CN107340940A - The method and wire brush device of lead off normal are examined during touch screen is made - Google Patents
The method and wire brush device of lead off normal are examined during touch screen is made Download PDFInfo
- Publication number
- CN107340940A CN107340940A CN201710488426.XA CN201710488426A CN107340940A CN 107340940 A CN107340940 A CN 107340940A CN 201710488426 A CN201710488426 A CN 201710488426A CN 107340940 A CN107340940 A CN 107340940A
- Authority
- CN
- China
- Prior art keywords
- plate base
- small plate
- lead
- sideline
- small
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 title claims abstract description 20
- 239000003550 marker Substances 0.000 claims abstract description 20
- 238000007689 inspection Methods 0.000 claims description 10
- 239000000463 material Substances 0.000 claims description 9
- 210000002186 septum of brain Anatomy 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 3
- 239000011521 glass Substances 0.000 description 8
- 239000000758 substrate Substances 0.000 description 8
- 238000013461 design Methods 0.000 description 6
- 238000005520 cutting process Methods 0.000 description 5
- 239000005357 flat glass Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000004080 punching Methods 0.000 description 2
- 238000007650 screen-printing Methods 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- 239000005041 Mylar™ Substances 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 235000009470 Theobroma cacao Nutrition 0.000 description 1
- 244000240602 cacao Species 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2203/00—Indexing scheme relating to G06F3/00 - G06F3/048
- G06F2203/041—Indexing scheme relating to G06F3/041 - G06F3/045
- G06F2203/04103—Manufacturing, i.e. details related to manufacturing processes specially suited for touch sensitive devices
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Human Computer Interaction (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Pinball Game Machines (AREA)
- Structure Of Printed Boards (AREA)
Abstract
The present invention relates to a kind of method and wire brush device that lead off normal is examined during touch screen is made.This examines the method for lead off normal during touch screen is made, and comprises the following steps:Big plate base for forming multiple small plate bases is provided, wherein, the region between adjacent two small plate base is marker space;Lead is formed on small plate base and check tag is formed at the sideline of small plate base, wherein, a part for each check tag is located on small plate base, and another part is located on marker space;Small plate base is separated from big plate base;Estimate the check tag on small plate base, with determine lead whether off normal.During touch screen is made can by estimate the check tag on small plate base determine lead whether off normal, relative to using measurement the distance between lead and small plate base sideline mode, operating efficiency it is higher.
Description
Technical field
The present invention relates to technical field of touch control, and lead off normal is examined during touch screen is made more particularly to one kind
Method and wire brush device.
Background technology
Capacitive touch screen can be divided into following two:(1) glass capacitive formula touch-screen;(2) Film (film) condenser type
Touch-screen.
When making glass capacitive formula touch-screen, designed, first formed on the glass of sheet for true according to drawing typesetting
Determine the touch control electrode of touch-control coordinate and the lead for connecting touch control electrode and chip, then cut the glass of sheet again, obtain
To the glass of small pieces (glass size of small pieces is suitable with actual product).
When making Film capacitive touch screen, designed, first formed on the Film of sheet for true according to drawing typesetting
Determine the touch control electrode of touch-control coordinate, lead and target for connecting touch control electrode and chip, then pass through target, the punching of set position
Cut the Film of sheet, obtain small pieces Film (the Film sizes of small pieces are suitable with actual product).
In the large stretch of Film of the large stretch of glass of cutting or punching, due to material (material of lead, the material of target) originally
Body, which exists to inside contract, to be extended out the imagination and the presence of mismachining tolerance be present, can cause lead on small sheet glass or small pieces Film with it is small
The distance between sheet glass or small pieces Film edge is excessive or too small, namely the phenomenon of cutting off normal be present.Generally judging
Cutting whether off normal when, it is necessary to which staff removes to measure lead and small sheet glass or small on every small sheet glass or small pieces Film
The distance between piece Film edge, so as to verify off normal defective products, operating efficiency is low.
The content of the invention
Based on this, it is necessary to provide a kind of higher inspection lead off normal during touch screen is made of operating efficiency
Method and wire brush device.
A kind of method that lead off normal is examined during touch screen is made, comprises the following steps:
Big plate base for forming multiple small plate bases is provided, wherein, the region between the adjacent two small plate base
For marker space;
Lead is formed on the small plate base and check tag is formed at the sideline of the small plate base, wherein,
A part for each check tag is located on the small plate base, and another part is located on the marker space;
The small plate base is separated from the big plate base;And
Estimate the check tag on the small plate base, with determine the lead whether off normal.
The above-mentioned method that lead off normal is examined during touch screen is made, is formed by elder generation on the small plate base
Lead and the formation check tag at the sideline of the small plate base, wherein, a part for each check tag is located at
On the small plate base, another part is located on the marker space, then can pass through range estimation during touch screen is made
Check tag on small plate base come determine lead whether off normal, relative to using between measurement lead and small plate base sideline
Range range mode, operating efficiency are higher.
In one of the embodiments, the big plate base includes central area and frame region, and the central area is used
In the multiple small plate bases of formation;
Before the step of separating the small plate base from the big plate base, the frame region is additionally included in
The step of forming target.Small plate base can so be separated from big plate base by the way of position target is covered, improved
Production efficiency and yield.
In one of the embodiments, the check tag is formed simultaneously with the lead.Can so avoid the occurrence of because
The problem of setting up check tag and causing processing step increase.
In one of the embodiments, the check tag is identical with the material of the lead.So can further it avoid
The problem of appearance causes processing step increase because setting up check tag.
In one of the embodiments, symmetric figure centered on the check tag, the center line of the check tag with
The sideline of the small plate base overlaps.Judge in this way, centrosymmetric image is more conducive to estimate, because centrosymmetric image such as half
Circle, major arc and minor arc have higher identification relative to non-centrosymmetry figure such as right angled triangle.
In one of the embodiments, the dimensional tolerance for forming the lead is positive and negative X, and the check tag is along adjacent
Maximum length on the arragement direction of the two small plate bases is twice of the X.It is arranged such, on the one hand can ensures to examine
Mark is easy to naked-eye observation, on the other hand can reduce the making material of check tag, reduce cost.
In one of the embodiments, multiple small plate bases in array format arrange, if each column and often row include
The dry small plate base, the small plate base are square, and each small plate base includes relative the first sideline and second
Sideline, and the 3rd relative sideline and the 4th sideline, in every row, first sideline of the adjacent two small plate base with
Second sideline is staggered, in each column, the 3rd sideline and the 4th sideline of the adjacent two small plate base
It is staggered;
The check tag is at least one of first sideline and the 3rd sideline.Such cocoa so as to
In cutting small plate base from big plate base, while can be by estimating the inspection on small plate base during touch screen is made
Standard inspection know determine lead whether off normal, relative to using measure the distance between lead and small plate base sideline mode, operation
Efficiency is higher.
A kind of method that lead off normal is examined during touch screen is made, comprises the following steps:
The first big plate base and second largest plate base are provided, the first big plate base is used to form multiple first small pieces
Substrate, the second largest plate base are used to form the multiple second small plate bases, the area between the adjacent two first small plate base
Domain is the first marker space;
The first lead, the first touch control electrode are formed on the described first small plate base and in the described first small plate base
Check tag is formed at sideline, the second lead and second touch control electrode are formed on the described second small plate base, wherein, Mei Yisuo
The part for stating check tag is located on the described first small plate base, and another part is located on first marker space;
Surface of the described first big plate base away from first lead is affixed on the second largest plate base, and it is described
The sideline of first small plate base overlaps with the sideline of the described second small plate base;
Described first small plate base is separated from the described first big plate base, at the same by the described second small plate base from
The second largest plate base is separated;And
Estimate the check tag on the described first small plate base, with determine first lead whether off normal.So into
During the first small plate base of production of batch, it is only necessary to estimate the check tag of first small pieces substantially and be assured that
First lead whether off normal, can so improve production efficiency.
A kind of wire brush device, including for formed the first silk-screen region of lead and for forming check tag second
Silk-screen region.
In one of the embodiments, in addition to for forming the 3rd silk-screen region of target.
Brief description of the drawings
Fig. 1 is the structural representation of the big plate base of an embodiment;
Fig. 2 is the partial enlarged drawing at A in Fig. 1;
Fig. 3 is Fig. 2 partial enlarged drawing;
Fig. 4 is the partial enlarged drawing at the B in Fig. 1;
Fig. 5 is schematic diagram corresponding to Fig. 1;
Fig. 6 is the structural representation of the small plate base of an embodiment;
Fig. 7 is the partial enlarged drawing at C in Fig. 6.
Embodiment
Below in conjunction with the accompanying drawings and specific embodiment to during touch screen is made examine lead off normal method and
Wire brush device is further described.
The method that lead off normal is examined during touch screen is made, comprises the following steps:
Step S110, there is provided the big plate base basic for forming multiple small pieces, wherein, between adjacent two small plate base
Region is marker space.
Step S120, lead is formed on small plate base and check tag is formed at the sideline of small plate base, wherein,
A part for each check tag is located on small plate base, and another part is located on marker space.
Step S130, small plate base is separated from big plate base.
Step S140, estimate the check tag on small plate base, with determine lead whether off normal.
It can determine whether lead is inclined by estimating the check tag on small plate base during touch screen is made
Position, relative to higher using measurement the distance between lead and small plate base sideline mode, operating efficiency.
In the present embodiment, before step S120, in addition to the step of design drawing is provided, according to design drawing,
Carry out step S120.Specifically, as shown in Figures 1 to 5, it can be seen from design drawing, big plate base 10 is multiple small for being formed
Plate base 12, the region between adjacent two small plate base 12 is marker space 14, and marker space 14 includes laterally separated area 14a and longitudinal direction
Marker space 14b.Big plate base 10 includes central area 10a and frame region 10b, and central area 10a is used to form multiple small pieces
Substrate 12.Multiple small plate bases 12 in array format arrange, each column and often row include several small plate bases 12.Small plate base
12 are square, and each small plate base 12 includes relative the first sideline 12a and the second sideline 12b, and the 3rd relative sideline
12c and the 4th sideline 12d.In every row, the first sideline 12a and the second sideline 12b of adjacent two small plate base 12 are staggered;
In each column, the 3rd sideline 12c and the 4th sideline 12d of adjacent two small plate base 12 are staggered.Formed on small plate base 12
Leaded 20, and formed with check tag 30 at the sideline of small plate base 14.A part for each check tag 30 is located at small pieces
On substrate 12, another part is located on marker space 14.
In the present embodiment, it is not provided with before implementation steps S120, on big plate base 10 and is used to distinguish small pieces
Substrate 12 it is beautiful, the sideline of small plate base 12 formed while small plate base 12 are formed, namely small plate base 12
Sideline is formed in step s 130.Wherein, the formation of lead 20 and check tag 30, and the sideline of small plate base 12
Formed, be all according to design drawing, formed by automated procedures.It is appreciated that in other embodiments, can also be pre-
First be provided for distinguishing the beautiful of small plate base 12 on big plate base 10, for example, in advance on big plate base 10 make with it is small
The lines that the sideline of plate base 12 overlaps.
Small plate base 12 is square, and each small plate base 12 has four edges line, and inspection can be all set on four edges line
Standard inspection knows 30, can also only set check tag 30 on one or two sidelines wherein.Preferably, in the present embodiment,
Check tag 30 is at least one of first sideline 12a and the 3rd sideline 12c.
Further, in the present embodiment, marker space 14 includes laterally separated area 14a and longitudinal subdivision area 14b, longitudinal direction
For marker space 14b between the first sideline 12a and the second sideline 12b, laterally separated area 14a is located at the 3rd sideline 12c and the 4th
Between the 12d of sideline.Longitudinal subdivision area 14b has the longitudinal centre line 14c parallel with the first sideline 12a, laterally separated area 14a tools
There is the cross central line 14d parallel with the 3rd sideline 12c.Check tag 30 is also located at longitudinal centre line 14c and cross central line
On at least one of 14d.Specifically, in the present embodiment, check tag 30 is located at longitudinal centre line 14c.In longitudinal direction
Whether at least one of heart line 14c and cross central line 14d are upper sets check tag 30, can inclined with auxiliary judgment lead 20
Position.
Further, in the present embodiment, before step S120 is carried out, in addition to touch-control is formed on small plate base 14
The step of electrode (not shown).After forming touch control electrode, then carry out step S120.The one end of lead 20 formed in the step s 120
It is connected with touch control electrode, the other end is used to be connected with the flexible PCB (i.e. FPC) of touch screen.Specifically, in present embodiment
In, touch control electrode is ITO electrode.
Further, in the present embodiment, big plate base 10 is ilm substrate, and small plate base 12 is being divided from big plate base 10
Before separating out the step come, the step of frame region 10b forms target 40 is additionally included in.The frame region 10b of big plate base 10
Target 40 is provided with, can be separated small plate base 12 from big plate base 10 by the way of position target 40 is covered.It is large stretch of
Substrate 10 can be mylar substrate.In other embodiments, when big plate base is glass substrate, cutting can be used
Mode small plate base is separated from big plate base.
Further, in the present embodiment, lead 20 is formed simultaneously with check tag 30, so as to avoid the occurrence of because increasing
If check tag 30 and the problem of cause processing step increase.Further, in the present embodiment, lead 20 and check tag 30
Material it is also identical, can further avoid the occurrence of the problem of causing processing step increase because setting up check tag 30.Specifically
, in the present embodiment, lead 20 and the material of check tag 30 are silver paste, and lead 20 is formed by the way of silk-screen printing
And check tag 30.
Further, in the present embodiment, symmetric figure centered on check tag 30, the center line of check tag 30 with it is small
The sideline of plate base 20 overlaps.Wherein, check tag 30 can be annulus, round dot (round spot), isosceles triangle etc..In this implementation
In mode, check tag 30 is preferably annulus, and relative to the round dot of identical size, annulus materials are less, and to small plate base 12
Non-visible area (lead 20 where region) influence it is small.And annulus is more conducive to estimate and judged relative to isosceles triangle, because
There is higher identification relative to right angled triangle for semicircle, major arc and minor arc.
Further, in the present embodiment, the dimensional tolerance for forming lead 20 is positive and negative X, when designing check tag, inspection
The maximum length that standard inspection is known on the arragement direction along adjacent two small plate bases is to form X twice.Specifically, such as Fig. 6 and Fig. 7
Shown, in the present embodiment, the spacing between the lead 20 of design and sideline is 0.40 ± 0.15mm, forms the chi of lead 20
Very little tolerance is positive and negative 0.15mm, a diameter of 0.30mm of check tag.
Estimate the check tag 30 on small plate base 12, come judge lead 20 whether off normal.For example, can be according to being present in
The situation of check tag 30 on small plate base 12 judges whether off normal, when check tag 30 is not present on small plate base 12
Or when the figure of the check tag 30 on small plate base 12 is complete, the off normal of lead 20, that is, in design, do not have with lead
The size for having check tag 30 of the degree of off normal or off normal on the small plate base 12 in the margin of tolerance is standard, range estimation
When the size of check tag 30 on small plate base 12 deviates the standard, i.e. the off normal of lead 20.In the present embodiment, mark is examined
It is annulus or round dot to know 30, when the check tag 30 on small plate base 12 is semi-ring or half round dot, the not off normal of lead 20.
In the present embodiment, touch screen is double-deck touch screen, makes the double-deck touch screen and comprises the following steps:
Step S210, there is provided the first big plate base and second largest plate base, the first big plate base are used to form multiple the
One small plate base, second largest plate base are used to form the multiple second small plate bases, the region between adjacent two first small plate base
For the first marker space.
Step S220, the first lead, the first touch control electrode are formed on the first small plate base and in the first small plate base
Sideline at formed check tag, form the second lead and second touch control electrode on the second small plate base, wherein, each inspection
A part for mark is located on the first small plate base, and another part is located on the first marker space.
Step S230, the first surface of the big plate base away from the first lead is affixed on second largest plate base, and first is small
The sideline of plate base overlaps with the sideline of the second small plate base.
Step S240, the first small plate base is separated from the first big plate base, while by the second small plate base from
Two big plate bases are separated.
Step S250, estimate the first small plate base on check tag, with determine the first lead whether off normal.
Due to the Anawgy accuracy of the first big plate base and second largest plate base enable to the sideline of the first small plate base with
The sideline of second small plate base overlaps, the first lead whether off normal table can represent the second lead whether off normal.
Lead 20 and check tag 30 are formed by the way of silk-screen printing.In the present embodiment, a kind of silk is also provided
Brush device, the wire brush device include being used for the first silk-screen region for forming lead and the second silk-screen for forming check tag
Region.Further, in the present embodiment, the wire brush device also includes being used for the 3rd silk-screen region for forming target.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope that this specification is recorded all is considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more specific and detailed, but simultaneously
Can not therefore it be construed as limiting the scope of the patent.It should be pointed out that come for one of ordinary skill in the art
Say, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (10)
- A kind of 1. method that lead off normal is examined during touch screen is made, it is characterised in that comprise the following steps:Big plate base for forming multiple small plate bases is provided, wherein, the region between the adjacent two small plate base is point Septal area;Lead is formed on the small plate base and check tag is formed at the sideline of the small plate base, wherein, it is each A part for the check tag is located on the small plate base, and another part is located on the marker space;The small plate base is separated from the big plate base;AndEstimate the check tag on the small plate base, with determine the lead whether off normal.
- 2. the method according to claim 1 that lead off normal is examined during touch screen is made, it is characterised in that institute Stating big plate base includes central area and frame region, and the central area is used to form multiple small plate bases;Before the step of separating the small plate base from the big plate base, it is additionally included in the frame region and is formed The step of target.
- 3. the method according to claim 1 that lead off normal is examined during touch screen is made, it is characterised in that institute State check tag and the lead while formed.
- 4. the method according to claim 3 that lead off normal is examined during touch screen is made, it is characterised in that institute It is identical with the material of the lead to state check tag.
- 5. the method according to claim 1 that lead off normal is examined during touch screen is made, it is characterised in that institute Symmetric figure centered on check tag is stated, the center line of the check tag overlaps with the sideline of the small plate base.
- 6. the method according to claim 5 that lead off normal is examined during touch screen is made, it is characterised in that shape Dimensional tolerance into the lead is positive and negative X, and the check tag is on the arragement direction along the adjacent two small plate bases Maximum length is twice of the X.
- 7. the method according to claim 1 that lead off normal is examined during touch screen is made, it is characterised in that more The individual small plate base in array format arrange, each column and often row include several described small plate bases, the small plate base It is square, each small plate base includes the first relative sideline and the second sideline, and relative the 3rd sideline and the 4th Sideline, in every row, first sideline and second sideline of the adjacent two small plate base are staggered, in each column In, the 3rd sideline and the 4th sideline of the adjacent two small plate base are staggered;The check tag is at least one of first sideline and the 3rd sideline.
- A kind of 8. method that lead off normal is examined during touch screen is made, it is characterised in that comprise the following steps:The first big plate base and second largest plate base are provided, the first big plate base is used to form the multiple first small chip bases Plate, the second largest plate base are used to form the multiple second small plate bases, the region between the adjacent two first small plate base For the first marker space;The first lead, the first touch control electrode are formed on the described first small plate base and in the sideline of the described first small plate base Place forms check tag, and the second lead and second touch control electrode are formed on the described second small plate base, wherein, each inspection The part that standard inspection is known is located on the described first small plate base, and another part is located on first marker space;Surface of the described first big plate base away from first lead is affixed on the second largest plate base, and described first The sideline of small plate base overlaps with the sideline of the described second small plate base;Described first small plate base is separated from the described first big plate base, while by the described second small plate base from described Second largest plate base is separated;AndEstimate the check tag on the described first small plate base, with determine first lead whether off normal.
- 9. a kind of wire brush device, it is characterised in that including for forming the first silk-screen region of lead and being examined for being formed Second silk-screen region of mark.
- 10. wire brush device according to claim 9, it is characterised in that also include being used for the 3rd silk-screen area for forming target Domain.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710488426.XA CN107340940B (en) | 2017-06-23 | 2017-06-23 | Method for checking deviation of lead in process of manufacturing touch screen and wire brush device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710488426.XA CN107340940B (en) | 2017-06-23 | 2017-06-23 | Method for checking deviation of lead in process of manufacturing touch screen and wire brush device |
Publications (2)
Publication Number | Publication Date |
---|---|
CN107340940A true CN107340940A (en) | 2017-11-10 |
CN107340940B CN107340940B (en) | 2023-10-24 |
Family
ID=60221611
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710488426.XA Active CN107340940B (en) | 2017-06-23 | 2017-06-23 | Method for checking deviation of lead in process of manufacturing touch screen and wire brush device |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN107340940B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108388376A (en) * | 2018-03-07 | 2018-08-10 | 张家港康得新光电材料有限公司 | Conductive film layer structure, its production method and touch screen |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1345010A (en) * | 2000-09-26 | 2002-04-17 | 洋华光电股份有限公司 | Manufacture of touching control panel |
JP2004342664A (en) * | 2003-05-13 | 2004-12-02 | Juki Corp | Electronic part packaging apparatus |
KR20050032530A (en) * | 2005-01-28 | 2005-04-07 | (주)포틱스테크놀로지 | Automatic inspection apparatus of substrate for semiconductor package |
CN101844864A (en) * | 2009-03-24 | 2010-09-29 | 北京京东方光电科技有限公司 | Glass substrate and cutting method thereof |
CN102096505A (en) * | 2011-01-07 | 2011-06-15 | 牧东光电(苏州)有限公司 | Touch panel jointed fragmentally and manufacturing method thereof |
CN103853395A (en) * | 2012-11-30 | 2014-06-11 | 比亚迪股份有限公司 | Capacitive screen and manufacturing method thereof |
CN104035642A (en) * | 2014-06-16 | 2014-09-10 | 南京点面光电有限公司 | OGS (one glass solution) capacitive touch screen and preparation method thereof |
CN104166485A (en) * | 2013-05-17 | 2014-11-26 | 袁博 | Monolithic substrate capacitive touch screen and manufacturing method thereof |
CN104181768A (en) * | 2013-05-27 | 2014-12-03 | 佳能株式会社 | Imprinting method, imprinting apparatus, and device manufacturing method |
CN104330912A (en) * | 2014-11-24 | 2015-02-04 | 京东方科技集团股份有限公司 | Mother board, mother board after box pairing, corresponding manufacturing method and liquid crystal display panel |
CN104718519A (en) * | 2013-08-23 | 2015-06-17 | 林龙辰 | Process module, fabricating method thereof and substrate processing method using the process module |
CN205029958U (en) * | 2015-09-25 | 2016-02-10 | 广州兴森快捷电路科技有限公司 | V -CUT prevents slow -witted graphic structure |
CN106842838A (en) * | 2017-04-19 | 2017-06-13 | 武汉华星光电技术有限公司 | Alignment mark and substrate alignment method |
-
2017
- 2017-06-23 CN CN201710488426.XA patent/CN107340940B/en active Active
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1345010A (en) * | 2000-09-26 | 2002-04-17 | 洋华光电股份有限公司 | Manufacture of touching control panel |
JP2004342664A (en) * | 2003-05-13 | 2004-12-02 | Juki Corp | Electronic part packaging apparatus |
KR20050032530A (en) * | 2005-01-28 | 2005-04-07 | (주)포틱스테크놀로지 | Automatic inspection apparatus of substrate for semiconductor package |
CN101844864A (en) * | 2009-03-24 | 2010-09-29 | 北京京东方光电科技有限公司 | Glass substrate and cutting method thereof |
CN102096505A (en) * | 2011-01-07 | 2011-06-15 | 牧东光电(苏州)有限公司 | Touch panel jointed fragmentally and manufacturing method thereof |
CN103853395A (en) * | 2012-11-30 | 2014-06-11 | 比亚迪股份有限公司 | Capacitive screen and manufacturing method thereof |
CN104166485A (en) * | 2013-05-17 | 2014-11-26 | 袁博 | Monolithic substrate capacitive touch screen and manufacturing method thereof |
CN104181768A (en) * | 2013-05-27 | 2014-12-03 | 佳能株式会社 | Imprinting method, imprinting apparatus, and device manufacturing method |
CN104718519A (en) * | 2013-08-23 | 2015-06-17 | 林龙辰 | Process module, fabricating method thereof and substrate processing method using the process module |
CN104035642A (en) * | 2014-06-16 | 2014-09-10 | 南京点面光电有限公司 | OGS (one glass solution) capacitive touch screen and preparation method thereof |
CN104330912A (en) * | 2014-11-24 | 2015-02-04 | 京东方科技集团股份有限公司 | Mother board, mother board after box pairing, corresponding manufacturing method and liquid crystal display panel |
CN205029958U (en) * | 2015-09-25 | 2016-02-10 | 广州兴森快捷电路科技有限公司 | V -CUT prevents slow -witted graphic structure |
CN106842838A (en) * | 2017-04-19 | 2017-06-13 | 武汉华星光电技术有限公司 | Alignment mark and substrate alignment method |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108388376A (en) * | 2018-03-07 | 2018-08-10 | 张家港康得新光电材料有限公司 | Conductive film layer structure, its production method and touch screen |
Also Published As
Publication number | Publication date |
---|---|
CN107340940B (en) | 2023-10-24 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20140362030A1 (en) | Capacitive touch screen and method for manufacturing the same | |
CN104699545B (en) | The method and apparatus of misjudgment proximity event | |
US10146385B2 (en) | Touch substrate, display device and method for detecting touch electrode pattern | |
WO2019041985A1 (en) | Metal mesh, touch display device and method of reducing moiré patterns in touch display device | |
US20130062179A1 (en) | Touch panel having a shielding structure and method of manufacturing the same | |
WO2016188004A1 (en) | Fingerprint recognition apparatus, touch panel and display device | |
US9891768B2 (en) | Touch panel, its manufacturing method and touch display device | |
CN107045400A (en) | Multipoint pressure touch detection method and multipoint pressure touch module | |
US20170131827A1 (en) | Array substrate, method for manufacturing the same, and touch display device | |
CN106484184B (en) | Touch screen and its recognition methods | |
CN109192072A (en) | Display panel and display device | |
US20210365148A1 (en) | Touch substrate, display device and method for acquiring touch coordinate | |
CN106293207A (en) | A kind of touch-control display panel and driving method, touch control display apparatus | |
CN107340940A (en) | The method and wire brush device of lead off normal are examined during touch screen is made | |
TWI582652B (en) | Touch sensitive information transmission method, processor and system | |
US20140014489A1 (en) | Touch panel | |
CN108646127B (en) | Touch screen short circuit position detection structure and detection method | |
CN108181541B (en) | Detection device and detection method of touch panel | |
CN103105980B (en) | Electrode structure of capacitive touch control panel | |
CN102855043A (en) | Multi-point identification capacitor screen with single conducting layer | |
US20120287078A1 (en) | Multi-touch detection method and device thereof | |
CN207443201U (en) | A kind of screen finger with pressure checks the flexible circuit board of line | |
CN108021260B (en) | Touch detection method | |
CN207051874U (en) | Have capacitance type touch control substrate, touch-screen and the display device of visual testing point | |
CN105426011B (en) | Touch screen and position of touch localization method and display device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20210223 Address after: 231323 Building 1, precision electronics industrial park, Hangbu Town, Shucheng County, Lu'an City, Anhui Province Applicant after: Anhui jingzhuo optical display technology Co.,Ltd. Address before: 215143 No. 233 Kangyang Road, Huangdi Town, Xiangcheng District, Suzhou City, Jiangsu Province Applicant before: SUZHOU OFILM TECH Co.,Ltd. |
|
GR01 | Patent grant | ||
GR01 | Patent grant |