CN106597270B - The structure of optic probe in a kind of verification arc light protecting device - Google Patents
The structure of optic probe in a kind of verification arc light protecting device Download PDFInfo
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- CN106597270B CN106597270B CN201611121623.XA CN201611121623A CN106597270B CN 106597270 B CN106597270 B CN 106597270B CN 201611121623 A CN201611121623 A CN 201611121623A CN 106597270 B CN106597270 B CN 106597270B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
- G01R31/3277—Testing of circuit interrupters, switches or circuit-breakers of low voltage devices, e.g. domestic or industrial devices, such as motor protections, relays, rotation switches
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
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Abstract
The structure of optic probe in a kind of verification arc light protecting device, 2 light source emitters are equipped at the center of optic probe, have been uniformly and symmetrically distributed several receivers in light source emitter outer ring optic probe；In 2 light source emitters, the visible light source of one light source emitter A (101) transmitting optic probe sensitive wave length section, its wavelength is the visible light of 520nm-640nm, and another light source emitter B (102) launch wavelength is the light of 200nm-2000nm；2 light source emitter difference semicirculars in shape are to spelling against as circle；Receiver is symmetrical centered on light source, several described quantity take even number.The beneficial effects of the present invention are: considering in checking procedure, according to light source with the actual conditions different apart from differential declines, constructs mathematical model and compensate；It according to live different manufacturers sensor situation, can conveniently and efficiently carry out the optic probe verification of common different wave length.It is higher to verify accuracy.Entire verifying work practical value is high, there is preferable market value and prospect.
Description
Technical field
This patent is related to the detection field more particularly to a kind of arc short-circuit verification light of arc light protecting device optic probe
The device and method for learning probe.
Background technique
With the fast development of power grid, the safeguard measure of 110kV and the existing comparative maturity of above, 6kV
It is full factory's subsidiary engine/power supply system for armature that (10kV), which arrives station-service IVdistribution switch cabinet in this voltage class ranges of 35kV,
Whether knob can cut off rapidly failure when internal fault occurs, to the safe operation of full factory (substation) distribution system to Guan Chong
Want, but press current protection scheme: in the power system, the bus of 35kV and following voltage class is not due to having stabilization to ask
Topic, does not install bus protection generally.However, since the outlet on middle voltage bus bar is more, frequent operation, three-phase conductor wire spacing
With it is closer at a distance from the earth, be easy endangered by toy, device fabrication quality is poorer than high-tension apparatus, apparatus insulated aging and machine
Tool abrasion, service condition is severe, and system operation conditions change, and reasons, the failure of middle voltage bus bar such as artificial and operating mistake are several
Rate is more much higher than high pressure, super-pressure bus.But for a long time, people pay little attention to always the protection of middle voltage bus bar, mostly
Failure on bus is cut off using the back-up protection with larger delay, failure is often made to be developed, expand.
In view of the critical role of middle pressure bus, the delay excision of any failure, is all that we are extremely unwilling that sees shows
Shape, because high temperature, high pressure, arc light, vibration, plosive that the arclight in switchgear generates when occurring are set to correlations such as switchgears
It is standby to cause serious damage, or even feed through to transformer, burning for transformer is caused, seriously jeopardizes the safety of the person, to make
At huge economic loss.Such as power supply bureau, Anhui electric power company 220kV substation 35kV switchgear maloperation electric arc in 2009
Light accident causes a people dead；Chongqing Station Service Electrical-Energy incoming line cabinet current transformer insulated electro arc fault causes to stop within 2009
Machine and house transformer depot repair；Yunnan Power Grid Company " 2.24 " accident in 2011, Nujiang substation, power supply bureau is because of electric arc
Light accident causes a people dead.
Since many years operation shows that arc protection greatly damages the person and equipment belt inside mesolow power distribution cabinet, respectively
State electric power expert starts that arclight failure is studied and recognized.International Electrotechnical Commission IEC has revised its IEC60298-
2003 standards Medium Voltage Switchgear internal arc light failure Producing reason, solution and test method, Canadian electric power and
Electronic manufacture Business Association (EEMAC) has formulated the test rule of metallic armoured switch cabinet resistance under conditions of internal arc fault
Then, the U.S. has published the test directive/guide that arc fault inside metallic armoured switch cabinet is pressed in IEEE C37.20.7.Furthermore the U.S. exists
Electric power employment security production aspect dodges accident for electric arc arc of lighting and establishes relevant criterion and requirement, American National fire prevention association
(NFPA), it as a supplement of American National electric power specification (NBC), has formulated NFPA 70E-2004 occupation electric power safety and has wanted
Seek standard.According to the existing standard GB 3906-2006 in IEC60298-2003 standard formulation China, " 3.6kV~40.5kV is handed over for the country
Flow metal enclosed switchgear and control equipment ", internal arc grade switchgear and control equipment (IAC) are defined, inside
Fault electric arc test determination is the type approval test that must be done.
In recent years due to the continuous understanding to Internal faults arc characteristic parameter, Medium Voltage Switchgear correlation new standard is to preventing arc
The continuous improvement of light failure requirements, domestic some experts emphasize to install the importance of dedicated middle voltage bus bar protection, user always
Also wish can to provide that a kind of cost is relatively low, and principle is simple, suitable for the bus protection of 6-35kV, to minimize bus
Damage of the failure to equipment, provides power supply reliability, and the dedicated bus arc light protecting system as prestissimo comes into being, it
It can not only be advantageously applied to also can easily be attached in the switchgear run in new clothes switchgear, target is exactly
Arc fault is cut off in one time minimizes personal injury and equipment damage, has price compared with other dedicated bus protections
Advantage.
Apply the wider detection probe for electric current and optic probe as arc light protecting device, but the spy on the market at present
Head arc light is difficult to verify, and then determines its optical accuracy.Application number: 201610506888.5, patent name are as follows: arc protection
Device to test instrument verifies optic probe detection signal using look-up table, and this method does not account for the decaying feelings of light source
Condition, thus the case where there are precision not high, check results and actual conditions have greater difference in practical checking procedure, therefore this
Patent is also to carry out in this context.
Summary of the invention
The present invention mainly overcomes application number: 201610506888.5, patent name are as follows: and arc light protecting device tester, it is real
Border checking procedure has that not high precision, check results and actual conditions have greater difference, while considering the decaying of light source
Situation designs a kind of new structure and mathematical algorithm,
Summary of the invention of the present invention is as follows:
The structure of optic probe in a kind of verification arc light protecting device, present invention is characterized in that at the center of optic probe
Place is equipped with 2 light source emitters, has been uniformly and symmetrically distributed several receptions being located at 2 light source emitter outer ring optic probes
Device；In 2 light source emitters, the visible light source of one of light source emitter A transmitting optic probe sensitive wave length section, wavelength
For the visible light of 520nm-640nm, another light source emitter B launch wavelength is the light of 200nm-2000nm；2 light source transmittings
Device distinguishes semicircular in shape to spelling against as circle；Receiver is symmetrical centered on light source, several described quantity take idol
It is several.
Receiver of the present invention is preferably 4 or 6 or 8.
The application method of optic probe structure in a kind of verification arc light protecting device, present invention is characterized in that step 1: light
Source transmitter A is calibrated in Third Party Authentication mechanism, and main calibration information is accuracy situation；
Step 2: according to mathematic graph analysis method, the optical attenuation distance of light source emitter A and light source emitter B are determined；
Step 3: light source emitter A provides calibration algorithm to light source emitter B, and light source is sent out under the conditions of obtaining different distance
The calibration factor of emitter B；
Step 4: output light intensity calculating is carried out to light source emitter B, obtains optics using the data of light source emitter B
The precision of probe.
Mathematic graph analysis method of the present invention refers to, ad distance, can by according to trapezoidal calculation formula, according to ab away from
With a distance from, bc, cd distance ad distance, specific ad=sqrt ((cd-ab) * (cd-ab)+bc*bc) is calculated.
Calibration algorithm of the present invention are as follows: indicate certain wavelength light source attenuation degree with φ, it is strong to be defined as light source emitter output
The ratio between degree and input intensity, φ=IOut/IEnter, IOutIndicate that light source emitter issues the size of light intensity, IEnterIndicate optic probe detection
To the size of light intensity, with light source issue light to arc light protecting device optic probe reception light distance under different conditions, light
Attenuation degree differs larger, embodiments are as follows: when distance is when being more than or equal to 10cm, and being less than 2m, letter is presented with distance in φ
Number relationship, between preferably 2 functions and 3 functions；When distance is when being more than or equal to 2m, and being less than 4m, φ is in distance
Existing linear relationship, slope are preferably greater than or equal to 2；When distance is when being more than or equal to 4m, power exponent relationship is presented with distance in φ.
In calibration algorithm of the present invention, optic probe detects light intensity, refers to that receiver receives arc light protecting device optics
Probe is reflected into the light of receiver.
Calibration algorithm of the present invention assumes that light source emitter A, light source emitter B optical attenuation are in the same size.
What the present invention was implemented has the beneficial effect that；
1, consider in checking procedure, according to light source with the actual conditions different apart from differential declines, construct mathematical model
It compensates；
2, the optic probe school of common different wave length can conveniently and efficiently be carried out according to live different manufacturers sensor situation
It tests.
3, verification accuracy is higher.
4, entire verifying work practical value is high, there is preferable market value and prospect.
Detailed description of the invention
Fig. 1 is a kind of structure for verifying optic probe in arc light protecting device；
Fig. 2 is the mathematic graph of distance calculating during optical monitoring device.
Specific embodiment
As shown in Figure 1, a kind of structure for verifying optic probe in arc light protecting device, present invention is characterized in that in optics
2 light source emitters are equipped at the center of probe, if being uniformly and symmetrically distributed being located at 2 light source emitter outer ring optic probes
Dry receiver；In 2 light source emitters, one of light source emitter A101 emits the visible of optic probe sensitive wave length section
Light source, wavelength are the visible light of 520nm-640nm, another light source emitter B102 launch wavelength is 200nm-2000nm's
Light；2 light source emitter difference semicirculars in shape are to spelling against as circle；Receiver is symmetrical centered on light source, described
Several quantity take even number.Distribution can symmetrically receive light source information in this way, but be distributed it is excessive again there are factors such as manufacturing costs,
It is generally preferred to 4 or 6 or 8.
The present invention provides a kind of method for verifying optic probe in arc light protecting device, starting point are as follows: according to light in space
The concrete condition of decaying provides a kind of spare light beside light source generator, by monitoring spare light input, output situation, obtains
Light source generator is defeated under Different Altitude Regions, different temperature and humidity items, different distance, the inferior factor interference of different illumination conditions out
Enter and export situation, and then obtains the accuracy situation of arc light protecting device optic probe.
A kind of method of optic probe in verification arc light protecting device, it is characterised in that: step 1: light source emitter 101
In Third Party Authentication, mechanism is calibrated, and main calibration information is accuracy situation；Step 2: according to mathematic graph analysis side
Method determines the optical attenuation distance of light source emitter 101 and light source emitter 102；Step 3: light source emitter 101 sends out light source
Emitter 102 provides calibration algorithm, obtains the calibration factor of light source emitter 102 under the conditions of different distance.Step 4: light source is sent out
Emitter 102 carries out output light intensity calculating, and the precision of optic probe is obtained using the data of light source emitter 102.Mathematic graph
Analysis method refers to, ad distance in Fig. 2 is directly measured according to distance-measuring equipment, can also be by according to trapezoidal calculation formula, according to ab
Ad distance is calculated in distance, bc distance, cd distance.Calibration algorithm are as follows: indicate certain wavelength light source attenuation degree with φ, define
For the ratio between 101 output intensity of light source emitter and input intensity, φ=IOut/IEnter, IOutIndicate that light source emitter issues the big of light intensity
It is small, IEnterIt indicates that optic probe detects the size of light intensity, receives light to arc light protecting device optic probe as light source issues light
Under different condition, optical attenuation degree differ larger, embodiments are as follows: when distance be more than or equal to 10cm, and be less than 2m
When, functional relation is presented with distance in φ, between preferably 2 functions and 3 functions；It is and small when distance is being more than or equal to 2m
When 4m, linear relationship is presented with distance in φ, and slope is preferably greater than or equal to 2；When distance be more than or equal to 4m when, φ with away from
From presentation power exponent relationship.In calibration algorithm, optic probe detects light intensity, refers to that receiver receives arc light protecting device
Optic probe is reflected into the light of receiver.Calibration algorithm assumes light source emitter 101,102 optical attenuation size base of light source emitter
This is consistent.
A specific implementation example of the invention,
As shown in Figure 1, light source emitter 101,102 is rounded symmetrical, light source emitter 101 and light source emitter
102 is adjacent, it is assumed that and optical attenuation size is almost the same, and light source emitter 101 emits the visible light source of optic probe sensitive wave length section,
It is preferred that are as follows: visible light of the wavelength in 520nm-640nm, light of 102 launch wavelength of light source emitter in 200nm-2000nm, reception
Device is symmetrical centered on light source, and Fig. 1 is 4, as shown in Fig. 2, the position c is light source emitter position, the position d is receiver
Position, the position o, a, b are the position of arc light protecting device arc probe, and o is the geometric center of arc probe, and b is arc light spy
The center of head surface, a are the edge on arc probe surface, when light source emitter goes out light emitting to arc probe, arc probe
Receiver d is reflected light into again, and judgment method is as follows:
Step 1: light source emitter 101 is calibrated in Third Party Authentication mechanism, and main calibration information is accuracy feelings
Condition provides the detection data of receiver under different distance, different light-intensity conditions；
Step 2: first by the methods of infrared range-measurement system or physical distance measurement, ab, bc distance are obtained.Cd distance can lead to
It crosses Fig. 1 structure to learn, is then calculated by the trapezoidal distance of mathematics, determine the light decay of light source emitter 101 and light source emitter 102
Subtract distance ad；
Step 3: light source emitter 101 emits light simultaneously to light source emitter 102, according to IOutIndicate light source emitter hair
The size of light intensity out, IEnterIt indicates that optic probe detects the size of light intensity, according to calibration algorithm, calculates light source emitter 101
Attenuation coefficient, light source emitter 101 provide calibration algorithm to light source emitter 102, and light source emits under the conditions of obtaining different distance
The calibration factor of device 102；Calibration algorithm is using power function, linear function, repeatedly the combination of function fitting such as square function；
Step 4: output light intensity calculating is carried out to light source emitter 102, is obtained using the data of light source emitter 102
The precision of optic probe.
In conclusion the present invention provides a kind of structures and methods for verifying optic probe in arc light protecting device, Ke Yishi
The verification of existing arc light protecting device optic probe constructs mathematics according to light source with the actual conditions different apart from differential declines
Model compensates, and the optics that according to live different manufacturers sensor situation, can conveniently and efficiently carry out common different wave length is visited
Head verification has the characteristics that accuracy is high, practical value is high, improves verification efficiency, reduce power off time to a certain extent.
The above for those of ordinary skill in the art can according to the technique and scheme of the present invention and technology
Other various corresponding changes and modifications are made in design, and all these change and modification all should belong to the appended right of the present invention
It is required that protection scope.
Claims (6)
1. the structure of optic probe in a kind of verification arc light protecting device, it is characterised in that: be equipped with 2 at the center of optic probe
A light source emitter has been uniformly and symmetrically distributed several receivers being located at 2 light source emitter outer ring optic probes；2 light
In the transmitter of source, one of light source emitter A (101) emits the visible light source of optic probe sensitive wave length section, and wavelength is
The visible light of 520nm-640nm, another light source emitter B (102) launch wavelength are the light of 200nm-2000nm；2 light sources
Transmitter distinguishes semicircular in shape to spelling against as circle；Receiver is symmetrical centered on light source, several described quantity
Take even number；The application method of the structure includes following 4 steps: step 1: light source emitter A (101) recognizes in third party
Card mechanism is calibrated, and main calibration information is accuracy situation；
Step 2: according to mathematic graph analysis method, the light decay of light source emitter A (101) and light source emitter B (102) are determined
Subtract distance；
Step 3: light source emitter A (101) provides calibration algorithm to light source emitter B (102), under the conditions of obtaining different distance
The calibration factor of light source emitter B (102)；
Step 4: output light intensity calculating is carried out to light source emitter B (102), is obtained using the data of light source emitter B (102)
The precision of optic probe out.
2. the structure of optic probe in a kind of verification arc light protecting device according to claim 1, which is characterized in that receive
Device is 4 or 6 or 8.
3. the structure of optic probe in a kind of verification arc light protecting device according to claim 1, it is characterised in that: mathematics
Graph analysis method refers to that ad distance can be calculated by according to trapezoidal calculation formula according to ab distance, bc distance, cd distance
Obtain ad distance, specific ad=sqrt ((cd-ab) * (cd-ab)+bc*bc), shown position concrete meaning is as follows: a point indicates arc
The edge on light probe surface, b point indicate the center on arc probe surface, and c point indicates light source emitter position, and d point indicates to receive
Device position, ab are arc probe marginal surface at a distance from arc probe centre of surface, and bc distance is arc probe surface
At a distance from light source emitter position, cd distance is light source emitter position at a distance from receiver position at center, utilizes public affairs
Ad distance is calculated in formula, and as arc probe marginal surface is at a distance from receiver position.
4. the structure of optic probe in a kind of verification arc light protecting device according to claim 1, it is characterised in that: calibration
Algorithm are as follows: indicate certain wavelength light source attenuation degree with φ, be defined as light source emitter A (101) output intensity and input intensity
The ratio between, φ=IOut/IEnter, IOutIndicate that light source emitter issues the size of light intensity, IEnterIndicate that optic probe detects the size of light intensity,
With light source issue light to arc light protecting device optic probe receive light distance under different conditions, optical attenuation degree differ compared with
Greatly, embodiments are as follows: when distance be more than or equal to 10cm, and be less than 2m when, φ with distance present functional relation, specially 2
Between secondary function and 3 functions；When distance is when being more than or equal to 2m, and being less than 4m, linear relationship, slope is presented with distance in φ
More than or equal to 2；When distance is when being more than or equal to 4m, power exponent relationship is presented with distance in φ.
5. the structure of optic probe in a kind of verification arc light protecting device according to claim 4, it is characterised in that: calibration
In algorithm, optic probe detects light intensity, refers to that receiver receives arc light protecting device optic probe and is reflected into receiver
Light.
6. the structure of optic probe in a kind of verification arc light protecting device according to claim 4, it is characterised in that: calibration
Algorithm assumes that light source emitter A (101), light source emitter B (102) optical attenuation are in the same size.
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Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6084756A (en) * | 1999-01-22 | 2000-07-04 | Eaton Corporation | Apparatus for testing protection of an electric power distribution circuit by an arc fault circuit breaker |
| CN204065289U (en) * | 2014-09-22 | 2014-12-31 | 山东中瑞电气有限公司 | For the checkout equipment of arc light protecting device |
| CN106019135A (en) * | 2016-07-01 | 2016-10-12 | 南京五石金传感技术有限公司 | Testing instrument for arc protection device |
-
2016
- 2016-12-08 CN CN201611121623.XA patent/CN106597270B/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6084756A (en) * | 1999-01-22 | 2000-07-04 | Eaton Corporation | Apparatus for testing protection of an electric power distribution circuit by an arc fault circuit breaker |
| CN204065289U (en) * | 2014-09-22 | 2014-12-31 | 山东中瑞电气有限公司 | For the checkout equipment of arc light protecting device |
| CN106019135A (en) * | 2016-07-01 | 2016-10-12 | 南京五石金传感技术有限公司 | Testing instrument for arc protection device |
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| CN106597270A (en) | 2017-04-26 |
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Effective date of registration: 20191119 Address after: 650217 Yunnan city of Kunming province by the West Development Zone No. 105 Yunnan Co-patentee after: Electric Power Research Institute of Yunnan Power System Ltd Patentee after: Yunnan Electric Power Test Research Institute (Group) Co., Ltd. Address before: 650217 Yunnan city of Kunming province by the West Development Zone No. 105 Yunnan Co-patentee before: Electric Power Research Institute of Yunnan Power System Ltd Patentee before: Yunnan Electric Power Test Research Institute (Group) Co., Ltd. Co-patentee before: Kunming Dafang Automatic Control Science and Technology Co., Ltd. |