CN106771822A - A kind of modified carrier rocket electrical system leakage testses result computational methods - Google Patents

A kind of modified carrier rocket electrical system leakage testses result computational methods Download PDF

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Publication number
CN106771822A
CN106771822A CN201710025222.2A CN201710025222A CN106771822A CN 106771822 A CN106771822 A CN 106771822A CN 201710025222 A CN201710025222 A CN 201710025222A CN 106771822 A CN106771822 A CN 106771822A
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test
resistance
power supply
leak
leak resistance
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CN106771822B (en
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孙兆牛
田建宇
苏磊
陈放
李学锋
余力凡
王雨萌
杨岫婷
权赫
张嗣锋
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China Academy of Launch Vehicle Technology CALT
Beijing Aerospace Automatic Control Research Institute
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China Academy of Launch Vehicle Technology CALT
Beijing Aerospace Automatic Control Research Institute
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14Measuring resistance by measuring current or voltage obtained from a reference source

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

A kind of modified carrier rocket electrical system leakage testses result computational methods, are related to carrier rocket electrical system field;Circular comprises the following steps:Step (1), ground power supply are powered, computing system leakage testses result;Including negative busbar leakage testses and positive bus-bar leakage testses, the computing formula for obtaining ground power supply voltage M is respectively obtained;By two computing formula simultaneous, leak resistance Rx and leak resistance Ry values are calculated;Battery is powered on step (2), arrow, computing system leakage testses result;Including negative busbar leakage testses and positive bus-bar leakage testses, the computing formula of supply voltage on ground power supply voltage M and arrow is respectively obtained, by two computing formula simultaneous, be calculated leak resistance Rx and leak resistance Ry values;The present invention can accurately calculate the resistance of both-end electric leakage in the case where both-end electric leakage occurs in system power supply bus, solve the problems, such as that existing leakage testses method cannot accurately test out leak resistance under both-end drain conditions.

Description

A kind of modified carrier rocket electrical system leakage testses result computational methods
Technical field
The present invention relates to a kind of carrier rocket electrical system field, particularly a kind of modified carrier rocket electrical system leakage Electrical test results computational methods.
Background technology
Carrier rocket electrical system is typically powered using battery, and power and distribution supply cable complexity is huge, is distributed in each portion of whole rocket Section, the flight reliability of rocket can be influenceed if there is electric leakage, or even is caused battery short circuit and caused flight to fail, it is therefore desirable to Leakage testses are carried out before rocket launching, the insulating resistance value of anode and negative terminal to housing of power supply buses is tested and calculate.
Existing conventional leakage testses circuit ,+M and-M are respectively the anode and negative terminal of power supply, and test anode leaks electricity to shell When switch K is connected to negative terminal, switch K is connected to anode, the magnitude of voltage at test resistance R2 two ends, by formula when test negative terminal leaks electricityThe leak resistance value of anode and negative terminal to housing is calculated respectively.But this method of testing pin is single-ended Test result is effective under drain conditions, but in the case where both-end is all in the presence of electric leakage, computational methods have obvious defect, are entering During the leakage testses of row one end, the presence due to the other end to the leak resistance of housing causes the voltage V that tests for substantially less than normal, Cause the leak resistance value for calculating significantly bigger than normal, have a strong impact on test result, so as to the electric leakage situation to system produces erroneous judgement.
Do not consider to be powered using battery and powered using ground power supply on arrow in existing method of testing in addition to survey electric leakage The influence of test result, because cell voltage and ground power supply voltage differences are larger, only considers ground in traditional measuring and calculation method Face supply voltage value only considers battery voltage value, and result of calculation has larger error.
The content of the invention
A kind of above-mentioned deficiency it is an object of the invention to overcome prior art, there is provided modified carrier rocket electrical system Leakage testses result computational methods, can accurately calculate both-end in the case where both-end electric leakage occurs in system power supply bus The resistance of electric leakage, solving existing leakage testses method cannot accurately test out leak resistance under both-end drain conditions Problem.
Above-mentioned purpose of the invention is achieved by following technical solution:
A kind of modified carrier rocket electrical system leakage testses result computational methods, test circuit includes test resistance R1, test resistance R2, test voltage Table V and test conversion band switch K;Test conversion band switch K, test resistance R1 and survey Examination resistance R2 is sequentially connected in series;Test voltage Table V is connected in parallel on the two ends of test resistance R2;Computational methods comprise the following steps:
Step (1), ground power supply are powered, computing system leakage testses result;
S1:Negative busbar leakage testses
One end of test circuit is connected to ground power supply+M ends, one end of test circuit and rocket external shell are connected Connect;The computing formula for obtaining ground power supply voltage M is:
In formula, V1 is the magnitude of voltage that test voltage Table V is measured;
R1 is the resistance of test resistance R1;
R2 is the resistance of test resistance R2;
Rx is the resistance of leak resistance Rx;
Ry is the resistance of test resistance Ry;
S2:Positive bus-bar leakage testses
One end of test circuit is connected to ground power supply-M ends, one end of test circuit and rocket external shell are connected Connect;The computing formula for obtaining ground power supply voltage M is:
In formula, V2 is the magnitude of voltage that test voltage Table V is measured;
S3:Calculate leak resistance Rx and leak resistance Ry values
Simultaneous formula (1) and (2), are calculated leak resistance Rx, leak resistance Ry:
Battery is powered on step (2), arrow, computing system leakage testses result;
S1:Negative busbar leakage testses
One end of test circuit is connected to ground power supply+M ends, one end of test circuit and rocket external shell are connected Connect;The computing formula for obtaining supply voltage B on ground power supply voltage M and arrow is:
In formula, V3 is the magnitude of voltage that test voltage Table V is measured;
S2:Positive bus-bar leakage testses
One end of test circuit is connected with power supply-B ends on ground power supply-M ends, arrow respectively, by one end of test circuit It is connected with rocket external shell;The computing formula for obtaining supply voltage B on arrow is:
In formula, V4 is the magnitude of voltage that test voltage Table V is measured;
S3:Calculate leak resistance Rx and leak resistance Ry values
Simultaneous formula (3) and (4), calculate leak resistance Rx and leak resistance Ry:
In a kind of above-mentioned modified carrier rocket electrical system leakage testses result computational methods, the step (1) In S1, circuit is specifically connected as:Ground power supply+M ends are connected with leak resistance Rx and test conversion band switch K respectively;Survey The other end that preliminary operation changes band switch K is connected with test resistance R1, test resistance R2 successively, in test resistance R2 two ends electricity in parallel Pressure Table V, leak resistance Rx is connected to ground power supply-M ends after being connected with leak resistance Ry;The other end of test resistance R2 respectively with Rocket external shell and leak resistance Ry are connected.
In a kind of above-mentioned modified carrier rocket electrical system leakage testses result computational methods, the step (1) In S2, circuit is specifically connected as:Ground power supply-M ends are connected with leak resistance Ry and test conversion band switch K respectively;Survey The other end that preliminary operation changes band switch K is connected with test resistance R1, test resistance R2 successively, in test resistance R2 two ends electricity in parallel Pressure Table V, leak resistance Ry is connected to ground power supply+M ends after being connected with leak resistance Rx;The other end of test resistance R2 respectively with Rocket external shell and leak resistance Rx are connected.
In a kind of above-mentioned modified carrier rocket electrical system leakage testses result computational methods, the step (2) In S1, circuit is specifically connected as:Ground power supply+M ends are connected with test conversion band switch K;Test conversion band switch K's The other end is connected with test resistance R1, test resistance R2 successively, and voltmeter V is connected in parallel on the two ends of test resistance R2;Power supply on arrow + B ends be connected with one end of leak resistance Rx;The other end of leak resistance Rx respectively with leak resistance Ry, test resistance R2 and Rocket external shell is connected;- B end of the other end of leak resistance Ry respectively with power supply on ground power supply-M ends, arrow is connected.
In a kind of above-mentioned modified carrier rocket electrical system leakage testses result computational methods, the step (2) In S2, circuit is specifically connected as:Ground power supply-M ends are connected with test conversion band switch K, leak resistance Ry respectively;On arrow - B the ends of power supply are connected with test conversion band switch K, leak resistance Ry respectively;Test conversion band switch K successively with test Resistance R1, test resistance R2 connect;Voltmeter V is connected in parallel on the two ends of test resistance R2;The other end of leak resistance Ry respectively with Rocket external shell, leak resistance Rx and test resistance R2 connection;The other end of leak resistance Rx connects with+B the ends of power supply on arrow Connect.
The present invention has the following advantages that compared with prior art:
(1) mode present invention employs anode and each test of negative terminal once, positive and negative both-end is calculated using test result Leak resistance, improve system leak resistance test precision and test validity;
(2) present invention powers the difference of leakage testses circuit under two states for surface power supply and battery, using improvement Leakage testses method, improve the precision and test validity of system leak resistance test under battery-powered state.
Brief description of the drawings
Fig. 1 is leakage testses circuit theory diagrams of the present invention;
Fig. 2 is negative busbar of the present invention to shell leak resistance test circuit schematic diagram;
Fig. 3 is positive bus-bar of the present invention to shell leak resistance test circuit schematic diagram;
Fig. 4 be arrow of the present invention on for when battery is powered negative busbar to shell leak resistance test circuit schematic diagram;
Fig. 5 be arrow of the present invention on for when battery is powered positive bus-bar to shell leak resistance test circuit schematic diagram.
Specific embodiment
The present invention is described in further detail with specific embodiment below in conjunction with the accompanying drawings:
The present invention cannot accurately test out system power supply bus to shell both-end electric leakage electricity for existing leakage testses method A kind of problem of resistance, it is proposed that improved system leakage testses method, can power supply buses occur both-end leak electricity in the case of, The accurate resistance tested and calculate both-end electric leakage.Improve method of testing mainly using positive and negative two-way each test once Mode, test obtains voltage V1, V2, V3 and V4, solves leak resistance Rx and leak resistance Ry after Simultaneous Equations respectively.
It is as shown in Figure 1 leakage testses circuit theory diagrams, as seen from the figure, test circuit includes test resistance R1, test electricity Resistance R2, test voltage Table V and test conversion band switch K;Test conversion band switch K, test resistance R1 and test resistance R2 It is sequentially connected in series;Test voltage Table V is connected in parallel on the two ends of test resistance R2;
Electric leakage calculates specific method and comprises the following steps:
Step (1), ground power supply are powered, computing system leakage testses result;
S1:Negative busbar leakage testses
Negative busbar is illustrated in figure 2 to shell leak resistance test circuit schematic diagram, as known to figure, by one end of test circuit Ground power supply+M ends are connected to, one end of test circuit is connected with rocket external shell;Specifically connection circuit is:Ground electricity Source+M ends are connected with leak resistance Rx and test conversion band switch K respectively;The other end of test conversion band switch K successively with Test resistance R1, test resistance R2 connect, in test resistance R2 two ends shunt voltage Table V, leak resistance Rx and leak resistance Ry Ground power supply-M ends are connected to after series connection;The other end of test resistance R2 connects with rocket external shell and leak resistance Ry respectively Connect.
The computing formula for obtaining ground power supply voltage M is:
In formula, V1 is the magnitude of voltage that test voltage Table V is measured;
R1 is the resistance of test resistance R1;
R2 is the resistance of test resistance R2;
Rx is the resistance of leak resistance Rx;
Ry is the resistance of test resistance Ry;
S2:Positive bus-bar leakage testses
One end of test circuit is connected to ground power supply-M ends, one end of test circuit and rocket external shell are connected Connect;Ground power supply-M ends are connected with leak resistance Ry and test conversion band switch K respectively;Test conversion band switch K's is another One end is connected with test resistance R1, test resistance R2 successively, in test resistance R2 two ends shunt voltage Table V, leak resistance Ry with Ground power supply+M ends are connected to after leak resistance Rx series connection;The other end of test resistance R2 respectively with rocket external shell and electric leakage Resistance Rx is connected;The computing formula for obtaining ground power supply voltage M is:
In formula, V2 is the magnitude of voltage that test voltage Table V is measured;
S3:Calculate leak resistance Rx and leak resistance Ry values
Simultaneous formula (1) and (2), are calculated leak resistance Rx, leak resistance Ry:
Battery is powered on step (2), arrow, computing system leakage testses result;
S1:Negative busbar leakage testses
One end of test circuit is connected to ground power supply+M ends, one end of test circuit and rocket external shell are connected Connect;Ground power supply+M ends are connected with test conversion band switch K;The other end of test conversion band switch K is electric with test successively Resistance R1, test resistance R2 series connection, voltmeter V are connected in parallel on the two ends of test resistance R2;+ B the ends of power supply and leak resistance Rx on arrow One end connection;The other end of leak resistance Rx is connected with leak resistance Ry, test resistance R2 and rocket external shell respectively;Leakage - B end of the other end of resistance Ry respectively with power supply on ground power supply-M ends, arrow is connected;Obtain on ground power supply voltage M and arrow The computing formula of supply voltage B is:
In formula, V3 is the magnitude of voltage that test voltage Table V is measured;
S2:Positive bus-bar leakage testses
One end of test circuit is connected with power supply-B ends on ground power supply-M ends, arrow respectively, by one end of test circuit It is connected with rocket external shell;Ground power supply-M ends are connected with test conversion band switch K, leak resistance Ry respectively;Electricity on arrow - B the ends in source are connected with test conversion band switch K, leak resistance Ry respectively;Test conversion band switch K is electric with test successively Resistance R1, test resistance R2 series connection;Voltmeter V is connected in parallel on the two ends of test resistance R2;The other end of leak resistance Ry respectively with fire Arrow external shell, leak resistance Rx and test resistance R2 connection;The other end of leak resistance Rx is connected with+B the ends of power supply on arrow; The computing formula for obtaining supply voltage B on arrow is:
In formula, V4 is the magnitude of voltage that test voltage Table V is measured;
S3:Calculate leak resistance Rx and leak resistance Ry values
Simultaneous formula (3) and (4), calculate leak resistance Rx and leak resistance Ry:
Effect:
This method is correctly feasible, can more accurately test and calculate resistance of the power supply buses to the leak resistance of housing Value, for the electric leakage condition evaluation before rocket launching provides important believable foundation.
The content not being described in detail in description of the invention belongs to the known technology of those skilled in the art.

Claims (5)

1. a kind of modified carrier rocket electrical system leakage testses result computational methods, it is characterised in that:Test circuit includes Test resistance R1, test resistance R2, test voltage Table V and test conversion band switch K;Test conversion band switch K, test electricity Resistance R1 and test resistance R2 is sequentially connected in series;Test voltage Table V is connected in parallel on the two ends of test resistance R2;Computational methods include following step Suddenly:
Step (1), ground power supply are powered, computing system leakage testses result;
S1:Negative busbar leakage testses
One end of test circuit is connected to ground power supply+M ends, one end of test circuit is connected with rocket external shell; Computing formula to ground power supply voltage M is:
M = V 1 R 2 ( R 1 + R 2 ) ( 1 + R y R 1 + R 2 + R y R x ) - - - ( 1 )
In formula, V1 is the magnitude of voltage that test voltage Table V is measured;
R1 is the resistance of test resistance R1;
R2 is the resistance of test resistance R2;
Rx is the resistance of leak resistance Rx;
Ry is the resistance of test resistance Ry;
S2:Positive bus-bar leakage testses
One end of test circuit is connected to ground power supply-M ends, one end of test circuit is connected with rocket external shell; Computing formula to ground power supply voltage M is:
M = V 2 R 2 ( R 1 + R 2 ) ( 1 + R x R 1 + R 2 + R x R y ) - - - ( 2 )
In formula, V2 is the magnitude of voltage that test voltage Table V is measured;
S3:Calculate leak resistance Rx and leak resistance Ry values
Simultaneous formula (1) and (2), are calculated leak resistance Rx, leak resistance Ry:
R x = M R 2 - ( V 1 + V 2 ) ( R 1 + R 2 ) V 2
R y = M R 2 - ( V 1 + V 2 ) ( R 1 + R 2 ) V 1
Battery is powered on step (2), arrow, computing system leakage testses result;
S1:Negative busbar leakage testses
One end of test circuit is connected to ground power supply+M ends, one end of test circuit is connected with rocket external shell; The computing formula of supply voltage B is on to ground power supply voltage M and arrow:
B R x + V 3 R 2 = ( M - V 3 R 2 ( R 1 + R 2 ) ) ( 1 R y + 1 R x ) - - - ( 3 )
In formula, V3 is the magnitude of voltage that test voltage Table V is measured;
S2:Positive bus-bar leakage testses
One end of test circuit is connected with power supply-B ends on ground power supply-M ends, arrow respectively, by one end of test circuit and fire Arrow external shell is connected;The computing formula for obtaining supply voltage B on arrow is:
B = V 4 R 2 ( R 1 + R 2 ) ( 1 + R x R 1 + R 2 + R x R y ) - - - ( 4 )
In formula, V4 is the magnitude of voltage that test voltage Table V is measured;
S3:Calculate leak resistance Rx and leak resistance Ry values
Simultaneous formula (3) and (4), calculate leak resistance Rx and leak resistance Ry:
R x = ( M R 2 - ( V 1 + V 2 ) ( R 1 + R 2 ) ) × B M V 2
R y = ( M R 2 - ( V 1 + V 2 ) ( R 1 + R 2 ) ) × B B ( V 1 + V 2 ) - M V 2 .
2. a kind of modified carrier rocket electrical system leakage testses result computational methods according to claim 1, it is special Levy and be:In the S1 of the step (1), circuit is specifically connected as:Ground power supply+M ends respectively with leak resistance Rx and test The K connections of conversion band switch;The other end of test conversion band switch K is connected with test resistance R1, test resistance R2 successively, Test resistance R2 two ends shunt voltage Table V, leak resistance Rx is connected to ground power supply-M ends after being connected with leak resistance Ry;Test The other end of resistance R2 is connected with rocket external shell and leak resistance Ry respectively.
3. a kind of modified carrier rocket electrical system leakage testses result computational methods according to claim 1, it is special Levy and be:In the S2 of the step (1), circuit is specifically connected as:Ground power supply-M ends respectively with leak resistance Ry and test The K connections of conversion band switch;The other end of test conversion band switch K is connected with test resistance R1, test resistance R2 successively, Test resistance R2 two ends shunt voltage Table V, leak resistance Ry is connected to ground power supply+M ends after being connected with leak resistance Rx;Test The other end of resistance R2 is connected with rocket external shell and leak resistance Rx respectively.
4. a kind of modified carrier rocket electrical system leakage testses result computational methods according to claim 1, it is special Levy and be:In the S1 of the step (2), circuit is specifically connected as:Ground power supply+M ends connect with test conversion band switch K Connect;The other end of test conversion band switch K is connected with test resistance R1, test resistance R2 successively, and voltmeter V is connected in parallel on test The two ends of resistance R2;+ B the ends of power supply are connected with one end of leak resistance Rx on arrow;The other end of leak resistance Rx respectively with leakage Resistance Ry, test resistance R2 and rocket external shell are connected;The other end of leak resistance Ry respectively with ground power supply-M ends, arrow - B ends the connection of upper power supply.
5. a kind of modified carrier rocket electrical system leakage testses result computational methods according to claim 1, it is special Levy and be:In the S2 of the step (2), circuit is specifically connected as:Ground power supply-M ends respectively with test conversion band switch K, leak resistance Ry are connected;- B the ends of power supply are connected with test conversion band switch K, leak resistance Ry respectively on arrow;Test turns Band switch K is changed to be connected with test resistance R1, test resistance R2 successively;Voltmeter V is connected in parallel on the two ends of test resistance R2;Electric leakage The other end of resistance Ry is connected with rocket external shell, leak resistance Rx and test resistance R2 respectively;Leak resistance Rx's is another End is connected with+B the ends of power supply on arrow.
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