CN106601579A - Upper electrode mechanism and semiconductor processing device - Google Patents

Upper electrode mechanism and semiconductor processing device Download PDF

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Publication number
CN106601579A
CN106601579A CN201510679475.2A CN201510679475A CN106601579A CN 106601579 A CN106601579 A CN 106601579A CN 201510679475 A CN201510679475 A CN 201510679475A CN 106601579 A CN106601579 A CN 106601579A
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CN
China
Prior art keywords
coil
electrode mechanism
adapter
top electrode
base plate
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Granted
Application number
CN201510679475.2A
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Chinese (zh)
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CN106601579B (en
Inventor
张虎威
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Beijing NMC Co Ltd
Beijing North Microelectronics Co Ltd
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Beijing North Microelectronics Co Ltd
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Priority to CN201510679475.2A priority Critical patent/CN106601579B/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32532Electrodes
    • H01J37/32568Relative arrangement or disposition of electrodes; moving means

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Plasma Technology (AREA)

Abstract

The invention provides an upper electrode mechanism and a semiconductor processing device. The upper electrode mechanism includes a coil and an adapter arranged at the top of a reaction cavity and a coil shielding assembly, wherein the coil is electrically connected with the adapter via a coil connector. The coil shielding assembly is used to isolate the horizontal interference electric field generated at the connection part of the adapter and the coil connector from the vertical electric field generated by the coil. The upper electrode mechanism can prevent the interference of the horizontal interference electric field generated at the connection part of the adapter and the coil connector to the vertical electric field generated by the coil, so that the distribution uniformity of the plasma can be ensured.

Description

Top electrode mechanism and semiconductor processing equipment
Technical field
The present invention relates to microelectronics technology, in particular it relates to a kind of Top electrode mechanism and Semiconductor processing equipment.
Background technology
In MEMS etching apparatus, radio-frequency coil is generally provided with the top of reaction chamber, The radio-frequency coil is connected by adapter with radio-frequency power supply, to the technique of provocative reaction within the chamber Gas forms plasma.
Fig. 1 is a kind of sectional view of existing etching apparatus.As shown in figure 1, etching apparatus Including reaction chamber 11, coil 12, adapter 13 and radio-frequency power supply (not shown). Wherein, bottom electrode 16 is provided with reaction chamber 11, for bearing wafer;Coil 12 Using helicoidal structure, it is fixed on the top of reaction chamber 11 using coil brace 15, and And the input and outfan of coil 12 is electrically connected by coil connection strap 14 with adapter 13, Adapter 13 is electrically connected with radio-frequency power supply.After radio-frequency power supply is powered, radio-frequency power supply passes through Adapter 13 to coil 12 loads alternating voltage, and the alternating magnetic field produced by coil 12 is excited Process gas in reaction chamber 11 produces plasma and performs etching.
Above-mentioned etching apparatus is inevitably present in actual applications problems with:
By theory analysis and the proof of many experiments, adapter 13 and coil connection strap 14 Junction can produce horizontal disturbance electric field parallel to the place plane of coil 12, the horizon bar Disturbing electric field can directly affect the vertical electric field produced by coil 12, destroy the distribution of plasma Uniformity, so as to cause etching homogeneity to reduce, affects process results, interference region such as Fig. 1 In the I regions that illustrate.
The content of the invention
It is contemplated that at least solving one of technical problem present in prior art, it is proposed that A kind of Top electrode mechanism and semiconductor processing equipment, it can avoid being connected with coil in adapter The horizontal disturbance electric field that the junction of part produces is disturbed the vertical electric field produced by coil, Thereby may be ensured that the distributing homogeneity of plasma.
A kind of Top electrode mechanism is provided to realize the purpose of the present invention, including being arranged on reaction The coil and adapter of chamber roof, the coil is by coil connector and adapter electricity Connection, also including coil shield assembly, for will be in the adapter and the coil connector Junction produce horizontal disturbance electric field isolate with the vertical electric field produced by the coil.
Preferably, the coil shield assembly includes closed shielding box, and the shielding box is adopted Make of metal material;The outfan of the adapter extends to the inside of the shielding box;Institute The one end for stating coil connector is connected with the coil, the other end of the coil connector and institute State the outfan connection of adapter.
Preferably, the shielding box be by least four side plates, top board and base plate constitute it is many Face body, is provided with each side plate and each side plate interface respectively with top board and base plate First Line ring recess, and the first shielded coil is provided with the First Line ring recess, to realize Each side plate and each side plate electromagnetic shielding respectively between top board and base plate.
Preferably, the shielding box is the cylinder being made up of annular slab, top board and base plate, The annular slab is provided with First Line ring recess with the interface of the top board and base plate respectively, and The first shielded coil is provided with the First Line ring recess, to realize the annular slab difference With the electromagnetic shielding between the top board and base plate.
Preferably, first through hole, the outfan of the adapter are provided with the top board The inside of the shielding box is stretched into by the first through hole;Also, on the top board, and It is looped around around the first through hole and is provided with the second coil groove, and in second coil Secondary shielding coil is provided with groove, to realize the electricity between the adapter and the top board Magnetic shield.
Preferably, the coil connector includes coil adaptor, insulating fixing piece and matching Device connector, wherein, one end of the coil adaptor is connected with the coil, the coil The other end of adaptor passes through the base plate, and is matched with described by the adapter connector The outfan connection of device;The insulating fixing piece is described for the coil adaptor to be fixed on On base plate, and the coil adaptor and the base plate are electrically insulated.
Preferably, the metal material includes aluminium sheet, and the surface of the aluminium sheet through conductive Oxidation is formed with oxide layer.
Preferably, the Top electrode mechanism also include being arranged on reaction chamber top and Closed coil box, and gripper shoe is provided with the coil box, the gripper shoe is by institute The inside division for stating coil box forms upper space and lower space;The coil shield assembly sets Put in the gripper shoe, and in the upper space;The adapter is arranged on described The top of coil shield assembly, and in the upper space;The coil is arranged on described In lower space.
Preferably, the Top electrode mechanism also includes coil brace, for the coil to be consolidated It is scheduled on the top of the reaction chamber;The coil brace includes horizontally disposed fixed plate and use In the annular support member for supporting the fixed plate, the fixed plate, annular support member and described anti- Closing space is formed on the top for answering chamber, and the coil is located in the closing space, and fixed On the lower surface of the fixed plate.
Used as another technical scheme, the present invention also provides a kind of semiconductor processing equipment, wraps Reaction chamber, Top electrode mechanism and bottom electrode mechanism are included, the Top electrode mechanism is arranged on described The top of reaction chamber;The bottom electrode mechanism is arranged on the inside of the reaction chamber, described The above-mentioned Top electrode mechanism that Top electrode mechanism is provided using the present invention.
The invention has the advantages that:
The Top electrode mechanism that the present invention is provided, it passes through to arrange coil shield assembly, can be by Produce in the horizontal disturbance electric field of the junction generation of adapter and coil connector and by coil Vertical electric field isolation, such that it is able to avoid the horizontal disturbance electric field vertical to what is produced by coil Electric field is disturbed, and then can ensure that the distributing homogeneity of plasma.
The semiconductor processing equipment that the present invention is provided, it passes through using the above-mentioned of present invention offer Top electrode mechanism, can avoid vertical electric field of the horizontal disturbance electric field to being produced by coil from carrying out Interference, thereby may be ensured that the distributing homogeneity of plasma.
Description of the drawings
Fig. 1 is a kind of sectional view of existing etching apparatus;
Fig. 2 is the installation diagram of Top electrode mechanism provided in an embodiment of the present invention;
Fig. 3 A are the sectional view of Top electrode mechanism provided in an embodiment of the present invention;
Fig. 3 B are the enlarged drawing in II regions in Fig. 3 A;And
Fig. 3 C are the enlarged drawing in III regions in Fig. 3 A.
Specific embodiment
To make those skilled in the art more fully understand technical scheme, tie below The Top electrode mechanism and semiconductor processing equipment for closing accompanying drawing to provide the present invention is retouched in detail State.
Fig. 2 is the installation diagram of Top electrode mechanism provided in an embodiment of the present invention.Refer to Fig. 2, Bottom electrode 33 is provided with reaction chamber 32, and is provided with the top of reaction chamber 32 Flat medium window 30 (is made) using the insulant of ceramics or quartz etc., and on Electrode mechanism is arranged on the top of medium window 30, for presenting radio-frequency power through medium window 30 Enter the inside of reaction chamber 32.
In the present embodiment, Top electrode mechanism includes the shielding of coil 29, adapter 21 and coil Component.Wherein, coil 29 is fixed on the top of medium window 30, the line by coil brace 28 Coil support 28 includes horizontally disposed fixed plate and the annular support member for supporting the fixed plate 31, fixed plate, annular support member 31 and medium window 30 form closing space, coil 29 In the closing space, and it is fixed on the lower surface of fixed plate.Certainly, in actual applications, Other any-mode fixed coils can also be adopted, and the structure of coil is different, fixed coil Mode is also different.
And, coil 29 is electrically connected by coil connector with adapter 21, the adapter 21 electrically connect with radio-frequency power supply (not shown), and radio-frequency power supply is used to pass through the adapter 21 to coil 29 loads radio-frequency (RF) energy, so that coil 29 can be in provocative reaction chamber 32 Reacting gas forms plasma.Coil shield assembly is used to connect in adapter 21 and coil The horizontal disturbance electric field that the junction of fitting produces and the vertical electric field produced by coil 29 every From such that it is able to avoid the horizontal disturbance electric field from doing the vertical electric field produced by coil Disturb, and then can ensure that the distributing homogeneity of plasma.
Fig. 3 A are the sectional view of Top electrode mechanism provided in an embodiment of the present invention.Fig. 3 B are figure The enlarged drawing in II regions in 3A.Fig. 3 C are the enlarged drawing in III regions in Fig. 3 A.Please in the lump Refering to Fig. 3 A-3C, in the present embodiment, coil shield assembly includes closed shielding box 23, The shielding box 23 is made using metal material, to realize the effect of radio shielding.Preferably, Above-mentioned metal material includes aluminium sheet, the surface of the aluminium sheet through electric conductive oxidation, and in surface of aluminum plate The oxide layer that can fully completely cut off with its space outerpace is formed with, so that shielding box 23 is effectively sealed, Such that it is able to avoid radio frequency from revealing, etching result is affected.
The shielding box 23 is six be made up of four side plates 232, top board 231 and base plate 233 Face body, each side plate 232 and each side plate 232 respectively with top board 231 and base plate 233 Interface on be provided with First Line ring recess, and be provided with the first shielding in the First Line ring recess Coil 34, to realize each side plate 232 and each side plate 232 respectively with top board 231 And the electromagnetic shielding between base plate 233, as shown in Figure 3 B.
Top electrode mechanism also includes being arranged on the top of reaction chamber 23 and closed coil box 26, and be provided with gripper shoe 27 in the coil box 26, the gripper shoe 27 is by coil box 26 inside division forms upper space and lower space.In upper space, above-mentioned shielding Box 23 is arranged in gripper shoe 27;Adapter 21 is arranged on the top of shielding box 23.Coil 26 are arranged in lower space.
In the present embodiment, as shown in Figure 3 C, first through hole is provided with top board 231, The outfan 211 of adapter 21 stretches into the inside of shielding box 23 by the first through hole;Also, On top board 231, and it is looped around around first through hole and is provided with the second coil groove, and Secondary shielding coil 35 is provided with the second coil groove, to realize adapter 21 and top board Electromagnetic shielding between 231.
And, the outfan of adapter 21 extends to the inside of shielding box 23.Coil connects One end of part is connected with coil 29, the other end of coil connector and the outfan of adapter 21 Connection, because the outfan of adapter 21 is located at the inside of shielding box 23, thus coil connects The other end of part is located at the inside of shielding box 23 with the junction of the outfan of adapter 21, from And the horizontal disturbance electricity that can realize producing in the junction of adapter 21 and coil connector Field isolates with the vertical electric field produced by coil 29.
In the present embodiment, above-mentioned coil connector includes that coil adaptor 25, insulation are fixed Part 24 and adapter connector 22.Wherein, as shown in Figure 3A, coil adaptor 25 is by One adaptor 251 and the second adaptor 252 are constituted, the lower end of the second adaptor 252 and coil 29 connections, the upper end of the second adaptor 252 is connected with the lower end of the first adaptor 251, the The upper end of one adaptor 251 pass through base plate 233, and by adapter connector 22 with match The outfan 211 of device 21 connects;Insulating fixing piece 24 is used to fix the second adaptor 252 On base plate 233, and the second adaptor 252 and base plate 233 are electrically insulated, so as to realize two The radio frequency isolation of person.In actual applications, insulating fixing piece 24 can adopt arbitrary structures, As long as the radio frequency isolation of the second adaptor 252 and base plate 233 can be realized.
It should be noted that in the present embodiment, coil adaptor 25 is by the first adaptor 251 Constitute with the second adaptor 252, but the invention is not limited in this, in actual applications, Coil adaptor 25 can also adopt other arbitrary structures, if base plate can be passed through, and will Coil links together with the outfan of adapter.In addition, in actual applications, matching The outfan 211 of device 21 is two, and coil 29 is generally by completely identical in structure two points Body docking is formed, and each split has two connection ends, and two splits have altogether four connection ends, In this case it is necessary to four coil adaptors 25 and two adapter connectors 22 are set, Wherein, one end of four coil adaptors 25 is connected correspondingly with four connection ends;Two Individual adapter connector 22 is connected respectively with two outfans 211 of adapter 21.Also, In four coil adaptors 25, the other end of two of which coil adaptor 25 is by matching Device connector 22 is connected with one of outfan 211 of adapter 21 simultaneously, other two The other end of coil adaptor 25 by adapter connector 22 simultaneously with adapter 21 its In another outfan 211 connect.In addition, in actual applications, adapter connector 22 Arbitrary structures can be adopted, as long as can realize coil adaptor 25 is defeated with adapter 21 Go out the electrical connection at end.
Also, it should be noted that in the present embodiment, shielding box 23 be by four side plates 232, The hexahedron of top board 231 and the composition of base plate 233, but this is the invention is not limited in, in reality In the application of border, shielding box can also be pentahedron or heptahedron etc., i.e. shielding box can be with It is the side plate and the polyhedron that constitutes of top board and base plate by five or more than six.
Explanation is needed further exist for, in actual applications, shielding box can also be cylinder, The cylinder can be made up of annular slab, top board and base plate.With the shielding box of above-mentioned polyhedral structure It is similar, in order to realize the electromagnetic shielding between each plate, annular slab respectively with top board and First Line ring recess is provided with the interface of base plate, and the first screen is provided with First Line ring recess Coil is covered, to realize electromagnetic shielding of the annular slab respectively between top board and base plate.Certainly, In actual applications, shielding box can also adopt other arbitrary structures, as long as it can realize penetrating The effect of frequency shielding.
In sum, Top electrode mechanism provided in an embodiment of the present invention, it passes through to arrange coil Shield assembly, can be by the horizontal disturbance electricity produced in the junction of adapter and coil connector Isolate with the vertical electric field produced by coil, such that it is able to avoid the horizontal disturbance electric field to by The vertical electric field that coil is produced is disturbed, and then can ensure that being evenly distributed for plasma Property.
Used as another technical scheme, the embodiment of the present invention also provides a kind of semiconductor machining and sets It is standby, including reaction chamber, bottom electrode mechanism and Top electrode mechanism.Wherein, Top electrode mechanism sets Put at the top of reaction chamber, the Top electrode mechanism employs the above embodiment of the present invention offer Top electrode mechanism;Bottom electrode mechanism is arranged on the inside of reaction chamber.
Semiconductor processing equipment provided in an embodiment of the present invention, it passes through using present invention enforcement The above-mentioned Top electrode mechanism that example is provided, can avoid the horizontal disturbance electric field to being produced by coil Vertical electric field is disturbed, and thereby may be ensured that the distributing homogeneity of plasma.
It is understood that the principle that is intended to be merely illustrative of the present of embodiment of above and Using illustrative embodiments, but the invention is not limited in this.For in the art For those of ordinary skill, without departing from the spirit and substance in the present invention, can do Go out various modifications and improvement, these modifications and improvement are also considered as protection scope of the present invention.

Claims (10)

1. a kind of Top electrode mechanism, including the coil and adapter that are arranged at the top of reaction chamber, The coil is electrically connected by coil connector with the adapter, it is characterised in that also included Coil shield assembly, for will produce with the junction of the coil connector in the adapter Horizontal disturbance electric field isolate with the vertical electric field produced by the coil.
2. Top electrode mechanism according to claim 1, it is characterised in that the coil Shield assembly includes closed shielding box, and the shielding box is made using metal material;
The outfan of the adapter extends to the inside of the shielding box;
One end of the coil connector is connected with the coil, the coil connector it is another One end is connected with the outfan of the adapter.
3. Top electrode mechanism according to claim 2, it is characterised in that the shielding Box is the polyhedron being made up of at least four side plates, top board and base plate, in each side plate and respectively Individual side plate is provided with First Line ring recess with the interface of top board and base plate respectively, and described The first shielded coil is provided with one coil groove, to realize each side plate and each side plate point Electromagnetic shielding not between top board and base plate.
4. Top electrode mechanism according to claim 2, it is characterised in that the shielding Box is the cylinder being made up of annular slab, top board and base plate, the annular slab respectively with the top First Line ring recess is provided with the interface of plate and base plate, and is arranged in the First Line ring recess There is the first shielded coil, to realize the annular slab respectively between the top board and base plate Electromagnetic shielding.
5. the Top electrode mechanism according to claim 3 or 4, it is characterised in that in institute State and be provided with top board first through hole, the outfan of the adapter is stretched by the first through hole Enter the inside of the shielding box;Also, on the top board, and it is looped around the first through hole Around be provided with the second coil groove, and be provided with secondary shielding in the second coil groove Coil, to realize the electromagnetic shielding between the adapter and the top board.
6. the Top electrode mechanism according to claim 3 or 4, it is characterised in that described Coil connector includes coil adaptor, insulating fixing piece and adapter connector, wherein,
One end of the coil adaptor is connected with the coil, the coil adaptor it is another One end passes through the base plate, and the outfan for passing through the adapter connector and the adapter Connection;
The insulating fixing piece is used to for the coil adaptor to be fixed on the base plate, and The coil adaptor and the base plate are electrically insulated.
7. Top electrode mechanism according to claim 2, it is characterised in that the metal Material includes aluminium sheet, and the surface of the aluminium sheet is formed with oxide layer through electric conductive oxidation.
8. the Top electrode mechanism according to claim 1-7 any one, it is characterised in that The Top electrode mechanism also includes being arranged on the reaction chamber top and closed coil box, And it is provided with gripper shoe in the coil box, the gripper shoe is by the inside of the coil box Segmentation forms upper space and lower space;
The coil shield assembly is arranged in the gripper shoe, and positioned at the upper space It is interior;
The adapter is arranged on the top of the coil shield assembly, and positioned at the top In space;
The coil is arranged in the lower space.
9. the Top electrode mechanism according to claim 1-7 any one, it is characterised in that The Top electrode mechanism also includes coil brace, for the coil to be fixed on into the reaction chamber The top of room;
The coil brace includes horizontally disposed fixed plate and for supporting the fixed plate Envelope is formed on annular support member, the top of the fixed plate, annular support member and the reaction chamber Space is closed, the coil is located in the closing space, and is fixed on the following table of the fixed plate On face.
10. a kind of semiconductor processing equipment, including reaction chamber, Top electrode mechanism and bottom electrode Mechanism, the Top electrode mechanism is arranged on the top of the reaction chamber;The bottom electrode mechanism It is arranged on the inside of the reaction chamber, it is characterised in that the Top electrode mechanism adopts right Require the Top electrode mechanism described in 1-9 any one.
CN201510679475.2A 2015-10-19 2015-10-19 Top electrode mechanism and semiconductor processing equipment Active CN106601579B (en)

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CN106601579B CN106601579B (en) 2019-02-19

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109494170A (en) * 2017-09-12 2019-03-19 北京北方华创微电子装备有限公司 Top electrode mechanism and semiconductor processing equipment
CN114121581A (en) * 2020-08-27 2022-03-01 中微半导体设备(上海)股份有限公司 Plasma processing apparatus
CN114171360A (en) * 2021-12-07 2022-03-11 北京北方华创微电子装备有限公司 Upper electrode device and process chamber

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CN104342632A (en) * 2013-08-07 2015-02-11 北京北方微电子基地设备工艺研究中心有限责任公司 Pre-cleaning cavity and plasma machining device
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JPH11330058A (en) * 1998-05-19 1999-11-30 Tokyo Electron Ltd Plasma processor
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TW200302683A (en) * 2002-01-30 2003-08-01 Alps Electric Co Ltd Plasma processing apparatus and method
CN101231943A (en) * 2002-11-26 2008-07-30 东京毅力科创株式会社 Plasma processing apparatus and method
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Publication number Priority date Publication date Assignee Title
CN109494170A (en) * 2017-09-12 2019-03-19 北京北方华创微电子装备有限公司 Top electrode mechanism and semiconductor processing equipment
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CN114171360A (en) * 2021-12-07 2022-03-11 北京北方华创微电子装备有限公司 Upper electrode device and process chamber
CN114171360B (en) * 2021-12-07 2023-11-14 北京北方华创微电子装备有限公司 Upper electrode device and process chamber

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