CN106841709A - A kind of MMIC Universal test clamping apparatus - Google Patents
A kind of MMIC Universal test clamping apparatus Download PDFInfo
- Publication number
- CN106841709A CN106841709A CN201710248692.5A CN201710248692A CN106841709A CN 106841709 A CN106841709 A CN 106841709A CN 201710248692 A CN201710248692 A CN 201710248692A CN 106841709 A CN106841709 A CN 106841709A
- Authority
- CN
- China
- Prior art keywords
- radio frequency
- input
- mmic
- output
- pedestal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 33
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims abstract description 45
- 238000009434 installation Methods 0.000 claims description 5
- 238000010586 diagram Methods 0.000 description 7
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 3
- 230000005540 biological transmission Effects 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 230000002542 deteriorative effect Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 230000008054 signal transmission Effects 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000002708 enhancing effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/08—Coupling devices of the waveguide type for linking dissimilar lines or devices
- H01P5/10—Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced lines or devices with unbalanced lines or devices
- H01P5/107—Hollow-waveguide/strip-line transitions
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
Abstract
The invention belongs to clamp art, there is provided a kind of MMIC Universal test clamping apparatus.The test fixture includes radio frequency input pedestal, radio frequency output pedestal and the boss for installing MMIC to be measured, input microstrip line and the direct current supply plate for being powered to MMIC are installed on radio frequency input pedestal, output microstrip line is installed in radio frequency output pedestal, boss is removably mounted on radio frequency input pedestal, and with input microstrip line output end it is relative connect, radio frequency output pedestal can along radio frequency direction be slidably mounted on radio frequency be input into pedestal on.After be removably mounted on boss on radio frequency input base by the present invention, pedestal is exported by radio frequency and is input into slip on base in radio frequency along radio frequency direction, so as to drive output microstrip line to come close to or in contact with the MMIC on boss, realize the regulation in radio frequency direction, to adapt to various sizes of MMIC, test period and the cost of MMIC are reduced.
Description
Technical field
The invention belongs to clamp art, more particularly to a kind of MMIC (Monolithic Microwave
Integrated Circuit monolithic integrated microwave circuits) Universal test clamping apparatus.
Background technology
Short-distance wireless high-speed transfer is widely used to using the millimeter wave frequency band MMIC of GaAs, InP-base or Si bases, is defended
The field such as star communication and military radar.In millimeter MMIC test phase, there is reliability higher, economy using waveguide form
Property and lower loss, i.e. test fixture input/output end port be waveguide form, this is accomplished by design plane micro-strip knot
Structure, to realize the good transition between waveguiding structure and planar microstrip structure.But for different type and the MMIC of size, need
The test fixture of different configuration is prepared, using inconvenience, this will greatly increase cycle and the cost that MMIC is tested.
The content of the invention
Embodiment of the present invention technical problem to be solved is to provide a kind of MMIC Universal test clamping apparatus, it is intended to solved existing
The problem for having the test period existing for the MMIC test fixtures in technology long with high cost.
The embodiment of the present invention is achieved in that a kind of MMIC Universal test clamping apparatus, including radio frequency input pedestal and radio frequency
Output pedestal, is provided with input microstrip line and the direct current supply plate for being powered to MMIC on the radio frequency input pedestal, described
Output microstrip line is installed, the Universal test clamping apparatus also include the boss for installing MMIC to be measured in radio frequency output pedestal,
The boss is removably mounted on radio frequency input pedestal, and it is relative with the output end of the input microstrip line connect, institute
Stating radio frequency output pedestal can be slidably mounted on the radio frequency input pedestal along radio frequency direction, and can make the output microstrip line
Input come close to or in contact with MMIC to be measured on the boss.
Further, the radio frequency input pedestal includes that lid and radio frequency are input into base in the radio frequency input being detachably connected,
The input microstrip line and direct current supply plate are arranged on radio frequency input base, are covered in the radio frequency input and are fixedly mounted on
On radio frequency input base, the bottom of the radio frequency input base is provided with sliding block and offers long through-hole, the sliding block and institute
State between radio frequency exports pedestal and be fixedly connected by connector, and the connector is located in the long through-hole.
Further, the radio frequency output pedestal includes that lid and radio frequency export base in the radio frequency output being detachably connected,
There is the storage tank slided for radio frequency output base on the radio frequency input base, fixed installation is covered in the radio frequency output
On radio frequency output base, it is fixedly connected by the connector between the radio frequency output base and the sliding block, institute
The bottom for stating radio frequency input base has chute, and the sliding block is slided in the chute.
Further, there is hole position on the radio frequency input base, the hole position has opening, and the boss is arranged on institute
State in hole position, there is groove on the boss, there is projection on the radio frequency output base, the output microstrip line is arranged on institute
State on projection, the projection can make the output on the projection by the opening near the groove or against the groove
The input of microstrip line is near or against the MMIC to be measured on the boss.
Further, the cross section of the signal input notch that the radio frequency input base and radio frequency are constituted between being input into and covering
L-shaped, through there is the first groove between the signal input notch and the hole position, the input microstrip line is arranged on described the
In one groove, and during its input stretches into the signal input notch, the signal output notch in the radio frequency output pedestal
Also it is L-shaped, the second groove connected with the signal output notch is offered on the projection, the output microstrip line is arranged on
In second groove, and during its output end stretches into the signal output notch.
Further, offered for adjusting some of the direct current supply plate installation site on the radio frequency input base
Screwed hole, offers some perforates coordinated with the screwed hole on the direct current supply plate, the direct current supply plate with it is described
The perforate is worn between radio frequency input base using screw to be fixedly connected with screwed hole.
Compared with prior art, beneficial effect is the embodiment of the present invention：The present invention is for different size and type
The boss that MMIC configurations match, after boss is arranged on radio frequency input pedestal, pedestal is exported along radio frequency side by radio frequency
Slided on frequency input pedestal such that it is able to the MMIC for driving output microstrip line to come close to or in contact with boss, realize radio frequency
The regulation of position on direction, it is easy to use to adapt to various sizes of MMIC, greatly reduce MMIC test period and into
This；Simultaneously, it is ensured that microstrip line is as far as possible small with the gap of MMIC so that by after gold wire bonding between microstrip line and MMIC, energy
Enough strengthen signal transmission, prevent test performance from deteriorating.
Brief description of the drawings
Fig. 1 is adjustable MMIC Universal test clamping apparatus overall structure diagram provided in an embodiment of the present invention；
Fig. 2 is the overlooking the structure diagram of the MMIC Universal test clamping apparatus shown in Fig. 1；
Fig. 3 is the backsight structural representation of Fig. 2；
Fig. 4 is the decomposition texture schematic diagram of Fig. 1；
Fig. 5 is the radio frequency input base schematic diagram in Fig. 1；
Fig. 6 is the radio frequency input another angle schematic diagram of base shown in Fig. 5；
Fig. 7 is the boss block schematic diagram for installing MMIC to be measured in Fig. 1；
Fig. 8 is the direct current supply plate schematic diagram in Fig. 1.
Specific embodiment
In order to make the purpose , technical scheme and advantage of the present invention be clearer, it is right below in conjunction with drawings and Examples
The present invention is further elaborated.It should be appreciated that the specific embodiments described herein are merely illustrative of the present invention, and
It is not used in the restriction present invention.
As shown in Figures 1 to 6, it is a kind of MMIC Universal test clamping apparatus provided in an embodiment of the present invention, the test fixture bag
Include radio frequency input pedestal, radio frequency output pedestal 3 and the boss 4 for installing MMIC to be measured 7.Installed on radio frequency input pedestal
Have for the input microstrip line 5 of radiofrequency signal input and the direct current supply plate 8 for being powered to MMIC 7, radio frequency output pedestal 3
Output microstrip line 6 for radiofrequency signal output is inside installed, boss 4 is removably mounted on radio frequency input pedestal, and with
The output end for being input into microstrip line 5 connects relatively, and radio frequency output pedestal 3 can be slidably mounted on radio frequency input pedestal along radio frequency direction X
On, and the MMIC to be measured 7 that the input of output microstrip line 5 come close to or in contact with boss 4 can be made.
In above-described embodiment, radio frequency input pedestal includes the upper lid 2 of radio frequency input being detachably connected and radio frequency input base
1, input microstrip line 5 and direct current supply plate 8 are arranged on radio frequency input base 1, and it is defeated that the upper lid 2 of radio frequency input is fixedly mounted on radio frequency
Enter on base 1.The bottom of radio frequency input base 1 is provided with sliding block 9 and offers long through-hole 10, sliding block 9 and radio frequency output pedestal 3 it
Between be fixedly connected by connector 20, and connector 20 is located in 10 in long through-hole.Radio frequency output pedestal 3 includes detachably connecting
The upper lid 31 of radio frequency output and radio frequency output base 32 for connecing, have what is slided for radio frequency output base 32 on radio frequency input base 1
Storage tank 11, the upper lid 31 of radio frequency output is fixedly mounted on radio frequency output base 32, is led between radio frequency output base 32 and sliding block 9
Cross connector 20 to be fixedly connected, the bottom of radio frequency input base 1 has chute 12, and sliding block 9 is slided in chute 12.So, lead to
Cross promotion sliding block 9 to be slided along radio frequency direction X in chute 12, so as to drive radio frequency to export base 32 with the upper lid 31 1 of radio frequency output
Rise and moved along radio frequency direction X, output microstrip line 6 is moved to close to each other with the MMIC to be measured 7 on boss 4 or is contacted, for
Various sizes of MMIC 7, by the mobile regulation of sliding block 9, it is ensured that try one's best in the gap between output microstrip line 6 and MMIC 7
Small, the transmission between enhancing signal prevents test performance from deteriorating.
There is hole position 13 on above-mentioned radio frequency input base 1, hole position 13 has opening 130, and boss 4 is arranged on hole position 13
In.Please referring collectively to shown in Fig. 7, having groove 40 on boss 4, there is projection 320 on radio frequency output base 32, export microstrip line
6 are arranged on projection 320, promote sliding block 9, sliding block 9 to drive radio frequency output base 32 to move, and radio frequency output base 32 drives projection
320 by the way that opening 130 is near groove 40 or is resisted against in groove 40, is close to the input of the output microstrip line 6 on projection 320
Or against the MMIC to be measured 7 on boss 4, so as to realize the accurate regulation of input and the phase position of output.Above-mentioned is to be measured
MMIC 7, according to the difference of type and size, selection matches the boss 4 of specification, to adapt to install fixing different types and chi
Very little MMIC to be measured 7.Please referring collectively to shown in Fig. 6, the frame mode that MMIC to be measured 7 is fixed on boss 4 is：According to boss
4 specifications, adaptable copper sheet 41 is pasted in the upper surface of boss 4 by conductive silver paste, viscous by conductive silver paste on copper sheet 41
MMIC to be measured 7 is pasted, then MIM (metal-insulator- are pasted by conductive silver paste on the copper sheet 41 of the both sides of MMIC to be measured 7
Metal metal-insulator-metal types) electric capacity 42, boss 4 is finally screwed mode installed in radio frequency input base 1
In hole position 13, the direct current supply plate 8 on radio frequency input base 1 is bonded on MMIC 7 through MIM capacitor 42, and power supply is through direct current supply
Plate 8 is powered to MMIC 7.
In above-described embodiment, the horizontal stroke of the signal input notch 14 constituted between radio frequency input base 1 and the upper lid 2 of radio frequency input
Section is L-shaped, and through there is the first groove 17 between signal input notch 14 and hole position 13, it is recessed that input microstrip line 5 is arranged on first
In groove 17, and during its input stretches into signal input notch 14.Signal output notch 30 in radio frequency output pedestal 3 is also in L
Shape, offers the second groove (not shown) connected with signal output notch 30 on projection 320, output microstrip line 6 is installed
In the second groove, and during its output end stretches into signal output notch 30.Radio-frequency input signals is by conventional standard rectangular
Waveguide feed-in, turns microstrip transition structure and realizes conversion of the signal from waveguide to microstrip circuit via waveguide, and rectangular waveguide is in transmission
90 ° of turn is done on direction, to realize the conllinear transmission of input and output.
In above-described embodiment, some spiral shells for adjusting direct current supply plate installation site are offered on radio frequency input base 1
Pit 15.Please referring collectively to some perforates 80 coordinated with screwed hole 15 shown in Fig. 8, are offered on direct current supply plate 8, direct current is supplied
Perforate 80 is worn using screw 16 to be fixedly connected with screwed hole 15, make direct current supply between electroplax 8 and radio frequency input base 1
The installation site of plate 8 can be electrically connected with MIM capacitor 42.Because the spatial arrangement of direct current biasing direction Y is to the performances of MMIC 7
Influence it is smaller, in order to simplify design and processing cost, in the present embodiment, radio frequency input base 1 on be provided with two grades of screw threads
Hole 15, is provided with two grades of corresponding with two grades of screwed holes 15 respectively perforates 80, for regulation direct-current bias on direct current supply plate
The position of direction Y.If MMIC 7 is smaller in the size of direct current biasing direction Y, one grade of perforate 801 and one grade are worn by screw 16
Screw 151, direct current supply plate 8 is fixed on radio frequency input base 1, if MMIC 7 is larger in the size of direct current biasing direction Y,
Two grades of perforates 802 and two grades of screws 152 are then worn by screw 16, direct current supply plate 8 are fixed on radio frequency input base 1,
Direct current supply plate 8 is set to be adjusted with respect to the position of MIM capacitor 42, to reach the regulation to direct current biasing position.
In sum, above-mentioned MMIC Universal test clamping apparatus can be directed to the MMIC 7 of different type and size without changing
Whole test fixture, it is only necessary to change the boss matched with the sizes of MMIC 7, exports pedestal 3 to realize by mobile radio
Position adjustments on the X of radio frequency direction, adapt to the test to various sizes of MMIC 7, and easy to use and flexible reduces MMIC 7
Test period and cost, while ensure that microstrip line is as far as possible small with the gap of MMIC 7, so as to strengthen signal transmission, prevent from surveying
Examination penalty.In addition, the test fixture can be adjusted according to the size of MMIC 7 on the Y of direct current biasing direction, reduce
Influence to the performances of MMIC 7.
Presently preferred embodiments of the present invention is the foregoing is only, is not intended to limit the invention, it is all in essence of the invention
Any modification, equivalent and improvement made within god and principle etc., should be included within the scope of the present invention.
Claims (6)
1. a kind of MMIC Universal test clamping apparatus, including radio frequency are input into pedestal and radio frequency output pedestal, on the radio frequency input pedestal
Input microstrip line and the direct current supply plate for being powered to MMIC are installed, output micro-strip is installed in the radio frequency output pedestal
Line, it is characterised in that the Universal test clamping apparatus also include the boss for installing MMIC to be measured, the boss is removably pacified
On radio frequency input pedestal, and it is relative with the output end of the input microstrip line connect, the radio frequency exports pedestal energy edge
Radio frequency direction is slidably mounted on the radio frequency input pedestal, and can come close to or in contact with the input of the output microstrip line
MMIC to be measured on the boss.
2. MMIC Universal test clamping apparatus as claimed in claim 1, it is characterised in that the radio frequency input pedestal includes detachable
Lid and radio frequency are input into base in the radio frequency input of connection, and the input microstrip line and direct current supply plate are input into installed in the radio frequency
On base, lid is fixedly mounted on the radio frequency input base in the radio frequency input, and the bottom of the radio frequency input base sets
There is sliding block and offer long through-hole, be fixedly connected by connector between the sliding block and radio frequency output pedestal, and institute
Connector is stated to be located in the long through-hole.
3. MMIC Universal test clamping apparatus as claimed in claim 2, it is characterised in that the radio frequency output pedestal includes detachable
Lid and radio frequency export base in the radio frequency output of connection, have on the radio frequency input base and are slided for radio frequency output base
Storage tank, lid is fixedly mounted on the radio frequency output base in radio frequency output, the radio frequency output base with it is described
It is fixedly connected by the connector between sliding block, the bottom of the radio frequency input base has chute, and the sliding block is described
Slided in chute.
4. MMIC Universal test clamping apparatus as claimed in claim 3, it is characterised in that there is hole on the radio frequency input base
Position, the hole position has opening, and the boss is arranged in the hole position, has groove, the radio frequency output on the boss
There is projection, the output microstrip line is arranged on the projection on base, the projection can be by the opening near described
Groove or against the groove, makes the input of output microstrip line on the projection near or against to be measured on the boss
MMIC。
5. MMIC Universal test clamping apparatus as claimed in claim 4, it is characterised in that the radio frequency input base is input into radio frequency
The cross section of the signal input notch constituted between upper lid is L-shaped, and running through between the signal input notch and the hole position has
First groove, the input microstrip line is arranged in first groove, and its input stretches into the signal input notch
In, the signal output notch in the radio frequency output pedestal is also L-shaped, is offered on the projection and the signal output notch
Second groove of connection, the output microstrip line is arranged in second groove, and its output end to stretch into the signal defeated
Go out in notch.
6. MMIC Universal test clamping apparatus as described in any one in claim 1 to 5, it is characterised in that the radio frequency input
The some screwed holes for adjusting the direct current supply plate installation site are offered on base, is offered on the direct current supply plate
Some perforates coordinated with the screwed hole, institute is worn between the direct current supply plate and radio frequency input base using screw
Perforate is stated to be fixedly connected with screwed hole.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710248692.5A CN106841709B (en) | 2017-04-17 | 2017-04-17 | A kind of MMIC Universal test clamping apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710248692.5A CN106841709B (en) | 2017-04-17 | 2017-04-17 | A kind of MMIC Universal test clamping apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106841709A true CN106841709A (en) | 2017-06-13 |
| CN106841709B CN106841709B (en) | 2019-08-02 |
Family
ID=59147739
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710248692.5A Active CN106841709B (en) | 2017-04-17 | 2017-04-17 | A kind of MMIC Universal test clamping apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106841709B (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107422199A (en) * | 2017-04-28 | 2017-12-01 | 中国电子科技集团公司第二十九研究所 | A kind of Multi-channel microwave component test system |
| CN109669118A (en) * | 2019-01-29 | 2019-04-23 | 中国科学院上海微***与信息技术研究所 | A kind of adjustable microwave circuit test fixture |
| WO2019133093A1 (en) * | 2017-12-29 | 2019-07-04 | Xcerra Corporation | Test socket assembly with waveguide transition and related methods |
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| CN106053889A (en) * | 2016-06-22 | 2016-10-26 | 珠海纳睿达科技有限公司 | Multifunctional microwave testing clamp |
| CN106093483A (en) * | 2016-07-27 | 2016-11-09 | 深圳市华讯方舟微电子科技有限公司 | Chip test fixture and chip test system |
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| US5017865A (en) * | 1989-06-07 | 1991-05-21 | Wiltron Company | Coaxial microwave device test fixture |
| US5506513A (en) * | 1995-01-13 | 1996-04-09 | Bacher; Helmut | Microwave circuit test fixture |
| US6028483A (en) * | 1998-05-06 | 2000-02-22 | Hughes Electronics Corporation | Universal fixture/package for spatial-power-combined amplifier |
| CN102411072A (en) * | 2011-08-04 | 2012-04-11 | 苏州易特诺科技股份有限公司 | Test fixture of millimeter-wave circuit device |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107422199A (en) * | 2017-04-28 | 2017-12-01 | 中国电子科技集团公司第二十九研究所 | A kind of Multi-channel microwave component test system |
| WO2019133093A1 (en) * | 2017-12-29 | 2019-07-04 | Xcerra Corporation | Test socket assembly with waveguide transition and related methods |
| CN109669118A (en) * | 2019-01-29 | 2019-04-23 | 中国科学院上海微***与信息技术研究所 | A kind of adjustable microwave circuit test fixture |
| CN109669118B (en) * | 2019-01-29 | 2021-09-03 | 中国科学院上海微***与信息技术研究所 | Adjustable microwave circuit test fixture |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106841709B (en) | 2019-08-02 |
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