CN106501978B - A kind of analysis method and analytical equipment of display panel flame - Google Patents
A kind of analysis method and analytical equipment of display panel flame Download PDFInfo
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- CN106501978B CN106501978B CN201710003418.1A CN201710003418A CN106501978B CN 106501978 B CN106501978 B CN 106501978B CN 201710003418 A CN201710003418 A CN 201710003418A CN 106501978 B CN106501978 B CN 106501978B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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Abstract
The present invention provides the analysis method and analytical equipment of a kind of display panel flame, the analysis method includes: the bad stitching image for obtaining the first parent panel, and the bad stitching image with associated second parent panel of first parent panel, wherein, the bad stitching image of parent panel is spliced by the bad detection image for belonging to each sub- display panel of the parent panel, and the corresponding flame of bad stitching image of parent panel is summarized to obtain by the flame for belonging to each sub- display panel of the parent panel;By the bad stitching image additive fusion of the bad stitching image of the first parent panel and the second parent panel, obtain a bad superimposed image, the corresponding flame of the bad superimposed image is summarized to obtain by the flame of first parent panel and second parent panel.Since the flame of bad superimposed image is to summarize to obtain from multiple parent panels, the bad performance on parent panel of panel of big data quantity can be embodied.
Description
Technical field
The present invention relates to display panel detection technique field more particularly to a kind of analysis methods of display panel flame
And analytical equipment.
Background technique
With the development of intelligent manufacturing technology, automatic optics inspection (AOI) in link is checked in the production of display panel
Using increasingly extensive.AOI using it is unmanned detect automatically by the way of, detection speed it is fast, performance is stable, Modulatory character is good, become
Substitute the main product defects detection pattern of artificial detection.
Display panel AOI is to be shot using photographing device to the single sub- display panel after cutting, then to shooting
Image analyzed, find out bad on single sub- display panel, and carry out defective products interception, can not obtain before not cutting
Parent panel bad whole shape appearance figure, the specific bad association on parent panel, through situation etc..
Advanced lines line display panel produces now, for analysis and timely technique the reason of bad generation on parent panel,
Equipment adjustment, promotes product yield, improves shipment quality, and containment loss due to spoiled work etc. has huge facilitation.
The analysis method of existing display panel flame is the sub- display panel detection data of swipe, counts parent panel
Upper each sub- specific undesirable incidence in display panel position, obtains roughly the specific bad proportion at which position of parent panel
Height, and then trace the correspondence problem point of process equipment.
Above-mentioned analysis method inefficiency must manually carry out examination screening from mass data, while compile to data
It collects and arranges, finally can only obtain simply abstract bad Mapping (map) incidence chart, and bad tool can not be accurately positioned
Body position can not intuitively obtain the bad whole shape appearance figure of parent panel, can not study the specific bad association on parent panel, run through
Situation etc. has significant limitation for bad analysis promptly and accurately.
Summary of the invention
In view of this, the present invention provides the analysis method and analytical equipment of a kind of display panel flame, it can be to not
The flame of parent panel before cutting is comprehensively analyzed.
In order to solve the above technical problems, the present invention provides a kind of analysis method of display panel flame, comprising:
The bad stitching image of the first parent panel is obtained, and not with associated second parent panel of first parent panel
Good stitching image, wherein the bad stitching image of parent panel is by belonging to the bad detection figure of each sub- display panel of the parent panel
As being spliced, the corresponding flame of bad stitching image of parent panel is by belonging to each sub- display panel of the parent panel not
Good information summarizes to obtain;
By the bad stitching image additive fusion of the bad stitching image of first parent panel and second parent panel,
Obtain a bad superimposed image, the corresponding flame of the bad superimposed image is by first parent panel and described second female
The flame of panel summarizes to obtain.
Preferably, the bad spliced map by the bad stitching image of first parent panel and second parent panel
As additive fusion, after the step of obtaining a bad superimposed image further include:
Determine flame type to be resolved;
Display is loaded with the bad superimposed image of the related content of the flame to be resolved.
Preferably, before the step of bad stitching image for obtaining the first parent panel further include:
Sub- display panel to be detected is detected by automatic optical detecting system, the sub- display surface detected
The bad detection image of plate;
The bad detection image of the storage sub- display panel detected.
Preferably, the step of bad stitching image for obtaining the first parent panel includes:
Determine that the sub- display panel of to be resolved first, the first sub- display panel belong to first parent panel;
From the bad detection image of the sub- display panel detected described in storage, first son for extracting storage is aobvious
Show that the bad detection image of panel, and the second son for belonging to first parent panel with the described first sub- display panel are shown
The bad detection image of panel;
The bad detection of bad detection image and the second sub- display panel to the first sub- display panel got
Image is spliced, and the bad stitching image of first parent panel, the bad stitching image pair of first parent panel are obtained
The flame answered is summarized to obtain by the flame of the described first sub- display panel and the second sub- display panel.
Preferably, the corresponding unique number of bad detection image of each sub- display panel detected of storage,
Identification information comprising parent panel belonging to the sub- display panel detected in the number;
It is described extract storage the described first sub- display panel bad detection image, and with the described first sub- display surface
Plate belongs to the step of bad detection image of the second sub- display panel of first parent panel and includes:
According to the number of the described first sub- display panel, retrieves and belong to described first with the described first sub- display panel
The number of the sub- display panel of the second of parent panel;
According to the number of the described first sub- display panel and the second sub- display panel, extract the first sub- display panel and
The bad detection image of the second sub- display panel.
Preferably, the position in the parent panel in the number also comprising the sub- display panel detected belonging to it
Information;
It is described obtain the first parent panel bad stitching image the step of include:
According to indicated its described first in the number of the described first sub- display panel and the second sub- display panel
Location information in parent panel determines the described first sub- display panel and the second sub- display panel in first parent panel
In position;
It is right according to the position of the described first sub- display panel and the second sub- display panel in first parent panel
The bad detection image of the first sub- display panel and the bad detection image of the second sub- display panel are spliced, and are obtained
To the bad stitching image of first parent panel.
Preferably, the flame of sub- display panel includes the bad coordinate information in sub- display panel, the acquisition
The step of bad stitching image of first parent panel further include:
According to the coordinate of the flame in the described first sub- display panel and the second sub- display panel, described first
The position of sub- display panel and the second sub- display panel in first parent panel, the first sub- display panel and institute
State the size of the second sub- display panel, the cutting of the size of first parent panel and first parent panel in cutting technique
Parameter is converted to the bad coordinate information in the described first sub- display panel and the second sub- display panel bad in institute
State the coordinate information on the first parent panel.
Preferably, before the step of bad stitching image for obtaining the first parent panel further include:
Sub- display panel to be detected is detected using automatic optical detecting system, the sub- display surface detected
The bad detection image of plate;
The bad detection image for belonging to the sub- display panel of same parent panel respectively detected is spliced, generatrix is obtained
The bad stitching image of plate;
Store the bad stitching image of parent panel.
Preferably, the step of bad stitching image for obtaining the first parent panel includes:
Determine the first parent panel to be resolved;
From the bad stitching image of the parent panel of storage, the bad stitching image of the first parent panel to be resolved is extracted.
The present invention also provides a kind of analytical equipments of display panel flame, comprising:
Module is obtained, it is associated for obtaining the bad stitching image of the first parent panel, and with first parent panel
The bad stitching image of second parent panel, wherein the bad stitching image of parent panel is by belonging to each sub- display surface of the parent panel
The bad detection image of plate is spliced, and the corresponding flame of bad stitching image of parent panel is by belonging to each of the parent panel
The flame of sub- display panel summarizes to obtain;
Additive fusion module, for by the bad of the bad stitching image of first parent panel and second parent panel
Stitching image additive fusion, obtains a bad superimposed image, and the corresponding flame of the bad superimposed image is by described first
The flame of parent panel and second parent panel summarizes to obtain.
The advantageous effects of the above technical solutions of the present invention are as follows:
In the embodiment of the present invention, the bad detection image for belonging to multiple sub- display panels of same parent panel is spelled
It connects, obtains the bad stitching image of parent panel, then, the bad stitching image of multiple relevant parent panels is overlapped, is obtained
To bad superimposed image, since the corresponding flame of bad superimposed image is summarized by the flame of multiple parent panels
It arrives, it is thus possible to embody the bad performance on parent panel of panel of big data quantity.
The method of the embodiment of the present invention is simple and effective, can intuitively obtain the bad appearance of parent panel, bad position, no rapidly
The information such as good penetrability, undesirable concentration, greatly improve bad analysis efficiency and accuracy, so as to according to bad analysis
As a result timely technique, equipment adjustment are carried out, product yield is promoted, improves shipment quality, contain loss due to spoiled work.
Detailed description of the invention
Fig. 1 is the flow diagram of the analysis method of the display panel flame of the embodiment of the present invention one;
Fig. 2 is the flow diagram of the analysis method of the display panel flame of the embodiment of the present invention two;
Fig. 3 is the flow diagram of the analysis method of the display panel flame of the embodiment of the present invention three;
Fig. 4 is the flow diagram of the analysis method of the display panel flame of the embodiment of the present invention four;
Fig. 5 is the number schematic diagram of the sub- display panel of one embodiment of the invention;
Fig. 6 is the joining method schematic diagram of the bad detection image of the sub- display panel of one embodiment of the invention;
Fig. 7 is converted to bad on parent panel for the bad coordinate information on sub- display panel of one embodiment of the invention
Coordinate information schematic diagram;
Fig. 8 is that the stitching image of multiple parent panels of one embodiment of the invention is overlapped the schematic diagram of fusion;
Fig. 9 is the schematic diagram of the bad superimposed image of the display of one embodiment of the invention.
Specific embodiment
In order to make the object, technical scheme and advantages of the embodiment of the invention clearer, below in conjunction with the embodiment of the present invention
Attached drawing, the technical solution of the embodiment of the present invention is clearly and completely described.Obviously, described embodiment is this hair
Bright a part of the embodiment, instead of all the embodiments.Based on described the embodiment of the present invention, ordinary skill
Personnel's every other embodiment obtained, shall fall within the protection scope of the present invention.
Unless otherwise defined, the technical term or scientific term used herein should be in fields of the present invention and has
The ordinary meaning that the personage of general technical ability is understood.Used in present patent application specification and claims " the
One ", " second " and similar word are not offered as any sequence, quantity or importance, and are used only to distinguish different
Component part.Equally, the similar word such as "one" or " one " does not indicate that quantity limits yet, but indicates that there are at least one.
" connection " either the similar word such as " connected " is not limited to physics or mechanical connection, but may include electrical
Connection, it is either direct or indirect."upper", "lower", "left", "right" etc. are only used for indicating relative positional relationship, work as quilt
After the absolute position of description object changes, then the relative positional relationship also correspondingly changes.
Referring to FIG. 1, Fig. 1 is the process signal of the analysis method of the display panel flame of the embodiment of the present invention one
Figure, the analysis method include:
Step 11: obtaining the bad stitching image of the first parent panel, and female with first parent panel associated second
The bad stitching image of panel, wherein the bad stitching image of parent panel is by belonging to each sub- display panel of the parent panel not
Good detection image is spliced, and the corresponding flame of bad stitching image of parent panel is by belonging to each sub- display of the parent panel
The flame of panel summarizes to obtain;
So-called parent panel refers to that the big panel before not cutting, so-called sub- display panel refer to small after being cut by parent panel
Panel.
The flame may include undesirable type, undesirable quantity and undesirable coordinate information etc..
The bad detection image of the sub- display panel can be the bad inspection detected by automatic optical detecting system
Altimetric image.
With the described first sub- associated second parent panel of display panel, number can be one or more, be and the first mother
The identical parent panel of panel product model, further, can also be has and the described first sub- display panel same type
The parent panel of predetermined flame.
Step 12: the bad stitching image of the bad stitching image of first parent panel and second parent panel is folded
Add fusion, obtain a bad superimposed image, the corresponding flame of the bad superimposed image is by first parent panel and institute
The flame for stating the second parent panel summarizes to obtain.
In the embodiment of the present invention, the bad detection image for belonging to multiple sub- display panels of same parent panel is spelled
It connects, obtains the bad stitching image of parent panel, then, the bad stitching image of multiple relevant parent panels is overlapped, is obtained
To bad superimposed image, since the corresponding flame of bad superimposed image is summarized by the flame of multiple parent panels
It arrives, it is thus possible to embody the bad performance on parent panel of panel of big data quantity.
The method of the embodiment of the present invention is simple and effective, can intuitively obtain the bad appearance of parent panel, bad position, no rapidly
The information such as good penetrability, undesirable concentration, greatly improve bad analysis efficiency and accuracy, so as to according to bad analysis
As a result timely technique, equipment adjustment are carried out, product yield is promoted, improves shipment quality, contain loss due to spoiled work.
For convenience of viewing, the method for the embodiment of the present invention can also include: that display is loaded with the bad superimposed image pair
The bad superimposed image of the related content for the flame answered.
The related content of so-called flame, including undesirable type, undesirable location information and undesirable statistics letter
Contents, the undesirable statistical informations such as breath include the information such as undesirable incidence.
Specifically, the related content of all types of flames can be loaded on the bad superimposed image of display.
It is of course also possible to certain flames to be resolved are loaded as needed, and non-load all types of bad letters
Breath.Thus, the method for the embodiment of the present invention can also comprise determining that flame type to be resolved;Display is loaded with described
The bad superimposed image of the related content of flame to be resolved.So that only needle in the bad superimposed image of display
The related content that flame to be resolved is shown to property avoids other unwanted flames from interrupting the view.
In the embodiment of the present invention, each sub- display panel to be detected can be examined by automatic optical detecting system
It surveys, obtains the bad detection image of each sub- display panel, then store the bad detection image of each sub- display panel, to
Used when the analysis of display panel flame.
Citing is illustrated below.
Referring to FIG. 2, Fig. 2 is the process signal of the analysis method of the display panel flame of the embodiment of the present invention two
Figure, the analysis method include:
Bad detection-phase:
Step 21: sub- display panel to be detected being detected by automatic optical detecting system, has been detected
The bad detection image of sub- display panel;
The bad detection image includes the flame of the sub- display panel detected;
The flame includes: undesirable type, undesirable quantity, bad coordinate on sub- display panel etc..
Step 22: the bad detection image of the storage sub- display panel detected.
The bad analysis phase:
Step 23: determining that the sub- display panel of to be resolved first, the first sub- display panel belong to the first parent panel;
The first sub- display panel to be resolved can be with high-incidence badness and/or the undesirable sub- display of specificity
Panel.
Step 24: from the bad detection image of the storage sub- display panel detected, extracting described the of storage
The bad detection image of one sub- display panel, and the second of first parent panel is belonged to the described first sub- display panel
The bad detection image of sub- display panel;
The quantity of the second sub- display panel can be one or more.The second sub- display panel is the first parent panel
In other sub- display panels in addition to the first sub- display panel.
Step 25: bad detection image and the second sub- display panel to the first sub- display panel got are not
Good detection image is spliced, and the bad stitching image of first parent panel, the bad splicing of first parent panel are obtained
The corresponding flame of image is summarized to obtain by the flame of the described first sub- display panel and the second sub- display panel;
Step 26: obtaining the bad stitching image with the described first sub- associated second parent panel of display panel, wherein institute
The acquisition process for stating the bad stitching image of the second parent panel is similar with step 24 and step 25 process, that is, extracts the second parent panel
Each sub- display panel bad detection image, then spliced.
Step 27: the bad stitching image of the bad stitching image of first parent panel and second parent panel is folded
Add fusion, obtain a bad superimposed image, the corresponding flame of the bad superimposed image is by first parent panel and institute
The flame for stating the second parent panel summarizes to obtain.
In the embodiment of the present invention, the bad detection image corresponding one of each sub- display panel detected of storage is only
One number, so as to when carrying out the analysis of flame of display panel, unique number by sub- display panel is from depositing
Quick-searching is to sub- display panel to be resolved in the database of storage.It meanwhile further including that the son is aobvious in the number of sub- display panel
Show the identification information of parent panel belonging to panel, thus according to the identification information of the parent panel in the number, from the data of storage
Other the sub- display panels for belonging to same parent panel with sub- display panel to be resolved are retrieved in library, to carry out sub- display surface
The splicing of the bad detection image of plate, obtains the stitching image of parent panel.
Referring to FIG. 5, Fig. 5 is the number schematic diagram of the sub- display panel of one embodiment of the invention, it is each in the embodiment
The number of sub- display panel has 14, in which:
The 1-11 sequence numbers (GLASS ID) for sub- display panel.Belonging to capable of being embodied in the sequence number of sub- display panel
Parent panel mark.
12nd type for sub- display panel is single Panel (single sub- display panel) or Q-panel, Q-
Panle refers to for a parent panel being cut into several small pieces, every containing several small single panel, it is such just to be cried per a piece of
It is Q-panel.
13rd and the 14th is position of the sub- display panel in parent panel.Wherein, the 13rd is sub- display panel place
Row (Panel Rows), naming rule can be A~Z row, 0~9 row.14th is column (Panel where sub- display panel
Columns), naming rule can be A~Z column, 0~9 column.
In the embodiment of the present invention, a sub- display panel and other sub- display panels for belonging to a parent panel with it are being carried out
When the extraction of bad detection image, it can determine according to 1-12 in the number of the sub- display panel and belong to a mother with it
The number of other sub- display panels of panel, and according to the number of each sub- display panel, extract the bad inspection of each sub- display panel
Altimetric image.
Certainly, in some other embodiment of the invention, the number of sub- display panel can also be advised using other names
Then, no longer illustrate one by one herein.
That is, the bad detection image of the described first sub- display panel of storage is extracted in above-mentioned steps 24, and
The bad detection image for belonging to the second sub- display panel of first parent panel with the described first sub- display panel can have
Body includes:
Step 241: according to the number of the described first sub- display panel, retrieving and belonged to the described first sub- display panel
The number of second sub- display panel of first parent panel;
Step 242: according to the number of the described first sub- display panel and the second sub- display panel, it is aobvious to extract first son
Show the bad detection image of panel and the second sub- display panel.
It is further preferred that can also include that the sub- display panel detected exists in the number of the sub- display panel
The location information in parent panel belonging to it, so as to according to the location information to belonging to each sub-panel of a parent panel not
Good detection image is spliced.
That is, in above-mentioned steps 25, the bad detection image to the first sub- display panel got and described
The step of bad detection image of two sub- display panels is spliced, and the bad stitching image of first parent panel is obtained can be with
Include:
Step 251: according to indicated its in the number of the described first sub- display panel and the second sub- display panel
Location information in first parent panel determines the described first sub- display panel and the second sub- display panel described
Position in one parent panel;
Step 252: according to the described first sub- display panel and the second sub- display panel in first parent panel
Position, the bad detection image of bad detection image and the second sub- display panel to the described first sub- display panel into
Row splicing, obtains the bad stitching image of first parent panel.
Referring to FIG. 6, Fig. 6 is the joining method signal of the bad detection image of the sub- display panel of one embodiment of the invention
Figure, from fig. 6 it can be seen that carrying its position letter in affiliated parent panel in the number (Panel ID) of each sub- display panel
Breath, as shown in the Panel ID table in Fig. 6, AA (A Row, 1Column), AB (A Row, 2Column), CA (C Row,
1Column) etc., according to the location information in the number of each sub- display panel, the bad detection image of each sub-panel is spelled
It connects, obtains the bad stitching image of a complete parent panel, as shown in the right views of Fig. 6 arrow meaning.
In the embodiment of the present invention, the flame of sub- display panel includes the bad in the sub- display surface of the sub- display panel
Coordinate information on plate is needed when the bad detection image to each sub- display panel for belonging to same parent panel is spliced
By the bad coordinate information on the sub- display panel of each sub- display panel, the bad coordinate in parent panel is converted to
Information.
That is, in above-described embodiment, the step of the bad stitching image for obtaining the first parent panel further include: according to described
The coordinate of first sub- display panel and the flame in the second sub- display panel, the first sub- display panel and described
Position of the second sub- display panel in first parent panel, the first sub- display panel and the second sub- display panel
Size, the cutting parameter of the size of first parent panel and first parent panel in cutting technique, by bad in institute
State the coordinate information in the first sub- display panel and the second sub- display panel be converted to it is bad on first parent panel
Coordinate information.
Referring to FIG. 7, Fig. 7 be one embodiment of the invention the bad coordinate information on sub- display panel be converted to it is bad
The schematic diagram of coordinate information on parent panel, it can be seen from figure 7 that by the bad coordinate information on sub- display panel
When (x, y) is converted to bad coordinate information (x', the y') on parent panel, need to consider position of the sub- display panel in parent panel
It sets (i.e. the position Map), the size of sub- display panel, cutting parameter of the size and parent panel of parent panel in cutting technique
(Dummy width).
Referring to FIG. 3, Fig. 3 is the process signal of the analysis method of the display panel flame of the embodiment of the present invention four
Figure, the analysis method include:
Bad detection-phase:
Step 31: sub- display panel to be tested being tested using automatic optical detecting system, has been tested
The bad detection image of sub- display panel;
It include the flame of sub- display panel in the bad detection image.
The flame includes: undesirable type, undesirable quantity and bad coordinate on sub- display panel etc..
Step 32: will have been tested by P-CIM (Probe CIM, computer integrated manufacturing system information management system) system
The bad detection image of sub- display panel is uploaded in the corresponding file site of File Server (file server) and stores.
The bad detection image of the sub- display panel of each storage corresponding one numbers (panel ID), wraps in the panel ID
The location information of the identification information of first parent panel and sub- display panel in parent panel belonging to enclosed tool display panel.
Panel ID may refer to Fig. 5.
The bad analysis phase:
Step 33: by BO (data information report) system to the bad of the File Server each sub- display panel stored
Detection image is analyzed, and the panel ID of high-incidence badness or the undesirable first sub- display panel of specificity is obtained.
Step 34: inputting the panel ID of the sub- display panel of to be resolved first;
Step 35: being retrieved in File Server and other associated sub- display panels of the described first sub- display panel
Panel ID;
It include: to belong to sub- display panel to be resolved with other associated sub- display panels of sub- display panel to be resolved
The sub- display panel of the second of same parent panel, and it is identical as parent panel product type belonging to sub- display panel to be resolved,
And there are similar high-incidence badness or the undesirable sub- display panel of specificity and its other the sub- display panels for belonging to a parent panel.
Specifically, according to the identification information of the affiliated parent panel carried in the panel ID of the first sub- display panel, really
The panel ID of fixed the second sub- display panel for belonging to same parent panel with the first sub- display panel.
According to bad, the determining and to be resolved sub- display panel institute of the high-incidence badness of the first sub- display panel or specificity
The parent panel product type of category is identical, and has similar high-incidence badness or the undesirable sub- display panel of specificity and its belong to one
Other sub- display panels of parent panel.
Step 36: extracted from File Server with the first sub- display panel and closed with the described first sub- display panel
The bad detection image of other sub- display panels of connection;
Step 37: according to location information of the sub- display panel carried in panel ID in parent panel, to the category of extraction
Spliced in the bad detection image of each sub- display panel of same parent panel, obtains the bad spliced map of multiple parent panels
Picture.
When splicing to the bad detection image of each sub- display panel, need to by the bad seat in sub- display panel
Mark is converted to the coordinate in parent panel.
Step 38: fusion treatment being overlapped to the bad stitching image for multiple parent panels that splicing obtains, obtains one not
Good superimposed image.
Step 39: determining flame type to be resolved;
Specifically, a selection interface can be provided, all types of flames are shown in selection interface, and provide hook
Mode is selected, to choose to flame to be resolved.
Step 310: display is loaded with the bad superimposed image of the related content of the flame to be resolved.
That is, only indicating the related content of flame to be resolved, not in the bad superimposed image of display
It shows other kinds of flame, so as to be checked for specific flame, vision is avoided to interfere.
In addition, step 39 and step 310 can repeat, it can repeatedly select to need to parse as needed bad
Information.
In above-described embodiment, in bad detection-phase, each sub- display panel is obtained not by automatic optical detecting system
Then good detection image stores the bad detection image of each sub- display panel, aobvious in the bad analysis phase, then by each son
Show that the bad detection image of panel is spliced, obtains the bad stitching image of parent panel.Certainly, of the invention some other
In embodiment, just the bad detection image of each sub- display panel can also be spliced, obtain generatrix in bad detection-phase
The bad stitching image of plate, and the bad stitching image of parent panel is stored, in the bad analysis phase, directly not using parent panel
Good stitching image is analyzed.
Citing is illustrated below.
Referring to FIG. 4, Fig. 4 is the process signal of the analysis method of the display panel flame of the embodiment of the present invention three
Figure, the analysis method include:
Bad detection-phase:
Step 41: sub- display panel to be detected being detected using automatic optical detecting system, has been detected
The bad detection image of sub- display panel;
The bad detection image includes the flame of the sub- display panel detected;
The flame includes: undesirable type, undesirable quantity, bad coordinate on sub- display panel etc..
Step 42: the bad detection image for belonging to the sub- display panel of same parent panel respectively detected is spliced,
Obtain the bad stitching image of parent panel;
Step 43: storing the bad stitching image of parent panel.
The bad analysis phase:
Step 44: determining the first parent panel to be resolved;
Step 45: from the bad stitching image of the parent panel of storage, extracting the bad spelling of the first parent panel to be resolved
Map interlinking picture;
Step 46: from the bad stitching image of the parent panel of storage, extracting and first parent panel associated second
The bad stitching image of parent panel.
Step 47: the bad stitching image of the bad stitching image of first parent panel and second parent panel is folded
Add fusion, obtain a bad superimposed image, the corresponding flame of the bad superimposed image is by first parent panel and institute
The flame for stating the second parent panel summarizes to obtain.
In the embodiment of the present invention, the corresponding unique number of the bad stitching image of each parent panel of storage, so as to
Carry out display panel flame analysis when, by the unique number of parent panel from the database of storage quick-searching
To required parent panel.
The present invention implement in bad detection-phase, the joining method of the bad detection image of sub- display panel can be with
Referring to the joining method of embodiment two, i.e., the bad detection image of each sub- display panel also corresponds to a unique number, thus root
The splicing of sub- display panel is carried out according to the number.
In above-described embodiment, the additive fusion method of the first parent panel and the second parent panel may refer to shown in Fig. 8 attached
Figure, as can be seen from Figure 8, summarizes the first parent panel and the second parent panel in the bad superimposed image obtained after additive fusion
Flame.
In the bad superimposed image obtained, due to the flame including multiple parent panels, thus big data can be embodied
The bad bad appearance on parent panel of the panel of amount, and each undesirable position coordinates can be accurately positioned, in addition, can also be according to need
The problems such as identifying undesirable concentration information, effectively analyzing bad correlation, penetrability.
So-called concentration information is the bad ratio occurred in region.So-called penetrability refers to the bad pattern on mother substrate
Each sub- display panel areas is continuously appeared in, i.e., undesirable complete pattern is through how many sub- display panels.
Referring to FIG. 9, Fig. 9 is the schematic diagram of the bad superimposed image of the display of one embodiment of the invention, from shown in Fig. 9
It is identified in bad superimposed image: undesirable type (such as P/T Gap, scratching), undesirable position (a, b in figure, c, d),
Undesirable incidence, undesirable penetrability (through content shown in the dotted line of four sub- display panels in figure).
In figure, a indicates the distance of the bad side GP apart from parent panel certain Mura;
B indicates the bad spacing distance on the direction GP of these two types Mura;
The distance of the c mark side Mura badness distance GPO;
D mark scratch it is bad in the side GPO final position at a distance from the side DPO.
The side GP, GPO, DP, DPO is that liquid crystal display panel manufacturing calls the definition on four side of parent panel, with Glass
Circuit signal source Mask and glass Mark is position reference.
Display panel in above-described embodiment can be liquid crystal display panel.
Based on the same inventive concept, the embodiment of the present invention also provides a kind of analytical equipment of display panel flame, packet
It includes:
Module is obtained, it is associated for obtaining the bad stitching image of the first parent panel, and with first parent panel
The bad stitching image of second parent panel, wherein the bad stitching image of parent panel is by belonging to each sub- display surface of the parent panel
The bad detection image of plate is spliced, and the corresponding flame of bad stitching image of parent panel is by belonging to each of the parent panel
The flame of sub- display panel summarizes to obtain;
Additive fusion module, for by the bad of the bad stitching image of first parent panel and second parent panel
Stitching image additive fusion, obtains a bad superimposed image, and the corresponding flame of the bad superimposed image is by described first
The flame of parent panel and second parent panel summarizes to obtain.
Preferably, further includes:
Selecting module, for determining flame type to be resolved;
Display module, for showing the bad stacking chart for being loaded with the related content of the flame to be resolved
Picture.
Preferably, further includes:
Automatic optics inspection module, for being detected to sub- display panel to be detected, the son display detected
The bad detection image of panel;
Memory module, for storing the bad detection image of the sub- display panel detected.
In one embodiment of this invention, the acquisition module is specifically used for:
Determine that the sub- display panel of to be resolved first, the first sub- display panel belong to first parent panel;
From the bad detection image of the sub- display panel detected described in storage, first son for extracting storage is aobvious
Show that the bad detection image of panel, and the second son for belonging to first parent panel with the described first sub- display panel are shown
The bad detection image of panel;
The bad detection of bad detection image and the second sub- display panel to the first sub- display panel got
Image is spliced, and the bad stitching image of first parent panel, the bad stitching image pair of first parent panel are obtained
The flame answered is summarized to obtain by the flame of the described first sub- display panel and the second sub- display panel.
Preferably, the corresponding unique number of bad detection image of each sub- display panel detected of storage,
Identification information comprising parent panel belonging to the sub- display panel detected in the number;
It is described extract storage the described first sub- display panel bad detection image, and with the described first sub- display surface
Plate belongs to the step of bad detection image of the second sub- display panel of first parent panel and includes:
According to the number of the described first sub- display panel, retrieves and belong to described first with the described first sub- display panel
The number of the sub- display panel of the second of parent panel;
According to the number of the described first sub- display panel and the second sub- display panel, extract the first sub- display panel and
The bad detection image of the second sub- display panel.
Preferably, the position in the parent panel in the number also comprising the sub- display panel detected belonging to it
Information;
The acquisition module is used for:
According to indicated its described first in the number of the described first sub- display panel and the second sub- display panel
Location information in parent panel determines the described first sub- display panel and the second sub- display panel in first parent panel
In position;
It is right according to the position of the described first sub- display panel and the second sub- display panel in first parent panel
The bad detection image of the first sub- display panel and the bad detection image of the second sub- display panel are spliced, and are obtained
To the bad stitching image of first parent panel.
Preferably, the flame of sub- display panel includes the bad coordinate information in sub- display panel, the acquisition
Module is also used to:
According to the coordinate of the flame in the described first sub- display panel and the second sub- display panel, described first
The position of sub- display panel and the second sub- display panel in first parent panel, the first sub- display panel and institute
State the size of the second sub- display panel, the cutting of the size of first parent panel and first parent panel in cutting technique
Parameter is converted to the bad coordinate information in the described first sub- display panel and the second sub- display panel bad in institute
State the coordinate information on the first parent panel.
In another embodiment of the invention, the analytical equipment further include:
Detection module, for detecting to sub- display panel to be detected, the sub- display panel detected is not
Good detection image;
Splicing module is carried out for that will belong to the bad detection image of the sub- display panel respectively detected of same parent panel
Splicing, obtains the bad stitching image of parent panel;
Memory module, for storing the bad stitching image of parent panel.
Preferably, the acquisition module is used for:
Determine the first parent panel to be resolved;
From the bad stitching image of the parent panel of storage, the bad stitching image of the first parent panel to be resolved is extracted.
The above is a preferred embodiment of the present invention, it is noted that for those skilled in the art
For, without departing from the principles of the present invention, it can also make several improvements and retouch, these improvements and modifications
It should be regarded as protection scope of the present invention.
Claims (10)
1. a kind of analysis method of display panel flame characterized by comprising
Obtain the bad stitching image of the first parent panel, and the bad spelling with associated second parent panel of first parent panel
Map interlinking picture, wherein the bad stitching image of parent panel is spelled by the bad detection image for belonging to each sub- display panel of the parent panel
It connects, the corresponding flame of bad stitching image of parent panel is by belonging to the bad letter of each sub- display panel of the parent panel
Breath summarizes to obtain;
By the bad stitching image additive fusion of the bad stitching image of first parent panel and second parent panel, obtain
One bad superimposed image, the corresponding flame of the bad superimposed image is by first parent panel and second parent panel
Flame summarize to obtain.
2. the analysis method of display panel flame according to claim 1, which is characterized in that described by described first
The bad stitching image additive fusion of the bad stitching image of parent panel and second parent panel, obtains a bad superimposed image
The step of after further include:
Determine flame type to be resolved;
Display is loaded with the bad superimposed image of the related content of the flame to be resolved.
3. the analysis method of display panel flame according to claim 1, which is characterized in that described to obtain the first mother
Before the step of bad stitching image of panel further include:
Sub- display panel to be detected is detected by automatic optical detecting system, the sub- display panel detected
Bad detection image;
The bad detection image of the storage sub- display panel detected.
4. the analysis method of display panel flame according to claim 3, which is characterized in that described to obtain the first mother
The step of bad stitching image of panel includes:
Determine that the sub- display panel of to be resolved first, the first sub- display panel belong to first parent panel;
From the bad detection image of the sub- display panel detected described in storage, the described first sub- display surface of storage is extracted
The bad detection image of plate, and belong to the described first sub- display panel the second sub- display panel of first parent panel
Bad detection image;
The bad detection image of bad detection image and the second sub- display panel to the first sub- display panel got
Spliced, obtain the bad stitching image of first parent panel, the bad stitching image of first parent panel is corresponding
Flame is summarized to obtain by the flame of the described first sub- display panel and the second sub- display panel.
5. the analysis method of display panel flame according to claim 4, which is characterized in that storage it is each described
The bad detection image of the sub- display panel detected corresponds to a unique number, shows in the number comprising the son detected
Show the identification information of parent panel belonging to panel;
The bad detection image of the described first sub- display panel for extracting storage, and it is same with the described first sub- display panel
The step of belonging to the bad detection image of the second sub- display panel of first parent panel include:
According to the number of the described first sub- display panel, retrieves and belong to first generatrix with the described first sub- display panel
The number of the sub- display panel of the second of plate;
According to the number of the described first sub- display panel and the second sub- display panel, the first sub- display panel and described is extracted
The bad detection image of second sub- display panel.
6. the analysis method of display panel flame according to claim 5, which is characterized in that also wrapped in the number
The location information in parent panel containing the sub- display panel detected belonging to it;
It is described obtain the first parent panel bad stitching image the step of include:
According to its described first generatrix indicated in the number of the described first sub- display panel and the second sub- display panel
Location information in plate determines the described first sub- display panel and the second sub- display panel in first parent panel
Position;
According to the position of the described first sub- display panel and the second sub- display panel in first parent panel, to described
The bad detection image of first sub- display panel and the bad detection image of the second sub- display panel are spliced, and institute is obtained
State the bad stitching image of the first parent panel.
7. the analysis method of display panel flame according to claim 6, which is characterized in that sub- display panel is not
The step of good information includes the bad coordinate information in sub- display panel, the bad stitching image for obtaining the first parent panel
Further include:
According to the coordinate of the flame in the described first sub- display panel and the second sub- display panel, first son is aobvious
Show the position of panel and the second sub- display panel in first parent panel, the first sub- display panel and described
The size of two sub- display panels, the cutting ginseng of the size of first parent panel and first parent panel in cutting technique
Number, the bad coordinate information in the described first sub- display panel and the second sub- display panel is converted to bad described
Coordinate information on first parent panel.
8. the analysis method of display panel flame according to claim 1, which is characterized in that described to obtain the first mother
Before the step of bad stitching image of panel further include:
Sub- display panel to be detected is detected using automatic optical detecting system, the sub- display panel detected
Bad detection image;
The bad detection image for belonging to the sub- display panel of same parent panel respectively detected is spliced, parent panel is obtained
Bad stitching image;
Store the bad stitching image of parent panel.
9. the analysis method of display panel flame according to claim 8, which is characterized in that described to obtain the first mother
The step of bad stitching image of panel includes:
Determine the first parent panel to be resolved;
From the bad stitching image of the parent panel of storage, the bad stitching image of the first parent panel to be resolved is extracted.
10. a kind of analytical equipment of display panel flame characterized by comprising
Obtain module, for obtaining the bad stitching image of the first parent panel, and with first parent panel associated second
The bad stitching image of parent panel, wherein the bad stitching image of parent panel is by belonging to each sub- display panel of the parent panel
Bad detection image is spliced, and the corresponding flame of bad stitching image of parent panel is aobvious by each son for belonging to the parent panel
Show that the flame of panel summarizes to obtain;
Additive fusion module, for by the bad splicing of the bad stitching image of first parent panel and second parent panel
Image superposition fusion, obtains a bad superimposed image, and the corresponding flame of the bad superimposed image is by first generatrix
The flame of plate and second parent panel summarizes to obtain.
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CN110837717B (en) * | 2019-11-06 | 2022-09-06 | 成都数之联科技股份有限公司 | Map-based glass panel multi-defect root cause analysis method |
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Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6172410B1 (en) * | 1998-07-14 | 2001-01-09 | Sharp Kabushiki Kaisha | Collective substrate of active-matrix substrates, manufacturing method thereof and inspecting method thereof |
CN101750554A (en) * | 2008-12-12 | 2010-06-23 | 北京京东方光电科技有限公司 | Array substrate detection circuit and detection method |
CN102681224A (en) * | 2012-04-25 | 2012-09-19 | 京东方科技集团股份有限公司 | Liquid crystal display (LCD) screen detection device and method |
CN104792263A (en) * | 2015-04-20 | 2015-07-22 | 合肥京东方光电科技有限公司 | Method and device for determining to-be-detected area of display mother board |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI328704B (en) * | 2006-04-07 | 2010-08-11 | Chimei Innolux Corp | Panel used in liquid crystal display |
-
2017
- 2017-01-04 CN CN201710003418.1A patent/CN106501978B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6172410B1 (en) * | 1998-07-14 | 2001-01-09 | Sharp Kabushiki Kaisha | Collective substrate of active-matrix substrates, manufacturing method thereof and inspecting method thereof |
CN101750554A (en) * | 2008-12-12 | 2010-06-23 | 北京京东方光电科技有限公司 | Array substrate detection circuit and detection method |
CN102681224A (en) * | 2012-04-25 | 2012-09-19 | 京东方科技集团股份有限公司 | Liquid crystal display (LCD) screen detection device and method |
CN104792263A (en) * | 2015-04-20 | 2015-07-22 | 合肥京东方光电科技有限公司 | Method and device for determining to-be-detected area of display mother board |
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