CN107015527A - Monitoring system - Google Patents

Monitoring system Download PDF

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Publication number
CN107015527A
CN107015527A CN201610292461.XA CN201610292461A CN107015527A CN 107015527 A CN107015527 A CN 107015527A CN 201610292461 A CN201610292461 A CN 201610292461A CN 107015527 A CN107015527 A CN 107015527A
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CN
China
Prior art keywords
range unit
monitoring system
instrument
tool holder
unit
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610292461.XA
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Chinese (zh)
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CN107015527B (en
Inventor
林义隆
林雨德
简宏文
王智勇
柯孟翰
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Pegatron Corp
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Pegatron Corp
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Priority claimed from US15/009,800 external-priority patent/US9645570B2/en
Application filed by Pegatron Corp filed Critical Pegatron Corp
Publication of CN107015527A publication Critical patent/CN107015527A/en
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Publication of CN107015527B publication Critical patent/CN107015527B/en
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    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00Programme-control systems
    • G05B19/02Programme-control systems electric
    • G05B19/18Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
    • G05B19/406Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by monitoring or safety
    • G05B19/4065Monitoring tool breakage, life or condition
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00Program-control systems
    • G05B2219/30Nc systems
    • G05B2219/32Operator till task planning
    • G05B2219/32221Correlation between defect and measured parameters to find origin of defect

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  • Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

A kind of monitoring system can be used to monitor an at least board.Board has a portable lamp.Monitoring system includes a range unit, a defect dipoles unit and a lamp controller.Range unit is to be used to produce a signal according to the distance between instrument for range unit and board.Defect dipoles unit is electrically connected with range unit, the defect to judge this instrument according to this signal.Lamp controller is electrically connected with defect dipoles unit, to the defect judged according to defect dipoles unit, changes the optical characteristics of a radiating light of portable lamp.Above-mentioned design may help to judge whether the instrument of board has defect, and know in time for manager.

Description

Monitoring system
Technical field
The present invention is to be used for monitoring the monitoring system of board on a kind of monitoring system, and especially with regard to a kind of System.
Background technology
In current various manufacturing works, computer numeral control (Computer numerical control, CNC) board is one of indispensable instrument, the various processing operations such as cut or drill such as, can be by CNC boards are realized.
In a factory building, generally contain tens of, in addition hundreds CNC boards, in order to monitor The working condition of every CNC boards, that is, monitoring CNC boards running whether, every CNC machines Platform can install a monitoring formula, and it is to produce that the data of board working condition can be reflected.CNC machines Platform can pass through connecting interface connection servomechanism, and the manager that above-mentioned data is supplied to factory building is known.
However, in the CNC boards that different vendor is produced, its compatible monitoring formula is simultaneously differed, If therefore accommodating the board of a variety of different vendors (for example simultaneously in a factory building:10 kinds), then producer must purchase Enter a variety of monitoring formulas (for example:10 kinds), the burden in cost can be lifted far and away.Further, since machine Platform is large number of, therefore when the instrument of board is impaired, is also difficult to effectively judge and find in time.
The content of the invention
The purpose of the present invention is whether the instrument for effectively judging board has defect, and in time for pipe Reason person knows.
Another object of the present invention is to provide a kind of monitoring system, it can be supervised using the mode of light sensing The working condition of various different platforms is controlled, and monitoring formula need not be bought respectively for the board of different vendor, So as to which cost is greatly reduced.
In one or more embodiments of the present invention, a kind of monitoring system can be used to monitor an at least board. Board has a portable lamp.Monitoring system includes a range unit, a defect dipoles unit and a lamp control Device processed.Range unit is to be used to produce a signal according to the distance between instrument for range unit and board. Defect dipoles unit is electrically connected with range unit, the defect to judge this instrument according to this signal.Lamp Controller is electrically connected with defect dipoles unit, to the defect judged according to defect dipoles unit, changes The optical characteristics of one radiating light of portable lamp.
In one or more embodiments of the present invention, monitoring system can also include a tool holder, be used to Branch stake tool.The one of which of tool holder and range unit relative to tool holder and range unit its Middle another one is moveable.
In one or more embodiments of the present invention, monitoring system can also include a resting.Resting Surrounded around tool holder or by tool holder.Range unit is static relative to resting.Instrument Support is moveable relative to resting.
In one or more embodiments of the present invention, a radial direction of the range unit essentially along resting Direction or an axial direction radiate a light beam.
In one or more embodiments of the present invention, monitoring system also includes a Rotation Controllers, electrically Fastening means support, causes several instruments to be moved to range unit in order and put to throw support A position on one travel path of the light beam penetrated.
In one or more embodiments of the present invention, monitoring system can also include a gig, around work Tool support is surrounded by tool holder.Range unit is static, and gig phase relative to gig It is rotatable for tool holder.
In one or more embodiments of the present invention, a radial direction of the range unit essentially along gig Direction or an axial direction radiate a light beam.
In one or more embodiments of the present invention, monitoring system can also include a Rotation Controllers, electricity Property connection gig, to rotate gig so that a travel path of the light beam that range unit is radiated Sequentially change to several instruments.
In one or more embodiments of the present invention, monitoring system can also include a lifting apparatus, be used to Relative to tool holder lifting range unit.
In one or more embodiments of the present invention, range unit is to be radiated according to range unit A light beam whether be blocked and export a digital signal, and defect dipoles unit be used to according to numeral news The defect of number judgement instrument.
In one or more embodiments of the present invention, range unit when range unit to be radiated When one light beam is blocked by instrument, according to the distance between range unit and instrument one analog signal of output, and Defect dipoles unit is the defect to judge instrument according to analog signal.
In the present invention one or more embodiments in, monitoring system can also comprising an at least OPTICAL SENSORS with And an at least controller.OPTICAL SENSORS is disposed on portable lamp, the brightness to the portable lamp according to board Send a sensing signal.Controller is electrically connected with OPTICAL SENSORS, according to sensing signal, to judge board A working condition.
In one or more embodiments of the present invention, monitoring system can also include an at least fixture.Gu Determine part to be disposed on portable lamp.OPTICAL SENSORS is disposed on fixture.
In one or more embodiments of the present invention, fixture includes an occulter.Occulter has one Storage tank and an inner surface.Inner surface is adjacent to portable lamp.Storage tank is recessed in inner surface.Light Sensor is located in storage tank.
In one or more embodiments of the present invention, monitoring system can also include an at least flexible structure. Flexible structure is disposed between fixture and portable lamp.
In one or more embodiments of the present invention, monitoring system can also include an at least light-emittingdiode. Light-emittingdiode is electrically connected with controller, and it can be used to judge the working condition of board for running in controller Lighted when middle.
In one or more embodiments of the present invention, OPTICAL SENSORS is variable comprising a photo resistance and one Resistance.The brightness that photo resistance can be used to the portable lamp of correspondence board changes resistance value.Variable resistor is string It is coupled to photo resistance.
In above-mentioned embodiment, by the defect of instrument can be detected by the mode of distance measuring, rather than Detected by way of image capture, vibration-sensing or temperature sensing, thus can avoid by image capture, Shortcoming produced by the mode such as vibration-sensing or temperature sensing.Further, since the portable lamp of board is in machine It is luminous when the working condition of platform is in running, in this way, monitoring system is that can sense machine using OPTICAL SENSORS The brightness of the portable lamp of platform, so that the working condition for knowing board is in operating or in non-running.Due to Aforesaid way only needs to sense the portable lamp brightness of board, therefore need not respectively be bought for the board of different vendor Formula is monitored, so that cost is greatly reduced.
It is described above be only illustrate the present invention it is to be solved the problem of, solution problem technological means, And its effect produced etc., detail of the invention is by embodiment below and correlative type It is discussed in detail.
Brief description of the drawings
For above and other purpose, feature, advantage and the embodiment of the present invention can be become apparent, institute Accompanying drawings are described as follows:
Fig. 1 illustrates the system block diagrams of the monitoring system according to an embodiment of the present invention;
Fig. 2 illustrates the Organization Chart of the monitoring system according to an embodiment of the present invention;
Fig. 3 illustrates the fixture and the three-dimensional exploded view of OPTICAL SENSORS according to an embodiment of the present invention;
Fig. 4 illustrates the three-dimensional exploded view of the fixture and OPTICAL SENSORS according to another embodiment of the invention;
Fig. 5 illustrates the circuit diagram between OPTICAL SENSORS and controller according to an embodiment of the present invention;
Fig. 6 illustrates the circuit diagram between OPTICAL SENSORS and controller according to another embodiment of the invention;
Fig. 7 illustrates the circuit diagram between OPTICAL SENSORS and controller according to a further embodiment of this invention;
Fig. 8 illustrates the system block diagrams of the monitoring system according to another embodiment of the invention;
The system side that Fig. 9 illustrates the system of the detecting instrument of board 300 according to one embodiment of the present invention Block figure;
Figure 10 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention;
Figure 11 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention;
Figure 12 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention;
Figure 13 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention;
Figure 14 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention;
Figure 15 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention; And
Figure 16 illustrates the stereogram of the system of the defect of the detecting instrument according to some embodiments of the present invention.
Embodiment
Several embodiments of the present invention, as clearly stated, many practices will be disclosed with schema below On details will be explained in the following description.However, those skilled in the art are understood that Arrive, in some embodiments of the present invention, details in these practices not necessarily, therefore is not applied To limit the present invention.In addition, for the sake of simplifying schema, some known usual structures are with element in schema It is middle to illustrate it in the way of simply illustrating.
Fig. 1 illustrates the system block diagrams of the monitoring system according to an embodiment of the present invention.As shown in figure 1, The monitoring system of present embodiment can include an at least OPTICAL SENSORS 100, an at least controller 200, at least One relay station is (for example:) 500, one interchanger (Switch) 600 and a servomechanism 700.It is many Individual OPTICAL SENSORS 100 can be electrically connected with same controller 200, and the sensing signal each produced is transmitted To controller 200.Multiple controllers 200 can be electrically connected with relay station 500.Relay station 500 can pass through Interchanger 600 is electrically connected with servomechanism 700.In this way, manager just can obtain light through servomechanism 700 The sensing signal and the judged result of controller 200 of sensor 100, so as to know the work of each board Make state.
Fig. 2 illustrates the Organization Chart of the monitoring system according to an embodiment of the present invention.As shown in Fig. 2 every One board 300 is respectively provided with a portable lamp 310.Portable lamp 310 is to be used to the working condition in board 300 Lighted during in running.Specifically, when the working condition of board 300 is in running, portable lamp 310 It is luminous, and when the working condition of board 300 is in non-running, portable lamp 310 is non-luminous. That is, whether luminous the running of the and board 300 of portable lamp 310 be synchronous.OPTICAL SENSORS 100 is It is arranged at portable lamp 310.OPTICAL SENSORS 100 can be sent according to the brightness of the portable lamp 310 of board 300 Sense signal.That is, OPTICAL SENSORS 100 can be when the portable lamp 310 of board 300 lights in running And send sensing signal.Controller 200 is to be electrically connected with OPTICAL SENSORS 100, to according to OPTICAL SENSORS The 100 sensing signals sent, judge the working condition of board 300.
Due to portable lamp 310 it is whether luminous be it is synchronous with the running of board 300, with avoid work pacify problem. Based on such characteristic, monitoring system can sense the portable lamp 310 of board 300 using OPTICAL SENSORS 100 Brightness, so that the working condition for knowing board 300 is in operating or in non-running.Due to above-mentioned implementation Mode only needs to sense the brightness of the portable lamp 310 of board 300, therefore can need not be directed to the board of different vendor 300 buy monitoring formula respectively, so that cost is greatly reduced.
In some embodiments, as shown in Fig. 2 controller 200 can include several connectivity ports 202. Multiple connectivity ports 202 of controller 200 can be electrically connected in multiple OPTICAL SENSORSs 100, and respectively Transmission sensing signal judges the working condition of each board 300 with sharp controller 200 to controller 200. In other words, in embodiments of the present invention, Single Controller 200 can pass through multiple OPTICAL SENSORSs 100 To monitor multiple boards 300, so as to overcome in conventional monitoring systems, by each institute of board 300 is compatible Monitoring formula it is different, cause the problem of Single Controller 200 can only monitor single board 300.In portion In point embodiment, board 300 can be CNC boards, but the present invention is not limited thereto.
In some embodiments, as shown in Fig. 2 monitoring system is selectively included an at least fixation Part 400.Fixture 400 is disposed on portable lamp 310, and OPTICAL SENSORS 100 is disposed on fixing On part 400.Consequently, it is possible to OPTICAL SENSORS 100 can be fixed on portable lamp 310 by fixture 400, And be not to depart from portable lamp 310.In some embodiments, fixture 400 can be a cyclic structure, It can be tightly bundled on portable lamp 310, and helps fixed OPTICAL SENSORS 100.In some embodiments, Portable lamp 310 is shaped as a column, can be tightly bundled in thereon with sharp fixture 400.For example, The shape of portable lamp 310 can be for a cylinder, Elliptic Cylinder or prism etc., and fixture 400 Structure can make different changes with the shape of portable lamp 310, but the present invention is not limited.
Fig. 3 illustrates the solid point of the fixture 400 and OPTICAL SENSORS 100 according to an embodiment of the present invention Xie Tu.As shown in figure 3, fixture 400 includes an occulter 410 and an annulus 420.Ring-type Portion 420 can be used to tie portable lamp 310 (see Fig. 2).Occulter 410 is to be located at annulus 420 Regional area on.Occulter 410 has an inner surface 412 and a storage tank 414.Occulter 410 Inner surface 412 be adjacent to portable lamp 310 (see Fig. 2).That is, when 400 sets of fixture When on portable lamp 310, the inner surface 412 of fixture 400 is shielded, without exposing outside. Storage tank 414 is the recessed inner surface 412 in occulter 410.OPTICAL SENSORS 100 can be located in accommodating In groove 414.
Because when fixture 400 is sheathed on portable lamp 310, the inner surface 412 of fixture 400 is not Can expose outside, thus storage tank 414 and be located in OPTICAL SENSORS 100 therein be also not exposed to it is outer. Therefore, the ambient light outside occulter 410 can be blocked body 410 and be covered so that the energy of OPTICAL SENSORS 100 It is enough to receive the light that portable lamp 310 (see Fig. 2) is sent in large quantities, without being influenceed by ambient light. In some embodiments, the shape and size of OPTICAL SENSORS 100 are identical with storage tank 414, such light Sensor 100 just can be sealed in storage tank 414.
In some embodiments, OPTICAL SENSORS 100 has a first surface 102 and back to the first table One second surface 104 in face 102.When fixture 400 is sheathed on portable lamp 310 (see Fig. 2), First surface 102 can be close to portable lamp 310, and receives the light from portable lamp 310.Back to the first table The second surface 104 in face 102 can be embedded in the storage tank 414 of occulter 410, without by ambient light Influenceed.
Fig. 4 illustrates the solid of the fixture 400 and OPTICAL SENSORS 100 according to another embodiment of the invention Exploded view.Main Differences between present embodiment and Fig. 3 are to be:Present embodiment is also scratched comprising one Property structure 430.Flexible structure 430 is disposed on fixture 400 and portable lamp 310 (see Fig. 2) Between.Specifically, flexible structure 430 is positioned at the inner side of annulus 420, when annulus 420 is tied Firmly during portable lamp 310 (see Fig. 2), flexible structure 430 could be sandwiched in annulus 420 and portable lamp 310 Between, to provide buffering effect using the deflection characteristic of itself, and help annulus 420 tightly to tie Portable lamp 310.In some embodiments, the shape and size of flexible structure 430 and annulus 420 It is identical.
Fig. 5 illustrates the electricity between OPTICAL SENSORS 100 and controller 200 according to an embodiment of the present invention Lu Tu.As shown in figure 5, controller 200 is the node P being electrically connected with the circuit of OPTICAL SENSORS 100, Therefore node P magnitude of voltage may be output to controller 200 with as sensing signal.OPTICAL SENSORS 100 can be wrapped Containing a photo resistance 110.Photo resistance 110 can correspond to the portable lamp 310 (see Fig. 2) of board 300 The brightness change resistance value of itself.Specifically, the resistance value of photo resistance 110 with its received by Light intensity it is weak be related.As long as consequently, it is possible to the brightness change of portable lamp 310, node P voltage Value will change, and controller 200 can be according to the magnitude of voltage of the node P obtained by it, to judge machine The working condition of platform 300 (see Fig. 2).In other embodiment, OPTICAL SENSORS 100 can also be used Other photosensitive devices replace photo resistance 110, for example:Photo Interrupter etc., but the present invention not with This is limited.
In some embodiments, as shown in figure 5, controller 200 can judge single comprising a sensing signal Member 210.Sensing signal judging unit 210 can be used to sensing signal (that is, node P magnitude of voltage) During for high level, judge the working condition of board 300 (see Fig. 2) in running.Specifically, when When node P magnitude of voltage meets the high level of controller 200, sensing signal judging unit 210 can be sentenced Off line platform 300 is in running.
In practice, even if board 300 (see Fig. 2) is in running, it would still be possible to because portable lamp 310 (can Refering to Fig. 2) use for a long time, cause brightness decay, so that node P magnitude of voltage is not enough to reach control The high level of device 200 processed, and cause controller 200 whether can not correctly judge board 300 in fortune In work.In this regard, in some embodiments, as shown in figure 5, OPTICAL SENSORS 100 is optionally wrapped Containing a variable resistor 120.Variable resistor 120 can be series at photo resistance 110.Consequently, it is possible to use Person can be by adjusting the resistance value of variable resistor 120, to change variable resistor 120 and photo resistance 110 Between resistance value ratio, so as to adjust node P magnitude of voltage, judged with sharp controller 200.Citing comes Say, user can increase the resistance value of variable resistor 120, to lift node P magnitude of voltage, so i.e. Make the brightness decay of portable lamp 310 (see Fig. 2), node P magnitude of voltage is still up to controller 200 High level, so as to help the correct working condition for judging board 300 of controller 200.
In some embodiments, lighted as shown in figure 5, monitoring system is selectively included at least one Diode 810.Light-emittingdiode 810 is to be electrically connected with controller 200.Light-emittingdiode 810 can use It is luminous during judging that the working condition of board 300 is as in operating in controller 200.As long as that is, Controller 200 judges the working condition of board 300 when being in running, then light-emittingdiode 810 can be sent out Light;Relatively, as long as controller 200 judges the working condition of board 300 in non-running, then send out Near-infrafed photodiodes 810 will not light.Therefore, as user it was observed that portable lamp 310 (see Fig. 2) is luminous, But light-emittingdiode 810 without it is luminous when, you can understanding brightness of the portable lamp 310 when lighting may be not enough, So that node P magnitude of voltage is not enough to reach the high level of controller 200, and cause controller 200 Erroneous judgement.Then, user can adjust the resistance value of variable resistor 120 so that light-emittingdiode 810 With the synchronous light-emitting of portable lamp 310, the judgement that controller 200 is ensured with profit is correct.
In some embodiments, as shown in figure 5, controller 200 can also be collected comprising a sensing signal Unit 220.Sense signal collector unit 220 and be electrically connected with sensing signal judging unit 210.Sensing news Number collector unit 220 collects OPTICAL SENSORS 100 within one section of period, and it is many that multiple time points are sent Individual sensing signal, as long as at least one sensing signal is high level, you can notify sensing signal judging unit 210 Judge the working condition of board 300 (see Fig. 2) in running.
For example, if it is high level that OPTICAL SENSORS 100 distributes the sensing signal that 7: 00,7 It is low level that point 01, which distributes the sensing signal that, and it is low level to distribute the sensing signal that 7: 02, It is high level to distribute the sensing signal that 7: 03, then due to 7 points 00 minute to 7: 03/ Between there is at least one sensing signal to be high level, therefore sensing signal judging unit 210 can determine whether that board 300 (can Refering to Fig. 2) in 7 points are running in 00 minute to 7: 03 work states.
Consequently, it is possible to which above-mentioned monitoring system can be efficiently applied to board of the cresset of portable lamp 310 for flicker 300.Specifically, in some embodiments, when board 300 is in running, its portable lamp 310 Cresset it is not permanent bright, but in flicker looks, although OPTICAL SENSORS 100 may can not in part-time point The sensing signal of high level is provided, but because sensing signal collector unit 220 collects OPTICAL SENSORS 100 The multiple sensing signals sent at multiple time points, as long as therefore have at least one sensing signal be high level, Sensing signal judging unit 210 can be notified to judge the working condition of board 300 in running.So just It can avoid flashing the erroneous judgement that cresset is likely to result in.
Fig. 6 is illustrated between OPTICAL SENSORS 100 and controller 200 according to another embodiment of the invention Circuit diagram.Main Differences between present embodiment and Fig. 5 are to be:Present embodiment is optionally Include an amplifier 820.Amplifier 820 be electrically coupled to OPTICAL SENSORS 100 and controller 200 it Between.Amplifier 820 can be used to amplify the sensing signal that OPTICAL SENSORS 100 sends controller 200 to.Such as This one, amplifier 820 just can be avoided between OPTICAL SENSORS 100 and controller 200 because apart from mistake Signal decline problem caused by long.In other words, amplifier 820 can help to elongate OPTICAL SENSORS 100 The distance between with controller 200.
Fig. 7 is illustrated between OPTICAL SENSORS 100 and controller 200 according to a further embodiment of this invention Circuit diagram.Main Differences between present embodiment and Fig. 5 are to be:Present embodiment can also include one Level translator 830.Level translator 830 is electrically coupled to OPTICAL SENSORS 100 and controller 200 Between.Level translator 830 can be used to increase the gap between the high level and low level of controller 200. The gap between the high and low level of controller 200 can be increased due to level translator 830, therefore may be such that control The judgement of 200 pairs of sensing signals of device processed is less sensitive.Therefore, even if OPTICAL SENSORS 100 and controller 200 Between because apart from long and cause signal to fail, also controller 200 will not be caused to judge by accident.Therefore, it is electric Flat turn parallel operation 830 can also help to elongate the distance between OPTICAL SENSORS 100 and controller 200.
Fig. 8 illustrates the system block diagrams of the monitoring system according to another embodiment of the invention.This embodiment party Main Differences between formula and Fig. 1 are to be:Present embodiment is to instead of figure using wireless base station 900 1 relay station 500.Specifically, controller 200 can wirelessly connect wireless base station 900.Wireless base 900 permeable interchangers 600 of standing are electrically connected with servomechanism 700.The transmission standard of wireless base station 900 can Meet Wi-Fi, Zigbee or transmitted by other RF signals, but the present invention is not limited thereto.
In summary, the monitoring system of embodiment of above can sense board 300 using OPTICAL SENSORS 100 Portable lamp 310 brightness so that the working condition for knowing board 300 be running in or non-running in. Because aforesaid way only needs to sense the brightness of portable lamp 310 of board 300, therefore need not be for different vendor Board 300 buys monitoring formula respectively, so that cost is greatly reduced.
In some embodiments, the defect of the instrument of board 300 can be detected by monitoring system.As schemed Shown in 9, it is the system side of the system of the detecting instrument of board 300 according to one embodiment of the present invention Block figure.In Fig. 9, this system can include range unit 1000, defect dipoles unit 1010, lamp control Device 1020 and storage device 1030 processed.Range unit 1000 can be used to utilization ranging from mode Come the defect of the instrument of detecting board.Specifically, range unit 1000 can be by light beam come measuring tool The distance between with range unit 1000.By the defect of instrument can be detected by the mode of distance measuring, Rather than detected by way of image capture, vibration-sensing or temperature sensing, therefore can avoid being picked by image Take, the shortcoming produced by the mode such as vibration-sensing or temperature sensing.
Range unit 1000 can be laser range finder, and this laser range finder can swash towards the instrument radiation of board Light light beam, and receive the laser beam reflected by instrument.Range unit 1000 can be put according to it Difference between the laser beam that the laser beam and instrument penetrated are reflected produces a signal.Defect dipoles list Member 1010 is electrically connected with range unit 1000, to be judged according to the signal from range unit 1000 The defect of instrument.Signal produced by range unit 1000 can be transferred into defect dipoles unit 1010, This signal corresponds to distance measuring data.Storage device 1030 stores preset distance data, this distance Preset data corresponds to the distance between flawless instrument and range unit 1000.Storage device 1030 It is electrically connected with defect dipoles unit 1010 so that defect dipoles unit 1010 can be from storage device 1030 Preset distance data is obtained, and may compare distance measuring data and preset distance data, thereby according to distance The defect of diversity judgement instrument between metrology data and preset distance data.
Lamp controller 1020 is electrically connected with defect dipoles unit 1010 and portable lamp 310 so that lamp is controlled The defect that device 1020 can be judged according to defect dipoles unit 1010 changes the radiating light of portable lamp 310 Optical characteristics.For example, lamp controller 1020 can change the radiating light of portable lamp 310 wavelength, Brightness or polarization state.OPTICAL SENSORS 100 can work of detection and examination lamp 310 radiating light change and transmittable detect Signal is surveyed to controller 200, and this detection signal corresponds to the change of radiating light.Consequently, it is possible to manage Reason person can know the defect of the instrument of board 300 in time.Lamp controller 1020 and aforementioned embodiments Controller 200 can be two independent controllers or to be integrated in Single Controller.
Figure 10 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.As shown in Figure 10, this system includes range unit 1100 and tool holder 1300.Tool holder The 1300 several instrument T of support are thereon.The one of which of tool holder 1300 and range unit 1100 Wherein another one relative to tool holder 1300 and range unit 1100 is moveable so that ranging Device 1100 can detect this little instrument T respectively and in order.When wherein an instrument T has defect, and this Defect is that when being detected by range unit 1100, lamp controller 1020 (see Fig. 9) can change portable lamp The optical characteristics of the radiating light of (see Fig. 2).
In some embodiments, this system also includes resting 1400 and Rotation Controllers 1500. Resting 1400 surrounds tool holder 1300.Tool holder 1300 is electrically connected with Rotation Controllers 1500 And can be rotated under the control of Rotation Controllers 1500, so that tool holder 1300 is relative to resting 1400 be rotatable.Range unit 1100 is still to be located on resting 1400.That is, survey Relative to resting 1400 it is static away from device 1100.Under such a configuration, tool holder 1300 It is rotatable relative to range unit 1100, therefore, when tool holder 1300 rotates, ranging is filled This little instrument T can individually and sequentially be detected by putting 1100.More specifically, when tool holder 1300 revolves When turning make it that wherein an instrument T blocks the laser beam that range unit 1100 is radiated, range unit 1100 Analog signal, and defect dipoles unit can be exported according to the distance between range unit 1100 and instrument T 1010 (see Fig. 9) can judge defect according to this analog signal.For example, this analog signal can be class Than voltage, it is related, defect dipoles unit to the distance between range unit 1100 and instrument T 1010 can be according to the analog voltage produced by range unit 1100 and storage device 1030 (see Fig. 9) Difference between stored predetermined analog voltage, judges instrument T defect.
In some embodiments, resting 1400 includes fixed seat 1410 and cyclic structure 1420, Fixed seat 1410 is affixed in the annular surface of cyclic structure 1420.Range unit 1100 is fixed In in fixed seat 1410.Consequently, it is possible to which range unit 1100 can be static relative to resting 1400 's.In other words, range unit 1100 is quiet relative to tool holder 1300 with resting 1400 Only.Range unit 1100 has lasing light emitter 1110.Because range unit 1100 is relative to instrument branch Frame 1300 is static, therefore lasing light emitter 1110 can carry out lase light beam along relatively-stationary direction. Furthermore, it is understood that the cyclic structure 1420 of resting 1400 has radial direction R.Range unit 1100 Lasing light emitter 1110 can be essentially along radial direction R lase light beams, tool holder 1300 can be with The central shaft of the cyclic structure 1420 of resting 1400 rotates for axle.Therefore, when tool holder 1300 During rotation, all instrument T can be moved to the position on the travel path of laser beam in order so that All instrument T can be detected.In some embodiments, the cyclic structure 1420 of resting 1400 With opening O.Opening O may help to change defective instrument T.For example, when tool holder 1300 During rotation, defective instrument T can remove tool holder 1300 and board 300 by opening O (can join Read Fig. 2) outside.Defective instrument T is movable to the position exposed by opening O, then, Ling Yigong Tool T can be inserted by opening O to be placed in board 300 on tool holder 1300.Therefore it can realize The instrument T of defect replacement operation.
Figure 11 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.Main Differences between present embodiment and Figure 10 illustrated embodiments are to be:This system, which is included, encloses Around the gig 1600 of tool holder 1300.Range unit 1100 is disposed on gig 1600. Gig 1600 is electrically coupled to Rotation Controllers 1500a, and can be Rotation Controllers 1500a's Control is lower to rotate, so that gig 1600 is rotatable relative to tool holder 1300.Such Under configuration, range unit 1100 is rotatable relative to tool holder 1300, therefore, works as gig During 1600 rotation, range unit 1100 can sequentially detect multiple instrument T that tool holder 1300 is supported. More specifically, when gig 1600, which rotates, make it that range unit 1100 is circumferentially moved, ranging dress Put 1100 can sequentially lase light beam to different instrument T.In other words, gig 1600 is rotatable So that the travel path for the laser beam that range unit 1100 is radiated sequentially changes to different instrument T.When Laser beam is by when wherein an instrument T is blocked, and range unit 1100 can be according to range unit 1100 and work Have the distance between T output analog signals.
In some embodiments, gig 1600 includes fixed seat 1610 and cyclic structure 1620. Fixed seat 1610 is affixed in the annular surface of cyclic structure 1620.Range unit 1100 is fixed In in fixed seat 1610.Therefore, range unit 1100 is static relative to gig 1600.Change Sentence talk about, range unit 1100 be relative to tool holder 1300 with gig 1600 it is rotatable, So that when gig 1600 rotates, multiple instrument T can be detected by range unit 1100 in order.
Figure 12 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.Main Differences between present embodiment and Figure 10 illustrated embodiments are to be:This system is also included Lifting apparatus 1700 is with relative to the lifting range unit 1100 of tool holder 1300.In other words, lift Rise device 1700 can lifting range unit 1100 to differentiated levels.Again in other words, resting 1400 With axial direction A, lifting apparatus 1700 can move ranging along the axial direction A of resting 1400 Device 1100.
Lifting apparatus 1700 is disposed on resting 1400 with range unit 1100.Range unit 1100 For laser range finder, when this range unit 1100 is to be located at predeterminated level height, range unit 1100 Whether the laser beam that can be radiated according to it is blocked, to export digital signal.Defect dipoles unit 1010 Instrument T defect can be judged according to this digital signal.For example, when laser beam is hidden by instrument T During gear, the exportable high level voltage of range unit 1100, when laser beam is not blocked by instrument T, The exportable low level voltage of range unit 1100.Therefore, when range unit 1100 is to be located at predeterminated level During height, whether defect dipoles unit 1010 can be blocked and judgement instrument according to laser beam by instrument T T defect.
In some embodiments, radial direction of the range unit 1100 essentially along resting 1400 R lases light beam is to instrument T, and this range unit 1100 can also be along the axial direction of resting 1400 Direction A is moved.Therefore, instrument T height can be detected.When the instrument T height being detected is compared When the predetermined altitude being stored in storage device 1030 is reduction, instrument T can be judged as defective Instrument T.For example, when range unit 1100 is promoted to a predetermined altitude, and in this predetermined altitude, Laser beam is expected to be blocked, but when actually laser beam is not blocked, instrument T can be judged For defective instrument T.In some embodiments, lifting apparatus 1700 can with range unit 1100 Be arranged on gig 1600 as shown in figure 11, and when this range unit 1100 be raised to it is predetermined During height, whether range unit 1100 can be blocked according to laser beam and export digital signal.
Figure 13 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.Main Differences between present embodiment and Figure 10 illustrated embodiments are to be:This system includes quilt The resting 1400a that tool holder 1300 is surrounded.More particularly, tool holder 1300 is ring-type Structure, this cyclic structure surrounds resting 1400a.Resting 1400a can comprising fixed seat 1410a with Disc 1420a.Fixed seat 1410a is affixed on disc 1420a.Disc 1420a is by instrument branch Frame 1300 is surrounded.Range unit 1100 is affixed on fixed seat 1410a.Consequently, it is possible to ranging Device 1100 is static relative to resting 1400a, and is surrounded by tool holder 1300.When When tool holder 1300 rotates, range unit 1100 can be according between range unit 1100 and instrument T Distance output analog signal.In some embodiments, lifting apparatus 1700 and range unit 1100 May be disposed on resting 1400a disc 1420a, and when range unit 1100 be promoted to it is predetermined During level height, whether range unit 1100 can be blocked according to laser beam and export digital signal.
Figure 14 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.Main Differences between present embodiment and Figure 10 illustrated embodiments are to be:This system includes quilt The gig 1600a that tool holder 1300 is surrounded.Range unit 1100 is relative to gig 1600a It is static.Gig 1600a is electrically coupled to Rotation Controllers 1500a, and can be in rotation control Under device 1500a control rotate, therefore, gig 1600a be can opposite tool support 1300 rotate 's.Fixed seat 1610a is affixed on gig 1600a disc 1620a, and range unit 1100 It is affixed on fixed seat 1610a.When tool holder 1300 rotates, range unit 1100 can basis The distance between range unit 1100 and instrument T output analog signals.In some embodiments, lifting Device 1700 may be disposed on gig 1600a disc 1620a with range unit 1100, and work as When this range unit 1100 is raised to predeterminated level height, range unit 1100 can be according to laser beam Whether it is blocked and exports digital signal.
Figure 15 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.Main Differences between present embodiment and Figure 10 illustrated embodiments are to be:Range unit 1100a Lasing light emitter 1110a essentially along resting 1400 axial direction A lase light beam.Therefore, Range unit 1100a can be between measuring tool T and range unit 1100a in the axial direction on A distance, To judge instrument T defect.In some embodiments, a range unit 1100a part is to be located at The top of tool holder 1300, thereby lasing light emitter 1110a can be above instrument T.For example, survey It can be exported away from device 1100a according to the distance on instrument T and range unit 1100a in the axial direction A Analog signal.In some embodiments, range unit 1100a is disposed on ring as shown in figure 11 Shape gig 1600.
Figure 16 illustrates the solid of the system of the defect of the detecting instrument T according to some embodiments of the present invention Figure.Main Differences between present embodiment and Figure 15 illustrated embodiments are to be:This system includes quilt The resting 1400a that tool holder 1300 is surrounded.For further, tool holder 1300 is ring Shape structure, this cyclic structure surrounds resting 1400a.Resting 1400a can include fixed seat 1410a With disc 1420a.Fixed seat 1410a is affixed on disc 1420a.Disc 1420a is by instrument Support 1300 is surrounded.Range unit 1100a is affixed on fixed seat 1410a.Consequently, it is possible to Range unit 1100a is static relative to resting 1400a, and is surrounded by tool holder 1300. A range unit 1100a part is to be located at the top of tool holder 1300, with measuring tool T and ranging Distance between device 1100a in the axial direction on A, to judge instrument T defect.
Although the present invention is disclosed above with embodiment, so it is not limited to the present invention, any ripe This those skilled in the art is practised, without departing from the spirit and scope of the present invention, when can be used for a variety of modifications and variations, Therefore protection scope of the present invention is worked as and is defined depending on as defined in claim.

Claims (16)

1. a kind of monitoring system, to monitor an at least board, the wherein board has a portable lamp, its It is characterised by, the monitoring system is included:
One range unit, a signal is produced according to the distance between instrument for the range unit and the board;
One defect dipoles unit, is electrically connected with the range unit, and judge the instrument according to the signal one lacks Fall into;And
One lamp controller, is electrically connected with the defect dipoles unit, is judged according to the defect dipoles unit The defect, changes the optical characteristics of a radiating light of the portable lamp.
2. monitoring system as claimed in claim 1, is further included:
One tool holder, to support the instrument, the one of which phase of the tool holder and the range unit Wherein another one for the tool holder and the range unit is moveable.
3. monitoring system as claimed in claim 2, is further included:
One resting, is surrounded around the tool holder or by the tool holder, wherein the range unit phase It is static for the resting, and the tool holder is moveable relative to the resting.
4. monitoring system as claimed in claim 3, wherein the range unit is essentially along the resting A radial direction or an axial direction radiate a light beam.
5. monitoring system as claimed in claim 3, is further included:
One Rotation Controllers, is electrically connected with the tool holder, to rotate the tool holder so that several should The position that instrument is moved on a travel path of the light beam that the range unit is radiated in order.
6. monitoring system as claimed in claim 2, is further included:
One gig, is surrounded around the tool holder or by the tool holder, wherein the range unit phase It is static for the gig, and the gig is rotatable relative to the tool holder.
7. as claimed in claim 6 monitoring system, wherein the range unit is essentially along the gig A radial direction or an axial direction radiate a light beam.
8. monitoring system as claimed in claim 6, is further included:
One Rotation Controllers, is electrically connected with the gig, to rotate the gig so that the range unit One travel path of the light beam radiated sequentially changes to several instruments.
9. monitoring system as claimed in claim 2, is further included:
One lifting apparatus, to relative to the tool holder lifting range unit.
10. monitoring system as claimed in claim 1, the wherein range unit are used to according to the ranging Whether the light beam that device is radiated is blocked and exports a digital signal, and the defect dipoles unit is to use To judge the defect of the instrument according to the digital signal.
11. monitoring system as claimed in claim 1, the wherein range unit are to when ranging dress It is defeated according to the range unit and the distance between the instrument when putting a radiated light beam and being blocked by the instrument Go out an analog signal, and the defect dipoles unit is to be used to judge that this of the instrument lacks according to the analog signal Fall into.
12. monitoring system as claimed in claim 1, is further included:
An at least OPTICAL SENSORS, is arranged at the portable lamp, the brightness to the portable lamp according to the board Send a sensing signal;And
An at least controller, is electrically connected with the OPTICAL SENSORS, according to the sensing signal, to judge the machine One working condition of platform.
13. monitoring system as claimed in claim 12, is further included:
An at least fixture, is arranged on the portable lamp, and the OPTICAL SENSORS is disposed on the fixture.
14. monitoring system as claimed in claim 13, the wherein fixture include an occulter, the screening Body of light has a storage tank and an inner surface, and the inner surface is adjacent to the portable lamp, and the storage tank is It is recessed in the inner surface, the wherein OPTICAL SENSORS is located in the storage tank.
15. monitoring system as claimed in claim 13, is further included:
An at least flexible structure, is arranged between the fixture and the portable lamp.
16. monitoring system as claimed in claim 12, the wherein OPTICAL SENSORS are included:
One photo resistance, to should board the portable lamp brightness change resistance value;And
One variable resistor, is series at the photo resistance.
CN201610292461.XA 2016-01-28 2016-05-05 Monitoring system Active CN107015527B (en)

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Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1437145A (en) * 1973-04-28 1976-05-26 Toyoda Machine Works Ltd Control system for machine tool provided with automatic tool- exchanger
US4608747A (en) * 1982-05-06 1986-09-02 Index-Werke Komm.-Ges. Hahn & Tessky Multispindle-automatic turret lathe
JPH0957581A (en) * 1995-08-25 1997-03-04 Okuma Mach Works Ltd Life detector for tool gripper
JP2782267B2 (en) * 1990-06-30 1998-07-30 オークマ株式会社 Angle measurement method for oblique hole drilling equipment
JP2006305663A (en) * 2005-04-27 2006-11-09 Brother Ind Ltd Automatic tool changer
CN100354070C (en) * 2004-03-18 2007-12-12 特莎有限公司 Tool change apparatus
CN101642884A (en) * 2008-08-07 2010-02-10 奥林巴斯株式会社 State detector and method of machine tool
CN202592349U (en) * 2011-03-10 2012-12-12 布莱克和戴克公司 Clamping device
CN102941503A (en) * 2012-10-25 2013-02-27 深圳市壹兴佰测量设备有限公司 Method for determining workpiece reference point by using measuring halving rod of numerically-controlled machine tool
CN103658966A (en) * 2012-09-04 2014-03-26 株式会社F.泰克 Friction stir welding apparatus
CN103692304A (en) * 2013-12-24 2014-04-02 合肥晶桥光电材料有限公司 Multifunctional sapphire ingot processing device
CN104062132A (en) * 2013-03-22 2014-09-24 和硕联合科技股份有限公司 Monitoring system
CN104128832A (en) * 2013-04-30 2014-11-05 Dmg森精机株式会社 Tool changing method and machine tool
CN105096212A (en) * 2015-07-31 2015-11-25 国网山东五莲县供电公司 Electric power toolset intelligent management system

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1437145A (en) * 1973-04-28 1976-05-26 Toyoda Machine Works Ltd Control system for machine tool provided with automatic tool- exchanger
US4608747A (en) * 1982-05-06 1986-09-02 Index-Werke Komm.-Ges. Hahn & Tessky Multispindle-automatic turret lathe
JP2782267B2 (en) * 1990-06-30 1998-07-30 オークマ株式会社 Angle measurement method for oblique hole drilling equipment
JPH0957581A (en) * 1995-08-25 1997-03-04 Okuma Mach Works Ltd Life detector for tool gripper
CN100354070C (en) * 2004-03-18 2007-12-12 特莎有限公司 Tool change apparatus
JP2006305663A (en) * 2005-04-27 2006-11-09 Brother Ind Ltd Automatic tool changer
CN101642884A (en) * 2008-08-07 2010-02-10 奥林巴斯株式会社 State detector and method of machine tool
CN202592349U (en) * 2011-03-10 2012-12-12 布莱克和戴克公司 Clamping device
CN103658966A (en) * 2012-09-04 2014-03-26 株式会社F.泰克 Friction stir welding apparatus
CN102941503A (en) * 2012-10-25 2013-02-27 深圳市壹兴佰测量设备有限公司 Method for determining workpiece reference point by using measuring halving rod of numerically-controlled machine tool
CN104062132A (en) * 2013-03-22 2014-09-24 和硕联合科技股份有限公司 Monitoring system
CN104128832A (en) * 2013-04-30 2014-11-05 Dmg森精机株式会社 Tool changing method and machine tool
CN103692304A (en) * 2013-12-24 2014-04-02 合肥晶桥光电材料有限公司 Multifunctional sapphire ingot processing device
CN105096212A (en) * 2015-07-31 2015-11-25 国网山东五莲县供电公司 Electric power toolset intelligent management system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
赵波: "课题二 数控机床的结构及工作原理", 《数控加工项目实训教程》 *

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