CN107339952B - Three-dimensional measuring device for projection in three directions of high and low groups - Google Patents

Three-dimensional measuring device for projection in three directions of high and low groups Download PDF

Info

Publication number
CN107339952B
CN107339952B CN201710627797.1A CN201710627797A CN107339952B CN 107339952 B CN107339952 B CN 107339952B CN 201710627797 A CN201710627797 A CN 201710627797A CN 107339952 B CN107339952 B CN 107339952B
Authority
CN
China
Prior art keywords
projection
grating
grating projection
mounting block
included angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710627797.1A
Other languages
Chinese (zh)
Other versions
CN107339952A (en
Inventor
姚征远
林福凌
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xiamen Sinic Tek Intelligent Technology Co ltd
Original Assignee
Xiamen Sinic Tek Intelligent Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xiamen Sinic Tek Intelligent Technology Co ltd filed Critical Xiamen Sinic Tek Intelligent Technology Co ltd
Priority to CN201710627797.1A priority Critical patent/CN107339952B/en
Publication of CN107339952A publication Critical patent/CN107339952A/en
Application granted granted Critical
Publication of CN107339952B publication Critical patent/CN107339952B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

The invention discloses a three-dimensional measuring device for projection in each three directions of a high group and a low group, which relates to the field of detection of circuit boards and comprises an image capturing device, a first mounting block and a second mounting block which are sequentially arranged from top to bottom; three groups of first grating projection devices are respectively arranged on three side surfaces of the first installation block, and the projection light of each group of first grating projection devices is equal to an included angle beta 1 between the central axis of the camera; three groups of second grating projection devices are respectively arranged on three sides of the second installation block, and the projection light of each group of second grating projection devices is equal to an included angle beta 2 between the central axis of the camera; the included angle beta 1 is smaller than the included angle beta 2; the first grating projection device and the second grating projection device are arranged in a staggered mode. The device can realize nondestructive optical measurement of the object to be measured with the height of up to 10mm, effectively reduces the influence of shadows generated by the light projection of the object to be measured on the detection precision, and has the advantages of strong universality and high measurement precision.

Description

Three-dimensional measuring device for projection in three directions of high and low groups
Technical Field
The invention relates to the field of detection of circuit boards, in particular to a three-dimensional measuring device for projection in three directions of a high-low group.
Background
Aiming at the detection of the heights of printed solder paste and components mounted on the surface in the electronic manufacturing process of a circuit board, no-damage optical measurement technology exists at present, namely a programmable structure grating (PSLM) technology is adopted to form a full-spectrum structure grating combined with a phase profile modulation measurement technology (PMP), an XYZ operation platform is combined, motion control, detection head light source (2D and 3D) control, image acquisition, data input and output are carried out by self-programming control software through computer and PLC control, the height and the area of a measured object are calculated through decomposition and synthesis, and three-dimensional parameters of the measured object are calculated through the area and the height, so that the three-dimensional measurement of the printed solder paste and the components is realized.
At present, the measuring device with unidirectional projection is mainly used in the market, the unidirectional projection light generates shadows on the back of the measured object relative to the light, the shadow area is larger as the height of the measured object is higher, and the measuring error is larger, so that the measuring device with unidirectional projection has the defect that the measuring device with unidirectional projection has overlarge error and even can not finish the measurement under the condition that the height of the measured object is relatively higher.
Aiming at the technical problems, the inventor develops a three-dimensional measuring device for projection in each three directions of a high-low group, which overcomes the technical problems through intensive research, and the scheme is generated.
Disclosure of Invention
In order to solve the technical problems, the invention provides a three-dimensional measuring device for projection in each three directions of a high-low group so as to realize accurate detection of various objects to be measured with different heights, reduce measuring errors and improve measuring accuracy.
In order to achieve the above purpose, the present invention adopts the following technical scheme:
the three-dimensional measuring device comprises an image capturing device, a first mounting block and a second mounting block which are sequentially arranged from top to bottom, wherein the first mounting block and the second mounting block are respectively fixedly connected with the image capturing device; the image capturing device comprises a T-shaped mounting seat, a placing block arranged on the T-shaped mounting seat and a camera which is arranged on the placing block and has a downward lens; the upper and lower openings of the first mounting block consist of seven side surfaces, and the cross section area of the first mounting block is gradually reduced from top to bottom; the upper and lower openings of the second mounting block consist of seven side surfaces, and the cross section area of the second mounting block is gradually reduced from top to bottom; three groups of first grating projection devices are respectively arranged on three side surfaces of the first installation block, and the projection light of each group of first grating projection devices is equal to an included angle beta 1 between the central axis of the camera; three groups of second grating projection devices are respectively arranged on three sides of the second installation block, and the projection light of each group of second grating projection devices is equal to an included angle beta 2 between the central axis of the camera; the included angle beta 1 is smaller than the included angle beta 2; the first grating projection device and the second grating projection device are arranged in a staggered mode.
Preferably, the projection light rays of each group of first grating projection devices are parallel to the corresponding side surfaces of the first mounting blocks; the projection light rays of each group of second grating projection devices are parallel to the corresponding side surfaces of the second installation blocks.
Preferably, the three groups of first grating projection devices are installed at the same height; and the mounting heights of the three groups of second grating projection devices are consistent.
The beneficial effects of the invention are as follows: according to the invention, three groups of grating projection devices are designed, so that a measured object is covered by two groups of projection light rays in three different directions, six grating images are respectively collected by a camera, the collected pictures are decomposed and synthesized by a computer, and the height, the area and the three-dimensional parameters of the measured object are calculated by combining a phase profile modulation measurement technology (PMP), so that the measured object is accurately measured; meanwhile, the first grating projection device 21 projects grating images which are in three directions and have the same included angle beta 1 with the central axis of the camera, and likewise, the second grating projection device 31 projects grating images which are in three directions and have the same included angle beta 2 with the central axis of the camera, and the included angle beta 1 is smaller than the included angle beta 2, so that two groups of parameters exist when the height operation is performed by adopting the phase profile modulation measurement technology (PMP), and the measurement precision is effectively improved. The invention effectively reduces the influence of shadows generated by the projection of the light rays on the detection precision, is suitable for three-dimensional measurement of various objects to be measured with different heights, and has the advantages of strong universality and high measurement precision.
Drawings
FIG. 1 is a schematic diagram of the structure of the present invention.
Fig. 2 is a top view of the present invention.
FIG. 3 is a cross-sectional view of the invention A-A.
FIG. 4 is a cross-sectional view of the invention B-B.
FIG. 5 is a schematic diagram of a raster image operation according to the present invention.
Detailed Description
As shown in fig. 1-5, the invention discloses a three-dimensional measuring device for projection in each three directions of a high-low group, which comprises an image capturing device 1, a first mounting block 2 and a second mounting block 3 which are sequentially arranged from top to bottom, wherein the first mounting block 2 and the second mounting block 3 are respectively fixedly connected with the image capturing device 1; the image capturing device 1 comprises a T-shaped mounting seat 11, a placing block 12 arranged on the T-shaped mounting seat 11, and a camera 13 which is arranged on the placing block 12 and has a downward lens; the upper and lower openings of the first mounting block 2 are formed by seven side surfaces, and the cross section area of the first mounting block is gradually reduced from top to bottom; the upper and lower openings of the second mounting block 3 are formed by seven side surfaces, and the cross section area of the second mounting block is gradually reduced from top to bottom; three groups of first grating projection devices 21 are respectively arranged on three side surfaces of the first installation block 2, and the included angle beta 1 between the projection light 211 of each group of first grating projection devices 21 and the central axis 131 of the camera 13 is equal; three groups of second grating projection devices 31 are respectively arranged on three side surfaces of the second installation block 3, and the included angle beta 2 between the projection light 311 of each group of second grating projection devices 31 and the central axis 131 of the camera 13 is equal; the included angle beta 1 is smaller than the included angle beta 2; the first grating projection device 21 and the second grating projection device 31 are staggered.
Further, the projection light rays 211 of each group of the first grating projection devices 21 are parallel to the corresponding side surfaces of the first mounting blocks 2; the projection light 311 of each set of the second grating projection device 31 is parallel to the corresponding side of the second mounting block.
Further, the mounting heights of the three groups of the first grating projection devices 21 are consistent; the three sets of the second grating projection devices 31 are installed to be uniform in height.
The first grating projection device 21 and the second grating projection device 31 respectively comprise an electronic circuit, an optical engine and an LED lamp, wherein the electronic circuit generates a programmable structure grating (PSLM), the LED lamp is used as a light source to project the grating through the optical engine, so that each first grating projection device 21 and each second grating projection device 31 can project grating images with different phases and different colors on a measured object, the grating images are respectively collected by the camera 13, the collected images are decomposed and synthesized by a computer, and the height, the area and the three-dimensional parameters of the measured object are calculated by combining a phase profile modulation measurement technology (PMP), thereby realizing the detection of the measured object.
In one embodiment, taking the included angle β1 as 12.5 ° and the included angle β2 as 14 °, the first grating projection device 21 projects grating images with three directions and equal included angle β1 to the central axis 131 of the camera 13, and similarly, the second grating projection device 31 projects grating images with three directions and equal included angle β2 to the central axis 131 of the camera 13, so that when the phase profile modulation measurement technique (PMP) is adopted to perform the height operation, two sets of parameters of α angle are provided, as shown in fig. 5, according to h=d·tan (α), two sets of data of height H can be obtained, thereby effectively improving the measurement accuracy. The device can realize nondestructive optical measurement of the object to be measured with the height of up to 10mm, effectively reduces the influence of shadows generated by the light projection of the object to be measured on the detection precision, and has the advantages of strong universality and high measurement precision.
The present invention is not limited to the above-mentioned embodiments, and any changes or substitutions that can be easily understood by those skilled in the art within the technical scope of the present invention are intended to be included in the scope of the present invention. Therefore, the protection scope of the present invention should be subject to the protection scope of the claims.

Claims (3)

1. The utility model provides a three-dimensional measuring device of three directional projection of two sets of each directions in height, its characterized in that: the device comprises an image capturing device, a first mounting block and a second mounting block which are sequentially arranged from top to bottom, wherein the first mounting block and the second mounting block are respectively fixedly connected with the image capturing device; the image capturing device comprises a T-shaped mounting seat, a placing block arranged on the T-shaped mounting seat and a camera which is arranged on the placing block and has a downward lens; the upper and lower openings of the first mounting block consist of seven side surfaces, and the cross section area of the first mounting block is gradually reduced from top to bottom; the upper and lower openings of the second mounting block consist of seven side surfaces, and the cross section area of the second mounting block is gradually reduced from top to bottom; three groups of first grating projection devices are respectively arranged on three side surfaces of the first installation block, and the projection light of each group of first grating projection devices is equal to an included angle beta 1 between the central axis of the camera; three groups of second grating projection devices are respectively arranged on three sides of the second installation block, and the projection light of each group of second grating projection devices is equal to an included angle beta 2 between the central axis of the camera; the included angle beta 1 is smaller than the included angle beta 2; the first grating projection device and the second grating projection device are arranged in a staggered mode, each of the first grating projection device and the second grating projection device comprises an electronic circuit, an optical engine and an LED lamp, the electronic circuit generates a grating with a programmable structure, the LED lamp is used as a light source, and the LED lamp is used for projecting the grating through the optical engine.
2. The three-dimensional measuring device for projection in each of the three directions of the high and low sets according to claim 1, wherein: the projection light rays of each group of first grating projection devices are parallel to the corresponding side surfaces of the first installation blocks; the projection light rays of each group of second grating projection devices are parallel to the corresponding side surfaces of the second installation blocks.
3. A three-dimensional measuring device for three-dimensional projection of a high and low group according to claim 1 or 2, wherein: the mounting heights of the three groups of first grating projection devices are consistent; and the mounting heights of the three groups of second grating projection devices are consistent.
CN201710627797.1A 2017-07-28 2017-07-28 Three-dimensional measuring device for projection in three directions of high and low groups Active CN107339952B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710627797.1A CN107339952B (en) 2017-07-28 2017-07-28 Three-dimensional measuring device for projection in three directions of high and low groups

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710627797.1A CN107339952B (en) 2017-07-28 2017-07-28 Three-dimensional measuring device for projection in three directions of high and low groups

Publications (2)

Publication Number Publication Date
CN107339952A CN107339952A (en) 2017-11-10
CN107339952B true CN107339952B (en) 2023-07-28

Family

ID=60216481

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710627797.1A Active CN107339952B (en) 2017-07-28 2017-07-28 Three-dimensional measuring device for projection in three directions of high and low groups

Country Status (1)

Country Link
CN (1) CN107339952B (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109531226A (en) * 2019-01-09 2019-03-29 苏州北斗星智能科技有限公司 A kind of compressor cutting centralized positioning detection device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101246228A (en) * 2008-02-01 2008-08-20 黑龙江科技学院 Phase shift optical grating in three-dimensional measuring system
CN101900534A (en) * 2009-05-27 2010-12-01 株式会社高永科技 3-d shape measurement equipment and method for measuring three-dimensional shape
CN103047944A (en) * 2013-01-22 2013-04-17 廖怀宝 Three-dimensional object measuring method and device
CN206095172U (en) * 2016-10-26 2017-04-12 厦门思泰克智能科技股份有限公司 Variable three how projected maintenance of grating space survey device

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4149853B2 (en) * 2003-06-02 2008-09-17 株式会社山武 3D measuring apparatus and 3D measuring method
JP2013174577A (en) * 2011-09-05 2013-09-05 Toyota Central R&D Labs Inc Surface shape measuring device
JP2013124938A (en) * 2011-12-15 2013-06-24 Ckd Corp Three-dimensional measuring device
JP2014106143A (en) * 2012-11-28 2014-06-09 Toyota Central R&D Labs Inc Surface shape measurement device and method
CN203132511U (en) * 2013-04-01 2013-08-14 廖怀宝 Measuring device applied for two-dimensional and three-dimensional contour identification methods of object
CN203443556U (en) * 2013-09-18 2014-02-19 廖怀宝 Device capable of realizing two dimensional measurement and three dimensional measurement of object
CN204043632U (en) * 2014-08-29 2014-12-24 西安新拓三维光测科技有限公司 A kind of structure based light multiple plate three-dimensional measurement instrument apparatus
CN206989909U (en) * 2017-07-28 2018-02-09 厦门思泰克智能科技股份有限公司 A kind of three-dimensional measuring apparatus of each three direction projection of two groups of height

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101246228A (en) * 2008-02-01 2008-08-20 黑龙江科技学院 Phase shift optical grating in three-dimensional measuring system
CN101900534A (en) * 2009-05-27 2010-12-01 株式会社高永科技 3-d shape measurement equipment and method for measuring three-dimensional shape
CN103047944A (en) * 2013-01-22 2013-04-17 廖怀宝 Three-dimensional object measuring method and device
CN206095172U (en) * 2016-10-26 2017-04-12 厦门思泰克智能科技股份有限公司 Variable three how projected maintenance of grating space survey device

Also Published As

Publication number Publication date
CN107339952A (en) 2017-11-10

Similar Documents

Publication Publication Date Title
KR102015606B1 (en) Multi-line laser array three-dimensional scanning system and multi-line laser array three-dimensional scanning method
US9945698B2 (en) Macro-micro composite grating ruler measuring system and measuring method using same comprising a macro-scale reading module, a micro-scale reading module and a measuring reference line
US10563977B2 (en) Three-dimensional measuring device
WO2017041418A1 (en) Multi-line array laser three-dimensional scanning system, and multi-line array laser three-dimensional scanning method
CN202304768U (en) Three-dimension measurement module and measurement instrument
JP5709009B2 (en) 3D measuring device
TWI414749B (en) Apparatus for measurement of surface profile
CN203443556U (en) Device capable of realizing two dimensional measurement and three dimensional measurement of object
CN202255299U (en) Solder paste thickness testing device
CN103162623A (en) Stereoscopic measuring system for double vertically mounted cameras and calibration method
CN102261896A (en) Method and system for measuring three-dimensional shape of object based on phase measurement
CN104380037A (en) Three-dimensional measurement apparatus, and three-dimensional measurement method
JP5957575B1 (en) 3D measuring device
KR20130042282A (en) Parallel manipulator with a system capable of three dimensional modeling of object and space
CN105953729A (en) Mobile image speed measuring instrument
KR101766468B1 (en) Method for 3D shape measuring using of Triple Frequency Pattern
CN107339952B (en) Three-dimensional measuring device for projection in three directions of high and low groups
JP2012527610A (en) 3D shape measurement method
CN106247944B (en) Code targets and vision coordinate measurement method based on Code targets
KR101757240B1 (en) Method for generating reference pattern of 3D shape measuring device
CN206989909U (en) A kind of three-dimensional measuring apparatus of each three direction projection of two groups of height
CN203479266U (en) Breadth-changeable stereoscopic vision measuring device
JP2012237613A (en) Shape measuring device and shape measuring method
CN102052907B (en) BGA (ball grid array) coplanarity measuring system based on projection Moire principle
JP6314210B2 (en) Component recognition system for component mounters

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant