CN107661112B - Scanning preparation time calculation method and scanning preparation process display method of CT system - Google Patents

Scanning preparation time calculation method and scanning preparation process display method of CT system Download PDF

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CN107661112B
CN107661112B CN201610599829.7A CN201610599829A CN107661112B CN 107661112 B CN107661112 B CN 107661112B CN 201610599829 A CN201610599829 A CN 201610599829A CN 107661112 B CN107661112 B CN 107661112B
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CN107661112A (en
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金文兵
田维
杨永
从洪伟
周伟
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Shanghai United Imaging Healthcare Co Ltd
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Abstract

The invention relates to a method and a system for calculating scanning preparation time of a CT system and a method and a system for displaying scanning preparation progress. According to the method and the device, the modules related to scanning preparation are determined according to the scanning parameters input by the user, the scanning preparation time of each module is obtained respectively, the scanning preparation time of the CT system is obtained finally in an integrated mode, and the scanning process is displayed to the user in an interface-friendly mode according to the finally obtained scanning preparation time, so that the user can intuitively master the scanning preparation process, and the user experience is improved remarkably.

Description

Scanning preparation time calculation method and scanning preparation process display method of CT system
Technical Field
The invention relates to the field of electronic computer tomography, in particular to a scanning preparation time calculation method and a scanning preparation process display method of a CT system.
Background
In the CT scanning, after the doctor confirms the scanning parameters, the doctor needs to wait for the CT system to perform scanning preparation, and the CT system can start to work after the scanning preparation is completed, and the scanning preparation time is different according to the different scanning parameters. In the prior art, the CT system cannot give an estimated value to scanning preparation time, so that the scanning preparation time cannot be displayed for a user, and a scanning process cannot be dynamically displayed, and a doctor can only wait quietly after inputting scanning parameters and cannot know the scanning preparation process of the CT system in time, so that inconvenience is brought to the doctor for scanning by using the CT system, and the user experience of the CT system is poor.
Disclosure of Invention
In order to solve the technical problems, the invention provides a method and a system for calculating scanning preparation time of a CT system and a method and a system for displaying scanning preparation progress. The scanning preparation time is calculated by constructing a calculation model of the scanning preparation time, and the scanning preparation process is displayed to a user in an interface-friendly manner, so that the user experience is remarkably improved.
The invention is realized by the following technical scheme, and the method for calculating the scanning preparation time of the CT system comprises the following steps:
the scanning parameters are obtained, and the scanning parameters are obtained,
determining modules participating in scanning preparation according to the scanning parameters,
acquiring state parameters related to scanning preparation time in each module,
the scanning preparation time of each module is obtained,
and calculating the scanning preparation time of the CT system according to the scanning preparation time of each module and the operation relation among the modules.
Preferably, the modules include a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a gantry rotation module, a collimator module, and/or a couch preparation module.
Preferably, the preparation time for scanning the CT system is calculated according to a critical path method.
Preferably, the X-ray anode acceleration module and the gantry rotation module operate in series, the X-ray anode acceleration module and the X-ray other configuration module operate in parallel or in series, and the detector module, the collimator module and the patient bed preparation module operate in parallel and are all independent of the operating states of the X-ray anode acceleration module, the X-ray other configuration module and the gantry rotation module.
Preferably, the calculating the scan preparation time of the CT system according to the critical path method includes:
acquiring all selectable paths for completing the scanning preparation of the CT system according to the operational relationship among the modules, wherein the selectable paths are paths which one module needs to pass after completing the scanning preparation,
obtaining the weight of the optional path according to the time of each module completing scanning preparation,
and taking the weight with the maximum value as the scanning preparation time of the CT system.
Preferably:
the scan preparation time of the X-ray anode acceleration module includes a time to set the X-ray anode,
scan preparation time for the X-ray other configuration modules includes setting focus size, flying focus and time to prepare filament,
the scan preparation time of the gantry rotation module includes gantry acceleration, deceleration and positioning time,
the scan preparation time of the collimator block includes a time to set a slice plate and a shape filter.
Preferably, the modules further comprise other accessory preparation modules, the scan preparation time of the other accessory preparation modules being the preparation time of the CT gantry accessories, the other accessory preparation modules running in parallel with the other modules.
A display method for CT system scanning preparation time comprises the steps of obtaining the CT system scanning preparation time, and further comprises the following steps:
displaying the preparation time of the scanning of the CT system,
or/and displaying the progress of the preparation of scanning of the CT system.
A computing system for CT system scan preparation time, comprising:
a scanning parameter acquisition module for acquiring scanning parameters,
a related module acquisition module used for determining modules participating in scanning preparation according to the scanning parameters, a state parameter acquisition module used for acquiring state parameters related to scanning preparation time in each module,
a scanning preparation time acquisition module for acquiring the scanning preparation time of each module,
and the overall time calculation module is used for calculating the scanning preparation time of the CT system according to the scanning preparation time of each module and the operation relation among the modules.
Preferably, the modules include a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a gantry rotation module, a collimator module, and/or a couch preparation module.
Preferably, the overall planning time calculation module calculates the scanning preparation time of the CT system according to a critical path method.
Preferably, the X-ray anode acceleration module and the gantry rotation module operate in series, the X-ray anode acceleration module and the X-ray other configuration module operate in parallel or in series, and the detector module, the collimator module and the patient bed preparation module operate in parallel and are all independent of the operating states of the X-ray anode acceleration module, the X-ray other configuration module and the gantry rotation module.
Preferably, the pool time calculation module includes:
the optional path acquisition sub-module is used for acquiring all optional paths for completing the scanning preparation of the CT system according to the operation relation among the modules, the optional paths are paths which one module needs to pass after completing the scanning preparation,
a weight value obtaining submodule for obtaining the weight value of the selectable path according to the time of each module completing scanning preparation,
and the CT system scanning preparation time obtaining submodule is used for taking the weight with the maximum value as the CT system scanning preparation time.
Preferably, the scanning preparation time acquisition module includes:
the detector preparation time calculation submodule is used for acquiring scanning preparation time of the detector module;
the X-ray anode acceleration preparation time calculation submodule is used for acquiring the scanning preparation time of the X-ray anode acceleration module;
the X-ray other configuration preparation time calculation submodule is used for acquiring scanning preparation time of the X-ray other configuration module;
the rack rotation preparation time calculation submodule is used for acquiring scanning preparation time of the rack rotation module;
the collimator preparation time calculation submodule is used for acquiring scanning preparation time of the collimator module;
and the hospital bed preparation time calculation submodule is used for acquiring the scanning preparation time of the hospital bed preparation module.
Preferably, the scanning preparation time obtaining module further includes:
and the other auxiliary equipment preparation time calculation sub-module is used for acquiring the scanning preparation time of other auxiliary equipment preparation modules, the scanning preparation time of the other auxiliary equipment preparation modules comprises the preparation time of auxiliary equipment of the CT rack, and the other auxiliary equipment preparation modules run in parallel with other modules.
A display system for a scanning preparation process of a CT system comprises the calculation system for the scanning preparation time of the CT system, and further comprises:
a scanning time display module for displaying the scanning preparation time of the CT system,
and the scanning progress display module is used for displaying the progress of the scanning preparation of the CT system.
The invention has the beneficial effects that:
the invention provides a method and a system for calculating scanning preparation time of a CT system and a method and a system for displaying scanning preparation progress. According to the method and the device, the modules related to scanning preparation are determined according to the scanning parameters input by the user, the scanning preparation time of each module is respectively obtained, the scanning preparation time of the CT system is finally obtained in an integrated mode, the finally obtained result is displayed to the user in an interface-friendly mode, and furthermore, the user can intuitively master the progress of the scanning preparation, so that the user experience is remarkably improved.
Drawings
FIG. 1 is a flowchart of a method for calculating the preparation time for scanning of a CT system according to embodiment 1;
FIG. 2 is a flowchart of a scanning preparation time calculation method of the detector module provided in embodiment 1;
FIG. 3 is a third-order S-trajectory variation graph with a uniform acceleration section provided in example 1;
FIG. 4 is a third order S-trajectory variation plot without the uniform acceleration segment provided in example 1;
FIG. 5 is a schematic diagram showing the movement locus of a typical chipper plate and shape filter provided in example 1;
FIG. 6 is a flowchart of a method for calculating the scan preparation time of a CT system according to the critical path method provided in embodiment 1;
FIG. 7 is a flowchart for executing on time axis of respective modules provided in embodiment 1;
FIG. 8 is a flowchart of a display method for preparing a scanning procedure of a CT system according to an embodiment 2;
FIG. 9 is a schematic page diagram of a display method for a scanning preparation process of a CT system according to embodiment 2;
FIG. 10 is a schematic diagram of a computing system for scanning preparation time of a CT system according to embodiment 3;
FIG. 11 is a schematic diagram of a display system for a scanning preparation process of a CT system according to embodiment 4.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in further detail with reference to the accompanying drawings.
In a first embodiment, as shown in fig. 1, a method for calculating scan preparation time of a CT system includes:
s101, scanning parameters are obtained.
A user inputs scanning parameters according to actual scanning requirements, and the CT system captures the scanning parameters for subsequent scanning preparation time calculation.
And S102, determining a module participating in scanning preparation according to the scanning parameters.
The modules in this embodiment include a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a gantry rotation module, a collimator module, a bed preparation module, and other accessory equipment preparation modules.
In particular, the scan preparation time of the X-ray anode acceleration module comprises the time for setting the X-ray anode,
scan preparation time for the X-ray other configuration modules includes setting focus size, flying focus and time to prepare filament,
the scan preparation time of the gantry rotation module includes gantry acceleration, deceleration and positioning time,
the scan preparation time of the collimator block includes the time to set the chipper plate and shape filter,
the scanning preparation time of the hospital bed preparation module comprises the preparation working time of the hospital bed,
the scan preparation time for the detector module includes the time it takes to configure the detector,
the scan preparation time of the other accessory device preparation module includes the preparation time of the CT gantry accessory device.
And S103, acquiring state parameters related to scanning preparation time in each module.
And S104, acquiring scanning preparation time of each module.
(1) Obtaining scan preparation time for detector modules
Specifically, as shown in fig. 2, the method for calculating the scanning preparation time of the detector module includes:
judging whether the scanning parameters of the detector module are the same as the state parameters of the detector module:
if yes, scanning preparation time of the detector module is 0;
otherwise, judging the working mode of the detector module according to the state parameters of the detector module:
if the mode is the correction mode, the scanning preparation time of the detector module is the same as the correction configuration time of the detector module;
and if the sampling time is in a normal sampling mode, acquiring offset time, wherein the offset time is the multiplication of the integration time of the detector module and an offset preset value, and the scanning preparation time of the detector module is the sum of the normal configuration time of the detector module and the offset time.
(2) Acquisition of scan preparation time for an X-ray anode acceleration module and other X-ray configuration modules
For different bulbs, the filament, anode, focus position and size control devices in the bulbs can be realized in different manners, for example, the bulb of DUNLEE CTR2150 is a single filament, the speed of the single anode is high, and the focus control is controlled by grid voltage; the Varian mcs7171 bulb is a double filament, the speed of the double anode and the size of the focus are determined by the selected filament. Accordingly, the scanning preparation time of the X-ray anode acceleration module and the X-ray other configuration modules can have different acquisition methods according to different bulbs.
Generally, the X-ray scan preparation time includes the anode preparation time of the X-ray anode acceleration module, the filament preparation time of the X-ray other configuration module, and the setup time of the focus position and focus size.
Taking a bulb of Varian mcs7171 as an example, the anode speed switching time is shown in Table 1, the filament preparation time is shown in Table 2, and the filament switching time is shown in Table 3.
TABLE 1 Anode speed switching time
Initial velocity Target speed Time
Low speed High speed 6s
Off Low speed 6s
High speed Low speed 10s
Off High speed 12s
Low Off 0
High Off 10s
TABLE 2 filament preparation time
Initial state Target state Time
Off Standy operating temperature 5s
TABLE 3 filament switching time
Initial state Target state Time
Small filament Large filament 60ms
Large filament Small filament 60ms
For a Varian mcs7171 bulb, the X-ray anode acceleration module and the X-ray other configuration modules may run in parallel. And scanning preparation time of the X-ray anode acceleration module and scanning preparation time of the X-ray other configuration modules can be obtained according to the scanning parameters input by the user and the state parameters of the X-ray anode acceleration module and the X-ray other configuration modules.
Because there is a dependency relationship between the anode and the gantry in control, the gantry can start to rotate after the anode is accelerated, so that the time point when the gantry rotation module starts to operate needs to be determined according to the scanning preparation time of the X-ray anode acceleration module, that is, the gantry rotation performed by the X-ray anode acceleration module and the gantry rotation module is serial operation.
(3) Obtaining scan preparation time for gantry rotation module
The CT gantry rotation control mainly comprises a speed mode and a positioning mode, and a three-order S-track control algorithm is usually adopted for control. The motion trail curves are shown in fig. 3 and 4, S represents position, V represents velocity, a represents acceleration, and j represents jerk. a is integrated by j, V is integrated by a, and S is integrated by V.
In the speed mode, the scan preparation time of the rack is calculated until the rack enters a constant speed section, i.e., t3 in fig. 4 or t2 in fig. 5, and the corresponding speed is VtargetWhen is coming into contact with
Figure BDA0001061563260000081
When it is the trace of FIG. 4, when
Figure BDA0001061563260000082
Is the fig. 5 trace.
The scan preparation time in speed mode can be described as:
Figure BDA0001061563260000083
where j, maximum acceleration amax, VtargetAll are constant values.
In the positioning mode, the scanning preparation time of the rack is calculated until the rack enters the positioning mode in the speed mode, i.e. t3-t6 in fig. 4 or t2-t4 in fig. 5, and the scanning preparation time in the positioning mode can be described as follows:
Figure BDA0001061563260000084
Vpositonis the speed at which the positioning movement is entered,
in summary, the preparation time for the rotation of the rack is as follows: at speed mode of TspeedIn the positioning mode, Tposition。
(4) Obtaining scan preparation time for collimator modules
The scan preparation time of the collimator block includes a time to set a slice plate and a shape filter. The motion trajectory of a typical chipper plate and shape filter is in a trapezoidal pattern as shown in fig. 5, and when the velocity does not reach the maximum velocity, the motion trajectory of the chipper plate and shape filter is in a triangular pattern, which is a special case of a trapezoid. When the speed reaches the maximum moving speed, the motion trail of the slicing plate and the shape filter is in a trapezoidal mode. Judging whether the maximum speed can be reached in the movement, calculating the running stroke S,
Figure BDA0001061563260000085
a triangular mode, otherwise, a trapezoidal mode.
The preparation time for scanning both the chipper plate and the shape filter can be described as
Figure BDA0001061563260000086
The scan preparation time of the collimator block is the maximum of the scan preparation time of the chipper plate and the shape filter.
(5) Obtaining scanning preparation time of a hospital bed preparation module
The bed preparation module is also in a speed division mode and a position mode, and is consistent with the acquisition algorithm of the scanning preparation time of the rack rotating module.
(6) Obtaining scan preparation time for other accessory device preparation modules
Some auxiliary devices are devices which are not necessary for scanning, such as syringes, ECG and the like, and the initialization time and the parameter configuration validation time of the devices can be provided by referring to a technical manual without additional algorithms.
And S105, calculating the scanning preparation time of the CT system according to the scanning preparation time of each module and the operation relation among the modules.
Specifically, the preparation time for scanning the CT system is calculated according to a critical path method. In this embodiment, the X-ray anode acceleration module and the gantry rotation module operate in series, the X-ray anode acceleration module and the X-ray other configuration module operate in parallel, and the detector module, the collimator module, the patient bed preparation module and the other accessory device preparation module operate in parallel and are all independent of the operating states of the X-ray anode acceleration module, the X-ray other configuration module and the gantry rotation module.
Specifically, the calculating of the scan preparation time of the CT system according to the critical path method is shown in fig. 6, and includes:
s1051, all selectable paths for completing scanning preparation of the CT system are obtained according to the operation relation among the modules, and the selectable paths are paths which one module needs to pass after completing scanning preparation.
And S1052, acquiring the weight of the optional path according to the time for completing scanning preparation of each module.
And S1053, taking the weight with the maximum value as the scanning preparation time of the CT system.
Taking fig. 7 as an example, t1 is a time point when the scanning preparation of the detector module is completed, t2 is a time point when the scanning preparation of the X-ray anode acceleration module is completed, t3 is a time point when the scanning preparation of the collimator module is completed, t5 is a time point when the scanning preparation of all X-rays related to the X-ray anode acceleration module is completed by the X-ray other configuration module and the X-ray anode acceleration module, t6 is a time point when the bed preparation module moves the bed to a specified position, and t7 is a time point when the gantry reaches a specified position or a rotational speed by the gantry rotation module.
The alternative paths for completing the work on the upper graph are:
path1:t0->t2->t7
path2:t0->t2-t5
path3:t0->t3
path4:t0->t1
path5:t0->t5
path6：t0->t4
and acquiring the weight of the optional path according to the preparation time of the sub-path related module. And taking the weight with the maximum value as the scanning preparation time of the CT system.
Example 2:
a display method for a scanning preparation process of a CT system, as shown in fig. 8, includes the following steps:
s201, acquiring scanning preparation time of the CT system by using the calculation method for the scanning preparation time of the CT system provided in the embodiment 1.
And S202, displaying the scanning preparation time of the CT system.
S203, displaying the progress of scanning preparation of the CT system through a working progress bar, wherein the progress is the ratio of the number of the modules which complete scanning preparation to the number of all modules which need scanning preparation.
Specifically, as shown in fig. 9, in the process of scan preparation, the display page counts down with the CT system scan preparation time acquired in S201 as the start time.
Example 3:
a computing system for CT system scan preparation time, as shown in fig. 10, comprising:
a scanning parameter obtaining module 301, configured to obtain scanning parameters.
A correlation module obtaining module 302, configured to determine modules participating in scan preparation according to the scan parameters, where the modules include a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a gantry rotation module, a collimator module, other accessory equipment preparation modules, and/or a patient bed preparation module.
The X-ray anode acceleration module and the rack rotation module run in series, the X-ray anode acceleration module and the X-ray other configuration module run in parallel or in series, and the detector module, the collimator module and the hospital bed preparation module run in parallel and are all unrelated to the running states of the X-ray anode acceleration module, the X-ray other configuration module and the rack rotation module.
And a state parameter acquiring module 303, configured to acquire a state parameter related to scanning preparation time in each module.
A scanning preparation time acquiring module 304, configured to acquire scanning preparation times of the respective modules.
The scanning preparation time acquisition module 304 includes:
a detector preparation time calculation submodule 3041 for acquiring scan preparation time of the detector module;
an X-ray anode acceleration preparation time calculation submodule 3042 for acquiring scan preparation time of the X-ray anode acceleration module;
an X-ray other configuration preparation time calculation submodule 3043 for acquiring scan preparation times of the X-ray other configuration modules;
a gantry rotation preparation time calculation submodule 3044 for acquiring scan preparation time of the gantry rotation module;
a collimator preparation time calculation submodule 3045 for acquiring scan preparation time of the collimator module;
a bed preparation time calculation submodule 3046 configured to acquire a scan preparation time of the bed preparation module.
The other-accessory-device-preparation-time calculating sub-module 3047 is configured to acquire scan preparation times of other accessory-device preparation modules, which are preparation times of accessories of the CT gantry.
And the overall planning time calculation module 305 is used for calculating the scanning preparation time of the CT system according to the scanning preparation time of each module and the operation relation among the modules.
The overall planning time calculation module 305 calculates a CT system scanning preparation time according to a critical path method, and the overall planning time calculation module 305 includes:
the optional path obtaining sub-module 3051 is configured to obtain, according to the operation relationship between the modules, all optional paths that are required to be passed by a certain module to complete scanning preparation of the CT system,
a weight value obtaining sub-module 3052, configured to obtain a weight value of the selectable path according to time for each module to complete scanning preparation,
and the CT system scanning preparation time obtaining submodule 3053 is used for taking the weight with the maximum numerical value as the CT system scanning preparation time.
Example 4:
a display system for a scanning preparation process of a CT system, as shown in fig. 11, comprising:
a computing system 401 for CT system scan preparation time, said computing system 401 for CT system scan preparation time may be provided by embodiment 3,
a scanning time display module 402 for displaying the scanning preparation time of the CT system,
and a scanning progress display module 403, configured to display a progress of scanning preparation of the CT system through a working progress bar, where the progress is a ratio of the number of modules that have completed scanning preparation to the number of all modules that need to perform scanning preparation.
The above disclosure is only for the purpose of illustrating the preferred embodiments of the present invention, and it is therefore to be understood that the invention is not limited by the scope of the appended claims.

Claims (16)

1. A method for calculating the scanning preparation time of a CT system is characterized by comprising the following steps:
the scanning parameters are obtained, and the scanning parameters are obtained,
determining modules participating in scanning preparation according to the scanning parameters,
acquiring state parameters related to scanning preparation time in each module,
acquiring scanning preparation time of each module according to the scanning parameters and the state parameters,
and calculating the scanning preparation time of the CT system according to the scanning preparation time of each module and the operation relation among the modules.
2. The method as claimed in claim 1, wherein the modules involved in scanning preparation comprise a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a gantry rotation module, a collimator module and/or a bed preparation module.
3. The method as claimed in claim 2, wherein the CT system scan preparation time is calculated according to a critical path method.
4. The method of claim 3, wherein the X-ray anode acceleration module and the gantry rotation module are operated in series, the X-ray anode acceleration module and the X-ray other configuration module are operated in parallel or in series, and the detector module, the collimator module and the bed preparation module are operated in parallel and are independent of the operation status of the X-ray anode acceleration module, the X-ray other configuration module and the gantry rotation module.
5. The method as claimed in claim 4, wherein the calculating the scan preparation time of the CT system according to the critical path method comprises:
acquiring all selectable paths for completing the scanning preparation of the CT system according to the operational relationship among the modules, wherein the selectable paths are paths which one module needs to pass after completing the scanning preparation,
obtaining the weight of the optional path according to the time of each module completing scanning preparation,
and taking the weight with the maximum value as the scanning preparation time of the CT system.
6. The method for calculating the scanning preparation time of the CT system according to claim 2, wherein the method comprises the following steps:
the scan preparation time of the X-ray anode acceleration module includes a time to set the X-ray anode,
scan preparation time for the X-ray other configuration modules includes setting focus size, flying focus and time to prepare filament,
the scan preparation time of the gantry rotation module includes gantry acceleration, deceleration and positioning time,
the scan preparation time of the collimator block includes a time to set a slice plate and a shape filter.
7. The method as claimed in claim 2, wherein the modules involved in scanning preparation further comprise other accessory equipment preparation modules, the scanning preparation time of the other accessory equipment preparation modules is the preparation time of the accessories of the CT rack, the other accessory equipment preparation modules run in parallel with other modules, and the other modules comprise a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a rack rotation module, a collimator module and/or a bed preparation module.
8. A display method for scanning preparation time of a CT system is characterized by comprising the following steps:
displaying the preparation time of the scanning of the CT system,
or/and displaying the progress of scanning preparation of the CT system;
the scanning preparation time of the CT system is obtained by obtaining scanning parameters, determining modules participating in scanning preparation according to the scanning parameters, obtaining state parameters related to the scanning preparation time in the modules participating in scanning preparation, obtaining the scanning preparation time of each module according to the scanning parameters and the state parameters, and calculating according to the scanning preparation time of each module and the operation relation among the modules.
9. A computing system for CT system scan preparation time, comprising:
a scanning parameter acquisition module for acquiring scanning parameters,
a related module acquisition module used for determining a module participating in scanning preparation according to the scanning parameters,
a state parameter acquisition module for acquiring state parameters related to scanning preparation time in the modules participating in scanning preparation,
a scanning preparation time acquisition module for acquiring the scanning preparation time of each module according to the scanning parameters and the state parameters,
and the overall time calculation module is used for calculating the scanning preparation time of the CT system according to the scanning preparation time of each module and the operation relation among the modules.
10. The system of claim 9, wherein the modules involved in scan preparation comprise a detector module, an X-ray anode acceleration module, an X-ray other configuration module, a gantry rotation module, a collimator module, and/or a bed preparation module.
11. The system of claim 10, wherein the orchestration time calculation module calculates the CT system scan preparation time according to a critical path method.
12. The system of claim 11, wherein the X-ray anode acceleration module and the gantry rotation module are operated in series, the X-ray anode acceleration module and the X-ray other configuration module are operated in parallel or in series, and the detector module, the collimator module, and the bed preparation module are operated in parallel and are independent of the operating status of the X-ray anode acceleration module, the X-ray other configuration module, and the gantry rotation module.
13. The computing system for CT system scan preparation time of claim 12, wherein the orchestration time computing module comprises:
the optional path acquisition sub-module is used for acquiring all optional paths for completing the scanning preparation of the CT system according to the operation relation among the modules, the optional paths are paths which one module needs to pass after completing the scanning preparation,
a weight value obtaining submodule for obtaining the weight value of the selectable path according to the time of each module completing scanning preparation,
and the CT system scanning preparation time obtaining submodule is used for taking the weight with the maximum value as the CT system scanning preparation time.
14. The system of claim 10, wherein the scan preparation time acquisition module comprises:
the detector preparation time calculation submodule is used for acquiring scanning preparation time of the detector module;
the X-ray anode acceleration preparation time calculation submodule is used for acquiring the scanning preparation time of the X-ray anode acceleration module;
the X-ray other configuration preparation time calculation submodule is used for acquiring scanning preparation time of the X-ray other configuration module;
the rack rotation preparation time calculation submodule is used for acquiring scanning preparation time of the rack rotation module;
the collimator preparation time calculation submodule is used for acquiring scanning preparation time of the collimator module;
and the hospital bed preparation time calculation submodule is used for acquiring the scanning preparation time of the hospital bed preparation module.
15. The system of claim 14, wherein the scan preparation time acquisition module further comprises:
a further accessory device preparation time calculation sub-module for obtaining scan preparation times of further accessory device preparation modules, the scan preparation times of the further accessory device preparation modules comprising preparation times of CT gantry accessories, the further accessory device preparation modules running in parallel with further modules, the further modules comprising a detector module, an X-ray anode acceleration module, an X-ray further configuration module, a gantry rotation module, a collimator module and/or a bed preparation module.
16. A display system for a scanning preparation process of a CT system, comprising:
a scanning time display module for displaying the scanning preparation time of the CT system,
the scanning progress display module is used for displaying the progress of the scanning preparation of the CT system;
the scanning preparation time of the CT system is obtained by obtaining scanning parameters, determining modules participating in scanning preparation according to the scanning parameters, obtaining state parameters related to the scanning preparation time in the modules participating in scanning preparation, obtaining the scanning preparation time of each module according to the scanning parameters and the state parameters, and calculating according to the scanning preparation time of each module and the operation relation among the modules.
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