CN106783507A - A kind of ion shaping lens structure design based on SIMION emulation - Google Patents
A kind of ion shaping lens structure design based on SIMION emulation Download PDFInfo
- Publication number
- CN106783507A CN106783507A CN201611246989.XA CN201611246989A CN106783507A CN 106783507 A CN106783507 A CN 106783507A CN 201611246989 A CN201611246989 A CN 201611246989A CN 106783507 A CN106783507 A CN 106783507A
- Authority
- CN
- China
- Prior art keywords
- ion
- lens
- simion
- shaping lens
- ions follow
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/06—Electron- or ion-optical arrangements
- H01J49/067—Ion lenses, apertures, skimmers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
The invention discloses a kind of ion shaping lens structure design based on SIMION emulation, ions follow trajectories are analyzed by SIMION first, a kind of ion shaping lens device is designed accordingly.The simulation process is that ions follow trajectories are analyzed using SIMION, main to include setting up ions follow trajectories model, and carries out parameter optimization using SIMION emulation.The ion shaping lens are three simple lenses of diameter identical coaxial circles tubular electrode combination, the ion lens is installed in the vacuum system of time of-flight mass spectrometer, it is focused for ion, lower the degree and energy, speed, the degree of scatter of angle of ion space diverging, to cause that ion substantially reaches mass analyzer.
Description
Technical field
It is based on the present invention relates to the technology category of the ion shaping lens in time of-flight mass spectrometer, more particularly to one kind
The structure design of the ion shaping lens of SIMION emulation.
Background technology
In time of-flight mass spectrometer, the ion produced by ionization apparatus, especially time of flight secondary ion massspectrometry instrument
In, secondary ion is entered into when in secondary ion optical system from the reflection of primary ions direction, is unavoidably existed
Initial position dispersion, initial angle dispersion, primary power dispersion and initial velocity dispersion, these primary condition dispersion can cause from
Difference on the sub- flight time, so that designing ion guide device before ion enters mass analyzer, enters to ion
Line focusing, lowers the degree and energy, speed, the degree of scatter of angle of ion space diverging, to cause that ion is substantially arrived
Up to mass analyzer.
Existing ion lens species is a lot, but is the absence of a kind of being designed according to the ions follow trajectories of predetermined substance
Ion lens.The ions follow trajectories of predetermined substance molecule are analyzed herein in conjunction with SIMION simulation softwares, are set based on this
An ion reshaping structure is counted.
The content of the invention
To solve the above problems, the purpose of the present invention is exactly to design a kind of ion shaping lens based on SIMION, first
Simulation calculation is carried out to the flight path for setting ion using SIMION, a kind of ion shaping lens has been redesigned so that ion
Ion after change substantially reaches mass analyzer, improves the precision of time of-flight mass spectrometer.
The present invention uses following technical scheme to solve above-mentioned technical problem：
1. it is a kind of based on SIMION emulation ion shaping lens structure design, it is characterised in that its design process first lead to
Cross SIMION softwares to be analyzed ions follow trajectories, a kind of ion shaping lens device is designed accordingly.
2. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that：Using existing
Electrostatic lenses analysis mode soft sim ION8.1 is emulated to the ions follow trajectories that ionization is produced, and obtains dividing for ion
Dissipate track.
3. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that emulated
When, the mode that selection directly sets array sizes sets up geometrical model.
4. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that emulated
When, the parameter of required setting includes：The size of platform space, symmetric property, the type of field, the position of electrode, shape and size,
The kinetic energy of ion, movement area distance, initial position, initial velocity, polar plate voltage value.
5. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that by emulation
The dispersion angle of ions follow trajectories is obtained, the distance between ion lens pole plate is determined according to this and the value of voltage is accessed.
6. ion shaping lens according to claim 1, it is characterised in that by three diameter identical coaxial cylinders
The simple lens of shape electrode combination, the combined shaped of three electrodes is symmetrical, and the both sides of simple lens have identical and constant
Current potential, the current potential of two electrodes in makings outside is zero, and the current potential of target is adjustable.
7. ion shaping lens according to claim 1, its feature also has the current potential for assuming three electrodes to be respectively
V1、V2And V3, and V1=V3, therefore the focal length of simple lens depends on the potential values of three electrodes for the value of f.
8. ion shaping lens according to claim 1, its feature also has：By the potential value for adjusting target
And the size of pole plate, spacing adjust the focal length of lens, the transmission and focusing to ion are realized.
9. ion shaping lens according to claim 1, its feature also has that to set z be current potential transverse axis coordinate, and s is cylinder
Spacing, a be gap midpoint to lens centre distance, then the focal length of simple lens be f value be
10. ion shaping lens according to claim 1, its feature also has：Lens are installed on flight time mass spectrum
In the vacuum system of instrument, and whole vacuum system is full of as far as possible, the ion after ionization is carried out shaping and gathered with maximum magnitude
Jiao, and substantially enter in mass analyzer.
11. ion shaping lens according to claim 1, its feature also has：Three metal electrode boards of lens it
Between be full of insulating materials so that each pole plate is spaced and mutually insulated.
Brief description of the drawings
Fig. 1 is the method flow diagram of the ion shaping lens based on SIMION emulation；
Fig. 2 is the structural representation of ion shaping lens.
Specific embodiment
Technical scheme is described in further detail below in conjunction with the accompanying drawings：
1. as shown in figure 1, the method flow diagram of the ion shaping lens based on SIMION emulation, a kind of imitative based on SIMION
Genuine ion shaping lens structure design, it is characterised in that its design process is first by SIMION softwares to ions follow trajectories
It is analyzed, a kind of ion shaping lens device is designed accordingly.
2. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that：Using existing
Electrostatic lenses analysis mode soft sim ION8.1 is emulated to the ions follow trajectories that ionization is produced, and obtains dividing for ion
Dissipate track.
3. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that emulated
When, the mode that selection directly sets array sizes sets up geometrical model.
4. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that emulated
When, the parameter of required setting includes：The size of platform space, symmetric property, the type of field, the position of electrode, shape and size,
The kinetic energy of ion, movement area distance, initial position, initial velocity, polar plate voltage value.
5. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that by emulation
The dispersion angle of ions follow trajectories is obtained, the distance between ion lens pole plate is determined according to this and the value of voltage is accessed.
6. as shown in Fig. 2 ion shaping lens according to claim 1, it is characterised in that identical by three diameters
Coaxial circles tubular electrode combination simple lens, the combined shaped of three electrodes is symmetrical, and the both sides of simple lens have phase
Same and two electrodes on the outside of constant current potential, makings current potentials are zero, and the current potential of target is adjustable.
7. ion shaping lens according to claim 1, its feature also has the current potential for assuming three electrodes to be respectively
V1、V2And V3, and V1=V3, therefore the focal length of simple lens depends on the potential values of three electrodes for the value of f.
8. ion shaping lens according to claim 1, its feature also has：By the potential value for adjusting target
And the size of pole plate, spacing adjust the focal length of lens, the transmission and focusing to ion are realized.
9. ion shaping lens according to claim 1, its feature also has that to set z be current potential transverse axis coordinate, and s is cylinder
Spacing, a be gap midpoint to lens centre distance, then the focal length of simple lens be f value be
10. ion shaping lens according to claim 1, its feature also has：Lens are installed on flight time mass spectrum
In the vacuum system of instrument, and whole vacuum system is full of as far as possible, the ion after ionization is carried out shaping and gathered with maximum magnitude
Jiao, and substantially enter in mass analyzer.
11. ion shaping lens according to claim 1, its feature also has：Three metal electrode boards of lens it
Between be full of insulating materials so that each pole plate is spaced and mutually insulated.
Claims (11)
1. it is a kind of based on SIMION emulation ion shaping lens structure design, it is characterised in that its design process passes through first
SIMION softwares are analyzed to ions follow trajectories, and a kind of ion shaping lens device is designed accordingly.
2. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that：Using existing electrostatic
Lens analysis simulation softward SIMION8.1 is emulated to the ions follow trajectories that ionization is produced, and obtains the dispersion rail of ion
Mark.
3. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that when being emulated, choosing
The mode for selecting directly setting array sizes sets up geometrical model.
4. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that when being emulated, institute
The parameter that need to be set includes：The size of platform space, symmetric property, the type of field, the position of electrode, shape and size, ion
Kinetic energy, movement area distance, initial position, initial velocity, polar plate voltage value.
5. SIMION according to claim 1 is analyzed to ions follow trajectories, it is characterised in that obtained by emulating
The dispersion angle of ions follow trajectories, the distance between ion lens pole plate is determined according to this and the value of voltage is accessed.
6. ion shaping lens according to claim 1, it is characterised in that by three diameter identical coaxial circles tubulars electricity
The simple lens that pole combines, the combined shaped of three electrodes is symmetrical, and the both sides of simple lens have identical and constant current potential,
The current potential of two electrodes in makings outside is zero, and the current potential of target is adjustable.
7. ion shaping lens according to claim 1, its feature also has three current potential of electrode respectively V of hypothesis1、V2
And V3, and V1=V3, therefore the focal length of simple lens depends on the potential values of three electrodes for the value of f.
8. ion shaping lens according to claim 1, its feature also has：By adjust target potential value and
The size of pole plate, spacing adjust the focal length of lens, realize the transmission and focusing to ion.
9. ion shaping lens according to claim 1, its feature also has that to set z be current potential transverse axis coordinate, between s is cylinder
Away from a is distance of the gap midpoint to lens centre, then the focal length of simple lens is that the value of f is
10. ion shaping lens according to claim 1, its feature also has：Lens are installed on time of-flight mass spectrometer
In vacuum system, and whole vacuum system is full of as far as possible, the ion after ionization is carried out by shaping and focusing with maximum magnitude, and
Substantially enter in mass analyzer.
11. ion shaping lens according to claim 1, its feature also has：Filled between three metal electrode boards of lens
Full insulating materials so that each pole plate is spaced and mutually insulated.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611246989.XA CN106783507A (en) | 2016-12-29 | 2016-12-29 | A kind of ion shaping lens structure design based on SIMION emulation |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201611246989.XA CN106783507A (en) | 2016-12-29 | 2016-12-29 | A kind of ion shaping lens structure design based on SIMION emulation |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106783507A true CN106783507A (en) | 2017-05-31 |
Family
ID=58929205
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611246989.XA Pending CN106783507A (en) | 2016-12-29 | 2016-12-29 | A kind of ion shaping lens structure design based on SIMION emulation |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106783507A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1689134A (en) * | 2002-07-16 | 2005-10-26 | 力可公司 | Tandem time of flight mass spectrometer and method of use |
| CN103858201A (en) * | 2011-03-04 | 2014-06-11 | 珀金埃尔默健康科学股份有限公司 | Electrostatic lenses and systems including the same |
-
2016
- 2016-12-29 CN CN201611246989.XA patent/CN106783507A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1689134A (en) * | 2002-07-16 | 2005-10-26 | 力可公司 | Tandem time of flight mass spectrometer and method of use |
| CN103858201A (en) * | 2011-03-04 | 2014-06-11 | 珀金埃尔默健康科学股份有限公司 | Electrostatic lenses and systems including the same |
Non-Patent Citations (1)
| Title |
|---|
| 刘晓旭 等: "《TOF-SIMS二次离子光学***仿真研究》", 《中国测试》 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101523548B (en) | Multi-reflecting time-of-flight mass analyser and a time-of-flight mass spectrometer including the mass analyser | |
| KR101957808B1 (en) | First and second order focusing using field free regions in timeofflight | |
| US8519353B2 (en) | Method and apparatus for controlling an asymmetric electrostatic lens about a central ray trajectory of an ion beam | |
| CN103858201A (en) | Electrostatic lenses and systems including the same | |
| CN102782797A (en) | System and method for controlling deflection of a charged particle beam within a graded electrostatic lens | |
| CN103065921A (en) | Multiple-reflection high resolution time-of-flight mass spectrometer | |
| CN202694819U (en) | Ion beam slicing device and mass spectrometer system | |
| JP2017152368A (en) | Quadrupole mass spectrometer | |
| CN103681184A (en) | Ion implanter electrodes | |
| CN1816383A (en) | Mass spectrometer and related ionizer and methods | |
| CN105225918B (en) | For the electrostatic lenses of flight time mass spectrum intermediate ion beam shaping | |
| CN102737952B (en) | Magnetic field-quadrupole cascade mass spectrum device and magnetic field-quadrupole cascade mass spectrum method with high abundance sensitivity | |
| Wang et al. | A new ion funnel for improving the transmission of low mass ions | |
| CN106783507A (en) | A kind of ion shaping lens structure design based on SIMION emulation | |
| CN103531432A (en) | Pulsed ion source, mass spectrometer and method for generating ions | |
| US10128098B2 (en) | System and methodology for expressing ion path in a time-of-flight mass spectrometer | |
| CN104282525A (en) | Ion focusing transmission lens under atmosphere pressure | |
| CN105632873B (en) | One kind is used for mass spectrographic ion optical path electrostatic convergence deviation device | |
| CN203733758U (en) | Automatic correction device for ion source electrical parameter quality discrimination | |
| Sise et al. | The voltage optimization of a four-element lens used on a hemispherical spectrograph with virtual entry for highest energy resolution | |
| CN101271817A (en) | Ion storing and repelling device used for time-of-flight mass spectrometer and its storing and repelling method | |
| CN108281345A (en) | Pole plate tunable optical electronic imaging instrument and its method | |
| CN113223919B (en) | Annular TOF mass analyzer and working method thereof | |
| CN109767971A (en) | Two-dimensional beam deflection device | |
| CN103208411A (en) | Electron impact ion source mechanism |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20170531 |
|
| WD01 | Invention patent application deemed withdrawn after publication |