CN106526435B - Voltage converter impact testing device and method for active electronic voltage transformer - Google Patents
Voltage converter impact testing device and method for active electronic voltage transformer Download PDFInfo
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- CN106526435B CN106526435B CN201610905310.7A CN201610905310A CN106526435B CN 106526435 B CN106526435 B CN 106526435B CN 201610905310 A CN201610905310 A CN 201610905310A CN 106526435 B CN106526435 B CN 106526435B
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/12—Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
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Abstract
The invention provides a voltage converter impact testing device for an active electronic voltage transformer and a corresponding impact testing method, aiming at the problem that the adopted methods are slow boosting testing methods when the existing intelligent transformer station performs active electronic voltage transformer and voltage converter type tests used by the same, and great hidden dangers are brought to power production. The impact testing device, the testing transformer, provides the voltage needed by the test; the circuit breaker is arranged on a circuit of the voltage division circuit connected in series with the test transformer, and the input end of the voltage converter is connected in parallel with one voltage division device of the voltage division circuit; the voltage waveform collector is connected with the output end of the voltage converter; and the wave recorder is connected with the voltage waveform collector. The invention completely simulates the actual impact process before and after the circuit breaker is opened and closed, can actually verify whether the voltage converter has the capability of accurate output in the impact state or not, and solves the potential hazard possibly generated in the power production process.
Description
Technical Field
The invention relates to the technical field related to component testing of an intelligent substation, in particular to an impact testing device and a corresponding impact testing method of a voltage converter for an active electronic voltage transformer of the intelligent substation.
Background
In recent years, with the rapid advance of the construction of intelligent substations and new-generation intelligent substations, a large amount of new equipment and new technologies, such as new-generation intelligent substation protocols, intelligent protection devices, intelligent terminals, merging units, electronic transformers, and the like, are adopted in the intelligent substations. As a key device for primary and secondary electric quantity conversion, the electronic transformer is widely applied to the most different intelligent transformer stations and new-generation intelligent transformer stations from the traditional comprehensive automatic transformer stations.
The electronic transformer can be divided into two major series of active and passive according to the transformation principle, the active electronic transformer is also called an electronic voltage/current transformer (EVT/ECT), and is characterized in that a sensing head needs to be provided with a power supply, mainly represented by a Rogowski (Rogowski) coil.
In production, because the actual service life of the active electronic voltage transformer is short, part of the active electronic voltage transformer is immature in principle, especially, the voltage transformers of part models often output abnormal waveforms before and after the circuit breaker is disconnected, the abnormal waveform locking protection device is in an extreme condition, and if a fault occurs in a related protection area at the moment, serious consequences of fault expansion inevitably occur.
The reason is that when the active electronic voltage transformer and the voltage converter used by the active electronic voltage transformer are subjected to type tests, all the adopted methods are slow voltage boosting test methods, and the voltage is slowly boosted from 0V to rated voltage or 1.2 to 1.5 times of the rated voltage. However, the method has no way to simulate the impact process before and after the circuit breaker is switched on and off, and the actual measurement characteristics of the active electronic voltage transformer before and after the circuit breaker is switched on and off are not verified, so that great hidden danger is brought to power production.
Disclosure of Invention
The invention provides an active voltage transformer impact testing device for an intelligent substation and a corresponding impact testing method, aiming at the problems that when the existing intelligent substation is used for performing type tests of an active electronic voltage transformer and a voltage converter used by the same, the adopted methods are slow boosting testing methods, no method is available for simulating impact processes before and after a breaker is switched on and off, the actual measurement characteristics of the voltage converter for the active electronic voltage transformer before and after the breaker is switched on and off are not verified, and great hidden dangers are brought to power production.
The technical problem to be solved by the invention can be realized by the following technical scheme:
in a first aspect of the present invention, a voltage converter surge testing apparatus for an active electronic voltage transformer is characterized by comprising:
the test transformer provides voltage required by the test;
the active electronic voltage transformer comprises a voltage dividing circuit, wherein the voltage dividing circuit is connected with the test transformer in series, a circuit breaker is arranged on the series circuit, and the input end of a voltage converter to be tested is connected to one voltage dividing device of the voltage dividing circuit in parallel;
the voltage waveform collector is connected with the output end of the voltage converter to be tested;
and the wave recorder is connected with the voltage waveform collector.
In the present invention, the ratio of the input voltage to the output voltage of the voltage converter to be tested is 25:1.
in the invention, the voltage dividing circuit is a capacitor voltage dividing circuit connected in series, and the input end of the voltage converter to be tested is connected in parallel with one voltage dividing capacitor.
In the invention, the number of the voltage waveform collectors is two or more, the two or more voltage waveform collectors are connected with a voltage waveform combiner, and the voltage waveform combiner is connected with the wave recorder.
In a second aspect of the present invention, a method for impact testing of a voltage converter for an active electronic voltage transformer is characterized by comprising the following steps:
1) Starting a wave recorder to start wave recording operation;
2) Applying voltage which is not less than the rated voltage of the active electronic voltage transformer at two ends of the voltage division circuit through a test transformer, converting the breaker from an open circuit state to a closed state, and carrying out impact test on the voltage converter to be tested;
3) The voltage waveform collector collects the voltage waveform of the output end of the voltage converter, the wave recorder records the wave, and the actual measurement characteristic of the voltage converter to be tested is obtained according to the recorded wave of the wave recorder.
In the invention, the voltage applied to two ends of the voltage division circuit is 1Un to 1.5Un, wherein Un is the rated voltage of the active electronic voltage transformer.
In the invention, when 1.5 times of rated voltage of the active electronic voltage transformer is applied to two ends of the voltage dividing circuit, the voltage waveform of the output end of the voltage converter to be tested can be recovered to be normal in a preset time or period, and the saturation characteristic of the voltage converter is considered to meet the use requirement of the active electronic voltage transformer.
In the invention, load capacitors are connected in parallel at two ends of a voltage dividing circuit, a comparison impact test that the same voltage is applied to the two ends of the voltage dividing circuit is carried out, and if the voltage waveform of the output end of a voltage converter in the comparison impact test meets a preset deviation range compared with the impact test, the capacitive load is considered not to influence the impact test result.
In the invention, a second voltage division circuit which is the same as the voltage division circuit is connected in parallel at two ends of the voltage division circuit, and in the process of carrying out impact test, an external oscilloscope is adopted to collect the voltage waveform of the voltage division circuit and the voltage divider connected with the input end of the voltage converter to be tested at the high-voltage end of the voltage division device, and the voltage waveform of the second voltage division circuit and the voltage divider corresponding to the voltage division device at the high-voltage end of the second voltage division device.
In the process of carrying out impact test, simultaneously adopting an external oscilloscope to collect the voltage waveform of the output end of the voltage converter to be tested;
or, removing the voltage waveform collector and the downstream element device from the impact testing device, and simultaneously collecting the voltage waveform of the output end of the voltage converter to be tested by adopting an external oscilloscope in the process of performing impact testing;
or removing the voltage converter to be tested and the downstream components of the voltage converter to be tested from the impact testing device, and then carrying out impact testing.
The invention relates to an impact test device and a corresponding impact test method for a voltage converter for an active electronic voltage transformer of an intelligent substation, which solve the problem of inconvenient impact state test caused by the opening and closing of a breaker of the active electronic voltage transformer of the existing intelligent substation and the voltage converter used by the active electronic voltage transformer.
Drawings
The invention is further described below in conjunction with the appended drawings and the detailed description.
FIG. 1 is a schematic circuit diagram of an impact testing apparatus according to the present invention.
FIG. 2 is a schematic diagram of a circuit structure of a parallel load capacitor of the impact testing apparatus according to the present invention.
FIG. 3 is a schematic diagram of a circuit structure of the impact testing apparatus of the present invention connected in parallel with a second voltage divider circuit.
Fig. 4 is a schematic diagram of a circuit structure of the impulse testing apparatus according to the present invention after removing the voltage waveform collector and the devices downstream thereof.
Fig. 5 is a schematic circuit diagram of the impulse testing apparatus of the present invention after the voltage converter to be tested and the components downstream thereof are removed.
Detailed Description
In order to make the technical means, the creation characteristics, the achievement purposes and the effects of the invention easy to understand, the invention is further described below by combining the specific drawings.
The invention mainly aims to find that the adopted methods are slow boosting test methods when the existing intelligent substation carries out the type test of the active electronic voltage transformer and the voltage converter used by the active electronic voltage transformer through the analysis of the type test process of the active electronic voltage transformer and the voltage converter used by the active electronic voltage transformer, and the invention has no way to simulate the impact process before and after the circuit breaker is switched on, and has no verification of the actual measurement characteristics of the voltage converter used by the active electronic voltage transformer before and after the circuit breaker is switched on, thereby bringing great hidden trouble to the power production.
Referring to fig. 1, an active electronic voltage transformer generally adopts a capacitive voltage division or resistive voltage division technology, utilizes an electronic module similar to the active electronic current transformer to process signals, and uses an optical fiber to transmit signals, in this embodiment, the active electronic voltage transformer adopts the capacitive voltage division technology, a voltage division capacitor C1 and a voltage division capacitor C2 are connected in series to form a capacitive voltage division circuit, and an input end of a voltage converter to be tested is connected in parallel with two ends of the voltage division capacitor C2, so that the electronic module (not shown), the voltage division circuit, and the voltage converter to be tested form the active electronic voltage transformer.
The voltage converter impact testing device for the active electronic voltage transformer of the intelligent substation comprises a test transformer, wherein the test transformer is used for providing voltage required by testing, a voltage dividing circuit is connected with the test transformer in series, and a circuit breaker is arranged on a loop of the test transformer and the voltage dividing circuit.
The two ends of the voltage dividing capacitor C2 are connected in parallel with the voltage converter to be tested, specifically, the input end of the voltage converter is connected in parallel with the two ends of the voltage dividing capacitor C2, then, the voltage U2 at the input end of the voltage converter = C1 × U1/(C1 + C2), where U1 is the applied voltage of the test transformer at the two ends of the voltage dividing circuit (in the case of closing the circuit breaker), and the voltage is output through the output end of the voltage converter. In the present invention, the voltage converter for the active electronic voltage transformer functions to convert a high voltage level into an analog voltage of a low voltage level. Preferably, the ratio of the input voltage to the output voltage of the input of the voltage converter to be tested in the present invention is 25:1, preferably, through setting parameters of the voltage dividing capacitor C2 and the voltage dividing capacitor C1, the voltage at two ends of the voltage dividing capacitor C2 is 100V, that is, the voltage at the input end of the voltage converter to be tested is set to be 100V, and then the output voltage at the output end of the voltage converter to be tested is 4V. It is to be understood that, the voltage dividing circuit may also adopt a resistance voltage dividing circuit or other types of voltage dividing circuits besides the capacitance voltage dividing circuit in the embodiment, and the input end of the voltage converter to be tested is connected in parallel to a suitable voltage dividing device to realize voltage input.
As before, the voltage waveform collector is connected to the voltage converter's of plans the test output, in this embodiment, the voltage waveform collector has set up two, voltage waveform merger is all connected to two voltage waveform collectors, the voltage waveform merger then merges the signal of two way different voltage waveform collectors output to same data frame, the rethread broadcast message is to transmitting outward, can adopt merging cells to the voltage waveform merger, and then the wave recorder is reconnected to the voltage waveform merger, the wave waveform is taken in to the wave recorder, so that take notes and the actual measurement characteristic of evaluation active electronic voltage transformer. Like this, two voltage waveform collector's sampling value all carries out independent AD sampling, is so to avoid a certain sampling to appear unusually, leads to the maloperation, and two way independent samplings can realize the check-up each other.
It can be understood that only one voltage waveform collector may be provided, and then the voltage waveform collector and the wave recorder may be directly connected without providing a voltage waveform combiner; the voltage waveform collectors can also be arranged more than 2, and signals output by the multiple paths of different voltage waveform collectors are combined into the same data frame and input into the wave recorder by arranging the voltage waveform combiner.
When the impact test device of the voltage converter for the active electronic voltage transformer of the intelligent substation is used for performing the impact test on the voltage converter for the active electronic voltage transformer, firstly, a wave recorder is started to start wave recording operation; then, applying a voltage which is not less than the rated voltage of the active electronic voltage transformer at two ends of the voltage dividing circuit through a test transformer, converting the breaker from an open circuit state to a closed state, and carrying out impact test on the voltage converter to be tested; the voltage waveform collector collects the voltage waveforms at the output end of the voltage converter, the wave recorder records the waves (if the voltage waveform collector is multiple and the voltage waveform combiner is arranged, the wave recorder records the waves after combination), and the actual measurement characteristics of the voltage converter to be tested are obtained according to the recorded waveforms of the wave recorder. Here, the waveform recorded by the wave recorder may be a normal waveform or an abnormal waveform, and the actual measurement characteristic of the voltage converter to be tested can be obtained by determining whether the waveform is normal or not, and the abnormal waveform includes a saturated waveform generated when the saturation point of the voltage converter to be tested is low, a distorted waveform caused by other factors, a dc offset, and the like.
Of course, the above test is only a general operation process of the voltage converter impact test for the active electronic voltage transformer of the present invention, and there is a most important measurement characteristic for the voltage converter to be tested, that is, whether the saturation characteristic can meet the use requirement of the active electronic voltage transformer. The iron core saturation multiple of the voltage converter is not designed sufficiently, the saturation point of the voltage converter is low, and the voltage converter is influenced by impulse voltage and direct-current offset voltage in the closing process of the breaker to generate the condition of saturated waveforms. The saturation characteristic of the voltage converter is considered to meet the use requirement of the active electronic voltage transformer, and the basic requirement is as follows: when 1.5 times of rated voltage of the active electronic voltage transformer is applied to two ends of the voltage division circuit, the voltage waveform of the output end of the voltage converter to be tested can be recovered to be normal within preset time or period, and the saturation characteristic of the voltage converter is considered to meet the use requirement of the active electronic voltage transformer.
In one test example of the invention, a plurality of old voltage converters and a new voltage converter of the same type are randomly selected, 3 voltage converters are selected from the old converters, the two voltage converters and the new voltage converter are built, an impact test device is built, and the test is carried out by applying voltage to two ends of a voltage division circuit and using a breaker to carry out switching operation. The first old voltage converter firstly carries out impact test, the rated voltage Un of the active electronic voltage transformer is applied to two ends of a voltage division circuit, and when a breaker is closed, the test waveform is found to be saturated (abnormal waveform) through the waveform recorded by a wave recording device, but can be recovered within 5 cycles; applying 1.1 times of rated voltage Un at two ends of the voltage division circuit for impact test again, wherein the waveform is saturated when the breaker is closed as when the rated voltage Un is applied, and the waveform is recovered to be normal after lasting for 5 s; and applying 1.2 times of rated voltage Un to two ends of the voltage dividing circuit to perform impact test again, wherein the waveform is still saturated when the circuit breaker is closed and does not recover to normal after lasting for more than 5min, and further, when the voltage of a primary terminal is reduced from 76kV to 70kV, the voltage converter recovers to normal immediately, and at the moment, the iron core of the voltage converter is demagnetized. Then, an impact test experiment that a larger voltage is applied to two ends of the voltage division circuit is not performed any more, and the voltage converter tested at present can obviously not meet the requirement.
And then, a second old voltage converter is adopted for carrying out an impact test, under the condition that the voltage of rated voltage Un and the voltage of 1.2 times of rated voltage Un are applied to the two ends of the voltage dividing circuit, the output waveform of the voltage converter for the impact test has no difference with the result of the output waveform of the impact test, and when the voltage of 1.1 times of rated voltage Un is applied to the two ends of the voltage dividing circuit, the saturation time of the output waveform when the circuit breaker is closed is reduced to about 2 cycles, so that the saturation time is improved to a certain extent by about 5s compared with the saturation time when the circuit breaker is closed. However, when 1.5 times of rated voltage Un is applied across the voltage divider circuit, the output waveform still exhibits long-term saturation. The voltage converters tested at present are likewise not satisfactory.
And then, a new voltage converter is adopted to carry out impact test, when rated voltage Un, 1.1 times of rated voltage Un, 1.2 times of rated voltage Un and 1.5 times of rated voltage Un are applied to two ends of a voltage division circuit, when a breaker is closed, the output waveforms are only subjected to direct current bias in the first 2 and 3 cycles, and then the waveforms are completely recovered to be normal, which indicates that the saturation multiple margin of the new voltage converter is large, and the saturation characteristic of the voltage converter can be considered to meet the use requirement of the active electronic voltage transformer. The limitation that the normal state is recovered within the predetermined time or period may be selected according to the actual condition of the voltage converter to be subjected to the impact test, for example, the normal state is recovered within 10 periods (cycles) to be considered as meeting the requirement, and since the actual condition is complicated, the description is not repeated here.
Referring to fig. 2, the impact testing apparatus for a voltage converter for an active electronic voltage transformer of an intelligent substation according to the present invention may further include load capacitors connected in parallel to two ends of the voltage dividing circuit, for example, the load capacitors C are connected in parallel to two ends of the capacitive voltage dividing circuit in this embodiment, and a comparative impact test is performed in which voltages applied to two ends of the voltage dividing circuit are the same (as compared to the normal impact test). In an example of the embodiment, a load capacitor C with a capacitance value of 5000pF is connected in parallel with the voltage dividing circuit, and the impact test with the same voltage is repeatedly applied, so that the test waveform and the saturation duration of the invention have no obvious change compared with the previous impact test, which indicates that the capacitive load does not influence the result of the impact test. Here, satisfying the preset deviation range may be considered from the saturation duration and the speed of recovering from normality of the test waveform, for example, the saturation duration is different by 5 to 10 cycles, and the preset deviation range may be considered to be satisfied.
Referring to fig. 3, in the invention, a second voltage divider circuit identical to the voltage divider circuit may be further connected in parallel at two ends of the voltage divider circuit, and during the impact test, an external oscilloscope is used to collect the voltage waveform at the high-voltage end of the voltage divider connected between the voltage divider circuit and the input end of the voltage converter to be tested, and the voltage waveform at the high-voltage end of the second voltage divider corresponding to the voltage divider of the second voltage divider. For example, in the present embodiment, a second capacitance voltage-dividing circuit composed of a voltage-dividing capacitor C3 and a voltage-dividing capacitor C4 is connected in parallel to both ends of a capacitance voltage-dividing circuit composed of a voltage-dividing capacitor C1 and a voltage-dividing capacitor C2, a 2-channel of the oscilloscope XSC1 is connected to a high-voltage end of the voltage-dividing capacitor C2, and a 1-channel of the oscilloscope XSC1 is connected to a high-voltage end of the voltage-dividing capacitor C4 corresponding to the voltage-dividing capacitor C2, but of course, in the present embodiment, the voltage waveform at the output end of the voltage converter to be tested is collected by using the external oscilloscope XSC1 by connecting the output end of the voltage converter to be tested to the 4-channel of the oscilloscope XSC 1.
The impact test is carried out under the condition of the circuit structure, the impact test device is of a complete structure, the circuit breaker is switched on and off under the condition that 1.3 times of rated voltage of the active electronic voltage transformer is applied to two ends of the voltage dividing circuit, and an oscilloscope collects signals, so that the output signal of the high-voltage end of the voltage dividing capacitor C4 is good, and the waveform distortion occurs to the high-voltage end of the voltage dividing capacitor C2 and the output end of the voltage converter to be tested.
Referring to fig. 4, in the present embodiment, the voltage waveform collector and the component devices downstream thereof are removed from the impact testing apparatus, and during the impact testing process, an external oscilloscope is used to collect the voltage waveform at the output end of the voltage converter to be tested. The result is completely consistent with the embodiment shown in fig. 3, which indicates that the acquisition unit does not cause an abnormality.
Referring to fig. 5, in the present embodiment, the voltage converter to be tested and the components downstream thereof are removed from the impact testing apparatus, and then the impact test is performed, so that the abnormal waveform disappears, and it can be determined that the output of the voltage divider circuit is abnormal, and the fault is caused by the voltage converter to be tested.
The foregoing shows and describes the general principles, essential features, and advantages of the invention. It will be understood by those skilled in the art that the present invention is not limited to the embodiments described above, which are given by way of illustration of the principles of the present invention, and that various changes and modifications may be made without departing from the spirit and scope of the invention as defined by the appended claims. The scope of the invention is defined by the appended claims and equivalents thereof.
Claims (9)
1. Active electronic formula voltage transformer is with voltage converter impact test device, its characterized in that includes:
the test transformer provides voltage required by the test;
the active electronic voltage transformer comprises a voltage division circuit, wherein the voltage applied to two ends of the voltage division circuit is 1 Un-1.5 Un, the Un is the rated voltage of the active electronic voltage transformer, the voltage division circuit is connected with the test transformer in series, a circuit breaker is arranged on the series circuit, and the input end of a voltage converter to be tested is connected on one voltage division device of the voltage division circuit in parallel;
the voltage waveform collector is connected with the output end of the voltage converter to be tested;
and the wave recorder is connected with the voltage waveform collector.
2. The voltage converter surge testing device for the active electronic voltage transformer of claim 1, wherein: the ratio of the input voltage to the output voltage of the voltage converter to be tested is 25:1.
3. the voltage converter surge testing device for the active electronic voltage transformer of claim 1, wherein: the voltage division circuit is a capacitor voltage division circuit which is connected in series, and the input end of the voltage converter to be tested is connected to one of the voltage division capacitors in parallel.
4. The voltage converter surge testing device for the active electronic voltage transformer of claim 1, wherein: the voltage waveform collector is more than two, the voltage waveform collector more than two all connects the voltage waveform combiner, the voltage waveform combiner is connected the oscillograph.
5. The voltage converter impact test method for the active electronic voltage transformer adopts the voltage converter impact test device for the active electronic voltage transformer as claimed in any one of claims 1 to 4, and is characterized by comprising the following steps:
1) Starting a wave recorder to start wave recording operation;
2) Applying voltage which is not less than the rated voltage of the active electronic voltage transformer at two ends of the voltage dividing circuit through a test transformer, converting the breaker from an open circuit state to a closed state, and carrying out impact test on the voltage converter to be tested;
3) The voltage waveform collector collects the voltage waveform of the output end of the voltage converter, the wave recorder records the wave, and the actual measurement characteristic of the voltage converter to be tested is obtained according to the recorded wave of the wave recorder.
6. The method for testing the surge of the voltage converter for the active electronic voltage transformer of claim 5, wherein: when 1.5 times of rated voltage of the active electronic voltage transformer is applied to two ends of the voltage division circuit, the voltage waveform of the output end of the voltage converter to be tested can be recovered to be normal within preset time or period, and the saturation characteristic of the voltage converter is considered to meet the use requirement of the active electronic voltage transformer.
7. The method for testing the surge of the voltage converter for the active electronic voltage transformer of claim 5, wherein: load capacitors are connected in parallel at two ends of the voltage dividing circuit, a comparison impact test that the same voltage is applied to the two ends of the voltage dividing circuit is carried out, and if the voltage waveform of the output end of the voltage converter in the comparison impact test meets a preset deviation range compared with the voltage waveform of the voltage dividing circuit in the comparison impact test, the capacitive load is considered not to influence the result of the impact test.
8. The method for testing the impact of the voltage converter for the active electronic voltage transformer as claimed in claim 5, wherein: and in the process of impact test, an external oscilloscope is adopted to collect the voltage waveform of the high-voltage end of the voltage divider connected with the voltage divider and the input end of the voltage converter to be tested, and the voltage waveform of the high-voltage end of the second voltage divider corresponding to the voltage divider.
9. The method for testing the impact of the voltage converter for the active electronic voltage transformer as claimed in claim 8, wherein: in the process of carrying out the impact test, simultaneously adopting an external oscilloscope to collect the voltage waveform of the output end of the voltage converter to be tested;
or, removing the voltage waveform collector and the downstream element device from the impact test device, and simultaneously collecting the voltage waveform of the output end of the voltage converter to be tested by adopting an external oscilloscope in the process of performing impact test;
or removing the voltage converter to be tested and the downstream components of the voltage converter to be tested from the impact testing device, and then carrying out impact testing.
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