CN107423185B - Method and device for testing compatibility adaptation of disk array and host - Google Patents

Method and device for testing compatibility adaptation of disk array and host Download PDF

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CN107423185B
CN107423185B CN201710660541.0A CN201710660541A CN107423185B CN 107423185 B CN107423185 B CN 107423185B CN 201710660541 A CN201710660541 A CN 201710660541A CN 107423185 B CN107423185 B CN 107423185B
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test
link
host
read
equipment
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CN107423185A (en
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高宁
王文庆
杜彦魁
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Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/263Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers

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Abstract

The invention discloses a testing method for compatible adaptation of a disk array and a host, which maps LUNs divided by tested equipment to a host end through multiple paths, the host establishes a file system on the LUNs after adding and identifying the LUNs of the tested equipment, performs basic read-write testing on the file system, and achieves the purpose of testing the stability of the host by continuously reading and writing the tested equipment after performing a series of basic tests on the tested equipment.

Description

Method and device for testing compatibility adaptation of disk array and host
Technical Field
The invention relates to the field of host equipment, in particular to a method and a device for testing compatibility adaptation of a disk array and a host.
Background
The Langchao Tiansuo K1 system is the result of the 'high-end fault-tolerant computer development and application promotion' project which is a great special item in 863 plans in China. The first key application host in China, the Langchao K1 system, marks that China becomes the third country in the world after American day to master the new generation of host technology, and is expected to change the embarrassing situation that large hosts rely on import for a long time in the core fields of finance, telecommunication and the like.
Because the host needs to be matched with the disk arrays serving as the storage devices to complete various functions, and the compatibility adaptation between the host and the disk arrays of different brands and models is different, before the host is used, tests in some aspects are generally performed on the disk arrays of different brands and signals to determine whether the compatibility adaptation between the host and the storage devices is good or not.
However, the main problems of the disk arrays of various models are different, and the possibility of other problems cannot be eliminated only by testing the main problems, so that the test is not comprehensive and universal, the test result is not accurate, and a plurality of problems caused by poor compatibility are generated in the later use process.
Disclosure of Invention
The invention aims to provide a testing method for compatible adaptation of a disk array and a host, which solves the problems that the disk array test aiming at brands and models is not comprehensive and has no universality, carries out comprehensive evaluation on a bottom hardware system consisting of the host and the disk array, and ensures the stability and the performance of later online application.
In order to solve the above technical problem, the present invention provides a method for testing compatibility between a disk array and a host, comprising:
the method comprises the steps that a plurality of LUNs are scanned and identified through ports of an HBA card, wherein the LUNs are storage spaces created in tested equipment, the tested equipment is mapped to a host side through multiple paths, and the tested equipment is a disk array;
creating a file system for the LUN, and mounting the file system to a directory;
performing read-write test on the mounted directory, and checking an operating system log and a storage log;
judging whether the operating system log and the storage log have abnormal error reporting, if not, adopting an iozone tool to continuously read and write the mounting catalog until the duration time of the read and write operation reaches a first preset time;
and checking whether the operating system log and the iozone log have abnormal error reporting to obtain a test result.
Wherein, the checking whether the operating system log and the iozone log are abnormal or not, and the obtaining of the test result comprises:
if the operating system log and the iozone log do not have abnormal error reporting, creating LVM equipment for the LUN;
if the LVM equipment is successfully created, performing read-write operation on the LVM equipment by adopting a Fio tool, wherein the Fio tool is an IO pressure test tool;
selecting one link from a plurality of links between the host side and the tested equipment to enable the link to be in a dropped link state, and keeping the dropped link state within a second preset time;
checking whether the time from interruption to flow recovery of IO between the host side and the tested equipment exceeds first preset recovery time or not through iostat, if not, the chain dropping state test is passed, and the link in the chain dropping state is recovered and connected;
and judging whether the IO flow of the link which is recovered and connected within second preset recovery time is recovered to be normal or not, and if so, passing the link recovery test.
Wherein, after the link recovery test passes, the method further comprises:
and repeatedly executing the operation of selecting one of the plurality of links between the host side and the tested device to enable the link to be in a chain-dropping state until each link between the host side and the tested device executes the chain-dropping state test and the link recovery test.
Wherein, each link between the host side and the device under test performs a test for completing a dropped link state and a link recovery test, including:
if the link drop state test and the link recovery test of each link pass, performing read-write operation on the LVM equipment by adopting the Fio tool;
controlling one of two controllers in the tested equipment to be in a failure state, judging whether the time from interruption to recovery of IO between the host end and the tested equipment exceeds a third preset time, and if not, recovering the controller to be in a normal state;
and controlling the other controller of the two controllers in the tested equipment to be in a failure state, and judging whether the time from interruption to recovery of IO between the host terminal and the tested equipment exceeds a third preset time or not to obtain a controller failure test result.
Wherein, after the plurality of LUNs are identified by the HBA card port scan, the method further comprises:
creating the LUN into a bare device, and performing read-write operation on the bare device by adopting the Fio tool;
recording read-write bandwidth, judging whether the read-write bandwidth reaches preset bandwidth, if so, executing the creation of a file system on the LUN, and mounting the file system to a directory.
The invention also provides a testing device for compatible adaptation of the disk array and the host, which comprises:
the system comprises a scanning module, a host computer and a storage module, wherein the scanning module is used for scanning and identifying a plurality of LUNs through ports of an HBA card, the LUNs are storage spaces created in tested equipment, the tested equipment is mapped to the host computer through multiple paths, and the tested equipment is a disk array;
the creating module is used for creating a file system for the LUN and mounting the file system to a directory;
the test module is used for performing read-write test on the mounted directory and checking an operating system log and a storage log; judging whether the operating system log and the storage log have abnormal error reporting, if not, adopting an iozone tool to continuously read and write the mounting catalog until the duration time of the read and write operation reaches a first preset time; and checking whether the operating system log and the iozone log have abnormal error reporting to obtain a test result.
Wherein the test module comprises:
the first testing unit is used for creating LVM equipment for the LUN if the operating system log and the iozone log do not have abnormal error reporting; if the LVM equipment is successfully created, performing read-write operation on the LVM equipment by adopting a Fio tool, wherein the Fio tool is an IO pressure test tool;
the second testing unit is used for selecting one link from a plurality of links between the host end and the tested equipment, enabling the link to be in a chain-dropping state and keeping the chain-dropping state within a second preset time; checking whether the time from interruption to flow recovery of IO between the host side and the tested equipment exceeds first preset recovery time or not through iostat, if not, the chain dropping state test is passed, and the link in the chain dropping state is recovered and connected; and judging whether the IO flow of the link which is recovered and connected within second preset recovery time is recovered to be normal or not, and if so, passing the link recovery test.
Wherein the second test unit is further configured to:
and after the link recovery test is passed, repeatedly executing the operation of selecting one of the plurality of links between the host side and the tested device, and disconnecting the link to enable the link to be in a dropped link state until each link between the host side and the tested device executes the dropped link state test and the link recovery test.
Wherein the test module comprises:
the third testing unit is used for performing read-write operation on the LVM equipment by adopting the Fio tool if the link drop state test and the link recovery test of each link pass; controlling one of two controllers in the tested equipment to be in a failure state, judging whether the time from interruption to recovery of IO between the host end and the tested equipment exceeds a third preset time, and if not, recovering the controller to be in a normal state; and controlling the other controller of the two controllers in the tested equipment to be in a failure state, and judging whether the time from interruption to recovery of IO between the host terminal and the tested equipment exceeds a third preset time or not to obtain a controller failure test result.
Wherein the test module further comprises:
the fourth testing unit is used for creating the LUNs into bare equipment after the plurality of LUNs are scanned and identified through the HBA card port, and performing read-write operation on the bare equipment by adopting the Fio tool; recording read-write bandwidth, judging whether the read-write bandwidth reaches preset bandwidth, if so, executing the creation of a file system on the LUN, and mounting the file system to a directory.
The invention provides a test method for compatible adaptation of a disk array and a host, which is characterized in that an HBA port scans and identifies an LUN divided by a tested device, if the identification is successful, the tested device can be added to the host and identified, a file system is established on the identified LUN, and the read-write operation of the file system is tested, if no abnormal error is reported, the basic read-write function can be completed between the tested device and the host, the basic compatible adaptation performance is met, and then the long-time continuous read-write test is carried out on the LUN, which is a test on the stability of the host, if the test result is not abnormal, the whole system matched with the tested device and the host can keep relatively stable performance in the long-time read-write operation, so that the tested device and the host can be judged to have relatively good compatible adaptation performance, the testing method provided by the invention is characterized in that after the basic multi-path addition and identification test are carried out on the host end, the basic read-write function of the tested equipment is tested by the host end, and on the basis of determining that the basic read-write function can be completed, the long-time continuous read-write of the tested equipment by the host end is carried out.
Compared with the prior art, the test of a certain aspect is only considered for the type of the disk array, for example, only the addition and identification of the disk array are considered, the identification, reading and writing and the like can be considered, the test is inaccurate, the test method has no limitation on the brand and the type of the disk array, can be suitable for any disk array connected with a host terminal, has universality, carries out comprehensive basic evaluation on a bottom hardware system formed by knowledge and the disk array, and ensures that an application system has better stability and performance.
Preferably, the invention also tests the chain dropping state of the link between the host and the disk array, further ensures that one link is interrupted and other links can recover the read-write function in time during the read-write process, ensures the coping ability of the bottom hardware environment of the application system to the mutation environment, and further improves the comprehensiveness of the test and the usability of the equipment.
The invention also provides a testing device for the compatibility and the adaptation of the disk array and the host, and the testing device has the beneficial effects.
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In order to more clearly illustrate the embodiments or technical solutions of the present invention, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other drawings can be obtained based on these drawings without creative efforts.
FIG. 1 is a flow chart of one embodiment of a test for compatibility adaptation of a disk array and a host provided by the present invention;
FIG. 2 is a flow diagram illustrating one embodiment of a link test provided by the present invention;
FIG. 3 is a flow chart of one embodiment of a controller failure test provided by the present invention;
FIG. 4 is a flow diagram of one embodiment of a bandwidth test provided by the present invention;
FIG. 5 is a flow chart of another embodiment of testing compatibility adaptation between a disk array and a host provided by the present invention;
fig. 6 is a block diagram of a testing apparatus for compatibility between a disk array and a host according to an embodiment of the present invention.
Detailed Description
In order that those skilled in the art will better understand the disclosure, the invention will be described in further detail with reference to the accompanying drawings and specific embodiments. It is to be understood that the described embodiments are merely exemplary of the invention, and not restrictive of the full scope of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1, the method may include:
step S101: multiple LUNs are identified by HBA card port scanning.
Specifically, the LUN is a storage space created in the device under test, the device under test maps the LUN to the host side through multiple paths, and the device under test is a disk array.
It should be noted that, only one path may be mapped to the host side or multiple LUNs may be mapped to the host side, and the operation of the subsequent step is not affected for whether the LUN is mapped in multiple paths, but the multiple LUNs are mapped in multiple paths, which is also a test for the multiple path function of the device. Of course, this is not an essential feature of the present invention, because in the subsequent steps, data needs to be transmitted through multiple paths, if there is a problem in the multiple path function, the data can also be tested, but the performance of the multiple path function can be determined more quickly by testing the multiple path function through mapping LUNs, and the test efficiency is improved, so this is a preferred embodiment.
Step S102: and creating a file system for the LUN, and mounting the file system to a directory.
In particular, the file systems may be EXT3, EXT4, and other forms of file systems.
Step S103: and performing read-write test on the mounted directory, and checking an operating system log and a storage log.
And mounting the file system created by the LUN under the directory, and reading and writing the directory, namely reading and writing the file system mounted under the directory, namely reading and writing the LUN mapped to the host by the disk array.
Step S104: and judging whether the operating system log and the storage log have abnormal error reporting, if so, failing to pass the test, ending the test, and if not, entering the step S105.
If a fault occurs in the read-write process, related abnormal error reports can be found in the operating system log and the storage log, and therefore a test result is obtained.
Step S105: and continuously reading and writing the mounted directory by adopting an iozone tool until the duration time of the reading and writing operation reaches a first preset time.
Specifically, the first preset time is generally set to be about 3 days, or may be any time between 2 days and 4 days, and is mainly used for performing a long-time read-write test on the device under test, and if the test passes the description, under the long-time high-intensity read-write test, both the host and the device under test can maintain good stability.
It should be noted that step S103 is a test of a basic read/write function, step S105 is a long-time continuous read/write test, and if step S103 is not performed, the step S105 can be performed directly, but if step S103 is not performed, the test time of step S105 is long, and if step S103 is not performed, the test of step S105 is not required, and the test time of step S103 is negligible with respect to step S105, so that performing the test of step S103 first is a preferred embodiment of the present invention, which can improve the test efficiency, but is not an essential technical feature of the present invention.
Step S106: and checking whether the operating system log and the iozone log have abnormal error reporting to obtain a test result.
The invention firstly carries out LUN addition, identification and multi-path function test on the host end and the tested equipment, can determine the normal connection between the host end and the tested equipment, and can test the basic read-write function between the host end and the tested equipment by carrying out read-write test on the mounted catalogue, and then further test the continuous read-write function so as to determine the stability of the equipment. The test of all aspects of the host end and the tested equipment is completed, and the model of the disk array is not limited in the whole test process, so the test method has universality and ensures higher stability in the application of the host and the disk array which pass the test.
In addition, the method is mainly applied to the test of compatibility and adaptation of the sky shuttle K1 host and various disk arrays of different models, and other subsequent embodiments are also mainly applied to the same application scene.
Based on the above embodiments, in consideration of the fact that there are multiple paths between the host side and the device under test, during the reading and writing process, some links may be selected to transmit data, or all links may transmit data at the same time, and when a link in which data is being transmitted is suddenly disconnected, the transition of the data transmission state is also one of the important performances that need to be considered for compatible adaptation between the host side and the disk array. In the above embodiment, when there is an abnormal error report in the os log and the iozone log, the test may be considered as failed, and if there is no abnormal error report, the present invention may be further improved.
Therefore, in an embodiment of the present invention, on the basis that there is no abnormal error report in the operating system log and the iozone log, as shown in fig. 2, fig. 2 is a flowchart of an embodiment of a link test provided by the present invention, where the method may include:
step S201: and creating an LVM device for the LUN.
Step S202: and if the LVM equipment is successfully created, performing read-write operation on the LVM equipment by adopting a Fio tool.
It should be noted that, it is not necessary to create the LVM device for performing the read-write test on the disk array by using the Fio tool, and the LVM device is created in the present invention to successfully test whether the LVM can be created by the device to be tested, and if the compatible adaptation performance between the host side and the disk array is not good, the disk array may explode when the LVM is created, so that the creation of the LVM device is also a test for the performance of the device to be tested. In addition, the created device is not necessarily an LVM device, but may be a PV, VG, or the like.
Step S203: and selecting one of the links between the host end and the tested equipment to enable the link to be in a chain dropping state, and keeping the chain dropping state within a second preset time.
It should be noted that, when the read-write operation is normally performed between the host end and the disk array, one or more or all of the links between the host end and the disk array may be set to transmit data simultaneously, but once a link that is transmitting data is suddenly disconnected and is in a link-down state in the read-write process, the system may automatically convert the data originally transmitted by the suddenly disconnected link into other links that are not disconnected for transmission, and the speed of the conversion process is also one of the important performances of compatible adaptation between the host and the disk array.
Specifically, in step S203, it is default that each link between the host and the disk array is transmitting data together, and when testing the links, one of the links may be selected for testing, which is not the only solution of the present invention, or one or more links may be set to transmit read-write data, as long as the link that is transmitting read-write data is disconnected during testing.
In addition, the implementation that makes a certain link in a link drop state is simple and easy to be performed by manually pulling out the link, but the link can be in a link drop state by adopting other manners, which are not listed here.
Step S204: and checking whether the time from interruption to flow recovery of the IO between the host side and the device to be tested exceeds a first preset recovery time or not through iostat, if so, stopping the test, and if not, passing the test of the chain dropping state, and entering the step S205.
It should be noted that, when performing a test in a drop link state, the basis of the judgment test is that the longer the time taken for IO between the host and the disk array to recover the total flow from interruption is, the worse the performance of compatible adaptation is, and conversely, the shorter the time taken is, the better the performance is.
Step S205: and restoring the connection of the link in the link-down state.
Step S206: and judging whether the IO flow of the link which is recovered and connected within the second preset recovery time is recovered to be normal or not.
It should be noted that, when the link is in the link drop state to the link recovery state, the data transmission between the original host side and the disk array is automatically converted into the originally set link transmission data, and the IO traffic of the link to be recovered after disconnection is interrupted to recover the original traffic value, which is also one of the performance standards for judging compatibility and adaptation.
In order to further determine whether the performance of compatible adaptation of the host side and the device under test side is good, it is necessary to perform a link drop test and a link recovery test on each link, so in the above embodiment, if the link recovery test does not pass, the test is stopped, and if the link recovery test passes, the method may further include:
step S207: and judging whether each link executes the completion of the chain drop state test and the link recovery test, if so, entering the step S208, and if not, entering the step 204.
Step S208: and the link between the host side and the tested device side passes the test.
It should be noted that, for the link test, it is not necessary to perform disconnection and recovery tests on each link, or it may be that one link selected by each of the host end and the device under test is selected to perform disconnection and recovery tests on the links, if the tests are passed, it may also be considered that multiple links between the host end and the device under test have good functions, but a more comprehensive and preferable test method is to perform testing on each link, so this is only one specific implementation manner for testing the link states of the host end and the device under test, and is not the only implementation manner of the present invention.
Based on the above embodiments, considering that the disk array as the device under test is a dual controller device, if one of the controllers suddenly fails, the other controller is required to perform the related operations, and the fast switching controller performs the related operations, which is also one of the important performances of the compatible adaptation between the host side and the disk array. Therefore, the method can also comprise the test of the failure of the controller of the disk array on the basis of passing the link test.
As shown in fig. 3, a flowchart of a specific embodiment of a controller failure test provided by the present invention may include:
step S301: reading and writing the LVM equipment by adopting the Fio tool;
specifically, the read-write test on the LVM device may be not a Fio tool, but may also be a dd tool or other devices capable of performing the read-write test on the device under test.
Step S302: controlling one of two controllers in the device under test to be in a failure state;
step S303: judging whether the time from interruption to recovery of IO between the host terminal and the tested device exceeds a third preset time, if so, failing to pass the test, ending the test, and if not, entering step S304;
the specific third preset time is generally about 15 minutes, and of course, other time lengths are also possible, and may be set according to the needs of the device in a specific application scenario.
Step S304: restoring the controller to be in a normal state;
step S305: controlling the other of the two controllers in the device under test to be in a failure state;
step S306: and judging whether the time from interruption to recovery of the IO between the host terminal and the tested equipment exceeds a third preset time, if so, not passing the test, and finishing the test, otherwise, passing the test, and finishing the test.
Based on the above embodiment, in order to ensure the read-write function between the host side and the device under test, after the host side detects the LUN mapped by the device under test, before creating the LVM device for the LUN, the bandwidth of the device under test may be tested first.
The flowchart of a specific embodiment of the bandwidth test provided by the present invention, as shown in fig. 4, may include:
step S401: and creating the LUN into a bare device.
Step S402: and performing read-write operation on the bare equipment by adopting the Fio tool.
Specifically, other read/write tools may be used for testing, and the bare device refers to a LUN for creating other devices.
Step S403: and recording the read-write bandwidth.
Step S404: and judging whether the read-write bandwidth reaches a preset bandwidth, if so, not passing the test, ending the test, and if not, passing the bandwidth test.
It should be noted that the bandwidth test is a test of the speed of reading and writing data between the host side and the device under test, and if the above test is not performed, the performance of reading and writing data can be embodied in other reading and writing tests, but the test is performed in a state of ensuring good reading and writing speed, so that the passing rate of subsequent tests can be improved, and the test efficiency can be improved.
Based on the above embodiment, some of the tests may be selected according to the actual application of the host side and the adapted disk array in the present invention, but a preferred scheme is to perform all the tests once, and if all the tests are all able to pass, it is more comprehensively and accurately determined that the compatible adaptation between the host side and the device under test has good performance, and a flow chart of another specific embodiment of the test for compatible adaptation of the disk array and the host provided by the present invention is shown in fig. 5, and the method includes:
step S501: multiple LUNs are identified by HBA card port scanning.
Step S502: and creating the LUN into a bare device, and performing read-write operation on the bare device by adopting the Fio tool.
Step S503: recording the read-write bandwidth, judging whether the read-write bandwidth reaches the preset bandwidth, if so, failing to pass the test, ending the test, and if not, entering the step S504.
Step S504: and creating a file system for the LUN, and mounting the file system to a directory for read-write test.
Step S505: and judging whether the operating system log and the storage log have abnormal error reports or not, if so, failing to pass the test, ending the test, and if not, entering the step S506.
Step S506: and continuously reading and writing the directory by adopting an iozone tool until the duration time of the reading and writing operation reaches a first preset time.
Step S507: and judging whether the operating system log and the iozone log have abnormal error reporting, if so, failing to pass the test, ending the test, and if not, entering the step S508.
Step S508: creating the LVM device, performing link test on a link between the host terminal and the tested device terminal, judging whether the test passes, if not, finishing the test, and if so, entering step S509.
Step S509: performing controller failure on a double controller of the tested equipment;
step S510: and judging whether the test is passed or not, if so, passing the test, and if not, failing to pass the test and ending the test.
It should be noted that, the test order of the continuous read-write test, the link test and the controller failure test between the host device and the disk array is not necessarily sequential.
The following describes a testing apparatus for compatibility and adaptation of a disk array and a host according to an embodiment of the present invention, and the testing apparatus for compatibility and adaptation of a disk array and a host described below and the testing method for compatibility and adaptation of a disk array and a host described above may be referred to correspondingly.
Fig. 6 is a block diagram of a structure of a testing apparatus for compatible adaptation of a disk array and a host according to an embodiment of the present invention, where the testing apparatus for compatible adaptation of a disk array and a host according to fig. 6 may include:
the scanning module 100 is configured to scan and identify a plurality of LUNs through HBA card ports, where the LUNs are storage spaces created in a device under test, the device under test maps the LUNs to a host side through multiple paths, and the device under test is a disk array;
a creating module 200, configured to create a file system for the LUN, and mount the file system to a directory;
the test module 300 is used for performing read-write test on the mounted directory and checking an operating system log and a storage log; judging whether the operating system log and the storage log have abnormal error reporting, if not, adopting an iozone tool to continuously read and write the mounting catalog until the duration time of the read and write operation reaches a first preset time; and checking whether the operating system log and the iozone log have abnormal error reporting to obtain a test result.
Preferably, the test module 300 includes:
the first testing unit is used for creating LVM equipment for the LUN if the operating system log and the iozone log do not have abnormal error reporting; if the LVM equipment is successfully created, performing read-write operation on the LVM equipment by adopting a Fio tool, wherein the Fio tool is an IO pressure test tool;
the second testing unit is used for selecting one link from a plurality of links between the host end and the tested equipment, enabling the link to be in a chain-dropping state and keeping the chain-dropping state within a second preset time; checking whether the time from interruption to flow recovery of IO between the host side and the tested equipment exceeds first preset recovery time or not through iostat, if not, the chain dropping state test is passed, and the link in the chain dropping state is recovered and connected; and judging whether the IO flow of the link which is recovered and connected within second preset recovery time is recovered to be normal or not, and if so, passing the link recovery test.
Preferably, the second test unit is further configured to:
and after the link recovery test is passed, repeatedly executing the operation of selecting one of the plurality of links between the host side and the tested device, and disconnecting the link to enable the link to be in a dropped link state until each link between the host side and the tested device executes the dropped link state test and the link recovery test.
The test module 300 includes:
the third testing unit is used for performing read-write operation on the LVM equipment by adopting the Fio tool if the link drop state test and the link recovery test of each link pass; controlling one of two controllers in the tested equipment to be in a failure state, judging whether the time from interruption to recovery of IO between the host end and the tested equipment exceeds a third preset time, and if not, recovering the controller to be in a normal state; and controlling the other controller of the two controllers in the tested equipment to be in a failure state, and judging whether the time from interruption to recovery of IO between the host terminal and the tested equipment exceeds a third preset time or not to obtain a controller failure test result.
As a specific embodiment, the testing apparatus for compatible adaptation of a disk array and a host provided by the present invention may further include:
the test module 300 further comprises:
the fourth testing unit is used for creating the LUNs into bare equipment after the plurality of LUNs are scanned and identified through the HBA card port, and performing read-write operation on the bare equipment by adopting the Fio tool; recording read-write bandwidth, judging whether the read-write bandwidth reaches preset bandwidth, if so, executing the creation of a file system on the LUN, and mounting the file system to a directory.
The test apparatus for compatible adaptation of a disk array and a host of this embodiment is used to implement the test method for compatible adaptation of a disk array and a host, and therefore, specific embodiments in the test apparatus for compatible adaptation of a disk array and a host may be found in the foregoing embodiments of the test method for compatible adaptation of a disk array and a host, for example, the scan module 100 is used to implement step S101 in the test method for compatible adaptation of a disk array and a host, the creation module 200 is used to implement step S102 in the test method, and the test module 300 is used to implement steps S103, S104, S105, and S106 in the test method for compatible adaptation of a disk array and a host, respectively.
The embodiments are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same or similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
The method and the device for testing the compatibility and the adaptation of the disk array and the host provided by the invention are described in detail above. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.

Claims (8)

1. A method for testing compatibility adaptation of a disk array and a host is characterized by comprising the following steps:
the method comprises the steps that a plurality of LUNs are scanned and identified through ports of an HBA card, wherein the LUNs are storage spaces created in tested equipment, the tested equipment is mapped to a host side through multiple paths, and the tested equipment is a disk array;
creating a file system for the LUN, and mounting the file system to a directory;
performing read-write test on the mounted directory, and checking an operating system log and a storage log;
judging whether the operating system log and the storage log have abnormal error reporting, if not, adopting an iozone tool to continuously read and write the mounting catalog until the duration time of the read and write operation reaches a first preset time; the abnormal error report is generated when a fault occurs in the read-write process of the read-write test;
checking whether the operating system log and the iozone log have abnormal error reporting or not to obtain a test result;
the checking whether the operating system log and the iozone log are abnormal or not, and the obtaining of the test result comprises:
if the operating system log and the iozone log do not have abnormal error reporting, creating LVM equipment for the LUN;
if the LVM equipment is successfully created, performing read-write operation on the LVM equipment by adopting a Fio tool, wherein the Fio tool is an IO pressure test tool;
selecting one link from a plurality of links between the host side and the tested equipment to enable the link to be in a dropped link state, and keeping the dropped link state within a second preset time;
checking whether the time from interruption to flow recovery of IO between the host side and the tested equipment exceeds first preset recovery time or not through iostat, if not, the chain dropping state test is passed, and the link in the chain dropping state is recovered and connected;
and judging whether the IO flow of the link which is recovered and connected within second preset recovery time is recovered to be normal or not, and if so, passing the link recovery test.
2. The method of claim 1, further comprising, after the link recovery test passes:
and repeatedly executing the operation of selecting one of the plurality of links between the host side and the tested device to enable the link to be in a chain-dropping state until each link between the host side and the tested device executes the chain-dropping state test and the link recovery test.
3. The method according to claim 2, wherein the step of performing the link drop status test and the link recovery test on each link between the host side and the device under test comprises:
if the link drop state test and the link recovery test of each link pass, performing read-write operation on the LVM equipment by adopting the Fio tool;
controlling one of two controllers in the tested equipment to be in a failure state, judging whether the time from interruption to recovery of IO between the host end and the tested equipment exceeds a third preset time, and if not, recovering the controller to be in a normal state;
and controlling the other controller of the two controllers in the tested equipment to be in a failure state, and judging whether the time from interruption to recovery of IO between the host terminal and the tested equipment exceeds a third preset time or not to obtain a controller failure test result.
4. The method according to claim 3, further comprising, after identifying the plurality of LUNs through the HBA card port scan:
creating the LUN into a bare device, and performing read-write operation on the bare device by adopting the Fio tool;
recording read-write bandwidth, judging whether the read-write bandwidth reaches preset bandwidth, if so, executing the creation of a file system on the LUN, and mounting the file system to a directory.
5. A testing device for compatible adaptation of a disk array and a host computer is characterized by comprising:
the system comprises a scanning module, a host computer and a storage module, wherein the scanning module is used for scanning and identifying a plurality of LUNs through ports of an HBA card, the LUNs are storage spaces created in tested equipment, the tested equipment is mapped to the host computer through multiple paths, and the tested equipment is a disk array;
the creating module is used for creating a file system for the LUN and mounting the file system to a directory;
the test module is used for performing read-write test on the mounted directory and checking an operating system log and a storage log; judging whether the operating system log and the storage log have abnormal error reporting, if not, adopting an iozone tool to continuously read and write the mounting catalog until the duration time of the read and write operation reaches a first preset time; the abnormal error report is generated when a fault occurs in the read-write process of the read-write test; checking whether the operating system log and the iozone log have abnormal error reporting or not to obtain a test result;
the test module includes:
the first testing unit is used for creating LVM equipment for the LUN if the operating system log and the iozone log do not have abnormal error reporting; if the LVM equipment is successfully created, performing read-write operation on the LVM equipment by adopting a Fio tool, wherein the Fio tool is an IO pressure test tool;
the second testing unit is used for selecting one link from a plurality of links between the host end and the tested equipment, enabling the link to be in a chain-dropping state and keeping the chain-dropping state within a second preset time; checking whether the time from interruption to flow recovery of IO between the host side and the tested equipment exceeds first preset recovery time or not through iostat, if not, the chain dropping state test is passed, and the link in the chain dropping state is recovered and connected; and judging whether the IO flow of the link which is recovered and connected within second preset recovery time is recovered to be normal or not, and if so, passing the link recovery test.
6. The testing device of claim 5, wherein the second testing unit is further configured to:
and after the link recovery test is passed, repeatedly executing the operation of selecting one of the plurality of links between the host side and the tested device, and disconnecting the link to enable the link to be in a dropped link state until each link between the host side and the tested device executes the dropped link state test and the link recovery test.
7. The testing device of claim 6, wherein the testing module further comprises:
the third testing unit is used for performing read-write operation on the LVM equipment by adopting the Fio tool if the link drop state test and the link recovery test of each link pass; controlling one of two controllers in the tested equipment to be in a failure state, judging whether the time from interruption to recovery of IO between the host end and the tested equipment exceeds a third preset time, and if not, recovering the controller to be in a normal state; and controlling the other controller of the two controllers in the tested equipment to be in a failure state, and judging whether the time from interruption to recovery of IO between the host terminal and the tested equipment exceeds a third preset time or not to obtain a controller failure test result.
8. The testing device of claim 7, wherein the testing module further comprises:
the fourth testing unit is used for creating the LUNs into bare equipment after the plurality of LUNs are scanned and identified through the HBA card port, and performing read-write operation on the bare equipment by adopting the Fio tool; recording read-write bandwidth, judging whether the read-write bandwidth reaches preset bandwidth, if so, executing the creation of a file system on the LUN, and mounting the file system to a directory.
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CN108364670B (en) * 2018-02-06 2020-12-08 珠海全志科技股份有限公司 Read-write pressure testing method, device, equipment and storage medium
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