CN106970273A - Spiralism type surface potential measurement device based on Electro-optical Modulation - Google Patents
Spiralism type surface potential measurement device based on Electro-optical Modulation Download PDFInfo
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- CN106970273A CN106970273A CN201710201796.0A CN201710201796A CN106970273A CN 106970273 A CN106970273 A CN 106970273A CN 201710201796 A CN201710201796 A CN 201710201796A CN 106970273 A CN106970273 A CN 106970273A
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- rotating vane
- electrooptic modulator
- potential measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/12—Measuring electrostatic fields or voltage-potential
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
- G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
- G01R15/24—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices
- G01R15/241—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using light-modulating devices using electro-optical modulators, e.g. electro-absorption
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- Measurement Of Current Or Voltage (AREA)
- Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
Abstract
The invention discloses a kind of Spiralism type surface potential measurement device based on Electro-optical Modulation, including laser, optical fiber, electrooptic modulator, rotating vane, fixed blade etc., when carrying out potential measurement to measured surface, in the presence of tested electrical body, when being grounded rotating vane rotation, periodically cover or open fixed blade, make to fix blade and induce lasting AC signal, and output to electro-optic modulation system is detected, the optical transport that laser is sent is to electrooptic modulator, electric signal is converted to via being transmitted after the AC signal modulation loaded to photodetector, electric signal is subjected to output observation eventually through signal display output device, and by calculating the final potential value for obtaining testee surface.Spiralism type measuring method is combined by the present invention with integrated light guide technology, finally realizes high sensitivity, high stability and high-precision surface potential measurement.
Description
Technical field
The invention belongs to spacecraft space environment detection technical field, in particular it relates to which a kind of be based on electric light
The Spiralism type surface potential measurement device of modulation.
Background technology
The satellite run in space causes the current potential and satellite of satellite surface due to the isolated bulk effect in plasma
Structure and context current potential it is inconsistent, cause satellite surface to charge.After satellite surface charges, it can have influence on and defend
Star carries the measurement of scientific exploration equipment, or even occurs electric discharge phenomena.To satellite surface charge high precision monitor contribute into
One step understands the influence that space environment is caused to satellite, and further improvement satellite keeps away anti-measure to space environment.The opposing party
Face, in lunar exploration task, moonscape gathers thick and heavy lunar dust, its by the sun and cosmic ray etc. irradiation and in powered shape
The various functions of equipment are caused serious influence by state, it is easy to be adsorbed in lunar exploration instrument and equipment.Therefore, it is each to ensure
The safe handling of kind of equipment after moonfall, before moonfall detection is carried out, it is necessary to the various hazard factors of lunar surface are proved and
Lunar environment carries out simulated test, and the more important pilot project of one of which is the measurement of lunar dust surface electrostatic current potential, studies the moon
The powered property of dirt has highly important construction value.
Measurement body surface current potential instrument be generally divided into contact and contactless two kinds, due to contact instrument with
Testee can make charged object static discharge when contacting, and reduce the quantity of electric charge or increase the electric capacity of charged object, and this two
Individual factor all reduces the surface potential of object, thus the result measured differs larger with the true powered situation of object, so
Method when measuring the surface potential of many objects more often is to use contactless measurement.Spiralism type electrometer belongs to conventional
There is the fan-shaped rotary blade of decile more than one at non-contact measurement apparatus, test probe position, and the sensing on fixed blade is straight
Stream signal is changed into AC signal.
For the measurement of surface potential, because measurement process is vulnerable to external condition influence, thus measurement easily misses
Difference.When carrying out potential measurement to measured position, survey measurements is decayed with the time with exponential law, therefore it is required that measurement apparatus has
There is very high input impedance, to reduce test error.
In addition, the signal transmission pathway of its probe segment of above-mentioned measuring method and output equipment composition is likely to become transmitting
Source, so as to produce interference to tested region current potential, while space electric field can produce electromagnetic induction phenomenon in these equipment, will cause
Measurement result substantial deviation actual value.Probe segment can be effectively set to be carried out with signal processing unit using Electro-optical Modulation technology
Phototube Coupling, while electro-optic crystal has high input impedance, therefore Spiralism type probe is combined with electrooptic modulator and
Into surface potential measurement device can realize the high stability of surface potential, high-acruracy survey.
The content of the invention
For problem present in surface potential measurement, the present invention proposes a kind of Spiralism type surface electricity based on Electro-optical Modulation
Level measuring arrangement, Electro-optical Modulation technology is combined with Spiralism type probe, it is possible to achieve high sensitivity, high stability and high accuracy
Spatial electronic field measurement ability.
Spiralism type surface potential measurement device based on Electro-optical Modulation, including laser, optical fiber, electrooptic modulator, electrode,
Photodetector, signal display output device, motor, fixed blade, rotating vane, wherein, the laser for producing laser
Electrooptic modulator is transferred to by optical fiber, is transmitted after its modulation by optical fiber to photodetector and is converted to electric signal, finally
Electric signal is carried out by output observation by signal display output device, and by calculating the final current potential for obtaining testee surface
Value；Wherein, a pair of electrodes of electrooptic modulator is connected with Spiralism type test probe respectively, has two metal leaves in test probe
Piece is fixed blade and rotating vane, and wherein rotating vane is the fan-shaped rotary metal blade of many equal portions, by fixed blade
Sensing direct current signal is changed into having perforate on AC signal, rotating vane and is fixed on micromotor, is done and rotated by its drive
Motion；Fixed blade is complementary with rotating vane, shows the equal portions blade of full circle, is fixedly mounted on before motor and and Electro-optical Modulation
The input of device is connected, rotating vane and motor and the output head grounding of electrooptic modulator, when to measured surface progress current potential
During measurement, in the presence of tested electrical body, when being grounded rotating vane rotation, fixed blade is periodically covered or opens,
Make to fix blade and induce lasting AC signal.
Wherein, fixed blade is fixed between motor and rotating vane, as rotating vane is periodically blocked and beaten
Open, measured measured surface voltage carries out cyclically-varying, finally gives AC signal.
Wherein, rotating vane and fixed blade have the sector structure of the quartering.
Wherein, the voltage change on probe, the voltage being carried on electrooptic modulator signal electrode changes, while electric
The refractive index of electro-optic crystal in optical modulator changes therewith, causes the light that laser is exported to be produced when by electrooptic modulator
Phase delay.
Wherein, assemble and interfere with the light of two arms in electrooptic modulator, the change of its phase will cause shaking for light
Amplitude variation, realizes the modulation to light intensity.
Wherein, electrooptic modulator is waveguide electro-optic modulator, and AC signal is loaded into waveguide electro-optic modulator,
To being modulated by the laser of electrooptic modulator, electric signal then is converted optical signals to through photodetector again, through processing
It can obtain measured value afterwards.
Wherein, electrooptic modulator is Mach-Zehnder (M-Z) type integrated light guide electro-optic intensity modulator.
Electrooptic modulator in the present invention has input impedance high, fast response time, the advantages of sensitivity is high, and will not be right
The electric field of tested region produces interference.The present invention uses Mach-Zehnder (M-Z) type integrated light guide electro-optic intensity modulator,
Have the advantages that modulation efficiency is high, temperature stability is good, small volume.Therefore Spiralism type is popped one's head in and the signal of electrooptic modulator is electric
Extremely it is connected, Spiralism type measuring method is combined with integrated light guide technology, finally realizes high sensitivity, high stability and high-precision
The surface potential measurement of degree.
The Spiralism type surface potential measurement device based on Electro-optical Modulation of the present invention, surface is applied to by Electro-optical Modulation technology
In potential measurement, with advantages below：(1) due to electro-optic crystal have high input impedance (>1G Ω), so survey measurements
Slower with the decay of time, measurement stability is high, can effectively reduce test error；(2) due to the Phototube Coupling of electro-optic crystal
Effect, probe segment and output equipment do not result in influence to the current potential of measured position yet, while space electric field also will not be right
Signal output apparatus produces electromagnetic interference；(3) in the characteristics of electrooptic modulator has fast response time, sensitivity is high, the present invention
Selected M-Z type integrated type optical waveguide electro-optic intensity modulator also has modulation efficiency height, the good, small volume of temperature stability etc.
Advantage, thus based on Electro-optical Modulation technology combination Spiralism type pop one's head in can realize high sensitivity, high stability surface potential survey
Amount ability.
Brief description of the drawings
Fig. 1 is the structural representation of the Spiralism type surface potential measurement device based on Electro-optical Modulation of the present invention.
In figure：1- lasers, 2- optical fiber, 3- electrooptic modulators, 4- electrodes, 5- photodetectors, 6- signal display outputs
Device, 7- motors, 8- fixes blade, 9- rotating vanes, 10- measured surfaces.
Embodiment
Introduced below is the embodiment as content of the present invention, below by embodiment to this
The content of invention is made further to illustrate.Certainly, the not Tongfang of description following detailed description only for the example present invention
The content in face, and should not be construed as limiting the scope of the invention.
Referring to Fig. 1, Fig. 1 shows the structural representation of the Spiralism type surface potential measurement device based on Electro-optical Modulation.Its
In, the Spiralism type surface potential measurement device of the invention based on Electro-optical Modulation, including laser 1, optical fiber 2, electrooptic modulator
3rd, electrode 4, photodetector 5, signal display output device 6, motor 7, fixed blade 8, rotating vane 9, fixed blade 8 are fixed
Between motor 7 and rotating vane 9, rotating vane has the sector structure of the quartering with fixed blade, with rotation
Blade 9 is periodically blocked and opened, and the voltage of measured measured surface 10 carries out cyclically-varying, finally gives exchange
Signal.Wherein, electrooptic modulator 3 is transferred to for producing the laser 1 of laser by optical fiber 2, is passed after its modulation by optical fiber 2
Transport to photodetector 5 and be converted to electric signal, electric signal is subjected to output observation eventually through signal display output device 6,
And by calculating the final potential value for obtaining the surface of testee 10；Wherein, a pair of electrodes of electrooptic modulator 3 respectively with vane
Formula test probe is connected, and in test probe there are two metal blades to be fixed blade 8 and rotating vane 9, wherein rotating vane 9
For the fan-shaped rotary blade of 4 equal portions, the sensing direct current signal on fixed blade 8 is changed into having out on AC signal, rotating vane 9
Hole is simultaneously fixed on micromotor 7, is rotated by its drive；Fixed blade 8 is complementary with rotating vane 9, shows whole
Round equal portions blade, is fixedly mounted on before motor 7 and is connected with the input of electrooptic modulator 3, rotating vane 9 and motor 7 with
And the output head grounding of electrooptic modulator 3, when carrying out potential measurement to measured surface, in the presence of tested electrical body, when
When being grounded rotating vane 9 and rotating, fixed blade is periodically covered or opened, makes to fix blade 8 and induces lasting exchange letter
Number.
In a particular embodiment, the voltage change on probe, is carried in the voltage on the signal electrode of electrooptic modulator 3
Change, while the refractive index of the electro-optic crystal in electrooptic modulator 3 changes therewith, cause the light that laser is exported passing through
During two arms in electrooptic modulator 3, the opposite phase delay of size same-sign is generated respectively.With the light meeting of two arms
Poly- to interfere, the change of its phase will cause the amplitude variations of light, realize the modulation to light intensity.
Measuring system perceives the current potential on measured object surface by popping one's head in, and probe segment is designed using Spiralism type, belongs to non-
Contact type measurement.A pair of electrodes (4) of electrooptic modulator (3) is connected with Spiralism type probe.Electrooptic modulator chooses integrated light wave
Intensity modulator such as Mach-Zehnder (M-Z) type integrated light guide electro-optic intensity modulator is led, detected signal is to light intensity
Modulation do not influenceed by the bit phase delay that natural birefringence is produced, therefore it has good temperature characterisitic.Simultaneously as inspection
The ground electrode of survey and the ground of receiving circuit are isolated, and the surface potential detection based on electrooptic modulator can realize low noise, resist
Interferometry.
Although the embodiment to the present invention gives detailed description and illustrated above, it should be noted that
Those skilled in the art can carry out various equivalent changes and modification, its institute according to the spirit of the present invention to above-mentioned embodiment
The function of generation, all should be within the scope of the present invention in the spirit covered without departing from specification and accompanying drawing.
Claims (7)
1. the Spiralism type surface potential measurement device based on Electro-optical Modulation, including laser, optical fiber, electrooptic modulator, electrode, light
Electric explorer, signal display output device, motor, fixed blade, rotating vane, wherein, the laser for producing laser leads to
Cross optical fiber and be transferred to electrooptic modulator, transmitted after its modulation by optical fiber to photodetector and be converted to electric signal, it is final logical
Cross signal display output device and electric signal is subjected to output observation, and by calculating the final current potential for obtaining testee surface
Value；Wherein, a pair of electrodes of electrooptic modulator is connected with Spiralism type test probe respectively, has two metal leaves in test probe
Piece is fixed blade and rotating vane, and wherein rotating vane is the fan-shaped rotary metal blade of many equal portions, by fixed blade
Sensing direct current signal is changed into having perforate on AC signal, rotating vane and is fixed on micromotor, is done and rotated by its drive
Motion；Fixed blade is complementary with rotating vane, shows the equal portions blade of full circle, is fixedly mounted on before motor and and Electro-optical Modulation
The input of device is connected, rotating vane and motor and the output head grounding of electrooptic modulator, when to measured surface progress current potential
During measurement, in the presence of tested electrical body, when being grounded rotating vane rotation, fixed blade is periodically covered or opens,
Make to fix blade and induce lasting AC signal.
2. the Spiralism type surface potential measurement device as claimed in claim 1 based on Electro-optical Modulation, wherein, fixed blade is fixed
Between motor and rotating vane, as rotating vane is periodically blocked and opened, measured measured surface voltage
Cyclically-varying is carried out, AC signal is finally given.
3. the Spiralism type surface potential measurement device based on Electro-optical Modulation as claimed in claim 1, wherein, rotating vane and solid
Fixed blade has the sector structure of the quartering.
4. the Spiralism type surface potential measurement device based on Electro-optical Modulation as described in claim any one of 1-3, wherein, probe
On voltage change, the voltage being carried on electrooptic modulator signal electrode changes, while the electric light in electrooptic modulator
The refractive index of crystal changes therewith, causes the light that laser is exported to produce phase delay when by electrooptic modulator.
5. the Spiralism type surface potential measurement device based on Electro-optical Modulation as described in claim any one of 1-3, wherein, with
The light of two arms is assembled and interfered in electrooptic modulator, and the change of its phase will cause the amplitude variations of light, realize to light intensity
Modulation.
6. the Spiralism type surface potential measurement device based on Electro-optical Modulation as described in claim any one of 1-3, wherein, electric light
Modulator is waveguide electro-optic modulator, and AC signal is loaded into waveguide electro-optic modulator, to passing through electrooptic modulator
Laser be modulated, then convert optical signals to electric signal through photodetector again, after processing i.e. can obtain measured value.
7. the Spiralism type surface potential measurement device based on Electro-optical Modulation as described in claim any one of 1-3, wherein, electric light
Modulator is Mach-Zehnder (M-Z) type integrated light guide electro-optic intensity modulator.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201710201796.0A CN106970273B (en) | 2017-03-30 | 2017-03-30 | Spiralism type surface potential measurement device based on Electro-optical Modulation |
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|---|---|---|---|
| CN201710201796.0A CN106970273B (en) | 2017-03-30 | 2017-03-30 | Spiralism type surface potential measurement device based on Electro-optical Modulation |
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| CN106970273A true CN106970273A (en) | 2017-07-21 |
| CN106970273B CN106970273B (en) | 2019-10-29 |
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08122380A (en) * | 1994-10-27 | 1996-05-17 | Shishido Seidenki Kk | Surface potential-measuring device |
| JPH08271562A (en) * | 1995-03-31 | 1996-10-18 | Ricoh Co Ltd | Surface potential measuring apparatus |
| CN2807268Y (en) * | 2005-06-06 | 2006-08-16 | 上海电动工具研究所 | Horizontal modulating type surface potentiometer sensor |
| CN104132798A (en) * | 2014-07-25 | 2014-11-05 | 国家电网公司 | Y-waveguide integrated optics phase modulator modulation factor measurement device and method |
| CN106066421A (en) * | 2016-08-12 | 2016-11-02 | 国家电网公司 | A kind of lightning arrester discharge current monitoring system and method |
| CN106200019A (en) * | 2015-05-29 | 2016-12-07 | 特克特朗尼克公司 | There is the electrical-optical probe of multiple range of sensitivity |
| CN106680595A (en) * | 2015-11-11 | 2017-05-17 | 北京卫星环境工程研究所 | Double-probe electric field measurement device based on integrated optical waveguide |
-
2017
- 2017-03-30 CN CN201710201796.0A patent/CN106970273B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08122380A (en) * | 1994-10-27 | 1996-05-17 | Shishido Seidenki Kk | Surface potential-measuring device |
| JPH08271562A (en) * | 1995-03-31 | 1996-10-18 | Ricoh Co Ltd | Surface potential measuring apparatus |
| CN2807268Y (en) * | 2005-06-06 | 2006-08-16 | 上海电动工具研究所 | Horizontal modulating type surface potentiometer sensor |
| CN104132798A (en) * | 2014-07-25 | 2014-11-05 | 国家电网公司 | Y-waveguide integrated optics phase modulator modulation factor measurement device and method |
| CN106200019A (en) * | 2015-05-29 | 2016-12-07 | 特克特朗尼克公司 | There is the electrical-optical probe of multiple range of sensitivity |
| CN106680595A (en) * | 2015-11-11 | 2017-05-17 | 北京卫星环境工程研究所 | Double-probe electric field measurement device based on integrated optical waveguide |
| CN106066421A (en) * | 2016-08-12 | 2016-11-02 | 国家电网公司 | A kind of lightning arrester discharge current monitoring system and method |
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| CN106970273B (en) | 2019-10-29 |
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