CN107015027A - The Sample location fixing means and device of a kind of scanning probe microscopy - Google Patents
The Sample location fixing means and device of a kind of scanning probe microscopy Download PDFInfo
- Publication number
- CN107015027A CN107015027A CN201710125108.7A CN201710125108A CN107015027A CN 107015027 A CN107015027 A CN 107015027A CN 201710125108 A CN201710125108 A CN 201710125108A CN 107015027 A CN107015027 A CN 107015027A
- Authority
- CN
- China
- Prior art keywords
- metal
- metal substrate
- scanning probe
- scale
- probe microscopy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 45
- 238000004621 scanning probe microscopy Methods 0.000 title claims abstract description 22
- 239000002184 metal Substances 0.000 claims abstract description 97
- 229910052751 metal Inorganic materials 0.000 claims abstract description 97
- 239000000758 substrate Substances 0.000 claims abstract description 56
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 4
- 239000010931 gold Substances 0.000 claims 4
- 229910052737 gold Inorganic materials 0.000 claims 4
- 238000000034 method Methods 0.000 abstract description 9
- 239000000017 hydrogel Substances 0.000 description 4
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 2
- 239000002390 adhesive tape Substances 0.000 description 2
- 238000013475 authorization Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 1
- 241000562569 Riodinidae Species 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000003292 glue Substances 0.000 description 1
- 229910052742 iron Inorganic materials 0.000 description 1
- 230000004807 localization Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229920001223 polyethylene glycol Polymers 0.000 description 1
- 238000012805 post-processing Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q30/00—Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
- G01Q30/20—Sample handling devices or methods
Abstract
The invention belongs to scanning probe microscopy technical field, the Sample location fixing means and device of specially a kind of scanning probe microscopy.The step of the inventive method is：Select the metal substrate of cylindrical type, the surrounding of metal substrate puts on scale, and hold screw line successfully in certain distance in surrounding, circular ring type sheet metal is added in the top of metal substrate, screwed hole is outputed on sheet metal by the same distance of metal substrate surrounding threaded hole, make 2, the metal straight scale of metal substrate diameter length, output screwed hole in two ends, then sheet metal and metal ruler are fixed on metal substrate with flat head screw, the position of sample can both be specified by forming one, can play the device of fixation to sample again.The present invention can be widely used on the base station of scanning probe microscopy.
Description
Technical field
The invention belongs to scanning probe microscopy technical field, and in particular to the Sample location of scanning probe microscopy is fixed
Method and device.
Background technology
At present, many researchers can run into Sample location fixation problem when being tested using scanning probe microscopy, such as
Preliminary Determination is carried out to sample, in addition it is also necessary to which sample is post-processed, wished to find same position test again after post processing, separately
Outside, for some samples such as hydrogel material, the especially higher hydrogel of moisture content is by water-setting according to usual way
Glue is fixed on double faced adhesive tape to be placed on iron plate above the magnet of microscopical flying-spot tube, but hydrogel is aqueous more, general
Double faced adhesive tape can not firmly be fixed, so that controller can not accurately feed back the active force between needle point and sample and make
The larger error of measurement generation has no idea to be scanned.
Although, patent（Authorization Notice No. CN100543447C）" re-positioning method based on AFM " and specially
Profit（Authorization Notice No. CN1116694C）" sample positioning method of scanning probe microscopy " is all reported to AFM
The localization method of sample, but both approaches all lack the fixation to sample.
The content of the invention
Show it is an object of the invention to provide a kind of convenient, simple to operate, ocular and clear the scanning probe that is applied to of observation
The method that the Sample location of micro mirror is fixed, this method is to ensure the fixation to sample, again beneficial to the position of observation sample test
Put.
The Sample location fixing means for the scanning probe microscopy that the present invention is provided, specific steps are followed successively by：
（1）Cylinder type metal substrate is selected, the surrounding of metal substrate puts on scale, and holds spiral shell successfully by set a distance in edge
Pit；
（2）Circular ring type sheet metal is added in the top of metal substrate, the same mark scale on sheet metal, and by Metal Substrate
The same distance of piece surrounding threaded hole, correspondence perforate on sheet metal；
（3）Make 2, the metal straight scale of metal substrate diameter length, two ends perforate, the spiral shell of the size in hole with metal substrate
Hole size, position is corresponding with the position of metal substrate and thin slice；
（4）Then sheet metal and metal ruler are fixed on metal substrate, realize the positioning and fixation to sample.
The present invention, which can form one, can both specify the position of sample, can play the device of fixation to sample again.
In the present invention, a diameter of 8-18mm of described metal substrate, thickness is 1-10mm.
In the present invention, the scale of described metal substrate surrounding notes scale according to angle-differentiated every 30 scales.One week
360 degree, there are 12 scales.
In the present invention, described screwed hole is every 45 degree of perforates one, and bore dia is 1-2mm；Tour, has 8
Screwed hole.
In the present invention, the thickness of described circular ring type sheet metal is 0.1-0.3mm, and the overall diameter of annulus is 8-18mm
（With metal substrate diameter）, interior diameter is 5-16mm；Position of opening on annulus and hole size and the size in hole on metal substrate,
Position is identical.
In the present invention, described metal ruler length is the length of the diameter of metal substrate, and width is 1.5-3mm, ruler
Index and mark according to mm units.
The advantage of the invention is that：It is simple in construction, it is easy to operate, sample effectively can be fixed on scanning probe micro-
On magnet above the flying-spot tube of mirror, sample is put on this sample stage, and the region to be measured of exposure is indeformable.This method not only can be with
For the observation of scanning probe microscopy, the observation of other light microscopes and Electronic Speculum can also be applied to.
Brief description of the drawings
Fig. 1 is the three-dimensional exploded view of metal substrate, sheet metal, metal scale.
Fig. 2 is the top view of metal substrate, sheet metal, metal scale.
Embodiment
The present invention is further described with reference to the accompanying drawings and examples.
Such as Fig. 1, shown in 2, the Sample location fixing means of a kind of scanning probe microscopy of the invention, i.e., on metal substrate
The circumference number of degrees have been marked, while providing the space for placing film class sample using sheet metal, have then been provided using metal ruler
The positional information of sample, while metal ruler can play fixation to sample.Specific experiment step is as follows：
（1）The metal substrate of selection cylindrical type, a diameter of 14mm of metal substrate, thickness is 1.4mm, and presses 30 degree of point in surrounding
Scale is noted and opens 8 screwed holes, screw thread bore dia 1.4mm every 45 degree of equidistances on angle index, circumference；
（2）Circular ring type sheet metal is added in the top of metal substrate, the thickness of sheet metal is 0.2mm, the overall diameter of annulus
For 14mm, interior diameter is 8mm；Annulus sheet metal marks scale according to the mask method of metal substrate, on sheet metal
Position of opening is identical with the position of metal substrate upper screwed hole, bore dia 1.4mm；
（3）2, the metal straight scale of 14mm length is made, width is 1.5mm, and ruler is indexed and marked according to mm units, two ends
Screwed hole is outputed, the size in hole is with metal substrate size；
（4）Then sheet metal and metal ruler are fixed on metal substrate with flat head screw, realize the positioning to sample and consolidate
Determine function.
Concrete application example, such as polyethylene glycol hydrogel thin-film material, are fabricated to 0.2mm thickness, are subtracted into 8mm diameters
Circle, be put on metal substrate, then put sheet metal, sheet metal has certain fixation to the surrounding of film, then
Pushed down, be then screwed with metal ruler.The research of probe microscope can be scanned.Two metal rulers can be adjusted
Position of the whole different angle to facilitate fixed sample and record sample.
Claims (10)
1. the Sample location fixing means of a kind of scanning probe microscopy, it is characterised in that concretely comprise the following steps：
（1）Cylinder type metal substrate is selected, the surrounding of metal substrate puts on scale, and outputs spiral shell by set a distance in edge
Pit；
（2）Circular ring type sheet metal is added in the top of metal substrate, the same mark scale on sheet metal, and by Metal Substrate
The same distance of piece surrounding threaded hole, correspondence perforate on sheet metal；
（3）Make 2, the metal straight scale of metal substrate diameter length, two ends perforate, the spiral shell of the size in hole with metal substrate
Hole size, position is corresponding with the position of metal substrate and thin slice；
（4）Then sheet metal and metal ruler are fixed on metal substrate, realize the positioning and fixation to sample.
2. the Sample location fixing means of scanning probe microscopy according to claim 1, it is characterised in that described gold
Category substrate diameter is 8-18mm, and thickness is 1-10mm.
3. the Sample location fixing means of scanning probe microscopy according to claim 1 or 2, it is characterised in that described
Metal substrate surrounding scale according to angle-differentiated, note scale every 30 scales.
4. the Sample location fixing means of scanning probe microscopy according to claim 3, it is characterised in that described spiral shell
Pit is every 45 degree of perforates one, and bore dia is 1-2mm.
5. the Sample location fixing means of the scanning probe microscopy according to claim 1,2 or 4, it is characterised in that institute
The thickness for the circular ring type sheet metal stated is 0.1-0.3mm, and the overall diameter of annulus is 8-18mm, consistent with metal substrate diameter,
Interior diameter is 5-16mm；Position of opening on annulus is identical with the size in hole, position on metal substrate with hole size.
6. the Sample location fixing means of scanning probe microscopy according to claim 5, it is characterised in that described gold
Belong to length of the ruler length for the diameter of metal substrate, width is 1.5-3mm, and ruler is indexed and marked according to mm units.
7. a kind of Sample location fixing device of scanning probe microscopy, it is characterised in that including：
（1）One cylinder type metal substrate, the surrounding of the metal substrate indicates scale, and is provided with spiral shell by set a distance in edge
Pit；
（2）The one circular ring type sheet metal being placed in above metal substrate, is equally labeled with scale, and down payment on the sheet metal
Belong to the same distance of substrate surrounding threaded hole, correspondence is provided with hole on sheet metal；
（3）2 and metal substrate diameter length identical metal straight scale, scale two ends are provided with hole, the same metal of size in hole
The screw size of substrate, position is corresponding with the position of metal substrate and thin slice；
（4）Sheet metal and metal ruler are fixed on metal substrate when using, the positioning and fixation to sample is realized.
8. the Sample location fixing device of scanning probe microscopy according to claim 7, it is characterised in that described gold
Category substrate diameter is 8-18mm, and thickness is 1-10mm.
9. the Sample location fixing device of scanning probe microscopy according to claim 7, it is characterised in that described gold
Belong to the scale of substrate surrounding according to angle-differentiated, scale is noted every 30 scales；Described screwed hole is every 45 degree of perforates one, hole
A diameter of 1-2mm.
10. the Sample location fixing device of scanning probe microscopy according to claim 7, it is characterised in that described
The thickness of circular ring type sheet metal is 0.1-0.3mm, and the overall diameter of annulus is 8-18mm, consistent with metal substrate diameter, interior straight
Footpath is 5-16mm；Position of opening on annulus is identical with the size in hole, position on metal substrate with hole size；Described metal is straight
Chi length is the length of the diameter of metal substrate, and width is 1.5-3mm, and ruler is indexed and marked according to mm units.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710125108.7A CN107015027B (en) | 2017-03-03 | 2017-03-03 | Sample positioning and fixing method and device of scanning probe microscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710125108.7A CN107015027B (en) | 2017-03-03 | 2017-03-03 | Sample positioning and fixing method and device of scanning probe microscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107015027A true CN107015027A (en) | 2017-08-04 |
| CN107015027B CN107015027B (en) | 2020-09-01 |
Family
ID=59439793
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710125108.7A Expired - Fee Related CN107015027B (en) | 2017-03-03 | 2017-03-03 | Sample positioning and fixing method and device of scanning probe microscope |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107015027B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108226572A (en) * | 2017-12-29 | 2018-06-29 | 国联汽车动力电池研究院有限责任公司 | A kind of atomic force microscope sample scaling method |
| CN109188028A (en) * | 2018-10-12 | 2019-01-11 | 深圳市华星光电技术有限公司 | A kind of roughness concentration fixture and its measurement method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1300095A (en) * | 1999-12-16 | 2001-06-20 | 中国科学院长春应用化学研究所 | Sample positioning method for microscope with scanning probe |
| CN1779435A (en) * | 2004-11-22 | 2006-05-31 | 宁波大学 | Re-positioning method for microscope based on atomic force |
| CN203299107U (en) * | 2013-05-04 | 2013-11-20 | 河北钢铁股份有限公司唐山分公司 | Sample positioning scale of metallographic microscope |
| CN103926685A (en) * | 2014-04-28 | 2014-07-16 | 四川沃文特生物技术有限公司 | Improved object table |
| CN204188644U (en) * | 2014-09-24 | 2015-03-04 | 复旦大学 | A kind of Special sample table of scanning probe microscopy |
| CN205406483U (en) * | 2016-02-04 | 2016-07-27 | 河南师范大学 | Field emission scanning electron microscope sample platform |
-
2017
- 2017-03-03 CN CN201710125108.7A patent/CN107015027B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1300095A (en) * | 1999-12-16 | 2001-06-20 | 中国科学院长春应用化学研究所 | Sample positioning method for microscope with scanning probe |
| CN1779435A (en) * | 2004-11-22 | 2006-05-31 | 宁波大学 | Re-positioning method for microscope based on atomic force |
| CN203299107U (en) * | 2013-05-04 | 2013-11-20 | 河北钢铁股份有限公司唐山分公司 | Sample positioning scale of metallographic microscope |
| CN103926685A (en) * | 2014-04-28 | 2014-07-16 | 四川沃文特生物技术有限公司 | Improved object table |
| CN204188644U (en) * | 2014-09-24 | 2015-03-04 | 复旦大学 | A kind of Special sample table of scanning probe microscopy |
| CN205406483U (en) * | 2016-02-04 | 2016-07-27 | 河南师范大学 | Field emission scanning electron microscope sample platform |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108226572A (en) * | 2017-12-29 | 2018-06-29 | 国联汽车动力电池研究院有限责任公司 | A kind of atomic force microscope sample scaling method |
| CN109188028A (en) * | 2018-10-12 | 2019-01-11 | 深圳市华星光电技术有限公司 | A kind of roughness concentration fixture and its measurement method |
| CN109188028B (en) * | 2018-10-12 | 2020-08-11 | 深圳市华星光电技术有限公司 | Roughness measuring clamp and measuring method thereof |
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| Publication number | Publication date |
|---|---|
| CN107015027B (en) | 2020-09-01 |
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Granted publication date: 20200901 |