CN107084787A - A kind of temperature correction of AOTF imaging spectrometers spectral calibration - Google Patents
A kind of temperature correction of AOTF imaging spectrometers spectral calibration Download PDFInfo
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Abstract
A kind of temperature correction of AOTF imaging spectrometers spectral calibration is disclosed, including：S1, linear light sorurce selected according to acousto-optic tunable filter AOTF service band scope, wherein, the wavelength of the linear light sorurce is located in the range of AOTF service band；S2, for each calibration temperature, obtain ultrasonic drive frequency corresponding with the calibration temperature during spectral calibration；Tuner parameters in S3, the wavelength based on linear light sorurce, each calibration temperature and ultrasonic drive frequency corresponding with each calibration temperature, fitting tuning curve, obtain the tuning curve of temperature adjustmemt.Compared with prior art, the present invention can carry out temperature adjustmemt to transmission spectra the calibration results, it can be reduced because of the spectral calibration error that variation of ambient temperature is introduced by the way that AOTF temperature is introduced into the calibration results spectral tuning curve, reduce outfield measurement error, improve imaging spectrometer spectral measurement precision.
Description
Technical Field
The invention relates to the technical field of tests and tests, in particular to a temperature correction method for AOTF imaging spectrometer spectral calibration.
Background
The background of the related art of the present invention will be described below, but the description does not necessarily constitute the prior art of the present invention.
Quantitative remote sensing is a process of realizing quantitative inversion of optical radiation data collected by a remote sensor and establishing a corresponding numerical model for measurement, calculation and identification. The development of the imaging spectrometer lays a technical foundation for establishing a quantitative remote sensing theory, especially, the hyperspectral remote sensing comprehensively utilizes the spatial resolution and the spectral resolution, not only can obtain a target image of each narrow spectral band, but also can obtain a spectral curve of each pixel on the image, and a data cube of information is formed by obtaining the image information and the spectral information of the target. The AOTF imaging spectrometer is an imaging spectrometer using an acousto-optic tunable filter (AOTF) as a light splitting element, however, it is found in experiments that the spectral characteristics of the AOTF are affected by the external temperature, thereby causing errors in spectral measurement.
Disclosure of Invention
Based on the problems in the prior art, the invention provides a temperature correction method for the spectral calibration of the AOTF imaging spectrometer, which can obtain the change rule that the AOTF spectral characteristics are influenced by the environmental temperature, and effectively perform temperature correction on the traditional spectral calibration result.
The invention relates to a temperature correction method for spectral calibration of an AOTF imaging spectrometer, which is characterized by comprising the following steps:
s1, selecting a linear light source according to the working waveband range of the AOTF, wherein the wavelength of the linear light source is within the working waveband range of the AOTF;
s2, aiming at each calibration temperature, acquiring ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process;
s3, fitting tuning parameters in a tuning curve based on the wavelength of the linear light source, each calibration temperature and the ultrasonic driving frequency corresponding to each calibration temperature to obtain a temperature-corrected tuning curve;
wherein the tuning curve is:
in the formula, lambda is the wavelength of a linear light source and the wavelength of monochromatic light diffracted by the AOTF crystal; f is the ultrasonic driving frequency; a is1、a2、b、γ1…γmIs a tuning parameter in the tuning curve; m is the number of error terms of the tuning curve.
Preferably, the acquiring of the ultrasonic driving frequency corresponding to the calibration temperature in the spectral calibration process includes:
in the spectral calibration process, scanning is carried out by changing scanning frequency at intervals of n MHz to obtain a scanning image corresponding to each scanning frequency;
determining a linear relationship between the scanning frequency and the DL according to the scanning image gray value DL corresponding to each scanning frequency, and the maximum value DL of the DL in the scanning frequency rangemax；
By DLmaxAnd the corresponding scanning frequency is used as the ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process.
Preferably, the scan image gray value DL corresponding to each scan frequency is determined as follows:
for each scanning frequency, taking the gray value DL of the scanning image obtained under the scanning frequency as the gray value DL of the scanning image corresponding to the scanning frequency; or,
for each scanning frequency, changing the scanning frequency at intervals of alpha n MHz to perform fine scanning to obtain a plurality of fine scanning images; taking the gray average value of a plurality of fine scanning images corresponding to each scanning frequency as DL corresponding to the scanning frequency; wherein alpha is more than 0 and less than 0.1.
Preferably, the linear relationship between the scanning frequency and the DL is:
in the formula, DLi(fi) To and the scanning frequency fiCorresponding gray values of the scanned image; f. ofiThe scanning frequency of the ith scanning; a. thei、Bi、CiAnd DiAs fitting parameters, fi、BiAnd CiThe units of (a) are the same.
Preferably, the temperature difference between any two calibration temperatures is no greater than 100 ℃.
Preferably, the number of error terms of the tuning curve is 1.
According to the method, the AOTF temperature is introduced into the spectrum tuning curve of the calibration result, so that the spectrum calibration error introduced by the change of the environmental temperature can be reduced, the external field measurement error is effectively reduced, and the spectrum measurement precision of the imaging spectrometer is improved.
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The features and advantages of the present invention will become more readily appreciated from the detailed description section provided below with reference to the drawings, in which:
FIG. 1 is a schematic diagram of the optical splitting principle of an AOTF crystal.
Detailed Description
Exemplary embodiments of the present invention will be described in detail below with reference to the accompanying drawings. The description of the exemplary embodiments is for purposes of illustration only and is not intended to limit the invention, its application, or uses.
At present, an imaging spectrometer based on an acousto-optic tunable filter (AOTF) is widely applied to the fields of spectral measurement, hyperspectral remote sensing and the like, however, in practice, it is found that the spectral position of the AOTF spectrometer is shifted due to the change of environmental temperature in external field measurement, and spectral curve measurement errors are caused. According to the method, the spectrum tuning curve is obtained by introducing the temperature of the AOTF spectrometer into the calibration result, so that the spectrum calibration error caused by the change of the environmental temperature can be reduced, the external field measurement error is effectively reduced, and the spectrum measurement precision of the imaging spectrometer is improved.
The AOTF is an electric tuning filter made based on the anomalous Bragg diffraction effect of anisotropic crystals under the acousto-optic interaction, and can diffract incident polychromatic light according to the difference of the frequency of radio-frequency signals applied to the AOTF so as to obtain monochromatic light with specific wavelength. Acousto-optic interaction refers to the phenomenon that light waves are diffracted or scattered by an ultrasonic field when propagating in a medium. Since the acoustic wave is an elastic wave, the phenomenon that the acoustic wave propagates in the medium to generate elastic stress or strain is called as an elasto-optical effect, and the refractive index of the medium is changed due to the elastic deformation of the medium. When light waves propagate in a medium, a diffraction phenomenon occurs, and the intensity, frequency, direction and the like of diffracted light change along with the change of an ultrasonic field.
Fig. 1 shows a schematic diagram of the principle of light splitting of an AOTF crystal, in which 1 is the AOTF crystal, 2 is an ultrasonic traveling wave field, 3 is a transducer, 4 is an adjustable radio frequency source, 5 is a sound absorber, 6 is incident polychromatic light, 7 and 8 are diffracted orthogonal monochromatic light, 9 is zero-order light, and 10 is a light barrier. When an excitation radio frequency electric signal with a certain frequency is applied to the transducer 3, the transducer 3 can convert the excitation radio frequency electric signal into an ultrasonic signal with a corresponding frequency and couple the ultrasonic signal into the AOTF crystal 1, the refractive index of the AOTF crystal 1 is periodically changed along with the ultrasonic signal, so that a phase grating is formed in the AOTF crystal 1, and the grating constant is the wavelength of the ultrasonic wave. For a certain acousto-optic medium and a certain propagation direction (i.e. ultrasonic driving frequency f, V, incident light direction angle theta)iConstant, a constant), the spectral tuning relationship of the AOTF spectrometer can be represented by the following equation:
wherein Δ n ═ ni-ndI, is the birefringence difference of the AOTF crystal, niIs the refractive index of incident light, ndIs the refractive index of the incident light; thetaiIs the incident light direction angle, i.e. the included angle between the incident light and the ultrasonic wave surface, and the unit is: (iv) DEG; v is the sound velocity of the ultrasound wave in the crystal in units of: m/s; λ is the wavelength of diffracted light.
When light passes through the AOTF crystal, abnormal Bragg diffraction occurs, and wave vector of incident lightWave vector of diffracted lightAnd the vector of sound wavesThe vector triangle closing condition is strictly matched:the modulus of each vector is:
in the formula, niIs a function of the angle between the incident light and the ultrasonic wave surface, thetaiIs the angle theta between the diffracted light and the ultrasonic wave surfacedAs a function of (c).
Generally, in the case that the AOTF is integrated in an imaging spectrometer system, the angle of incident light entering the AOTF crystal after passing through the pre-optical system is not changed, and the sound velocity in the crystal is also constant. Therefore, under the condition of neglecting the change of birefringence, the wavelength lambda of monochromatic light diffracted and emitted by the AOTF and the frequency f of radio frequency signals for excitation have a one-to-one correspondence relationship, the wavelength of output light can be changed rapidly and randomly only by tuning of electric signals, and a novel optical filter device which is easy to realize program control is provided for a spectrum analyzer.
The invention relates to a temperature correction method for spectral calibration of an AOTF imaging spectrometer, which comprises the following steps:
s1, selecting a linear light source according to the working waveband range of the AOTF, wherein the wavelength of the linear light source is within the working waveband range of the AOTF;
s2, aiming at each calibration temperature, acquiring ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process;
s3, fitting tuning parameters in a tuning curve based on the wavelength of the linear light source, each calibration temperature and the ultrasonic driving frequency corresponding to each calibration temperature to obtain a temperature-corrected tuning curve;
wherein the tuning curve is:
in the formula, lambda is the wavelength of a linear light source and the wavelength of monochromatic light diffracted by the AOTF crystal; f is the ultrasonic driving frequency; gamma ray-1、γ0、γ1…γmIs a tuning parameter in the tuning curve; m is the number of error terms of the tuning curve.
The temperature correction method analyzes the spectral characteristics of the AOTF spectrometer from the angle of vector mismatch, calculates the accurate spectral response function form of the AOTF spectrometer, analyzes the parameters which can be changed due to the influence of environmental temperature, and provides the temperature correction method, thereby effectively improving the spectral calibration precision. The reliability of the cubic information of the data acquired by the remote sensing detection of the imaging spectrometer can be accurately analyzed, and experimental and theoretical support is provided for accurate acquisition of the surface feature spectral curve and accurate analysis of spectral characteristics.
As can be seen from the above equation 1, after obtaining a plurality of sets of calibration data (i.e., the wavelength, the calibration temperature, and the ultrasonic driving frequency corresponding to each calibration temperature), the tuning parameters in the tuning curve can be fitted. The number of sets of calibration data may be any value, and when the number of sets of calibration data is small, the tuning parameters in the tuning curve may be fitted only according to the calibration data; when the number of groups of calibration data is large, each group of calibration data can be analyzed according to the experimental design principle, data with large errors are abandoned, and then the remaining effective calibration data are used for fitting the tuning parameters in the tuning curve. The first term in the formula 1 is a tuning curve function term calculated theoretically, the following m +1 term is an error term in the form of taylor expansion series, the larger the value of m is, the higher the accuracy of the fitted tuning curve is, and the more the number of calibration data sets is required for fitting the tuning parameters in the tuning curve.
Theoretical calculations show that the variation of birefringence Δ n of AOTF with temperature exhibits a quasi-linear relationship. Let a be r-1×Δn,b＝r0，c＝r1Since Δ n varies linearly with temperature, a is a parameter varying linearly with ambient temperature, where a is equal to a1×T+a2The form of the tuning curve that is finally adopted can therefore be:
in the formula, lambda is the wavelength of a linear light source and the wavelength of monochromatic light diffracted by the AOTF crystal; f is the ultrasonic driving frequency; a is1、a2、b、γ1…γmIs a tuning parameter in the tuning curve; m is the number of error terms of the tuning curve.
In the AOTF spectrum calibration experiment, m is usually equal to 1, namely, an error term is intercepted to a primary term. The error term number of the tuning curve is set to be 1, so that the accuracy of the obtained tuning curve is not reduced, the testing steps can be greatly simplified, the calculated amount of fitting tuning parameters is reduced, and the efficiency of temperature correction by using the method is improved.
The birefringence Δ n of AOTF exhibits a quasi-linear relationship with temperature. Generally, the variation of birefringence with temperature is almost linear over a relatively small temperature range, e.g., less than 100 ℃. Therefore, to maximize the accuracy of the tuning curve, in some embodiments, the temperature difference between any two calibration temperatures may be no greater than 100 ℃.
As described above, after obtaining several sets of calibration data (i.e., wavelength, calibration temperature, and ultrasonic drive frequency corresponding to each calibration temperature), the tuning parameters in the tuning curve can be fitted. It should be understood by those skilled in the art that the method of the present invention may be used for temperature correction as long as several sets of calibration data are obtained, and the manner of obtaining the calibration data does not affect the implementation of the technical solution of the present invention. The skilled person can select a suitable manner to obtain the calibration data according to actual needs, for example, the wavelength can be determined according to the wavelength of the linear light source, and the calibration temperature can be measured in the calibration process.
The diffraction efficiency T of the AOTF varies with wavelength and drive frequency, and its basic functional form is sinc2Function (define sinc)2(x)＝(sin(πx)/(πx))2) Called transfer function of the AOTF spectroscopic system, the functional form is:
wherein T is diffraction efficiency of the AOTF crystal and has a unit of:%, α is a function peak value without a unit when momentum is matched, L is an acousto-optic interaction constant of the AOTF crystal and has a unit of nm, and delta k is acousto-optic vector mismatch and has a unit of nm-1. Under the condition that the wavelength is not changed, the delta k is linearly changed along with the drive frequency f of the AOTF, and the size of the diffraction efficiency T is related to the output gray value of an image obtained when the drive frequency is scanned and output in a frequency range corresponding to the wavelength. Thus, in some preferred embodiments, the ultrasonic drive frequency may obtain the acquisition light as followsThe ultrasonic drive frequency corresponding to the calibration temperature in the spectrum calibration process comprises:
in the spectral calibration process, scanning is carried out by changing scanning frequency at intervals of n MHz to obtain a scanning image corresponding to each scanning frequency;
determining a linear relationship between the scanning frequency and the DL according to the scanning image gray value DL corresponding to each scanning frequency, and the maximum value DL of the DL in the scanning frequency rangemax；
By DLmaxAnd the corresponding scanning frequency is used as the ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process.
The size of the scan interval n can be chosen based on the operating frequency range of the AOTF spectrometer and the required calibration accuracy, e.g., 0 < n < 1.
In order to improve the accuracy of the scanning result as much as possible, the gray level value DL of the scanned image corresponding to each scanning frequency may be further determined as follows:
for each scanning frequency, taking the gray value DL of the scanning image obtained under the scanning frequency as the gray value DL of the scanning image corresponding to the scanning frequency; for example, when the scanning frequency n is 20MHz, the gray-scale value DL of the obtained scanning image is DL20Then use DL20As a scanned image gray value DL corresponding to a scanning frequency of 20 MHz;
or,
for each scanning frequency, changing the scanning frequency at intervals of alpha n MHz to perform fine scanning to obtain a plurality of fine scanning images; taking the gray average value of a plurality of fine scanning images corresponding to each scanning frequency as DL corresponding to the scanning frequency; wherein alpha is more than 0 and less than 0.1. The larger the resolution of the AOTF imaging spectrometer, the smaller the value of alpha can be properly reduced. The "several sheets" herein may be determined according to actual conditions, such as two or more sheets. For example, when the scanning frequency n is 20MHz, the scanning frequency is changed at intervals of 0.5MHz to perform fine scanning, and 10 fine scan images corresponding to 10 of 17.5MHz, 18.0MHz, 18.5MHz, 19.0MHz, 19.5MHz, 20MHz, 20.5MHz, 21.0MHz, 21.5MHz, and 22.0MHz are obtained, the grayscale average value of the 10 fine scan images is used as the scan image grayscale value DL corresponding to the scanning frequency 20 MHz.
In some embodiments, the linear relationship between the scanning frequency and the DL is:
in the formula, DLi(fi) To and the scanning frequency fiCorresponding gray values of the scanned image; f. ofiThe scanning frequency of the ith scanning; a. thei、Bi、CiAnd DiAs fitting parameters, fi、BiAnd CiThe units of (a) are the same. After several sets of scanning frequencies and DL data are obtained, a can be fitted according to equation 2 abovei、Bi、CiAnd DiAnd obtaining the linear relation between the scanning frequency and the DL. When spectral calibration is performed for each calibration temperature in step S2, the maximum value DL in the scanning frequency range can be found according to the above-mentioned linear relationship between the scanning frequency and DLmax(ii) a By DLmaxThe corresponding scanning frequency is used as the ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process.
Compared with the prior art, the method can correct the temperature of the traditional spectrum calibration result, and can reduce the spectrum calibration error caused by the change of the environmental temperature, reduce the external field measurement error and improve the spectrum measurement precision of the imaging spectrometer by introducing the AOTF temperature into the calibration result spectrum tuning curve.
While the present invention has been described with reference to exemplary embodiments, it is to be understood that the invention is not limited to the specific embodiments described and illustrated in detail herein, and that various changes may be made therein by those skilled in the art without departing from the scope of the invention as defined by the appended claims.
Claims (6)
1. A temperature correction method for AOTF imaging spectrometer spectral calibration is characterized by comprising the following steps:
s1, selecting a linear light source according to the working waveband range of the AOTF, wherein the wavelength of the linear light source is within the working waveband range of the AOTF;
s2, aiming at each calibration temperature, acquiring ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process;
s3, fitting tuning parameters in a tuning curve based on the wavelength of the linear light source, each calibration temperature and the ultrasonic driving frequency corresponding to each calibration temperature to obtain a temperature-corrected tuning curve;
wherein the tuning curve is:
in the formula, lambda is the wavelength of a linear light source and the wavelength of monochromatic light diffracted by the AOTF crystal; f is the ultrasonic driving frequency; a is1、a2、b、γ1…γmIs a tuning parameter in the tuning curve; m is the number of error terms of the tuning curve.
2. The temperature correction method of claim 1, wherein obtaining an ultrasonic drive frequency corresponding to the calibration temperature during spectral calibration comprises:
in the spectral calibration process, scanning is carried out by changing scanning frequency at intervals of n MHz to obtain a scanning image corresponding to each scanning frequency;
determining a linear relationship between the scanning frequency and the DL according to the scanning image gray value DL corresponding to each scanning frequency, and the maximum value DL of the DL in the scanning frequency rangemax；
By DLmaxAnd the corresponding scanning frequency is used as the ultrasonic driving frequency corresponding to the calibration temperature in the spectrum calibration process.
3. The temperature correction method as claimed in claim 2, wherein the scan image gray value DL corresponding to each scan frequency is determined as follows:
for each scanning frequency, taking the gray value DL of the scanning image obtained under the scanning frequency as the gray value DL of the scanning image corresponding to the scanning frequency; or,
for each scanning frequency, changing the scanning frequency at intervals of alpha n MHz to perform fine scanning to obtain a plurality of fine scanning images; taking the gray average value of a plurality of fine scanning images corresponding to each scanning frequency as DL corresponding to the scanning frequency; wherein alpha is more than 0 and less than 0.1.
4. The method of claim 2, wherein the linear relationship between the scanning frequency and the DL is:
in the formula, DLi(fi) To and the scanning frequency fiCorresponding gray values of the scanned image; f. ofiThe scanning frequency of the ith scanning; a. thei、Bi、CiAnd DiAs fitting parameters, fi、BiAnd CiThe units of (a) are the same.
5. The temperature correction method of claim 1, wherein the temperature difference between any two scaled temperatures is no greater than 100 ℃.
6. The temperature correction method of claim 1, wherein the tuning curve has an error term of 1.
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