control module, after writing the first data, control storage server mainboard power down；
Module is re-powered, for separated in time threshold value after storage server mainboard power down, makes storage server master
Plate re-powers, and NVDIMM carries out the time of data storage when the time threshold is more than storage server mainboard power down；
Data output and contrast module, for exporting the in NVDIMM memory headrooms by memcheck2.efi orders
Two data, and first data are contrasted with the second data；
Power-down protection judge module, for whether identical with the second data according to the first data, judge to store
Whether the power-down protection of server master board is qualified, if first data are identical with the second data, judges storage
Server master board power-down protection is qualified, otherwise judges that storage server mainboard power-down protection is unqualified.
Alternatively, the system also includes：
Memory headroom enquiry module, for inquiring about all memory headrooms in storage server mainboard by memmap orders
Address；
NVDIMM memory headroom determining modules, for according to UNknow-DES-Tydpe addresses, from all memory headrooms
NVDIMM memory headroom is determined in address.
Alternatively, the system also includes：
Data judge module, for judging whether the first data are partial data, if the first data are partial datas, make
Power down control module is started working, if the first data are not partial datas, Data write. module is re-write the first data.
The technical scheme that embodiments herein provides can include the following benefits：
The embodiment of the present application provides a kind of method of testing of storage server mainboard power-down protection, for supporting
NVDIMM storage server, by before storage server mainboard power down, by memset2.efi orders in NVDIMM
Deposit and the first data are write in space, then make storage server mainboard power down；After separated in time threshold value, make storage server
Mainboard re-powers, then exports the second data in NVDIMM memory headrooms by memcheck2.efi orders, and by described the
One data are contrasted with the second data；It is whether identical with the second data according to the first data, to judge storage server
Whether mainboard power-down protection is qualified.Testing tool in the present embodiment is memset2.efi and memcheck2.efi, profit
It can complete to test under uefi shell with this testing tool, it is not necessary to operating system, will test in the embodiment of the present application
Instrument is put into USB flash disk, and test transplantability is relatively good.And the application uses memset2.efi and memcheck2.efi to storage
Server master board power-down protection is tested, and can reach 100% to the test coverage of NVDIMM memory headrooms, so as to
Greatly improve testing efficiency.
The embodiment of the present application provides a kind of test system of storage server mainboard power-down protection, and the system includes number
According to writing module, power down control module, re-power module, data output and contrast module and power-down protection judges mould
Block.Utilize internal memory of the memset2.efi orders in NVDIMM empty before storage server mainboard power down by Data write. module
Between the first data of middle write-in, control storage server mainboard power down secondly by power down control module, after certain interval of time, weight
Newly upper electric module re-powers storage server mainboard, and then data output and contrast module are ordered by memcheck2.efi
The second data in order output NVDIMM memory headrooms, and the first data and the second data are contrasted, finally by power down
Defencive function judge module judges whether the power-down protection of storage server mainboard is qualified.
Test system in the present embodiment carries out mainboard power down guarantor using memset2.efi and memcheck2.efi orders
Protective function is tested, memset2.efi and memcheck2.efi orders can be completed to test under uefi shell, it is not necessary to grasp
Make system, test transplantability is relatively good.And memset2.efi and memcheck2.efi orders can be realized to NVDIMM internal memories
The test coverage in space reaches 100%, so as to effectively improve testing efficiency.
It should be appreciated that the general description and following detailed description of the above are only exemplary and explanatory, not
The application can be limited.
Brief description of the drawings
Accompanying drawing herein is merged in specification and forms the part of this specification, shows the implementation for meeting the application
Example, and be used to together with specification to explain the principle of the application.
, below will be to embodiment or existing in order to illustrate more clearly of the embodiment of the present application or technical scheme of the prior art
There is the required accompanying drawing used in technology description to be briefly described, it should be apparent that, for those of ordinary skill in the art
Speech, without having to pay creative labor, other accompanying drawings can also be obtained according to these accompanying drawings.
Fig. 1 is a kind of flow of the method for testing for storage server mainboard power-down protection that the embodiment of the present application provides
Schematic diagram；
Fig. 2 is the stream of the method for testing for second of storage server mainboard power-down protection that the embodiment of the present application provides
Journey schematic diagram；
Fig. 3 is the stream of the method for testing for the third storage server mainboard power-down protection that the embodiment of the present application provides
Journey schematic diagram；
Fig. 4 is the stream of the method for testing for the 4th kind of storage server mainboard power-down protection that the embodiment of the present application provides
Journey schematic diagram；
Fig. 5 is the stream of the method for testing for the 5th kind of storage server mainboard power-down protection that the embodiment of the present application provides
Journey schematic diagram；
Fig. 6 is a kind of structure of the test system for storage server mainboard power-down protection that the embodiment of the present application provides
Schematic diagram.
Symbol represents：1- Data write. modules, 2- power down control module, 3- re-power module, 4- data outputs and right
Than module, 5- power-down protection judge modules.
Embodiment
For the technical characterstic for illustrating this programme can be understood, below by embodiment, and its accompanying drawing is combined, to this Shen
It please be described in detail.Following disclosure provides many different embodiments or example is used for realizing the different knots of the application
Structure.In order to simplify disclosure herein, hereinafter the part and setting of specific examples are described.In addition, the application can be with
Repeat reference numerals and/or letter in different examples.This repetition is that for purposes of simplicity and clarity, itself is not indicated
Relation between various embodiments are discussed and/or set.It should be noted that part illustrated in the accompanying drawings is not necessarily to scale
Draw.The application eliminates the description to known assemblies and treatment technology and process to avoid being unnecessarily limiting the application.
In order to more fully understand the application, presently filed embodiment is explained in detail below in conjunction with the accompanying drawings.
Embodiment one
Referring to Fig. 1, Fig. 1 is a kind of test side for storage server mainboard power-down protection that the embodiment of the present application provides
The schematic flow sheet of method.As shown in Figure 1, the method for testing in the present embodiment mainly comprises the following steps：
S101：Before storage server mainboard power down, write by memset2.efi orders in NVDIMM memory headroom
First data.
Memset2.efi is the testing tool that Intel is provided, because memset2.efi orders cover storage server
In all NVDIMM memory headroom, i.e.,：As long as NVDIMM memory headroom, will can own by memset2.efi orders
NVDIMM memory headroom write-in data.Therefore, first is write in NVDIMM memory headroom by memset2.efi orders
Data, write data cover NVDIMM whole memory headroom can be made, test coverage is high, can reach 100%.
Wherein, memset2.efi orders can be stored in advance independent of operating system, memset2.efi orders
Store up in server, can also be in USB flash disk be stored in.
S102：Make storage server mainboard power down.
S103：After separated in time threshold value, re-power storage server mainboard, the time threshold is more than storage
NVDIMM carries out the time of data storage during server master board power down.
Storage server mainboard power down, it is to simulate the situation that storage server in practical application powers off suddenly.Storage
It is re-powered again after server master board power down, reenters test system.Because NVDIMM enters to data storage after power down
Row storage needs certain time, therefore the time threshold between power down and upper electricity is when needing to be more than storage server mainboard power down
NVDIMM carries out the time of data storage, just can ensure that NVDIMM completes storage, is advantageous to improve the accuracy of test result.
After re-powering, step S104 is performed：The in NVDIMM memory headrooms is exported by memcheck2.efi orders
Two data, and first data are contrasted with the second data.
In the present embodiment, by memcheck2.efi orders the reading of data and verifying work can be made disposably to complete,
I.e.：It can export the second data in NVDIMM memory headrooms by memcheck2.efi orders, and by the first data and second
Data are contrasted, and this method of testing saves the testing time, are advantageous to improve testing efficiency.
S105：If first data are identical with the second data, storage server mainboard power down protection work(is judged
Can be qualified, otherwise judge that storage server mainboard power-down protection is unqualified.
Embodiment two
Referring to Fig. 2, Fig. 2 is the test for second of storage server mainboard power-down protection that the embodiment of the present application provides
The schematic flow sheet of method.The present embodiment is added before step S101 and led on the basis of embodiment illustrated in fig. 1
The process of USB flash disk.
Specifically, including step S106：By memset2.efi orders and memcheck2.efi orders storage into USB flash disk.
Step S107：Enter USB flash disk catalogue under UEFI shell.
In the present embodiment, memset2.efi orders and memcheck2.efi orders are deposited in USB flash disk, and in UEFI
Enter USB flash disk catalogue under shell, when carrying out power-down protection test for different mainboards, it is only necessary to which USB flash disk is inserted to the phase of mainboard
Interface is answered to be tested, therefore, using the method for testing in the present embodiment, test transplantability is good, and convenient test is quick.
The part that the embodiment is not described in detail can refer to the embodiment one shown in Fig. 1, between the two can mutual reference,
No longer elaborate herein.
Referring to Fig. 3, Fig. 3 is the test for the third storage server mainboard power-down protection that the embodiment of the present application provides
The schematic flow sheet of method.From the figure 3, it may be seen that the present embodiment on the basis of embodiment illustrated in fig. 2, increases before step S101
Confirm the process of NVDIMM memory headroom.Specifically comprise the following steps：
S108：The address of all memory headrooms in storage server mainboard is inquired about by memmap orders；
S109：According to UNknow-DES-Tydpe addresses, the determination NVDIMM internal memory from the address of all memory headrooms
Space.
Storage server in the present embodiment is supports NVDIMM storage server, but this storage server is usual
DIMM and NVDIMM exist simultaneously, such as：The conventional storage content of operating system is need not to use NVDIMM memory headroom
's.Taking the data of NVDIMM memory headrooms can preserve after mainboard power down, and the data for taking common DIMM memory headrooms exist
It will not be preserved after mainboard power down.Pass through above step S108-S109, it can be ensured that this method of testing is directed to NVDIMM
Memory headroom tested, be advantageous to further improve test accuracy.
Certainly, the application can also include another embodiment：On the basis of embodiment illustrated in fig. 1, directly exist
Increase the process for the memory headroom for confirming NVDIMM before step S101.Do not include step S106 and S107, but use it
Memset2.efi orders are such as directly stored in storage server mode by he in advance, are confirmed according to step S108-S109
Start to perform step S101-S105 after NVDIMM memory headroom.
The part that the embodiment is not described in detail can refer to the embodiment two shown in embodiment one and Fig. 2 shown in Fig. 1, and three
Between person can mutual reference, no longer elaborate herein.
Referring to Fig. 4, Fig. 4 is the test for the 4th kind of storage server mainboard power-down protection that the embodiment of the present application provides
The schematic flow sheet of method.As shown in Figure 4, the present embodiment increases on the basis of embodiment illustrated in fig. 3 before step S101
The step of whether being empty storage space in the memory headroom for confirming NVDIMM is added.Specifically comprise the following steps：
S110：Check in NVDIMM memory headroom whether there are data by mem orders.
Mem is an order under shell, is used together with offset address.Such as：Order in mem 3880000000,
3880000000 be offset address, and the order, which is meant, reads the data that 3880000000 addresses start.Being inputted after mem needs
Carry out the initial address of the NVDIMM of power-down protection test memory headroom.
S111：If there are data in NVDIMM memory headroom, data are deleted；If do not have in NVDIMM memory headroom
Data, perform step S101.
Completed jointly due to being cooperated in the present embodiment by memset2.efi orders and memcheck2.efi orders
The test of storage server mainboard power-down protection, after the first data are write by memset2.efi orders,
Memcheck2.efi orders can carry out staying shelves to preserve to the data in write-in NVDIMM memory headrooms, in order to subsequently export the
Two data are simultaneously contrasted the first data and the second data.If there are data in NVDIMM memory headroom, perform
When memset2.efi orders write the first data, because all NVDIMM in storage server are covered in memset2.efi orders
Memory headroom, it is generally the case that the first data can cover original data in NVDIMM memory headrooms.Inspection is added in the present embodiment
Whether have data the step of, can avoid the first data to original number in NVDIMM memory headrooms if looking into NVDIMM memory headroom
According to infull situation is covered, be advantageous to improve the accuracy of test result.
Certainly, the application can also include another embodiment：On the basis of embodiment illustrated in fig. 1, directly exist
Increase the process for the memory headroom for confirming NVDIMM before step S101, and confirm whether be stored with NVDIMM memory headrooms
The process of data, without including step S106 and S107.In this embodiment, such as directly will using other modes
Memset2.efi orders are stored in storage server in advance, and NVDIMM memory headroom is confirmed according to step S108-S109
Afterwards, confirm whether be stored with data in NVDIMM memory headrooms further according to step S110 and step S111, then start to perform step
Rapid S101-S105.
The part that the embodiment is not described in detail can refer to the embodiment shown in Fig. 1-Fig. 3, can mutual coherent between four
According to no longer elaborating herein.
Referring to Fig. 5, Fig. 5 is the test for the 5th kind of storage server mainboard power-down protection that the embodiment of the present application provides
The schematic flow sheet of method.As shown in Figure 5, after performing step S101 in the present embodiment, in addition to step S112：Described in judgement
Whether the first data are partial data；If first data are partial datas, step S102 is performed；If first number
According to not being partial data, return to step S101.
According to the format standard of data storage under corresponding scripts, the integrality of the first data is judged, one can be entered
Step improves the accuracy of test.
Referring to Fig. 6, Fig. 6 is a kind of test system for storage server mainboard power-down protection that the embodiment of the present application provides
The structural representation of system.It will be appreciated from fig. 6 that the test system in the present embodiment mainly includes Data write. module 1, power down control mould
Block 2, re-power module 3, data output and contrast module 4 and 5 five parts of power-down protection judge module.Wherein, number
It is used for according to writing module 1 before storage server mainboard power down, by memset2.efi orders in NVDIMM memory headroom
Write the first data；Power down control module 2 is used for after writing the first data, controls storage server mainboard power down；Re-power
Module 3 is used for separated in time threshold value after storage server mainboard power down, re-powers storage server mainboard, wherein,
NVDIMM carries out the time of data storage when time threshold is more than storage server mainboard power down；Data output and contrast module 4
Counted for exporting the second data in NVDIMM memory headrooms by memcheck2.efi orders, and by the first data and second
According to being contrasted；Power-down protection judge module 5 be used for according to the first data it is whether identical with the second data, judge to deposit
Whether qualified store up the power-down protection of server master board, if the first data are identical with the second data, judge storage clothes
Being engaged in, device mainboard power-down protection is qualified, and otherwise judgement storage server mainboard power-down protection is unqualified.The present embodiment
In test system, memset2.efi orders, and data output and contrast module 4 is used to use by Data write. module 1
Memcheck2.efi orders, the collocation of two modules using carrying out mainboard power-down protection tests, due to memset2.efi and
Memcheck2.efi orders can be completed to test under uefi shell, it is not necessary to operating system, therefore the survey of this test system
It is relatively good to try transplantability.And memset2.efi and memcheck2.efi orders can realize the test to NVDIMM memory headrooms
Coverage rate reaches 100%, so as to effectively improve testing efficiency.
Further, the test system in the present embodiment can also include memory headroom enquiry module and NVDIMM internal memories are empty
Between determining module.Wherein, memory headroom enquiry module is used for by all interior in memmap orders inquiry storage server mainboard
Deposit the address in space；NVDIMM memory headrooms determining module is used for according to UNknow-DES-Tydpe addresses, empty from all internal memories
Between address in determine NVDIMM memory headroom.Memory headroom enquiry module and NVDIMM memory headrooms determining module can be entered
One step improves test accuracy, and ensures that this test system is tested for NVDIMM memory headroom, is advantageous to save and surveys
Try the time.
Further, the test system in the present embodiment also includes data judge module, for whether judging the first data
For partial data, if the first data are partial datas, power down control module is set to start working, if the first data are not complete
Data, Data write. module is set to re-write the first data.The setting of data judge module, can be according to storing under corresponding scripts
The format standard of data, the integrality of the first data is judged, so as to further improve the accuracy of test.
The method of testing of storage server mainboard power-down protection and principle are real shown in Fig. 1-Fig. 5 in the present embodiment
Apply in example and be discussed in detail, will not be repeated here.
The optional embodiment of simply the application described above, for those skilled in the art,
On the premise of not departing from the application principle, some improvements and modifications can also be made, these improvements and modifications are also regarded as this Shen
Protection domain please.
Claims (8)
1. a kind of method of testing of storage server mainboard power-down protection, for supporting NVDIMM storage server, its
It is characterized in, comprises the following steps：
S101：Before storage server mainboard power down, first is write in NVDIMM memory headroom by memset2.efi orders
Data；
S102：Make storage server mainboard power down；
S103：After separated in time threshold value, re-power storage server mainboard, the time threshold is more than storage service
NVDIMM carries out the time of data storage during device mainboard power down；
S104：The second data in NVDIMM memory headrooms are exported by memcheck2.efi orders, and by first data
Contrasted with the second data；
S105：If first data are identical with the second data, judge that storage server mainboard power-down protection closes
Lattice, otherwise judge that storage server mainboard power-down protection is unqualified.
2. a kind of method of testing of storage server mainboard power-down protection as claimed in claim 1, it is characterized in that, step
Before S101, methods described also includes：
S106：By memset2.efi orders and memcheck2.efi orders storage into USB flash disk；
S107：Enter USB flash disk catalogue under UEFI shell.
3. a kind of method of testing of storage server mainboard power-down protection as claimed in claim 1 or 2, it is characterized in that,
Before step S101, methods described also includes：
S108：The address of all memory headrooms in storage server mainboard is inquired about by memmap orders；
S109：According to UNknow-DES-Tydpe addresses, the determination NVDIMM memory headroom from the address of all memory headrooms.
4. a kind of method of testing of storage server mainboard power-down protection as claimed in claim 3, it is characterized in that, step
Before S101, methods described also includes：
S110：Check in NVDIMM memory headroom whether there are data by mem orders；
S111：If there are data in NVDIMM memory headroom, data are deleted；
If there is no data in NVDIMM memory headroom, step S101 is performed.
5. a kind of method of testing of storage server mainboard power-down protection as claimed in claim 1 or 2, it is characterized in that,
Before storage server mainboard power down, after step S101, methods described also includes：
S112：Judge whether first data are partial data；
If first data are partial datas, step S102 is performed；
If first data are not partial datas, return to step S101.
6. a kind of test system of storage server mainboard power-down protection, it is characterized in that, the system includes：
Data write. module, for before storage server mainboard power down, by memset2.efi orders NVDIMM internal memory
The first data are write in space；
Power down control module, after writing the first data, control storage server mainboard power down；
Module is re-powered, for separated in time threshold value after storage server mainboard power down, makes storage server mainboard weight
New upper electricity, NVDIMM carries out the time of data storage when the time threshold is more than storage server mainboard power down；
Data output and contrast module, for exporting the second number in NVDIMM memory headrooms by memcheck2.efi orders
According to, and first data are contrasted with the second data；
Power-down protection judge module, for whether identical with the second data according to the first data, judge storage service
Whether the power-down protection of device mainboard is qualified, if first data are identical with the second data, judges storage service
Device mainboard power-down protection is qualified, otherwise judges that storage server mainboard power-down protection is unqualified.
7. a kind of test system of storage server mainboard power-down protection as claimed in claim 6, it is characterized in that, it is described
System also includes：
Memory headroom enquiry module, for inquiring about the ground of all memory headrooms in storage server mainboard by memmap orders
Location；
NVDIMM memory headroom determining modules, for according to UNknow-DES-Tydpe addresses, from the address of all memory headrooms
Middle determination NVDIMM memory headroom.
8. a kind of test system of storage server mainboard power-down protection as described in any one in claim 6-7,
It is characterized in that the system also includes：
Data judge module, for judging whether the first data are partial data, if the first data are partial datas, make power down
Control module is started working, if the first data are not partial datas, Data write. module is re-write the first data.
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| CN201711052354.0A CN107807870B (en) | 2017-10-30 | 2017-10-30 | Method and system for testing power-down protection function of storage server mainboard |
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| CN201711052354.0A CN107807870B (en) | 2017-10-30 | 2017-10-30 | Method and system for testing power-down protection function of storage server mainboard |
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| CN (1) | CN107807870B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108845903A (en) * | 2018-06-20 | 2018-11-20 | 郑州云海信息技术有限公司 | A kind of method and device for testing NVDIMM power-off protection function |
| CN110739025A (en) * | 2019-09-30 | 2020-01-31 | 广州妙存科技有限公司 | storage equipment power failure test method, device and system |
| CN111897685A (en) * | 2020-07-29 | 2020-11-06 | 深圳佰维存储科技股份有限公司 | Method and device for checking data in power failure, storage medium and electronic equipment |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1628284A (en) * | 2002-05-31 | 2005-06-15 | 先进微装置公司 | Secure execution mode exceptions |
| CN102053885A (en) * | 2009-10-27 | 2011-05-11 | 英业达股份有限公司 | Test system and test method for computer device without storage device |
| CN104021093A (en) * | 2014-06-24 | 2014-09-03 | 浪潮集团有限公司 | Power-down protection method for memory device based on NVDIMM (non-volatile dual in-line memory module) |
| CN106683706A (en) * | 2017-01-05 | 2017-05-17 | 郑州云海信息技术有限公司 | Testing method of NVDIMM_ADR function |
| CN107122273A (en) * | 2017-04-28 | 2017-09-01 | 郑州云海信息技术有限公司 | A kind of method that NVDIMM functional tests are carried out under shell |
| CN107133125A (en) * | 2017-05-02 | 2017-09-05 | 郑州云海信息技术有限公司 | A kind of method of automatic test NVDIMM data protection stability |
-
2017
- 2017-10-30 CN CN201711052354.0A patent/CN107807870B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1628284A (en) * | 2002-05-31 | 2005-06-15 | 先进微装置公司 | Secure execution mode exceptions |
| CN102053885A (en) * | 2009-10-27 | 2011-05-11 | 英业达股份有限公司 | Test system and test method for computer device without storage device |
| CN104021093A (en) * | 2014-06-24 | 2014-09-03 | 浪潮集团有限公司 | Power-down protection method for memory device based on NVDIMM (non-volatile dual in-line memory module) |
| CN106683706A (en) * | 2017-01-05 | 2017-05-17 | 郑州云海信息技术有限公司 | Testing method of NVDIMM_ADR function |
| CN107122273A (en) * | 2017-04-28 | 2017-09-01 | 郑州云海信息技术有限公司 | A kind of method that NVDIMM functional tests are carried out under shell |
| CN107133125A (en) * | 2017-05-02 | 2017-09-05 | 郑州云海信息技术有限公司 | A kind of method of automatic test NVDIMM data protection stability |
Non-Patent Citations (1)
| Title |
|---|
| 蔡志强等: "一种基于虚拟机的动态内存泄露检测方法", 《计算机应用与软件》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108845903A (en) * | 2018-06-20 | 2018-11-20 | 郑州云海信息技术有限公司 | A kind of method and device for testing NVDIMM power-off protection function |
| CN110739025A (en) * | 2019-09-30 | 2020-01-31 | 广州妙存科技有限公司 | storage equipment power failure test method, device and system |
| CN110739025B (en) * | 2019-09-30 | 2021-09-21 | 广州妙存科技有限公司 | Power failure test method, device and system for storage equipment |
| CN111897685A (en) * | 2020-07-29 | 2020-11-06 | 深圳佰维存储科技股份有限公司 | Method and device for checking data in power failure, storage medium and electronic equipment |
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