CN107390039B - A kind of method of quick test Antenna Array Pattern - Google Patents
A kind of method of quick test Antenna Array Pattern Download PDFInfo
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- CN107390039B CN107390039B CN201710724942.8A CN201710724942A CN107390039B CN 107390039 B CN107390039 B CN 107390039B CN 201710724942 A CN201710724942 A CN 201710724942A CN 107390039 B CN107390039 B CN 107390039B
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- 238000000034 method Methods 0.000 title claims abstract description 22
- 238000012360 testing method Methods 0.000 title claims abstract description 22
- 238000010586 diagram Methods 0.000 claims description 6
- 238000005259 measurement Methods 0.000 abstract description 3
- 238000013461 design Methods 0.000 description 2
- 230000005855 radiation Effects 0.000 description 2
- 238000012937 correction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/10—Radiation diagrams of antennas
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- Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Variable-Direction Aerials And Aerial Arrays (AREA)
Abstract
The invention discloses a kind of methods of quickly test Antenna Array Pattern, signal source, reference receiver and antenna array to be tested are laid out in microwave dark room first, by being numbered to antenna array to be tested and determining the relationship between antenna and angle, region division is carried out to microwave dark room again, signal is sent to tested antenna by signal source by region, then tested antenna received signal is received by reference receiver, Antenna Array Pattern is drawn by fitting.The present invention can quickly and easily realize the measurement to Antenna Array Pattern, improve work efficiency；It is versatile at the same time it can also be suitable for the measurement of different type antenna array pattern by arranging in pairs or groups different signal sources.
Description
Technical field
The present invention relates to Beidou antenna technical field, especially a kind of method for testing Antenna Array Pattern.
Background technique
Antenna radiation pattern is the important figure for measuring antenna performance, and the items of antenna can be observed from antenna radiation pattern
Parameter.The main purpose of Antenna Array Pattern test is to examine whether the performance indicator of antenna meets design requirement, with realization pair
The adjustment of antenna array critical component and size.By test, effective fault diagnosis can be carried out, it may be verified that antenna array design thinking
Correctness, and provide necessary theoretical correction for development of new antenna.
Currently, mainly using turntable mensuration to the method for Antenna Array Pattern test.By antenna array to be tested before test
It is erected on turntable, and frequency spectrograph and antenna array interface is linked together by cable；After opening turntable, antenna array can turn
Pitch rotation is done under the control of platform, the signal received in antenna rotation process is transmitted to frequency spectrograph by cable, and frequency spectrograph is again
The signal received is analyzed, Antenna Array Pattern is finally re-formed.In entire test process, it can only be turned by turntable
The power of the dynamic a certain angle for testing aerial array one by one, test period is long, and software control process is cumbersome.
Summary of the invention
The technical problem to be solved by the invention is to provide the methods that one kind can quickly test Antenna Array Pattern, to mention
High working efficiency.
In order to solve the above technical problems, the technical solution used in the present invention is as follows.
A kind of method of quick test Antenna Array Pattern, specifically includes the following steps:
S1. initialization process is carried out to the M antenna array layout of microwave dark room internal discrete；
S2. according to test beam angle requirement, the discrete antenna array of microwave dark room interior layout is divided into N number of region,
The space angle range of each region overlay is Φ j；
S3. the carrier-to-noise ratio signal that the corresponding signal source output frequency in some region is f is controlled, until reference receiver receives
Until signal, the carrier-to-noise ratio and power of the antenna number that the region includes and output are stored；
S4. reference receiver receives signal by tested antenna array, stores the carrier-to-noise ratio information received；
S5. step S3 to S4 is repeated, until all areas are all measured, storage all receives data；
S6. the data of storage are handled, the received carrier-to-noise ratio information in each region of step by step calculation and output carrier-to-noise ratio
The difference of signal obtains tested gain of the antenna within the scope of the corresponding space angle of particular beam width, passes through total data
The directional diagram of tested antenna array f frequency point is drawn in fitting；
S7. step S3-S6 is repeated, until the directional diagram of all frequency points is completed.
A kind of method of above-mentioned quickly test Antenna Array Pattern, the content of initialization process described in step S1 includes day
Line number, the relationship of aerial angle θ i and antenna number and aerial angle.
Due to using above technical scheme, the invention technological progress is as follows.
The present invention is used to carry out rapid survey for Antenna Array Pattern, and the turning table control stream in original scheme is omitted
Journey, it is only necessary to weave antenna number and aerial angle relationship in advance, according to the width of test wave beam, subregion survey is carried out to darkroom
Examination reduces test data and processing time, can quickly and easily realize the measurement to Antenna Array Pattern, improve work
Efficiency；Meanwhile the present invention can also be by arranging in pairs or groups different signal sources to be suitable for the survey of different type antenna array pattern
Amount, it is versatile.
Detailed description of the invention
Fig. 1 is flow chart of the invention.
Specific embodiment
Below in conjunction with the drawings and specific embodiments, the present invention will be described in further detail.
A kind of method of quick test Antenna Array Pattern, first by signal source, reference receiver and day to be tested
Linear array is laid out in microwave dark room, by the way that the relationship between antenna and angle is numbered and determined to antenna array to be tested,
Region division is carried out to microwave dark room again, signal is sent to tested antenna by signal source by region, is then received by standard
Machine receives tested antenna received signal, draws Antenna Array Pattern by fitting.Detailed process as shown in Figure 1, include in detail
Following steps.
S1. initialization process is carried out to the M antenna array layout of microwave dark room internal discrete；The content packet of initialization process
Include antenna number, i(i=1 aerial angle θ, 2 ... M) and antenna number and aerial angle relationship.
S2. according to test beam angle requirement, the discrete antenna array of microwave dark room interior layout is divided into N number of region,
The space angle range of each region overlay is j(j=1 Φ ... N).
S3. carrier-to-noise ratio signal (C/N) out that the corresponding signal source output frequency in some region is f is controlled, until standard connects
Until receipts machine receives signal, the carrier-to-noise ratio and power of the antenna number that the region includes and output are stored.
S4. reference receiver receives signal by tested antenna array, stores corresponding each tested antenna in the region and receives
Carrier-to-noise ratio information (C/N) in arrived.
S5. step S3 to S4 is repeated, until all areas are all measured, storage all receives data.
S6. the data of storage are handled, the received carrier-to-noise ratio information in each region of step by step calculation and output carrier-to-noise ratio
The difference of signal obtains tested gain of the antenna within the scope of the corresponding space angle of particular beam width, passes through total data
Fitting obtains main lobe peak value, maximum side petal, beam angle (angular width in from main peak value to the following section -3dB), zero
Parameters such as depth (differences of the main peak value of lobe to poor lobe zero point) are fallen into, the directional diagram of tested antenna array f frequency point is drawn.
S7. step S3-S6 is repeated, until the directional diagram of all frequency points is completed.
Claims (2)
1. a kind of method of quickly test Antenna Array Pattern, which is characterized in that specifically includes the following steps:
S1. initialization process is carried out to the M antenna array layout of microwave dark room internal discrete；
S2. according to test beam angle requirement, the discrete antenna array of microwave dark room interior layout is divided into N number of region, each
The space angle range of region overlay is Φ j；
S3. the carrier-to-noise ratio signal that the corresponding signal source output frequency in some region is f is controlled, until reference receiver receives letter
Until number, the carrier-to-noise ratio and power of the antenna number that the region includes and output are stored；
S4. reference receiver receives signal by tested antenna array, stores the carrier-to-noise ratio information received；
S5. step S3 to S4 is repeated, until all areas are all measured, storage all receives data；
S6. the data of storage are handled, the received carrier-to-noise ratio information in each region of step by step calculation and output carrier-to-noise ratio signal
Difference, obtain tested gain of the antenna within the scope of the corresponding space angle of particular beam width, be fitted by total data,
Draw the directional diagram of tested antenna array f frequency point；
S7. step S3-S6 is repeated, until the directional diagram of all frequency points is completed.
2. a kind of method of quickly test Antenna Array Pattern according to claim 1, which is characterized in that institute in step S1
The content for stating initialization process includes the relationship of antenna number, aerial angle θ i and antenna number and aerial angle.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201710724942.8A CN107390039B (en) | 2017-08-22 | 2017-08-22 | A kind of method of quick test Antenna Array Pattern |
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| CN201710724942.8A CN107390039B (en) | 2017-08-22 | 2017-08-22 | A kind of method of quick test Antenna Array Pattern |
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| CN107390039A CN107390039A (en) | 2017-11-24 |
| CN107390039B true CN107390039B (en) | 2019-11-15 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108963459B (en) | 2018-06-30 | 2021-05-18 | 华为技术有限公司 | Measuring method and device |
| CN111123250B (en) * | 2019-12-30 | 2021-09-28 | 成都汇蓉国科微***技术有限公司 | Pulse Doppler radar based on pattern search algorithm and beam forming method |
| CN112964941B (en) * | 2021-03-24 | 2021-12-21 | 中山大学 | Phased array antenna test method, device, equipment and medium |
| CN113435069B (en) * | 2021-08-27 | 2021-11-16 | 湖南卫导信息科技有限公司 | Antenna directional pattern simulation method, device and equipment for satellite navigation simulation |
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| CN105021902A (en) * | 2015-08-21 | 2015-11-04 | 中国电子科技集团公司第三十八研究所 | Outfield test system applied to far-field pattern of high-frequency antenna and test method |
| CN106872932A (en) * | 2017-01-24 | 2017-06-20 | 四川九洲电器集团有限责任公司 | A kind of system and method for carrying out phase alignment |
| RU2627958C1 (en) * | 2016-11-07 | 2017-08-14 | Акционерное общество "Научно-исследовательский институт Приборостроения имени В.В. Тихомирова" | Method for forming direction diagram by digital antenna array |
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2017
- 2017-08-22 CN CN201710724942.8A patent/CN107390039B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105021902A (en) * | 2015-08-21 | 2015-11-04 | 中国电子科技集团公司第三十八研究所 | Outfield test system applied to far-field pattern of high-frequency antenna and test method |
| RU2627958C1 (en) * | 2016-11-07 | 2017-08-14 | Акционерное общество "Научно-исследовательский институт Приборостроения имени В.В. Тихомирова" | Method for forming direction diagram by digital antenna array |
| CN106872932A (en) * | 2017-01-24 | 2017-06-20 | 四川九洲电器集团有限责任公司 | A kind of system and method for carrying out phase alignment |
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| 基于空域滤波的相控阵天线方向图仿真方法研究;董平;《中国优秀硕士学位论文全文数据库信息科技辑》;20090715;论文正文第7-9页、35-41页、57-58页 * |
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Denomination of invention: A method of fast testing antenna array pattern Effective date of registration: 20210528 Granted publication date: 20191115 Pledgee: Changsha bank Limited by Share Ltd. Xiangjiang New District sub branch Pledgor: HUNAN SNR INFORMATION TECHNOLOGY Co.,Ltd. Registration number: Y2021980004116 |
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Date of cancellation: 20231205 Granted publication date: 20191115 Pledgee: Changsha bank Limited by Share Ltd. Xiangjiang New District sub branch Pledgor: HUNAN SNR INFORMATION TECHNOLOGY CO.,LTD. Registration number: Y2021980004116 |