CN107765194B - Explosion flash lamp tester - Google Patents
Explosion flash lamp tester Download PDFInfo
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- CN107765194B CN107765194B CN201710929555.8A CN201710929555A CN107765194B CN 107765194 B CN107765194 B CN 107765194B CN 201710929555 A CN201710929555 A CN 201710929555A CN 107765194 B CN107765194 B CN 107765194B
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- singlechip
- resistor
- power supply
- explosion
- lamp
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02B—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
- Y02B20/00—Energy efficient lighting technologies, e.g. halogen lamps or gas discharge lamps
- Y02B20/40—Control techniques providing energy savings, e.g. smart controller or presence detection
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- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The utility model discloses an explosion flash tester, which comprises an external casing and a singlechip, wherein the singlechip outputs a trigger signal to trigger the explosion flash to explode, and then the explosion flash signal of the explosion flash lamp acquired by a photosensitive sensor is processed by the singlechip and then is output and displayed, and a test result is stored, and the external casing is provided with a light receiving window and a display window of the photosensitive sensor. The utility model adopts the photosensitive sensor to measure whether the lamp emits light or not instead of whether the lamp is triggered, is a non-contact test, does not need to disassemble the lamp, can save the workload and the labor cost, and has small volume, can be held by hand and is convenient to carry.
Description
Technical Field
The utility model relates to an explosion flash tester.
Background
The field test of the traffic burst lamp is a problem which always puzzles the industry, for the production factory of the burst lamp, a complete set of test instruments are arranged, and the test is not problematic, but the test instruments are large and heavy, for the construction site of the burst lamp, the work is generally performed at high altitude, and the desk type test instruments used by the factory cannot be moved to the construction site, so that the hand-held and portable test instruments are needed.
The existing explosion lamp test has the following problems besides huge volume and heaviness:
1. the voltage at two ends of the energy storage capacitor is tested to judge whether the capacitor is discharged by the lamp tube or not so as to infer whether the lamp tube is lighted or not, in practice, whether the lamp is triggered or not can only be tested, if the lamp tube is damaged, the energy storage capacitor is leaked, and the like, the energy storage capacitor can still be discharged, so that whether the lamp is lighted or not can not be detected, and the aging degree can not be detected.
2. Contact measurement requires disassembly of the lamp to measure the voltage across the storage capacitor, which increases effort and labor costs. The trigger pulse of the lamp is input into the singlechip for test reference, which also requires the lamp to be disassembled, and the workload and the labor cost are increased.
3. The test result is sent out through the serial port, and the test result can be known by the computer side.
4. Only gas flash lamps can be tested.
Disclosure of Invention
The utility model aims to overcome the defects of the prior art and provides an explosion flash tester.
The technical scheme adopted for solving the technical problems is as follows:
the utility model provides a burst lamp tester which characterized in that: the device comprises an external shell and a singlechip, wherein the singlechip outputs a trigger signal to trigger the explosion lamp to explode, and then outputs and displays an explosion signal of the explosion lamp acquired by the photosensitive sensor after being processed by the singlechip and stores a test result, and the external shell is provided with a light receiving window and a display window of the photosensitive sensor.
In another preferred embodiment, the device further comprises a shaping circuit, a level conversion circuit, a power supply, a switch circuit and a key, wherein the shaping circuit is connected with the explosion flash signal of the singlechip.
In another preferred embodiment, the trigger signal is a trigger pulse and an on-off switching value formed by a level shift circuit.
In another preferred embodiment, the light receiving window is disposed at a side surface of the housing, and the display window is disposed at a top surface of the housing.
In another preferred embodiment, the level conversion circuit includes an NPN type triode, a first PNP type triode, a first diode, an optocoupler and a test terminal, wherein a base electrode of the NPN type triode is connected with a first output port of the singlechip through a first resistor to receive an output pulse, an emitter is grounded, a collector electrode is respectively connected with a base electrode and a second resistor of the first PNP triode, and the other end of the second resistor is connected with a power supply end; the emitter of the first PNP triode is connected with a power supply, the collector outputs test pulses to be respectively connected with one end of a third resistor and one end of a fourth resistor, the other end of the third resistor is connected with an optocoupler circuit and then is connected with a test terminal, the other end of the fourth resistor is respectively connected with the cathode of the first diode and the test terminal, and the anode of the first diode is grounded;
in another preferred embodiment, the shaping circuit includes a photosensor, a second PNP type triode and a second diode, two ends of the photosensor are respectively connected with a base electrode and a ground end of the second PNP type triode, the base electrode of the second PNP type triode is also connected with a power supply end through a fifth resistor, an emitter electrode of the second PNP type triode is connected with the power supply end through the second diode, a collector electrode of the second PNP type triode is respectively connected with an input port of the singlechip and one end of a sixth resistor, and the other end of the sixth resistor is grounded.
In another preferred embodiment, the photosensor is a photodiode or a photoresistor.
In another preferred embodiment, the power supply and the switch circuit are provided with an electronic switch controlled by a singlechip for controlling on/off.
In another preferred embodiment, a current limiting resistor is arranged in the power supply and the switch circuit to provide power for the singlechip during shutdown so as to keep the singlechip to sleep normally and prevent data loss during sleep.
The utility model has the beneficial effects that: the single chip microcomputer outputs a trigger signal to trigger the explosion flash lamp to perform explosion flash, and then the explosion flash signal of the explosion flash lamp acquired by the photosensitive sensor is processed by the single chip microcomputer, then the output display is performed, and the test result is stored; the light receiving window is positioned on the side surface of the tester shell, the display window is arranged on the top surface of the shell, the hand-held explosion flash tester only needs to face the light source when testing, and the test result can be visually seen, so that a computer is omitted to read the test result, convenience is brought to construction, and the working efficiency is improved; the trigger pulse is output to trigger the lamp tube or the light source, instead of taking the trigger signal of the lamp as a test reference, which is equivalent to one trigger pulse generator.
The utility model can test the explosion flash lamp with the non-gas lamp tube such as the LED explosion flash lamp as the light source besides the gas explosion flash lamp.
The utility model is described in further detail below with reference to the drawings and examples; the burst lamp tester of the utility model is not limited to the embodiment.
Drawings
FIG. 1 is a schematic perspective view of a housing of the present utility model;
FIG. 2 is a schematic front side view of the housing of FIG. 1;
fig. 3 is a schematic circuit diagram of the present utility model.
Detailed Description
Referring to fig. 1 and 2, the embodiment of the utility model provides an explosion flash tester, which comprises an external casing 1 and a singlechip, wherein after the singlechip outputs a trigger signal to trigger the explosion flash to explode, the explosion flash signal of the explosion flash collected by a photosensitive sensor is processed by the singlechip and then is output and displayed, and a test result is stored, and the external casing 1 is provided with a light receiving window 2 and a display window 3 of the photosensitive sensor. The light receiving window 2 is disposed at a side surface of the cabinet 1, and the display window 3 is disposed at a top surface of the cabinet 1.
The trigger signal is a pulse converted by a level conversion circuit.
And a shaping circuit for the burst signal.
The utility model comprises an internal circuit with the singlechip, the photosensitive sensor, the level conversion circuit and the shaping circuit. Specifically, referring to fig. 3, the internal circuit includes a level conversion circuit 10, a shaping circuit 11, a singlechip 12, a display module 13, and a power supply and switch circuit 14; the level conversion circuit 10 is connected to the first output port of the singlechip 12, so as to receive the output pulse of the singlechip 12 and output a trigger pulse to the explosion flash lamp after level conversion to trigger the explosion flash lamp to perform explosion flash; the display module 13 is connected with a second output port of the singlechip 12; the shaping circuit 11 is connected with an input port of the singlechip 12, and sends the explosion signal of the explosion lamp acquired by the photosensitive sensor R01 to the singlechip 12 for processing after shaping, and the singlechip 12 displays the signal processing result on the display module 13; the power supply and switch circuit 14 supplies power to the level conversion circuit 10, the shaping circuit 11, the singlechip 12 and the display module 13 and performs standby control.
The level conversion circuit 10 receives pulses through the singlechip, the inverted signal is output from the collector through the base electrode of the first PNP type triode Q1, the secondary inverted test pulse signal is output from the collector through the base electrode of the NPN type triode Q2, the test pulse is respectively connected with the resistors R14 and R15, the other end of the R14 is connected with the IC1, the test pulse is output from the test terminal 9, the other end of the R15 is respectively connected with the cathode of the voltage stabilizing diode and the test terminal 4, the anode of the voltage stabilizing diode D1 is grounded, the test terminal 9 outputs trigger pulse meeting the test requirement to trigger the explosion flash lamp to explosion flash, and the trigger pulse is converted into a switch trigger mode by the IC1 photoelectric coupler.
The shaping circuit 11 collects the explosion signal through the photoresistor R01, inputs the explosion signal from the base electrode of the second PNP triode Q3, outputs the signal from the collector electrode to the singlechip 12 for processing, and the singlechip 12 stores the test result and can inquire the test result through a key.
The singlechip 12 is connected with the nixie tube 13 through the current limiting resistors R4 to R11 so as to output the result to the nixie tube 13 for display output. The positive electrode of the electrolytic capacitor C1 is connected with the power supply end, the negative electrode of the electrolytic capacitor C1 is grounded, one end of the ceramic chip capacitor C2 is connected with the power supply end, the electrolytic capacitor C1 eliminates low-frequency interference, and the ceramic chip capacitor C2 eliminates high-frequency interference. One end of each of the keys S1, S2 and S3 is grounded, one end of each of the keys is connected with the singlechip 12 and the pull-up resistors R1 to R3 respectively, the other end of each of the pull-up resistors is connected with a power supply, and the purposes of sending out test commands, inquiring the number of sent pulses, inquiring the burst delay time, measuring missing triggering, judging whether a test result is qualified, adjusting the triggering frequency, adjusting the triggering pulse width, adjusting the number of triggering pulses and the like can be achieved through the keys 5. The trigger form may be selected: the trigger level of the level trigger or the on-off switch quantity trigger is compatible with the TTL level.
In the power supply and switching circuit 14, the BT 1=battery is input through the emitter of the triode Q4, the collector is output to the power management chip IC3, and the singlechip 12 outputs a standby control signal through the resistor R18 to control the on and off of the triode Q4 so as to control whether power is supplied. The resistor R12 provides power for the singlechip during shutdown so as to keep the singlechip to sleep normally and prevent data loss during sleep. The positive electrode of the electrolytic capacitor C3 is connected with the collector electrode of the triode Q4, and the negative electrode is grounded to decouple the power supply.
A charging port 15 is also provided to allow the battery in the tester to be charged through the power adapter.
The above embodiment is only used for further illustrating an explosion flash tester of the present utility model, but the present utility model is not limited to the embodiment, and any simple modification, equivalent variation and modification of the above embodiment according to the technical substance of the present utility model falls within the protection scope of the technical solution of the present utility model.
Claims (1)
1. The utility model provides a burst lamp tester which characterized in that: the device comprises an external shell and a singlechip, wherein the singlechip outputs a trigger signal to trigger the explosion lamp to perform explosion, and then outputs and displays an explosion signal of the explosion lamp acquired by the photosensitive sensor after being processed by the singlechip and stores a test result;
the device also comprises a shaping circuit, a level conversion circuit, a power supply and switch circuit and a key, wherein the shaping circuit is connected with the explosion signal of the singlechip;
the trigger signal is trigger pulse and on-off switching value formed by a level conversion circuit;
the light receiving window is arranged on the side face of the shell, and the display window is arranged on the top face of the shell;
the level conversion circuit comprises an NPN triode, a first PNP triode, a first diode, an optocoupler and a test terminal, wherein the base electrode of the NPN triode is connected with a first output port of the singlechip through a first resistor so as to receive output pulses, the emitter is grounded, the collector is respectively connected with the base electrode of the first PNP triode and a second resistor, and the other end of the second resistor is connected with a power supply end; the emitter of the first PNP triode is connected with a power supply, the collector outputs test pulses to be respectively connected with one end of a third resistor and one end of a fourth resistor, the other end of the third resistor is connected with an optocoupler circuit and then is connected with a test terminal, the other end of the fourth resistor is respectively connected with the cathode of the first diode and the test terminal, and the anode of the first diode is grounded; the shaping circuit comprises a photosensitive sensor, a second PNP type triode and a second diode, wherein two ends of the photosensitive sensor are respectively connected with a base electrode and a ground end of the second PNP type triode, the base electrode of the second PNP type triode is also connected with a power supply end through a fifth resistor, an emitting electrode of the second PNP type triode is connected with the power supply end through the second diode, a collecting electrode of the second PNP type triode is respectively connected with an input port of the singlechip and one end of a sixth resistor, and the other end of the sixth resistor is grounded;
the photosensitive sensor is a photosensitive diode or a photosensitive resistor;
an electronic switch controlled by a singlechip is arranged in the power supply and switch circuit and used for controlling the on-off;
the power supply and the switch circuit are internally provided with a current limiting resistor which supplies power for the singlechip when the singlechip is shut down so as to keep the singlechip to be dormant normally and prevent data from being lost during dormancy.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710929555.8A CN107765194B (en) | 2017-10-09 | 2017-10-09 | Explosion flash lamp tester |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710929555.8A CN107765194B (en) | 2017-10-09 | 2017-10-09 | Explosion flash lamp tester |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107765194A CN107765194A (en) | 2018-03-06 |
| CN107765194B true CN107765194B (en) | 2023-08-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201710929555.8A Active CN107765194B (en) | 2017-10-09 | 2017-10-09 | Explosion flash lamp tester |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111323655A (en) * | 2020-03-09 | 2020-06-23 | 杭州方千科技有限公司 | Self-adaptive detection circuit for trigger signal of light supplementing lamp |
| CN113552766B (en) * | 2020-04-07 | 2023-02-17 | 浙江宇视科技有限公司 | Flash-missing detection method and device for flash-explosion lamp, electronic equipment and storage medium |
| CN112887626B (en) * | 2021-01-22 | 2022-02-25 | 北京英泰智科技股份有限公司 | Method for testing performance of explosion flash lamp and electronic equipment |
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| WO2009036650A1 (en) * | 2007-09-21 | 2009-03-26 | Zhixiong Chen | Dual-purpose intelligent lamp |
| CN201699682U (en) * | 2010-05-21 | 2011-01-05 | 深圳市易能电气技术有限公司 | Low-speed optical coupler accelerating circuit |
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| DE202015101496U1 (en) * | 2015-03-25 | 2015-04-23 | Protect-Blitz Gmbh | monitoring system |
| CN206024211U (en) * | 2016-09-22 | 2017-03-15 | 杭州品拓电子技术有限公司 | A kind of stroboscopic lamp |
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2017
- 2017-10-09 CN CN201710929555.8A patent/CN107765194B/en active Active
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56150736A (en) * | 1980-04-23 | 1981-11-21 | Olympus Optical Co Ltd | Test light emitting device for automatic strobe |
| CN2580682Y (en) * | 2002-10-17 | 2003-10-15 | 北京安控科技发展有限公司 | Pulse volume input circuit |
| CN2728101Y (en) * | 2004-09-21 | 2005-09-21 | 深圳市珊星电脑有限公司 | Short circuit protection circuit based on P channel MOSFET |
| WO2009036650A1 (en) * | 2007-09-21 | 2009-03-26 | Zhixiong Chen | Dual-purpose intelligent lamp |
| CN201699682U (en) * | 2010-05-21 | 2011-01-05 | 深圳市易能电气技术有限公司 | Low-speed optical coupler accelerating circuit |
| WO2013010865A1 (en) * | 2011-07-18 | 2013-01-24 | Siemens Aktiengesellschaft | Fault detection method and device |
| CN103442486A (en) * | 2013-08-26 | 2013-12-11 | 南京工程学院 | High-luminance LED strobe lamp |
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| Publication number | Publication date |
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| CN107765194A (en) | 2018-03-06 |
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