CN107389995A - Adjust series resonant inverter Q circuit and its method of testing - Google Patents

Adjust series resonant inverter Q circuit and its method of testing Download PDF

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Publication number
CN107389995A
CN107389995A CN201710694511.1A CN201710694511A CN107389995A CN 107389995 A CN107389995 A CN 107389995A CN 201710694511 A CN201710694511 A CN 201710694511A CN 107389995 A CN107389995 A CN 107389995A
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quality factor
points
capacitance
matching capacitor
booster
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CN107389995B (en
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陈玥名
张延鹏
刘国栋
李楠
魏俊红
张海鹰
王大勇
张天祥
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Huadian Electric Power Research Institute Co Ltd
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Huadian Electric Power Research Institute Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/28Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02BCLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO BUILDINGS, e.g. HOUSING, HOUSE APPLIANCES OR RELATED END-USER APPLICATIONS
    • Y02B70/00Technologies for an efficient end-user side electric power management and consumption
    • Y02B70/10Technologies improving the efficiency by using switched-mode power supplies [SMPS], i.e. efficient power electronics conversion e.g. power factor correction or reduction of losses in power supplies or efficient standby modes

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The present invention relates to one kind regulation series resonant inverter Q circuit and its method of testing, including experimental power supply, pressure regulator, booster, loop equivalent resistance, reactor, matching capacitor, it is tested loop equivalent capacity, it is tested voltage transformer and standard potential transformer, experimental power supply is connected with the input of pressure regulator, the output end of pressure regulator is connected with the low pressure, input end of booster, the high-voltage output end of booster is connected with loop equivalent resistance, loop equivalent resistance is connected with reactor, reactor is connected with matching capacitor, matching capacitor is connected with a low side of booster;Subject loop equivalent capacity is connected in parallel on the both ends of matching capacitor.The present invention adds etc. the line-of-sight course Approach by inchmeal resonance point at capacitance value interval using basic electric capacity, its quality factor is measured respectively, next capacitance is selected after judging 3 points of relations with series circuit resonance point according to three groups of data, the resonance point of Step wise approximation series circuit is untill quality factor are more than quality factor minimum value.

Description

Adjust series resonant inverter Q circuit and its method of testing
Technical field
The present invention relates to one kind regulation series resonant inverter Q circuit and its method of testing, and especially suitable is a kind of use In the regulation series resonant inverter Q circuit and its method of testing of voltage transformer on-site proving.
Background technology
Voltage transformer is the working measuring instrument of national requirements compulsory verification, and the on-site proving work of voltage transformer is Voltage value transmits the important step of work, is the important means for the voltage transformer accurate measurement for ensureing onsite application.Voltage The on-site proving experiment of transformer needs to measure voltage transformer in the case where equipment has a power failure under different voltage measurement points Error, it is therefore desirable to the experiment power supply equipment of adjustable voltage.Typically using series resonant inverter as voltage transformer scene Experiment power supply during calibrating.Series resonant inverter is big in the case where providing identical voltage compared with traditional testing transformer The big weight and volume for reducing equipment, at the same it is relatively low to the capacity requirement of field test power supply box.This feature to go here and there Connection resonant devices obtain a wide range of applications in power test.
Because the subject voltage transformer circuit capacitance value excursion of Different field is larger, therefore to Different field Need to match when voltage transformer is examined and determine certain value capacitor and reactor so that circuit reaches approximate resonance state. When resonance occurs for series resonant circuit, the ratio between the voltage of capacitor (or reactor) and the supply voltage of input are referred to as series resonance The quality factor of circuit.Quality factor are higher, and same input voltage can obtain higher on capacitor (or reactor) Output voltage.In order to obtain higher output voltage, the electric capacity of generally use regulation capacitor during on-site proving voltage transformer The value reactance value of reactor (or regulation) adjusts the quality factor of series resonant circuit.General regulation quality factor is exploratory Regulation, untill quality factor satisfaction requires, without ready patterns to follow, regulation process is complicated, and it is higher to be not easy acquisition for regulation process Quality factor.
The content of the invention
It is an object of the invention to overcome above shortcomings in the prior art, and provide a kind of regulation series resonance electricity Source Q circuit and its method of testing.The present invention is mutual with being in capacitive subject voltage using a group capacitor, reactor Sensor loop sets adjust the quality factor of resonance circuit into series resonant circuit by adjusting the capacitance of capacitor, so that The quality factor of series resonance testing device meet the requirement of voltage transformer on-site proving experiment.
Technical scheme is used by the present invention solves the above problems:One kind regulation series resonant inverter quality factor electricity Road, it is characterised in that:Including experimental power supply, pressure regulator, booster, loop equivalent resistance, reactor, matching capacitor, subject Loop equivalent capacity, subject voltage transformer and standard potential transformer, experimental power supply are connected with the input of pressure regulator, pressure regulation The output end of device is connected with the low pressure, input end of booster, and the high-voltage output end of booster is connected with loop equivalent resistance, loop Equivalent resistance is connected with reactor, and reactor is connected with matching capacitor, and matching capacitor is connected with a low side of booster, The low side ground connection of booster;Subject loop equivalent capacity is connected in parallel on the both ends of matching capacitor;It is tested voltage transformer simultaneously The both ends of matching capacitor are associated in, subject voltage transformer is connected in parallel on the both ends of subject loop equivalent capacity;Normal voltage mutual inductance Device is connected in parallel on the both ends of matching capacitor, and standard potential transformer is connected in parallel on the both ends of subject voltage transformer, and normal voltage is mutual Sensor is connected in parallel on the both ends of subject loop equivalent capacity.
The high-pressure side of matching capacitor of the present invention, the high-pressure side for being tested loop equivalent capacity, subject voltage transformer High-pressure side and the high-pressure side of standard potential transformer be connected with reactor.
The low-pressure end of matching capacitor of the present invention, the low-pressure end for being tested loop equivalent capacity, subject voltage transformer Low-pressure end and the low-pressure end of standard potential transformer be connected with a low side of booster.
A kind of method of testing for adjusting series resonant inverter Q circuit, it is characterised in that:
R is the resistance value of loop equivalent resistance, and L is the reactance value of reactor, CXIt is the capacitance of matching capacitor, C0It is The capacitance of loop equivalent capacity is tested,To be tested the virtual value of the voltage at loop equivalent capacity both ends,For booster Voltage between low side and the high-voltage output end of booster, ω are the angular frequency of experimental power supply, and j is imaginary unit;
WithThe ratio between be quality factor q:Then Work as CXWhen=0,Now quality factor are constant;Work as CxDuring=+ ∞, Q=0;As 1- ω2L (C0+CxDuring)=0,Now quality factor are maximum, and resonance occurs for circuit, now reaches resonance curve Q-CX's Resonance point;
QminIt is quality factor minimum value, as long as quality factor are more than QminIt can meet that voltage transformer on-site proving is tested Requirement;With C0Based on capacitance, and with equal capacitance value interval choose three capacitance C1=C0、C2=C0+C、C3= C0+ 2C, C is measured respectively1、C2And C3Corresponding quality factor q1、Q2And Q3, then (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points humorous Shake curve Q-CXOn distribution situation can be divided into two classes distribution:First kind distribution is (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points minutes For cloth in the both sides of resonance point, the distribution of the second class is (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points be distributed in the same of resonance point Side.
Add etc. the line-of-sight course Approach by inchmeal resonance point at capacitance value interval using basic capacitance, you can be quickly found out satisfaction The capacitance of on-site proving voltage transformer quality factor requirement, makes the quality factor of circuit be more than quality factor minimum value, from And make the calibrating circuit of voltage transformer that resonance (or approximate resonance) occur.
In first kind distribution, (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points of both sides for being distributed in resonance point include two kinds of feelings Condition:
The first situation:(C1, Q1)、(C2, Q2) and (C3, Q3) in 3 points a little in resonance curve Q-CXRaised bench Section, other 2 points of decline stages in curve in 3 points;
Second of situation:(C1, Q1)、(C2, Q2) and (C3, Q3) 2 points in 3 points are in resonance curve Q-CXRaised bench Section, it is other a little in resonance curve Q-C in 3 pointsXDecline stage;
The processing method of first kind distribution is as follows:
Now, (C is taken1, Q1)、(C2, Q2) and (C3, Q3) quality factor are larger in 3 points matching capacitor corresponding to 2 points Capacitance capacitance of the average value as new one group of matching capacitor, survey its corresponding quality factor, and retain above-mentioned Quality factor are maximum in four points 3 points, if still there are two kinds of situations of the first kind, repeat this step, until quality because Number meets to require.
In the distribution of second class, (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points be distributed in resonance point side and include two kinds of feelings Condition:
The first situation:(C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXAscent stage;
Second of situation:(C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXDecline stage;
In the distribution of second class during the first situation, continue, to increase the capacitance of matching capacitor at equal intervals, to measure increase Quality factor corresponding to the capacitance of matching capacitor afterwards, while retain at 3 points of quality factor maximum, if there is the first kind Distribution, the then processing method being distributed according to the first kind find the capacitance that quality factor meet the matching capacitor of requirement;If go out Existing second class distribution, then continue to increase capacitance value at equal intervals until there is first kind distribution, then by first kind distribution Processing method is until find the quality factor for meeting to require;
In the distribution of second class during second of situation, continue, to reduce the capacitance of matching capacitor at equal intervals, to measure reduction Quality factor corresponding to the capacitance of matching capacitor afterwards, while retain at 3 points of quality factor maximum, if there is the first kind Distribution, the then processing method being distributed according to the first kind find the capacitance that quality factor meet the matching capacitor of requirement;If go out Existing second class distribution, then continue to reduce capacitance value at equal intervals until there is first kind distribution, then by first kind distribution Processing method is until find the quality factor for meeting to require.
Compared with prior art, the present invention substantially increases the efficiency of series resonant inverter regulation quality factor to the present invention, especially It is applied to the unknown substation field of subject voltage transformer primary circuit direct-to-ground capacitance, such as used in GIS transformer stations The on-site proving of the electronic type voltage transformer used in electromagnetic potential transformer and AIS, GIS, PASS transformer station.Connect humorous The power quality factor that shakes meets that requirement is the regulation process of premise, often quality factor that on-site proving is carried out to voltage transformer Occupy the most of the time of voltage transformer on-site proving experiment.Test method designed by the present invention can be with quick regulation product Prime factor is allowed to be more than quality factor minimum value, circuit is reached resonant condition (or approximate resonance state), so as to greatly improve The operating efficiency of voltage transformer on-site proving experiment.
Brief description of the drawings
Fig. 1 is regulation series resonant inverter Q circuit structural representation of the embodiment of the present invention.
Fig. 2 is resonance curve of embodiment of the present invention Q-CXFigure.
Fig. 3 is the method for testing flow chart of regulation series resonant inverter Q circuit of the embodiment of the present invention.
Embodiment
Below in conjunction with the accompanying drawings and the present invention is described in further detail by embodiment, and following examples are to this hair Bright explanation and the invention is not limited in following examples.
Embodiment.
Referring to Fig. 1 to Fig. 3.
A kind of regulation series resonant inverter Q circuit is present embodiments provided, its installation method is as follows:Will experiment Power supply 1 access pressure regulator 2 input, pressure regulator 2 output termination booster 3 low pressure, input end, booster 3 it is once low End ground connection, the High voltage output termination reactor 5 of booster 3, the series connection matching capacitor 6 of reactor 5, matching capacitor 6 and standard Voltage transformer 9 and subject voltage transformer 7 are in parallel, i.e. the low-pressure end of matching capacitor 6, the low pressure of standard potential transformer 9 The low-pressure end of end and subject voltage transformer 7 is grounded, high-pressure side, the high-pressure side of standard potential transformer 9 of matching capacitor 6 It is both connected to together with the high-pressure side of subject voltage transformer 7.
The regulation series resonant inverter Q circuit obtained by above-mentioned installation include experimental power supply 1, pressure regulator 2, Booster 3, loop equivalent resistance 4, reactor 5, matching capacitor 6, subject loop equivalent capacity 8, subject voltage transformer 7 and Standard potential transformer 9.
Wherein loop equivalent resistance 4 for regulation series resonant inverter Q circuit in reactor 5, matching capacitor 6, It is tested total equivalent resistance corresponding to voltage transformer 7 and standard potential transformer 9.Loop equivalent capacity 8 is tested as subject voltage The equivalent capacity in the loop where transformer 7.
Experimental power supply 1 is connected with the input of pressure regulator 2, the output end of pressure regulator 2 and the low pressure, input end phase of booster 3 Even, the high-voltage output end of booster 3 is connected with loop equivalent resistance 4, and loop equivalent resistance 4 is connected with reactor 5, reactor 5 Connected with matching capacitor 6, matching capacitor 6 is connected with a low side of booster 3, the low side ground connection of booster 3.
Subject loop equivalent capacity 8 is connected in parallel on the both ends of matching capacitor 6.
Subject voltage transformer 7 is connected in parallel on the both ends of matching capacitor 6, and subject voltage transformer 7 is connected in parallel on subject loop The both ends of equivalent capacity 8.
Standard potential transformer 9 is connected in parallel on the both ends of matching capacitor 6, and standard potential transformer 9 is connected in parallel on subject voltage The both ends of transformer 7, standard potential transformer 9 are connected in parallel on the both ends of subject loop equivalent capacity 8.
Preferably, the high-pressure side of matching capacitor 6 is connected with reactor 5, be tested the high-pressure side of loop equivalent capacity 8 with Reactor 5 is connected, and the high-pressure side of subject voltage transformer 7 is connected with reactor 5, high-pressure side and the electricity of standard potential transformer 9 Anti- device 5 is connected.The high-pressure side of matching capacitor 6, the high-pressure side for being tested loop equivalent capacity 8, the high pressure for being tested voltage transformer 7 The high-pressure side of end and standard potential transformer 9 is first connected with each other, and is then connected again with reactor 5.
Preferably, the low-pressure end of matching capacitor 6 is connected with a low side of booster 3, is tested loop equivalent capacity 8 Low-pressure end be connected with a low side of booster 3, be tested the low-pressure end of voltage transformer 7 and a low side phase of booster 3 Even, the low-pressure end of standard potential transformer 9 is connected with a low side of booster 3.The low-pressure end of matching capacitor 6, it is tested back Low-pressure end, the low-pressure end of subject voltage transformer 7 of road equivalent capacity 8 are first connected with the low-pressure end of standard potential transformer 9, so It is connected afterwards with a low side of booster 3.
The present embodiment additionally provides the method for testing of regulation series resonant inverter Q circuit.
R is the resistance value of loop equivalent resistance 4, and L is the reactance value of reactor 5, CXIt is the capacitance of matching capacitor 6, C0 It is the capacitance for being tested loop equivalent capacity 8,To be tested the virtual value of the voltage at the both ends of loop equivalent capacity 8,For boosting Voltage between low side of device 3 and the high-voltage output end of booster 3, ω are the angular frequency of experimental power supply 1, and j is imaginary number list Position.
WithThe ratio between be quality factor q:
With reference to above-mentioned two formula, then
Work as CXWhen=0,Now quality factor are constant;Work as CxDuring=+ ∞, Q=0; As 1- ω2L(C0+CxDuring)=0,Now quality factor are maximum, and resonance occurs for circuit, and it is bent now to reach resonance Line Q-CXResonance point.
QminIt is quality factor minimum value, as long as quality factor q is more than QminIt can meet that voltage transformer on-site proving tries The requirement tested.
With C0Based on capacitance, and with equal capacitance value C intervals choose three capacitance C1=C0、C2=C0+ C and C3 =C0+2C.Measure C1Corresponding quality factor q1、C2Corresponding quality factor q2, C3Corresponding quality factor q3.Obtain (C1, Q1)、(C2, Q2) and (C3, Q3) three point coordinates.
Then (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXOn distribution situation can be divided into two classes distribution: First kind distribution is (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points of both sides for being distributed in resonance point, the distribution of the second class is (C1, Q1)、 (C2, Q2) and (C3, Q3) 3 points of the same sides for being distributed in resonance point.
In first kind distribution, (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points of both sides for being distributed in resonance point include two kinds of feelings Condition:
The first situation of first kind distribution:(C1, Q1)、(C2, Q2) and (C3, Q3) in 3 points a little in resonance curve Q- CXAscent stage, other 2 points of decline stages in curve in 3 points;
Second of situation of first kind distribution:(C1, Q1)、(C2, Q2) and (C3, Q3) 2 points in 3 points are in resonance curve Q- CXAscent stage, in 3 points in addition a little in resonance curve Q-CXDecline stage.
The processing method of first kind distribution is as follows:
Now, (C is taken1, Q1)、(C2, Q2) and (C3, Q3) quality factor are larger in 3 points matching capacitor corresponding to 2 points Capacitance C of the average value of 6 capacitance as new one group of matching capacitor 64If for example, Q1< Q2< Q3, then C4=(C2+ C3)/2。
Survey its C4Corresponding quality factor q4, obtain (C4, Q4), and retain (C1, Q1)、(C2, Q2)、(C3, Q3) and (C4, Q4) Quality factor are maximum in four points 3 points.If for example, Q1< Q2< Q3< Q4, then (C is retained2, Q2)、(C3, Q3) and (C4, Q4) Three points.
If still there are two kinds of situations of the first kind, such as (C2, Q2)、(C3, Q3) and (C4, Q4) three points be still distributed in it is humorous The both sides to shake a little, take (C2, Q2)、(C3, Q3) and (C4, Q4) quality factor are larger in three points matching capacitor corresponding to 2 points Capacitance C of the average value of 6 capacitance as new one group of matching capacitor 65.If for example, Q2< Q3< Q4, then C5=(C3+ C4)/2.Repeat the above steps until quality factor meet to require.
In the distribution of second class, (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points be distributed in resonance point side and include two kinds of feelings Condition.
The first situation of second class distribution:(C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXIt is upper The stage of liter.
In the distribution of second class during the first situation, continue to be worth to C to increase the electric capacity of matching capacitor 6 at equal intervals4, C4 =C0+ 3C, measure C4Corresponding quality factor q4, obtain point (C4, Q4).Retain (C1, Q1)、(C2, Q2)、(C3, Q3) and (C4, Q4) 3 points of middle quality factor maximum.If for example, Q1< Q2< Q3< Q4, then (C is retained2, Q2)、(C3, Q3) and (C4, Q4)。
If (C2, Q2)、(C3, Q3) and (C4, Q4) be distributed for the first kind, then the processing method being distributed according to the first kind finds product Prime factor meets the capacitance of desired matching capacitor 6.If there is the distribution of the second class, continue to increase capacitance at equal intervals Value is until there is first kind distribution, then by the processing method of first kind distribution until finding the quality factor for meeting requirement.
Second of situation of the second class distribution:(C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXUnder Depression of order section.
In the distribution of second class during second of situation, continue to be worth to C to reduce the electric capacity of matching capacitor 6 at equal intervals4, C4 =C0- C, measure C4Corresponding quality factor q4, obtain point (C4, Q4).Retain (C1, Q1)、(C2, Q2)、(C3, Q3) and (C4, Q4) 3 points of middle quality factor maximum.If for example, Q1< Q2< Q3< Q4, then (C is retained2, Q2)、(C3, Q3) and (C4, Q4)。
If (C2, Q2)、(C3, Q3) and (C4, Q4) be distributed for the first kind, then the processing method being distributed according to the first kind finds product Prime factor meets the capacitance of desired matching capacitor 6.If there is the distribution of the second class, continue to reduce capacitance at equal intervals Value is until there is first kind distribution, then by the processing method of first kind distribution until finding the quality factor for meeting requirement.
The method of testing of the present embodiment regulation series resonant inverter Q circuit the capacitance such as adds using basic electric capacity It is worth the line-of-sight course Approach by inchmeal resonance point at interval, quality factor is more than quality factor minimum value, so that series circuit occurs Resonance (or approximate resonance).Add etc. the line-of-sight course Approach by inchmeal resonance point at capacitance value interval using basic electric capacity, measure respectively Its quality factor, next capacitance is selected after judging 3 points of relations with series circuit resonance point according to three groups of data, progressively The resonance point of series circuit is approached untill quality factor are more than quality factor minimum value.Now, voltage transformer calibrating circuit Generation resonance (or approximate resonance), you can carry out the on-site proving experiment of voltage transformer.
Furthermore, it is necessary to illustrate, the specific embodiment described in this specification, the shape of its parts and components, it is named Title etc. can be different, and the above content described in this specification is only to structure example explanation of the present invention.It is all according to The equivalence changes or simple change done according to the construction described in inventional idea of the present invention, feature and principle, are included in this hair In the protection domain of bright patent.Those skilled in the art can do various to described specific embodiment The modification of various kinds or supplement are substituted using similar mode, without departing from structure of the invention or surmount present claims Scope defined in book, protection scope of the present invention all should be belonged to.

Claims (6)

1. one kind regulation series resonant inverter Q circuit, it is characterised in that:Including experimental power supply, pressure regulator, booster, Loop equivalent resistance, reactor, matching capacitor, subject loop equivalent capacity, subject voltage transformer and normal voltage mutual inductance Device, experimental power supply are connected with the input of pressure regulator, and the output end of pressure regulator is connected with the low pressure, input end of booster, booster High-voltage output end be connected with loop equivalent resistance, loop equivalent resistance is connected with reactor, reactor and matching capacitor string Connection, matching capacitor are connected with a low side of booster, the low side ground connection of booster;It is in parallel to be tested loop equivalent capacity At the both ends of matching capacitor;Subject voltage transformer is connected in parallel on the both ends of matching capacitor, and subject voltage transformer is connected in parallel on It is tested the both ends of loop equivalent capacity;Standard potential transformer is connected in parallel on the both ends of matching capacitor, and standard potential transformer is simultaneously The both ends of subject voltage transformer are associated in, standard potential transformer is connected in parallel on the both ends of subject loop equivalent capacity.
2. regulation series resonant inverter Q circuit according to claim 1, it is characterised in that:The matching capacitance The high-pressure side of device, the high-pressure side for being tested loop equivalent capacity, the high-pressure side for being tested voltage transformer and standard potential transformer High-pressure side is connected with reactor.
3. regulation series resonant inverter Q circuit according to claim 1 or 2, it is characterised in that:The matching The low-pressure end of capacitor, the low-pressure end for being tested loop equivalent capacity, the low-pressure end for being tested voltage transformer and normal voltage mutual inductance The low-pressure end of device is connected with a low side of booster.
A kind of 4. test side of regulation series resonant inverter Q circuit as described in claim 1-3 any claims Method, it is characterised in that:
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R is the resistance value of loop equivalent resistance, and L is the reactance value of reactor, CXIt is the capacitance of matching capacitor, C0It is subject The capacitance of loop equivalent capacity,To be tested the virtual value of the voltage at loop equivalent capacity both ends,For booster once Voltage between low side and the high-voltage output end of booster, ω are the angular frequency of experimental power supply, and j is imaginary unit;
WithThe ratio between be quality factor q:ThenWork as CX When=0,Now quality factor are constant;Work as CxDuring=+ ∞, Q=0;As 1- ω2L(C0+ CxDuring)=0,Now quality factor are maximum, and resonance occurs for circuit, now reaches resonance curve Q-CXResonance Point;
QminIt is quality factor minimum value, as long as quality factor are more than QminWanting for voltage transformer on-site proving experiment can be met Ask;With C0Based on capacitance, and with equal capacitance value interval choose three capacitance C1=C0、C2=C0+C、C3=C0+ 2C, C is measured respectively1、C2And C3Corresponding quality factor q1、Q2And Q3, then (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance Curve Q-CXOn distribution situation can be divided into two classes distribution:First kind distribution is (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points of distributions In the both sides of resonance point, the distribution of the second class is (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points of the same sides for being distributed in resonance point.
5. the method for testing of regulation series resonant inverter Q circuit according to claim 4, it is characterised in that:The In one kind distribution, (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points of both sides for being distributed in resonance point include two kinds of situations:
The first situation:(C1, Q1)、(C2, Q2) and (C3, Q3) in 3 points a little in resonance curve Q-CXAscent stage, 3 points In other 2 points of decline stages in curve;
Second of situation:(C1, Q1)、(C2, Q2) and (C3, Q3) 2 points in 3 points are in resonance curve Q-CXAscent stage, 3 points In in addition a little in resonance curve Q-CXDecline stage;
The processing method of first kind distribution is as follows:
Now, (C is taken1, Q1)、(C2, Q2) and (C3, Q3) quality factor are larger in 3 points matching capacitor corresponding to 2 points electricity Capacitance of the average value of capacitance as new one group of matching capacitor, its corresponding quality factor is surveyed, and retain aforementioned four Quality factor are maximum in point 3 points, if still there are two kinds of situations of the first kind, repeat this step, until quality factor expire Foot requires.
6. the method for testing of regulation series resonant inverter Q circuit according to claim 5, it is characterised in that:The In the distribution of two classes, (C1, Q1)、(C2, Q2) and (C3, Q3) 3 points be distributed in resonance point side and include two kinds of situations:
The first situation:(C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXAscent stage;
Second of situation:(C1, Q1)、(C2, Q2) and (C3, Q3) 3 points in resonance curve Q-CXDecline stage;
In the distribution of second class during the first situation, continue to increase the capacitance of matching capacitor at equal intervals, after measuring increase Quality factor corresponding to the capacitance of matching capacitor, while retain at 3 points of quality factor maximum, if there is first kind distribution, The processing method being then distributed according to the first kind finds the capacitance that quality factor meet the matching capacitor of requirement;If occur second Class is distributed, then continues to increase capacitance value at equal intervals until there is first kind distribution, the processing side being then distributed by the first kind Method is until find the quality factor for meeting to require;
In the distribution of second class during second of situation, continue to reduce the capacitance of matching capacitor at equal intervals, after measuring reduction Quality factor corresponding to the capacitance of matching capacitor, while retain at 3 points of quality factor maximum, if there is first kind distribution, The processing method being then distributed according to the first kind finds the capacitance that quality factor meet the matching capacitor of requirement;If occur second Class is distributed, then continues to reduce capacitance value at equal intervals until there is first kind distribution, the processing side being then distributed by the first kind Method is until find the quality factor for meeting to require.
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110096167A (en) * 2019-05-10 2019-08-06 鲁伯特(北京)教育科技有限公司 A kind of LC resonance circuit of time writer and the method for proposing high q-factor
CN115079069A (en) * 2022-07-25 2022-09-20 国仪量子(合肥)技术有限公司 Frequency-variable modulation field system, control method thereof and EPR spectrometer

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5072186A (en) * 1989-02-15 1991-12-10 Siemens Aktiengesellschaft Method and apparatus for interturn and/or interlayer fault testing of coils
JP2000151457A (en) * 1998-11-17 2000-05-30 Mitsubishi Electric Corp Resonance frequency adjustment method for contactless mobile body identification device
JP2001267950A (en) * 2000-03-21 2001-09-28 Yuhshin Co Ltd Automatic tuning antenna system
JP2005304272A (en) * 2004-04-16 2005-10-27 Denki Kogyo Co Ltd Resonance boosting circuit device
JP2007208538A (en) * 2006-01-31 2007-08-16 Fujitsu Ltd Resonator type oscillator and tuning capacitor circuit
US20110256841A1 (en) * 2010-04-16 2011-10-20 Denso Corporation Wireless communication apparatus having automatic antenna tuning function
CN102710300A (en) * 2012-05-11 2012-10-03 北京握奇数据***有限公司 Radio frequency identification (RFID) loop antenna matching method, antenna, electronic tag and reader
CN102832457A (en) * 2012-09-11 2012-12-19 马华 Matching method of RFID (Radio Frequency Identification Device) loop antenna
CN207396558U (en) * 2017-08-15 2018-05-22 华电电力科学研究院 Adjust series resonant inverter Q circuit

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5072186A (en) * 1989-02-15 1991-12-10 Siemens Aktiengesellschaft Method and apparatus for interturn and/or interlayer fault testing of coils
JP2000151457A (en) * 1998-11-17 2000-05-30 Mitsubishi Electric Corp Resonance frequency adjustment method for contactless mobile body identification device
JP2001267950A (en) * 2000-03-21 2001-09-28 Yuhshin Co Ltd Automatic tuning antenna system
JP2005304272A (en) * 2004-04-16 2005-10-27 Denki Kogyo Co Ltd Resonance boosting circuit device
JP2007208538A (en) * 2006-01-31 2007-08-16 Fujitsu Ltd Resonator type oscillator and tuning capacitor circuit
US20110256841A1 (en) * 2010-04-16 2011-10-20 Denso Corporation Wireless communication apparatus having automatic antenna tuning function
CN102710300A (en) * 2012-05-11 2012-10-03 北京握奇数据***有限公司 Radio frequency identification (RFID) loop antenna matching method, antenna, electronic tag and reader
CN102832457A (en) * 2012-09-11 2012-12-19 马华 Matching method of RFID (Radio Frequency Identification Device) loop antenna
CN207396558U (en) * 2017-08-15 2018-05-22 华电电力科学研究院 Adjust series resonant inverter Q circuit

Non-Patent Citations (3)

* Cited by examiner, † Cited by third party
Title
孙林涛: "串联谐振技术在电容式电压互感器校验中的应用研究", 《中国优秀硕士学位论文全文数据库-工程科技Ⅱ辑》 *
王智忠等: "《电工电子学》" *
龙腾飞等: "MPPT的三点比较法与登山法比较分析", 《大众科技》 *

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110096167A (en) * 2019-05-10 2019-08-06 鲁伯特(北京)教育科技有限公司 A kind of LC resonance circuit of time writer and the method for proposing high q-factor
CN115079069A (en) * 2022-07-25 2022-09-20 国仪量子(合肥)技术有限公司 Frequency-variable modulation field system, control method thereof and EPR spectrometer

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