CN106559149A - A kind of throughput testing approach and device of multiple terminals - Google Patents
A kind of throughput testing approach and device of multiple terminals Download PDFInfo
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Abstract
The present invention provides a kind of throughput testing approach and device of multiple terminals, is applied to the framework in Multi probe darkroom, and the throughput testing approach includes：Acquisition is arranged at the interference strength between multiple measured terminals in Multi probe darkroom；Multiple first measured terminals of one preset strength value are less than or equal to interference strength, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, and multiple test signals are handed down to into multiple first measured terminals parallel by the different probes in Multi probe darkroom by channel simulator；The handling capacity change information put posture, obtain the first measured terminal respectively of transmission power, the arrival bearing of multiple test signals and multiple first measured terminals of multiple test signals is adjusted respectively.The embodiment of the present invention using being issued by the way of test signal carries out testing throughput parallel, improves testing efficiency according to the interference strength between each measured terminal to not interfering with or disturbing weaker multiple terminals in the case where precision is guaranteed.
Description
Technical field
The present invention relates to wireless communication technology field, the throughput testing approach of more particularly to a kind of multiple terminals and
Device.
Background technology
The throughput performance of LTE terminal directly affects the Consumer's Experience of terminal.MIMO technology (multiple-input, multiple-output
Technology) it is one of core technology that LTE lifts handling capacity.MIMO technology needs to compare in spatial coherence
Could be suitable in the abundant wireless propagation environment of low and multipath component.The direct shadow of multiple antennas performance of LTE terminal
Space channel condition is rung, so as to affect MIMO technology be suitable for, terminal throughput performance is have impact on.MIMO
Over the air is just used for the multiple antennas receptivity of test terminal.
Multi probe darkroom method is the testing scheme of existing MIMO OTA (over the airs of multiple-input, multiple-output)
One of, as shown in figure 1, base station simulator is used to simulate LTE cells and sets up and communicate to connect with terminal；Letter
Road emulator is then used for simulating wireless propagation environment, and downstream signal is declined；Inside Multi probe darkroom
For signal is radiate according to certain mapping ruler, build around measured terminal needs antenna probes
Wireless propagation environment, so as to the handling capacity of test terminal.
Existing MIMO OTA testing time length, high cost, it is that may be present due to facing in test process
Multiple terminals interference, parallel test environment are built and the difficult problem such as control, and existing scheme can only carry out an end simultaneously
The testing throughput at end, inefficiency.And due to expensive, the low survey of MIMO OTA cost of testing system
Examination efficiency causes the significant wastage of test resource.
The content of the invention
It is an object of the invention to provide the throughput testing approach and device of a kind of multiple terminals, solve existing
In technology, MIMO OTA test systems can only carry out the testing throughput of a terminal simultaneously, and testing efficiency is low
Under cause the problem of the wasting of resources.
In order to achieve the above object, the present invention provides a kind of throughput testing approach of multiple terminals, is applied to many
The framework in probe darkroom, including：
Acquisition is arranged at the interference strength between multiple measured terminals in the Multi probe darkroom；
To interference strength less than or equal to multiple first measured terminals of a preset strength value, imitate to a channel
True device issues multiple test signals of different test frequency ranges parallel, believes multiple tests by the channel simulator
Number multiple first measured terminals are handed down to parallel by the different probes in the Multi probe darkroom；
Adjust respectively the transmission power of the plurality of test signal, the arrival bearing of the plurality of test signal with
And the quantitative change of handling up put posture, obtain multiple first measured terminals respectively of the plurality of first measured terminal
Change information.
Wherein, the throughput testing approach also includes：
Multiple second measured terminals of the preset strength value are more than to interference strength, to the channel simulator
Serial issues the test signal for the second measured terminal, leads to the test signal by the channel simulator
The probe serial crossed in the Multi probe darkroom is handed down to the second measured terminal；
It is sequentially adjusted in transmission power, the arrival bearing of the test signal and described of the test signal
The handling capacity change information put posture, obtain the second measured terminal successively of two measured terminals.
Wherein, the acquisition is arranged at the interference strength between multiple measured terminals in the Multi probe darkroom
Step includes：
Obtain each measured terminal work in respectively it is all test frequency range when out-of-band radiation spectrum information；
According to the out-of-band radiation spectrum information, it is determined that work in respectively each test frequency range measured terminal with
Interference strength between other measured terminals.
Wherein, obtain each measured terminal work in respectively it is all test frequency range when out-of-band radiation spectrum information
The step of include：
Communication link is set up with each measured terminal；
That what is launched when working in each test frequency range by the corresponding measured terminal of communication link reception is up
Signal；
According to the upward signal, out-of-band radiation when each measured terminal works in each test frequency range is obtained
Spectrum information.
Wherein, methods described also includes：
According to work in respectively each test frequency range measured terminal and other measured terminals between interference strength,
Determine it is multiple work in different test frequency ranges, and when the different test frequency ranges are worked simultaneously each other
Interference strength is the first measured terminal less than or equal to the measured terminal of the preset strength value.
Wherein, multiple test signals of different test frequency ranges are issued to a channel simulator parallel, by the letter
Multiple test signals are handed down to multiple the by the different probes in the Multi probe darkroom by road emulator parallel
The step of one measured terminal, includes：
By multiple base station simulators to the different multiple test signals for testing frequency range of channel simulator transmitted in parallel,
The test signal is exported into a Multi probe darkroom and is somebody's turn to do from default output port by the channel simulator
The corresponding multiple probes of default output port, by the plurality of test signals of multiple probe transmitted in parallel；
The plurality of test signal builds corresponding wireless channel environment around first measured terminal；
First measured terminal of the corresponding test frequency range of the plurality of base station simulator of control control is built respectively
Vertical communication link, is issued to multiple first measured terminals parallel by the communication link tested with described first
The corresponding test signal of channel model of terminal works.
Wherein, the transmission power for adjusting the plurality of test signal respectively, the plurality of test signal
Arrival bearing and the plurality of first measured terminal put posture, obtain multiple first measured terminals respectively
Handling capacity change information the step of include：
The arrival bearing of the transmission power and multiple test signals of the plurality of test signal is adjusted respectively, point
Handling capacity change information of corresponding first measured terminal in the case where posture is currently put is not obtained；
The posture of putting of the plurality of first measured terminal is adjusted, and adjusts the transmission power of the test signal
And the arrival bearing of test signal, obtain respectively corresponding first measured terminal after the adjustment put posture
Under handling capacity change information；
Determine the plurality of first measured terminal in all of handling capacity change information put under posture；
According to first measured terminal in all handling capacity change informations put under posture, described is determined
The average throughput change information of one measured terminal.
The embodiment of the present invention also provides a kind of testing throughput device of multiple terminals, is applied to Multi probe darkroom frame
Structure, including：
Interference acquisition module, is arranged between multiple measured terminals in the Multi probe darkroom for obtaining
Interference strength；
Concurrent testing module, for multiple first quilts of a preset strength value are less than or equal to interference strength
Terminal is surveyed, and multiple test signals of different test frequency ranges is issued parallel to a channel simulator, by the channel
Multiple test signals are handed down to multiple first by the different probes in the Multi probe darkroom by emulator parallel
Measured terminal；
First information acquisition module, for adjusting the transmission power of the plurality of test signal, described many respectively
The arrival bearing of individual test signal and the plurality of first measured terminal put posture, obtain multiple respectively
The handling capacity change information of the first measured terminal.
Wherein, the testing throughput device also includes：
Serial test module, for being more than multiple second measured terminals of the preset strength value to interference strength,
The test signal for the second measured terminal is issued to the channel simulator serial, by the channel simulator
The test signal is handed down to into the second measured terminal by the probe serial in the Multi probe darkroom；
Second data obtaining module, for being sequentially adjusted in transmission power, the test letter of the test signal
Number arrival bearing and second measured terminal put posture, obtain gulping down for the second measured terminal successively
The amount of telling change information
Wherein, the interference acquisition module includes：
Frequency spectrum acquisition module, for obtain each measured terminal work in respectively it is all test frequency range when band outside
Transmitted spectrum information；
Interference acquisition submodule, for according to the out-of-band radiation spectrum information, it is determined that working in each respectively
Interference strength between the measured terminal and other measured terminals of test frequency range.
Wherein, the frequency spectrum acquisition module includes：
Module is set up, for communication link being set up with each measured terminal；
Receiver module, works in each test frequency for receiving corresponding measured terminal by the communication link
The upward signal launched during section；
Frequency spectrum acquisition submodule, works in each for according to the upward signal, obtaining each measured terminal
Out-of-band radiation spectrum information during test frequency range.
Wherein, described device also includes：
Determining module, for according to the measured terminal and other measured terminals for working in each test frequency range respectively
Between interference strength, determine it is multiple work in different test frequency ranges, and in the different test frequency ranges simultaneously
Interference strength during work each other is the first quilt less than or equal to the measured terminal of the preset strength value
Survey terminal.
Wherein, the concurrent testing module includes：
First paralleled sub-modules, for being surveyed to channel simulator transmitted in parallel is different by multiple base station simulators
Multiple test signals of examination frequency range, it is the test signal is defeated from default output port by the channel simulator
Go out into a Multi probe darkroom multiple probes corresponding with the default output port, it is parallel by multiple probes
Launch the plurality of test signal；The plurality of test signal builds correspondence around first measured terminal
Wireless channel environment；
Second paralleled sub-modules, for the corresponding test frequency range of the plurality of base station simulator of control
The first measured terminal set up communication link respectively, by the communication link to multiple first measured terminals simultaneously
Row issues the test signal corresponding with the channel model of first measured terminal work.
Wherein, the first information acquisition module includes：
First adjusting module, for the transmission power for adjusting the plurality of test signal respectively and multiple tests
The arrival bearing of signal, obtains handle up quantitative change of corresponding first measured terminal in the case where posture is currently put respectively
Change information；
Second adjusting module, for adjusting the posture of putting of the plurality of first measured terminal, and adjusts described
The arrival bearing of the transmission power and test signal of test signal, obtains corresponding first measured terminal respectively
The handling capacity change information put under posture after the adjustment；
First information acquisition submodule, for determining that the plurality of first measured terminal puts posture all of
Under handling capacity change information；
Second acquisition of information submodule, for according to first measured terminal it is all put under posture gulp down
The amount of telling change information, determines the average throughput change information of first measured terminal.
The above-mentioned technical proposal of the present invention at least has the advantages that：
The throughput testing approach and device of the multiple terminals of the embodiment of the present invention, it is adaptable to the frame in Multi probe darkroom
Structure, the method for testing according to the interference strength between each measured terminal, to not interfering with or disturbing weaker
Multiple terminals, using being issued by the way of test signal carries out testing throughput parallel, are guaranteeing the situation of precision
Under improve testing efficiency；And for stronger terminal is disturbed, then switching to serial and issuing test signal is carried out
The mode of testing throughput, it is ensured that the accuracy of test, effectively raises the testing efficiency and drop of handling capacity
Low terminal test time and cost.
Description of the drawings
Fig. 1 represents the structure chart of Multi probe darkroom MIMO OTA test systems in prior art；
Fig. 2 represents the basic step flow chart of the throughput testing approach of multiple terminals provided in an embodiment of the present invention；
Fig. 3 represents the out-of-band radiation spectrum diagram of measured terminal in the embodiment of the present invention；
Fig. 4 represents Multi probe darkroom provided in an embodiment of the present invention multiple terminals MIMO OTA testing throughputs system
System；
Fig. 5 represents the acquisition flow chart of the out-of-band radiation spectrum information of measured terminal in the embodiment of the present invention；
Fig. 6 represents the determination flow chart of the first measured terminal and the second measured terminal in the embodiment of the present invention；
Fig. 7 represents the structural representation of channel simulator provided in an embodiment of the present invention；
Fig. 8 represents the concrete test flow chart of the throughput testing approach of multiple terminals provided in an embodiment of the present invention；
Fig. 9 represents the composition structure chart of the testing throughput device of multiple terminals provided in an embodiment of the present invention.
Specific embodiment
To make the technical problem to be solved in the present invention, technical scheme and advantage clearer, below in conjunction with attached
Figure and specific embodiment are described in detail.
The present invention can only carry out handling up for a terminal simultaneously for MIMO OTA test systems in prior art
Examination is measured, testing efficiency lowly causes the problem of the wasting of resources, there is provided a kind of testing throughput side of multiple terminals
Method and device, it is according to the interference strength between each measured terminal, weaker multiple to not interfering with or disturbing
Terminal, using being issued by the way of test signal carries out testing throughput parallel, carries in the case where precision is guaranteed
Testing efficiency is risen；And for stronger terminal is disturbed, then switch to serial and issue test signal and handled up
Measure the mode of examination, it is ensured that the accuracy of test, effectively raise the testing efficiency of handling capacity and reduce
Terminal test time and cost.
As shown in Fig. 2 a kind of throughput testing approach of multiple terminals provided in an embodiment of the present invention, is applied to
The framework in Multi probe darkroom, the throughput testing approach include：
Step 21, acquisition are arranged at the interference strength between multiple measured terminals in the Multi probe darkroom；Its
In, multiple measured terminals can be operated in different frequency ranges and can also work in identical frequency range.For example obtain
When measured terminal 1 works in frequency range 1, measured terminal 1 works in frequency range 1, frequency respectively with other measured terminals
Section 2 ..., frequency range n when between interference strength；When obtaining measured terminal 1 again and working in frequency range 2, quilt
Survey terminal 1 and other measured terminals work in respectively frequency range 1, frequency range 2 ..., frequency range n when between do
Intensity is disturbed, the like, so that it is determined that the interference strength between multiple measured terminals.
Step 22, is less than or equal to multiple first measured terminals of a preset strength value to interference strength, to
One channel simulator issues multiple test signals of different test frequency ranges parallel, will be many by the channel simulator
Individual test signal is handed down to multiple first measured terminals parallel by the different probes in the Multi probe darkroom；
As MIMO OTA are tested using throughput curve as judgment criteria, concern drops to 95% from maximum throughput
The descending power value of maximum throughput；Therefore downstream signal is stronger, i.e., relatively possible terminal out-of-band radiation is done
For disturbing, downstream signal is a big signal, and this is to carrying out multi-terminal parallel test there is provided possible.As long as terminal
Between out-of-band radiation interference strength be unlikely to too strong, just can evade the interference between multiple terminals completely.Wherein,
Interference strength can regard which as each other less than or equal to multiple first measured terminals of a preset strength value
Interference can be evaded, i.e., (multiple first quilts when all first measured terminals work in respective frequency range simultaneously
Survey terminal and must work in different test frequency ranges), other measured terminals will not be interfered.Such that it is able to
Concurrent testing signal is issued to multiple first measured terminals, so as to lift testing efficiency.
In order to realize the decoupling between each first measured terminal, arrange multiple base station simulators respectively with it is multiple
First measured terminal connects, then multiple base station simulators send multiple test signals of different test frequency ranges simultaneously,
And multiple first measured terminals are only capable of receiving the test signal that the base station simulator being attached thereto sends, so as to
Realize the concurrent testing of multiple first measured terminals.
Meanwhile, channel simulator includes a darkroom antenna mapping units, and the darkroom antenna mapping units complete base
Mapping of the downstream signal of simulator of standing transmitting to the darkroom probe in Multi probe darkroom.I.e. in multiple first quilts
In the case of surveying terminal concurrent testing, the downstream signal Jing after decline can be exported and feed-in darkroom probe simultaneously；
And in the case where unit/terminal is tested, the downstream signal after decline is only input into the descending letter of a base station simulator
Number and feed-in darkroom probe.
Step 23, adjusts the transmission power of the plurality of test signal, the plurality of test signal respectively and comes
Ripple direction and the plurality of first measured terminal put posture, obtain multiple first measured terminals respectively
Handling capacity change information.The embodiment of the present invention can obtain a handling capacity change curve changed with transmission power；
Specifically, measured terminal is primarily upon in present invention enforcement drop to 95% maximum throughput from maximum throughput
When, the transmission power level of descending test signal；If the transmission power level is less, show the tested end
The performance at end is better；Transmission power level is bigger, then show that the performance of the measured terminal is poorer.Specifically, by
In the application scenarios in Multi probe darkroom, for the change of the handling capacity of measured terminal is believed except needing to consider to test
Number transmission power, also need to consider that the arrival bearing of test signal and measured terminal put posture, so as to
Obtain the average throughput change information of measured terminal.
In the above embodiment of the present invention, the throughput testing approach root of multiple terminals provided in an embodiment of the present invention
According to the judgement to interference strength, evade the interference between multiple terminals, realize that multi-terminal parallel is tested, improve
Testing efficiency.
Further, the throughput testing approach that the above embodiment of the present invention is provided also includes：
Step 24, is more than multiple second measured terminals of the preset strength value to interference strength, to the letter
Road emulator serial issues the test signal for the second measured terminal, by the channel simulator by the survey
Trial signal is handed down to the second measured terminal by the probe serial in the Multi probe darkroom；Wherein, this second
Measured terminal is to disturb very strong in all of test frequency range, i.e., no matter second measured terminal works in which
Individual test frequency range, which can produce larger interference to other measured terminals, therefore, this part terminal cannot
Carry out concurrent testing；And for the accuracy for ensureing to test, for second measured terminal of part, using string
Row issues the mode of test signal and carries out the test of handling capacity, i.e., one terminal, one terminal carries out handling capacity
Test.
It is general using first multiple first measured terminals are carried out with concurrent testing in practical application, it is to be tested finish after
The serial test of multiple second measured terminals is carried out again；Serial can also be carried out to multiple second measured terminals first
Test, it is to be tested finish after carry out the concurrent testing of multiple first measured terminals again, here is not especially limited.
Continuous upper example is held, in order to the concurrent testing of multiple first measured terminals is provided with multiple base station simulators, then
When multiple second measured terminals are tested in serial, the second measured terminal can be attached with arbitrary base station simulator,
A certain base station simulator is not limited.
Step 25, be sequentially adjusted in the transmission power of the test signal, the arrival bearing of the test signal with
And the handling capacity change information put posture, obtain the second measured terminal successively of second measured terminal.
Consistent with test process of the prior art to the test of the second measured terminal in the embodiment of the present invention, here is not
It is described in detail.Specifically, the embodiment of the present invention is by being sequentially adjusted in the transmission power of multiple test signals,
Handling up for second measured terminal changed with transmission power corresponding with each the second measured terminal can be obtained
Amount change curve；Specifically, measured terminal is primarily upon in present invention enforcement drop to 95% from maximum throughput
During maximum throughput, the transmission power level of descending test signal；If the transmission power level is less, table
The performance of the bright measured terminal is better；Transmission power level is bigger, then show that the performance of the measured terminal is poorer.
Specifically, due to the application scenarios in Multi probe darkroom, for measured terminal handling capacity change except need
Consider the transmission power of test signal, also need to consider the arrival bearing of test signal and putting for measured terminal
Posture, so as to obtain the average throughput change information of measured terminal.
Specifically, in the above embodiment of the present invention, step 21 includes：
Step 211, obtains out-of-band radiation frequency spectrum when each measured terminal works in all test frequency ranges respectively and believes
Breath；Specifically, its out-of-band radiation spectrum information can be obtained by a frequency spectrograph, also can be by some software programmings
Realizing, here is not especially limited method.Wherein, the acquisition of frequency spectrograph for convenience, reduces frequency spectrograph
Setting quantity, a signal shunt is set in the concrete application of the present invention, its frequency spectrograph and signal shunt
Connection, intercepts the upward signal of terminal, from signal shunt so as to obtain out of band spectrum information.Specifically,
The output end of signal shunt is connected with multiple base station simulators respectively, realizes measured terminal and base station simulator
Communication.
Step 212, according to the out-of-band radiation spectrum information, it is determined that working in the quilt of each test frequency range respectively
The interference strength surveyed between terminal and other measured terminals.Wherein, when measured terminal works in a test frequency range,
The out-of-band radiation spectrum information of the measured terminal intuitively can accurately represent the measured terminal for other frequencies
Section is with the presence or absence of interference；For example, it is illustrated in figure 3 the out-of-band radiation spectrum diagram of measured terminal；Wherein,
The expression of curve 101 terminal 1 is operated in out-of-band radiation spectrum information during frequency range 1, and the spectrum information is represented eventually
When end 1 is operated in frequency range 1, the stronger interference of the presence to frequency range a；Curve 102 represents that terminal 2 works
Out-of-band radiation spectrum information in frequency range 2, it is when the spectrum information represents that terminal 2 is operated in frequency range 2, right
The stronger interference of the presence of frequency range b；The expression of curve 103 terminal n is operated in out-of-band radiation frequency during frequency range n
Spectrum information, when the spectrum information represents that terminal n is operated in frequency range n, stronger dry of presence to frequency range n+3
Disturb.
Specifically, in the above embodiment of the present invention, step 211 includes：
Step 2111, sets up communication link with each measured terminal；
Step 2112, when working in each test frequency range by the corresponding measured terminal of communication link reception
The upward signal of transmitting；
Step 2113, according to the upward signal, obtain each measured terminal work in each test frequency range when
Out-of-band radiation spectrum information.
Need to obtain the out-of-band radiation spectrum information of terminal in the above embodiment of the present invention, it is necessary first to will eventually
Communication connection is set up with a base station simulator in end so that can communicate between terminal and base station simulator；Further
Radiance of the part to terminal is isolated from the upward signal of measured terminal, and (i.e. out-of-band radiation interference is strong
Degree) it is estimated.
Specifically, the embodiment of the present invention is applied to the MIMO OTA test systems in Multi probe darkroom, and this
The structure of the Multi probe multiple terminals MIMO OTA testing throughput systems that bright embodiment is provided is as shown in Figure 4.
Based on said system structure, as shown in figure 5,
The obtaining step of out-of-band radiation spectrum information is as follows：
Step 51, measured terminal 1 are set up with arbitrary base station simulator and are connected, and up with maximum power transmission
Signal；
Step 52, captures band when measured terminal 1 works in all frequency ranges to be measured respectively successively using frequency spectrograph
External radiation frequency spectrum (frequency spectrum is illustrated as shown in Figure 3)；
Step 53, disconnects the connection of measured terminal 1 and base station simulator, repeats measured terminal 2-N successively
Execution step 51-52, so far capture complete the out-of-band radiation spectrum information of all measured terminals.
Further, the throughput testing approach of multiple terminals provided in an embodiment of the present invention also includes：
According to work in respectively each test frequency range measured terminal and other measured terminals between interference strength,
Determine it is multiple work in different test frequency ranges, and when the different test frequency ranges are worked simultaneously each other
Interference strength is the first measured terminal less than or equal to the measured terminal of the preset strength value.Wherein, lead to
Cross a series of mathematical algorithms and be allocated to testing frequency range, intensity is interfered as base between measured terminal
It is accurate to distribute the test frequency range that interference strength is weaker or does not interfere with for measured terminal；And for all of test frequency
The section very strong measured terminal of interference, can an optional frequency range tested.It should be noted that first is tested
The characteristics of terminal is：Different test frequency ranges are worked in, and multiple first measured terminals work in correspondence simultaneously
Test frequency range when, which disturbs weaker each other or does not interfere with.Wherein, for each test frequency range is done
For disturbing the stronger measured terminal of intensity, the second measured terminal is determined that it is, i.e., such measured terminal can only
Carry out serial test.
In short, its multiple first measured terminal works in different test frequency ranges, and multiple first quilts respectively
Survey when terminal works in the test frequency range of respective distribution simultaneously and other-end is not interfered.I.e. according to capture
Terminal out-of-band radiation spread spectrum scenarios, choose noiseless or disturb weaker frequency range combination to carry out concurrent testing,
Raising efficiency；And for full frequency band disturbs all very strong scene, carry out individually test to guarantee test to terminal
Accuracy.As shown in figure 3, when 101 display terminal 1 of curve works in test frequency range 1, frequency range a is not
Concurrent testing can be used for, i.e., the terminal of parallel with the terminal 1 for working in test frequency range 1 test can not to work
In frequency range a；Fig. 3 is only an illustration, and the embodiment of the present invention need to be according to terminal works in the frequency of each self-supporting
Spread spectrum scenarios during section, so many spectrum distributions (such as the frequency spectrum of N number of M frequency range of terminal *) are had,
By selecting measured terminal and test frequency range to cause noiseless each other or disturbing relatively low；Eventually pass the present invention
After analysis to out-of-band radiation frequency spectrum, the working frequency range of each the first measured terminal that terminal determines (is tested
Test frequency range during handling capacity) as shown in Figure 6.As can be seen from Figure 6, terminal 1, terminal 2, and eventually
When end 3 works in respective working frequency range simultaneously, do not interfere between its each terminal.
It should be noted that when the test system as shown in Figure 4 of present invention offer is provided, by central authorities
Controller come realize multi-terminal parallel test and unit/terminal serial test switching, effectively reduce terminal test
Time and cost.
The throughput testing approach of multiple terminals provided in an embodiment of the present invention is applied to Multi probe as shown in Figure 4
In the MIMO OTA testing throughput systems of multiple terminals, with reference to the test system of Fig. 4 to present invention enforcement
The process that test signal is issued parallel in test process in example and testing throughput is carried out is specifically described：
I.e. in the embodiment of the present invention, step 22 includes：
Step 221, by multiple base station simulators to the multiple of the different test frequency ranges of channel simulator transmitted in parallel
The test signal is exported to a Multi probe from default output port by test signal by the channel simulator
Multiple probes corresponding with the default output port in darkroom, it is the plurality of by multiple probe transmitted in parallel
Test signal；The plurality of test signal builds corresponding wireless channel ring around first measured terminal
Border；Under the Multi probe darkroom model, multiple wireless environments can be built in the Multi probe darkroom simultaneously, for example
Independent UMI channel circumstances are set up respectively for different terminals simultaneously or the same portion's terminal of tail sets up UMI channel rings
Border and be that another terminal sets up UMA channel circumstances.Which is mainly by channel simulator realization, channel simulator
Device can channel model needed for complete pairwise testing configuration, it should be noted that channel simulator can for multiple,
Can also be one in the case of port number is enough.The result of its channel simulator is as shown in fig. 7, channel
One darkroom antenna mapping units are set in emulator, different channel models in the antenna mapping units of darkroom, are preserved
Mapping relations between (i.e. output port) and different darkroom probes.For example, channel model is UMI's
Test signal is exported from port 1, and channel model for UMA test signal from port 2 output etc.,
This does not enumerate one by one.
Specifically, the test signal for exporting from different output ports has different channel models, and can lead to
Cross different probes to send (it should be noted that a test signal can also may be used by a probe transmission
Sent by multiple probes, here is not especially limited), so as to different channel circumstances are built in darkroom.
It should be noted that a measured terminal can only receive oneself working frequency range in the channel model of their own
Test signal.
Step 222, the first tested end of the corresponding test frequency range of the plurality of base station simulator of control control
End set up communication link respectively, by the communication link to multiple first measured terminals issue parallel with it is described
The corresponding test signal of channel model of the first measured terminal work.
And, step 24 includes：
Step 241, adjusts the incoming wave of the transmission power and multiple test signals of the plurality of test signal respectively
Direction, obtains handling capacity change information of corresponding first measured terminal in the case where posture is currently put respectively；
Step 242, adjust the plurality of first measured terminal put posture, and adjust the test signal
The arrival bearing of transmission power and test signal, obtains corresponding first measured terminal after the adjustment respectively
Put the handling capacity change information under posture；
Step 243, determines the plurality of first measured terminal in all of handling capacity change letter put under posture
Breath；
Step 244, according to first measured terminal in all handling capacity change informations put under posture, really
The average throughput change information of fixed first measured terminal.
It should be noted that the embodiment of the present invention is applied to need first to be initialized before the test system of Fig. 4：
Base station simulator is set to different test frequency ranges for different tested ends by initialization base station simulator
The test connection of corresponding frequency band is set up at end, for example, is that base station simulator 1 arranges test frequency range 1, if tested end
End 1 works in test frequency range 1, then base station simulates 1 for being led in test frequency range 1 with measured terminal 1
Letter；Initial Channel Assignment emulator, the configuration (letter of channel model needed for the complete pairwise testing of control channel emulator
Road emulator can be multiple, can also be one in the case of port number is enough)；Initial Channel Assignment is emulated
The darkroom antenna mapping units of device, the structure of its channel simulator is as shown in fig. 7, i.e. control channel emulator
Complete its output port (if the channel model that different terminals are adopted is different, to believe to the mapping of darkroom antenna
Road emulator need to meet the requirement of different channels model to the mapping of darkroom antenna port, same in darkroom to realize
When build the purpose of multiple wireless environments)；Initialization Multi probe darkroom, and the path of communication antenna is opened.
After the completion of initialization, test process can be carried out, therefore specific test process is as follows, as shown in Figure 8：
Step 81, adjustment multi-section measured terminal are positioned in Multi probe darkroom with certain attitude；
Step 82, base station simulator have certain orientation to terminal transmission by multiple antennas of darkroom periphery
Test signal, the wireless test environment (wireless propagation environment of test of needs is built around measured terminal
Independent UMI channel circumstances can also can be set up respectively for different terminals simultaneously such as multiple for same
Or be that an other terminal sets up UMA channel circumstances for a terminal sets up UMI channel circumstances)；
Step 83, adjusts the transmission power of test signal, make each measured terminal of concurrent testing respectively with test
Communication connection is set up in base station, and is in 100% maximum throughput state；Wherein, each measured terminal only connects
The test signal of corresponding test frequency range is received, which does not disturb from each other；
Step 84, constantly reduces the transmission power of test signal in the case where guarantee communication link does not go offline,
And count the downlink throughput capacity change of multiple measured terminals of concurrent testing by base station simulator respectively；
Step 85, (such as system shown in Figure 4 includes 8 probes to predetermined angle, then this is pre- in the horizontal direction
If angle is 45 °) for step-size change downstream signal arrival bearing, repeat step 84.To each terminal
Throughput curve under all rotational angles that each self-test is obtained averagely is obtained each leisure placing attitude
Under throughput performance；It should be noted that different terminals test process independence, so a terminal test
Terminate possible other-end still testing but do not affecting mutually.
Step 86, adjusts terminal to next placing attitude to be tested, repeats after completing a placing attitude
Step 84 is carried out to step 85, until completing all of placing attitude and test angle.
Step 87, after completing parallel terminal test, the terminal to there is interference carries out serial testing throughput,
Step 83 is repeated in step 86, the test of all terminals is completed.
To sum up, the embodiment of the present invention proposes the measurement while development multiple terminals is handled up in MIMO OTA technologies
The method of examination, is worked under different test frequency ranges by controlling different terminals, while by introducing frequency spectrum point
With the presence or absence of disturbed conditions such as intermodulation, spuious, frequencys multiplication between analysis link automatic decision measured terminal, noiseless
Scene adopt concurrent testing, be switched in the presence of interference serial test, so as to guaranteeing test
Lift testing efficiency in the case of precision at double.
In order to preferably realize above-mentioned purpose, as shown in figure 9, a kind of testing throughput device of multiple terminals,
It is applied to Multi probe darkroom framework, it is characterised in that include：
Interference acquisition module 91, is arranged between multiple measured terminals in the Multi probe darkroom for obtaining
Interference strength；
Concurrent testing module 92, for multiple the first of a preset strength value are less than or equal to interference strength
Measured terminal, issues multiple test signals of different test frequency ranges to a channel simulator, parallel by the letter
Multiple test signals are handed down to multiple the by the different probes in the Multi probe darkroom by road emulator parallel
One measured terminal；
First information acquisition module 93, for adjusting the transmission power of the plurality of test signal, described respectively
The arrival bearing of multiple test signals and the plurality of first measured terminal put posture, obtain many respectively
The handling capacity change information of individual first measured terminal.
Specifically, in the above embodiment of the present invention, the testing throughput device also includes：
Serial test module, for being more than multiple second measured terminals of the preset strength value to interference strength,
The test signal for the second measured terminal is issued to the channel simulator serial, by the channel simulator
The test signal is handed down to into the second measured terminal by the probe serial in the Multi probe darkroom；
Second data obtaining module, for being sequentially adjusted in transmission power, the test letter of the test signal
Number arrival bearing and second measured terminal put posture, obtain gulping down for the second measured terminal successively
The amount of telling change information
Specifically, in the above embodiment of the present invention, the interference acquisition module 91 includes：
Frequency spectrum acquisition module, for obtain each measured terminal work in respectively it is all test frequency range when band outside
Transmitted spectrum information；
Interference acquisition submodule, for according to the out-of-band radiation spectrum information, it is determined that working in each respectively
Interference strength between the measured terminal and other measured terminals of test frequency range.
Specifically, in the above embodiment of the present invention, the frequency spectrum acquisition module includes：
Module is set up, for communication link being set up with each measured terminal；
Receiver module, works in each test frequency for receiving corresponding measured terminal by the communication link
The upward signal launched during section；
Frequency spectrum acquisition submodule, works in each for according to the upward signal, obtaining each measured terminal
Out-of-band radiation spectrum information during test frequency range.
Specifically, in the above embodiment of the present invention, described device also includes：
Determining module, for according to the measured terminal and other measured terminals for working in each test frequency range respectively
Between interference strength, determine it is multiple work in different test frequency ranges, and in the different test frequency ranges simultaneously
Interference strength during work each other is the first quilt less than or equal to the measured terminal of the preset strength value
Survey terminal.
Specifically, in the above embodiment of the present invention, the concurrent testing module 92 includes：
First paralleled sub-modules, for being surveyed to channel simulator transmitted in parallel is different by multiple base station simulators
Multiple test signals of examination frequency range, it is the test signal is defeated from default output port by the channel simulator
Go out into a Multi probe darkroom multiple probes corresponding with the default output port, it is parallel by multiple probes
Launch the plurality of test signal；The plurality of test signal builds correspondence around first measured terminal
Wireless channel environment；
Second paralleled sub-modules, for the corresponding test frequency range of the plurality of base station simulator of control
The first measured terminal set up communication link respectively, by the communication link to multiple first measured terminals simultaneously
Row issues the test signal corresponding with the channel model of first measured terminal work.
Specifically, in the above embodiment of the present invention, the first information acquisition module 93 includes：
First adjusting module, for the transmission power for adjusting the plurality of test signal respectively and multiple tests
The arrival bearing of signal, obtains handle up quantitative change of corresponding first measured terminal in the case where posture is currently put respectively
Change information；
Second adjusting module, for adjusting the posture of putting of the plurality of first measured terminal, and adjusts described
The arrival bearing of the transmission power and test signal of test signal, obtains corresponding first measured terminal respectively
The handling capacity change information put under posture after the adjustment；
First information acquisition submodule, for determining that the plurality of first measured terminal puts posture all of
Under handling capacity change information；
Second acquisition of information submodule, for according to first measured terminal it is all put under posture gulp down
The amount of telling change information, determines the average throughput change information of first measured terminal.
The embodiment of the present invention is proposed in MIMO OTA technologies while carrying out the side of multiple terminals testing throughput
Method, is worked under different test frequency ranges by controlling different terminals, while by introducing spectrum analysis link
With the presence or absence of disturbed conditions such as intermodulation, spuious, frequencys multiplication between automatic decision measured terminal, in glitch-free scene
Using concurrent testing, serial test is switched in the presence of interference, so as to guarantee measuring accuracy
In the case of lift testing efficiency at double.
The explanation of needs, in the application of the testing throughput device of multiple terminals provided in an embodiment of the present invention
The test device of the throughput testing approach of multiple terminals is stated, then the institute of the throughput testing approach of above-mentioned multiple terminals
There is embodiment to be applied to the test device, and can reach same or analogous beneficial effect.
The above is the preferred embodiment of the present invention, it is noted that for the common skill of the art
For art personnel, on the premise of without departing from principle of the present invention, some improvements and modifications can also be made,
These improvements and modifications also should be regarded as protection scope of the present invention.
Claims (14)
1. a kind of throughput testing approach of multiple terminals, is applied to the framework in Multi probe darkroom, it is characterised in that include：
Acquisition is arranged at the interference strength between multiple measured terminals in the Multi probe darkroom；
Multiple first measured terminals of one preset strength value are less than or equal to interference strength, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, and multiple test signals are handed down to into multiple first measured terminals parallel by the different probes in the Multi probe darkroom by the channel simulator；
The handling capacity change information put posture, obtain multiple first measured terminals respectively of transmission power, the arrival bearing of the plurality of test signal and the plurality of first measured terminal of the plurality of test signal is adjusted respectively.
2. the throughput testing approach of multiple terminals according to claim 1, it is characterised in that the throughput testing approach also includes：
Multiple second measured terminals of the preset strength value are more than to interference strength, the test signal for the second measured terminal is issued to the channel simulator serial, the test signal is handed down to into the second measured terminal by the probe serial in the Multi probe darkroom by the channel simulator；
It is sequentially adjusted in the handling capacity change information put posture, obtain the second measured terminal successively of transmission power, the arrival bearing of the test signal and second measured terminal of the test signal.
3. the throughput testing approach of multiple terminals according to claim 1, it is characterised in that the step of acquisition is arranged at the interference strength between multiple measured terminals in the Multi probe darkroom includes：
Obtain each measured terminal work in respectively it is all test frequency range when out-of-band radiation spectrum information；
According to the out-of-band radiation spectrum information, it is determined that work in respectively each test frequency range measured terminal and other measured terminals between interference strength.
4. the throughput testing approach of multiple terminals according to claim 3, it is characterised in that the step of obtaining out-of-band radiation spectrum information when each measured terminal works in all test frequency ranges respectively includes：
Communication link is set up with each measured terminal；
The upward signal launched when corresponding measured terminal works in each test frequency range is received by the communication link；
According to the upward signal, out-of-band radiation spectrum information when each measured terminal works in each test frequency range is obtained.
5. the throughput testing approach of multiple terminals according to claim 3, it is characterised in that methods described also includes：
According to work in respectively each test frequency range measured terminal and other measured terminals between interference strength, determine it is multiple work in different test frequency ranges, and the interference strengths when the different test frequency ranges are worked simultaneously each other are the first measured terminal less than or equal to the measured terminal of the preset strength value.
6. the throughput testing approach of multiple terminals according to claim 1, it is characterized in that, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, multiple test signals are included by different the step of being handed down to multiple first measured terminals parallel of popping one's head in the Multi probe darkroom by the channel simulator：
By multiple base station simulators to the different multiple test signals for testing frequency range of channel simulator transmitted in parallel, the test signal is exported into into a Multi probe darkroom multiple probes corresponding with the default output port from default output port by the channel simulator, by the plurality of test signals of multiple probe transmitted in parallel；The plurality of test signal builds corresponding wireless channel environment around first measured terminal；
First measured terminal of the corresponding test frequency range of the plurality of base station simulator of control control sets up communication link respectively, parallel issues with the channel model of the first measured terminal work corresponding test signal to multiple first measured terminals by the communication link.
7. the throughput testing approach of multiple terminals according to claim 6, it is characterized in that, the transmission power for adjusting the plurality of test signal respectively, the arrival bearing of the plurality of test signal and the plurality of first measured terminal put posture, include the step of the handling capacity change information for obtaining multiple first measured terminals respectively：
The arrival bearing of the transmission power and multiple test signals of the plurality of test signal is adjusted respectively, obtains handling capacity change information of corresponding first measured terminal in the case where posture is currently put respectively；
Adjust the posture of putting of the plurality of first measured terminal, and adjust the arrival bearing of the transmission power and test signal of the test signal, obtain the corresponding first measured terminal handling capacity change information put under posture after the adjustment respectively；
Determine the plurality of first measured terminal in all of handling capacity change information put under posture；
According to first measured terminal in all handling capacity change informations put under posture, the average throughput change information of first measured terminal is determined.
8. a kind of testing throughput device of multiple terminals, is applied to Multi probe darkroom framework, it is characterised in that include：
Interference acquisition module, for obtaining the interference strength being arranged between multiple measured terminals in the Multi probe darkroom；
Concurrent testing module, for multiple first measured terminals of a preset strength value are less than or equal to interference strength, multiple test signals of different test frequency ranges are issued parallel to a channel simulator, and multiple test signals are handed down to into multiple first measured terminals parallel by the different probes in the Multi probe darkroom by the channel simulator；
First information acquisition module, for adjusting the handling capacity change information put posture, obtain multiple first measured terminals respectively of transmission power, the arrival bearing of the plurality of test signal and the plurality of first measured terminal of the plurality of test signal respectively.
9. the testing throughput device of multiple terminals according to claim 8, it is characterised in that the testing throughput device also includes：
Serial test module, for being more than multiple second measured terminals of the preset strength value to interference strength, the test signal for the second measured terminal is issued to the channel simulator serial, the test signal is handed down to into the second measured terminal by the probe serial in the Multi probe darkroom by the channel simulator；
Second data obtaining module, for being sequentially adjusted in the handling capacity change information put posture, obtain the second measured terminal successively of transmission power, the arrival bearing of the test signal and second measured terminal of the test signal.
10. the testing throughput device of multiple terminals according to claim 8, it is characterised in that the interference acquisition module includes：
Frequency spectrum acquisition module, for obtain each measured terminal work in respectively it is all test frequency range when out-of-band radiation spectrum information；
Interference acquisition submodule, for according to the out-of-band radiation spectrum information, it is determined that the interference strength between working in the measured terminal and other measured terminals of each test frequency range respectively.
The testing throughput device of 11. multiple terminals according to claim 10, it is characterised in that the frequency spectrum acquisition module includes：
Module is set up, for communication link being set up with each measured terminal；
Receiver module, for receiving the upward signal launched when corresponding measured terminal works in each test frequency range by the communication link；
Frequency spectrum acquisition submodule, for according to the upward signal, obtaining out-of-band radiation spectrum information when each measured terminal works in each test frequency range.
The testing throughput device of 12. multiple terminals according to claim 10, it is characterised in that described device also includes：
Determining module, for according to work in respectively each test frequency range measured terminal and other measured terminals between interference strength, determine it is multiple work in different test frequency ranges, and the interference strengths when the different test frequency ranges are worked simultaneously each other are the first measured terminal less than or equal to the measured terminal of the preset strength value.
The testing throughput device of 13. multiple terminals according to claim 8, it is characterised in that the concurrent testing module includes：
First paralleled sub-modules, for multiple test signals of frequency range are tested by multiple base station simulators to channel simulator transmitted in parallel difference, the test signal is exported into into a Multi probe darkroom multiple probes corresponding with the default output port from default output port by the channel simulator, by the plurality of test signals of multiple probe transmitted in parallel；The plurality of test signal builds corresponding wireless channel environment around first measured terminal；
Second paralleled sub-modules, the first measured terminal for the corresponding test frequency range of the plurality of base station simulator of control sets up communication link respectively, parallel issues with the channel model of the first measured terminal work corresponding test signal to multiple first measured terminals by the communication link.
The testing throughput device of 14. multiple terminals according to claim 13, it is characterised in that the first information acquisition module includes：
First adjusting module, for adjusting the arrival bearing of the transmission power and multiple test signals of the plurality of test signal respectively, obtains handling capacity change information of corresponding first measured terminal in the case where posture is currently put respectively；
Second adjusting module, posture is put for adjust the plurality of first measured terminal, and the arrival bearing of the transmission power and test signal of the test signal is adjusted, the corresponding first measured terminal handling capacity change information put under posture after the adjustment is obtained respectively；
First information acquisition submodule, for determining the plurality of first measured terminal in all of handling capacity change information put under posture；
Second acquisition of information submodule, determines the average throughput change information of first measured terminal for according to first measured terminal in all handling capacity change informations put under posture.
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