CN106918776A - A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals - Google Patents
A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals Download PDFInfo
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- CN106918776A CN106918776A CN201710326966.8A CN201710326966A CN106918776A CN 106918776 A CN106918776 A CN 106918776A CN 201710326966 A CN201710326966 A CN 201710326966A CN 106918776 A CN106918776 A CN 106918776A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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- General Engineering & Computer Science (AREA)
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- General Physics & Mathematics (AREA)
- Testing Or Calibration Of Command Recording Devices (AREA)
Abstract
The present invention provides a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals, including test circuit plate main body and external Nano decks, external Micro SIM card holders, several LED signal indicator lamps and several testing needle contacts for being arranged in the test circuit plate main body；Test circuit plate main body one end is outward extended with the connection-peg for inserting apparatus connecting mouthful to be detected；And the welding of the connection-peg back side is provided with the pad of simulation Nano SIMs；Connection-peg backside pads, external Nano decks, external Micro SIM card holders, LED signal indicator lamp and testing needle contact site all have VCC, CLK, RST, IO and VPP contacts, the design carries out signal designation using low pressure red LED lamp, can in real time, dynamically, accurately show whether there is per the state of signal all the way, quickly positioning is which signal is not turned on to facilitate engineers and technicians and ordi-nary maintenance personnel, reliability is high, allows the engineering developme personnel being capable of more convenient, quick analyzing and positioning problem.
Description
[technical field]
The present invention relates to SIM testing equipment technical fields, more particularly to a kind of detection speed is fast, accuracy is high and user
The instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals just.
[background technology]
In the panel computer used in daily life, the data of 2G/3G call functions and 4G-LTE typically can be all carried
Transmitting function, essential in the panel computer of these functions in band to retain sim card slot, SIM is connection operation
The family identification card of business, only SIM are by correctly by being put into panel computer sim card slot, panel computer can be completed
GMS communications, Wireless data transmission.Because sim card slot is often plugged, thus sim card slot be easy to occur it is bad, for example, SIM
Draw-in groove inside shell fragment fracture, deformation, draw-in groove rosin joint the problems such as appearance may result in SIM can not with operator's normal communication,
So as to cause panel computer just to converse and use 2G/3G/4G networks.
It is more difficult for general user to tell that SIM is bad or SIM slot is bad after there is above-mentioned situation.Based on this,
Which it is accomplished by a kind of can not only helping user accurately to tell to be which kind of is bad, can also accurately judge it is signal
The detecting instrument for going wrong.
According to above mentioned problem, those skilled in the art has carried out substantial amounts of research and development and experiment, from the structure and work(of product
Energy aspect is started with and is improved and improves, and achieves preferable achievement.
[content of the invention]
To overcome the problems of prior art, a kind of detection speed of present invention offer is fast, accuracy is high and user
The instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals just.
The scheme of present invention solution technical problem is to provide a kind of instrument of Intelligent Measurement Nano SIM Dynamic Signals and sets
It is standby, including test circuit plate main body and the external Nano decks, the external Micro SIM that are arranged in the test circuit plate main body
Deck, several LED signal indicator lamps and several testing needle contacts；Described test circuit plate main body one end is outward extended with
Connection-peg for inserting apparatus connecting mouthful to be detected；And connection-peg back side welding is provided with simulation Nano SIMs
Pad；The external Nano decks, external Micro SIM card holders are located at the middle part of test circuit plate main body, and LED signal refers to
Show that lamp is set near external Nano decks, testing needle contact is set near external Micro SIM card holders；And the external Nano cards
Seat, external Micro SIM card holders, several LED signal indicator lamps and several testing needle contacts are electrically connected with；The connection-peg
Backside pads, external Nano decks, external Micro SIM card holders, LED signal indicator lamp and testing needle contact site all have
VCC, CLK, RST, IO and VPP contact.
Preferably, the VCC contacts of the pad are connected with the VCC contacts of external Nano decks, external Micro SIM card holders
Connect；The CLK contacts of pad are connected with the CLK contacts of external Nano decks, external Micro SIM card holders；The RST contacts of pad
RST contacts with external Nano decks, external Micro SIM card holders are connected.
Preferably, the length of each pad is 1.7mm in the connection-peg backside pads, and width is 0.84mm；Connection-peg
Width be 8.8mm；The width of test circuit plate main body is 36mm；The entire length of test circuit plate main body is 60mm.
Preferably, the quantity of the LED signal indicator lamp is five, in single setting arranged side by side；The quantity of testing needle contact
It it is nine, eight testing needle contacts are set in parallelly-arranged double-row, and another testing needle contact is arranged in two row's testing needle contacts
Between position.
Preferably, five LED signal indicator lamps correspond to VCC, RST, VPP, IO and CLK contact respectively；When detection is believed
When number normal, LED signal indicator lamp shiny red, wherein VCC, RST, VPP corresponding LED signal indicator lamp Chang Liang, IO and CLK pairs
The LED signal indicator lamp answered flashes.
Preferably, each pin surface gold-plating treatment of the external Micro SIM card holders, forms Gold plated Layer.
Preferably, the thickness of the test circuit plate main body is 0.7mm.
Preferably, the conducting voltage scope of the LED signal indicator lamp is 1.65-3.3V.
Compared with prior art, a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals of the invention is by surveying
Examination circuit board main body sets external Nano decks, external Micro SIM card holders, several LED signal indicator lamps being electrically connected with
And several testing needle contacts, using grafting connector analog Nano SIM profiles, drawing test stand (pad) is used to detect
Every signal all the way of panel computer SIM, such design allows the signal that engineers and technicians are directly tested on SIM
And waveform, the time of the fly line on mainboard is reduced, and can also quickly position whether Nano sim card slots belong to failure welding,
Improve under present circumstances, due to the problem that the welding pin of many Nano SIMs can not be tested directly inside draw-in groove,
The design carries out signal designation using low pressure red LED lamp, can in real time, dynamically, accurately show per signal all the way
State whether there is, and quickly positioning is which signal is not led can so to facilitate engineers and technicians and ordi-nary maintenance personnel
Logical, which signal there is a problem that reliability is high in quick location panel computer Nano SIM card holders, can significantly improve engineering
Research staff and ordi-nary maintenance personnel solve the problems, such as it is related to analysis Nano SIMs in efficiency, allow engineering developme personnel
Being capable of more convenient, quick analyzing and positioning problem.
[brief description of the drawings]
Fig. 1 is a kind of stereoscopic-state structural representation of the instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals of the invention
Figure.
Fig. 2 is a kind of stereo structure at another visual angle of the instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals of the invention
State structural representation.
[specific embodiment]
To make the purpose of the present invention, technical scheme and advantage become more apparent, below in conjunction with drawings and Examples, to this
Invention is further elaborated.It should be appreciated that specific embodiment described herein is used only for explaining the present invention, not
For limiting this invention.
Fig. 1 and Fig. 2 is referred to, a kind of instrument and equipment 1 of Intelligent Measurement Nano SIM Dynamic Signals of the invention includes surveying
Examination circuit board main body 11 and the external Nano decks 114, the external Micro SIMs that are arranged in the test circuit plate main body 11
Seat 115, several LED signal indicator lamps 111 and several testing needle contacts 113；Described one end of test circuit plate main body 11
It is outward extended with the connection-peg 13 for inserting apparatus connecting mouthful to be detected；And welding is provided with mould at the back side of the connection-peg 13
Intend the pad of Nano SIMs；The external Nano decks 114, external Micro SIM card holders 115 are located at test circuit plate main body
11 middle part, LED signal indicator lamp 111 is set near external Nano decks 114, and testing needle contact 113 is near external
Micro SIM card holders 115 are set；And the external Nano decks 114, external Micro SIM card holders 115, several LED signals
Indicator lamp 111 and several testing needle contacts 113 are electrically connected with；The backside pads of the connection-peg 13, external Nano decks 114,
External Micro SIM card holders 115, LED signal indicator lamp 111 and the position of testing needle contact 113 all have VCC, CLK, RST,
IO and VPP contacts.
By in test circuit plate main body 11, the external Nano decks 114, the external Micro SIM card holders that are electrically connected with are set
115th, several LED signal indicator lamps 111 and several testing needle contacts 113, Nano SIMs are simulated using connection-peg 13
Profile, drawing test stand (pad) is used to detect every signal all the way of panel computer SIM, and such design causes engineering skill
Signal and waveform that art personnel can be directly tested on SIM, reduce the time of the fly line on mainboard, and can also quickly determine
Whether position Nano sim card slots belong to failure welding, improve under present circumstances, due to the welding pin of many Nano SIMs
The problem that can not be directly tested inside draw-in groove, the design carries out signal designation using low pressure red LED lamp, can be real-time
, it is dynamic, accurately show and whether there is per the state of signal all the way, can so facilitate engineers and technicians and common dimension
Quickly positioning is which signal is not turned on to repair personnel, and which signal occurs in quick location panel computer Nano SIM card holders
Problem, reliability is high, can significantly improve engineering developme personnel and ordi-nary maintenance personnel and solve and analyzing Nano SIMs
Efficiency in related problem, allows the engineering developme personnel being capable of more convenient, quick analyzing and positioning problem.
Preferably, the VCC contacts of the pad are touched with the VCC of external Nano decks 114, external Micro SIM card holders 115
Point is connected；The CLK contacts of pad are connected with the CLK contacts of external Nano decks 114, external Micro SIM card holders 115；
The RST contacts of pad are connected with the RST contacts of external Nano decks 114, external Micro SIM card holders 115.Circuit design is closed
Reason, using effect is good.
Preferably, the length of each pad 131 is 1.7mm in the backside pads of the connection-peg 13, and width is 0.84mm；Insert
The width of joint 13 is 8.8mm；The width of test circuit plate main body 11 is 36mm；The entire length of test circuit plate main body 11 is
60mm。
Preferably, the quantity of the LED signal indicator lamp 111 is five, in single setting arranged side by side；Testing needle contact 113
Quantity be nine, eight testing needle contacts 113 in parallelly-arranged double-row set, another testing needle contact 113 be arranged at two rows survey
The middle part of test point contact 113.
Preferably, five LED signal indicator lamps 111 correspond to VCC, RST, VPP, IO and CLK contact respectively；Work as detection
When signal is normal, the corresponding Chang Liang of LED signal indicator lamp 111 of the shiny red of LED signal indicator lamp 111, wherein VCC, RST, VPP,
The corresponding LED signal indicator lamps 111 of IO and CLK flash.Such design more can intuitively judge abnormal conditions.
Preferably, each pin surface gold-plating treatment of the external Micro SIM card holders 114, forms Gold plated Layer.Improve
Service life.
Preferably, the thickness of the test circuit plate main body 11 is 0.7mm.
Preferably, the conducting voltage scope of the LED signal indicator lamp 111 is 1.65-3.3V.SIM letters generally used now
Number level be 1.65-3.0V, the conducting voltage of LED is 3.0V, if selection conducting voltage for 3.0V LED, then
When 1.8V signals are tested, LED will not show red, so the conducting voltage of LED signal indicator lamp 111 is set
Between 1.65-3.3V.
During actually detected, using the instrument for inserting on 2 model machines this Intelligent Measurement Nano SIM Dynamic Signals
Equipment 1, uses universal meter (model：Fluke 15B+), by general-purpose regulation to buzzing gear, positive contact test circuit plate main body
RST testing needles contact 113 on 11, the decoupling capacitance in parallel on cathode contact model machine mainboard on RST signal line, if universal meter
Pipe, then illustrate that circuit is conducting, the welding of Nano sim card slots is that OK (can be from outward appearance if belonging to draw-in groove shell fragment problem
Find out).Conversely, then explanation is Welding Problems.
When the instrument and equipment 1 of Intelligent Measurement Nano SIM Dynamic Signals of the present invention is inserted on 2 model machines, such as arnotto
Color LED signal indicator lamp 111 is normally lighted or flashed, then may determine that the corresponding signal of LED signal indicator lamp 111 or electricity
Source is normal work.Which signal OK so can be accurately determined, which signal is Fail.
Compared with prior art, a kind of instrument and equipment 1 of Intelligent Measurement Nano SIM Dynamic Signals of the invention by
Test circuit plate main body 11 sets external Nano decks 114, external Micro SIM card holders 115, several LED being electrically connected with
Signal lamp 111 and several testing needle contacts 113, Nano SIM profiles are simulated using connection-peg 13, draw test
Stand (pad) is used to detect every signal all the way of panel computer SIM, and such design allows that engineers and technicians are straight
The signal and waveform on test SIM are connect, the time of the fly line on mainboard is reduced, and can also quickly position Nano SIMs
Whether groove belongs to failure welding, improves under present circumstances, due to many Nano SIMs welding pin inside draw-in groove and
The problem that can not directly test, the design carries out signal designation using low pressure red LED lamp, can in real time, dynamically, precisely
State of the display per signal all the way whether there is, can so facilitate engineers and technicians and ordi-nary maintenance personnel quickly fixed
Position is which signal is not turned on, and which signal there is a problem in quick location panel computer Nano SIM card holders, reliability
Height, can significantly improve engineering developme personnel and ordi-nary maintenance personnel solve the problems, such as it is related to analysis Nano SIMs in
Efficiency, allows the engineering developme personnel being capable of more convenient, quick analyzing and positioning problem.
Invention described above implementation method, is not intended to limit the scope of the present invention..It is any in the present invention
Spirit and principle within modification, equivalent and the improvement made etc., should be included in claim protection model of the invention
Within enclosing.
Claims (8)
1. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals, it is characterised in that：Including test circuit plate main body
And the external Nano decks that are arranged in the test circuit plate main body, external Micro SIM card holders, several LED signals refer to
Show lamp and several testing needle contacts；Described test circuit plate main body one end is outward extended with inserts for inserting measurement equipment to be checked
The connection-peg of interface；And connection-peg back side welding is provided with the pad of simulation Nano SIMs；The external Nano cards
Seat, external Micro SIM card holders are located at the middle part of test circuit plate main body, and LED signal indicator lamp is near external Nano cards
Seat is set, and testing needle contact is set near external Micro SIM card holders；And the external Nano decks, external Micro SIMs
Seat, several LED signal indicator lamps and several testing needle contacts are electrically connected with；The connection-peg backside pads, external Nano
Deck, external Micro SIM card holders, LED signal indicator lamp and testing needle contact site all have VCC, CLK, RST, IO and
VPP contacts.
2. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 1, it is characterised in that：Institute
The VCC contacts for stating pad are connected with the VCC contacts of external Nano decks, external Micro SIM card holders；The CLK contacts of pad
CLK contacts with external Nano decks, external Micro SIM card holders are connected；The RST contacts of pad and external Nano decks,
The RST contacts of external Micro SIM card holders are connected.
3. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 1, it is characterised in that：Institute
The length of each pad in connection-peg backside pads is stated for 1.7mm, width is 0.84mm；The width of connection-peg is 8.8mm；Test
The width of circuit board main body is 36mm；The entire length of test circuit plate main body is 60mm.
4. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 1, it is characterised in that：Institute
The quantity of LED signal indicator lamp is stated for five, in single setting arranged side by side；The quantity of testing needle contact is nine, eight testing needles
Contact is set in parallelly-arranged double-row, and another testing needle contact is arranged at the middle part of two row's testing needle contacts.
5. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 4, it is characterised in that：Institute
State five LED signal indicator lamps and correspond to VCC, RST, VPP, IO and CLK contact respectively；When detection signal is normal, LED signal refers to
Show lamp shiny red, the wherein corresponding LED signal indicator lamps of VCC, RST, VPP corresponding LED signal indicator lamp Chang Liang, IO and CLK
Flicker.
6. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 1, it is characterised in that：Institute
Each pin surface gold-plating treatment of external Micro SIM card holders is stated, Gold plated Layer is formed.
7. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 1, it is characterised in that：Institute
The thickness for stating test circuit plate main body is 0.7mm.
8. a kind of instrument and equipment of Intelligent Measurement Nano SIM Dynamic Signals as claimed in claim 1, it is characterised in that：Institute
The conducting voltage scope for stating LED signal indicator lamp is 1.65-3.3V.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710326966.8A CN106918776A (en) | 2017-05-10 | 2017-05-10 | A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710326966.8A CN106918776A (en) | 2017-05-10 | 2017-05-10 | A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106918776A true CN106918776A (en) | 2017-07-04 |
Family
ID=59568421
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710326966.8A Pending CN106918776A (en) | 2017-05-10 | 2017-05-10 | A kind of instrument and equipment of Intelligent Measurement NanoSIM card Dynamic Signals |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106918776A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107271887A (en) * | 2017-07-27 | 2017-10-20 | 惠州Tcl移动通信有限公司 | A kind of two-in-one smart card tester and test system |
| CN107843272A (en) * | 2017-12-14 | 2018-03-27 | 九江精密测试技术研究所 | A kind of rotary transformer resolves modular system |
| CN113687210A (en) * | 2021-07-16 | 2021-11-23 | 广州市雅江光电设备有限公司 | Method, device and system for testing welding effect of lamp PCB |
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| US6400965B1 (en) * | 1999-07-13 | 2002-06-04 | Ericsson Inc. | Cellular phone handset SIM card reader and method for testing and updating a cellular phone handset memory |
| CN204740313U (en) * | 2015-07-16 | 2015-11-04 | 青岛海信移动通信技术股份有限公司 | Cassette test fixture |
| CN204807647U (en) * | 2015-07-27 | 2015-11-25 | 深圳市酷赛电子工业有限公司 | Test panel and testing arrangement are surveyed to cell -phone cassette |
| CN205786893U (en) * | 2016-05-20 | 2016-12-07 | 深圳铂睿智恒科技有限公司 | A kind of mobile phone card seat test board |
| CN106291182A (en) * | 2016-08-04 | 2017-01-04 | 上海与德通讯技术有限公司 | The deck test device of mobile terminal |
| CN206440800U (en) * | 2017-01-19 | 2017-08-25 | 捷开通讯(深圳)有限公司 | A kind of SIM card neck detection means |
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2017
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Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6400965B1 (en) * | 1999-07-13 | 2002-06-04 | Ericsson Inc. | Cellular phone handset SIM card reader and method for testing and updating a cellular phone handset memory |
| CN204740313U (en) * | 2015-07-16 | 2015-11-04 | 青岛海信移动通信技术股份有限公司 | Cassette test fixture |
| CN204807647U (en) * | 2015-07-27 | 2015-11-25 | 深圳市酷赛电子工业有限公司 | Test panel and testing arrangement are surveyed to cell -phone cassette |
| CN205786893U (en) * | 2016-05-20 | 2016-12-07 | 深圳铂睿智恒科技有限公司 | A kind of mobile phone card seat test board |
| CN106291182A (en) * | 2016-08-04 | 2017-01-04 | 上海与德通讯技术有限公司 | The deck test device of mobile terminal |
| CN206440800U (en) * | 2017-01-19 | 2017-08-25 | 捷开通讯(深圳)有限公司 | A kind of SIM card neck detection means |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107271887A (en) * | 2017-07-27 | 2017-10-20 | 惠州Tcl移动通信有限公司 | A kind of two-in-one smart card tester and test system |
| CN107843272A (en) * | 2017-12-14 | 2018-03-27 | 九江精密测试技术研究所 | A kind of rotary transformer resolves modular system |
| CN113687210A (en) * | 2021-07-16 | 2021-11-23 | 广州市雅江光电设备有限公司 | Method, device and system for testing welding effect of lamp PCB |
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Application publication date: 20170704 |