CN107742283A - A kind of method of cell piece outward appearance grid line thickness inequality defects detection - Google Patents
A kind of method of cell piece outward appearance grid line thickness inequality defects detection Download PDFInfo
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- CN107742283A CN107742283A CN201710836511.0A CN201710836511A CN107742283A CN 107742283 A CN107742283 A CN 107742283A CN 201710836511 A CN201710836511 A CN 201710836511A CN 107742283 A CN107742283 A CN 107742283A
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- 230000007547 defect Effects 0.000 title claims abstract description 38
- 238000001514 detection method Methods 0.000 title claims abstract description 29
- 238000000034 method Methods 0.000 title claims abstract description 23
- 230000002950 deficient Effects 0.000 claims abstract description 6
- 238000007781 pre-processing Methods 0.000 claims abstract description 5
- 238000009499 grossing Methods 0.000 claims description 7
- 230000006740 morphological transformation Effects 0.000 claims description 4
- 238000000605 extraction Methods 0.000 claims description 3
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 5
- 238000007689 inspection Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 206010036590 Premature baby Diseases 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003028 elevating effect Effects 0.000 description 1
- 230000001788 irregular Effects 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000002002 slurry Substances 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
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- Engineering & Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Image Processing (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
- Photovoltaic Devices (AREA)
Abstract
The method flow of cell piece outward appearance grid line thickness inequality defects detection provided by the invention is divided into three parts, and Part I is image pre-processing unit, obtains vertical discontinuous grid line information；Part II is curve matching unit, often row grid line average value will be fitted；Part III is detection grid line thickness inequality defective unit, and judgement detection is carried out using image array and the difference of matched curve.
Description
Technical field
The present invention relates to photovoltaic cell detection technique field, relates generally to a kind of polycrystalline silicon battery plate outward appearance grid line thickness not
Equal defect inspection method.
Background technology
The characteristics of solar energy is due to its cleanliness without any pollution, occupies important proportion gradually in energy industry, and China is
One of abundant country of solar energy resources, can further increase in future to the demand of photovoltaic industry.In order to improve the sun
The conversion efficiency of energy, the solar battery sheet part important as generating link, its quality are particularly important.
In the processing preparation process of solar battery sheet, cumbersome production technology, the production technology of high quality, silicon cell are thin and brittle
Feature etc. causes solar battery sheet easily to produce the defects of various.The life-span of these defective effect cell pieces and the effect that generates electricity
Rate, thus it is most important in the detection of production link to solar battery sheet.At present, violent increase of demand of photovoltaic cell is made
Must be to the quality requirement of cell piece further strict, so as to which context of detection needs the raising of technology.Solar battery sheet surface
Defect can cause its decrease in efficiency, it is local the defects of can influence generating efficiency, reduce the quality of production.Grid line thickness inequality is
One kind of solar battery sheet surface defect, grid line thickness inequality defect main forms have in normal grid line and have thick line, thick
There is thick line etc. in thin uneven and vertical and horizontal grid line intersection.Grid line thickness inequality is due to that pulp is irregular caused when slurry prints
Grid line thickness is inconsistent, influences the outward appearance and photoelectric transformation efficiency of cell piece.Therefore, by the uneven solar cell of grid line thickness
Piece is picked out in production link detection, lifts product appearance and quality is extremely important, the product of enterprise is had more the production advantage.
At present, solar battery sheet surface grid line thickness inequality defect predominantly detects mode or artificial sampling observation, machine regard
Feel the application also prematurity of aspect at home.Artificial detection rely on naked eyes judge, there is very big subjective consciousness, due to grid line compared with
To be elongated, prolonged human eye detection will certainly cause fatigue, cause loss and false drop rate to rise, reduce the production matter of product
Amount.
Therefore, need a kind of method of cell piece outward appearance grid line thickness inequality defects detection badly, improve operating efficiency and electricity
The detection quality of pond piece, elevating mechanism degree.
The content of the invention
In view of this, the invention provides a kind of method of cell piece outward appearance grid line thickness inequality defects detection, specific side
Case is as follows：
A kind of method of cell piece outward appearance grid line thickness inequality defects detection, this method include three step units,
The first step, image pre-processing unit
1-1, obtain HSI channel images：The RGB image that industrial camera is collected is converted to HSI channel images, and takes I passages
The information of image is as defects detection image；
1-2, extraction grid line：On the basis of step 1-1, the grid line that solar battery sheet surface is extracted by morphological transformation is believed
Breath, obtains discontinuous thin grid line in cell piece；
Second step, curve matching unit
2-1, grid line label are averaged：On the basis of step 1-2, the grid line in image is divided into a plurality of grid line, carried out successively
Label respectively, then ask for the average value of every row grid line；
2-2, curve matching：On the basis of step 2-1, by doing curve matching to image grid line pixel value, and expression of drawing；
2-3, Gaussian smoothing：On the basis of step 2-2, Gaussian smoothing is done to the curve of fitting；
3rd step, judge grid line thickness inequality defective unit
3-1, ask for difference：On the basis of step 2-3, the image information using step 1-2 and the Gauss in step 2-3 fittings
Smoothed curve does difference, and asks for the average value of difference；
3-2, judge defect：On the basis of step 3-1, thickness is judged by image information and the size of the difference of matched curve
Uneven defect whether there is.
Specifically, in the step 2-2 and 3-1, described image information is two-dimensional curve image.
Specifically, industrial camera used in IMAQ is 5,000,000 pixels, collection image size is 2456*2054, precision
0.08mm/pixl。
Specifically, this method is applied to 156mm * 156mm size battery cell pieces.
Specifically, judge that thickness inequality defect is realized especially by following contrast in the step 3-2, when difference is more than 6,
Count is incremented, when counting more than 4, is judged as thickness inequality；It is more than 4, when difference is less than 15 when counting, is judged as thickness inequality；When
When difference is more than 15, it is judged as thickness inequality.
The method flow of cell piece outward appearance grid line thickness inequality defects detection provided by the invention is divided into three parts, the
A part is image pre-processing unit, obtains vertical discontinuous grid line information；Part II is curve matching unit, will every row grid
Line average value is fitted；Part III is detection grid line thickness inequality defective unit, utilizes image array and matched curve
Difference carries out judgement detection.By the way that grid line information is fitted into curve, the difference using image dope vector with matched curve, sentence
Whether disconnected is grid line thickness inequality defect, realizes the vision-based detection of solar battery sheet surface grid line thickness inequality defect, by turning
Change HSI passages, morphological transformation, grid line average, curve matching, Gaussian smoothing, do the part of difference, defect dipoles etc. 7 composition
Grid line thickness inequality defect inspection method.Have the advantages that：1st, operating efficiency is improved.2nd, cell piece detection matter is improved
Amount.3rd, it is adapted to production line to sort online.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing
There is the accompanying drawing required in technology description to be briefly described, it should be apparent that, drawings in the following description are only the present invention
Some embodiments, for those of ordinary skill in the art, on the premise of not paying creative work, can also basis
These accompanying drawings obtain other accompanying drawings.
Fig. 1 is the flow chart of defect inspection method of the present invention.
Embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, rather than whole embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other under the premise of creative work is not made
Embodiment, belong to the scope of protection of the invention.
Shown in reference picture 1, Fig. 1 is the flow chart of defect inspection method of the present invention, and a kind of cell piece is claimed in the present invention
The method of outward appearance grid line thickness inequality defects detection, this method include three step units,
The first step, image pre-processing unit
1-1, obtain HSI channel images：The RGB image that industrial camera is collected is converted to HSI channel images, and takes I passages
The information of image is as defects detection image；
1-2, extraction grid line：On the basis of step 1-1, the grid line that solar battery sheet surface is extracted by morphological transformation is believed
Breath, obtains discontinuous thin grid line in cell piece；
Second step, curve matching unit
2-1, grid line label are averaged：On the basis of step 1-2, the grid line in image is divided into a plurality of grid line, carried out successively
Label respectively, then ask for the average value of every row grid line；
2-2, curve matching：On the basis of step 2-1, by doing curve matching to image grid line pixel value, and expression of drawing；
2-3, Gaussian smoothing：On the basis of step 2-2, Gaussian smoothing is done to the curve of fitting；
3rd step, judge grid line thickness inequality defective unit
3-1, ask for difference：On the basis of step 2-3, the image information using step 1-2 and the Gauss in step 2-3 fittings
Smoothed curve does difference, and asks for the average value of difference；
3-2, judge defect：On the basis of step 3-1, thickness is judged by image information and the size of the difference of matched curve
Uneven defect whether there is.
Specifically, in the step 2-2 and 3-1, described image information is two-dimensional curve image.
Specifically, industrial camera used in IMAQ is 5,000,000 pixels, collection image size is 2456*2054, precision
0.08mm/pixl。
Specifically, this method is applied to 156mm * 156mm size battery cell pieces.
Specifically, judge that thickness inequality defect is realized especially by following contrast in the step 3-2, when difference is more than 6,
Count is incremented, when counting more than 4, is judged as thickness inequality；It is more than 4, when difference is less than 15 when counting, is judged as thickness inequality；When
When difference is more than 15, it is judged as thickness inequality.
Embodiments of the invention are described above in conjunction with accompanying drawing, but the invention is not limited in above-mentioned specific
Embodiment, above-mentioned embodiment is only schematical, rather than restricted, one of ordinary skill in the art
Under the enlightenment of the present invention, in the case of present inventive concept and scope of the claimed protection is not departed from, it can also make a lot
Form, these are belonged within the protection of the present invention.
Claims (5)
- A kind of 1. method of cell piece outward appearance grid line thickness inequality defects detection, it is characterised in that：This method includes three steps Unit,The first step, image pre-processing unit1-1, obtain HSI channel images：The RGB image that industrial camera is collected is converted to HSI channel images, and takes I passages The information of image is as defects detection image；1-2, extraction grid line：On the basis of step 1-1, the grid line that solar battery sheet surface is extracted by morphological transformation is believed Breath, obtains discontinuous thin grid line in cell piece；Second step, curve matching unit2-1, grid line label are averaged：On the basis of step 1-2, the grid line in image is divided into a plurality of grid line, carried out successively Label respectively, then ask for the average value of every row grid line；2-2, curve matching：On the basis of step 2-1, by doing curve matching to image grid line pixel value, and expression of drawing；2-3, Gaussian smoothing：On the basis of step 2-2, Gaussian smoothing is done to the curve of fitting；3rd step, judge grid line thickness inequality defective unit3-1, ask for difference：On the basis of step 2-3, the image information using step 1-2 and the Gauss in step 2-3 fittings Smoothed curve does difference, and asks for the average value of difference；3-2, judge defect：On the basis of step 3-1, thickness is judged by image information and the size of the difference of matched curve Uneven defect whether there is.
- 2. the method for cell piece outward appearance grid line thickness inequality defects detection according to claim 1, it is characterised in that：Institute State in step 2-2 and 3-1, described image information is two-dimensional curve image.
- 3. the method for cell piece outward appearance grid line thickness inequality defects detection according to claim 1, it is characterised in that：Image Industrial camera used in collection is 5,000,000 pixels, and collection image size is 2456*2054, precision 0.08mm/pixl.
- 4. the method for cell piece outward appearance grid line thickness inequality defects detection according to claim 1, it is characterised in that：We Method is applied to 156mm * 156mm size battery cell pieces.
- 5. the method for the cell piece outward appearance grid line thickness inequality defects detection according to claim any one of 1-4, its feature It is：Judge that thickness inequality defect is realized especially by following contrast in the step 3-2, when difference is more than 6, count is incremented, meter When number is more than 4, it is judged as thickness inequality；It is more than 4, when difference is less than 15 when counting, is judged as thickness inequality；When difference is more than 15 When, it is judged as thickness inequality.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201710836511.0A CN107742283B (en) | 2017-09-16 | 2017-09-16 | Method for detecting defect of uneven thickness of grid line on appearance of battery piece |
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| CN201710836511.0A CN107742283B (en) | 2017-09-16 | 2017-09-16 | Method for detecting defect of uneven thickness of grid line on appearance of battery piece |
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| CN107742283A true CN107742283A (en) | 2018-02-27 |
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| CN201710836511.0A Expired - Fee Related CN107742283B (en) | 2017-09-16 | 2017-09-16 | Method for detecting defect of uneven thickness of grid line on appearance of battery piece |
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Cited By (4)
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| CN110443278A (en) * | 2019-07-02 | 2019-11-12 | 广州大学 | A kind of detection method, device and the equipment of solar battery sheet grid line thickness exception |
| CN114210591A (en) * | 2021-12-02 | 2022-03-22 | 格林美股份有限公司 | Lithium battery echelon utilization and sorting method and device based on IC curve |
| CN114264675A (en) * | 2022-01-04 | 2022-04-01 | 浙江工业大学 | Defect detection device and method for grid line of solar cell |
| CN115359059A (en) * | 2022-10-20 | 2022-11-18 | 一道新能源科技(衢州)有限公司 | Solar cell performance testing method and system |
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Cited By (7)
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| CN115359059A (en) * | 2022-10-20 | 2022-11-18 | 一道新能源科技(衢州)有限公司 | Solar cell performance testing method and system |
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