CN107505520A - Scene-type intelligence automatically testing platform and method - Google Patents
Scene-type intelligence automatically testing platform and method Download PDFInfo
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- CN107505520A CN107505520A CN201710631990.2A CN201710631990A CN107505520A CN 107505520 A CN107505520 A CN 107505520A CN 201710631990 A CN201710631990 A CN 201710631990A CN 107505520 A CN107505520 A CN 107505520A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
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Abstract
The invention discloses a kind of scene-type intelligence automatically testing platform and method, the platform includes test function virtual module, test case module, interface module and test report generation module, test function virtual module is used for description method and parameter by setting test scene, can be used for different types of equipment test；The test function virtual module includes some test function submodules；Test case module is used for the corresponding test system test case file of parameter generation according to test function submodule；Interface module includes the driving interface module for being connected with different tester signals, to control tester output and feed back, and the platform interface module with the communication connection of different types of test system；Test report generation module is used to call tester interface module control tester output test volume, calls test system communication interface module to receive the data tested automatically, and inputted according to the form of regulation.
Description
Technical field
The present invention relates to intelligent test method, especially a kind of scene-type intelligence automatically testing platform and method.
Background technology
As electronic technology, intelligent grid develop rapidly, intelligent apparatus reliability of operation and stability is very heavy
Want.Every kind of device（Such as protective relaying device, equipment for monitoring power quality, voltage monitoring instrument, tester etc.）Each
Function is required for by strict test.Meanwhile association again be present, it is necessary to cross-beta between each function of each device, because
The complexity of this test is very high, test period length.
For at present, the Auto-Test System of single type device has occurred, but because the species of device is various, base
In the various test applications of variety classes device, existing automatic testing software scalability and flexibility are inadequate, according to current
For method, it is necessary to carry out a set of Auto-Test System of individually exploitation of different application, development amount is big, takes time and effort, and not
Easily it is managed and safeguards；The test report of all types of devices, data reporting disunity, nonstandardized technique, management are inconvenient, no
Meet big data application demand in future.
The content of the invention
In order to solve above mentioned problem existing for prior art, there is provided a kind of scene-type intelligence automatic test approach and realization
The automatically testing platform of this method.
Technical scheme：A kind of scene-type intelligence automatically testing platform, it is characterised in that including：
Test function virtual module, by setting the description method and parameter of test scene, it can be used for different types of
Equipment is tested；The test function virtual module includes some test function submodules, and each test function submodule includes using
In some functional parameters for fictionalizing test scene, for describing the data type storehouse of each functional parameter data type, and
For the communication command storehouse communicated with test system；
Test case module, for the corresponding test system test case file of parameter generation according to test function submodule；
Interface module, including connect for being connected with different tester signals, with the driving for controlling tester to export and feed back
Mouth mold block, and the platform interface module with the communication connection of different types of test system；
Test report generation module, for calling tester interface module control tester output test volume, call test system
Communication interface module receives the data tested automatically, and is inputted according to the form of regulation.
According to an aspect of the present invention, the scene-type intelligence automatically testing platform also includes scene handover module, uses
In predetermined switching signal of the reception for input, or according to tester and the signal of Devices to test, corresponding test is called to use
Example text part, switch test scene.
According to an aspect of the present invention, the functional parameter dtd--data type definition storehouse includes the various events under test scene
Hinder parameter type, such as fault type, fault direction and variation pattern etc..
According to an aspect of the present invention, the communication command storehouse includes reading definite value, writes definite value, read control word, write control
Word and reading measure.
A kind of scene-type intelligence automatic test approach, comprises the following steps：
The first step, test scene is designed for different types of Devices to test, determine the description method of each test scene and retouch
State parameter；
Second step, digitization description is carried out to each test scene, joined by the parameter of design function storehouse and each function, function
Each test scene is described for several data types and communication command storehouse；It is used to control different type to survey under setting different scenes
The output of test instrument and the driving interface of feedback, and the platform interface for being communicated with different type tested device；
3rd step, test case file is generated according to the data of each test scene；
4th step, according to the corresponding test case file of the type and parameter call of test system and/or tester, start to survey
Trial work is made；
5th step, generate test report and exported according to predetermined format.
According to an aspect of the present invention, in the 4th step, the type and ginseng of the test system and/or tester
Number is voluntarily obtained by automatically testing platform or inputted by tester.
According to an aspect of the present invention, in the 4th step, after test case file is called, performs device test is used
Order in example text part, and it is not of the same race according to the normalized tester driving interface control of the type selecting of tester
The output of class testing instrument and feedback, carried out according to the communication protocol platform that tested device type selecting standardizes and tested device
Communication, complete automatic test.
According to an aspect of the present invention, it is defeated according to the user received when changing tester and/or Devices to test
The tester or the signal of Devices to test that the switching signal entered either receives, switch test scene, re-call test
Use-case file, step 3 is performed to five.
According to an aspect of the present invention, when needing switch test scene, also have one between step 2 and step 3
Intelligent decision step：The type information of its own is uploaded to automatically testing platform by tester and/or Devices to test, automatic to survey
Examination platform judges to use which kind of test scene, and switch test scene according to relevant information.
Beneficial effect：
First, from all types of device to test angles, each application scenarios are abstracted, different tester driving interfaces are entered
Row standardization, the communication to variety classes tested device carry out hardware and software platform.
2nd, according to the type of tester, normalized tester driving interface is selected to control variety classes to survey
The output of test instrument and feedback, according to tested device type, communication protocol platform and the tested device of selection standard are led to
News, automatic test is completed, generates test report.Section quickly carries out the switching and extension of more applications, realizes to all types of devices
Automatic test.
Brief description of the drawings
Fig. 1 is the principle schematic of the present invention.
Embodiment
The present invention is described with reference to Fig. 1, first, device species is various existing for prior art in order to solve, existing test system
Uniting, standardization level is low, autgmentability and flexibility are inadequate, it is difficult to more scenes, multi-functional is realized, the shortcomings that the test of hardware and software platform.Carry
A kind of new solution is gone out.
The program by analyzing test device and test scene, divides different test scenes, and pass through first
Test parameter is set to describe corresponding test scene, realizes multifunctional testing and standardized test.
First, from test philosophy, the setting and description of scene are carried out to different types of application：
1. structure measurand test function defines java standard library, every kind of tested device has different test functions, is answered according to actual
Described with different test function data interface standardizations is taken out.
2. build testing parameter data type definition storehouse：The parameters data type of specific test function is described.Such as
Fault type, fault direction, variation pattern etc..
3. structure measurand communication command defines java standard library.Need to be communicated with every kind of device, it is necessary to be communicated
The description of order, it is exactly to read definite value, write definite value, read control word, write control word, read measurement amount etc. for protection device.
4. build and realize that tester Standardization instrument tester interface drives：For controlling different type tester
Output and feedback.
5. structure and realization standardization communication protocol platform interface：For being communicated with different type tested device.
Then, measurand test function module, testing parameter data type, measurand is built according to test scene to lead to
Command definition java standard library generation variety classes device to test use-case file is interrogated, automatically testing platform is according to device to test example text
Part, the order in performs device test case file, according to the type of tester, selects normalized tester to drive
The output of mobile interface control variety classes tester and feedback, according to tested device type, the communication protocol of selection standard
Platform is communicated with tested device, completes automatic test, generation standard testing report.
In a further embodiment, scenario building specifically includes tests for different types of equipment, and abstract analysis carries
Refine test scene；Build the description method and storage format of test scene.Auto-Test System includes completing the survey of various applications
Function is tried, generates test case；Design is communicated with variety classes device；It is defeated that design controls different test equipments to carry out signal
Go out and feed back.The switching of different application scene, scene switching mainly include two ways, and one kind is tester according to tester
The information such as the model of device and/or Devices to test, switching signal is inputted to automatically testing platform, automatically testing platform receives automatically
After switching signal, corresponding test case file is called, completes scene switching.Another kind is that automatically testing platform is provided with intelligence
Energy detection and handover module, after connecting test instrument and Devices to test, can obtain tester and/or Devices to test automatically
The information such as model, judge which kind of test case file called according to these information, and then complete test scene switching.
It is illustrated below：, it is necessary to be rapidly switched to electric energy matter from automatic test system of relay protection device under some scene
Measure monitoring device Auto-Test System.
Again the automatic test scene of equipment for monitoring power quality is defined：
1st step, structure measurand test function description standard storehouse.Every kind of tested device has different test functions, according to reality
Border application takes out different test function data interface standardization descriptions.
2nd step, structure testing parameter data type specification storehouse：The parameters data class of the specific each test function of description
Type.Such as fault type, fault direction, variation pattern etc..
3rd step, structure measurand communication command java standard library.Need to be communicated with every kind of device, it is necessary to be communicated
The description of order, it is exactly to read definite value, write definite value, read control word, write control word, read measurement amount etc. for protection device.
4th step, build and realize that tester Standardization instrument tester interface drives：For controlling different type tester
The output of device and feedback.
5th step, fixed structure and realization standardization communication protocol platform interface：For being led to different type tested device
News.
In a word, the present invention is abstracted, to different testers from all types of device to test angles to each application scenarios
Device driving interface is standardized, and the communication to variety classes tested device is standardized, hardware and software platform.The present invention is according to test
The type of instrument, normalized tester driving interface is selected to control output and the feedback of variety classes tester,
According to tested device type, communication protocol platform and the tested device of selection standard are communicated, and complete automatic test, generation
Standard testing is reported.So as to quickly carry out the switching and extension of more applications, the automatic test to all types of devices is realized.It is 1. various
The device to test report of type and data reporting realize standardization.2. the Auto-Test System of the new types of devices of exploitation is more
Add easily.3. the system safeguarded only has one（Prior art is that the device of each type will safeguard set of system）.
The present invention is applied to the automatic test of intelligence with a kind of another device of instrument test, and it passes through various devices
Including：The dresses such as protective relaying device, equipment for monitoring power quality, voltage monitoring instrument, tester, meter are abstract to be built into various answer
With scene, automatically testing platform loading one of which scene, it is possible to realize the automatic test of intelligence to a kind of device, reach fast
Fast-growing reduces the workload for individually developing all types of device autotest programs, formed unitized, flat into the purpose of various applications
Platformization manages the intelligent Auto-Test System platform of all types of devices.
Claims (9)
- A kind of 1. scene-type intelligence automatically testing platform, it is characterised in that including：Test function virtual module, by setting the description method and parameter of test scene, it can be used for different types of Equipment is tested；The test function virtual module includes some test function submodules, and each test function submodule includes using In some functional parameters for fictionalizing test scene, for describing the data type storehouse of each functional parameter data type, and For the communication command storehouse communicated with test system；Test case module, the file for the corresponding test system test of parameter generation according to test function submodule；Interface module, including connect for being connected with different tester signals, with the driving for controlling tester to export and feed back Mouth mold block, and the platform interface module with the communication connection of different types of test system；Test report generation module, for calling tester interface module control tester output test volume, call test system Communication interface module receives the data tested automatically, and is inputted according to the form of regulation.
- 2. scene-type intelligence automatically testing platform as claimed in claim 1, it is characterised in that the scene-type intelligence is automatic to be surveyed Examination platform also includes scene handover module, and the predetermined switching signal of input is used for for receiving, or according to tester and to be measured The signal of equipment, call corresponding test case file, switch test scene.
- 3. scene-type intelligence automatically testing platform as claimed in claim 1, it is characterised in that the functional parameter data type Defining storehouse includes the various fault parameter types under test scene, and fault parameter type includes fault type, fault direction and change Change mode.
- 4. scene-type intelligence automatically testing platform as claimed in claim 1, it is characterised in that the communication command storehouse includes reading Definite value, definite value is write, reads control word, control word is write and reads measurement.
- 5. a kind of scene-type intelligence automatic test approach, it is characterised in that comprise the following steps：The first step, test scene is designed for different types of Devices to test, determine the description method of each test scene and retouch State parameter；Second step, digitization description is carried out to each test scene, joined by the parameter of design function storehouse and each function, function Each test scene is described for several data types and communication command storehouse；It is used to control different type to survey under setting different scenes The output of test instrument and the driving interface of feedback, and the platform interface for being communicated with different type tested device；3rd step, test case file is generated according to the data of each test scene；4th step, according to the corresponding test case file of the type and parameter call of test system and/or tester, start to survey Trial work is made；5th step, generate test report and exported according to predetermined format.
- 6. scene-type intelligence automatic test approach as claimed in claim 5, it is characterised in that described to treat in the 4th step The type and parameter for surveying device and/or tester are voluntarily obtained by automatically testing platform or inputted by tester.
- 7. scene-type intelligence automatic test approach as claimed in claim 5, it is characterised in that in the 4th step, calling After test case file, the order in performs device test case file, and standard is performed according to the type selecting of tester The output of the tester driving interface control variety classes tester of change and feedback, according to tested device type selecting standard Communication protocol platform and the tested device of change are communicated, and complete automatic test.
- 8. scene-type intelligence automatic test approach as claimed in claim 5, it is characterised in that when change tester and/or During Devices to test, the tester or the letter of Devices to test that are either received according to the switching signal of the user's input received Number, switch test scene, test case file is re-called, perform step 3 to five.
- 9. scene-type intelligence automatic test approach as claimed in claim 8, it is characterised in that when needing switch test scene When, also there is an intelligent decision step between step 2 and step 3：The type information of its own is uploaded to automatically testing platform, automatically testing platform root by tester and/or Devices to test Which kind of judge to use test scene, and switch test scene according to relevant information.
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| CN201710631990.2A CN107505520B (en) | 2017-07-28 | 2017-07-28 | Scene type intelligent automatic test platform and method |
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| CN108061833A (en) * | 2017-12-14 | 2018-05-22 | 南京能云电力科技有限公司 | Test equipment automatic checkout system and method based on virtual test instrument interface module |
| CN108933711A (en) * | 2018-06-29 | 2018-12-04 | 华勤通讯技术有限公司 | The automated testing method and system of terminal device |
| CN110232018A (en) * | 2019-05-17 | 2019-09-13 | 浙江数链科技有限公司 | Interface test method, device, computer equipment |
| CN110426589A (en) * | 2019-09-10 | 2019-11-08 | 南京国电南自电网自动化有限公司 | A kind of substation secondary device automatic testing method, server and system based on general-purpose interface template |
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| CN112305356A (en) * | 2020-10-26 | 2021-02-02 | 江苏罗思韦尔电气有限公司 | Portable test instrument and test method |
| CN112595434A (en) * | 2020-12-30 | 2021-04-02 | 广州旭杰电子有限公司 | Distributed optical fiber temperature measurement intelligent monitoring system |
| CN116069573A (en) * | 2022-11-16 | 2023-05-05 | 北京东方通科技股份有限公司 | Testing method and system based on API (application program interface) testing platform |
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