CN107219229A - A kind of panel filtering dust method and device - Google Patents
A kind of panel filtering dust method and device Download PDFInfo
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- CN107219229A CN107219229A CN201710343204.9A CN201710343204A CN107219229A CN 107219229 A CN107219229 A CN 107219229A CN 201710343204 A CN201710343204 A CN 201710343204A CN 107219229 A CN107219229 A CN 107219229A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
- G01N2021/8864—Mapping zones of defects
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
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- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
Abstract
The invention discloses a kind of panel filtering dust method and device.Counter plate carries out defects detection, obtains the position data and characteristic of panel defect, obtains panel historic defects information；Filter operation is done to current detection panel upper surface dust；According to panel historic defects information, to current detection panel detection to defect dipoles whether be lower surface dust, dust is filtered；The defect dipoles data of current detection panel are updated and arrive panel historic defects information.Compared to prior art, high degree reduces the flase drop that panel lower surface dust is brought, and improves the performance of AOI detecting systems.
Description
Technical field
The present invention relates to image deflects field, and in particular to a kind of panel filtering dust method and device.
Background technology
Carry out AOI LCD defects detection during, it is important that a step be exactly dust filtering.It is wherein grey
The dust of dust of the dirt comprising LCD upper surface and lower surface, as shown in Figure 1.Because the presence of these dusts, so panel
Be imaged on dust position exist it is abnormal.This is abnormal very similar with real defect, if may result in without filtering
Substantial amounts of dust area is taken as defects detection and come out, and causes the generation of a large amount of flase drops, so as to influence the property of whole AOI system
Energy.Therefore when LCD defects detection is carried out, it is necessary to carry out the filtering of dust.
The dust of upper surface and the dust of lower surface are contained due to dust, so all can individually be shot in general scheme
Two images.
Lower surface dust image is shot first, is usually the position where lower surface due to the position of printing opacity difference, so
The detection of dim spot is carried out in lower surface filtering dust image, the dim spot (spot) is behind dust.Secondly upper surface filtering is shot
Image, due to opening above and below side light lamp and left and right side light lamp, the dust of upper surface can uniformly be illuminated.So in upper table
The detection that bright spot (spot) is carried out in face filtering image is that can obtain the position where surface dirt.
For black matrix liquid crystal display, due to completely light tight, lower surface dust is converted to so panel can be overturn
Surface dirt is filtered.
There is following Railway Project in existing technology：
1st, at present most LCD screen be all black matrix pattern, whole LCD is all light tight, so cannot be distinguished by whether
In the presence of surface dirt.But these lower surface dusts others detection pictures (Red, Green, Blue, L0, L48, L127,
L255 etc.) certain influence can be carried out to the imaging belt in the region.
Term is explained：
Black matrix liquid crystal display, for such liquid crystal display, when not applying voltage, liquid crystal is light tight, and black picture is presented；Apply voltage
When, liquid crystal printing opacity shows white picture.
Red, green, blue is referred to as three primary colours, is used by LCD luminescence displays, and red, green, blue adjustable range is respectively 0-255, it
Also known as RGB color pattern, three colors all 0 are exactly black, and three colors all 255 are exactly white, and monochromatic red, green, blue is 255
It is exactly：Red (Red255), green (Green255), blue (Blue255), respectively RGB set different values to arrange in pairs or groups out thousand changes
Ten thousand colors changed, L48：48 grey menus, RGB value is 48, RGB (48,48,48) picture.
2nd, most of lower surface dirt problems can be solved by the way of roll-over panels, but partial lower surface is attached
On safety glass surface, or be attached to inside lamp box, can not be also photographed even if upset.The upset of panel is carried out simultaneously
The cost of the complexity that whole mechanism can be caused abnormal, greatly increase equipment.
The content of the invention
It is an object of the invention under the pattern of black matrix liquid crystal display, it is proposed that the filter method and device of a kind of dust.
This method obtains the historical track information of each defect by tracking position and the feature of the defect that each piece of panel detection is arrived,
And defect historical track information is updated in real time.The filtering of the dust of front wall is carried out according to defect historical track information,
Modified result is carried out to the panel that history is judged by accident simultaneously, so as to effectively reduce the flase drop that dust is brought.
On the one hand, the present invention provides a kind of panel filtering dust method, and methods described comprises the following steps：
Step S1, counter plate carries out defects detection, obtains the position data and characteristic of panel defect, obtains panel and go through
History defect information；
Step S2, filter operation is done to current detection panel upper surface dust；According to panel historic defects information, to current
Whether the defect dipoles that detection panel is detected are lower surface dust, and dust is filtered；
Step S3, the defect dipoles data of current detection panel are updated and arrive panel historic defects information.
Further, in the step S2, according to panel historic defects information, the defect arrived to current detection panel detection
Determine whether lower surface dust, specifically include：
Step S21, judge described in the defect that detects whether be dim spot or blackening, if dim spot or blackening, enter
Enter S22, if not dim spot or blackening, be judged as non-dust；
Step S22, the number of pictures that the statistics defect detected occurs in front wall detection picture, if etc.
In 3 or more than 3, it is then to enter S23, is otherwise judged as non-dust；
Step S23, judges that the defect detected whether there is that position is close, picture is identical in historic defects information
Defect, be then enter S24, be otherwise judged as non-dust；
Step S24, judge described in the identical defect of the defect that detects and the close positions in historic defects information, picture exist
Whether contrast, area, the difference characteristic value of vpg connection are respectively less than threshold value, are then to enter step S25, are otherwise judged as non-ash
Dirt；
Step S25, is lower surface dust by flaw labeling.
Further, after step s 3, methods described also includes：Panel historic defects information is corrected, detailed process is：
Defective data by the use of N+M block panels judges the defect of n-th piece of panel as panel historic defects information, amendment
The defective data of n-th piece of panel in panel historic defects information, wherein N>=1,1<=n<=N, M>1.
On the other hand, the present invention provides a kind of panel dust filtering device, and described device includes：
Panel historic defects information acquisition unit, defects detection is carried out for counter plate, obtains the positional number of panel defect
According to and characteristic, obtain panel historic defects information；
Filtering dust unit, for doing filter operation to current detection panel upper surface dust；According to panel historic defects
Information, to current detection panel detection to defect dipoles whether be lower surface dust, dust is filtered；
Panel historic defects information updating unit, goes through for the defect dipoles data of current detection panel to be updated to panel
History defect information.
Further, the filtering dust unit includes：
Dust judging unit, the unit is used for：
Whether the defect detected described in judging is dim spot or blackening；
The number of pictures that the statistics defect detected occurs in front wall detection picture, if equal to 3 or
More than 3；
Judge that the defect detected whether there is that position is close, picture identical defect in historic defects information；
The identical defect of the defect that detects described in judging and the close positions in historic defects information, picture contrast,
Whether area, the difference characteristic value of vpg connection are respectively less than threshold value；
It is lower surface dust by flaw labeling.
Further, described device also includes：Panel historic defects Information revision unit, the unit is used for：Utilize N+M blocks
The defective data of panel is judged in the defect of n-th piece of panel, amendment panel historic defects information as panel historic defects information
N-th piece of panel defective data, wherein N>=1,1<=n<=N, M>1.
The present invention compared with prior art, with advantages below：
(1) modification of hardware configuration need not be carried out, extra cost will not be increased；
(2) exploitativeness is extremely strong, will not also cause the increase of whole detection time；
(3) both the amendment of result, pole can be also carried out to the panel that history is judged by accident to the filtering dust of front wall
Big degree reduces the flase drop that panel lower surface dust is brought, and improves the performance of AOI detecting systems.
Brief description of the drawings
Below in conjunction with drawings and Examples, the invention will be further described, in accompanying drawing：
Fig. 1 is the schematic diagram of upper surface dust and lower surface dust and defect in the panel；
Fig. 2 is the imaging effect contrast schematic diagram of dust and real defect in the picture；
Fig. 3 is panel filtering dust method schematic diagram of the present invention.
Embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that specific embodiment described herein is only to explain the present invention, not
For limiting the present invention.
Fig. 1 is the schematic diagram of upper surface dust and lower surface dust and defect in the panel；
Fig. 2 is the imaging effect contrast schematic diagram of dust and real defect in the picture；
Fig. 3 is panel filtering dust method schematic diagram of the present invention.Methods described comprises the following steps：
Step S1, counter plate carries out defects detection, obtains the position data and characteristic of panel defect, obtains panel and go through
History defect information；
Step S2, filter operation is done to current detection panel upper surface dust；According to panel historic defects information, to current
Whether the defect dipoles that detection panel is detected are lower surface dust, and dust is filtered；
Step S3, the defect dipoles data of current detection panel are updated and arrive panel historic defects information.
Further, in the step S2, according to panel historic defects information, the defect arrived to current detection panel detection
Determine whether lower surface dust, specifically include：
Step S21, judge described in the defect that detects whether be dim spot or blackening, if dim spot or blackening, enter
Enter S22, if not dim spot or blackening, be judged as non-dust；
Step S22, the number of pictures that the statistics defect detected occurs in front wall detection picture, if etc.
In 3 or more than 3, it is then to enter S23, is otherwise judged as non-dust；
Step S23, judges that the defect detected whether there is that position is close, picture is identical in historic defects information
Defect, be then enter S24, be otherwise judged as non-dust；
Step S24, judge described in the identical defect of the defect that detects and the close positions in historic defects information, picture exist
Whether contrast, area, the difference characteristic value of vpg connection are respectively less than threshold value, are then to enter step S25, are otherwise judged as non-ash
Dirt；
Step S25, is lower surface dust by flaw labeling.
Further, after step s 3, methods described also includes：Panel historic defects information is corrected, detailed process is：
Defective data by the use of N+M block panels judges the defect of n-th piece of panel as panel historic defects information, amendment
The defective data of n-th piece of panel in panel historic defects information, wherein N>=1,1<=n<=N, M>1.
Specific embodiment：
Panel filtering dust method：
Step 1：The defects detection of all pictures to be detected is carried out to the panel N that streamline enters.The picture wherein detected
Comprising and be not limited to R255, G255, B255, L0, L48, L127, L255 etc..The picture of these detections is increased according to demand
Or reduce.
Term R255, G255, B255, L0, L48, L127, L255's is explained as follows：
Red (R), green (G), blue (B) are three primary colours, and adjustable range is respectively 0-255, and respectively RGB sets different values can
With different pictures of arranging in pairs or groups out.
R255：Monochromatic red and red value is 255, RGB (255,0,0) picture；
G255：It is monochromatic green, and the value of green is 255, RGB (0,255,0) picture；
B255：It is monochromatic blue, and the value of blueness is 255, RGB (0,0,255) picture；
L0：Black, RGB value is all 0；
L48：48 grey menus, RGB value is 48, RGB (48,48,48) picture；L127, L255 similar L48, L127
For RGB (127,127,127) picture；L255 is RGB (255,255,255) picture.
Detection picture is divided into R255, G255, B255, L0, L48, L127, L255 etc..
Step 2:Defect to detection carries out the filtering of upper surface dust；Front wall N is judged according to historic defects information
In whether there is dust, and filtered, wherein, N>=1；
Wherein, according to panel historic defects information, it is to each defect dipoles that current detection panel lower surface is detected
The no detailed step for dust：
Step 21, whether the defect detected described in judging is dim spot or blackening, if dim spot or blackening, is entered
S22, if not dim spot or blackening, is judged as non-dust；
Step 22, the defect detected described in statistics detects the number of pictures occurred in picture in front wall, if etc.
In 3 or more than 3, i.e. each defect that statistics front wall is detected detects the picture occurred in picture in front wall
Quantity, if equal to 3 or more than 3, more specifically mean：When usual counter plate carries out defects detection, detection picture is
The pictures such as R255, G255, B255, L0, L48, L127, L255, statistic mixed-state to each defect these detection pictures in
The quantity of appearance, is further determined whether as dust according to quantity, is judged whether to be equal to 3 or more than 3, is then to enter S23,
Otherwise it is judged as non-dust；
Step 23, judge that the defect detected whether there is that position is close, picture is identical in historic defects information
Defect, be then enter S24, be otherwise judged as non-dust；
Step 24, the identical defect of the defect that detects described in judging and the close positions in historic defects information, picture exists
Whether contrast, area, the difference characteristic value of vpg connection are then to enter step S25, are otherwise judged as non-all less than threshold value
Dust；
Step 25, it is lower surface dust by flaw labeling.
Step 3：The renewal and preservation of historic defects information.
On the other hand, the present invention provides a kind of panel dust filtering device, and described device includes：
Panel historic defects information acquisition unit, defects detection is carried out for counter plate, obtains the positional number of panel defect
According to and characteristic, obtain panel historic defects information；
Filtering dust unit, for doing filter operation to current detection panel upper surface dust；According to panel historic defects
Information, to current detection panel detection to defect dipoles whether be lower surface dust, dust is filtered；
Panel historic defects information updating unit, goes through for the defect dipoles data of current detection panel to be updated to panel
History defect information.
Further, the filtering dust unit includes：
Dust judging unit, the unit is used for：
Whether the defect detected described in judging is dim spot or blackening；
The number of pictures that the statistics defect detected occurs in front wall detection picture, if equal to 3 or
More than 3；
Judge that the defect detected whether there is that position is close, picture identical defect in historic defects information；
The identical defect of the defect that detects described in judging and the close positions in historic defects information, picture contrast,
Whether area, the difference characteristic value of vpg connection are respectively less than threshold value；
It is lower surface dust by flaw labeling.
Further, described device also includes：Panel historic defects Information revision unit, the unit is used for：Utilize N+M blocks
The defective data of panel is judged in the defect of n-th piece of panel, amendment panel historic defects information as panel historic defects information
N-th piece of panel defective data, wherein N>=1,1<=n<=N, M>1.
Finally it should be noted that：The preferred embodiments of the present invention are the foregoing is only, are not intended to limit the invention,
Although the present invention is described in detail with reference to the foregoing embodiments, for those skilled in the art, it still may be used
To be modified to the technical scheme described in foregoing embodiments, or equivalent substitution is carried out to which part technical characteristic.
Within the spirit and principles of the invention, any modification, equivalent substitution improvement for being made etc., should be included in the guarantor of the present invention
Within the scope of shield.
Claims (6)
1. a kind of panel filtering dust method, it is characterised in that methods described comprises the following steps：
Step S1, counter plate carries out defects detection, obtains the position data and characteristic of panel defect, obtains panel history and lacks
Fall into information；
Step S2, filter operation is done to current detection panel upper surface dust；According to panel historic defects information, to current detection
Panel detection to defect dipoles whether be lower surface dust, dust is filtered；
Step S3, the defect dipoles data of current detection panel are updated and arrive panel historic defects information.
2. panel filtering dust method as claimed in claim 1, it is characterised in that in the step S2, according to panel history
Defect information, to current detection panel detection to defect dipoles whether be lower surface dust, specifically include：
Step S21, judges whether the defect detected is dim spot or blackening, if dim spot or blackening, entrance
S22, if not dim spot or blackening, is judged as non-dust；
Step S22, the number of pictures that the statistics defect detected occurs in front wall detection picture, if equal to 3
It is individual or more than 3, it is then to enter S23, is otherwise judged as non-dust；
Step S23, judges the defect detected in historic defects information with the presence or absence of position is close, picture identical is scarce
Fall into, be then to enter S24, be otherwise judged as non-dust；
Step S24, judges that the identical defect of the defect detected and the close positions in historic defects information, picture is being contrasted
Whether degree, area, the difference characteristic value of vpg connection are respectively less than threshold value, are then to enter step S25, are otherwise judged as non-dust；
Step S25, is lower surface dust by flaw labeling.
3. panel filtering dust method as claimed in claim 1, it is characterised in that after step s 3, methods described is also wrapped
Include：Panel historic defects information is corrected, detailed process is：
Defective data by the use of N+M block panels judges the defect of n-th piece of panel as panel historic defects information, corrects panel
The defective data of n-th piece of panel in historic defects information, wherein N>=1,1<=n<=N, M>1.
4. a kind of panel dust filtering device, it is characterised in that described device includes：
Panel historic defects information acquisition unit, for counter plate carry out defects detection, obtain panel defect position data and
Characteristic, obtains panel historic defects information；
Filtering dust unit, for doing filter operation to current detection panel upper surface dust；According to panel historic defects information,
To current detection panel detection to defect dipoles whether be lower surface dust, dust is filtered；
Panel historic defects information updating unit, lacks for the defect dipoles data of current detection panel to be updated to panel history
Fall into information.
5. panel dust filtering device as claimed in claim 4, it is characterised in that the filtering dust unit includes：
Dust judging unit, the unit is used for：
Whether the defect detected described in judging is dim spot or blackening；
The defect detected described in statistics detects the number of pictures occurred in picture in front wall, if equal to 3 or more than 3
It is individual；
Judge that the defect detected whether there is that position is close, picture identical defect in historic defects information；
The identical defect of the defect that detects described in judging and the close positions in historic defects information, picture contrast, area,
Whether the difference characteristic value of vpg connection is respectively less than threshold value；
It is lower surface dust by flaw labeling.
6. panel dust filtering device as claimed in claim 4, it is characterised in that described device also includes：Panel historic defects
Information revision unit, the unit is used for：Defective data by the use of N+M block panels judges n-th piece as panel historic defects information
The defective data of n-th piece of panel in the defect of panel, amendment panel historic defects information, wherein N>=1,1<=n<=N, M>
1。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710343204.9A CN107219229B (en) | 2017-05-16 | 2017-05-16 | Panel dust filtering method and device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710343204.9A CN107219229B (en) | 2017-05-16 | 2017-05-16 | Panel dust filtering method and device |
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| Publication Number | Publication Date |
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| CN107219229A true CN107219229A (en) | 2017-09-29 |
| CN107219229B CN107219229B (en) | 2020-07-03 |
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ID=59945071
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|---|---|---|---|
| CN201710343204.9A Active CN107219229B (en) | 2017-05-16 | 2017-05-16 | Panel dust filtering method and device |
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Cited By (5)
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|---|---|---|---|---|
| CN108109136A (en) * | 2017-12-12 | 2018-06-01 | 武汉精测电子集团股份有限公司 | Surface dirt fast filtering method and device in a kind of panel detection |
| CN108414535A (en) * | 2018-01-25 | 2018-08-17 | 武汉精测电子集团股份有限公司 | A kind of LCD white points Mura defects and Cell foreign matters quit a post and thus leave it vacant of swooning fall into method of discrimination |
| CN109900723A (en) * | 2019-04-26 | 2019-06-18 | 李配灯 | Glass surface defects detection method and device |
| CN110108713A (en) * | 2019-04-26 | 2019-08-09 | 武汉精立电子技术有限公司 | A kind of Superficial Foreign Body defect fast filtering method and system |
| CN110880171A (en) * | 2019-10-30 | 2020-03-13 | 联想(北京)有限公司 | Detection method of display device and electronic equipment |
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| CN105806850A (en) * | 2016-03-10 | 2016-07-27 | 惠州高视科技有限公司 | LCD (Liquid Crystal Display) glass defect detection device and LCD (Liquid Crystal Display) glass defect detection method |
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| CN108109136A (en) * | 2017-12-12 | 2018-06-01 | 武汉精测电子集团股份有限公司 | Surface dirt fast filtering method and device in a kind of panel detection |
| CN108414535A (en) * | 2018-01-25 | 2018-08-17 | 武汉精测电子集团股份有限公司 | A kind of LCD white points Mura defects and Cell foreign matters quit a post and thus leave it vacant of swooning fall into method of discrimination |
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| CN110108713A (en) * | 2019-04-26 | 2019-08-09 | 武汉精立电子技术有限公司 | A kind of Superficial Foreign Body defect fast filtering method and system |
| CN110880171A (en) * | 2019-10-30 | 2020-03-13 | 联想(北京)有限公司 | Detection method of display device and electronic equipment |
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| Publication number | Publication date |
|---|---|
| CN107219229B (en) | 2020-07-03 |
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|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant after: Wuhan fine test electronics group Limited by Share Ltd Address before: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant before: Wuhan Jingce Electronic Technology Co., Ltd. |
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| CB02 | Change of applicant information | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |