CN107450774B - Touch detection method, circuit, storage medium, processor and terminal - Google Patents
Touch detection method, circuit, storage medium, processor and terminal Download PDFInfo
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- CN107450774B CN107450774B CN201710633107.3A CN201710633107A CN107450774B CN 107450774 B CN107450774 B CN 107450774B CN 201710633107 A CN201710633107 A CN 201710633107A CN 107450774 B CN107450774 B CN 107450774B
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/0416—Control or interface arrangements specially adapted for digitisers
Abstract
The invention discloses a touch detection method, a touch detection circuit, a storage medium, a processor and a terminal. The method comprises the following steps: under a touch control test mode, a plurality of signal-to-noise ratios corresponding to touch control scanning signals are obtained by adjusting the value of the first register and the value of the second register; and selecting the signal-to-noise ratio to be searched from the plurality of signal-to-noise ratios, and determining the value combination of the first register and the second register. The invention solves the technical problem that the signal-to-noise ratio of scanning signals cannot be effectively improved because the non-overlapping time cannot be flexibly adjusted in the existing touch detection process.
Description
Technical Field
The present invention relates to the field of touch detection, and in particular, to a touch detection method, a touch detection circuit, a touch detection storage medium, a touch detection processor, and a touch detection terminal.
Background
The touch screen is emerging from the field of smart phones and occupies the tablet computers rapidly. With the release of the Windows 8 system, the touch screen is still advancing to electronic devices such as super notebook and integrated computer. At present, along with the wide application of the intelligent terminal, a large number of electronic devices adopt touch screen operation to replace original physical keyboard operation so as to improve the operation experience and the visual experience of users. However, the accuracy of touch detection is an irrevocable technical problem while facilitating user usage.
Fig. 1 is a schematic diagram of a partial circuit structure of a touch detection process according to the related art. As shown in fig. 1, the left side shows a Touch screen pixel subunit, and the right side shows a scan signal processing circuit in an Integrated Touch-and-Driver Chip (ITD), wherein a Touch (Touch) scan signal is input from a Tx port and a corresponding scan result is output from an Rx port. To ensure that Touch scanning signals are supplied by a capacitor CtouchAccurate reception requires superimposing a voltage signal synchronized with Touch scanning on the gate and source of a Thin Film Transistor (TFT) to cancel parasitic capacitance (including C) of the TFT at the scanning signal input nodegdAnd Csd) And panel (panel) capacitor (i.e., C)panel) And further improve the signal-to-noise ratio of the scanning signal. In addition, the synchronizing signal on the source can directly utilize the scanning signal on Tx, the gridThe synchronization signal on the pole needs to be generated under the coordination of the charge pump.
Fig. 2 is a schematic circuit configuration diagram of a charge pump according to the related art. FIG. 3 is a diagram of acquiring a TFT gate driving signal V synchronized with Touch scanning by a charge pump according to the related artGSchematic diagram of the pulse signal of (1). As shown in fig. 2 and 3, on the basis of the scan signal Tx, the charge pump is controlled to alternately be in a charging (charging) stage (i.e., the SWN switch is closed and the SWP switch is opened under the coordination of CLK _ CH and CLK _ PM) and a discharging (pumping) stage (i.e., the SWN switch is opened and the SWP switch is closed under the coordination of CLK _ CH and CLK _ PM) by acquiring the control signals CLK _ CH and CLK _ PM with a certain non-overlap (non-overlap) with Tx by using a simple delay circuit, so as to complete the TFT gate control signal VGThe process of synchronizing with the scan signal Tx, thereby reducing the parasitic capacitance of the scan signal input node. However, the non-overlap time has no flexible adjustability and cannot realize an automatic adjustable function, so that the non-overlap time has a limited effect on improving the signal-to-noise ratio of the scanning signal.
In view of the above problems, no effective solution has been proposed.
Disclosure of Invention
The embodiment of the invention provides a touch detection method, a touch detection circuit, a storage medium, a processor and a terminal, which are used for at least solving the technical problem that the signal-to-noise ratio of a scanning signal cannot be effectively improved because non-overlapping time cannot be flexibly adjusted in the existing touch detection process.
According to an embodiment of the present invention, a touch detection method is provided, including:
in a touch test mode, acquiring a plurality of signal-to-noise ratios corresponding to touch scanning signals by adjusting a value of a first register and a value of a second register, wherein the value of the first register is used for adjusting a time interval of a falling edge of an input loop control signal of a charge pump and/or a rising edge of an output loop control signal of the charge pump relative to a falling edge of the touch scanning signals in the same discharging stage, and the value of the second register is used for adjusting a duration of keeping a low level of the input loop control signal and/or keeping a high level of the output loop control signal in the same discharging stage; and selecting the signal-to-noise ratio to be searched from the plurality of signal-to-noise ratios, and determining the value combination of the first register and the second register.
Optionally, determining the plurality of signal-to-noise ratios according to a value of the first register and a value of the second register includes: selecting a first value from a first value range corresponding to a first register and a second value from a second value range corresponding to a second register according to a preset sequence, and determining the non-overlapping time of the output voltage of the charge pump relative to the touch scanning signal, wherein the first value range is determined by the number of bits of the first register, and the second value range is determined by the number of bits of the second register; and a calculating step, namely calculating and storing the signal-to-noise ratio corresponding to the touch scanning signal when the first register is set as a first value and the second register is set as a second value, and returning to the value-taking step until all values in the first value-taking range and the second value-taking range are selected.
Optionally, selecting a signal-to-noise ratio to be searched from the plurality of signal-to-noise ratios, and determining a value combination of the first register and the second register includes: comparing a plurality of signal-to-noise ratios, and selecting the maximum value of the signal-to-noise ratios; and acquiring the value of the first register and the value of the second register corresponding to the maximum value of the signal-to-noise ratio.
Optionally, before determining the plurality of signal-to-noise ratios according to the value of the first register and the value of the second register, the method further includes: and simulating the human body capacitor in a touch test mode by using the newly added test capacitor.
Optionally, before determining the plurality of signal-to-noise ratios according to the value of the first register and the value of the second register, the method further includes: and sampling and quantizing the processing result of the touch scanning signal, wherein the processing result is a voltage signal associated with non-overlapping time under the participation of the test capacitor.
According to an embodiment of the present invention, there is also provided a touch detection circuit, including:
the control circuit component is used for obtaining a plurality of signal-to-noise ratios corresponding to the touch scanning signals by adjusting the value of the first register and the value of the second register and selecting the signal-to-noise ratio to be searched from the signal-to-noise ratios to determine the value combination of the first register and the second register, wherein the value of the first register is used for adjusting the time interval of the falling edge of the input loop control signal of the charge pump and/or the rising edge of the output loop control signal of the charge pump relative to the falling edge of the touch scanning signals in the same discharging stage, and the value of the second register is used for adjusting the duration of keeping the input loop control signal at a low level and/or keeping the output loop control signal at a high level in the same discharging stage.
Optionally, the control circuit assembly is further configured to run a program, and the program performs the following processing steps: selecting a first value from a first value range corresponding to a first register and a second value from a second value range corresponding to a second register according to a preset sequence, and determining the non-overlapping time of the output voltage of the charge pump relative to the touch scanning signal, wherein the first value range is determined by the number of bits of the first register, and the second value range is determined by the number of bits of the second register; and a calculating step, namely calculating and storing the signal-to-noise ratio corresponding to the touch scanning signal when the first register is set as a first value and the second register is set as a second value, and returning to the value-taking step until all values in the first value-taking range and the second value-taking range are selected.
Optionally, the control circuit assembly is further configured to run a program, and the program performs the following processing steps: comparing a plurality of signal-to-noise ratios, and selecting the maximum value of the signal-to-noise ratios; and acquiring the value of the first register and the value of the second register corresponding to the maximum value of the signal-to-noise ratio.
Optionally, the circuit further comprises: and the detection circuit component is used for simulating the human body capacitance in a touch test mode.
Optionally, the circuit further comprises: and the analog-to-digital converter is used for sampling and quantizing the processing result of the touch scanning signal, wherein the processing result is a voltage signal associated with non-overlapping time under the participation of the test capacitor.
According to an embodiment of the present invention, there is also provided a touch detection system, including: the touch screen pixel unit control circuit and the scanning signal processing circuit in the ITD chip; the touch screen pixel unit control circuit comprises: a TFT circuit structure; the scanning signal processing circuit in the ITD chip comprises: the device comprises a control circuit component, a test circuit component, an analog-to-digital converter, a charge pump and an amplifier component; the input end of the amplifier assembly is connected with the test circuit assembly, the output end of the amplifier assembly is connected with the input end of the analog-to-digital converter, the input end of the control circuit assembly is connected with the output end of the analog-to-digital converter, the output end of the control circuit assembly is connected with the input end of the charge pump, and the output end of the charge pump is connected with the grid electrode of the TFT circuit structure.
According to an embodiment of the present invention, a storage medium is further provided, where the storage medium includes a stored program, and when the program runs, the device on which the storage medium is located is controlled to execute the touch detection method.
According to an embodiment of the present invention, a processor is further provided, where the processor is configured to execute a program, and the program executes the touch detection method when running.
According to an embodiment of the present invention, there is also provided a terminal including: the touch detection device comprises a processor, a memory, a display device and one or more programs, wherein the one or more programs are stored in the memory, and the one or more programs are used for executing the touch detection method.
In the embodiment of the invention, the value of the first register is adopted to adjust the time interval of the falling edge of the input loop control signal of the charge pump and/or the rising edge of the output loop control signal of the charge pump relative to the falling edge of the touch scanning signal in the same discharging stage, and the value of the second register is adopted to adjust the time length of keeping the input loop control signal at a low level and/or keeping the output loop control signal at a high level in the same discharging stage, under a touch test mode, a plurality of signal-to-noise ratios corresponding to the touch scanning signal are obtained by adjusting the value of the first register and the value of the second register, the signal-to-noise ratio to be searched is selected from the plurality of signal-to-noise ratios, and the value combination of the first register and the second register is determined, so that the signal-to-noise ratios of a plurality of scanning signals are obtained by flexibly adjusting the values of the two registers, and the signal-to-noise The signal-to-noise ratio and the corresponding register value combination are combined to flexibly adjust the non-overlapping time, so that the accuracy of touch detection is improved, and the technical problem that the signal-to-noise ratio of a scanning signal cannot be effectively improved due to the fact that the non-overlapping time cannot be flexibly adjusted in the existing touch detection process is solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
fig. 1 is a schematic diagram of a partial circuit structure of a touch detection process adopted in the related art;
fig. 2 is a schematic circuit configuration diagram of a charge pump according to the related art;
FIG. 3 is a diagram of acquiring a TFT gate driving signal V synchronized with Touch scanning by a charge pump according to the related artGA pulse signal diagram of (a);
FIG. 4 is a block diagram of a touch detection system for obtaining an optimal non-overlap time in a touch detection mode according to an embodiment of the invention;
FIG. 5 is a schematic diagram of a touch detection circuit for obtaining an optimal non-overlap time in a touch detection mode according to an embodiment of the invention;
FIG. 6 is a schematic diagram of pulse signals controlling a non-overlapping time manner in accordance with a preferred embodiment of the present invention;
fig. 7 is a flowchart of a touch detection method according to an embodiment of the invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
According to an embodiment of the present invention, an embodiment of a touch detection system is provided. Fig. 4 is a block diagram of a touch detection system for obtaining an optimal non-overlapping time in a touch detection mode according to an embodiment of the invention. As shown in fig. 4, the touch detection system may include: a touch screen pixel unit control circuit and a scanning signal processing circuit in the ITD chip. The touch screen pixel cell control circuit may include: a TFT circuit structure for superimposing a voltage signal synchronized with Touch scanning on the gate and source of the TFT respectively to cancel C of the scanning signal input nodegd，CsdAnd Cpanel. The source synchronization signal can directly use the Tx scan signal, and the gate synchronization signal needs to be generated with the charge pump. The scanning signal processing circuit in the ITD chip may include: control circuit assembly, test circuit assembly, analog-to-digital converter, charge pump and amplifier assembly, and method of operating the sameThe input end of the amplifier component is connected with the test circuit component, the output end of the amplifier component is connected with the input end of the analog-to-digital converter, the input end of the control circuit component is connected with the output end of the analog-to-digital converter, the output end of the control circuit component is connected with the input end of the charge pump, and the output end of the charge pump is connected with the grid electrode of the TFT circuit structure.
According to an embodiment of the present invention, an embodiment of a touch detection circuit (corresponding to the scan signal processing circuit in the ITD chip) is further provided. Fig. 5 is a schematic diagram of a touch detection circuit for obtaining an optimal non-overlap time in a touch detection mode according to an embodiment of the invention. In order to improve the signal-to-noise ratio (SNR) of Touch scan signals on the Touch screen to ensure the accuracy of Touch detection, an automatic test mode may be added to the ITD chip. Under the test mode, non-overlap time between Touch scanning signals and CLK signals of the charge pump is automatically adjusted through an internal control circuit of the ITD chip, and then the optimal signal-to-noise ratio of the scanning signals is obtained. Finally, the non-overlap time is provided for the whole ITD chip to use in normal operation. As shown in fig. 5, the touch detection circuit includes: the control circuit component is used for obtaining a plurality of signal-to-noise ratios corresponding to the touch scanning signals by adjusting the value of the first register and the value of the second register and selecting the signal-to-noise ratio to be searched from the signal-to-noise ratios to determine the value combination of the first register and the second register, wherein the value of the first register is used for adjusting the time interval of the falling edge of the input loop control signal of the charge pump and/or the rising edge of the output loop control signal of the charge pump relative to the falling edge of the touch scanning signals in the same discharging stage, and the value of the second register is used for adjusting the duration of keeping the input loop control signal at a low level and/or keeping the output loop control signal at a high level in the same discharging stage.
By adopting the circuit structure, the time interval of the falling edge of the input loop control signal of the charge pump and/or the time interval of the rising edge of the output loop control signal of the charge pump relative to the falling edge of the touch scanning signal in the same discharging stage is adjusted by adopting the value of the first register, and the time length of the input loop control signal keeping low level and/or the output loop control signal keeping high level in the same discharging stage is adjusted by adopting the value of the second register The signal-to-noise ratio and the corresponding register value combination are combined to flexibly adjust the non-overlapping time, so that the accuracy of touch detection is improved, and the technical problem that the signal-to-noise ratio of a scanning signal cannot be effectively improved due to the fact that the non-overlapping time cannot be flexibly adjusted in the existing touch detection process is solved.
It can be understood by those skilled in the art that the touch detection circuit structure shown in fig. 5 is only an illustration, and the structure is not limited thereto. For example, the touch detection circuit structure may also include more or fewer components than shown in fig. 5, or have a different configuration than shown in fig. 5.
Optionally, the control circuit assembly is further configured to run a program, and the program performs the following processing steps: selecting a first value from a first value range corresponding to a first register and a second value from a second value range corresponding to a second register according to a preset sequence, and determining the non-overlapping time of the output voltage of the charge pump relative to the touch scanning signal, wherein the first value range is determined by the number of bits of the first register, and the second value range is determined by the number of bits of the second register; and a calculating step, namely calculating and storing the signal-to-noise ratio corresponding to the touch scanning signal when the first register is set as a first value and the second register is set as a second value, and returning to the value-taking step until all values in the first value-taking range and the second value-taking range are selected.
Under the control of a control circuit component arranged inside the ITD chip, two six-bit registers T1 (namely, the first register) and T2 (namely, the first register) are added. Fig. 6 is a schematic diagram of pulse signals for controlling the non-overlapping time manner according to a preferred embodiment of the present invention. As shown in fig. 6, the value of T1 is used to adjust the time interval between the falling edge of the input loop control signal (CLK _ CH) of the charge pump and/or the rising edge of the output loop control signal (CLK _ PM) of the charge pump relative to the falling edge of the touch scan signal in the same discharge phase, and the value of T2 is used to adjust the duration of the input loop control signal at low level and/or the output loop control signal at high level in the same discharge phase. And adjusting the time starting point and the pulse width of the charge pump control signal CLK relative to Tx, so as to realize flexible and adjustable non-overlap time, thereby realizing high-efficiency synchronization of the gate drive signal and the scanning signal. Table 1 shows the delay time setting method of T1 and T2. As shown in the table 1 below, the following examples,
TABLE 1
The value range of T1 is from 000000 to 111111, the value range of T2 is from 000000 to 111111, and the non-overlap time can be flexibly adjusted through any combination of T1 and T2. For example: when the value of T2 is 000000, T1 takes values from 000000 to 111111 in sequence, when the value of T2 takes 000001, T1 takes values from 000000 to 111111 in sequence, when the value of T2 takes 000010, T1 takes values from 000000 to 111111 in sequence, …, and so on, 4096 combinations exist in total.
Optionally, the control circuit assembly is further configured to run a program, and the program performs the following processing steps: comparing a plurality of signal-to-noise ratios, and selecting the maximum value of the signal-to-noise ratios; and acquiring the value of the first register and the value of the second register corresponding to the maximum value of the signal-to-noise ratio.
In a preferred embodiment, a scanning signal-to-noise ratio calculation, analysis and comparison function can be introduced into a control circuit of the ITD chip, and is used for determining the settings of two corresponding registers T1 and T2 when the signal-to-noise ratio is optimal.
Optionally, the circuit further comprises: and the detection circuit component is used for simulating the human body capacitance in a touch test mode.
Considering that the human body capacitance needs to be acted by touching the medium (such as the user's fingertip) screen, however, in the touch test mode, there is no touch medium involved. In order to ensure that Touch scanning signals can still be detected in the Touch test mode, a test capacitor needs to be introduced to the chip side to simulate a human body capacitor.
In a preferred embodiment, test capacitance (i.e., C) may be added to the Rx nodes of several signal processing circuits in the ITD chipt) For simulating the body capacitance (i.e. C) during normal scanningtouch). Testing the switch (S) between the capacitor and the Rx node when the ITD chip is working normallyt) The connection is broken.
Optionally, the circuit further comprises: and the analog-to-digital converter (ADC) is used for sampling and quantizing the processing result of the touch scanning signal, wherein the processing result is a voltage signal associated with non-overlapping time under the participation of the test capacitor.
The ADC samples and quantizes the touch scanning signal and has the following functions: converting the continuous analog signal into a discrete digital signal facilitates the control circuit (which is a kind of digital circuit) to process the digital signal.
When the ITD is in an automatic test mode, the numerical values of the two registers of T1 and T2 are automatically adjusted from low to high bit by bit through the control circuit, so that the time length of the non-overlap is automatically controlled. After each register adjustment, the ADC samples and quantizes the output voltage of the scanning signal processing circuit, wherein the input of the scanning signal processing circuit is a touch scanning signal which is a square wave voltage, and the output of the scanning signal processing circuit is connected with the test capacitor (namely C)t) The associated voltage signal. And the control circuit calculates a corresponding signal-to-noise ratio according to the voltage signal sampled and quantized by the ADC and stores the signal-to-noise ratio data. After the two registers (4096 combined values in total) are adjusted, all the stored SNR data (in total) are processed by the control circuit4096) to determine the register setting that maximizes the signal-to-noise ratio for use by the ITD during normal operation, thereby completing the entire automatic test process.
In the touch test mode, the optimal non-overlap setting can be obtained to improve the signal-to-noise ratio of the scanning signal by automatically adjusting the non-overlap time length between Tx and CLK and automatically comparing and analyzing the signal-to-noise ratio of the scanning signal, so that the accuracy of touch detection is improved.
Under the operating environment of the touch detection circuit, fig. 7 is a flowchart of a touch detection method according to an embodiment of the invention. It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein. The above method provided by the embodiment of the present application may be executed in a mobile terminal, a computer terminal, or a similar computing device, and as shown in fig. 7, the method may include the following steps:
step S62, under a touch test mode, obtaining a plurality of signal-to-noise ratios corresponding to the touch scanning signals by adjusting the value of a first register and the value of a second register, wherein the value of the first register is used for adjusting the time interval of the falling edge of the input loop control signal of the charge pump and/or the rising edge of the output loop control signal of the charge pump relative to the falling edge of the touch scanning signals in the same discharging stage, and the value of the second register is used for adjusting the time length for keeping the input loop control signal at a low level and/or keeping the output loop control signal at a high level in the same discharging stage;
step S64, selecting the signal-to-noise ratio to be searched from the signal-to-noise ratios, and determining the value combination of the first register and the second register.
Optionally, in step S62, determining the plurality of snr ratios according to the value of the first register and the value of the second register may include the following steps:
step S621, selecting a first value from a first value range corresponding to the first register and a second value from a second value range corresponding to the second register according to a preset sequence, and determining non-overlapping time of the output voltage of the charge pump with respect to the touch scan signal, where the first value range is determined by the number of bits of the first register and the second value range is determined by the number of bits of the second register;
in step S622, when the first register is set to the first value and the second register is set to the second value, the signal-to-noise ratio corresponding to the touch scanning signal is calculated and stored, and the step S621 is returned until all values in the first value range and the second value range are selected.
Optionally, in step S64, selecting a signal-to-noise ratio to be searched from the plurality of signal-to-noise ratios, and determining the value combination of the first register and the second register may include the following steps:
step S641, comparing a plurality of signal-to-noise ratios and selecting the maximum value of the signal-to-noise ratios;
step S642, a value of the first register and a value of the second register corresponding to the maximum value of the signal-to-noise ratio are obtained.
Optionally, in step S62, before determining the plurality of signal-to-noise ratios according to the value of the first register and the value of the second register, the method may further include the following steps:
and step S60, simulating the human body capacitance in a touch test mode by using the newly added test capacitance.
Optionally, in step S62, before determining the plurality of signal-to-noise ratios according to the value of the first register and the value of the second register, the method may further include the following steps:
in step S61, sampling and quantizing the processing result of the touch scan signal, wherein the processing result is a voltage signal associated with non-overlapping time in the presence of the test capacitor.
According to an embodiment of the present invention, a storage medium is further provided, where the storage medium includes a stored program, and when the program runs, the device on which the storage medium is located is controlled to execute the touch detection method. The storage medium may include, but is not limited to: various media capable of storing program codes, such as a Flash Memory, a Read-Only Memory (ROM), a Random-Access Memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.
According to an embodiment of the present invention, a processor is further provided, where the processor is configured to execute a program, and the program executes the touch detection method when running. The processor may include, but is not limited to: ITD chip, Micro Controller Unit (MCU) or Programmable logic device (Field-Programmable gate array (FPGA)) processing device.
According to an embodiment of the present invention, there is also provided a terminal, including: the touch detection device comprises one or more processors, a memory, a display device and one or more programs, wherein the one or more programs are stored in the memory and configured to be executed by the one or more processors, and the programs comprise instructions for executing the touch detection method. In some embodiments, the terminal may be a terminal device such as a smart phone (e.g., an Android phone, an iOS phone, etc.), a tablet computer, a palmtop computer, and a Mobile Internet Device (MID), a PAD, and the like. The Display device may be a touch screen type Liquid Crystal Display (LCD), and the LCD may enable a user to interact with a user interface of the terminal. In addition, the terminal may further include: an input/output interface (I/O interface), a Universal Serial Bus (USB) port, a network interface, a power source, and/or a camera.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.
Claims (12)
1. A touch detection method is characterized by comprising the following steps:
in a touch test mode, acquiring a plurality of signal-to-noise ratios corresponding to a touch scanning signal by adjusting a value of a first register and a value of a second register, wherein the value of the first register is used for adjusting a time interval of a falling edge of an input loop control signal of a charge pump and/or a rising edge of an output loop control signal of the charge pump relative to a falling edge of the touch scanning signal in the same discharge stage, and the value of the second register is used for adjusting a duration of keeping a low level of the input loop control signal and/or a high level of the output loop control signal in the same discharge stage;
selecting a signal-to-noise ratio to be searched from the plurality of signal-to-noise ratios, and determining a value combination of the first register and the second register;
wherein, selecting the signal-to-noise ratio to be searched from the signal-to-noise ratios, and determining the value combination of the first register and the second register comprises: comparing the signal-to-noise ratios, and selecting the maximum value of the signal-to-noise ratios; and acquiring the value of the first register and the value of the second register corresponding to the maximum value of the signal-to-noise ratio so as to adjust the time starting point and the pulse width of the input loop control signal of the charge pump or the output loop control signal of the charge pump relative to the touch scanning signal.
2. The method of claim 1, wherein determining the plurality of signal-to-noise ratios based on the value of the first register and the value of the second register comprises:
selecting a first value from a first value range corresponding to the first register and a second value from a second value range corresponding to the second register according to a preset sequence, and determining the non-overlapping time of the output voltage of the charge pump relative to the touch scanning signal, wherein the first value range is determined by the number of bits of the first register, and the second value range is determined by the number of bits of the second register;
and a calculating step, when the first register is set as the first value and the second register is set as the second value, calculating and storing the current signal-to-noise ratio corresponding to the touch scanning signal, and returning to the value-taking step until all values in the first value-taking range and the second value-taking range are selected.
3. The method of claim 1, further comprising, prior to determining the plurality of signal-to-noise ratios based on the values of the first register and the second register:
and simulating the human body capacitance in the touch test mode by using the newly added test capacitance.
4. The method of claim 3, wherein prior to determining the plurality of SNR's based on the value of the first register and the value of the second register, further comprising:
and sampling and quantizing the processing result of the touch scanning signal, wherein the processing result is a voltage signal associated with non-overlapping time under the participation of the test capacitor.
5. A touch detection circuit, comprising:
the control circuit assembly is used for acquiring a plurality of signal-to-noise ratios corresponding to a touch scanning signal by adjusting a value of a first register and a value of a second register and selecting the signal-to-noise ratio to be searched from the signal-to-noise ratios in a touch test mode, and determining a value combination of the first register and the second register, wherein the value of the first register is used for adjusting a time interval of a falling edge of an input loop control signal of a charge pump and/or a rising edge of an output loop control signal of the charge pump relative to a falling edge of the touch scanning signal in the same discharging stage, and the value of the second register is used for adjusting a duration of keeping a low level of the input loop control signal and/or keeping a high level of the output loop control signal in the same discharging stage;
wherein, the control circuit component is also used for operating a program, and the program executes the following processing steps: comparing the signal-to-noise ratios, and selecting the maximum value of the signal-to-noise ratios; and acquiring the value of the first register and the value of the second register corresponding to the maximum value of the signal-to-noise ratio so as to adjust the time starting point and the pulse width of the input loop control signal of the charge pump or the output loop control signal of the charge pump relative to the touch scanning signal.
6. The circuit of claim 5, wherein the control circuit assembly is further configured to run a program that performs the following processing steps:
selecting a first value from a first value range corresponding to the first register and a second value from a second value range corresponding to the second register according to a preset sequence, and determining the non-overlapping time of the output voltage of the charge pump relative to the touch scanning signal, wherein the first value range is determined by the number of bits of the first register, and the second value range is determined by the number of bits of the second register;
and a calculating step, when the first register is set as the first value and the second register is set as the second value, calculating and storing the current signal-to-noise ratio corresponding to the touch scanning signal, and returning to the value-taking step until all values in the first value-taking range and the second value-taking range are selected.
7. The circuit of claim 5, further comprising:
and the test circuit component is used for simulating the human body capacitance in the touch test mode.
8. The circuit of claim 7, further comprising:
and the analog-to-digital converter is used for sampling and quantizing the processing result of the touch scanning signal, wherein the processing result is a voltage signal associated with non-overlapping time under the participation of the test capacitor.
9. A touch detection system, comprising: the touch screen pixel unit control circuit and the scanning signal processing circuit in the integrated touch drive ITD chip;
the touch screen pixel unit control circuit comprises: a thin film field effect transistor (TFT) circuit structure;
the scanning signal processing circuit in the ITD chip comprises: the device comprises a control circuit component, a test circuit component, an analog-to-digital converter, a charge pump and an amplifier component;
the input end of the amplifier assembly is connected with the test circuit assembly, the output end of the amplifier assembly is connected with the input end of the analog-to-digital converter, the input end of the control circuit assembly is connected with the output end of the analog-to-digital converter, the output end of the control circuit assembly is connected with the input end of the charge pump, and the output end of the charge pump is connected with the grid electrode of the TFT circuit structure;
the control circuit assembly is used for acquiring a plurality of signal-to-noise ratios corresponding to a touch scanning signal by adjusting a value of a first register and a value of a second register in a touch test mode, selecting a signal-to-noise ratio to be searched from the plurality of signal-to-noise ratios, and determining a value combination of the first register and the second register, wherein the value of the first register is used for adjusting a time interval of a falling edge of an input loop control signal of the charge pump and/or a rising edge of an output loop control signal of the charge pump relative to a falling edge of the touch scanning signal in the same discharge stage, and the value of the second register is used for adjusting a duration of keeping a low level of the input loop control signal and/or keeping a high level of the output loop control signal in the same discharge stage;
wherein, the control circuit component is also used for operating a program, and the program executes the following processing steps: comparing the signal-to-noise ratios, and selecting the maximum value of the signal-to-noise ratios; and acquiring the value of the first register and the value of the second register corresponding to the maximum value of the signal-to-noise ratio so as to adjust the time starting point and the pulse width of the input loop control signal of the charge pump or the output loop control signal of the charge pump relative to the touch scanning signal.
10. A storage medium, characterized in that the storage medium includes a stored program, and when the program runs, the device where the storage medium is located is controlled to execute the touch detection method according to any one of claims 1 to 4.
11. A processor, configured to execute a program, wherein the program executes the touch detection method according to any one of claims 1 to 4.
12. A terminal, comprising: a processor, a memory, a display device, and one or more programs, wherein the one or more programs are stored in the memory, the one or more programs being configured to perform the touch detection method of any of claims 1-4.
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| CN105161067A (en) * | 2015-10-14 | 2015-12-16 | 深圳市华星光电技术有限公司 | GOA circuit, display panel and display device |
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| CN106933369A (en) * | 2017-03-30 | 2017-07-07 | 北京集创北方科技股份有限公司 | One kind touches display control unit and touches display control method |
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| WO2012039837A1 (en) * | 2010-09-22 | 2012-03-29 | Cypress Semiconductor Corporation | Capacitive stylus for a touch screen |
| TWI456470B (en) * | 2012-03-07 | 2014-10-11 | Himax Tech Ltd | Touch cell applied to capacitive touch panel and associated capacitive touch panel |
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| CN105161067A (en) * | 2015-10-14 | 2015-12-16 | 深圳市华星光电技术有限公司 | GOA circuit, display panel and display device |
| CN106847220A (en) * | 2017-03-15 | 2017-06-13 | 厦门天马微电子有限公司 | Shift register, touch-control display panel and its driving method, touch control display apparatus |
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