CN106679842B - A kind of temp measuring method and temperature measurement circuit using reference voltage compensation technology - Google Patents
A kind of temp measuring method and temperature measurement circuit using reference voltage compensation technology Download PDFInfo
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- CN106679842B CN106679842B CN201611065994.0A CN201611065994A CN106679842B CN 106679842 B CN106679842 B CN 106679842B CN 201611065994 A CN201611065994 A CN 201611065994A CN 106679842 B CN106679842 B CN 106679842B
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- temperature
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- voltage source
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/18—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer
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Abstract
The invention discloses a kind of temp measuring method and temperature measurement circuit using reference voltage compensation technology, while reference voltage source is that platinum resistor temperature measuring electric bridge is powered, by the Digital Measurement of Temperature sensor measurement of surface fitting, its temperature passes to fpga chip；Dut temperature is converted to voltage change by platinum resistor temperature measuring electric bridge, then successively inputs fpga chip after filter circuit, operational amplifier and A/D conversion module；Fpga chip carries out the error compensation and calculating of dut temperature, exports the digital quantity of dut temperature according to the temperature error peg model and platinum resistance nonlinear calibration model of reference voltage source.The present invention carries out error compensation by the output valve to reference voltage, guarantees that reference voltage is as accurate as possible in calculating process, to largely improve temperature measurement accuracy.
Description
Technical field
The present invention relates to technical field of temperature measurement more particularly to a kind of temp measuring methods using reference voltage compensation technology
And temperature measurement circuit.
Background technique
The advantages that platinum resistance is wide with its temperature-measuring range, precision is high, stability is good, indicating value repdocutbility is high and resistance to oxidation, in temperature
Degree fields of measurement occupies an important position.In order to reduce influence of the lead resistance to platinum resistor temperature measuring precision, generally using electric bridge electricity
Road design.Its principle are as follows: provide a voltage drive using reference voltage source for bridge circuit, bridge circuit is by the reference voltage
It is converted into the measurement voltage changed with platinum resistance change in resistance, obtains the survey of temperature by acquiring, handling measurement voltage signal
Magnitude.Wherein, the voltage value of reference voltage source output can change with ambient temperature and generate drift, this temperature error is high-precision
It is more prominent to spend thermometric occasion, largely affects temperature measurement accuracy.
Summary of the invention
In view of the above-mentioned drawbacks of the prior art, the present invention proposes a kind of thermometric side using reference voltage compensation technology
Method and temperature measurement circuit, improve temperature measurement accuracy.
A kind of temp measuring method using reference voltage compensation technology provided by the invention, it is improved in that benchmark is electric
While potential source is that platinum resistor temperature measuring electric bridge is powered, by the Digital Measurement of Temperature sensor measurement of surface fitting, its temperature passes to FPGA
Chip；Dut temperature is converted to voltage change by the platinum resistor temperature measuring electric bridge, then successively passes through filter circuit, operational amplifier
With the fpga chip is inputted after A/D conversion module；The fpga chip is according to the temperature error peg model of reference voltage source
With platinum resistance nonlinear calibration model, the error compensation and calculating of the dut temperature are carried out, the number of the dut temperature is exported
Word amount.
Preferably, the step of establishing the temperature error peg model of the reference voltage source include:
(1) the Digital Measurement of Temperature sensor is bonded the reference voltage source, and the surface temperature of the reference voltage source is passed
To the fpga chip；
(2) output voltage of the reference voltage source passes to after the operational amplifier and the A/D conversion module
The fpga chip；
(3) temperature in space where adjusting the reference voltage source, the fpga chip latch institute under output different temperatures
State the surface temperature and output voltage of reference voltage source；
(4) surface temperature and output voltage values obtained according to step (3) models, and determines the output of the reference voltage source
The function of voltage and surface temperature.
More preferably, the output voltage of step (4) described reference voltage source and the function of surface temperature are as follows:
Establish the reference voltage output quantity VREFWith the temperature value TV-REFBetween functional relation are as follows:
VREF=VREF0+f(TV-REF) (1)
In formula, VREFFor the output voltage of benchmark voltage source；VREF0For the theoretical output voltage of benchmark voltage source；f(TV-REF)
The piecewise function varied with temperature for output error.
More preferably, the piecewise function f (TV-REF) in waypoint by analysis regression criterion determine.
More preferably, the step of establishing the platinum resistance nonlinear calibration model include:
1) reference voltage source is platinum resistor temperature measuring electric bridge power supply；
2) temperature in space, keeps it synchronous with the temperature change of step (3) where adjusting platinum resistance, the fpga chip lock
It deposits platinum resistance resistance value data at different temperatures and exports；
3) according to the temperature and correspondence resistance value data modeling in step 2), the letter of the platinum resistance resistance value and temperature is determined
Number.
More preferably, it carries out the error compensation of the dut temperature and calculating includes the following steps:
I. according to formula (1), the output voltage V of calculating benchmark voltage sourceREFValue；
II. the voltage V of the exit point of the platinum resistor temperature measuring electric bridge is calculatedT:
In formula, β is the amplification factor of operational amplifier when carrying out temp measuring method；VDFpga chip when to carry out temp measuring method
Receive the digital quantity of A/D conversion module output；
III. platinum resistance resistance value R is calculatedT:
In formula, R is the precision resistance of definite value；
V. the digital quantity T of dut temperature is calculated:
T=g (RT) (4)。
More preferably, space where space where the reference voltage source and platinum resistance is separately positioned on the same incubator
The same position, carry out temperature adjusting when, the setting to the incubator includes:
1. incubator is stood, 25 DEG C of heat preservation 60min；
2. incubator is heated up 5 DEG C with 1 DEG C/min speed, 10min is kept the temperature in the temperature spot；
3. 2. return step carries out incubator heating, until keeping the temperature 10min when the Temperature of Warm Case is 80 DEG C；
4. incubator is cooled down 5 DEG C with 1 DEG C/min speed, 10min is kept the temperature in the temperature spot；
5. 4. return step carries out incubator cooling, until keeping the temperature 10min when the Temperature of Warm Case is -40 DEG C；
6. 2. return step carries out incubator heating, until keeping the temperature 10min when the Temperature of Warm Case is 25 DEG C.
More preferably, the temperature measurement circuit includes platinum resistor temperature measuring electric bridge, filter circuit, operational amplifier, A/D modulus of conversion
Block, reference voltage source, Digital Measurement of Temperature sensor and fpga chip；
The Digital Measurement of Temperature sensor is connect after being bonded the reference voltage source with the fpga chip；The reference voltage
Source successively with the platinum resistor temperature measuring electric bridge, the filter circuit, the operational amplifier, the A/D conversion module and described
Fpga chip connection.
More preferably, the platinum resistance model PT100, the platinum resistor temperature measuring electric bridge include platinum resistance and 3 resistance values
Identical definite value precision resistance；In two branches of the platinum resistance and definite value precision resistance composition, symmetric position is led
The model of line, length, wire laying mode are identical.
In technical solution of the present invention:
(1) error compensation is carried out by the output valve to reference voltage, guarantees reference voltage as far as possible in calculating process
Accurately, to largely improve temperature measurement accuracy；
(2) reference voltage source Temperature error model scaling method is devised, temperature measurement circuit can be effectively ensured in periodic calibration
Precision it is steady in a long-term.
(3) parameter in FGPA chip software is easy to modify, and function waypoint can easily be accommodated, in terms of improving compensation precision
There is preferable operability.
(4) the reference voltage source Temperature error model scaling method designed, for the other application occasion of reference voltage source
It is equally applicable.
(5) while compensating platinum resistance nonlinearity erron, the compensation of reference voltage source temperature error is carried out, it is additional to increase
System power dissipation it is smaller, have the advantages of simple structure and easy realization.
Detailed description of the invention
Fig. 1 is the temperature measurement circuit schematic diagram using reference voltage compensation technology of the embodiment of the present invention；
Fig. 2 is the reference voltage source temperature error Calibration Circuit schematic diagram of the embodiment of the present invention；
Fig. 3 is the platinum resistor temperature measuring electrical bridge principle figure of the embodiment of the present invention.
Specific embodiment
To make the objectives, technical solutions, and advantages of the present invention more comprehensible, referring to the drawings and preferred reality is enumerated
Example is applied, the present invention is described in more detail.However, it is necessary to illustrate, many details listed in specification are only to be
Reader is set to have a thorough explanation to one or more aspects of the present invention, it can also be with even without these specific details
Realize the aspects of the invention.
The temp measuring method and temperature measurement circuit using reference voltage compensation technology of the present embodiment, Main are electric with platinum
When resistance carries out temperature measurement, error compensation is carried out by the output valve to reference voltage, guarantees reference voltage in calculating process
It is as accurate as possible, to largely improve temperature measurement accuracy.It is specific:
The temperature measurement circuit using reference voltage compensation technology that the present embodiment proposes is as shown in Figure 1, include platinum resistor temperature measuring
Electric bridge, filter circuit, operational amplifier, A/D conversion module, reference voltage source, Digital Measurement of Temperature sensor and fpga chip；Number
Temperature transducer fitting reference voltage source after connect with fpga chip, reference voltage source successively with platinum resistor temperature measuring electric bridge, filter
Circuit, operational amplifier, A/D conversion module are connected with fpga chip.Reference voltage source is the same of platinum resistor temperature measuring electric bridge power supply
When, pass through the temperature T for the Digital Measurement of Temperature sensor measurement reference voltage source that surface is bondedV-REFPass to fpga chip；Platinum resistance is surveyed
Dut temperature is converted to voltage change by warm electric bridge, is exported as VT-PAnd VT-N, amplify β times by operational amplifier, using A/D
Analog quantity is converted to digital quantity V by conversion moduleDAfter input fpga chip；Fpga chip is according to the temperature error of reference voltage source
Peg model and platinum resistance nonlinear calibration model, carry out the error compensation and calculating of dut temperature, export the number of dut temperature
Word amount.
Specifically, Calibration Circuit schematic diagram is such as when the present embodiment establishes the temperature error peg model of reference voltage source
Shown in Fig. 2, including reference voltage source, operational amplifier, A/D conversion module, Digital Measurement of Temperature sensor and fpga chip.Number is surveyed
Temperature sensor is bonded reference voltage source, by the surface temperature T of reference voltage sourceV-REFPass to fpga chip.At the same time, benchmark electricity
The output voltage V of potential sourceREFAmplify α times by operational amplifier, analog quantity is switched into digital quantity V using A/D conversion moduleRD
After pass to fpga chip.The temperature in space where adjusting reference voltage source, fpga chip latch benchmark electricity under output different temperatures
The surface temperature and output voltage of potential source model reference voltage source surface temperature and output voltage values using MATLAB, modeling
Process is as follows:
The digital quantity V exported according to fpga chipRD, calculating benchmark voltage output amount VREF:
α is the amplification factor of operational amplifier in formula；
Reference voltage output quantity VREFWith temperature value TV-REFBetween functional relation are as follows:
VREF=VREF0+f(TV-REF) (1)
In formula, VREFFor the output voltage of benchmark voltage source；VREF0For the theoretical output voltage of benchmark voltage source；f(TV-REF)
The piecewise function varied with temperature for output error.Piecewise function f (TV-REF) in parameters be fitted using least square method
It obtains, waypoint is determined by analysis regression criterion.Parameter includes term coefficient, two-term coefficient, Monomial coefficient, constant three times
?.
Specifically, when the present embodiment establishes platinum resistance nonlinear calibration model, platinum resistor temperature measuring bridge circuit schematic diagram
As shown in figure 3, including platinum resistance and the identical definite value precision resistance of 3 resistance values.Reference voltage source is the confession of platinum resistor temperature measuring electric bridge
In two branches of electricity, platinum resistance and definite value precision resistance composition, model, length, the wire laying mode phase of the conducting wire of symmetric position
Together.The platinum resistance model PT100 of the present embodiment.In modeling, the temperature in space where adjusting platinum resistance makes itself and benchmark electricity
The temperature change when temperature error of potential source demarcates modeling synchronizes, the resistance value data of record platinum resistance at different temperatures, and passes
To fpga chip, fpga chip latches output temperature and corresponding resistance value data.It is modeled using MATLAB, determines the platinum resistance
The function of resistance value and temperature.
The present embodiment is in the temperature error calibration modeling and the modeling of platinum resistance nonlinear calibration of reference voltage source, by benchmark
Space where space where voltage source and platinum resistance is separately positioned on the same position of the same incubator, when carrying out temperature adjusting,
Setting to incubator includes:
1. being put into circuit devcie, 25 DEG C of heat preservation 60min of incubator；
2. incubator is heated up 5 DEG C with 1 DEG C/min speed, 10min is kept the temperature in the temperature spot；
3. 2. return step carries out incubator heating, until keeping the temperature 10min when the Temperature of Warm Case is 80 DEG C；
4. incubator is cooled down 5 DEG C with 1 DEG C/min speed, 10min is kept the temperature in the temperature spot；
5. 4. return step carries out incubator cooling, until keeping the temperature 10min when the Temperature of Warm Case is -40 DEG C；
6. 2. return step carries out incubator heating, until keeping the temperature 10min when the Temperature of Warm Case is 25 DEG C.
Specifically, steps are as follows when the present embodiment carries out the error compensation and calculating of dut temperature:
I. known quantity V is usedREF0With the fpga chip input quantity TV-REF, according to the reference voltage source temperature error mark
The functional relation that the method for determining obtains, calculating benchmark voltage output amount VREFValue:
VREF=VREF0+f(TV-REF) (1)
In formula, VREF0For the theory output of benchmark voltage source, f (TV-REF) it is the segmentation that characterization output error varies with temperature
Function；
II. known quantity β and fpga chip input quantity V is usedD, calculate the voltage V of platinum resistor temperature measuring bridge output pointT:
In formula, β is the amplification factor of operational amplifier when carrying out temp measuring method；VDFpga chip when to carry out temp measuring method
Receive the digital quantity of A/D conversion module output；
III. according to platinum resistor temperature measuring electric bridge according to electrical bridge principle, the voltage V of platinum resistor temperature measuring bridge output pointTAre as follows:
Therefore, platinum resistance resistance value RTCalculation formula are as follows:
In formula, R is the precision resistance of definite value；
V. using platinum resistance resistance value R obtained by above-mentioned steps IIIT, the function that is obtained according to the platinum resistance nonlinear calibration
Relationship calculates the output valve T of dut temperature:
T=g (RT) (4)。
Finally, the digital quantity of fpga chip output dut temperature.
Partial parameters are as follows in the present embodiment circuit:
The resistance value of precision resistance is 100 Europe in platinum resistor temperature measuring electric bridge；
The model DS18B20 of Digital Measurement of Temperature sensor；
A/D conversion module includes A/D conversion chip, model ADS1146.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art
For member, without departing from the principle of the present invention, it can also make several improvements and retouch, these improvements and modifications are also answered
It is considered as protection scope of the present invention.
Claims (5)
1. a kind of temp measuring method using reference voltage compensation technology, which is characterized in that reference voltage source is platinum resistor temperature measuring electricity
While bridge is powered, by the Digital Measurement of Temperature sensor measurement of surface fitting, its temperature passes to fpga chip；The platinum resistance is surveyed
Dut temperature is converted to voltage change by warm electric bridge, then successively defeated after filter circuit, operational amplifier and A/D conversion module
Enter the fpga chip；The fpga chip is according to the temperature error peg model and platinum resistance nonlinear calibration of reference voltage source
Model carries out the error compensation and calculating of the dut temperature, exports the digital quantity of the dut temperature；
Wherein, the step of establishing the temperature error peg model of the reference voltage source include:
(1) the Digital Measurement of Temperature sensor is bonded the reference voltage source, and the surface temperature of the reference voltage source is passed to institute
State fpga chip；
(2) output voltage of the reference voltage source passes to described after the operational amplifier and the A/D conversion module
Fpga chip；
(3) temperature in space where adjusting the reference voltage source, the fpga chip latch the base under output different temperatures
The surface temperature and output voltage of reference voltage source；
(4) surface temperature and output voltage values obtained according to step (3) models, and determines the output voltage of the reference voltage source
With the function of surface temperature；
The step of establishing the platinum resistance nonlinear calibration model include:
1) reference voltage source is platinum resistor temperature measuring electric bridge power supply；
2) temperature in space, keeps it synchronous with the temperature change of step (3) where adjusting platinum resistance, and the fpga chip latches platinum
Resistance resistance value data at different temperatures simultaneously export；
3) according to the temperature and correspondence resistance value data modeling in step 2), the function of the platinum resistance resistance value and temperature is determined.
2. temp measuring method as described in claim 1, which is characterized in that the output voltage of step (4) described reference voltage source with
The function of surface temperature is as follows:
Establish the reference voltage output quantity VREFWith the surface temperature TV-REFBetween functional relation are as follows:
VREF=VREF0+f(TV-REF) (1)
In formula, VREFFor the output voltage of benchmark voltage source；VREF0For the theoretical output voltage of benchmark voltage source；f(TV-REF) it is defeated
The piecewise function that error varies with temperature out.
3. temp measuring method as claimed in claim 2, which is characterized in that the piecewise function f (TV-REF) in waypoint by point
Regression criterion is analysed to determine.
4. temp measuring method as claimed in claim 2 or claim 3, which is characterized in that carry out the error compensation and meter of the dut temperature
Include the following steps:
I. according to formula (1), the output voltage V of calculating benchmark voltage sourceREFValue；
II. the voltage V of the exit point of the platinum resistor temperature measuring electric bridge is calculatedT:
In formula, β is the amplification factor of operational amplifier when carrying out temp measuring method；VDFpga chip receives when to carry out temp measuring method
The digital quantity of A/D conversion module output；
III. platinum resistance resistance value R is calculatedT:
In formula, R is the precision resistance of definite value；
V. the digital quantity T of dut temperature is calculated:
T=g (RT) (4)。
5. temp measuring method as claimed in claim 3, which is characterized in that by space and platinum resistance institute where the reference voltage source
When space is separately positioned on the same position of the same incubator, carries out temperature adjusting, the setting to the incubator includes:
1. incubator is stood, 25 DEG C of heat preservation 60min；
2. incubator is heated up 5 DEG C with 1 DEG C/min speed, 10min is kept the temperature in the temperature spot；
3. 2. return step carries out incubator heating, until keeping the temperature 10min when the Temperature of Warm Case is 80 DEG C；
4. incubator is cooled down 5 DEG C with 1 DEG C/min speed, 10min is kept the temperature in the temperature spot；
5. 4. return step carries out incubator cooling, until keeping the temperature 10min when the Temperature of Warm Case is -40 DEG C；
6. 2. return step carries out incubator heating, until keeping the temperature 10min when the Temperature of Warm Case is 25 DEG C.
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| CN201611065994.0A CN106679842B (en) | 2016-11-28 | 2016-11-28 | A kind of temp measuring method and temperature measurement circuit using reference voltage compensation technology |
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| CN109655179A (en) * | 2018-12-06 | 2019-04-19 | 东南大学 | Three-dimensional force sensor measuring circuit and method with temperature-compensating and optical fiber output |
| CN110243486B (en) * | 2019-07-04 | 2021-01-08 | 上海申矽凌微电子科技有限公司 | Full-temperature high-precision temperature sensing system, method and medium |
| CN110411608B (en) * | 2019-07-23 | 2021-01-19 | 瑞纳智能设备股份有限公司 | Correction method and system for temperature measurement error of single-live-wire switch |
| CN112198915B (en) * | 2020-10-22 | 2022-02-08 | 上海卫星工程研究所 | Satellite double-super-platform magnetic levitation electric drive temperature compensation method and system |
| CN112462740B (en) * | 2020-11-25 | 2022-04-22 | 中国兵器工业集团第二一四研究所苏州研发中心 | Temperature compensation calibration method for Stirling refrigerator controller |
| CN114636484B (en) * | 2022-05-09 | 2022-08-23 | 深圳市航顺芯片技术研发有限公司 | Digital temperature sensor, chip temperature detection system and chip temperature detection method |
| CN116054826A (en) * | 2023-03-31 | 2023-05-02 | 中勍科技股份有限公司 | Digital low-cost high-precision current frequency conversion system |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1963908A (en) * | 2005-11-10 | 2007-05-16 | 昆达电脑科技(昆山)有限公司 | Temperature compensating apparatus of LCD element and its method |
| CN101019010A (en) * | 2004-09-15 | 2007-08-15 | 皇家飞利浦电子股份有限公司 | Digital temperature sensors and calibration thereof |
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101019010A (en) * | 2004-09-15 | 2007-08-15 | 皇家飞利浦电子股份有限公司 | Digital temperature sensors and calibration thereof |
| CN1963908A (en) * | 2005-11-10 | 2007-05-16 | 昆达电脑科技(昆山)有限公司 | Temperature compensating apparatus of LCD element and its method |
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