CN107561122A - A kind of evenness tester method - Google Patents

A kind of evenness tester method Download PDF

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Publication number
CN107561122A
CN107561122A CN201710773864.0A CN201710773864A CN107561122A CN 107561122 A CN107561122 A CN 107561122A CN 201710773864 A CN201710773864 A CN 201710773864A CN 107561122 A CN107561122 A CN 107561122A
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CN
China
Prior art keywords
conductive yam
electrode
data collecting
evenness
computer
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Pending
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CN201710773864.0A
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Chinese (zh)
Inventor
贾高鹏
陆振乾
***
王春霞
高大伟
刘国亮
祁珍明
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Yangcheng Institute of Technology
Yancheng Institute of Technology
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Yangcheng Institute of Technology
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Priority to CN201710773864.0A priority Critical patent/CN107561122A/en
Publication of CN107561122A publication Critical patent/CN107561122A/en
Pending legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

The present invention relates to conductive yam field, in particular to a kind of evenness tester method.This method, first, conductive yam to be measured is pulled out to evenness tester device, conductive yam is then connected to electrode system;Electrode system is connected to data collecting system, and voltage or current signal corresponding to data collecting system collection conductive yam again, and voltage or current signal are sent to computer;Finally, computer calculates the bar evenness of conductive yam according to the voltage or current signal of reception.This method, there is provided a kind of method of new testing conductive sliver evenness, test and research to the conductive yarn uniformity play the role of important.

Description

A kind of evenness tester method
Technical field
The present invention relates to conductive yam field, in particular to a kind of evenness tester method.
Background technology
Yarn, strip or the rove uniformity coefficient of thickness or weight in unit length, referred to as bar evenness vertically.
The method of general prior art test yarn bar evenness mainly has several respects:First, weight method is cut off, Fiber cut off the weight of weighing measurement yarn unit length or specific length method come test yarn bar it is dry equal Even situation, second, capacitance method is the change that the capacitance for passing through yarn is measured with parallel plate electrode come the indirect thickness for reflecting yarn Uniform situation;3rd, luminescence method, yam surface is irradiated to using directional light, covers what is formed using photosensitive device measurement yarn Shadow shapes and area to reflect indirectly the uniform situation of yarn.It is all suitable for, cuts for above-mentioned three kinds of methods of various types of yarns Disconnected weight method fiber is low compared to capacitance method and luminescence method efficiency due to needing cut-out to weigh therefore operating, and operation will complexity one A bit.Moisture and impurity have a great influence capacitance method to measurement in yarn in test process, and luminescence method will obtain higher precision pair Dependency structure requires higher to the size of ccd light-sensitive elements, therefore equipment is costly.
The content of the invention
It is an object of the invention to provide a kind of evenness tester method, there is provided a kind of new testing conductive Yarn Evenness The method of the uniformity.
To achieve these goals, the technical scheme that the embodiment of the present invention uses is as follows:
A kind of evenness tester method, comprises the following steps:Conductive yam to be measured is pulled out to evenness tester Device, wherein, evenness tester device includes conveying device, electrode system, data collecting system and computer, electrode System is arranged in conveying device, and data collecting system electrically connects with electrode system, computer and data collecting system communication link Connect;Conductive yam is connected to electrode system;Electrode system is connected to data collecting system, data collecting system collection conductive yam Corresponding voltage signal, and voltage signal is sent to computer;Computer calculates conductive yam according to the voltage signal of reception Bar evenness.
In preferred embodiments of the present invention, when conductive yam is connected into electrode system, also electrode is pressurizeed.
In preferred embodiments of the present invention, when conductive yam is connected into electrode system, direct current also is set to electrode system Power supply.
In preferred embodiments of the present invention, before voltage signal corresponding to data collecting system collection conductive yam, also connect The switch of dc source.
In preferred embodiments of the present invention, voltage signal corresponding to data collecting system collection conductive yam is to pass through collection It is connected to caused voltage signal on the calibration resistor of data collecting card input.
In preferred embodiments of the present invention, electrode system includes two first roller electrodes, two the second roller electrodes, When conductive yam is connected into electrode system, it is between conductive yam is arranged at into two first roller electrodes, and extends to two Between two roller electrodes.
In preferred embodiments of the present invention, it is that tube to be measured or spool are inserted into for creel to pull out conductive yam to be measured On, by guide eyelit, between conductive yam is drawn to two first roller electrodes, and extend to two the second roller electrodes it Between.
In preferred embodiments of the present invention, when pulling out conductive yam to be measured, control conductive yam is in two first rollers Evenly moved along a straight line between electrode and two the second roller electrodes.
In preferred embodiments of the present invention, computer calculates the bar evenness of conductive yam according to the voltage signal of reception It is computer receiving voltage signal, by computer digital animation, the resistance mean value calculation in unit length is come out, so as to Calculate bar evenness.
A kind of evenness tester method, comprises the following steps:Conductive yam to be measured is pulled out to evenness tester Device, wherein, evenness tester device includes conveying device, electrode system, data collecting system and computer, electrode System is arranged in conveying device, and electrode system includes first electrode and second electrode, data collecting system and electrode system electricity Connection, computer communicate to connect with data collecting system;Conductive yam is connected to electrode system;Electrode system is connected to data Acquisition system, current signal corresponding to data collecting system collection conductive yam, and current signal is sent to computer;Computer The bar evenness of conductive yam is calculated according to the current signal of reception.
The beneficial effects of the invention are as follows:
A kind of evenness tester method provided by the invention, first, conductive yam to be measured is pulled out to bar evenness Test device, conductive yam is then connected to electrode system;Electrode system is connected to data collecting system again, and data are adopted Voltage or current signal corresponding to collecting system collection conductive yam, and voltage or current signal are sent to computer;Finally, calculate Machine calculates the bar evenness of conductive yam according to the voltage or current signal of reception.This method, there is provided a kind of new test is led The method of electric sliver evenness, test and research to the conductive yarn uniformity play the role of important.
The present invention compared with prior art, has advantages below and high-lighting effect:(1) it is dry uniform for conductive yam lines Degree test provides new method of testing;(2) the equal of the conductive yarn is reflected using the numerical value of resistive thread in unit length Even degree, there is provided gone out new characteristic index;(3) characteristic index obtained can reflect the resistance of the yarn of unit length, pass through The value that computer continuous data samples to obtain can obtain average index and discrete indicator by processing, to reflect fiber in specified piece The uniformity index of resistance characterization in segment length including piece is intersegmental and fragment in.(4) test device mechanism is simple, surveys Test result is accurately and reliably.
Brief description of the drawings
In order to illustrate the technical solution of the embodiments of the present invention more clearly, below by embodiment it is required use it is attached Figure is briefly described, it will be appreciated that the following drawings illustrate only certain embodiments of the present invention, therefore be not construed as pair The restriction of scope, for those of ordinary skill in the art, on the premise of not paying creative work, can also be according to this A little accompanying drawings obtain other related accompanying drawings.
Fig. 1 is the schematic flow sheet for the evenness tester method that first embodiment of the invention provides;
Fig. 2 is the structural representation for the evenness tester device that first embodiment of the invention provides;
Fig. 3 is the step S1 for the evenness tester method that first embodiment of the invention provides schematic flow sheet;
Fig. 4 is the step S2 for the evenness tester method that first embodiment of the invention provides schematic flow sheet;
Fig. 5 is the step S3 for the evenness tester method that first embodiment of the invention provides schematic flow sheet.
Icon:100- evenness tester devices;110- conveying devices;111- supplies creel;112- tubes;113- guides Hook;114- connects yarn box;120- electrode systems;121- first roller electrodes;First roller electrode above 122-;Below 123- First roller electrode;124- the second roller electrodes;The second roller electrode above 125-;The second roller electrode below 126-; 127- insulating barriers;128- dc sources;129- is switched;130- data collecting systems;131- data collecting cards;132- measuring resistances Device;140- computers;150- conductive yams.
Embodiment
To make the purpose, technical scheme and advantage of the embodiment of the present invention clearer, below in conjunction with the embodiment of the present invention In accompanying drawing, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is Part of the embodiment of the present invention, rather than whole embodiments.The present invention implementation being generally described and illustrated herein in the accompanying drawings The component of example can be configured to arrange and design with a variety of.
Therefore, below the detailed description of the embodiments of the invention to providing in the accompanying drawings be not intended to limit it is claimed The scope of the present invention, but be merely representative of the present invention selected embodiment.It is common based on the embodiment in the present invention, this area The every other embodiment that technical staff is obtained under the premise of creative work is not made, belong to the model that the present invention protects Enclose.
It should be noted that:Similar label and letter represents similar terms in following accompanying drawing, therefore, once a certain Xiang Yi It is defined, then it further need not be defined and explained in subsequent accompanying drawing in individual accompanying drawing.
, it is necessary to explanation in the description of the embodiment of the present invention, term " on ", the orientation of the instruction such as " interior " or position close Be for based on orientation shown in the drawings or position relationship, or the invention product using when the orientation usually put or position close System, it is for only for ease of and describes the present invention and simplify description, rather than indicates or imply that signified device or element must have Specific orientation, with specific azimuth configuration and operation, therefore be not considered as limiting the invention.
In the description of the invention, it is also necessary to explanation, unless otherwise clearly defined and limited, term " setting ", " installation ", " connected ", " connection " should be interpreted broadly, for example, it may be fixedly connected or be detachably connected, or one Connect body;Can be joined directly together, can also be indirectly connected by intermediary, can be the connection of two element internals. For the ordinary skill in the art, the concrete meaning of above-mentioned term in the present invention can be understood with concrete condition.
First embodiment
Fig. 1-Fig. 5 is refer to, the present embodiment provides a kind of evenness tester method, comprised the following steps:
S1, conductive yam 150 to be measured is pulled out to evenness tester device 100.
Specifically, evenness tester device 100 includes conveying device 110, electrode system 120, data collecting system 130 and computer 140.Electrode system 120 is arranged in conveying device 110, data collecting system 130 and electrode system 120 Electrical connection, computer 140 communicate to connect with data collecting system 130.
Conductive yam 150 is different from traditional yarn, and conducting staple fiber or long filament are added in weaving process, is formed conductive Mixed yarn or pure yarn, because conductive fiber is that conductive yam 150 therefore electronic conduction is knitted caused by has at a fairly low electricity Resistance.The resistance of conductive yam 150 is influenceed smaller by ambient temperature and humidity.Response of the conductive yam 150 to electric field is exceedingly fast, conductive yam If 150 thicknesses are uneven, the size of the resistance value of test can also have quick reflection to this.
In use, conveying device 110 transmits conductive yam 150, by electrode system 120, electrode system 120 connects conductive yam 150 to data collecting system 130, and data collecting system 130 gathers voltage signal corresponding to conductive yam 150, and by voltage signal Computer 140 is sent to, computer 140 calculates the bar evenness of conductive yam 150 according to the voltage signal of reception.
S1.1, tube 112 to be measured is inserted into added for yarn, conductive yam 150 is drawn to two first by twizzle 113 Between roller electrode 121, extend between two the second roller electrodes 124;
Electrode system 120 includes two first roller electrodes, 121, two the second roller electrodes 124, and conductive yam 150 is connected When being connected to electrode system 120, it is between conductive yam 150 is arranged at into two first roller electrodes 121, and extends to two second Between roller electrode 124.
Specifically, it is that tube 112 to be measured or spool are inserted into on creel 111, passing through to pull out conductive yam 150 to be measured Guide eyelit, between conductive yam 150 is drawn to two first roller electrodes 121, and extend to two the second roller electrodes 124 it Between.
It should be understood that above-mentioned can be according to being actually needed the common model in selection this area for creel 111, twizzle 113.
S1.2, when pulling out conductive yam 150 to be measured, control conductive yam 150 is in two first roller electrodes 121 and two Evenly moved along a straight line between second roller electrode 124.
Specifically, the motion switch of roller electrode is opened so that two first roller electrodes 121 and two the second roller electricity Pole 124 rotates, so as to realize that conductive yam 150 controls in two first roller electrodes 121 and two the second roller electrodes 124 In the range of move along a straight line.
S2, conductive yam 150 is connected to electrode system 120.
S2.1, electrode is pressurizeed;
Specifically, when by guide eyelit, conductive yam 150 is drawn to two first roller electrodes 121 and two second sieve After between pulling electrode 124, appropriate pressure is being added above using pressue device.
It should be understood that above-mentioned specific pressue device can select the common pressue device in this area according to actual conditions.Add The value of pressure selects appropriate value to be pressurizeed according to the situation of specific conductive yam 150.
S2.2, dc source 128 is set;
Specifically, above-mentioned first electrode includes a pair of first roller electrodes 121, and second electrode includes a pair of second rollers Electrode 124.Fig. 2 is refer to, wherein, a pair of first roller electrodes 121 include the first roller electrode 122 being disposed over and set Put the first roller electrode 123 in lower section.Also, the first roller electrode 122 of top and the first roller electrode 123 of lower section are led It is logical.The second roller electricity that a pair of second roller electrodes 124 include the second roller electrode 125 being disposed over and are arranged below Pole 126.Also, the second roller electrode 125 of top and the second roller electrode 126 of lower section turn on.
Further, a pair of above-mentioned first roller electrodes 121 and a pair of second roller electrodes 124 are including axle center and absolutely Edge layer 127, insulating barrier 127 are arranged at the periphery in axle center.By the setting of this structure, it can not only ensure that conductive yam 150 is suitable The transmission of profit, is also advantageously detected in during transmission to conductive yam 150.Open above-mentioned first roller electricity The motion switch of the roller electrode 124 of pole 121 and second, two pairs of roller electrodes rotate, and conductive yam 150 can control in roller electrode In the range of do linear uniform motion.
S2.3, switch 129 is set.
Specifically, switch 129 is arranged between dc source 128 and first roller electrode 121.
S3, electrode system 120 is connected to data collecting system 130, it is right that data collecting system 130 gathers conductive yam 150 The voltage signal answered, and voltage signal is sent to computer 140.
S3.1, the switch 129 for connecting dc source 128.
After roller motion switch is started, two pairs of rollers start along rotate counterclockwise, and conductive yam 150 is with appropriate tension water Even speed is moved from left to right, starting switch 129, and the control data capture card 131 of computer 140 is to calibration resistor after energization Caused voltage signal is gathered in real time on 132.
S3.2, collection are connected to caused voltage signal on the calibration resistor 132 of the input of data collecting card 131.
Specifically, data collecting system 130 includes data collecting card 131, and the input of data collecting card 131 is electrically connected to Electrode system 120, output end communicate to connect with computer 140.
Further, in an optional embodiment of the invention, data collecting system 130 also includes calibration resistor 132, Calibration resistor 132 is electrically connected to first electrode and second electrode.
In use, when roller electrode rotates, appropriate pressure is added on conductive yam 150 using pressue device;Will Data collecting card 131 is connected to the both ends of calibration resistor 132;The switch 129 of dc source 128 is connected, then opens computer 140 Data acquisition software, the control data capture card 131 of computer 140 carry out real to caused voltage signal on calibration resistor 132 When gather.
S4, computer 140 calculate the bar evenness of conductive yam 150 according to the voltage signal of reception.
Specifically, the receiving voltage signal of computer 140, by the data processing of computer 140, by the resistance in unit length Mean value calculation comes out, so as to calculate bar evenness.
Second embodiment
The present embodiment provides a kind of evenness tester method, and it is essentially identical with first embodiment, institute's difference It is, current signal corresponding to data collecting system collection conductive yam, and current signal is sent to computer.Computer according to The current signal of reception calculates the bar evenness of conductive yam.
Specifically, comprise the following steps:
Conductive yam to be measured is pulled out to evenness tester device, wherein, evenness tester device includes conveying Device, electrode system, data collecting system and computer, electrode system are arranged in conveying device, and electrode system includes the One electrode and second electrode, data collecting system electrically connect with electrode system, and computer communicates to connect with data collecting system;
Conductive yam is connected to electrode system;
Electrode system is connected to data collecting system, data collecting system gathers current signal corresponding to conductive yam, and Current signal is sent to computer;
Computer calculates the bar evenness of conductive yam according to the current signal of reception.
In summary, a kind of evenness tester method provided by the invention, first, conductive yam to be measured is pulled out to bar Evenness test device, is then connected to electrode system by conductive yam;Electrode system is connected to data collecting system again, and And voltage or current signal corresponding to data collecting system collection conductive yam, and voltage or current signal are sent to computer; Finally, computer calculates the bar evenness of conductive yam according to the voltage or current signal of reception.This method, there is provided Yi Zhongxin Testing conductive sliver evenness method, test and research to the conductive yarn uniformity play the role of important.
The present invention compared with prior art, has advantages below and high-lighting effect:(1) it is dry uniform for conductive yam lines Degree test provides new method of testing;(2) the equal of the conductive yarn is reflected using the numerical value of resistive thread in unit length Even degree, there is provided gone out new characteristic index;(3) characteristic index obtained can reflect the resistance of the yarn of unit length, pass through The value that computer continuous data samples to obtain can obtain average index and discrete indicator by processing, to reflect fiber in specified piece The uniformity index of resistance characterization in segment length including piece is intersegmental and fragment in.(4) test device mechanism is simple, surveys Test result is accurately and reliably.
The preferred embodiments of the present invention are the foregoing is only, are not intended to limit the invention, for the skill of this area For art personnel, the present invention can have various modifications and variations.Within the spirit and principles of the invention, that is made any repaiies Change, equivalent substitution, improvement etc., should be included in the scope of the protection.It should be noted that:Similar label and letter exists Similar terms is represented in following accompanying drawing, therefore, once being defined in a certain Xiang Yi accompanying drawing, is then not required in subsequent accompanying drawing It is further defined and explained.

Claims (10)

  1. A kind of 1. evenness tester method, it is characterised in that comprise the following steps:
    Conductive yam to be measured is pulled out to evenness tester device, wherein, the evenness tester device includes conveying Device, electrode system, data collecting system and computer, the electrode system are arranged in the conveying device, the number Electrically connected according to acquisition system with the electrode system, the computer communicates to connect with the data collecting system;
    The conductive yam is connected to the electrode system;
    The electrode system is connected to the data collecting system, the data collecting system is gathered corresponding to the conductive yam Voltage signal, and the voltage signal is sent to the computer;
    The computer calculates the bar evenness of the conductive yam according to the voltage signal of reception.
  2. 2. evenness tester method as claimed in claim 1, it is characterised in that the conductive yam is connected to electrode system During system, also the electrode is pressurizeed.
  3. 3. evenness tester method as claimed in claim 2, it is characterised in that the conductive yam is connected to electrode system During system, dc source also is set to the electrode system.
  4. 4. evenness tester method as claimed in claim 3, it is characterised in that described in the data collecting system collection Before voltage signal corresponding to conductive yam, the switch of the dc source is also connected.
  5. 5. evenness tester method as claimed in claim 4, it is characterised in that described in the data collecting system collection Voltage signal corresponding to conductive yam be by collection be connected on the calibration resistor of the data collecting card input caused by Voltage signal.
  6. 6. evenness tester method as claimed in claim 1, it is characterised in that the electrode system includes two first Roller electrode, two the second roller electrodes, are that the conductive yam is arranged at into institute when the conductive yam is connected into electrode system Between stating two first roller electrodes, and extend between described two second roller electrodes.
  7. 7. evenness tester method as claimed in claim 6, it is characterised in that pulling out the conductive yam to be measured is Tube to be measured or spool are inserted into on creel, by guide eyelit, the conductive yam is drawn to two first roller electricity Between pole, and extend between two the second roller electrodes.
  8. 8. evenness tester method as claimed in claim 7, it is characterised in that pull out the conductive yam to be measured When, control the conductive yam evenly to do straight line between two first roller electrodes and two the second roller electrodes Motion.
  9. 9. evenness tester method as claimed in claim 1, it is characterised in that the computer is according to reception The bar evenness that voltage signal calculates the conductive yam is that the computer receives the voltage signal, by the computer Data processing, the resistance mean value calculation in unit length is come out, so as to calculate the bar evenness.
  10. A kind of 10. evenness tester method, it is characterised in that comprise the following steps:
    Conductive yam to be measured is pulled out to evenness tester device, wherein, the evenness tester device includes conveying Device, electrode system, data collecting system and computer, the electrode system are arranged in the conveying device, the electricity Electrode systems include first electrode and second electrode, and the data collecting system electrically connects with the electrode system, the computer Communicated to connect with the data collecting system;
    The conductive yam is connected to electrode system;
    Electrode system is connected to data collecting system, the data collecting system gathers electric current letter corresponding to the conductive yam Number, and the current signal is sent to the computer;
    Computer calculates the bar evenness of the conductive yam according to the current signal of reception.
CN201710773864.0A 2017-08-31 2017-08-31 A kind of evenness tester method Pending CN107561122A (en)

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Application Number Priority Date Filing Date Title
CN201710773864.0A CN107561122A (en) 2017-08-31 2017-08-31 A kind of evenness tester method

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Application Number Priority Date Filing Date Title
CN201710773864.0A CN107561122A (en) 2017-08-31 2017-08-31 A kind of evenness tester method

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Publication Number Publication Date
CN107561122A true CN107561122A (en) 2018-01-09

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001056596A (en) * 1999-08-18 2001-02-27 Toei Sangyo Kk Resistance value measuring instrument for conductive yarn
CN1412547A (en) * 2002-10-25 2003-04-23 东华大学 Virtual strip uniformity testing instrument
JP2005248333A (en) * 2004-03-01 2005-09-15 Toyota Industries Corp Quality control method of fiber bundle in spinning machine
CN202049133U (en) * 2011-04-14 2011-11-23 乌斯特技术股份公司 Measurement terminal for detecting solid-wire-shaped object
CN102352544A (en) * 2011-07-06 2012-02-15 太仓宏大方圆电气有限公司 Capacitance type yarn levelness uniformity instrument
CN202256240U (en) * 2011-09-20 2012-05-30 乌斯特技术股份公司 Evenness tester for yarn detection
CN202256241U (en) * 2011-09-20 2012-05-30 乌斯特技术股份公司 Evenness device with measurement end for detecting solid and liner objects

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001056596A (en) * 1999-08-18 2001-02-27 Toei Sangyo Kk Resistance value measuring instrument for conductive yarn
CN1412547A (en) * 2002-10-25 2003-04-23 东华大学 Virtual strip uniformity testing instrument
JP2005248333A (en) * 2004-03-01 2005-09-15 Toyota Industries Corp Quality control method of fiber bundle in spinning machine
CN202049133U (en) * 2011-04-14 2011-11-23 乌斯特技术股份公司 Measurement terminal for detecting solid-wire-shaped object
CN102352544A (en) * 2011-07-06 2012-02-15 太仓宏大方圆电气有限公司 Capacitance type yarn levelness uniformity instrument
CN202256240U (en) * 2011-09-20 2012-05-30 乌斯特技术股份公司 Evenness tester for yarn detection
CN202256241U (en) * 2011-09-20 2012-05-30 乌斯特技术股份公司 Evenness device with measurement end for detecting solid and liner objects

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Application publication date: 20180109