CN107806820A - A kind of method of the reflectance factor and phase of regulation and control atomic raster - Google Patents
A kind of method of the reflectance factor and phase of regulation and control atomic raster Download PDFInfo
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Abstract
The present invention relates to a kind of regulation and control atomic raster reflectance factor and the method for phase,It is characterized in that realize the regulation and control to atomic raster reflectance factor and phase by manipulating the parameter of laser in atomic raster forming process,Wherein,The reflectance factor of atomic raster is realized by controlling laser with atom action time length,The phase of atomic raster is by controlling phase in-migration caused by the frequency change of laser to realize,The achievable atomic raster reflectance factor of the present invention and atomic raster phase it is continuous,Accurate adjustment,The separately adjustable of atomic raster reflectance factor and phase can be realized simultaneously,In addition,The present invention is not related to the motion of mechanical structure,Avoid thus caused vibration,Hysteresis error,Hysterisis error,It is easy with regulation and control method,Can continuously it regulate and control,Control accuracy is high,Adjust the advantages that multiplicity is high,Regulation and control available for atomic raster in accurate measurement.
Description
Technical Field
The invention relates to the technical field of atomic optical instruments, in particular to a method for regulating and controlling the reflection coefficient and the phase of an atomic grating, which can be used for regulating and controlling the atomic grating in precision measurement.
Background
Photonic crystals are periodic nanostructures that can manipulate photons like semiconductors manipulate electrons, and have been vigorously developed over the last 30 years. Photonic crystals can be classified into one-dimensional, two-dimensional, and three-dimensional according to structural characteristics. One-dimensional photonic crystals, commonly referred to as bragg gratings, are typically fabricated using nanofabrication processes, including etching and self-assembly, or a combination of both. In one-dimensional bragg gratings, gratings having a grating period close to the range of visible light to near infrared have wide and important applications in the fields of optics, communications, biomedicine and precision measurement. In these applications, the reflection coefficient, period and phase of the grating need to be optimized and adjusted. The adjustment of the reflection coefficient and the period is realized by controlling relevant parameters of a grating manufacturing process, and the adjustment of the phase is realized by adopting a high-precision mechanical translation stage. However, the steps required to rework the grating are complex and time consuming, resulting in increased costs for adjusting the grating period and reflection coefficient; meanwhile, the high-precision mechanical translation stage is not free from vibration and hysteresis phenomena in the moving process, so that the repeatability of phase regulation is poor. In the last 10 years, with the gradual and deep research on quantum optics and atomic physics, an atomic-based Bragg grating can be constructed by adopting an atomic interferometer. The atomic grating is realized by adopting a Talbot-Lau atomic interferometer: firstly, atoms, generally alkali metal atoms or alkaline earth metal atoms, are cooled to form a coherent cold atom source, and the temperature of the coherent cold atom source is reduced to the Doppler cooling limit or even lower to form a bose einstein condensation state; and then two beams of oppositely emitted laser are utilized to form standing wave pulses to diffract the cooled atom source, after two times of diffraction of the standing wave pulses with the interval of T, the atom grating is formed at the time of 2T, the duration is in the order of mu s, the grating period is the period lambda/2 of the standing wave of the laser, and lambda is the laser wavelength forming the standing wave. Although such atomic gratings have a short duration, they are easy and time-consuming to fabricate (about 1 s), and can be repeatedly fabricated to achieve long-term measurement applications. Moreover, by controlling the wavelength lambda of the standing wave laser, the period lambda/2 of the atomic grating can be changed; and the high-order atomic grating with the period of lambda/4, lambda/8 and the like can be formed by controlling the coherence time and other methods, so that the adjustment requirement on the grating period in practical application is met. In the aspect of adjusting and controlling the reflection coefficient of the grating, the reflection coefficient of the grating can be adjusted and controlled by changing the time interval T of the first standing wave pulse and the second standing wave pulse, but at the same time, the evolution of atoms between the two pulse intervals also changes, so that the phase of the atomic grating changes, which is not in accordance with the requirement that the reflection coefficient and the phase of the grating can be respectively adjusted in practical application.
Disclosure of Invention
The invention provides a method for independently regulating and controlling the reflection coefficient and the phase of an atomic grating.
The solution of the invention is as follows:
firstly, forming an atomic grating by using a two-pulse Talbot-Lau atomic interferometer, wherein the two pulses are a first standing wave pulse and a second standing wave pulse respectively; the method is characterized in that:
the reflection coefficient of the atomic grating is regulated and controlled by controlling the action time of the second standing wave pulse; the reflection coefficient R of the atomic grating is proportional to the amplitude ρ (x, Δ t) of the atomic grating, and the relationship is:
where Δ T = T-2T is the time window in which the atomic grating is present, T is the atomic grating evolution time, T is the time interval between the first standing wave pulse and the second standing wave pulse, u is the most probable rate of the atomic sample along the x-axis, Q is the equivalent wave vector of the diffracted standing wave pulse that forms the interferometer, J 2 (x) Is a second order Bessel function, Θ 2 = Ω τ is the area of action of the second pulse, τ is the action time of the second standing wave pulse, Ω is the two-photon ratiometric oscillation frequency, ω is the second standing wave pulse Q Is a double atomThe photon recoil oscillation frequency phi is the phase of the atomic grating; changing the action area theta of the second standing wave pulse by changing the action time tau of the second standing wave pulse 2 Thereby changing the reflection coefficient R of the atomic grating;
regulating and controlling the phase of the atomic grating by controlling the phase change of the second standing wave pulse relative to the first standing wave pulse; the phase formula of the atomic grating is:
wherein a is the acceleration along the pulse direction of the first and second standing waves,is the phase of the i-th standing wave pulse (i =1 or 2).
In the method for regulating and controlling the reflection coefficient and the phase of the atomic grating, the atomic interferometer adopts alkali metal atoms as an atomic source, and the atomic source needs to be in a state after laser cooling or a state of a Bose Einstein condensate; the atomic interferometer has a timing sequence of { T } 1 ＝0,T 2 And = T }, wherein the first standing wave pulse is a standing wave pulse formed by two beams of laser, and the pulse action area theta is 1 Is 2 to 10; the second standing wave pulse is a standing wave pulse formed by two beams of laser, and the pulse action area theta 2 About 2; the atomic grating is formed at time T =2T and has a duration of about 4 mus.
In the method for regulating and controlling the reflection coefficient and the phase of the atomic grating, the action time of the second standing wave pulse is controlled by respectively adopting two Acousto-optic modulators (AOMs) to control two beams of laser forming the second standing wave pulse, and the on-off of the radio frequency drive of the two AOMs is simultaneously controlled by using a high-speed radio frequency switch, so that the control of the on-off time of the two beams of laser, namely the standing wave pulse is realized, wherein the on-off time (10-90%) of the high-speed radio frequency switch is less than 20ns.
In the method for regulating and controlling the reflection coefficient and the phase of the atomic grating, the second standing wave pulse phaseThe phase difference control method for the first standing wave pulse comprises the steps of respectively adopting two AOMs to control two beams of laser forming the second standing wave pulse, adjusting the frequency difference delta f of the driving sources corresponding to the two AOMs, and controlling the accumulation time T of the frequency difference d Obtaining the phase difference of the second pulse relative to the first pulse
After the cooled atomic substance wave is subjected to the action of two standing wave pulses on a time domain, an atomic grating is formed at a specific time point, and the phenomenon is called a Talbot-Lau phenomenon of atoms and is also called a grating echo effect. The basic principle is similar to the Talbot-Lau effect on optics, and belongs to a near field diffraction phenomenon. Considering an atomic monochromatic wave, with momentum p, it can be expressed as:
the atoms are acted by standing wave pulses formed by laser, and the action time meets the Raman-Nath approximate condition, namely the displacement of the atoms relative to the standing wave pulses during the interaction is not considered. The wave function of the available atoms after being subjected to the standing wave pulse becomes (the time t =0 is subjected to the standing wave pulse):
then, atoms freely evolve in space until receiving the action of the second standing wave pulse, the evolution time is T, and the wave function is as follows:
in the formula, after the second standing wave pulse action, the atomic wave function becomes:
then, atoms freely evolve in space, and near the 2T moment, atomic waves form atomic interference fringes, namely an atomic grating. Considering that the momentum distribution of atoms conforms to the boltzmann distribution, the density distribution of atoms in space can be written as:
wherein the echo time t echo ＝(1-N 2 /N 1 ) T is the time of occurrence of the atomic grating, when N 2 If =1, the atomic grating period is 2 pi/Q = λ/2 before and after T = 2T;it can be seen that the atoms form a periodic structure in space, i.e. an atomic grating. The reflection coefficient R of an atomic grating is proportional to the amplitude of the atomic grating:
by changing the action area theta of the second standing wave pulse 2 And further controlling the reflection coefficient of the atomic grating. The principle is as follows: the atomic grating is formed by the interference of two groups of atoms diffracted by the second standing wave pulse, the total number of the two groups of atoms is constant, and at the position where tau takes the optimal value, the diffraction of the second standing wave pulse enables the number of the two groups of atoms participating in the formation of the atomic grating to be equal, so that the reflection coefficient of the formed atomic grating obtains the maximum value; when tau deviates from the optimum value, the numbers of atoms of the two groups are unequal, and the reflection coefficient of the atomic grating is determined by the number of the atomic groups with the smallest number.
According to the principle of the fisherman path integration, the phase of an atomic grating can be written as:
if the two lasers forming the grating have frequency deviation delta f after the first standing wave pulse action is finished and before the second standing wave pulse action, the duration time of the frequency deviation is T d The phase difference of the second standing wave pulse compared with the first standing wave pulse
The phase difference is finally reflected in the phase of the atomic grating, and the specific expression of the modified phase phi' is as follows:
therefore, the frequency difference Δ f and the accumulation time T of the two laser beams forming the standing wave pulse are controlled d The phase deviation of the second standing wave pulse relative to the first standing wave pulse can be controlled, and then the control of the atomic grating phase can be achieved. The principle is as follows: the second standing wave pulse diffracts the atomic substance wave as a phase grating, and transmits its own phase to the atomic substance wave while changing the fluctuation amount of the atomic substance. The atomic species wave carrying the second pulse phase interferes to form an atomic grating, which phase is ultimately represented on the atomic grating.
Compared with the prior art, the invention has the advantages that:
(1) The invention can realize the independent adjustment of the reflection coefficient and the phase of the atomic grating.
According to the analysis of the principle, the number of atoms participating in forming the atomic grating can be adjusted by adjusting the action time of the second standing wave pulse, so that the purpose of adjusting the reflection coefficient of the atomic grating is achieved; whereas the adjustment of the phase of the atomic grating is only related to the phase of the pulse, independent of the pulse action time. Compared with the existing method for adjusting the reflection coefficient of the atomic grating by changing the interval T between two pulses and causing the phase deviation of the atomic grating, the method has the advantage of realizing the independent adjustment of the reflection coefficient and the phase.
(2) The invention has high phase regulation precision and good repeatability, and does not relate to mechanical movement.
From the above principle analysis, it is found that the atomic grating phase can be shifted by adjusting the frequency difference between the two laser beams constituting the second standing wave pulse. Compared with a method of moving the grating in space by adopting a mechanical translation stage, the method avoids vibration, hysteresis error and return error caused by control, mechanical structure and the like in the moving process of the mechanical translation stage, and has the characteristic of good repeatability; meanwhile, the laser frequency is very high in adjustment precision, so that the phase adjustment of milliradian can be realized, the spatial movement corresponding to the atomic grating is in nanometer level or even sub-nanometer level, the limit of the existing high-precision translation stage is broken through, and the high-precision translation stage has very high adjustment precision.
Drawings
FIG. 1 is a flow chart of a method of modulating the reflection coefficient and phase of an atomic grating according to the present invention;
FIG. 2 is a comparison graph of experimental results and theoretical calculations for adjusting the reflection coefficient of an atomic grating in accordance with the present invention;
FIG. 3 is a graph comparing the phase adjustment results of the atomic grating in the present invention with theoretical calculations.
Detailed Description
Fig. 1 is an auxiliary flowchart illustrating the method for adjusting and controlling the reflection coefficient and phase of the atomic grating according to the present invention. Firstly, preparing cold atom source to form cold atom group or Bose EinsteinA condensed state; applying a first standing wave pulse action to the prepared atomic source, wherein the standing wave pulse is a standing wave laser grating formed by two beams of laser, and the pulse action area theta is 1 Is 2 to 10; after the interval T, a second standing wave pulse is applied, the standing wave is a standing wave laser grating formed by two beams of laser, and the pulse action area theta is 2 Is about 2. After a further interval T, an atomic grating is formed in space. The detection of the atomic grating adopts a Bragg backscattering method, and the backscattering light carries information of the phase phi and the reflection coefficient R of the atomic grating; and then, carrying out information calculation on the obtained back detection light by using an optical heterodyne method, specifically, carrying out beat frequency on a beam of local oscillation light with stable phase and back scattering light, and obtaining the information of the yard grating and the reflection coefficient by analyzing the phase and the amplitude of a beat frequency signal. The pulse action area theta is adjusted by regulating and controlling the action time of the second standing wave pulse 2 The reflection coefficient R of the atomic grating can be regulated and controlled; by regulating the frequency difference delta f of the two laser beams of the second standing wave pulse and controlling the accumulation time T of the frequency difference d Obtaining the phase difference of the second pulse relative to the first pulseThereby changing the phase of the atomic gratingWhere φ is the atomic grating phase before being changed.
The following description will be made of a specific embodiment of the present invention by taking a cesium atom Talbot-Lau interferometer as an example. Firstly, capturing and cooling cesium atoms from background thermal atoms by adopting a magneto-optical trap method; when the number of magneto-optical traps reaches about 10 9 And then, cutting off the current of the magneto-optical trap coil, and turning off the cooling light and the anti-pumping light to obtain cold atomic groups. Wherein the frequency of the cooling light is | F =4>→|F'＝5&Detuned-2 Γ (natural line width, Γ =2 π × 5.234 MHz); frequency of anti-pumping light is | F =3>→|F'＝4&And 0, detuning. The cooling light was turned off 4ms later than the back pumping light, so that the atoms in the cold radical were at | F =3&And (d) drying the steel. Two laser beams E are oppositely directed in the direction perpendicular to the gravity a And E b The two laser beams have the same frequency and are all | F =3>→|F'＝4> +200MHz detuning; the cross section width is 2mm (gauss radius), and the two laser beams are overlapped in space to form standing wave pulse and ensure that the atomic group is positioned at the center of the cross section of the laser. Applying a first beam of standing wave pulse to the prepared cesium cold atom source, wherein the pulse action area theta is 1 =4; after the interval T =137 μ s, a second beam standing wave pulse is applied to control the action area theta of the second beam pulse 2 =2, and after T =137 μ s further, an atomic grating is formed in space. The detection of the atomic grating adopts a Bragg backscattering method, and E is opened in each 2 mu s time window behind 2T =274 mu s a At this time E a The power attenuation of (A) is 1/2 of the previous one, due to the presence of the atomic grating, E a Will be back-scattered by the atomic grating, the scattered light is along E b Direction; at the same time, E b Opening, E b Frequency shift E of a The frequency of (4 MHz) is attenuated to 1 μ W. E b Coincident with the back-scattered light, and converge on an Avalanche Photodiode (APD) to form interference, and due to the limitation of the APD bandwidth, only E can be detected b And the difference frequency information of the signal light, namely, the oscillation signal of 4 MHz. The light intensity of the scattered light is in direct proportion to the amplitude of the atomic grating and further in direct proportion to the reflection coefficient of the atomic grating, and the phase of the scattered light carries the phase information of the atomic grating, so that the amplitude of the oscillation signal received by the APD is in direct proportion to the amplitude of the atomic grating, and the phase is the phase of the atomic grating.
Two beams of laser forming standing wave pulses are controlled by two AOMs respectively. The on-off of the radio frequency drive of the two AOMs is controlled by one high-speed radio frequency switch, so that the control of the on-off time of two beams of laser, namely standing wave pulses, is realized. FIG. 2 is a comparison of experimental results of atomic grating reflection coefficient controlled by second pulse action time with theoretical calculations, where scatter is normalized grating reflection coefficient and solid line is theoretical calculations. The on-off time of the AOM is controlled from 50ns to 650ns, and the backscattering signal of the atomic grating is observed. It can be seen that when the action time of the second standing wave pulse is 400ns, the backscattering signal of the atomic grating, i.e. the reflection coefficient of the atomic grating, reaches a maximum value; the adjustment of the reflection coefficient of the atomic grating from 0 to the maximum value in the whole range can be realized by adjusting the action time, and the experimental result is consistent with the calculation result of a theoretical formula. The experimental result verifies the feasibility of the method.
The driving sources for controlling the two AOMs are locked on an atomic clock, the frequency difference of any one of the AOM driving sources can be respectively controlled, and the phase of the second pulse is changed relative to the first pulse. Fig. 3 reflects the phase of the atomic grating versus the frequency adjustment voltage of the AOM drive source. Wherein (a) and (b) are used for adjusting two laser beams E respectively a 、E b The round dots represent experimental data of atomic grating phases, the solid lines represent fitting of the experimental data of the phases, and the squares represent signal amplitudes of corresponding atomic gratings; the inner graph represents the fit residuals. Let Δ f a ，Δf b Are respectively E a And E b When the two beams of laser deviate from the original frequency value, delta f = delta f a -Δf b . In the experiment, T =3.775ms was selected, the frequency adjustment voltage was applied from 0.5ms after the end of the first pulse, and E was adjusted a (E b ) While maintaining E b (E a ) The frequency is not changed. The calibration calculation shows that the deviation of the applied voltage and the frequency is 0.0759Rad/mV. Fitting the data of FIG. 3 (a) yields E a The applied voltage-to-frequency deviation relationship of (a) is 0.076 (1) Rad/mV, and fitting the data of FIG. 3 (b) yields E b The applied voltage to frequency deviation relationship of-0.0761 (6) Rad/mV, consistent with the theoretical prediction. Meanwhile, it can be seen that, in the process of adjusting the frequency of the atomic grating, the backscattering signal of the atomic grating remains stable, that is, the reflection coefficient of the atomic grating is unchanged. The experimental result verifies the correctness of the method.
Claims (5)
1. A method for regulating and controlling the reflection coefficient and the phase of an atomic grating comprises the steps of firstly, forming the atomic grating by utilizing a two-pulse Talbot-Lau atomic interferometer, wherein the two pulses are a first standing wave pulse and a second standing wave pulse respectively; the method is characterized in that:
(1) The reflection coefficient of the atomic grating is regulated and controlled by controlling the action time of the second standing wave pulse; the reflection coefficient R of the atomic grating is proportional to the amplitude ρ (x, Δ t) of the atomic grating, and the relationship is:
where Δ T = T-2T is the time window in which the atomic grating is present, T is the atomic grating evolution time, T is the time interval between the first standing wave pulse and the second standing wave pulse, u is the most probable rate of the atomic sample along the x-axis, Q is the equivalent wave vector of the diffracted standing wave pulse that forms the interferometer, J 2 (x) Is a second order Bessel function, Θ 2 = Ω τ is the area of action of the second pulse, τ is the time of action of the second standing wave pulse, Ω is the two-photon ratiometric oscillation frequency, ω is the second standing wave pulse Q Is the atom two-photon recoil oscillation frequency, phi is the phase of the atom grating; changing the action area theta of the second standing wave pulse by changing the action time tau of the second standing wave pulse 2 Thereby changing the reflection coefficient R of the atomic grating;
(2) Regulating and controlling the phase of the atomic grating by controlling the phase change of the second standing wave pulse relative to the first standing wave pulse; the phase formula of the atomic grating is:
wherein a is the acceleration along the pulse direction of the first and second standing waves,is the phase of the i-th standing wave pulse (i =1 or 2).
2. The method for regulating and controlling the reflection coefficient and phase of an atomic grating according to claim 1, wherein: the atomic interferometer adopts alkali metal atoms as an atom source, and the atom source needs to be in excitationA state after light cooling or a state of a Bose Einstein aggregate; the atomic interferometer has a time sequence of { T } 1 ＝0,T 2 The first standing wave pulse is a standing wave laser grating formed by two beams of laser, and the pulse action area theta is larger than that of the first standing wave pulse 1 Is 2 to 10; the second standing wave pulse is a standing wave laser grating formed by two beams of laser, and the pulse action area theta 2 About 2; the atomic grating is formed at time T =2T and has a duration of about 4 mus.
3. The method of modulating the reflection coefficient and phase of an atomic grating as recited in claim 1, wherein: the action time of the second standing wave pulse is controlled by two acousto-optic modulators to form two beams of laser of the second standing wave pulse, and the on-off of the radio frequency drive of the two acousto-optic modulators is controlled by a high-speed radio frequency switch simultaneously, so that the control of the on-off time of the two beams of laser, namely the standing wave pulse is realized, wherein the on-off time (10-90%) of the high-speed radio frequency switch is less than 20ns.
4. The method of modulating the reflection coefficient and phase of an atomic grating as recited in claim 1, wherein: the phase difference control method of the second standing wave pulse relative to the first standing wave pulse comprises the steps of respectively adopting two acousto-optic modulators to control two beams of laser forming the second standing wave pulse, adjusting the frequency difference delta f of the driving sources corresponding to the two AOMs, and controlling the accumulation time T of the frequency difference d Obtaining the phase difference of the second pulse relative to the first pulse
5. The method of claim 4, wherein the reflection coefficient and phase of the atomic grating are adjusted according to the phase differenceThe final phase phi' of the computed atomic grating is obtained:
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108981766A (en) * | 2018-07-16 | 2018-12-11 | 北京航空航天大学 | A kind of control method of Talbot-Lau atomic interferometer |
| CN111045070A (en) * | 2019-11-26 | 2020-04-21 | 浙江大学 | System and method for measuring captured cold atoms based on differential interferometer |
| CN111912338A (en) * | 2020-06-29 | 2020-11-10 | 山西大学 | Displacement measurement device and method based on electromagnetic induction transparent atomic grating |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5355218A (en) * | 1991-12-11 | 1994-10-11 | Agency Of Industrial Science And Technology | Shearing interferometer for measuring lens lateral aberration |
| CN1371001A (en) * | 2002-03-19 | 2002-09-25 | 李恩林 | Grating fabricating equipment and process |
| CN1388889A (en) * | 2000-01-26 | 2003-01-01 | 音质技术公司 | Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| CN103698983A (en) * | 2013-12-17 | 2014-04-02 | 中国科学院长春光学精密机械与物理研究所 | Holographic grating exposed interference fringe phase shifting and locking device |
| CN106482633A (en) * | 2015-08-24 | 2017-03-08 | 南京理工大学 | A kind of multiple-beam interference phase extraction method based on π/4 phase shift |
| CN107131902A (en) * | 2017-05-31 | 2017-09-05 | 北京航空航天大学 | A kind of scaling method for light ball modulator peak retardation |
-
2017
- 2017-10-20 CN CN201710989583.9A patent/CN107806820B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5355218A (en) * | 1991-12-11 | 1994-10-11 | Agency Of Industrial Science And Technology | Shearing interferometer for measuring lens lateral aberration |
| CN1388889A (en) * | 2000-01-26 | 2003-01-01 | 音质技术公司 | Caching of intra-layer calculations for rapid rigorous coupled-wave analyses |
| CN1371001A (en) * | 2002-03-19 | 2002-09-25 | 李恩林 | Grating fabricating equipment and process |
| CN103698983A (en) * | 2013-12-17 | 2014-04-02 | 中国科学院长春光学精密机械与物理研究所 | Holographic grating exposed interference fringe phase shifting and locking device |
| CN106482633A (en) * | 2015-08-24 | 2017-03-08 | 南京理工大学 | A kind of multiple-beam interference phase extraction method based on π/4 phase shift |
| CN107131902A (en) * | 2017-05-31 | 2017-09-05 | 北京航空航天大学 | A kind of scaling method for light ball modulator peak retardation |
Non-Patent Citations (1)
| Title |
|---|
| 吕昌贵: "光纤布拉格光栅法布里_珀罗腔纵模特性研究", 《物理学报》 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108981766A (en) * | 2018-07-16 | 2018-12-11 | 北京航空航天大学 | A kind of control method of Talbot-Lau atomic interferometer |
| CN111045070A (en) * | 2019-11-26 | 2020-04-21 | 浙江大学 | System and method for measuring captured cold atoms based on differential interferometer |
| CN111912338A (en) * | 2020-06-29 | 2020-11-10 | 山西大学 | Displacement measurement device and method based on electromagnetic induction transparent atomic grating |
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