CN106908685A - A kind of test system and its method of testing of mutual capacitance type touch display unit - Google Patents

A kind of test system and its method of testing of mutual capacitance type touch display unit Download PDF

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Publication number
CN106908685A
CN106908685A CN201710100551.9A CN201710100551A CN106908685A CN 106908685 A CN106908685 A CN 106908685A CN 201710100551 A CN201710100551 A CN 201710100551A CN 106908685 A CN106908685 A CN 106908685A
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China
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test
display unit
touch
electrode
solder joint
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CN201710100551.9A
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CN106908685B (en
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陈彩琴
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Wuhan China Star Optoelectronics Technology Co Ltd
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Wuhan China Star Optoelectronics Technology Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/58Testing of lines, cables or conductors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

The embodiment of the invention discloses a kind of test system of mutual capacitance type touch display unit, including:Test power supply;Test point disk, including more several first test solder joints, more several second test solder joints, the 3rd test solder joint;Touch unit, it includes that many several touch driving electrodes and many several touch-sensing electrodes;Test display apparatus, it includes more several first display units and more several second display units, each display unit includes first electrode and second electrode, second end of the first electrode of first display unit respectively with the different touch driving electrodes is connected, and the second end of the first electrode of second display unit respectively with the different touch-sensing electrode electrically connects;Second electrode electrical connection the 3rd test solder joint of first display unit and second display unit.The embodiment of the invention also discloses a kind of method of testing.Using the present invention, short-circuit, testing efficiency is high between having the advantages that two electrodes can be tested.

Description

A kind of test system and its method of testing of mutual capacitance type touch display unit
Technical field
The invention belongs to testing field, specifically, be related to a kind of test system of mutual capacitance type touch display unit and Its method of testing.
Background technology
Existing mutual capacitance touch display device, needs to enter the touch unit of touch display unit before product is assembled into Row detection, test touch unit whether normal work, such as test touch driving electrodes TX whether short circuit, open circuit, test touch Whether sensing electrode RX is short-circuit, short circuit, if touch unit goes wrong, could be by touch display unit group after needing to repair Dress up product.
The touch electrode of existing test touch unit it is whether problematic it is general by open/short detections board (open circuit/ Short-circuit detecting board), open/short detection boards are provided with two row's terminals, wherein row's terminal connects many several touches driving electrodes The other end of driving electrodes TX is touched in one end of TX, in addition row's calibrating terminal correspondence contact, then open/short detections board Timesharing input test signal detects a pair of terminal of board to open/short, for example, first time period open/short is detected Board input test signal is completed by terminal reception signal to first one end for touching driving electrodes TX, the other end with this First test for touching driving electrodes TX open circuits, and the test of electrode TX short circuits is contradicted with adjacent Article 2 first, equally, Second time period completes the test that Article 2 touches driving electrodes TX open circuits, and Article 2 touches driving electrodes and touched with Article 3 The test of electric pole short circuit is touched, the like, until completing all of test for touching driving electrodes TX, next, open/ Two row's terminals of short detection boards disconnect with driving electrodes TX is touched, and then, open/short detects two row's terminals of board It is connected with touch-sensing electrode RX, equally, open/short detects that board timesharing input test signal is detected to open/short A pair of terminal of board, to complete short circuit, the out of circuit test of touch-sensing electrode RX.
It was found by the inventors of the present invention that existing by open/short during testing above-mentioned touch unit Detection board test touch driving electrodes TX and touch-sensing electrode RX during, cannot test out touch driving electrodes TX with In short circuit between touch-sensing electrode RX, namely touch driving electrodes TX in a strip electrode and touch-sensing electrode RX one During strip electrode short circuit, above-mentioned method of testing cannot be tested out;And, above-mentioned method of testing is comparatively laborious, takes time and effort More, testing efficiency is low.
The content of the invention
Embodiment of the present invention technical problem to be solved is, there is provided a kind of test of mutual capacitance type touch display unit System and its method of testing.The short circuit that can be used between test touch driving electrodes and touch-sensing electrode, and testing efficiency is high.
In order to solve the above-mentioned technical problem, first aspect present invention provides a kind of survey of mutual capacitance type touch display unit Test system, including:
Test power supply, it is used to export more several test voltages;
Test point disk, including more several first test solder joints, more several second test solder joints, the 3rd test solder joint, it is described First test solder joint, the second test solder joint, the 3rd test solder joint receive the test voltage;
Touch unit, it includes that many several touch driving electrodes and many several touch-sensing electrodes, and the touch drives electricity First end electrical connection the first test solder joint of pole, first end electrical connection the second test weldering of the touch-sensing electrode Point, adjacent the first test solder joint for touching driving electrodes electrical connection is different, and the adjacent touch-sensing electrode is electrically connected The the second test solder joint for connecing is different;
Test display apparatus, it includes more several first display units and more several second display units, and each display is single Unit includes first electrode and second electrode, and the first electrode of first display unit is driven with the different touch respectively The second end connection of moving electrode, the first electrode of second display unit respectively with the different touch-sensing electrode The second end electrical connection;The second electrode electrical connection the described 3rd of first display unit and second display unit Test solder joint.
In the embodiment of first aspect present invention one, the number of the first test solder joint is two, is touched described in odd number bar The first end for touching driving electrodes shares one of them described first test solder joint, the first end of touch driving electrodes described in even number bar Share another described first test solder joint;Or/and, the number of the second test solder joint is two, is touched described in odd number bar The first end for touching sensing electrode shares one of them described first test solder joint, the first end of touch-sensing electrode described in even number bar Share another described first test solder joint.
In the embodiment of first aspect present invention one, the bar number for touching driving electrodes and described first tests solder joint Number is identical, and each described touch driving electrodes individually takes the first test solder joint;Or/and,
The bar number of the touch-sensing electrode is identical with the number of the described second test solder joint, each described touch-sensing Electrode individually takes the second test solder joint.
In the embodiment of first aspect present invention one, the number of the 3rd test solder joint is one, first display The second electrode of unit and second display unit receives the test power supply and exports by the described 3rd test solder joint The test voltage;Or
The number of the 3rd test solder joint is multiple, first display unit and second display unit it is described Second electrode is electrically connected the 3rd test solder joint and receives the test electricity by more several 3rd test solder joints The same described test voltage of source output.
In the embodiment of first aspect present invention one, the test display apparatus include first area and second area, institute State first area to be provided separately with the second area, more several first display units are arranged in the first area, More several second display units are arranged in the second area.
In the embodiment of first aspect present invention one, the test display apparatus are the dress beyond the touch display unit Put.
In the embodiment of first aspect present invention one, the touch display unit includes display unit, the display unit Including the test display apparatus.
In the embodiment of first aspect present invention one, the test display apparatus are OLED display, first electricity The anode of extremely described OLED display, the second electrode is the negative electrode of the OLED display;Or, the test Display device is LCD display device, and the first electrode is the pixel electrode of the LCD display device, and the second electrode is The common electrode of the LCD display device.
In the embodiment of first aspect present invention one, the touch display unit also includes display unit, the touch list Unit is arranged on the top of the display unit or the touch unit is arranged in the display unit.
Embodiment of the present invention second aspect provides a kind of test system of above-mentioned mutual capacitance type touch display unit Method of testing, the method includes:
First time period is tested the more several test voltages of power input and is supplied via the first test solder joint, touch driving electrodes To the first electrode of the first display unit, wherein, the two neighboring test voltage for touching driving electrodes reception is respectively height Level and low level;
Second time period is tested the more several test voltages of power input and is supplied via the second test solder joint, touch-sensing electrode To the first electrode of the second display unit, wherein, the test voltage that the two neighboring touch-sensing electrode is received is respectively height Level and low level;
The test same test voltage of power input is supplied to the first display unit and the second display via the 3rd test solder joint The second electrode of unit;
The test voltage that the test voltage and second electrode that first display unit is received according to its first electrode are received is carried out Brightness shows that the test voltage that the test voltage and second electrode that the second display unit is received according to its first electrode are received is carried out Brightness shows.
Implement the embodiment of the present invention, have the advantages that:
Because the test system includes test power supply, test point disk, touch unit, test display apparatus, the test With test power electric connection to access test voltage, the touch unit is electrically connected point disk with the test point disk, the test Display device is electrically connected with the touch unit, so that, by the way that from the different test voltage of test power input, test display is filled Putting can just show different brightness, so as to be shown according to the different brightness of test display apparatus, it is possible to obtain and touch driving Short/the open circuit of electrode, the short/open circuit of touch-sensing electrode, the short circuit between touch driving electrodes and touch-sensing electrode, and survey Examination is simple, efficiency high.
Brief description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, below will be to embodiment or existing The accompanying drawing to be used needed for having technology description is briefly described, it should be apparent that, drawings in the following description are only this Some embodiments of invention, for those of ordinary skill in the art, on the premise of not paying creative work, can be with Other accompanying drawings are obtained according to these accompanying drawings.
Fig. 1 is a kind of schematic diagram of the test system of mutual capacitance type touch display unit of first embodiment of the invention;
Fig. 2 is the method for testing flow chart of first embodiment of the invention test system;
Fig. 3 is a kind of schematic diagram of the test system of mutual capacitance type touch display unit of second embodiment of the invention;
Figure number explanation:
110- tests power supply;120th, 320- test points disk;121st, the tests of 321- first solder joint;122nd, the tests of 322- second weldering Point;123- the 3rd tests solder joint;130- touch units;200- test display apparatus;The display units of 210- first;220- second shows Show unit;230- first electrodes;240- second electrodes;250- first areas;260- second areas;TX- touches driving electrodes; RX- touch-sensing electrodes.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Site preparation is described, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.It is based on Embodiment in the present invention, it is every other that those of ordinary skill in the art are obtained under the premise of creative work is not made Embodiment, belongs to the scope of protection of the invention.
The term " comprising " and " having " occurred in present specification, claims and accompanying drawing and their any changes Shape, it is intended that covering is non-exclusive to be included.For example contain the process of series of steps or unit, method, system, product or Equipment is not limited to the step of having listed or unit, but alternatively also includes the step of not listing or unit, or optional Ground also includes for these processes, method, product or other intrinsic steps of equipment or unit.Additionally, term " first ", " the Two " and " the 3rd " etc. is, for distinguishing different objects, and to be not intended to describe specific order.
First embodiment
Fig. 1 is refer to, a kind of test system of mutual capacitance type touch display unit is the embodiment of the invention provides, including survey Examination power supply 110, test point disk 120, touch unit 130, test display apparatus 200.The touch display unit includes described touching Unit 130 and display unit are touched, the display unit is used to show that the touch unit 130 can be arranged in display unit (in cell), it is also possible to be arranged on display unit top (on cell).
In the present embodiment, the test power supply 110 is used to export multiple test voltages to be supplied to test point disk 120, The test voltage that the test power supply 110 is provided can be with manual control, it is also possible to by automation equipment control, such as by electricity Brain is controlled.The test power supply 110 can be independent power supply, or not independent power supply.
The number of the test point disk 120 (test pad) can be one, or multiple, in the present embodiment for One.The test point disk 120 includes that more several first test solder joints 121, more several second test solder joints the 122, the 3rd are tested Solder joint 123, wherein, the first test solder joint 121, second test test solder joint 123 of solder joint the 122, the 3rd is electric with test respectively Source 110 is electrically connected for receiving the test voltage, and the test power supply 110 can be supplied to the first test solder joint 121, the The different test voltage of the two test test solder joints 123 of solder joint the 122, the 3rd, and more several first test mutual tests of solder joint 121 Voltage can also be different, and the mutual test voltage of several second test solder joints 122 more can also be different.
The touch unit 130 includes that many several for extending in a first direction touch driving electrodes TX and prolong in a second direction Many several touch-sensing electrodes RX for stretching, the touch driving electrodes TX are set with the touch-sensing electrode RX square crossings, In the present embodiment, the touch driving electrodes TX extends along X-direction, and the touch-sensing electrode RX extends along Y direction, Can certainly be in turn;In the present embodiment, the touch unit 130 is mutual capacitance type touch unit.In the present embodiment, The first end (right-hand member in diagram) for touching driving electrodes TX is electrically connected with the described first test solder joint 121, described to touch sense The first end (upper end in diagram) for surveying electrode RX is electrically connected with the described second test solder joint 122, the adjacent touch driving electrodes First test solder joint 121 of TX electrical connections is different, and in the present embodiment, the number of the first test solder joint 121 drives with touch The number of moving electrode TX is identical, and every driving electrodes TX correspondence that touch electrically connects the first different test solder joints 121, namely Each described touch driving electrodes TX individually takes one first test solder joint 121, the first test solder joint 121 not with other Touch driving electrodes TX to share, the second test solder joint 122 of the adjacent touch-sensing electrode RX electrical connections is different, in this implementation In example, the number of the second test solder joint 122 is identical with the number of touch-sensing electrode RX, every touch-sensing electrode The different second tests solder joints 122 of RX correspondence electrical connections, namely each described touch-sensing electrode RX individually takes one the Two test solder joints 122, the second test solder joint 122 is not shared with other touch-sensing electrodes RX.
In the present embodiment, when the test display apparatus 200 are used to be tested, the test display apparatus 200 show Show different brightness, it will thus be seen that touch unit 130 whether short circuit/open circuit.Particularly, the test display apparatus 200 include more several first display units 210 and more several second display units 220, and first display unit 210 can be wrapped Include a pixel, it is also possible to which, including multiple pixels, equally, second display unit 220 can include a pixel, it is also possible to Including multiple pixels, each display unit includes first electrode 230 and second electrode 240, namely each first display unit 210 Including first electrode 230 and second electrode 240, each second display unit 220 also includes first electrode 230 and second electrode 240, in the present embodiment, all second electrodes 240 are electrically connected, and are an entire surface metal level.Described first shows Show that second end (in diagram left end) of the first electrode 230 of unit 210 respectively with the different touch driving electrodes TX is electrically connected Connect, namely the number of the first electrode 230 of the first display unit 210 is identical with the bar number for touching driving electrodes TX, is driven when touching When moving electrode TX is transfused to test voltage, the first electrode 230 of first display unit 210 can receive the test voltage.Institute The first electrode 230 of the second display unit 220 is stated respectively from second end of the different touch-sensing electrode RX (under in diagram End) electrically connect, namely the number of the first electrode 230 of the second display unit 220 is identical with the bar number of touch-sensing electrode RX, when When touch driving electrodes TX is transfused to test voltage, the first electrode 230 of second display unit 220 can receive test electricity Pressure.The second electrode 240 of the display unit 220 of first display unit 210 and second electrically connects the 3rd test solder joint 123, in the present embodiment, the number of the 3rd test solder joint 123 is one, and first display unit 210 and second shows Show that the second electrode 240 of unit 220 is electrically connected to the 3rd test solder joint 123, namely first display unit 210 and institute The second electrode 240 for stating the second display unit 220 receives test power supply by the same 3rd test solder joint 123 The same test voltage of 110 outputs.In addition, in other embodiments of the invention, the number of the 3rd test solder joint also may be used Think multiple, the second electrode of first display unit and second display unit is electrically connected the 3rd survey Test weld point simultaneously receives the same test voltage that test power supply is exported by more several 3rd test solder joints.In the present embodiment, survey Examination display device 200 can be according to pressure difference, second between the first electrode 230 and its second electrode 240 of the first display unit 210 Pressure difference between the first electrode 230 of display unit 220 and its second electrode 240 shows different brightness.
Hereinafter illustrating to illustrate, how whether test touch unit 130 is normal, refers to Fig. 1, in this example embodiment, touches It is 3 to touch the number of driving electrodes TX, and the number of touch-sensing electrode RX is also 3, now, the first test solder joint 121 Number be 3, second test solder joint 122 number also be 3, the 3rd test solder joint 123 number be 1, first display The number of unit 210 is 3, and the number of the second display unit 220 is also 3.Test of the test power supply 110 in first time input Voltage is high level, low level, high level, low level, high level, low level, low level test voltage, works as touch unit 130 it is normal when, test point disk 120, touch unit 130, test display apparatus 200 obtain test voltage and test display apparatus The brightness of 200 displays is respectively such as table one:
Table one
When touch unit 130 is abnormal, such as during first touch driving electrodes TX open circuit, test display apparatus 200 are obtained The brightness of voltage signal and test display apparatus 200 display for obtaining is respectively such as table two:
Table two
Can now be evident that first touch corresponding first display unit 210 of driving electrodes TX be it is dark, from And can be apparent judge that corresponding first of the first display unit 210 touches driving electrodes TX open circuits.
When touch unit 130 is abnormal, it is short that such as first touch driving electrodes TX touches driving electrodes TX with Article 2 Lu Shi, the brightness that the voltage signal and test display apparatus 200 that test display apparatus 200 are obtained show is respectively such as table three:
Table three
Can now be evident that first touches corresponding first display units 210, Article 2 of driving electrodes TX Corresponding first display unit 210 of driving electrodes TX is touched for bright in being all, namely brightness is the brightness between bright and dark, Judge that adjacent two touch driving electrodes TX short circuits such that it is able to apparent.
When touch unit 130 is abnormal, such as first touch driving electrodes TX is short with first touch-sensing electrode RX Lu Shi, the brightness that the voltage signal and test display apparatus 200 that test display apparatus 200 are obtained show is respectively such as table four:
Table four
Can now be evident that first touches corresponding first display units 210, first of driving electrodes TX Corresponding second display units 220 of touch-sensing electrode RX are bright in being all, namely brightness is the brightness between bright and dark; When driving electrodes TX and Article 2 touch-sensing electrode RX short circuits are touched for first, tester can control to test power supply 110 are input into one group of test voltage again, for example, low, high and low, low, high and low, low, can now test out both short circuits. In other embodiment of the invention, one of ordinary skill in the art can also be input into other test voltages, can equally test Go out to touch the short circuit between driving electrodes and touch-sensing electrode.Such that it is able to it is apparent judge to touch driving electrodes TX with Short circuit between touch-sensing electrode RX.
Because the test system includes test power supply 110, test point disk 120, touch unit 130, test display apparatus 200, the test point disk 120 electrically connects to access test voltage, the touch unit 130 and the survey with test power supply 110 Pilot disk 120 is electrically connected, and the test display apparatus 200 are electrically connected with the touch unit 130, so that, by electric from test Source 110 is input into different test voltages, test display apparatus 200 can just show it is bright, in bright, dark brightness, so as to according to survey The different brightness of examination display device 200 shows, it is possible to obtain short/open circuit, the touch-sensing electrode RX for touching driving electrodes TX Short/open circuit, touch short circuit between driving electrodes TX and touch-sensing electrode RX, and test is simple, efficiency high.
In the present embodiment, the test display apparatus 200 include first area 250 and second area 260, described first Region 250 is provided separately with second area 260, and more several first display units 210 are arranged on the first area 250 Interior, more several second display units 220 are arranged in the second area 260.So as to separately be set by by two regions Put, can be to touch driving electrodes TX or touch-sensing electrode RX open/short circuits with more obvious telling, and touch drive Short circuit between moving electrode TX and touch-sensing electrode RX.
In the present embodiment, the test display apparatus 200 are the device beyond touch display unit, namely test display Device 200 is not a part for touch display unit, and now, test display apparatus 200 can be used for different size and touch display The test of device, namely the test display apparatus 200 can be shared, easy to operate.In addition, in other embodiment of the invention In, the test display apparatus can also be a part for touch display unit, can be particularly of display unit Divide, namely the display unit includes the test display apparatus, when in test, touches driving electrodes and the first display unit First electrode electrical connection, touch-sensing electrode is electrically connected with the first electrode of the second display unit, described after being completed Touch driving electrodes and the first display unit first electrode it is cut-off opens, the touch-sensing electrode and the second display unit First electrode is cut off and opens, and this kind of mode can be with cost-effective.
In the present embodiment, the test display apparatus 200 be OLED (Organic Light-Emitting Diode, Organic Light Emitting Diode) display device, the first electrode 230 is the anode of OLED display, and the second electrode 240 is The negative electrode of OLED display, luminescent layer is accompanied between the anode and negative electrode.In addition, in other embodiments of the invention, The test display apparatus 200 can also be LCD display device, and the first electrode 230 is pixel electrode, the second electrode 240 is common electrode, and liquid crystal material is provided between the pixel electrode and the common electrode.
In addition, the present embodiment additionally provides a kind of test side of the test system of above-mentioned mutual capacitance type touch display unit Method, refers to Fig. 1 and Fig. 2, comprises the following steps:
S110:First time period test power supply 110 is input into more several test voltages via the first test solder joint 121, touch Driving electrodes TX is supplied to the first electrode 230 of the first display unit 210, wherein, the two neighboring touch driving electrodes TX The test voltage of reception is respectively high level and low level.
S120:Second time period test power supply 110 is input into more several test voltages via the second test solder joint 122, touch Sensing electrode RX is supplied to the first electrode 230 of the second display unit 220, wherein, the two neighboring touch-sensing electrode RX The test voltage of reception is respectively high level and low level;In the present embodiment, the first time period and second time period are The same time period;Certainly, in other embodiments of the invention, the first time period and second time period can also be difference Time period, now, the first time period may be located at before second time period, it is also possible to after the second time Face.
S130:Test power supply 110 is input into same test voltage and is supplied to the first display unit via the 3rd test solder joint 123 210 and second display unit 220 second electrode 240.
S140:The test voltage and second electrode 240 that first display unit 210 is received according to its first electrode 230 are received Test voltage carry out brightness and show, test voltage and the second electricity that the second display unit 220 is received according to its first electrode 230 The test voltage that pole 240 receives carries out brightness and shows.So as to the brightness according to the first display unit 210 shows, the second display is single The brightness of unit 220 show, it can be determined that go out to touch the short/open circuit of driving electrodes TX, the short/breaking of touch-sensing electrode RX and Touch the short circuit between driving electrodes TX and touch-sensing electrode RX.In the present embodiment, the step of S110-S140 can be carried out Repeatedly.
Second embodiment
A kind of test system of mutual capacitance type touch display unit that Fig. 3 is provided for second embodiment of the invention, the knot of Fig. 3 Structure is similar to the structure of Fig. 1, therefore identical numbers identical element, and the present embodiment is main with first embodiment Difference is test point disk.
Fig. 3 is referred to, in the present embodiment, the number of the first test solder joint 321 is two, and odd number bar is touched and driven The first end of electrode TX is electrically connected to one of them first test solder joint 321, namely odd number bar touches the first of driving electrodes TX End shares one of them first test solder joint 321;Even number article touch driving electrodes TX first end be electrically connected to another the One test solder joint 321, namely the first end of even number bar touch driving electrodes TX shares another first test solder joint 321;Institute The number for stating the second test solder joint 322 is also two, and the first end of odd number bar touch-sensing electrode RX is electrically connected to one of them First test solder joint 321, namely the first end of odd number bar touch-sensing electrode RX shares one of them first test solder joint 321; The first end of even number bar touch-sensing electrode RX is electrically connected to another first test solder joint 321, namely even number bar touches sense The first end for surveying electrode RX shares another first test solder joint 321.So as to, in the present embodiment, the test point disk 320 Area can reduce, and can also reduce with the tie point of test power supply 110, can be with reduces cost and workload, can be with Improve efficiency.In addition, in other embodiments of the invention, the number of the first test solder joint can be two, described the The number of two test solder joints can be identical with the bar number of touch-sensing electrode, or in turn.
It should be noted that each embodiment in this specification is described by the way of progressive, each embodiment weight Point explanation is all difference with other embodiments, between each embodiment identical similar part mutually referring to. For device embodiment, because it is substantially similar to embodiment of the method, so description is fairly simple, related part referring to The part explanation of embodiment of the method.
By the description of above-described embodiment, the present invention has advantages below:
Because the test system includes test power supply, test point disk, touch unit, test display apparatus, the test With test power electric connection to access test voltage, the touch unit is electrically connected point disk with the test point disk, the test Display device is electrically connected with the touch unit, so that, by the way that from the different test voltage of test power input, test display is filled Putting can just show different brightness, so as to be shown according to the different brightness of test display apparatus, it is possible to obtain and touch driving Short/the open circuit of electrode, the short/open circuit of touch-sensing electrode, the short circuit between touch driving electrodes and touch-sensing electrode, and survey Examination is simple, efficiency high.
Above disclosed is only present pre-ferred embodiments, can not limit the right model of the present invention with this certainly Enclose, therefore the equivalent variations made according to the claims in the present invention, still belong to the scope that the present invention is covered.

Claims (10)

1. a kind of test system of mutual capacitance type touch display unit, it is characterised in that including:
Test power supply, it is used to export more several test voltages;
Test point disk, including more several first test solder joints, more several second test solder joints, the 3rd test solder joint, described first Test solder joint, the second test solder joint, the 3rd test solder joint receive the test voltage;
Touch unit, it includes that many several touch driving electrodes and many several touch-sensing electrodes, the touch driving electrodes First end electrical connection the first test solder joint, first end electrical connection the second test solder joint of the touch-sensing electrode, Adjacent the first test solder joint for touching driving electrodes electrical connection is different, the adjacent touch-sensing electrode electrical connection The second test solder joint is different;
Test display apparatus, it includes more several first display units and more several second display units, each display unit bag First electrode and second electrode are included, the first electrode of first display unit drives electricity with the different touch respectively The second end connection of pole, the first electrode of second display unit is respectively with the of the different touch-sensing electrode Two ends electrically connect;Second electrode electrical connection the 3rd test of first display unit and second display unit Solder joint.
2. the test system of mutual capacitance type touch display unit as claimed in claim 1, it is characterised in that first test The number of solder joint is two, and the first end that driving electrodes are touched described in odd number bar shares one of them described first test solder joint, The first end that driving electrodes are touched described in even number bar shares another described first test solder joint;Or/and,
The number of the second test solder joint is two, and the first end of touch-sensing electrode described in odd number bar shares one of institute The first test solder joint is stated, the first end of touch-sensing electrode described in even number bar shares another described first test solder joint.
3. the test system of mutual capacitance type touch display unit as claimed in claim 1, it is characterised in that the touch drives The bar number of electrode is identical with the number of the described first test solder joint, and each described touch driving electrodes is individually taken described in one First test solder joint;Or/and,
The bar number of the touch-sensing electrode is identical with the number of the described second test solder joint, each described touch-sensing electrode Individually take the second test solder joint.
4. the test system of mutual capacitance type touch display unit as claimed in claim 1, it is characterised in that the 3rd test The number of solder joint is one, and the second electrode of first display unit and second display unit passes through the described 3rd Test solder joint receives the test voltage of the test power supply output;Or,
The number of the 3rd test solder joint is multiple, described the second of first display unit and second display unit Electrode be electrically connected it is described 3rd test solder joint and by more it is several it is described 3rd test solder joints receive it is described test power supply it is defeated The same described test voltage for going out.
5. the test system of mutual capacitance type touch display unit as claimed in claim 1, it is characterised in that the test shows Device includes first area and second area, and the first area is provided separately with the second area, more several described first Display unit is arranged in the first area, and more several second display units are arranged in the second area.
6. the test system of the mutual capacitance type touch display unit as described in claim 1-5 any one, it is characterised in that institute It is the device beyond the touch display unit to state test display apparatus.
7. the test system of the mutual capacitance type touch display unit as described in claim 1-5 any one, it is characterised in that institute Stating touch display unit includes display unit, and the display unit includes the test display apparatus.
8. the test system of the mutual capacitance type touch display unit as described in claim 1-5 any one, it is characterised in that institute Test display apparatus are stated for OLED display, the first electrode is the anode of the OLED display, second electricity The negative electrode of extremely described OLED display;Or, the test display apparatus are LCD display device, and the first electrode is The pixel electrode of the LCD display device, the second electrode is the common electrode of the LCD display device.
9. the test system of the mutual capacitance type touch display unit as described in claim 1-5 any one, it is characterised in that institute Stating touch display unit also includes display unit, and the touch unit is arranged on the top of the display unit or the touch Unit is arranged in the display unit.
10. the test side of the test system of a kind of mutual capacitance type touch display unit as described in claim 1-9 any one Method, it is characterised in that comprise the following steps:
First time period test the more several test voltages of power input via the first test solder joint, touch driving electrodes and be supplied to the The first electrode of one display unit, wherein, the two neighboring test voltage for touching driving electrodes reception is respectively high level And low level;
Second time period is tested the more several test voltages of power input and is supplied to the via the second test solder joint, touch-sensing electrode The first electrode of two display units, wherein, the test voltage that the two neighboring touch-sensing electrode is received is respectively high level And low level;
The test same test voltage of power input is supplied to the first display unit and the second display unit via the 3rd test solder joint Second electrode;
The test voltage that the test voltage and second electrode that first display unit is received according to its first electrode are received carries out brightness It has been shown that, the test voltage that the test voltage and second electrode that the second display unit is received according to its first electrode are received carries out brightness Display.
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113129827A (en) * 2019-12-31 2021-07-16 乐金显示有限公司 Embedded touch organic light emitting diode display device and test method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102809707A (en) * 2011-05-19 2012-12-05 马克西姆综合产品公司 Touch panel testing using mutual capacitor measurements
CN102981059A (en) * 2012-08-29 2013-03-20 北京集创北方科技有限公司 Method for detecting defects of capacitive touch screen device
CN103970339A (en) * 2013-01-28 2014-08-06 三星显示有限公司 Display device integrated with touch screen panel
CN104461162A (en) * 2014-12-31 2015-03-25 京东方科技集团股份有限公司 Touch substrate, touch panel and touch display device
CN106291216A (en) * 2016-08-04 2017-01-04 武汉华星光电技术有限公司 In-cell touch panel, test circuit and method of testing

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102809707A (en) * 2011-05-19 2012-12-05 马克西姆综合产品公司 Touch panel testing using mutual capacitor measurements
CN102981059A (en) * 2012-08-29 2013-03-20 北京集创北方科技有限公司 Method for detecting defects of capacitive touch screen device
CN103970339A (en) * 2013-01-28 2014-08-06 三星显示有限公司 Display device integrated with touch screen panel
CN104461162A (en) * 2014-12-31 2015-03-25 京东方科技集团股份有限公司 Touch substrate, touch panel and touch display device
CN106291216A (en) * 2016-08-04 2017-01-04 武汉华星光电技术有限公司 In-cell touch panel, test circuit and method of testing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113129827A (en) * 2019-12-31 2021-07-16 乐金显示有限公司 Embedded touch organic light emitting diode display device and test method thereof

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