CN107064566A - A kind of method for protecting integrated circuit testing connecting line - Google Patents
A kind of method for protecting integrated circuit testing connecting line Download PDFInfo
- Publication number
- CN107064566A CN107064566A CN201710438220.6A CN201710438220A CN107064566A CN 107064566 A CN107064566 A CN 107064566A CN 201710438220 A CN201710438220 A CN 201710438220A CN 107064566 A CN107064566 A CN 107064566A
- Authority
- CN
- China
- Prior art keywords
- connecting line
- integrated circuit
- protection device
- circuit testing
- protected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D21/00—Measuring or testing not otherwise provided for
- G01D21/02—Measuring two or more variables by means not covered by a single other subclass
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention discloses a kind of method for protecting integrated circuit testing connecting line, a protection device is installed on the connecting line of ATE, afterwards the protection device connection automatic prober platform；The protection device is equipped with Temperature Humidity Sensor, and the protection device monitors humiture, and when humiture is exceeded, sensor, which is sent, to pipe, and the protection device detection connecting line is attached thereto whether equipment connects.The method for the protection integrated circuit testing connecting line that the present invention is provided, connecting line can be effectively protected by this invention, find that the humiture of surrounding environment is abnormal in time, rapid detection saves many troubleshooting times to impaired trouble point.
Description
Technical field
The present invention relates to a kind of method for protecting integrated circuit testing connecting line.
Background technology
The technical scheme that the present invention is provided, it is therefore intended that protection ATE and automatic test probe station or automatic point
Select machine (manipulator) connecting line.
In test factory, some ATEs are connected by connecting line with automatic test probe station or automatic fraction collector
Connect.At present such connecting line due to it is exposed for a long time be suspended on ATE and automatic test probe station or manipulator it
Between, because long-time is hung, stretched by gravity itself, the influence of ambient temperature and humidity, cause connecting line to be damaged, cause integrated
Circuit test results are abnormal so that operating personnel waste many troubleshooting times.In addition, detection connecting line is damaged, it is usually used to connect
Touch detection device carrys out fault inspecting.
The technical scheme that the present invention is provided, is protected connecting line by protective cover, extends the service life of connecting line,
If connecting line breaks down, staff can be made to be quickly found out trouble point.
The content of the invention
The present invention is to provide a kind of protection integrated circuit testing company to solve the technical scheme that above-mentioned technical problem is used
The method of wiring, wherein, concrete technical scheme is：
One protection device is installed on the connecting line of ATE, afterwards the protection device connection automatic prober
Platform.
The method of above-mentioned protection integrated circuit testing connecting line, wherein：The protection device includes temperature sensor.
The method of above-mentioned protection integrated circuit testing connecting line, wherein：The protection device includes humidity sensor.
The method of above-mentioned protection integrated circuit testing connecting line, wherein：The humidity sensor temperature covers disposed on sensor
Put buzzer.
The method of above-mentioned protection integrated circuit testing connecting line, wherein：When humiture exceeds established standardses, humidity is passed
Buzzer on sensor temperature sensor, which is sent, to pipe.
The method of above-mentioned protection integrated circuit testing connecting line, wherein：The protection device detects connecting line phase therewith
Whether attached device connects.
The method of above-mentioned protection integrated circuit testing connecting line, wherein：The protection device is equipped with non-contact sensor
Whether device, monitoring connecting line breaks.
The present invention has the advantages that relative to prior art：
Connecting line can effectively be protected by this invention, find that the humiture of surrounding environment is abnormal in time, rapid detection to by
The trouble point of damage, saves many troubleshooting times.
Brief description of the drawings
Fig. 1 is the schematic diagram of protection integrated circuit testing connecting line.
In figure：
The automatic prober platform of 1 ATE, 2 connecting line, 3 protection device 4
Embodiment
Integrated circuit：It is a kind of microelectronic device or part.Using certain technique, the crystalline substance needed for a circuit
The elements such as body pipe, resistance, electric capacity and inductance and wiring interconnection together, are produced on a fritter or a few fritter semiconductor wafers or medium
On substrate, it is then encapsulated in a shell, as the microstructure with required circuit function.
Integrated circuit testing：Automatic test probe station, automatic fraction collector (manipulator), ATE can be utilized
(ATE) the various tests of integrated circuit and other related equipments, are engaged in.
Probe card：Interface in wafer sort between chip under test and test machine.
ATE (ATE)：The equipment of automatic detection chip quality.
The invention provides a kind of method for protecting integrated circuit testing connecting line, on the connecting line of ATE
One protection device is installed, afterwards the protection device connection automatic prober platform；
The protection device is equipped with Temperature Humidity Sensor, and the protection device monitors humiture, when humiture is exceeded, passes
Sensor, which is sent, to pipe, and the protection device detection connecting line is attached thereto whether equipment connects.The protection device connects equipped with non-
Whether touch sensor, monitoring connecting line breaks.
Although the present invention is disclosed as above with preferred embodiment, so it is not limited to the present invention, any this area skill
Art personnel, without departing from the spirit and scope of the present invention, when a little modification can be made and perfect, therefore the protection model of the present invention
Enclose when by being defined that claims are defined.
Claims (7)
1. a kind of method for protecting integrated circuit testing connecting line, it is characterised in that：Pacify on the connecting line of ATE
A protection device is filled, afterwards the protection device connection automatic prober platform.
2. the method for integrated circuit testing connecting line is protected as claimed in claim 1, it is characterised in that：The protection device bag
Include temperature sensor.
3. the method for integrated circuit testing connecting line is protected as claimed in claim 2, it is characterised in that：The protection device bag
Include humidity sensor.
4. the method for integrated circuit testing connecting line is protected as claimed in claim 3, it is characterised in that：The humidity sensor
Buzzer is set on temperature sensor.
5. the method for integrated circuit testing connecting line is protected as claimed in claim 4, it is characterised in that：Set when humiture exceeds
Calibration is punctual, and the buzzer on humidity sensor temperature sensor, which is sent, to pipe.
6. the method for integrated circuit testing connecting line is protected as claimed in claim 5, it is characterised in that：The protection device inspection
Survey connecting line and be attached thereto whether equipment connects.
7. the method for integrated circuit testing connecting line is protected as claimed in claim 6, it is characterised in that：The protection device dress
There is noncontacting proximity sensor, whether monitoring connecting line breaks.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710438220.6A CN107064566A (en) | 2017-06-12 | 2017-06-12 | A kind of method for protecting integrated circuit testing connecting line |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710438220.6A CN107064566A (en) | 2017-06-12 | 2017-06-12 | A kind of method for protecting integrated circuit testing connecting line |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107064566A true CN107064566A (en) | 2017-08-18 |
Family
ID=59593950
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710438220.6A Pending CN107064566A (en) | 2017-06-12 | 2017-06-12 | A kind of method for protecting integrated circuit testing connecting line |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107064566A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110763978A (en) * | 2019-10-15 | 2020-02-07 | 四川豪威尔信息科技有限公司 | Method for protecting integrated circuit test connecting line |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1136282A (en) * | 1994-10-03 | 1996-11-20 | 株式会社中庸 | Conductor cord disconnection checker for low-voltage output low-frequency cosmetic device |
| CN1280410A (en) * | 2000-08-02 | 2001-01-17 | 方炳钧 | Power supply line and equipment overheat detecting protector |
| CN201382984Y (en) * | 2009-03-23 | 2010-01-13 | 李戴玉 | Conducting-wire thread break detector |
| CN103261897A (en) * | 2010-08-10 | 2013-08-21 | 库柏技术公司 | Apparatus and method for mounting an overhead monitoring device |
| CN204271384U (en) * | 2015-01-06 | 2015-04-15 | 金陵科技学院 | A kind of disaster scenarios it can the smart jack of auto-breaking |
| CN104764973A (en) * | 2015-04-03 | 2015-07-08 | 苏州经贸职业技术学院 | Induction type wiring harness detection system and method |
| CN204631147U (en) * | 2015-04-13 | 2015-09-09 | 建安恒业（天津）电气设备技术有限公司 | The aging on-line diagnosing apparatus of anti-cable |
| CN205039533U (en) * | 2015-10-15 | 2016-02-17 | 云南海力特电气自动化有限公司 | Line protection measurement and control device |
| CN205193521U (en) * | 2015-12-11 | 2016-04-27 | 郑州湛思电子科技有限公司 | Electric circuit protection device |
| CN106093694A (en) * | 2016-06-08 | 2016-11-09 | 北京小米移动软件有限公司 | Connecting line, the method and device of connection status of detection connecting line |
-
2017
- 2017-06-12 CN CN201710438220.6A patent/CN107064566A/en active Pending
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1136282A (en) * | 1994-10-03 | 1996-11-20 | 株式会社中庸 | Conductor cord disconnection checker for low-voltage output low-frequency cosmetic device |
| CN1280410A (en) * | 2000-08-02 | 2001-01-17 | 方炳钧 | Power supply line and equipment overheat detecting protector |
| CN201382984Y (en) * | 2009-03-23 | 2010-01-13 | 李戴玉 | Conducting-wire thread break detector |
| CN103261897A (en) * | 2010-08-10 | 2013-08-21 | 库柏技术公司 | Apparatus and method for mounting an overhead monitoring device |
| CN204271384U (en) * | 2015-01-06 | 2015-04-15 | 金陵科技学院 | A kind of disaster scenarios it can the smart jack of auto-breaking |
| CN104764973A (en) * | 2015-04-03 | 2015-07-08 | 苏州经贸职业技术学院 | Induction type wiring harness detection system and method |
| CN204631147U (en) * | 2015-04-13 | 2015-09-09 | 建安恒业（天津）电气设备技术有限公司 | The aging on-line diagnosing apparatus of anti-cable |
| CN205039533U (en) * | 2015-10-15 | 2016-02-17 | 云南海力特电气自动化有限公司 | Line protection measurement and control device |
| CN205193521U (en) * | 2015-12-11 | 2016-04-27 | 郑州湛思电子科技有限公司 | Electric circuit protection device |
| CN106093694A (en) * | 2016-06-08 | 2016-11-09 | 北京小米移动软件有限公司 | Connecting line, the method and device of connection status of detection connecting line |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110763978A (en) * | 2019-10-15 | 2020-02-07 | 四川豪威尔信息科技有限公司 | Method for protecting integrated circuit test connecting line |
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| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170818 |