CN107677452A - A kind of less fundamental mode optical fibre comprehensive tester and method of testing - Google Patents
A kind of less fundamental mode optical fibre comprehensive tester and method of testing Download PDFInfo
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- CN107677452A CN107677452A CN201710997391.2A CN201710997391A CN107677452A CN 107677452 A CN107677452 A CN 107677452A CN 201710997391 A CN201710997391 A CN 201710997391A CN 107677452 A CN107677452 A CN 107677452A
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
- G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face
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Abstract
The invention discloses a kind of less fundamental mode optical fibre comprehensive tester and method of testing.The tester includes light source cell, guided mode selecting unit and the oscillograph set successively along light path, in addition to detection unit；The guided mode selecting unit, including narrow-band mode selection module and broadband mode selection module；The oscillograph, for obtaining the time domain waveform after tested less fundamental mode optical fibre；The detection unit, for according to detection pattern, obtaining Differential Group Delay and abbe number that the time domain waveform that oscillograph measures under different conditions calculates tested less fundamental mode optical fibre according to impulse time delay method respectively.Methods described, comprise the following steps：(1) tested less fundamental mode optical fibre is chosen, is placed between the guided mode selecting unit of the tester and oscillograph and adjusts thang-kng road；(2) integration test Differential Group Delay or abbe number.Tester provided by the invention, simple and reliable, integrated level is high；Method of testing significantly reduces workload, and automaticity is high.
Description
Technical field
The invention belongs to test optical fiber field, more particularly, to a kind of less fundamental mode optical fibre comprehensive tester and method of testing.
Background technology
Optical fiber telecommunications system based on single-mode fiber mainly passes through time division multiplexing, wavelength-division multiplex, palarization multiplexing or amplitude-phase
Position orthogonal multiplex skill upgrading transmission rate and capacity, however as increasing rapidly for transmission capacity requirements, based on single-mode fiber
Optical fiber telecommunications system already close to shannon limit, turn into " bottleneck " of limitation Future Optical Fibre Communication Systems development.
Less fundamental mode optical fibre is a kind of novel optical fiber, can allow the pattern transmission of two and the above.Mould based on less fundamental mode optical fibre
Divide multiplexing technology by as a kind of mode of solution single-mode fiber capacity of transmission system bottleneck.Mode division multiplexing technology is to utilize few mould
Different mode in optical fiber transmits information respectively, and different patterns is exactly different channels, therefore studies and test less fundamental mode optical fibre
Parameter, parameter particularly related to pattern has great importance.One of an important factor for dispersion is influence communication quality,
Although the chromatic dispersion measurement technology of single-mode fiber comparative maturity, but if in measurement less fundamental mode optical fibre each pattern dispersion,
Need to separate each pattern, it is necessary to improved on the basis of original technology.In addition, Differential Group Delay is also few mould light
One of fine important parameter, it is bigger to the performance impact of mode division multiplexing system.At present, although can be by improving prior art
The independent measurement of the two parameters is realized, but because test system is different, so test process is complicated, operation inconvenience, is taken
When it is laborious.
The content of the invention
For the disadvantages described above or Improvement requirement of prior art, the invention provides a kind of less fundamental mode optical fibre comprehensive tester and
Method of testing, its object is to test less fundamental mode optical fibre method of testing and optical system for testing by ingenious selection, realize that light path synthesis is multiple
With thus solving the technical problem of condition test multi-functional, of the same race inconvenience.
To achieve the above object, according to one aspect of the present invention, there is provided a kind of less fundamental mode optical fibre comprehensive tester, including
Light source cell, guided mode selecting unit, oscillograph and detection unit；
The light source cell, guided mode selecting unit and oscillograph are set in turn in light path；The detection unit and institute
Oscilloscope signal is stated to be connected；
The guided mode selecting unit, including the narrow-band mode selection module mutually replaced of position and the choosing of broadband pattern
Module is selected, for selecting the guided mode transmitted in tested optical fiber under Differential Group Delay test pattern or chromatic dispersion test pattern；
The oscillograph, pass through for obtaining the pulse laser that light source is sent after above-mentioned device and tested less fundamental mode optical fibre
Time domain waveform；
The detection unit, for according to detection pattern, obtaining the time domain waveform that oscillograph measures under different conditions, according to
Impulse time delay method calculates the Differential Group Delay and abbe number of tested less fundamental mode optical fibre respectively.
Preferably, the less fundamental mode optical fibre comprehensive tester, its narrow-band mode selection module, Differential Group Delay survey is worked in
Under die trial formula, for carrying out model selection in 1540nm-1560nm；It is preferred that use following structure：The single-mode optics set along light path
Fibre, the first convex lens group, phase plate and the second convex lens group；Described to be connected with light source cell single-mode fiber output end, its is defeated
Go out object focus of the end in first convex lens group, the coaxial setting of first and second convex lens group, the phase plate
It is arranged between first and second convex lens group, the rear focus of second convex lens group and the tested optics coupling
Close.
Preferably, the less fundamental mode optical fibre comprehensive tester, its narrow-band selecting module phase plate be mechanical phase plate or
Electric-controlled type liquid crystal phase plate.
Preferably, the less fundamental mode optical fibre comprehensive tester, its broadband selecting module include photon lantern or draw cone legal system
The mode converter of work, the preferably centralized photon lantern of the photon lantern.
Preferably, the less fundamental mode optical fibre comprehensive tester, its light source cell operation wavelength is adjustable.
Preferably, the less fundamental mode optical fibre comprehensive tester, its pulsed laser light source, for providing burst pulse light, operating wave
For long scope between 1450nm-1650nm, pulse width is less than or equal to 100ps.
Preferably, the less fundamental mode optical fibre comprehensive tester, when the tester is under Differential Group Delay test pattern,
The detection unit is obtained in narrow-band mode selection module operating wavelength range under specific wavelength, the time domain ripple under different guided modes
Shape, and calculate Differential Group Delay according to impulse time delay method accordingly；When the tester is under chromatic dispersion test pattern, the inspection
Survey unit and obtain time domain waveform corresponding to different guided modes in light source cell operating wavelength range under multiple wavelength, during according to pulse
Prolong method and calculate abbe number corresponding to different guided modes.
Provided according to another aspect of the present invention a kind of using less fundamental mode optical fibre comprehensive tester provided by the invention
Less fundamental mode optical fibre integrated test facility, comprises the following steps：
(1) the tested less fundamental mode optical fibre that length is L is chosen, is placed on less fundamental mode optical fibre comprehensive tester provided by the invention
Between guided mode selecting unit and oscillograph and adjust thang-kng road；
(2) integration test：So that the less fundamental mode optical fibre comprehensive tester is under corresponding test mode, and returns and measure
Differential Group Delay or abbe number.
Preferably, the less fundamental mode optical fibre integrated test facility, its tested less fundamental mode optical fibre, its length L 1km to 30km it
Between, determined according to following principle：Cross-section structure step change type less fundamental mode optical fibre, its length is in 1km between 20km；Cross-section structure gradual change
Type less fundamental mode optical fibre, its length is in 10km between 30km；Model number is more, and its length is shorter；Laser pulse period is smaller, its
Length is shorter.
Preferably, the less fundamental mode optical fibre integrated test facility, its step (2) include Differential Group Delay test and/or dispersion
Test；
The Differential Group Delay test comprises the following steps that：
A1, narrow-band mode selection module is placed in the less fundamental mode optical fibre comprehensive tester working light path, and adjusts institute
Light source cell output wavelength is stated to preset operation wavelength in 1540nm-1560nm；
A2, regulation narrow-band mode selector, select different guided modes, and obtain the time domain waveform of oscilloscope display；
A3, the Differential Group Delay that less fundamental mode optical fibre is tested under the wavelength that detection unit calculates is obtained, specific calculating process is such as
Under：Analyze the crest in time domain waveform under each conduction mode；For under the different time domain waveform that is obtained in step A2, the same time
The crest that point occurs, using highest crest as crest corresponding to guided mode under the conduction mode, the crest time of occurrence is used as should
Guided mode conduction time；The conduction time of different guided modes is derived from, calculates its time difference Δ t, the difference of tested optical fiber under the wavelength
Group Delay DGD calculation formula are：
DGD=Δs t/L
Wherein L is tested optical fiber length；
The chromatic dispersion test concretely comprises the following steps：
B1, broadband mode selection module is placed in the less fundamental mode optical fibre comprehensive tester working light path, and selects spy
Determine guided mode；
B2, regulation light source cell, are selected in the range of 1450nm-1650nm, multiple operation wavelengths, and obtain each wavelength pair
The time domain waveform for the oscilloscope display answered；The multiple operation wavelength quantity need to meet the quantity needed for second order polynomial fit；
B3, the abbe number that less fundamental mode optical fibre is tested under the guided mode that detection unit calculates is obtained, specific calculating process is as follows：
Time domain waveform alignment under the different wave length that will be obtained according to the time in step B2, obtains crest time of occurrence difference Δ t, and calculate
Relative time delay τ, calculation formula are as follows：
τ=Δ t/L
Wherein L is tested optical fiber length；Do second order polynomial fit curve for the τ measured under different wave length, and by its
First derivative is as abbe number.
In general, by the contemplated above technical scheme of the present invention compared with prior art, it can obtain down and show
Beneficial effect：
Less fundamental mode optical fibre comprehensive tester provided by the invention, passes through the selection to light source, mode selecting unit, detection module
And design, the multiplexing of a variety of detection patterns is realized, simple and reliable, integrated level is high, conveniently can directly measure less fundamental mode optical fibre
In each pattern abbe number, and each higher order mode is relative to the Differential Group Delay of basic mode.
Less fundamental mode optical fibre integrated test facility provided by the invention, the dismounting number of less fundamental mode optical fibre can be reduced, debugging is simple, and one
Secondary debugging can obtain abbe number under Differential Group Delay and different wave length, significantly reduce workload, and automaticity is high.
Brief description of the drawings
Fig. 1 is less fundamental mode optical fibre comprehensive tester structural representation provided by the invention；
Fig. 2 is less fundamental mode optical fibre comprehensive tester structural representation provided in an embodiment of the present invention；
Fig. 3 is narrow-band mode selector structural representation provided in an embodiment of the present invention；
Fig. 4 is broadband mode selector structural representation provided in an embodiment of the present invention；
Fig. 5 is the time domain waveform that Differential Group Delay provided in an embodiment of the present invention test obtains, and wherein Fig. 5 A are tested few
Mode fiber LP01Time domain waveform under pattern；Fig. 5 B are tested less fundamental mode optical fibre LP11Time domain waveform under pattern；
Fig. 6 is the second order polynomial fit curve that chromatic dispersion test provided in an embodiment of the present invention obtains, and wherein Fig. 6 A are quilt
Survey less fundamental mode optical fibre LP01The second order polynomial fit curve of wavelength and relative time delay τ under pattern；Fig. 6 B are tested less fundamental mode optical fibre LP11
The second order polynomial fit curve of wavelength and relative time delay τ under pattern；
Fig. 7 is chromatic dispersion test result figure provided in an embodiment of the present invention, and wherein Fig. 7 A are tested less fundamental mode optical fibre LP01Under pattern
Abbe number result figure；Fig. 7 B are tested less fundamental mode optical fibre LP11Abbe number result figure under pattern.
In all of the figs, identical reference is used for representing identical element or structure, wherein：1 is light source cell,
11 be pulsed laser light source, and 12 be optical filter, and 13 be image intensifer, and 14 be optical attenuator, and 2 be guided mode selecting unit, and 21 are
Single-mode fiber, 22 be the first convex lens group, and 23 be phase plate, and 24 be the second convex lens group, and 25 be photon lantern, and 3 be by light-metering
Device assembly unit is learned, 4 be oscillograph, and 5 be detection unit.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.As long as in addition, technical characteristic involved in each embodiment of invention described below
Conflict can is not formed each other to be mutually combined.
Less fundamental mode optical fibre comprehensive tester provided by the invention, shown in Fig. 1, including successively along light path set light source cell,
Guided mode selecting unit and oscillograph, in addition to the detection unit being connected with oscilloscope signal；
The light source cell operation wavelength is adjustable, including pulsed laser light source, image intensifer, optical attenuator, and/or light filter
Ripple device and single-mode fiber；The pulsed laser light source, for providing burst pulse light, operating wavelength range is in 1450nm-
Adjustable in 1650nm, pulse width is less than or equal to 100ps；The image intensifer, the laser wavelength used during for amplifying work,
That is service band；The optical attenuator, for regulating optical power；The image intensifer and optical attenuator are used for adjustment work wave band
The power of laser, to coordinate guided mode selecting unit and oscillograph, if both power of the pulsed laser light source itself properly can be
Do not have to or select one to use；The optical filter, its centre wavelength is adjustable in pulsed light operating wavelength range, minimum bandwidth
No more than 0.2nm, for reducing pulsed light spectrum width and filtering out the spontaneous emission noise of amplifier, to meet chromatic dispersion test condition；
The laser of single-mode fiber conduction pulsed laser light source transmission, and form basic mode, its input is used for light input, preferably with light
Wave filter is connected, and its output end is used for output light to guided mode selecting unit, preferably output end band connection head, is made using photon lantern
For broadband mode selection module when, joint can easily connect each input of photon lantern, and the single-mode fiber is naked
Optical fiber or wire jumper.
The guided mode selecting unit, including the narrow-band mode selection module mutually replaced of position and broadband model selection
Module, for selecting the guided mode transmitted in tested optical fiber under Differential Group Delay test pattern or chromatic dispersion test pattern.
The narrow-band mode selection module, is worked under Differential Group Delay test pattern, in 1540nm-1560nm
Carry out model selection；It is preferred that use following structure：Single-mode fiber, the first convex lens group, phase plate, the Yi Ji set along light path
Two convex lens groups；Described to be connected with light source cell single-mode fiber output end, its output is in the thing of first convex lens group
Square focus, the coaxial setting of first and second convex lens group, the phase plate are arranged between first and second convex lens group,
The rear focus of second convex lens group couples with the tested optics.The convex lens group comprises at least a convex lens
Mirror.During work, the laser of operation wavelength by single-mode fiber, by first convex lens group pool directional light or the angle of divergence compared with
Small light beam, after phase plate selects guided mode, by the second convex lens group by collimated light beam or the less less parallel of the angle of divergence
Light converges, and is coupled into the tested optics.It is preferred that first and second described convex lens group position is adjustable, for adapting to difference
Wavelength.The phase plate, preferably mechanical phase plate or electric-controlled type liquid crystal phase plate.
The single-mode fiber of the narrow-band mode selection module is bare fibre or wire jumper；Its input preferably has connection
Head, the other end are output end, and the output end end face is optical flat face, the tool processes such as cutter can be used, if the list
Mode fiber is wire jumper, and its end face is optical flat face in itself.
First convex lens group of the narrow-band mode selection module, it is applied to swashing for the tester service band
Light, the light beam of the diverging for single-mode fiber to be exported pool directional light or the less light beam of the angle of divergence.
Second convex lens group of the narrow-band mode selection module, it is applied to swashing for the tester service band
Light, for collimated light beam or the less less parallel light beam of the angle of divergence to be converged, it is allowed to be coupled into tested optics.
The narrow-band mode selection module, preferably also include support, for fixing above-mentioned optics, that is, be used to fix
Single-mode fiber, the first convex lens group, phase plate and the second convex lens group, and make it that the position of above-mentioned optics is adjustable.Tool
For body, including：First lens pack support, for causing the output of the single-mode fiber in the object space of the first convex lens group
Focus；Phase plate rack so that phase plate translates up and down；Second lens pack support so that second convex lens group
Rear focus is in the end face of the tested optics.
The broadband mode selection module, is worked under chromatic dispersion test pattern, for being carried out under 1450nm-1650nm
Model selection, such as photon lantern or the mode converter for drawing the making of cone method, preferably centralized photon lantern.The broadband mould
Formula selecting module is connected with light source cell single-mode fiber, and output end is connected with tested optical fiber.
The narrow-band mode selection module and broadband mode selection module are in situ in the optical path to be replaced so that the survey
Examination instrument is operated under different test patterns：When narrow-band mode selection module is in light path, the tester is operated in
Under Differential Group Delay test pattern；When broadband mode selector is in light path, the tester is operated in dispersion survey
Under die trial formula.
The oscillograph, pass through for obtaining the pulse laser that light source is sent after above-mentioned device and tested less fundamental mode optical fibre
Time domain waveform.The time domain waveform is that luminous power changes over time waveform in the pulse period.
The detection unit, for according to detection pattern, obtaining the time domain waveform that oscillograph measures under different conditions, according to
Impulse time delay method calculates the Differential Group Delay and abbe number of tested less fundamental mode optical fibre respectively；Specifically；When the tester is in
When under Differential Group Delay test pattern, the detection unit obtains certain wave in narrow-band mode selection module operating wavelength range
Under length, the time domain waveform under different guided modes, and calculate Differential Group Delay according to impulse time delay method accordingly；When the tester is in
When under chromatic dispersion test pattern, the detection unit obtains light source cell operating wavelength range corresponding to different guided modes, preferably
Time domain waveform in 1450nm-1650nm laser wavelength ranges under multiple wavelength, different guided modes pair are calculated according to impulse time delay method
The abbe number answered.
Under Differential Group Delay test pattern, different guided modes is selected by narrow-band guided mode selecting module successively, by showing
Ripple device obtains different guided modes corresponding time domain waveform after certain length L tested less fundamental mode optical fibre successively.Different guided modes exist
Transmission speed in optical fiber is different, therefore after the tested less fundamental mode optical fibre Jing Guo equal length, pulse corresponding to different guided modes
It can separate.When narrow-band guided mode selecting unit selects some guided mode, peak power corresponding to the guided mode can become in time domain waveform
Greatly, it is possible thereby to determine that different guided modes correspond to the time coordinate of crest.Each high order guided modes relative to the delay of basic mode pass through by
Corresponding peak time coordinate subtracts each other to obtain, then by the delay divided by tested less fundamental mode optical fibre length be each high order guided modes relative to
The Differential Group Delay of basic mode.
Under chromatic dispersion test pattern, pulsed laser light source continuously adjustabe in the range of 1450nm-1650nm, pass through broadband
Guided mode selecting module selects each guided mode successively.Under same guided mode, every time domain ripple corresponding to certain wavelength interval measurement
Shape, obtain time coordinate corresponding to crest.By by time coordinate corresponding to different wave length crest directly with initial wavelength crest
Corresponding time coordinate subtraction calculations go out time delay of each wavelength relative to initial wavelength.The relative time delay divided by optical fiber are grown
Degree, and wavelength and the relation curve in relative time delay are drawn, by second order polynomial fit wavelength and the curve in relative time delay, obtain
Its first derivative, first derivative are abbe number.
Less fundamental mode optical fibre integrated test facility provided by the invention, comprises the following steps：
(1) the tested less fundamental mode optical fibre that length is L is chosen, is placed on less fundamental mode optical fibre comprehensive tester provided by the invention
Between guided mode selecting unit and oscillograph and adjust thang-kng road；
The tested less fundamental mode optical fibre, its length L, between 30km, determine in 1km according to following principle：Cross-section structure step
Type less fundamental mode optical fibre, its length is in 1km between 20km；Cross-section structure gradation type less fundamental mode optical fibre, its length 10km to 30km it
Between；Model number is more, and its length is shorter；Laser pulse period is smaller, and its length is shorter.
It is preferred that less fundamental mode optical fibre comprehensive tester guided mode selecting unit output end carries joint, the tested optical fiber band input
With joint, convenient debugging.
(2) integration test：So that the less fundamental mode optical fibre comprehensive tester is under corresponding test mode, and returns and measure
Differential Group Delay or abbe number.Specifically include Differential Group Delay test and/or chromatic dispersion test：
The Differential Group Delay test comprises the following steps that：
A1, narrow-band mode selection module is placed in the less fundamental mode optical fibre comprehensive tester working light path, and adjusts institute
Light source cell output wavelength is stated to preset operation wavelength in 1540nm-1560nm；
A2, regulation narrow-band mode selector, select different guided modes, and obtain the time domain waveform of oscilloscope display；
A3, the Differential Group Delay that less fundamental mode optical fibre is tested under the wavelength that detection unit calculates is obtained, specific calculating process is such as
Under：Analyze the crest in time domain waveform under each conduction mode；For under the different time domain waveform that is obtained in step A2, the same time
The crest that point occurs, using highest crest as crest corresponding to guided mode under the conduction mode, the crest time of occurrence is used as should
Guided mode conduction time；The conduction time of different guided modes is derived from, calculates its time difference Δ t, the difference of tested optical fiber under the wavelength
Group Delay DGD calculation formula are：
DGD=Δs t/L
Wherein L is tested optical fiber length.
The chromatic dispersion test concretely comprises the following steps：
B1, broadband mode selection module is placed in the less fundamental mode optical fibre comprehensive tester working light path, and selects spy
Determine guided mode；
B2, regulation light source cell, are selected in the range of 1450nm-1650nm, multiple operation wavelengths, and obtain each wavelength pair
The time domain waveform for the oscilloscope display answered；The multiple operation wavelength quantity need to meet the quantity needed for second order polynomial fit；
B3, the abbe number that less fundamental mode optical fibre is tested under the guided mode that detection unit calculates is obtained, specific calculating process is as follows：
Time domain waveform alignment under the different wave length that will be obtained according to the time in step B2, obtains crest time of occurrence difference Δ t, and calculate
Relative time delay τ, calculation formula are as follows：
τ=Δ t/L
Wherein L is tested optical fiber length；Do second order polynomial fit curve for the τ measured under different wave length, and by its
First derivative is as abbe number.
It is embodiment below：
A kind of less fundamental mode optical fibre comprehensive tester, as shown in Fig. 2 being selected including light source cell, the guided mode set successively along light path
Select unit and oscillograph, in addition to the detection unit being connected with oscilloscope signal；
The light source cell includes pulsed laser light source, image intensifer, optical attenuator, optical filter and single-mode fiber；
The pulsed laser light source, for providing burst pulse light, operating wavelength range is adjustable in 1450nm-1650nm, pulse width
50ps, laser pulse period 40ns；The image intensifer, the laser wavelength used during for amplifying work, i.e. service band；Institute
Optical attenuator is stated, for regulating optical power；The image intensifer and optical attenuator are used for the power of adjustment work wave band of laser, with
Coordinate guided mode selecting unit and oscillograph；The optical filter, its centre wavelength is adjustable in pulsed light operating wavelength range, most
Small bandwidth 0.2nm, for reducing pulsed light spectrum width and filtering out the spontaneous emission noise of amplifier, to meet chromatic dispersion test condition；
The single-mode fiber is wire jumper, the laser of conduction pulsed laser light source transmission, and forms basic mode, and its input inputs for light,
It is connected with optical filter, its output end is used for output light to guided mode selecting unit, band connection head.
The guided mode selecting unit, including the narrow-band mode selection module mutually replaced of position and broadband model selection
Module, for selecting the guided mode transmitted in tested optical fiber under Differential Group Delay test pattern or chromatic dispersion test pattern.
The narrow-band mode selection module, as shown in figure 3, work under Differential Group Delay test pattern, for
1540nm-1560nm carries out model selection；Using following structure：Along the single-mode fiber of light path setting, the first convex lens group, phase
Piece and the second convex lens group；Described to be connected with light source cell single-mode fiber output end, its output is in first convex lens
The object focus of microscope group, the coaxial setting of first and second convex lens group, the mode selector are arranged at first and
Between two convex lens groups, the rear focus of second convex lens group couples with the tested optics.During work, operating wave
Long laser pools directional light or the less light beam of the angle of divergence, by phase by single-mode fiber by first convex lens group
After bit slice selection guided mode, collimated light beam or the less less parallel light of the angle of divergence are converged by the second convex lens group, are coupled into institute
State tested optics.First and second described convex lens group position is adjustable, for adapting to the focal length variations of different wave length.It is described
Phase plate, it is mechanical phase plate.
The single-mode fiber of the narrow-band mode selection module is wire jumper；Its input has connector, and the other end is defeated
Go out end.
First convex lens group of the narrow-band mode selection module, it is applied to swashing for the tester service band
Light, the light beam of the diverging for single-mode fiber to be exported pool directional light or the less light beam of the angle of divergence.
Second convex lens group of the narrow-band mode selection module, it is applied to swashing for the tester service band
Light, for collimated light beam or the less less parallel light beam of the angle of divergence to be converged, it is allowed to be coupled into tested optics.
The narrow-band mode selection module, in addition to support, for fixing above-mentioned optics, that is, it is used to fix single mode
Optical fiber, the first convex lens group, phase plate and the second convex lens group, and make it that the position of above-mentioned optics is adjustable.It is specific and
Speech, including：First lens pack support, for causing the output of the single-mode fiber burnt in the object space of the first convex lens group
Point；Phase plate rack so that phase plate can translate up and down；Second lens pack support so that the picture of second convex lens
Square focus is in the end face of the tested optics.
The broadband mode selection module, as shown in figure 4, working under chromatic dispersion test pattern, in 1450nm-
Model selection is carried out under 1650nm, using centralized photon lantern.The broadband mode selection module and light source cell single mode
Optical fiber is connected, and output end is connected with tested optical fiber.
The narrow-band mode selection module and the replacement in situ in the optical path of broadband mode selection module so that described
Tester is operated under different test patterns：When narrow-band mode selection module is in light path, the tester work
Under Differential Group Delay test pattern；When broadband mode selector is in light path, the tester is operated in dispersion
Under test pattern.
The oscillograph, pass through for obtaining the pulse laser that light source is sent after above-mentioned device and tested less fundamental mode optical fibre
Time domain waveform.The time domain waveform is that luminous power changes over time waveform in the pulse period.
The detection unit, for according to detection pattern, obtaining the time domain waveform that oscillograph measures under different conditions, according to
Impulse time delay method calculates the Differential Group Delay and abbe number of tested less fundamental mode optical fibre respectively；Specifically：When the tester is in
When under Differential Group Delay test pattern, the detection unit is obtained in 1540nm-1560nm laser wavelength ranges under specific wavelength,
Time domain waveform under different guided modes, and calculate Differential Group Delay according to impulse time delay method accordingly；When the tester is in dispersion
When under test pattern, the detection unit obtains corresponding to different guided modes multiple ripples in 1450nm-1650nm laser wavelength ranges
Time domain waveform under long, abbe number corresponding to different guided modes is calculated according to impulse time delay method.
Less fundamental mode optical fibre integrated test facility provided by the invention, comprises the following steps：
(1) the tested less fundamental mode optical fibre that length is L is chosen, by it as less fundamental mode optical fibre comprehensive tester provided by the invention
Between guided mode selecting unit and oscillograph and adjust thang-kng road；
The tested less fundamental mode optical fibre, is gradation type cross-section structure, and its length L is 24.981km
(2) integration test：So that the less fundamental mode optical fibre comprehensive tester is under corresponding test pattern, and returns and measure
Differential Group Delay or abbe number.Specifically include：
Differential Group Delay is tested：
A1, narrow-band mode selector is positioned in the less fundamental mode optical fibre comprehensive tester working light path, and adjusted
The light source cell output wavelength is that operation wavelength is preset in 1540nm-1560nm；
A2, regulation narrow-band mode selector, select different guided modes, and obtain the time domain waveform of oscilloscope display, such as
Shown in Fig. 5；
A3, the Differential Group Delay that less fundamental mode optical fibre is tested under the wavelength that detection unit calculates is obtained, specific calculating process is such as
Under：Analyze the crest in time domain waveform under each conduction mode；For under the different time domain waveform that is obtained in step A2, the same time
The crest that point occurs, using highest crest as crest corresponding to guided mode under the conduction mode, the crest time of occurrence is used as should
Guided mode conduction time；The conduction time of different guided modes is derived from, calculates its time difference Δ t, the difference of tested optical fiber under the wavelength
Group Delay DGD calculation formula are：
DGD=Δs t/L
Wherein L is tested optical fiber length.
Test result, LP11-LP01Between Differential Group Delay -0.136ps/m.
Chromatic dispersion test：
B1, narrow-band mode selector is positioned in the less fundamental mode optical fibre comprehensive tester working light path, and selected
Specific guided mode；
B2, regulation light source cell, are selected in the range of 1450nm-1650nm, and using 1450nm as starting point, 5nm is step-length, selection
Multiple operation wavelengths, and obtain the time domain waveform of oscilloscope display corresponding to each wavelength；
B3, the abbe number that less fundamental mode optical fibre is tested under the guided mode that detection unit calculates is obtained, specific calculating process is as follows：
Time domain waveform alignment under the different wave length that will be obtained according to the time in step B2, obtains crest time of occurrence difference Δ t, and calculate
Unit length delay, τ, calculation formula are as follows：
τ=Δ t/L
Wherein L is tested optical fiber length；Second order polynomial fit curve is done for the τ measured under different wave length, such as Fig. 6 institutes
Show, and using its first derivative as abbe number.
LP01The test result of mould as shown in Figure 7 A, LP11The test result of mould is as shown in Figure 7 B.
Wherein LP01Mould is 18.539ps/nm/km, LP in 1550nm abbe number11Abbe number of the mould in 1550nm
For 17.062ps/nm/km.
As it will be easily appreciated by one skilled in the art that the foregoing is merely illustrative of the preferred embodiments of the present invention, not to
The limitation present invention, all any modification, equivalent and improvement made within the spirit and principles of the invention etc., all should be included
Within protection scope of the present invention.
Claims (10)
- A kind of 1. less fundamental mode optical fibre comprehensive tester, it is characterised in that including light source cell, guided mode selecting unit, oscillograph and Detection unit；The light source cell, guided mode selecting unit and oscillograph are set in turn in light path；The detection unit is shown with described Ripple device signal is connected；The guided mode selecting unit, including the narrow-band mode selection module mutually replaced of position and broadband model selection mould Block, for selecting the guided mode transmitted in tested optical fiber under Differential Group Delay test pattern or chromatic dispersion test pattern；The oscillograph, for obtaining the time domain after the pulse laser that light source is sent passes through above-mentioned device and tested less fundamental mode optical fibre Waveform；The detection unit, for according to detection pattern, the time domain waveform that oscillograph measures under different conditions being obtained, according to pulse Time delay method calculates the Differential Group Delay and abbe number of tested less fundamental mode optical fibre respectively.
- 2. less fundamental mode optical fibre comprehensive tester as claimed in claim 1, it is characterised in that the narrow-band mode selection module, Work under Differential Group Delay test pattern, for carrying out model selection in 1540nm-1560nm；It is preferred that use following structure： Single-mode fiber, the first convex lens group, phase plate and the second convex lens group set along light path；Described and light source cell single mode Fiber-optic output connects, and its output is in the object focus of first convex lens group, first and second described convex lens group Coaxial setting, the phase plate are arranged between first and second convex lens group, the rear focus of second convex lens group with The tested optics coupling.
- 3. less fundamental mode optical fibre comprehensive tester as claimed in claim 2, it is characterised in that the narrow-band selecting module phase plate For mechanical phase plate or electric-controlled type liquid crystal phase plate.
- 4. less fundamental mode optical fibre comprehensive tester as claimed in claim 2, it is characterised in that the broadband selecting module includes light Sub- lantern or the mode converter for drawing cone method to make, the preferably centralized photon lantern of the photon lantern.
- 5. less fundamental mode optical fibre comprehensive tester as claimed in claim 1, it is characterised in that the light source cell operation wavelength can Adjust.
- 6. less fundamental mode optical fibre comprehensive tester as claimed in claim 5, it is characterised in that the pulsed laser light source, for carrying For burst pulse light, for operating wavelength range between 1450nm-1650nm, pulse width is less than or equal to 100ps.
- 7. less fundamental mode optical fibre comprehensive tester as claimed in claim 1, it is characterised in that when the tester is in difference group When under delay test pattern, the detection unit obtains in narrow-band mode selection module operating wavelength range under specific wavelength, no With the time domain waveform under guided mode, and calculate Differential Group Delay according to impulse time delay method accordingly；Surveyed when the tester is in dispersion When under die trial formula, the detection unit obtain corresponding to different guided modes in light source cell operating wavelength range under multiple wavelength when Domain waveform, abbe number corresponding to different guided modes is calculated according to impulse time delay method.
- 8. the less fundamental mode optical fibre integrated test facility of application less fundamental mode optical fibre comprehensive tester as described in claim 1 to 7 any one, It is characterised in that it includes following steps：(1) the tested less fundamental mode optical fibre that length is L is chosen, is placed on the less fundamental mode optical fibre comprehensive tester described in claim 1 to 7 Guided mode selecting unit and oscillograph between and adjust thang-kng road；(2) integration test：So that the less fundamental mode optical fibre comprehensive tester is under corresponding test pattern, and return to the difference measured Group Delay or abbe number.
- 9. less fundamental mode optical fibre integrated test facility as claimed in claim 8, it is characterised in that the tested less fundamental mode optical fibre, it is grown L is spent in 1km between 30km, is determined according to following principle：Cross-section structure step change type less fundamental mode optical fibre, its length is in 1km to 20km Between；Cross-section structure gradation type less fundamental mode optical fibre, its length is in 10km between 30km；Model number is more, and its length is shorter；Swash The light pulse cycle is smaller, and its length is shorter.
- 10. less fundamental mode optical fibre comprehensive tester as claimed in claim 8, it is characterised in that step (2) is surveyed including Differential Group Delay Examination and/or chromatic dispersion test；The Differential Group Delay test comprises the following steps that：A1, narrow-band mode selection module is placed in the less fundamental mode optical fibre comprehensive tester working light path, and adjusts the light Source unit output wavelength is that operation wavelength is preset in 1540nm-1560nm；A2, regulation narrow-band mode selector, select different guided modes, and obtain the time domain waveform of oscilloscope display；A3, the Differential Group Delay that less fundamental mode optical fibre is tested under the wavelength that detection unit calculates is obtained, specific calculating process is as follows：Point Analyse the crest in time domain waveform under each conduction mode；For the different time domain waveform obtained in step A2, same time point occurs Crest, using highest crest as crest corresponding to guided mode under the conduction mode, the crest time of occurrence passes as the guided mode Lead the time；The conduction time of different guided modes is derived from, calculates its time difference Δ t, under the wavelength during difference group of tested optical fiber Prolonging DGD calculation formula is：DGD=Δs t/LWherein L is tested optical fiber length；The chromatic dispersion test concretely comprises the following steps：B1, broadband mode selection module is placed in the less fundamental mode optical fibre comprehensive tester working light path, and selects specific guide Mould；B2, regulation light source cell, select multiple operation wavelengths in the range of 1450nm-1650nm, and obtain corresponding to each wavelength The time domain waveform of oscilloscope display；The multiple operation wavelength quantity need to meet the quantity needed for second order polynomial fit；B3, the abbe number that less fundamental mode optical fibre is tested under the guided mode that detection unit calculates is obtained, specific calculating process is as follows：According to Time domain waveform alignment under the different wave length that time will obtain in step B2, obtains crest time of occurrence difference Δ t, and calculates relative Delay, τ, calculation formula are as follows：τ=Δ t/LWherein L is tested optical fiber length；Second order polynomial fit curve is done for the τ measured under different wave length, and by its single order Derivative is as abbe number.
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