CN106959911A - The automatic generation method and device of terminal equipment failure - Google Patents
The automatic generation method and device of terminal equipment failure Download PDFInfo
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- CN106959911A CN106959911A CN201710104698.5A CN201710104698A CN106959911A CN 106959911 A CN106959911 A CN 106959911A CN 201710104698 A CN201710104698 A CN 201710104698A CN 106959911 A CN106959911 A CN 106959911A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04M—TELEPHONIC COMMUNICATION
- H04M1/00—Substation equipment, e.g. for use by subscribers
- H04M1/24—Arrangements for testing
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- General Physics & Mathematics (AREA)
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Abstract
The present invention relates to the communications field, the automatic generation method and device of a kind of terminal equipment failure are disclosed.In the present invention, the automatic generation method of terminal equipment failure includes：All electronic devices in end of scan equipment, obtain the information of each electronic device successively；According to the matching relationship between the information and presupposed information of acquisition, judge whether each electronic device occurs exception successively；When electronic device occurs abnormal, abnormal information is captured with graphic form, failure file is generated.The invention also discloses a kind of automatically generating device of terminal equipment failure.Compared with prior art, the invention enables can be repaired according to the fault message in failure file to electronic device, handle, safeguard, so that the later stage is improved to software quality and technology.
Description
Technical field
The present invention relates to the communications field, the automatic generation method and device of more particularly to a kind of terminal equipment failure.
Background technology
With the development of science and technology, the electronic equipment such as mobile phone has obtained very big popularization, and has turned into people's work
With an indispensable part in life.Meanwhile, the need for meeting consumer, these electronic digital products, which typically all possess, to be broadcast
Put video, listen the various audiovisual entertainment functions such as song, and user can also use electronic equipment to deliver resume, data storage
Deng.
At present, the application of electronic equipment is especially extensive.For mobile phone, if mobile phone breaks down, after-sales service people
Member, substantially checks the electronic device damaged in mobile phone by observation, is then changed the electronic device of damage.But
It is that inventor is during the present invention is realized, discovery also has following technical problem in the prior art：Mobile phone, which breaks down, to be needed
The reason for repairing has a lot, there is that device is bad to cause its service life shorter, and the leak BUG for also having software to exist in itself is asked
Topic.If changing electronic device simply by look at fault of mobile phone, it frequently can lead to failure cause and fail to understand, it is impossible to provided for research and development
Strong information and failure cause, so as to next improved technology.
The content of the invention
The purpose of the embodiment of the present invention is the automatic generation method and device for providing a kind of terminal equipment failure so that can
Electronic device is repaired with the fault message in failure file, handled, safeguarded, so as to the later stage to software quality and
Technology is improved.
In order to solve the above technical problems, the embodiments of the invention provide a kind of automatic generation method of terminal equipment failure,
Including：Electronic devices all in the terminal device are scanned, the information of each electronic device is obtained successively；According to the institute of acquisition
The matching relationship between information and presupposed information is stated, judges whether each electronic device occurs exception successively；In the electricity
When sub- device occurs abnormal, abnormal information is captured with graphic form, failure file is generated.
The embodiment of the present invention additionally provides a kind of automatically generating device of terminal equipment failure, including：Scan module, is used for
Scan electronic devices all in the terminal device；Acquisition module, the information for obtaining each electronic device successively；Matching
Module, for will be matched between the described information of acquisition and presupposed information；Judge module, for the letter according to acquisition
Matching relationship between breath and presupposed information, judges whether each electronic device occurs exception successively；Generation module, is used for
When the electronic device occurs abnormal, abnormal information is captured with graphic form, failure file is generated.
The embodiment of the present invention in terms of existing technologies, by scanning electronic devices all in the terminal device,
The information of each electronic device is obtained successively, according to the matching relationship between the described information and presupposed information of acquisition, is sentenced successively
Whether disconnected each electronic device occurs exception, when the electronic device occurs abnormal, with the abnormal letter of graphic form crawl
Breath, generates failure file so that can know whether the software section of electronic device breaks down from failure file, to tie up
The personnel of repairing can carry out maintenance process according to the fault message in failure file to electronic device；Or application developer can be with
Fault message in failure file carries out analysis maintenance to electronic device, so that the later stage changes to software quality and technology
Enter.
In addition, in the crawl abnormal information with graphic form, will be printed corresponding to the keyword of the abnormal information
Into the picture so that can quickly and easily know fault message from failure file according to keyword is more accurate,
To carry out maintenance process；And research staff more accurately can quickly and easily obtain according to keyword from failure file
The fault message known carries out analysis maintenance to electronic device, so as to the technological improvement in later stage.
In addition, after with graphic form crawl abnormal information, before the generation failure file, the terminal equipment failure
Automatic generation method also include：The picture of the abnormal information is classified according to the keyword；In the generation event
When hindering file, the classification according to where the picture of the abnormal information generates failure file.In this way so that can be with
The fault message of electronic device is preferably classified, so that user more accurately easily can be known from failure file
The fault message of electronic device, so as to improve the efficiency for obtaining fault message.
In addition, after generation failure file, the automatic generation method of the terminal equipment failure also includes：By the failure
File is stored to specified catalogue.The operation such as allow user to be called, check and analyze the failure file of storage.
In addition, failure file is stored to specified catalogue, specifically include：With keyword name catalogue file folder；
Keyword in picture, same class failure file is stored into corresponding catalogue file folder so that user can basis
The name of file is directly perceived convenient and the fault message of electronic device is quickly known from failure file.
In addition, after generation failure file, the automatic generation method of terminal equipment failure also includes：By the failure file
It is uploaded to backstage so that user can be checked and be analyzed to the failure file for uploading to backstage.And/or, by the failure
File is shown, allows user that more intuitively the failure file of display is checked and analyzed.
In addition, the automatically generating device of terminal equipment failure also includes：Print module, for being grabbed described with graphic form
When taking abnormal information, the keyword corresponding to the abnormal information is printed in the picture.
In addition, the automatically generating device of terminal equipment failure also includes：Sort module, for being grabbed described with graphic form
Take after abnormal information, before the generation failure file, the picture of the abnormal information is divided according to the keyword
Class；Generation module, is additionally operable in the generation failure file, the classification according to where the picture of the abnormal information, generation
Failure file.
In addition, the automatically generating device of terminal equipment failure also includes：Memory module, in the generation failure file
Afterwards, the failure file is stored to specified catalogue.
Brief description of the drawings
One or more embodiments are illustrative by the picture in corresponding accompanying drawing, these exemplary theorys
The element with same reference numbers label is expressed as similar element in the bright restriction not constituted to embodiment, accompanying drawing, removes
Composition is not limited the non-figure having in special statement, accompanying drawing.
Fig. 1 is the flow chart according to the automatic generation method of terminal equipment failure in first embodiment of the invention；
Fig. 2 is the flow chart according to the automatic generation method of terminal equipment failure in second embodiment of the invention；
Fig. 3 is the block diagram according to the automatically generating device of terminal equipment failure in third embodiment of the invention；
Fig. 4 is the block diagram according to the automatically generating device of terminal equipment failure in four embodiment of the invention.
Embodiment
To make the object, technical solutions and advantages of the present invention clearer, below in conjunction with each reality of the accompanying drawing to the present invention
The mode of applying is explained in detail.However, it will be understood by those skilled in the art that in each embodiment of the invention,
In order that reader more fully understands the application and proposes many ins and outs.But, even if without these ins and outs and base
Many variations and modification in following embodiment, can also realize the application technical scheme claimed.
The first embodiment of the present invention is related to a kind of automatic generation method of terminal equipment failure.It should be noted that
Before terminal device dispatches from the factory, the automatic physical examination program of terminal device can be created.
Idiographic flow is as shown in figure 1, the automatic generation method of terminal equipment failure includes：
Step 101, electronic device all in end of scan equipment.
Specifically, into the automatic physical examination program of terminal device, when user clicks on comprehensive physical examination in automatic physical examination program
When, automatic physical examination program brings into operation.During automatic physical examination, the electronics for the equipment that opened a terminal successively according to preset order
Device, and the software section of the electronic device of opening is scanned.Also, can be by the electronics of opening after the end of scan
Device is simultaneously closed off, can also be at the end of each electronic device is scanned, will electronic device closing.Such as, terminal is set
Standby electronic device at least can be, but not limited to include：Display screen, touch-screen, camera, range sensor, photosensitive sensors,
Compass etc., then can open display screen successively, touch-screen, camera, range sensor, photosensitive sensors, compass, and
Its software section is scanned.
Step 102, the information of each electronic device is obtained successively.
Specifically, the numerical value or numerical value change scope of each electronic device can be obtained.Such as, for chip,
Can obtain the register value of chip, or chip some pin magnitude of voltage.For capacitance plate, capacitance plate can be obtained
Voltage pin information, the I of capacitance plate2C information etc..For sensor electron-like device, sensor output value can be obtained
Saltus step scope, such as gravity sensor, when rocking terminal device, can obtain output valve of the gravity sensor on each axial direction
Saltus step scope；Such as range sensor, when unobstructed, the influence value of range sensor can be obtained.
Step 103, judge whether the information obtained matches with presupposed information.If the information and the presupposed information that obtain are not
Match somebody with somebody, exception occurs for electronic device, then into step 104；If the information obtained is matched with presupposed information, electronic device is normal,
Then terminate.
It is noted that carrying out automatic physical examination to terminal device in reality, i.e., terminal device electronic device is examined
During survey, it can be, but not limited to include following detection：
A. restarting (Reboot) test：The circulation of analog subscriber mobile phone is restarted, and confirms its part and the whole machine of terminal device
Whether normal (e.g., can restart, restart after whether normal).Terminal device test lead obtains and recorded the number of times restarted, and judges
Whether the number of times of acquisition is identical with default predetermined number of times.If the number of times obtained is differed with default predetermined number of times,
Reboot occurs abnormal.
B. dormancy (Sleep) is tested：Pseudo subscriber terminal equipment circulates dormancy, confirms can whether its part normally (e.g.,
Real-time clock RTC is waken up after dormancy, dormancy whether normal).Terminal device test lead obtains and records the number of times of dormancy, judges to obtain
Whether the number of times taken is identical with default predetermined number of times.If the number of times obtained is differed with default predetermined number of times, Sleep
Generation is abnormal.
C. central processing unit (CPU) is tested：Analog subscriber high load capacity multitask is used, and whether test CPU computings are correct.Tool
Body, circulation performs complex calculation, and obtains the run time for performing complex calculation.Judge obtain run time with it is default
Whether the specified time is identical.If the run time obtained is differed with the default specified time, CPU occurs abnormal.
D. audio (Audio) is tested：Analog subscriber long-time play music and for a long time recording, test loudspeaker and Mike
Whether wind is normal.Specifically, judging whether by specified time loop play music and recording.If it is not, then explanation Audio is surveyed
Examination is abnormal.
E. liquid crystal display (LCD) is tested：A large amount of screen content changes, test LCD colors during analog subscriber use
Whether normal refresh.Specifically, judging whether constantly to refresh each rgb value by the specified time.If it is not, then explanation LCD is surveyed
Examination is abnormal.
F.2D test：Analog subscriber long-time heavy-duty service 2D plays, and whether test GPU 2D render normal.Specifically
, judge whether to render 2D images by the circulation of specified time.If it is not, then explanation 2D tests are abnormal.
G.3D test：Analog subscriber long-time heavy-duty service 3D plays, and whether test GPU 3D render normal.Specifically
, judge whether to render 3D rendering by the circulation of specified time.If it is not, then explanation 3D tests are abnormal.
H. camera or video camera (Camera) test：Analog subscriber high-frequency uses camera, and whether test camera takes pictures
Normally.Specifically, judging whether to perform preview by predetermined number of times circulation and taking pictures.If it is not, then explanation Camera tests are different
Often.
I. global positioning system (GPS) is tested：Analog subscriber high-frequency is opened, searched using the application such as map, test GPS
Whether star, acquisition position, closing are normal.Specifically, judge whether by predetermined number of times circulation open GPS, search star, obtain position,
Close GPS.If it is not, then explanation GPS tests are abnormal.
J. file distributing agreement (BT) is tested：Analog subscriber high intensity circulates open and close bluetooth and matching bluetooth.Test
Whether bluetooth unlatching, search AP, closing are normal.Specifically, judging whether to open bluetooth, search AP by predetermined number of times circulation, closing
Close bluetooth.If it is not, then explanation BT tests are abnormal.
K.WIFI tests (WIFI refers to the WLAN based on IEEE 802.11b standards)：Analog subscriber high intensity
Open and close WIFI and connection WIFI are circulated, whether test WIFI unlatchings, search AP, closing are normal.Specifically, judge whether by
Predetermined number of times circulation opens WIFI, search AP, closes WIFI.If it is not, then explanation WIFI tests are abnormal.
L. light (Light) is tested：Analog subscriber high-frequency changes local environment, test light sensation opens, obtain light sensation value,
Whether normal close.Specifically, judging whether to open by predetermined number of times, obtaining light sensation value, close light sensation.If it is not, then saying
Bright Light tests are abnormal.
M. proximity transducer (Proximity) is tested：Analog subscriber high intensity recycles proximity transducer, and test is close
Whether sensor unlatching, acquired value, closing are normal.Specifically, judge whether to open by predetermined number of times, acquired value, close it is close
Sensor.If it is not, then explanation Proximity tests are abnormal.
N. gravity sensor (Gravitay) is tested：Analog subscriber high intensity recycles gravity sensor, tests gravity
Whether sensor unlatching, acquired value, closing are normal.Specifically, judging whether to open by predetermined number of times, acquired value, closing gravity
Sensor.If it is not, then explanation Gravitay tests are abnormal.
O. motor (Vibrator) is tested：Analog subscriber high intensity recycles motor, and whether test motor vibrations are normal.
Specifically, judging whether by specified time cycling cycling vibration motor.If it is not, then explanation Vibrator tests are abnormal.
P. fingerprint is tested：After analog subscriber typing fingerprint, can test recognize the fingerprint of typing.If can not know
Not, then illustrate that fingerprint test is abnormal.
Above-mentioned every test, is that this step is illustrated, and is not by the electronic device limit in terminal device
It is set to the above-mentioned device enumerated.
Specifically, the information of acquisition and presupposed information are compared, if what is obtained is the register value of chip,
Register value with chip under normal work is compared, if unanimously, illustrating that the information obtained is matched with presupposed information；If
It is inconsistent, illustrate that the information obtained is mismatched with presupposed information.If what is obtained is the magnitude of voltage of some pin of chip, and obtains
The magnitude of voltage taken is 0, and magnitude of voltage is not that 0, i.e. presupposed information are not 0 under normal work, then illustrates the information obtained with presetting
Information is mismatched, if the magnitude of voltage obtained is identical with default magnitude of voltage, illustrates that the information obtained is matched with presupposed information.
It is noted that can also be illustrated by taking gravity sensor as an example, if when rocking terminal device, gravity sensor exists
The collection numerical value of a certain axle is constant, then the information and presupposed information for illustrating the gravity sensor obtained are mismatched.With Distance-sensing
Illustrated exemplified by device, presupposed information can be 0 to 10.When unobstructed, if the influence value for obtaining range sensor exceeds 0
To 10 this scope, such as more than 10, then the information and presupposed information for illustrating the range sensor obtained are mismatched etc., herein not
Enumerate again.
Step 104, abnormal information is captured with graphic form, generates failure file.
Specifically, it is abnormal by running to when detecting electronic device generation exception during automatic physical examination
The program of electronic device is with graphic form sectional drawing.Occur exception if there is multiple electronic devices, then there can be multiple sectional drawings, it is many
Failure file can be generated by opening sectional drawing.
By the above, it is seen that, present embodiment allows to know the soft of electronic device from failure file
Whether part part breaks down, so that maintenance personal can repair according to the fault message in failure file to electronic device
Processing；Or application developer can carry out analysis maintenance according to the fault message in failure file to electronic device, so as to
Improvement of the later stage to software quality and technology.
Second embodiment of the present invention is related to a kind of automatic generation method of terminal equipment failure.Second embodiment is
The improvement done on the basis of first embodiment, is mainly theed improvement is that：In this second embodiment, it will can correspond to
The keyword of abnormal information is printed in picture.
Idiographic flow is as shown in Fig. 2 the automatic generation method of terminal equipment failure includes：
Step 201, electronic device all in end of scan equipment.
Specifically, into the automatic physical examination program of terminal device, when user clicks on comprehensive physical examination in automatic physical examination program
When, automatic physical examination program brings into operation.During automatic physical examination, the electronics for the equipment that opened a terminal successively according to preset order
Device, and the software section of the electronic device of opening is scanned.Also, can be by the electronics of opening after the end of scan
Device is simultaneously closed off, can also be at the end of each electronic device is scanned, will electronic device closing.Such as, terminal is set
Standby electronic device at least can be, but not limited to include：Display screen, touch-screen, camera, range sensor, photosensitive sensors,
Compass etc., then can open display screen successively, touch-screen, camera, range sensor, photosensitive sensors, compass, and
Its software section is scanned.
Step 202, the information of each electronic device is obtained successively.
Specifically, the numerical value or numerical value change scope of each electronic device can be obtained.Such as, for chip,
Can obtain the register value of chip, or chip some pin magnitude of voltage.For capacitance plate, capacitance plate can be obtained
Voltage pin information, the I of capacitance plate2C information etc..For sensor electron-like device, sensor output value can be obtained
Saltus step scope, such as gravity sensor, when rocking terminal device, can obtain output valve of the gravity sensor on each axial direction
Saltus step scope；Such as range sensor, when unobstructed, the influence value of range sensor can be obtained.
Step 203, judge whether the information obtained matches with presupposed information.If the information and the presupposed information that obtain are not
Match somebody with somebody, exception occurs for electronic device, then into step 104；If the information obtained is matched with presupposed information, electronic device is normal,
Then terminate.
It is noted that carrying out automatic physical examination to terminal device in reality, i.e., terminal device electronic device is examined
During survey, it can be, but not limited to include following detection：
A. restarting (Reboot) test：The circulation of analog subscriber mobile phone is restarted, and confirms its part and the whole machine of terminal device
Whether normal (e.g., can restart, restart after whether normal).Terminal device test lead obtains and recorded the number of times restarted, and judges
Whether the number of times of acquisition is identical with default predetermined number of times.If the number of times obtained is differed with default predetermined number of times,
Reboot occurs abnormal.
B. dormancy (Sleep) is tested：Pseudo subscriber terminal equipment circulates dormancy, confirms can whether its part normally (e.g.,
Real-time clock RTC is waken up after dormancy, dormancy whether normal).Terminal device test lead obtains and records the number of times of dormancy, judges to obtain
Whether the number of times taken is identical with default predetermined number of times.If the number of times obtained is differed with default predetermined number of times, Sleep
Generation is abnormal.
C. central processing unit (CPU) is tested：Analog subscriber high load capacity multitask is used, and whether test CPU computings are correct.Tool
Body, circulation performs complex calculation, and obtains the run time for performing complex calculation.Judge obtain run time with it is default
Whether the specified time is identical.If the run time obtained is differed with the default specified time, CPU occurs abnormal.
D. audio (Audio) is tested：Analog subscriber long-time play music and for a long time recording, test loudspeaker and Mike
Whether wind is normal.Specifically, judging whether by specified time loop play music and recording.If it is not, then explanation Audio is surveyed
Examination is abnormal.
E. liquid crystal display (LCD) is tested：A large amount of screen content changes, test LCD colors during analog subscriber use
Whether normal refresh.Specifically, judging whether constantly to refresh each rgb value by the specified time.If it is not, then explanation LCD is surveyed
Examination is abnormal.
F.2D test：Analog subscriber long-time heavy-duty service 2D plays, and whether test GPU 2D render normal.Specifically
, judge whether to render 2D images by the circulation of specified time.If it is not, then explanation 2D tests are abnormal.
G.3D test：Analog subscriber long-time heavy-duty service 3D plays, and whether test GPU 3D render normal.Specifically
, judge whether to render 3D rendering by the circulation of specified time.If it is not, then explanation 3D tests are abnormal.
H. camera or video camera (Camera) test：Analog subscriber high-frequency uses camera, and whether test camera takes pictures
Normally.Specifically, judging whether to perform preview by predetermined number of times circulation and taking pictures.If it is not, then explanation Camera tests are different
Often.
I. global positioning system (GPS) is tested：Analog subscriber high-frequency is opened, searched using the application such as map, test GPS
Whether star, acquisition position, closing are normal.Specifically, judge whether by predetermined number of times circulation open GPS, search star, obtain position,
Close GPS.If it is not, then explanation GPS tests are abnormal.
J. file distributing agreement (BT) is tested：Analog subscriber high intensity circulates open and close bluetooth and matching bluetooth.Test
Whether bluetooth unlatching, search AP, closing are normal.Specifically, judging whether to open bluetooth, search AP by predetermined number of times circulation, closing
Close bluetooth.If it is not, then explanation BT tests are abnormal.
K.WIFI tests (WIFI refers to the WLAN based on IEEE 802.11b standards)：Analog subscriber high intensity
Open and close WIFI and connection WIFI are circulated, whether test WIFI unlatchings, search AP, closing are normal.Specifically, judge whether by
Predetermined number of times circulation opens WIFI, search AP, closes WIFI.If it is not, then explanation WIFI tests are abnormal.
L. light (Light) is tested：Analog subscriber high-frequency changes local environment, test light sensation opens, obtain light sensation value,
Whether normal close.Specifically, judging whether to open by predetermined number of times, obtaining light sensation value, close light sensation.If it is not, then saying
Bright Light tests are abnormal.
M. proximity transducer (Proximity) is tested：Analog subscriber high intensity recycles proximity transducer, and test is close
Whether sensor unlatching, acquired value, closing are normal.Specifically, judge whether to open by predetermined number of times, acquired value, close it is close
Sensor.If it is not, then explanation Proximity tests are abnormal.
N. gravity sensor (Gravitay) is tested：Analog subscriber high intensity recycles gravity sensor, tests gravity
Whether sensor unlatching, acquired value, closing are normal.Specifically, judging whether to open by predetermined number of times, acquired value, closing gravity
Sensor.If it is not, then explanation Gravitay tests are abnormal.
O. motor (Vibrator) is tested：Analog subscriber high intensity recycles motor, and whether test motor vibrations are normal.
Specifically, judging whether by specified time cycling cycling vibration motor.If it is not, then explanation Vibrator tests are abnormal.
P. fingerprint is tested：After analog subscriber typing fingerprint, can test recognize the fingerprint of typing.If can not know
Not, then illustrate that fingerprint test is abnormal.
Above-mentioned every test, is that this step is illustrated, and is not by the electronic device limit in terminal device
It is set to the above-mentioned device enumerated.
Specifically, the information of acquisition and presupposed information are compared, if what is obtained is the register value of chip,
Register value with chip under normal work is compared, if unanimously, illustrating that the information obtained is matched with presupposed information；If
It is inconsistent, illustrate that the information obtained is mismatched with presupposed information.If what is obtained is the magnitude of voltage of some pin of chip, and obtains
The magnitude of voltage taken is 0, and magnitude of voltage is not that 0, i.e. presupposed information are not 0 under normal work, then illustrates the information obtained with presetting
Information is mismatched, if the magnitude of voltage obtained is identical with default magnitude of voltage, illustrates that the information obtained is matched with presupposed information.
It is noted that can also be illustrated by taking gravity sensor as an example, if when rocking terminal device, gravity sensor exists
The collection numerical value of a certain axle is constant, then the information and presupposed information for illustrating the gravity sensor obtained are mismatched.With Distance-sensing
Illustrated exemplified by device, presupposed information can be 0 to 10.When unobstructed, if the influence value for obtaining range sensor exceeds 0
To 10 this scope, such as more than 10, then the information and presupposed information for illustrating the range sensor obtained are mismatched etc., herein not
Enumerate again.
Step 204, abnormal information is captured with graphic form, the keyword corresponding to abnormal information is printed in picture.
It is noted that keyword can refer to running log log printing marks.Such as, log printings are designated [AUTO_
TEST_FAIL]TP read VB at error.Then keyword can be [AUTO_TEST_FAIL] TP read VB at
Error, or VB, for indicating display screen abnormal electrical power supply.Log printings are designated [AUTO_TEST_FAIL] TP read
I2C test error.Then keyword can be [AUTO_TEST_FAIL] TP read I2C test error, or
TP, the I for indicating display screen2C pin breakages etc..Example is intended only as above to illustrate, and is not caused to the present invention's
Limitation, is no longer enumerated herein.
Specifically, it is abnormal by running to when detecting electronic device generation exception during automatic physical examination
The program of electronic device is with graphic form sectional drawing.In sectional drawing, keyword is printed in picture.It should be noted that can be with
Keyword is printed into waken up in picture destination locations, e.g., upper left corner or the upper right corner of picture etc..In this way so that can
More accurately quickly and easily to know fault message from failure file according to keyword, to carry out maintenance process；And
And research staff can be according to the more accurate fault message quickly and easily known from failure file of keyword to electronics
Device carries out analysis maintenance, so as to the technological improvement in later stage.
Step 205, the picture of abnormal information is classified according to keyword.
It is noted that occurring exception if there is multiple electronic devices, then can there are multiple sectional drawings, multiple sectional drawing meetings
Generate failure file.Specifically, because every figure all has keyword.So can be according to the matching degree of keyword, to exception
The picture of information is classified.In this way so that the fault message of electronic device can preferably be classified, from
And user more accurately can easily know the fault message of electronic device from failure file, event is obtained so as to improve
Hinder the efficiency of information.
Step 206, the classification according to where the picture of abnormal information, generates failure file.
Step 207, failure file is stored to specified catalogue.User is adjusted to the failure file of storage
With, check and the operation such as analyze.
Specifically, with keyword name catalogue file folder；Keyword in picture, same class failure file is deposited
Storage is into corresponding catalogue file folder.In this way so that user can be called and look into the failure file of storage
See.Also, in actual application, after-sales service personnel can out there is provided analyzed to research staff failure file copy
Deeper into and it is accurate the reason for, also provide better quality for later software.Meanwhile, user can be according to the name of file
Fault message directly perceived convenient and that electronic device is quickly known from failure file.
Step 208, by failure files passe to backstage.User is looked into the failure file for uploading to backstage
See and analyze.
It should be noted that step 208 be not limited to after step 207 perform, can also first by failure files passe extremely
Backstage, then failure file is stored to specified catalogue.Stored by failure file to specified catalogue, can also be by event
Barrier file is shown, allows user that more intuitively the failure file of display is checked and analyzed.Or by failure
While files passe to backstage, failure file can also be shown.
By the above, it is seen that, present embodiment allows maintenance personal's rapid and convenient from failure file
Know fault message, to carry out maintenance process；And research staff can quickly and easily know event from failure file
Hinder information, and come with this to electronic device progress analysis maintenance, so as to the technological improvement in later stage.
The step of various methods are divided above, be intended merely to description it is clear, can be merged into when realizing a step or
Some steps are split, multiple steps are decomposed into, as long as including identical logical relation, all protection domain in this patent
It is interior；To adding inessential modification in algorithm or in flow or introducing inessential design, but its algorithm is not changed
Core design with flow is all in the protection domain of the patent.
Third embodiment of the invention is related to a kind of automatically generating device of terminal equipment failure, as shown in figure 3, terminal is set
The automatically generating device of standby failure includes：Scan module 31, for scanning electronic devices all in the terminal device；Obtain
Module 32, the information for obtaining each electronic device successively；Matching module 33, for the described information of acquisition to be believed with default
Matched between breath；Judge module 34, for the matching relationship between the described information and presupposed information according to acquisition, successively
Judge whether each electronic device occurs exception；Generation module 35, for when the electronic device occurs abnormal, to scheme
Sheet form captures abnormal information, generates failure file.
By the above, it is seen that, present embodiment allows to know the soft of electronic device from failure file
Whether part part breaks down, so that maintenance personal can repair according to the fault message in failure file to electronic device
Processing；Or application developer can carry out analysis maintenance according to the fault message in failure file to electronic device, so as to
Improvement of the later stage to software quality and technology.
It is seen that, present embodiment is the device embodiment corresponding with first embodiment, and present embodiment can be with
First embodiment is worked in coordination implementation.The relevant technical details mentioned in first embodiment still have in the present embodiment
Effect, in order to reduce repetition, is repeated no more here.Correspondingly, the relevant technical details mentioned in present embodiment are also applicable in
In first embodiment.
It is noted that each module involved in present embodiment is logic module, in actual applications, one
Individual logic unit can be a part for a physical location or a physical location, can also be with multiple physics lists
The combination of member is realized.In addition, will not be with solving institute of the present invention in the innovative part in order to protrude the present invention, present embodiment
The technical problem relation of proposition less close unit is introduced, but this be not intended that in present embodiment be not present it is other single
Member.
Four embodiment of the invention is related to a kind of automatically generating device of terminal equipment failure.4th embodiment be
The improvement done on the basis of 3rd embodiment, is mainly theed improvement is that：In the 4th embodiment, terminal equipment failure
Automatically generating device also includes print module.
As shown in figure 4, the automatically generating device of terminal equipment failure includes：Scan module 31, for scanning the terminal
All electronic devices in equipment；Acquisition module 32, the information for obtaining each electronic device successively；Matching module 33, is used
In will be matched between the described information of acquisition and presupposed information；Judge module 34, for the described information according to acquisition with
Matching relationship between presupposed information, judges whether each electronic device occurs exception successively；Generation module 35, for
When the electronic device occurs abnormal, abnormal information is captured with graphic form, failure file is generated.
In addition, the automatically generating device of terminal equipment failure also includes：Print module 36, for described with graphic form
When capturing abnormal information, the keyword corresponding to the abnormal information is printed in the picture.
In addition, the automatically generating device of terminal equipment failure also includes：Sort module 37, for described with graphic form
Capture after abnormal information, before the generation failure file, the picture of the abnormal information is carried out according to the keyword
Classification；Generation module 35, is additionally operable in the generation failure file, the classification according to where the picture of the abnormal information,
Generate failure file.
In addition, the automatically generating device of terminal equipment failure also includes：Memory module 38, in the generation failure text
After part, the failure file is stored to specified catalogue.
By the above, it is seen that, present embodiment allows maintenance personal's rapid and convenient from failure file
Know fault message, to carry out maintenance process；And research staff can quickly and easily know event from failure file
Hinder information, and come with this to electronic device progress analysis maintenance, so as to the technological improvement in later stage.
Because second embodiment is mutually corresponding with present embodiment, therefore present embodiment can be mutual with second embodiment
It is engaged implementation.The relevant technical details mentioned in second embodiment are still effective in the present embodiment, implement second
The technique effect that can be reached in mode can similarly be realized in the present embodiment, in order to reduce repetition, no longer be gone to live in the household of one's in-laws on getting married here
State.Correspondingly, the relevant technical details mentioned in present embodiment are also applicable in second embodiment.
It will be appreciated by those skilled in the art that realizing that all or part of step in above-described embodiment method can be by
Program instructs the hardware of correlation to complete, and the program storage is in a storage medium, including some instructions are to cause one
Individual equipment (can be single-chip microcomputer, chip etc.) or processor (processor) perform the whole of each embodiment method of the application
Or part steps.And foregoing storage medium includes：USB flash disk, mobile hard disk, read-only storage (ROM, Read-Only
Memory), random access memory (RAM, Random Access Memory), magnetic disc or CD etc. are various can store journey
The medium of sequence code.
It will be understood by those skilled in the art that the respective embodiments described above are to realize the specific embodiment of the present invention,
And in actual applications, can to it, various changes can be made in the form and details, without departing from the spirit and scope of the present invention.
Claims (10)
1. a kind of automatic generation method of terminal equipment failure, it is characterised in that including：
Electronic devices all in the terminal device are scanned, the information of each electronic device is obtained successively；
According to the matching relationship between the described information and presupposed information of acquisition, judge whether each electronic device is sent out successively
It is raw abnormal；
When the electronic device occurs abnormal, abnormal information is captured with graphic form, failure file is generated.
2. the automatic generation method of terminal equipment failure according to claim 1, it is characterised in that described with picture shape
When formula captures abnormal information, the keyword corresponding to the abnormal information is printed in the picture.
3. the automatic generation method of terminal equipment failure according to claim 2, it is characterised in that described with graphic form
Capture after abnormal information, before the generation failure file, the automatic generation method of the terminal equipment failure also includes：
The picture of the abnormal information is classified according to the keyword；
In the generation failure file, the classification according to where the picture of the abnormal information generates failure file.
4. the automatic generation method of terminal equipment failure according to claim 2, it is characterised in that the generation failure text
After part, the automatic generation method of the terminal equipment failure also includes：The failure file is stored to specified catalogue.
5. the automatic generation method of terminal equipment failure according to claim 4, it is characterised in that described by failure file
Store to specified catalogue, specifically include：
With keyword name catalogue file folder；
Keyword in picture, same class failure file is stored into corresponding catalogue file folder.
6. the automatic generation method of terminal equipment failure as claimed in any of claims 1 to 5, it is characterised in that
After the generation failure file, the automatic generation method of the terminal equipment failure also includes：By the failure files passe
To backstage；And/or, the failure file is shown.
7. a kind of automatically generating device of terminal equipment failure, it is characterised in that including：
Scan module, for scanning electronic devices all in the terminal device；
Acquisition module, the information for obtaining each electronic device successively；
Matching module, for will be matched between the described information of acquisition and presupposed information；
Judge module, for the matching relationship between the described information and presupposed information according to acquisition, judges each described successively
Whether electronic device occurs exception；
Generation module, for when the electronic device occurs abnormal, abnormal information, generation failure text to be captured with graphic form
Part.
8. the automatically generating device of terminal equipment failure according to claim 7, it is characterised in that the terminal device event
The automatically generating device of barrier also includes：
Print module, in the crawl abnormal information with graphic form, by corresponding to the keyword of the abnormal information
Print in the picture.
9. the automatically generating device of terminal equipment failure according to claim 8, it is characterised in that the terminal device event
The automatically generating device of barrier also includes：
Sort module, for after the crawl abnormal information with graphic form, before the generation failure file, according to institute
Keyword is stated to classify to the picture of the abnormal information；
Generation module, is additionally operable in the generation failure file, the classification according to where the picture of the abnormal information, generation
Failure file.
10. the automatically generating device of terminal equipment failure according to claim 8, it is characterised in that the terminal device
The automatically generating device of failure also includes：
Memory module, for after the generation failure file, the failure file to be stored to specified catalogue.
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| CN107590039A (en) * | 2017-08-31 | 2018-01-16 | 郑州云海信息技术有限公司 | A kind of continuous test method, device and storage medium |
| CN108012015A (en) * | 2017-12-14 | 2018-05-08 | 北京易诚高科科技发展有限公司 | Mobile phone recessiveness BUG quick determination methods |
| CN109522944A (en) * | 2018-10-30 | 2019-03-26 | 中国运载火箭技术研究院 | A kind of spacecraft failure various dimensions rapid classification method |
| CN113237473A (en) * | 2021-05-20 | 2021-08-10 | 广州绿怡信息科技有限公司 | Compass function detection method and device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107590039A (en) * | 2017-08-31 | 2018-01-16 | 郑州云海信息技术有限公司 | A kind of continuous test method, device and storage medium |
| CN108012015A (en) * | 2017-12-14 | 2018-05-08 | 北京易诚高科科技发展有限公司 | Mobile phone recessiveness BUG quick determination methods |
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| CN109522944A (en) * | 2018-10-30 | 2019-03-26 | 中国运载火箭技术研究院 | A kind of spacecraft failure various dimensions rapid classification method |
| CN109522944B (en) * | 2018-10-30 | 2022-12-13 | 中国运载火箭技术研究院 | Multi-dimensional rapid classification method for faults of spacecraft |
| CN113237473A (en) * | 2021-05-20 | 2021-08-10 | 广州绿怡信息科技有限公司 | Compass function detection method and device |
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