CN106651793A - PST stray light test data processing method - Google Patents
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- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
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Abstract
The invention provides a PST stray light test data processing method comprising the following steps that (1) inversion of the requirements of testing environment stray light is performed based on comprehensive assessment of remote sensing camera PST features and CCD detector performance; (2) differential calculation is performed on stray light test images under different states, and distribution of various test noise on a CCD detector is separated and extracted so as to complete stripping of test noise; (3) mathematical analysis is performed on the test images after stripping of test noise so as to analyze the scale of the image data and the distribution featuers of the values; and (4) a stable, efficient and accurate subsequent processing algorithm is determined according to the analyzed data scale and the value distribution features so as to complete testing of all columns of stray energy transmission capability of the CCD detector The PST stray light test data processing method is mainly used for PST stray light test data processing so that the technical requirements of the test system for instrument equipment can be reduced, the method has high transplantability and generality and thus the requirements of various types of stray light test data processing can be met.
Description
Technical field
The present invention relates to a kind of PST Stray Light Tests data processing method, it is adaptable to which all kinds, various spectral coverage space flight are distant
The data processing and analysis of sensor imaging system high accuracy PST Stray Light Test, belongs to Aid of Space Remote Sensing Technology field.
Background technology
The accuracy and precision of PST Stray Light Test data processings is largely determined by test noise and peels off and data processing
Two aspects of algorithm.The former is mainly by the method for image procossing to CCD dark current noises, the spuious optical noise of test environment
(being introduced by testing light source, darkroom etc.) etc. is separated and is extracted, and the quantitative and positioning analysis to each noise like is realized, so as to reach
To the purpose peeled off；The latter is the analysis carried out for valid data and place after completing the separation of noise, extracting and reject
Reason, it is contemplated that the data volume that PST Stray Light Tests are produced is huge, its Processing Algorithm must have good stability, accuracy height concurrently, receive
Fireballing feature is held back, and to possess good portable and versatility, all kinds of optical systems can be met in varying environment
The demand of lower PST Stray Light Test data processings.The present invention is solved in PST Stray Light Test data handling procedures, and test is made an uproar
Acoustic fix ranging and peel off inaccurate or cannot peel off, large-scale data Treatment Stability and accuracy cannot ensure, algorithm is removable
The problems such as plant property and versatility are poor.
The content of the invention
The present invention technology solve problem be：Overcome prior art not enough, propose a kind of PST Stray Light Tests data processing
Method, solve all kinds of test noises in PST Stray Light Test data handling procedures separation, extract and reject, and based on into
As the comprehensive assessment of system PST characteristic and ccd detector performance, can be finally inversed by for the requirement for surveying environment veiling glare；Together
When, carry out the process of large-scale image and data automatically with the numerical analyses such as least square method, genetic algorithm and operation method,
PST results are directly exported, portability and versatility is improve.
The present invention technical solution be：A kind of PST Stray Light Tests data processing method, step is as follows：
(1) according to point source transmitance PST of remote sensing camera, and ccd detector electric property, including photon efficiency, really
Determine environment veiling glare ENERGY EEnv, according to environment veiling glare ENERGY EEnv, it is determined that being radiated at the energy of light source of remote sensing camera entrance；
(2) under light source output different-energy state, remote sensing camera ccd image is acquired, then ccd image is carried out
Difference Calculation, to separate, extract distribution of all kinds of test noises on ccd detector, so as to complete the stripping of test noise, obtains
To the ccd image for having peeled off noise；
(3) ccd image to having peeled off noise in step (2) carries out mathematical analysis, parses expression and has peeled off noise
The matrix of ccd image whether there is inverse matrix；
(4) if there is inverse matrix, directly the matrix to having peeled off the ccd image of noise is solved, if not existing inverse
Matrix, then solved from least square method or genetic algorithm or dichotomy to the matrix for having peeled off the ccd image of noise, is obtained
To each row stray energy carry-over factors of remote sensing camera CCD, i.e. the contribution of each pixel veiling glare total for the row during CCD is often capable
Ability, for the image rectification in later stage.
Described step (1) is according to point source transmitance PST of remote sensing camera, and ccd detector electric property, including light
Sub- efficiency, determines environment veiling glare ENERGY EEnvMethod be：Under calculating the receptible spuious light energy of remote sensing camera institute respectively
Limit EPSTWith CCD minimum electrical noise ENERGY EsCCD, then environment veiling glare ENERGY E is surveyedEnvRequire EEnv<(EPST+ECCD)。
In described step (2), point source transmitance is PST, and the pixel scale of CCD is that rows rows and cols are arranged, at i-th
Under energy state, it is E that light source is input into spuious light energy0i(i=1,2 ..., n+1), the l rows of ccd detector, kth row pixel connect
The stray energy for receiving is E'(i)(l,k)(l=1,2 ... rows；K=1,2 ... cols).
So, jth+1 and adjacent input energy difference DELTA E twice of jth0j=E0(j+1)-E0j(j=1,2 ..., n)；And
The stray energy difference that twice l rows, kth row pixel are received is Δ E'(j)(l,k)=E'(j+1)(l,k)-E'(j)(l,k), then
Twice the difference of the pixel is Diff (Ej)(l,k)=Δ E0iPST-ΔE'(j)(l.k), the difference of the pixel is averagedWherein δiFor the weight of difference, the difference that other pixels can be tried to achieve in the same manner is put down
Average, and the difference mean value of each pixel constitutes rows × cols rank matrixes, and corresponding to rows × cols rank pictures of CCD
Unit, as test noise.The ccd detector gross energy that each pixel is received under the 1st energy state deducts the difference of the pixel
Mean value is divided to realize having surveyed the stripping of test noise.
Data pathosis in described step (3) refer to the solution difficulty or ease journey of rows × cols rank picture element matrixs of CCD
Degree.
Described step (4) is selected according to the matrix for representing the ccd image for having peeled off noise is parsed with the presence or absence of inverse matrix
Select least square method or generalized inverse least square method, genetic algorithm, dichotomy, it can be ensured that the stability of calculating process and computing
As a result accuracy, and ensure that computing has higher convergence rate, meet the demand of all kinds of Stray Light Test data processings.
Present invention advantage compared with prior art is：
(1) integrated use of the present invention image procossing, difference algorithm, least square method, genetic algorithm, unmanaged code skill
The multiple technologies means such as art, in solving PST Stray Light Test data handling procedures, test noise position and peel off it is inaccurate or
Person cannot peel off, large-scale data Treatment Stability and accuracy cannot ensure, algorithm is portable and versatility is poor etc. asks
Topic, is the key technology in PST test process with stronger practicality and versatility,
(2) present invention can reduce technical requirements of the test system for tester equipment, while ensureing measuring accuracy.
The present invention can meet the demand of all kinds of Stray Light Test data processings, and reduce the early investment of such test system.
Description of the drawings
Fig. 1 is PST Stray Light Tests data processing method flow chart of the present invention；
Fig. 2 is a series of pending image gathered in test process.
Specific embodiment
A kind of PST Stray Light Tests data processing method of the present invention is as follows：(1) based on remote sensing camera PST characteristics and CCD
The comprehensive assessment of detector performance, is finally inversed by for the requirement for surveying environment veiling glare；(2) by spuious flash ranging under different conditions
Attempt, as carrying out Difference Calculation, to separate, distribution of all kinds of test noises on CCD focal planes is extracted, so as to complete test noise
Peel off；(3) mathematical analysis is carried out to the test image after peel test noise, parses the scale of view data and dividing for numerical value
Cloth feature；(4) data scale and numeric distribution feature according to obtained by parsing determines that stable, efficient, accurate subsequent treatment is calculated
Method, completes the drafting of PST curves and the judgement of spuious Xanthophyll cycle angle.Present invention is mainly used for PST Stray Light Test data
Process, technical requirements of the test system for instrument and equipment can be reduced, with higher portable and versatility, Ke Yiman
The demand of all kinds of Stray Light Test data processings of foot.
The present invention a kind of PST Stray Light Tests data processing method, including early stage test noise peel off and it is follow-up
Large-scale data is automatically processed, and is related to the technological means such as image procossing, algorithm development, the system integration.First, in test process
The image of collection carries out difference algorithm process, obtains D/N Distribution value change of the CCD pixels array under the conditions of different veiling glares,
And with reference to the characteristic distributions of CCD dark current noises, the spuious optical noise of test environment etc., so as to separate, extract all kinds of test noises
Distribution on ccd detector；Secondly, the data volume of PST Stray Light Tests is huge, it is necessary to assure Processing Algorithm has powerful
Stability and reliable accuracy, it is to avoid the interference of singular point cannot restrain so as to cause result of calculation；Finally, it is removable in order to improve
Plant property and versatility, employ unmanaged code technology, realize rapid deployment, it is to avoid because interface communication, registration table are noted
The problem of the program stability difference that volume etc. brings.The present invention as a kind of novel PST Stray Light Test data processing techniques, no
Only disclosure satisfy that the data processing needs of all kinds of space remote sensors PST Stray Light Tests under various circumstances, and can be
While ensureing measuring accuracy, test system is reduced for the requirement of instrument and equipment, it is cost-effective.
Embodiment 1
To visible spectrum, focal length value is 40mm, and relative aperture is the remote sensing phase that 0.5, CCD pixels array is rectangular array
Machine Stray Light Test view data is processed.
As shown in figure 1, the present invention's comprises the following steps that：
(1) determination of test environment energy
Point source transmitance PST of remote sensing camera is calculated using the Analysis for Stray Light such as Fred, LightTools software,
Obtain point source transmitance PST of remote sensing camera.
Spuious light energy lower limit E is calculated respectively according to following two formulaPSTWith CCD minimum electrical noise ENERGY EsCCD：
In upper two formula, S/N for camera signal to noise ratio, N 'eFor the image-forming electron number of camera CCD, N 'ei(i=1 ..., n) be
The electron number that each noise like of camera CCD is produced, such as dark current noise.d2For pixel area；T is the time of integration；λ is photon
Wavelength；η is photon efficiency；H is Planck's constant；C is the light velocity in vacuum.
Then to surveying environment veiling glare ENERGY EEnvThere is following requirement：
EEnv<(EPST+ECCD)
(2) determination of energy of light source
According to survey environment veiling glare ENERGY EEnvAnd the reflectivity γ of camera outer surface is calculated and is radiated at remote sensing camera and enters
Maximum E of mouth energy of light source0(n+1)：
E0(n+1)=EENV/γ
(3) IMAQ
By E0(n+1)Start point n time and be gradually lowered the output energy of light source until E01, that is, meet E0(n+1)>E0n>…>E0i>…
E01(1<i<N), and under each energy output, the image that camera is generated is gathered, obtains CCD pixels array in different spuious striations
D/N values under part.6 images are gathered in this example altogether, as shown in Fig. 2 i.e. n=5；
(4) peel test noise
The pixel number of each width image is identical in Fig. 2, and is arranged according to 50 × 1000 matrix, i.e. rows
=50, cols=1000.Note i-th (i=1,2 ..., 6) in width figure, l (l=1,2 ..., 50) row, kth (k=1,2 ...,
1000) stray energy that row pixel is received is E (i)(l,k), its computational methods is as follows：
Wherein, DN (i)(l,k)For in the i-th width figure, l rows, the DN values of kth row pixel, k is CCD turning by electronics to DN values
Change coefficient.
Stray energy and l rows, the kth of jth width image that then the l rows of the width of jth+1 image, kth row pixel are received
Difference Δ E (j) of the stray energy that row pixel is received(l,k)(j=1,2 ..., 5) can be calculated by following formula：
ΔE'(j)(l,k)=E'(j+1)(l,k)-E'(j)(l,k)
It is E that 6 width images in Fig. 2 from top to bottom correspond to respectively light source and be input into spuious light energy01、E02、E03、E04、E05、
E06, then the difference Δ E of the input energy of the width of jth+1 image and jth width image0jFor：
ΔE0j=E0(j+1)-E0(j)
So, l rows, the kth row pixel difference Diff (E of the width of jth+1 image and jth width imagej)(l,k)Can be by following formula meter
Calculate：
Diff(E'j)(l,k)=Δ E0iPST-ΔE'(j)(l,k)
Then this 6 width image l rows, difference mean value of kth row pixelComputational methods are as follows：
Wherein, δjFor the weight of difference, can be calculated by following formula and be tried to achieve：
To other, each pixel does above-mentioned identical calculations, you can obtain the rows being made up of the difference mean value of each pixel
× cols rank matrixesAnd remember that the rows × cols ranks matrix being made up of the stray energy of the 1st width image each pixel is E
(1), then matrix E ' after peel test noise0For：
(5) E ' is parsed0With the presence or absence of inverse matrix
The large-scale data of peel test noise is processed according to data scale and numeric distribution, algorithm is analyzed and processed
Different strategies can be adopted according to the scale and characteristic distributions of input data, so as to reach the purpose of Fast Convergent.If E '0It is not
Square formation, then E '0It is irreversible, there is no inverse matrix；If E '0For square formation, but determinant | E'0|=0, then E'0It is irreversible, do not deposit
In inverse matrix；If E'0For square formation, and determinant | E'0| ≠ 0, then E'0It is reversible, there is inverse matrix；Due to pixel in this example
Columns is far longer than line number, so E '0It is not square formation, there is no inverse matrix；
(6) solution of spuious carry-over factor
E'0There is inverse matrix, directly solved；
E'0There is no inverse matrix, solved using least square method, genetic algorithm etc.；
Due to E' in this example0There is no inverse matrix, therefore solved using least square method, it is as a result as follows：
X=((E'0)TE'0)-1(E'0)TB
In above formula, X be the spuious carry-over factor of each row to be asked be 1 × cols rank vector, from the spuious of each row
Carry-over factor can interpret the information such as spuious Xanthophyll cycle angle, abnormal incident angle., (E'0)TFor matrix E '0Transposition, B is
The vector of one rows × 1 rank characterizes the veiling glare summation of each rows of CCD.
Embodiment 2
When image to producing in other cameras PST test process is processed, analysis process ibid, can draw similar knot
Really.Simply processing square CCD image, and matrix E '0When there is inverse matrix, the solution of X is as follows：
X=(E'0)-1B
Integrated use of the present invention image procossing, difference algorithm, least square method, genetic algorithm, unmanaged code technology
Etc. multiple technologies means, in solving PST Stray Light Test data handling procedures, test noise position and peel off it is inaccurate or
Cannot peel off, the problems such as large-scale data Treatment Stability and accuracy cannot ensure, algorithm portable and versatility is poor,
It is the key technology in PST test process with stronger practicality and versatility, test system can be reduced for tester
The technical requirements of device equipment, while ensureing measuring accuracy.
Jing tests and test the present invention can meet the demand of all kinds of Stray Light Test data processings, and reduce this class testing
The early investment of system.
Unspecified content belongs to the common knowledge of this area in the present invention.
Claims (5)
1. a kind of PST Stray Light Tests data processing method, it is characterised in that step is as follows：
(1) according to point source transmitance PST of remote sensing camera, and ccd detector electric property, including photon efficiency, determine ring
Border veiling glare ENERGY EEnv, according to environment veiling glare ENERGY EEnv, it is determined that being radiated at the energy of light source of remote sensing camera entrance；
(2) under light source output different-energy state, remote sensing camera ccd image is acquired, then difference is carried out to ccd image
Calculate, to separate, extract distribution of all kinds of test noises on ccd detector, so as to complete the stripping of test noise, shelled
From the ccd image of noise；
(3) ccd image to having peeled off noise in step (2) carries out mathematical analysis, parses and represents the CCD figures for having peeled off noise
The matrix of picture whether there is inverse matrix；
(4) if there is inverse matrix, directly the matrix to having peeled off the ccd image of noise is solved, if there is no inverse matrix,
Then the matrix for having peeled off the ccd image of noise is solved from least square method or genetic algorithm or dichotomy, obtain distant
The each row stray energy carry-over factors of sense camera CCD, i.e. the contribution energy of each pixel veiling glare total for the row during CCD is often capable
Power, for the image rectification in later stage.
2. a kind of PST Stray Light Tests data processing method according to claim 1, it is characterised in that：Described step
(1) according to point source transmitance PST of remote sensing camera, and ccd detector electric property, including photon efficiency, determine that environment is miscellaneous
Astigmatism ENERGY EEnvMethod be：The receptible spuious light energy lower limit E of remote sensing camera institute is calculated respectivelyPSTWith the minimum electricity of CCD
Noise energy ECCD, then environment veiling glare ENERGY E is surveyedEnvRequire EEnv<(EPST+ECCD)。
3. a kind of PST Stray Light Tests data processing method according to claim 1, it is characterised in that：Described step
(2) in, point source transmitance is PST, and the pixel scale of CCD is that rows rows and cols are arranged, and under i-th energy state, light source is defeated
Enter spuious light energy for E0i(i=1,2 ..., n+1), the stray energy that the l rows of ccd detector, kth row pixel are received is
E'(i)(l,k)(l=1,2 ... rows；K=1,2 ... cols)；
So, jth+1 and adjacent input energy difference DELTA E twice of jth0j=E0(j+1)-E0j(j=1,2 ..., n)；And twice
The stray energy difference that l rows, kth row pixel are received is Δ E'(j)(l,k)=E'(j+1)(l,k)-E'(j)(l,k), then twice should
The difference of pixel is Diff (Ej)(l,k)=Δ E0iPST-ΔE'(j)(l.k), the difference of the pixel is averagedWherein δiFor the weight of difference, the difference that other pixels can be tried to achieve in the same manner is put down
Average, and the difference mean value of each pixel constitutes rows × cols rank matrixes, and corresponding to rows × cols rank pictures of CCD
Unit, as test noise；The ccd detector gross energy that each pixel is received under the 1st energy state deducts the difference of the pixel
Mean value is divided to realize having surveyed the stripping of test noise.
4. a kind of PST Stray Light Tests data processing method according to claim 1, it is characterised in that：Described step
(3) the data pathosis in refer to the solution complexity of rows × cols rank picture element matrixs of CCD.
5. a kind of PST Stray Light Tests data processing method according to claim 1, it is characterised in that：Described step
(4) according to the matrix for representing the ccd image for having peeled off noise is parsed with the presence or absence of inverse matrix, least square method or broad sense are selected
Inverse least square method, genetic algorithm, dichotomy, it can be ensured that the stability of calculating process and the accuracy of operation result, and protect
Card computing has higher convergence rate, meets the demand of all kinds of Stray Light Test data processings.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN108036928A (en) * | 2017-12-15 | 2018-05-15 | 中国科学院西安光学精密机械研究所 | Entrance pupil magnitude of voltage scaling method, system and PST test systems in PST tests |
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| EP1369743A2 (en) * | 2002-06-07 | 2003-12-10 | Brion Technologies, Inc. | Characterisation of lithography apparatus |
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| CN108036928B (en) * | 2017-12-15 | 2023-09-01 | 中国科学院西安光学精密机械研究所 | Method and system for calibrating entrance pupil voltage value in PST test and PST test system |
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