CN106357268A - Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC - Google Patents

Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC Download PDF

Info

Publication number
CN106357268A
CN106357268A CN201610871262.4A CN201610871262A CN106357268A CN 106357268 A CN106357268 A CN 106357268A CN 201610871262 A CN201610871262 A CN 201610871262A CN 106357268 A CN106357268 A CN 106357268A
Authority
CN
China
Prior art keywords
logic circuit
output
latch
input
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201610871262.4A
Other languages
Chinese (zh)
Other versions
CN106357268B (en
Inventor
杨文解
马颖江
李广湘
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Gree Electric Appliances Inc of Zhuhai
Original Assignee
Gree Electric Appliances Inc of Zhuhai
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gree Electric Appliances Inc of Zhuhai filed Critical Gree Electric Appliances Inc of Zhuhai
Priority to CN201610871262.4A priority Critical patent/CN106357268B/en
Publication of CN106357268A publication Critical patent/CN106357268A/en
Priority to PCT/CN2017/076301 priority patent/WO2018058900A1/en
Application granted granted Critical
Publication of CN106357268B publication Critical patent/CN106357268B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10Calibration or testing
    • H03M1/1009Calibration
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03MCODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12Analogue/digital converters
    • H03M1/34Analogue value compared with reference values
    • H03M1/38Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/462Details of the control circuitry, e.g. of the successive approximation register

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Analogue/Digital Conversion (AREA)

Abstract

According to the delay correction circuit of the comparator in the ADC, a logic circuit connected with a latch is arranged in a data register, and the logic circuit controls the latch to output a preset level signal within the initial preset time length of the current ADC clock period; after a preset duration, the output of the latch depends on the comparator output. Therefore, the latch of the corresponding bit can be enabled to forcibly output the level signal which is the same as the input signal at the initial stage of each ADC clock cycle, namely, the latch of the corresponding bit is ensured to output the assumed preset level signal without being influenced by the output delay of the comparator of the previous clock cycle, namely, the next bit conversion of the ADC is not influenced by the output delay of the comparison result of the previous bit, thereby ensuring the normal work of the ADC.

Description

Comparator delay correction circuit, method and adc in a kind of adc
Technical field
The application is related to analog-digital converter technical field, more particularly to a kind of adc (analog-to- Digital converter, A-D converter) comparator delay correction circuit, method and adc.
Background technology
Adc extensively applies in fields such as Industry Control, medical apparatus and instruments and microprocessor submodule translation interfaces, for inciting somebody to action Analogue signal is converted to digital signal.
Comparator is the important module in adc, the transmission delay of comparator be determine whole adc conversion speed important One of factor.
For example, sar (successive approximation register) type adc is to be compared by turn, i.e. each clock cycle can only compare one Secondary, n position then needs to compare n time.When the voltage infinite approach of two inputs of comparator, comparator output time delay is more than one Clock cycle, it will lead to adc the output of correct comparator cannot be detected, and then lead to the adc cannot normal work.
Refer to Fig. 1, be a kind of circuit structure schematic diagram of prior art sar adc, pa is the anti-phase input of comparator End, the output of input dac (digital-to-analog converter, digital-to-analog converter);Pb is the homophase input of comparator End, inputs analogue signal to be converted;Sar adc gradually comparand register highest will put 1 first, and instruction dac output is corresponding Voltage signal, to the inverting input of comparator, is carried out with the analog voltage signal vi to be converted of comparator in-phase input end input Relatively, if vi is more than the voltage signal of dac output, comparator is output as binary number " 1 ", conversely, comparator output two System number " 0 ".Compare to the last one successively, now, final latch data simultaneously exports, the data of final output is that vi corresponds to Digital signal.
Refer to Fig. 2, show the oscillogram of each key point in circuit shown in Fig. 1, adc_clk is the clock week of adc Phase, only compare once in each clock cycle;Pa is the oscillogram of the inverting input of comparator;Pb is that the homophase of comparator is defeated Enter the oscillogram at end;Comp is the oscillogram of the outfan of comparator;Cap_pulse is the control clock signal of trigger d1; Latch_pulse is the control clock signal of latch d2, when rising edge in latch_pulse pulse, triggers latch Latch the data of the q0 output of d1;As shown in Fig. 2 comp=1 in the upper clock cycle, in this clock cycle, the voltage at pa end Slightly larger than the voltage at pb end, and the voltage of pa and pb is closely, and in this case, the output of comparator should be comp= 0, but, comparator compares pa end and the size of pb terminal voltage took long enough more than a clock cycle;Now, d1 triggering Device detect comparator output actual when a upper clock cycle output comp=1, when latch_pulse pulse appearance rising Along when, d1 trigger by the data input of a upper clock cycle in latch d2, lead to latch d2 latch error in data, And then lead to the adc cannot normal work.
Content of the invention
In view of this, the application provides comparator delay correction circuit, method and adc in a kind of adc, is compared with solving to work as During the voltage infinite approach of two inputs input of device, analog digital conversion converting machine cannot normal work technical problem, this The application following technical scheme of offer:
In a first aspect, the present invention provides comparator delay correction circuit in a kind of analog-digital converter adc, described adc includes Digital to analog converter dac, comparator data depositor, described data register includes multistage latch;The first of described dac is defeated Enter the outfan that end connects described data register, the second input input reference voltage signal, outfan connects described comparison The inverting input of device, the in-phase input end of described comparator inputs voltage signal to be converted, comparator time delay school in described adc Positive circuit includes: logic circuit and clock generation circuit, and wherein, every grade of described latch connects a described logic circuit;
The outfan of the first input end described comparator of connection of each described logic circuit, the second of described logic circuit Input connects the first outfan of described clock generation circuit, and the outfan described logic circuit of connection of described logic circuit is same The control end of the described latch of one-level;The input input predetermined level signal of described latch, the clock of described latch Control end connects the second outfan of described clock generation circuit;
Described logic circuit, for controlling described latch to export in initial preset duration of current adc clock cycle Predetermined level signal, and after described preset duration, control the output of comparator described in described latches;
The input input adc clock cycle signal of described clock generation circuit, during described first outfan output first Clock signal, described second outfan output second clock signal.
Alternatively, described predetermined level signal is high level signal.
Alternatively, described latch is d trigger;
The input of described d trigger is the input of described latch, for inputting described predetermined level signal;Described The outfan of d trigger is the outfan of described latch, and the Clock control end of described d trigger is the clock of described latch Control end, the reset terminal of described d trigger is the control end of described latch.
Alternatively, described logic circuit includes NOR logic circuit;
The first input end of described NOR logic circuit is the first input end of described logic circuit, described NOR-logic electricity Second input on road is the second input of described logic circuit, and the outfan of described NOR logic circuit is described logic electricity The outfan on road.
Alternatively, described clock generation circuit includes pulse-generating circuit, and be connected with described pulse-generating circuit Delay circuit;
The input of described pulse-generating circuit is the input of described clock generation circuit, described pulse-generating circuit Outfan is the first outfan of described clock generation circuit, and the outfan of described delay circuit is described clock generation circuit Second outfan;
Described pulse-generating circuit, for producing the pulse signal of one fixed width according to described adc clock cycle signal;
Described delay circuit, for the pulse delay signal Preset Time output exporting described pulse-generating circuit.
Second aspect, the present invention provides a kind of analog-digital converter adc, comprising: digital to analog converter dac, comparator, data are posted Storage and logic circuit, described data register includes multistage latch, and every grade of described latch connects a described logic electricity Road;
The first input end of described dac connects the outfan of described data register, the second input input reference voltage Signal, outfan connects the inverting input of described comparator;The in-phase input end input voltage to be converted letter of described comparator Number;
The outfan of the first input end described comparator of connection of each described logic circuit, the second of described logic circuit Input connects the first outfan of described clock generation circuit, and the outfan described logic circuit of connection of described logic circuit is same The control end of the described latch of one-level;The input input predetermined level signal of described latch, the clock of described latch Control end connects the second outfan of described clock generation circuit;
Described logic circuit, for controlling described latch to export in initial preset duration of current adc clock cycle Predetermined level signal, and after described preset duration, control the output of comparator described in described latches;
The input input adc clock cycle signal of described clock generation circuit, during described first outfan output first Clock signal, described second outfan output second clock signal.
The third aspect, the present invention provides comparator time delay correction method in a kind of analog-digital converter adc, is applied in adc, Described adc includes digital to analog converter dac, comparator, data register and logic circuit, and described data register includes multistage lock Storage, every grade of described depositor corresponds to a described logic circuit;Methods described includes:
In initial preset duration within the current adc clock cycle, described logic circuit produces the first level signal, and will Described first level signal is supplied to the latch being in same one-level in described data register with described logic circuit, so that institute State latch and export predetermined level signal in described preset duration;
After initial preset duration of current adc clock cycle, described logic circuit is according to the output of described comparator Signal output second electrical level signal, and described second electrical level signal is supplied to described latch, so that described latch is in institute The output signal of described comparator is latched after stating preset duration.
Alternatively, described predetermined level signal is high level signal.
Alternatively, in described initial preset duration within the current adc clock cycle, described logic circuit produces the first electricity Ordinary mail number, comprising:
In initial preset duration of current adc clock cycle, the height that described logic circuit inputs according to first input end Level signal exports low level signal;
After the described preset duration initial in the current adc clock cycle, described logic circuit is according to described comparator Output signal exports second electrical level signal, comprising:
After initial preset duration of current adc clock cycle, when described comparator output high level signal, described Logic circuit exports low level signal;
After initial preset duration of current adc clock cycle, when described comparator output low level signal, described Logic circuit exports high level signal.
Alternatively, the output signal of described logic circuit inputs to the reset terminal of described latch, and methods described also includes:
After initial preset duration of current adc clock cycle, when described logic circuit output high level signal, control Make described latch output low level signal;When described logic circuit output low level signal, control described latch output High level signal.
Understand via above-mentioned technical scheme, compared with prior art, comparator time delay correction in the adc that the application provides Circuit, arranges the logic circuit being connected with latch in data register, and logic circuit is initial in the current adc clock cycle In preset duration, control latch output predetermined level signal;After preset duration, the output of latch depends on comparator Output.So, the starting stage in each adc clock cycle can make the latch of corresponding positions force output and input signal phase Same level signal, i.e. ensure that the latch of corresponding positions is output as the predetermined level signal of hypothesis and is not subject to a clock cycle Comparator export time delay impact, that is, adc next bit conversion by upper one bit comparison result output time delay do not affected, Thus ensureing adc normal work.
Brief description
In order to be illustrated more clearly that the embodiment of the present application or technical scheme of the prior art, below will be to embodiment or existing Have technology description in required use accompanying drawing be briefly described it should be apparent that, drawings in the following description be only this The embodiment of application, for those of ordinary skill in the art, on the premise of not paying creative work, can also basis The accompanying drawing providing obtains other accompanying drawings.
Fig. 1 shows a kind of circuit structure schematic diagram of existing sar adc;
Fig. 2 illustrates the oscillogram of each key point of circuit shown in Fig. 1;
Fig. 3 shows the schematic diagram of the comparator delay correction circuit in a kind of adc of the embodiment of the present application;
Fig. 4 shows a kind of specific adc circuit theory schematic diagram of the embodiment of the present invention;
Fig. 5 shows the corresponding waveform diagram of each key point of circuit shown in Fig. 4;
The flow chart that Fig. 6 shows comparator time delay correction method in a kind of adc of the embodiment of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present application, the technical scheme in the embodiment of the present application is carried out clear, complete Site preparation describes it is clear that described embodiment is only some embodiments of the present application, rather than whole embodiments.It is based on Embodiment in the application, it is every other that those of ordinary skill in the art are obtained under the premise of not making creative work Embodiment, broadly falls into the scope of the application protection.
Refer to Fig. 3, show the schematic diagram of the comparator delay correction circuit in a kind of adc of the embodiment of the present application, should Circuit is applied in sar adc, as shown in figure 3, this circuit includes digital analog converter (dac) 100, comparator 200, data Depositor 300 and clock generation circuit 400, each data register 300 includes multi-level register, and every grade of depositor all includes patrolling Collect circuit 310 and latch 320.
Data register 300, latches the output knot of comparator for being produced as the binary data of dac input, meanwhile Really;The flip flop number comprising in data register 300 is identical with the digit of adc.
Dac100, for the reference voltage v according to inputref, and the binary data of input, output is corresponding to simulate Voltage signal simultaneously inputs to the inverting input of comparator 200.
The in-phase input end of comparator 200 inputs voltage signal to be converted, and the voltage signal with inverting input input It is compared, obtain comparative result, the corresponding positions of data register 300 in comparative result latch.
Following is a brief introduction of the operation principle of adc:
First, it is assumed that highest order is binary one in data register 300, other positions are binary number " 0 ", and should Binary data is supplied to dac, so that dac exports corresponding analog voltage signal according to reference voltage.
For example, for 8 adc, assume that the highest order of data register 300 is " 1 " for the first time, then this latch In data be " 1,000 0000 " be supplied to dac100, if the reference voltage of dac100 input is vref, then dac100 is defeated The analog voltage going out is vref/2.
The voltage signal of dac100 output transmits to the inverting input of comparator 200, comparator 200 relatively electricity to be converted Pressure signal and the voltage signal of inverting input input, if voltage signal to be converted is more than the voltage signal of dac output, compare It is output as high level compared with device 200, and this high level is latched into the highest order of data register 300, i.e. data register is High-order is finally " 1 ";Whereas if voltage signal to be converted be less than dac output voltage signal, then comparator 200 export low Level, and this low level signal is latched into the highest order of data register 300, i.e. the highest order of data register 300 is final For " 0 ".
Then it is assumed that a time high position for data register 300 is " 1 ", repeat the process that above-mentioned highest order is " 1 ", finally Obtain time actual value of a high position.Repeat above-mentioned process by turn, the data in final data depositor is voltage pair to be converted The digital signal answered.
The present invention is that data register is improved, and when gradually comparing, when gradually comparing a certain position, this position is posted Storage is output as " 1 " in the preset duration of adc clock cycle, i.e. total energy ensures the input starting stage of next bit register Inside remain " 1 ", and be not subject to the comparative result delay of.
As shown in figure 3, every grade of depositor of data register 300 all includes a latch 320 and a logic circuit 310.
The outfan of comparator 200 connects the first input end of logic circuit 310, the second input of logic circuit 310 Input the first clock signal, the outfan of logic circuit 310 connects the control end of latch 320.The input of latch 320 is defeated Enter predetermined level signal, Clock control end inputs second clock signal.Latch 320 is used for providing preset number letter for dac100 Number, then, the output result of latched comparator.
Clock generation circuit 400 input inputs adc clock cycle signal, and the first outfan exports the first clock signal, Second outfan output second clock signal.
The corresponding logic circuit of present bit 310 exports corresponding level letter in adc clock cycle initial preset duration Number it is supplied to latch 320, so that latch 320 is output as predetermined level signal in preset duration;And, in preset duration Afterwards, the output of latch 400 depends on the output of described comparator 200.
In a kind of possible implementation of the present invention, predetermined level signal is high level signal, i.e. latch 320 Input input high level signal, makes the adc clock cycle after controlling clock to arrive for the latch 320 by logic circuit 300 Output high level signal in initial preset duration.After preset duration, the output of latch 320 depends on comparator 200 Output, if comparator 200 is output as high level signal, latch 320 exports high level signal;If comparator 200 is defeated Go out for low level signal, then latch 320 output low level signal.
Comparator delay correction circuit in the adc that the present embodiment provides, is arranged in data register and is connected with latch Logic circuit, logic circuit makes to export in adc clock cycle initial preset duration after controlling clock to arrive for the latch Input identical level signal with latch;After preset duration, the output of latch depends on comparator and exports.So, The latch that corresponding positions can be made in the starting stage of each adc clock cycle forces output and input signal identical level letter Number, i.e. ensure that the comparator that the latch of corresponding positions is output as the predetermined level signal assumed and is not subject to a clock cycle is defeated Go out the impact of time delay, that is, the next bit conversion of adc is not affected by a upper bit comparison result output time delay, thus ensureing adc Normal work.
Refer to Fig. 4, show a kind of specific adc circuit theory schematic diagram of the embodiment of the present invention, in the present embodiment, patrol Collecting circuit can make latch force to export high level signal in adc starting stage clock cycle.
As shown in figure 4, logic circuit is NOR logic circuit, latch is d trigger.
The outfan of dac connects the inverting input pa of comparator c, and the in-phase input end pb input of comparator c is to be converted Voltage signal, the outfan of comparator c connects an input of NOR logic circuit.
Another input input of NOR logic circuit has the first clock signal, and the outfan of NOR logic circuit connects The reset terminal clr of d trigger.This first clock signal is the pulse in the initial preset duration of adc clock cycle for high level Signal.
The input input high level signal vdd of d trigger, outfan q are the output of a certain position of adc;D trigger when Clock control end inputs second clock signal.
Preferably, clock generation circuit includes pulse-generating circuit 410 and delay circuit 420, pulse-generating circuit 410 Input input has adc clock cycle signal, and the outfan of pulse-generating circuit 410 connects the input of delay circuit 420, with When, the outfan of pulse-generating circuit 410 exports the first clock signal;The outfan output second clock letter of delay circuit 420 Number.That is, second clock signal than the first clock signal delayed a period of time.
Refer to Fig. 5, show the corresponding waveform diagram of each key point of circuit shown in Fig. 4, this Figure only shows one Each signal waveform of individual adc clock cycle.
Adc_clk is the clock cycle of adc, only compares once in each clock cycle;Pa is the anti-phase input of comparator c The oscillogram at end;Pb is the oscillogram of the in-phase input end of comparator c;Comp is the oscillogram of the outfan of comparator c;cap_ Pulse is the control clock signal of d trigger, and cap_pulse0 is the first clock signal of NOR logic circuit input;
In conjunction with Fig. 4 and Fig. 5, between adc_clk is for high period, t0-t2 time period cap_pulse0 is high level, even One input of logical not component is " 1 ", and now, no matter comp is high level or low level, and NOR logic circuit exports It is always low level;Now, the clr of d trigger inputs as low level, wherein, the clr end of d trigger be high level effectively (i.e., When clr end input high level, d trigger outfan is output as " 0 "), therefore, the outfan q of d trigger remains input Level signal vdd, i.e. within the t0-t2 time period, regardless of the output of comparator, the output of d trigger is all vdd.
After instant t 2, cap_pulse0 is low level, and that is, NOR logic circuit a input is " 0 ", now, The output of NOR logic circuit depends on another input (comp);If comp is high level, NOR logic circuit is defeated Go out for low level, clr end inputs as low level, d trigger outfan is identical with its input, is high level vdd;If comp For low level, then NOR logic circuit is output as high level, the level of the clr end input of d trigger effectively, therefore, d trigger It is output as " 0 ".It can be seen that after the t2 moment, the output of d trigger depends on the output comp of comparator, if comp is high electricity Flat, then d trigger output high level;If comp is low level, d trigger exports low level, i.e. using d trigger lock Deposit the output result of comparator.
Preferably, cap_pulse than cap_pulse0 delayed a period of time (that is, t1-t0), this lag time difference in order to Ensure that the output signal of NOR logic circuit is transferred to d trigger.
Comparator delay correction circuit in the adc that the present embodiment provides, controls latch in adc clock using logic circuit In cycle initial preset duration, output and latch input identical level signal;After preset duration, latch defeated Go out depending on comparator output.So, the starting stage in each adc clock cycle can make the latch pressure of corresponding positions defeated Go out and input signal identical level signal, i.e. ensure that the latch of corresponding positions is output as the predetermined level signal assumed, and not Comparator output time delay by a upper clock cycle is affected, that is, the next bit conversion of adc is not subject to a bit comparison result defeated Go out the impact of time delay, thus ensureing adc normal work.
Corresponding to comparator delay correction circuit embodiment in above-mentioned adc, present invention also offers comparator prolongs in adc When bearing calibration embodiment.
Refer to Fig. 6, the flow chart showing comparator time delay correction method in a kind of adc of the embodiment of the present invention, the party Method is applied in comparator delay correction circuit in above-mentioned adc, and described adc includes dac, comparator, data register and patrols Collect circuit, described data register includes multistage latch, every grade of described depositor corresponds to a described logic circuit;Described side Method includes:
S110, in initial preset duration within the current adc clock cycle, described logic circuit produces the first level letter Number, and described first level signal is supplied to the latch being in same one-level in described data register with described logic circuit Device, so that described latch exports predetermined level signal in described preset duration.
In a kind of possible implementation of the present invention, described predetermined level signal is high level signal.
In initial preset duration of current adc clock cycle, the height that described logic circuit inputs according to first input end Level signal exports low level signal.
S120, after initial preset duration of current adc clock cycle, described logic circuit is according to described comparator Output signal exports second electrical level signal, and described second electrical level signal is supplied to described latch, so that described latch The output signal of described comparator is latched after described preset duration.
After initial preset duration of current adc clock cycle, when described comparator output high level signal, described Logic circuit exports low level signal, and described latch exports high level signal;When described comparator output low level signal, Described logic circuit exports high level signal, and described latch exports low level signal.
Comparator time delay correction method in the adc that the present embodiment provides, is arranged in data register and is connected with latch Logic circuit, in initial preset duration of current adc clock cycle, logic circuit controls latch output predetermined level letter Number;After preset duration, the output of latch depends on comparator and exports.So, in the initial rank of each adc clock cycle Duan Douneng makes the latch of corresponding positions force output and input signal identical level signal, i.e. ensure the latch of corresponding positions It is output as the predetermined level signal of hypothesis and do not affected by the comparator output time delay of a upper clock cycle, that is, under adc One conversion is not affected by a upper bit comparison result output time delay, thus ensureing adc normal work.
For aforesaid each method embodiment, in order to be briefly described, therefore it is all expressed as a series of combination of actions, but It is that those skilled in the art should know, the application is not limited by described sequence of movement, because according to the application, certain A little steps can be carried out using other orders or simultaneously.Secondly, those skilled in the art also should know, is retouched in description The embodiment stated belongs to preferred embodiment, necessary to involved action and module not necessarily the application.
In this specification, each embodiment is described by the way of going forward one by one, and what each embodiment stressed is and other The difference of embodiment, between each embodiment identical similar portion mutually referring to.For device disclosed in embodiment For, because it corresponds to the method disclosed in Example, so description is fairly simple, say referring to method part in place of correlation Bright.
Last in addition it is also necessary to explanation, herein, such as first and second or the like relational terms be used merely to by One entity or operation are made a distinction with another entity or operation, and not necessarily require or imply these entities or operation Between there is any this actual relation or order.And, term " inclusion ", "comprising" or its any other variant meaning Covering comprising of nonexcludability, so that including a series of process of key elements, method, article or equipment not only include that A little key elements, but also include other key elements being not expressly set out, or also include for this process, method, article or The intrinsic key element of equipment.In the absence of more restrictions, the key element being limited by sentence "including a ...", does not arrange Remove and also there is other identical element in the process including described key element, method, article or equipment.
For convenience of description, it is divided into various units to be respectively described with function when describing apparatus above.Certainly, implementing this The function of each unit can be realized in same or multiple softwares and/or hardware during application.
As seen through the above description of the embodiments, those skilled in the art can be understood that the application can Mode by software plus necessary general hardware platform to be realized.Based on such understanding, the technical scheme essence of the application On in other words prior art is contributed partly can be embodied in the form of software product, this computer software product Can be stored in storage medium, such as rom/ram, magnetic disc, CD etc., include some instructions use so that a computer equipment (can be personal computer, server, or network equipment etc.) executes some of each embodiment of the application or embodiment Partly described method.
Described above to the disclosed embodiments, makes professional and technical personnel in the field be capable of or uses the application. Multiple modifications to these embodiments will be apparent from for those skilled in the art, as defined herein General Principle can be realized in the case of without departing from spirit herein or scope in other embodiments.Therefore, the application It is not intended to be limited to the embodiments shown herein, and be to fit to and principles disclosed herein and features of novelty phase one The scope the widest causing.

Claims (10)

1. comparator delay correction circuit in a kind of analog-digital converter adc, described adc include digital to analog converter dac, comparator and Data register, described data register includes multistage latch;The first input end of described dac connects described data register Outfan, the second input input reference voltage signal, outfan connect described comparator inverting input, described comparison The in-phase input end of device inputs voltage signal to be converted it is characterised in that comparator delay correction circuit includes in described adc: Logic circuit and clock generation circuit, wherein, every grade of described latch connects a described logic circuit;
The first input end of each described logic circuit connects the outfan of described comparator, the second input of described logic circuit End connects the first outfan of described clock generation circuit, and the outfan of described logic circuit connects the same one-level of described logic circuit Described latch control end;The input input predetermined level signal of described latch, the clock control of described latch End connects the second outfan of described clock generation circuit;
Described logic circuit, for controlling the output in initial preset duration of current adc clock cycle of described latch default Level signal, and after described preset duration, control the output of comparator described in described latches;
The input input adc clock cycle signal of described clock generation circuit, described first outfan output the first clock letter Number, described second outfan output second clock signal.
2. circuit according to claim 1 is it is characterised in that described predetermined level signal is high level signal.
3. circuit according to claim 2 is it is characterised in that described latch is d trigger;
The input of described d trigger is the input of described latch, for inputting described predetermined level signal;Described d touches The outfan sending out device is the outfan of described latch, and the Clock control end of described d trigger is the when clock of described latch End processed, the reset terminal of described d trigger is the control end of described latch.
4. circuit according to claim 2 is it is characterised in that described logic circuit includes NOR logic circuit;
The first input end of described NOR logic circuit is the first input end of described logic circuit, described NOR logic circuit Second input is the second input of described logic circuit, and the outfan of described NOR logic circuit is described logic circuit Outfan.
5. circuit according to claim 2 is it is characterised in that described clock generation circuit includes pulse-generating circuit, with And the delay circuit being connected with described pulse-generating circuit;
The input of described pulse-generating circuit is the input of described clock generation circuit, the output of described pulse-generating circuit End is the first outfan of described clock generation circuit, and the outfan of described delay circuit is the second of described clock generation circuit Outfan;
Described pulse-generating circuit, for producing the pulse signal of one fixed width according to described adc clock cycle signal;
Described delay circuit, for the pulse delay signal Preset Time output exporting described pulse-generating circuit.
6. a kind of analog-digital converter adc is it is characterised in that include: digital to analog converter dac, comparator, data register and logic Circuit, described data register includes multistage latch, and every grade of described latch connects a described logic circuit;
The outfan of the first input end described data register of connection of described dac, the second input input reference voltage signal, Outfan connects the inverting input of described comparator;The in-phase input end of described comparator inputs voltage signal to be converted;
The first input end of each described logic circuit connects the outfan of described comparator, the second input of described logic circuit End connects the first outfan of described clock generation circuit, and the outfan of described logic circuit connects the same one-level of described logic circuit Described latch control end;The input input predetermined level signal of described latch, the clock control of described latch End connects the second outfan of described clock generation circuit;
Described logic circuit, for controlling the output in initial preset duration of current adc clock cycle of described latch default Level signal, and after described preset duration, control the output of comparator described in described latches;
The input input adc clock cycle signal of described clock generation circuit, described first outfan output the first clock letter Number, described second outfan output second clock signal.
7. in a kind of analog-digital converter adc comparator time delay correction method it is characterised in that being applied in adc, described adc bag Include digital to analog converter dac, comparator, data register and logic circuit, described data register includes multistage latch, every grade Described depositor corresponds to a described logic circuit;Methods described includes:
In initial preset duration within the current adc clock cycle, described logic circuit produces the first level signal, and will be described First level signal is supplied to the latch being in same one-level in described data register with described logic circuit, so that described lock Storage exports predetermined level signal in described preset duration;
After initial preset duration of current adc clock cycle, described logic circuit is according to the output signal of described comparator Output second electrical level signal, and described second electrical level signal is supplied to described latch, so that described latch is described pre- If latching the output signal of described comparator after duration.
8. method according to claim 7 is it is characterised in that described predetermined level signal is high level signal.
9. method according to claim 8 it is characterised in that
In described initial preset duration within the current adc clock cycle, described logic circuit produces the first level signal, bag Include:
In initial preset duration of current adc clock cycle, the high level that described logic circuit inputs according to first input end Signal output low level signal;
After the described preset duration initial in the current adc clock cycle, described logic circuit is according to the output of described comparator Signal output second electrical level signal, comprising:
After initial preset duration of current adc clock cycle, when described comparator output high level signal, described logic Circuit output low level signal;
After initial preset duration of current adc clock cycle, when described comparator output low level signal, described logic Circuit output high level signal.
10. method according to claim 8 is it is characterised in that the output signal of described logic circuit inputs to described lock The reset terminal of storage, methods described also includes:
After initial preset duration of current adc clock cycle, when described logic circuit output high level signal, control institute State latch output low level signal;When described logic circuit output low level signal, control the high electricity of described latch output Ordinary mail number.
CN201610871262.4A 2016-09-29 2016-09-29 Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC Active CN106357268B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN201610871262.4A CN106357268B (en) 2016-09-29 2016-09-29 Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC
PCT/CN2017/076301 WO2018058900A1 (en) 2016-09-29 2017-03-10 Comparer delay correction circuit in adc, method and adc

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610871262.4A CN106357268B (en) 2016-09-29 2016-09-29 Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC

Publications (2)

Publication Number Publication Date
CN106357268A true CN106357268A (en) 2017-01-25
CN106357268B CN106357268B (en) 2019-08-23

Family

ID=57866139

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610871262.4A Active CN106357268B (en) 2016-09-29 2016-09-29 Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC

Country Status (2)

Country Link
CN (1) CN106357268B (en)
WO (1) WO2018058900A1 (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018058900A1 (en) * 2016-09-29 2018-04-05 珠海格力电器股份有限公司 Comparer delay correction circuit in adc, method and adc
CN107907173A (en) * 2017-12-14 2018-04-13 湖北天禹环保科技有限公司 A kind of analog-digital converter for ultrasonic gas flowmeter
CN113497619A (en) * 2020-04-03 2021-10-12 龙芯中科技术股份有限公司 Trigger circuit, control circuit and chip
CN110535470B (en) * 2019-08-26 2022-06-14 中国电子科技集团公司第二十四研究所 Comparator clock generation circuit and high-speed successive approximation type analog-to-digital converter

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109257023B (en) * 2018-08-24 2022-10-14 中国电子科技集团公司第三十六研究所 Power amplifier protection circuit and method
CN111416621B (en) * 2020-04-10 2023-06-02 中国科学院上海微***与信息技术研究所 Power consumption reduction circuit and method for current steering DAC
CN113114257B (en) * 2021-04-19 2023-08-08 西安交通大学 Sub-high-order advanced successive approximation analog-to-digital converter and control method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080062032A1 (en) * 2006-09-08 2008-03-13 Sunghyun Park High speed comparator offset correction
US8482444B1 (en) * 2011-07-28 2013-07-09 The Boeing Company Calibration of analog-to-digital converter data capture
KR20150072972A (en) * 2013-12-20 2015-06-30 한국과학기술원 Analog to Digital Converter for interpolation using Calibration of Clock
CN104967451A (en) * 2015-07-31 2015-10-07 中国科学院电子学研究所 Successive approximation type analog-to-digital converter
CN105897268A (en) * 2016-05-12 2016-08-24 英特格灵芯片(天津)有限公司 Metastable state eliminating circuit and equipment

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007109744A2 (en) * 2006-03-21 2007-09-27 Multigig Inc. Dual pll loop for phase noise filtering
CN102355266B (en) * 2011-07-28 2016-03-02 上海华虹宏力半导体制造有限公司 A kind of successive approximation register analog-digital converter
CN104253613B (en) * 2014-09-11 2017-06-13 电子科技大学 A kind of low pressure ultra-low-power high-precision comparator of SAR ADC
CN105306059B (en) * 2015-11-20 2018-06-19 中国科学院微电子研究所 Successive approximation analog-to-digital converter device
CN106357268B (en) * 2016-09-29 2019-08-23 珠海格力电器股份有限公司 Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20080062032A1 (en) * 2006-09-08 2008-03-13 Sunghyun Park High speed comparator offset correction
US8482444B1 (en) * 2011-07-28 2013-07-09 The Boeing Company Calibration of analog-to-digital converter data capture
KR20150072972A (en) * 2013-12-20 2015-06-30 한국과학기술원 Analog to Digital Converter for interpolation using Calibration of Clock
CN104967451A (en) * 2015-07-31 2015-10-07 中国科学院电子学研究所 Successive approximation type analog-to-digital converter
CN105897268A (en) * 2016-05-12 2016-08-24 英特格灵芯片(天津)有限公司 Metastable state eliminating circuit and equipment

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018058900A1 (en) * 2016-09-29 2018-04-05 珠海格力电器股份有限公司 Comparer delay correction circuit in adc, method and adc
CN107907173A (en) * 2017-12-14 2018-04-13 湖北天禹环保科技有限公司 A kind of analog-digital converter for ultrasonic gas flowmeter
CN110535470B (en) * 2019-08-26 2022-06-14 中国电子科技集团公司第二十四研究所 Comparator clock generation circuit and high-speed successive approximation type analog-to-digital converter
CN113497619A (en) * 2020-04-03 2021-10-12 龙芯中科技术股份有限公司 Trigger circuit, control circuit and chip
CN113497619B (en) * 2020-04-03 2024-01-26 龙芯中科技术股份有限公司 Trigger circuit, control circuit and chip

Also Published As

Publication number Publication date
WO2018058900A1 (en) 2018-04-05
CN106357268B (en) 2019-08-23

Similar Documents

Publication Publication Date Title
CN106357268A (en) Time delay correction circuit and method for comparator in ADC (analog to digital converter) and ADC
CN103178847B (en) Formula analog-digital converter and method thereof are deposited in continuous approximation
CN103888141B (en) Streamline gradually compares the method for self-calibrating and device of analog-digital converter
US8957802B1 (en) Metastability error detection and correction system and method for successive approximation analog-to-digital converters
CN104135288B (en) Metastable state detection and correction in analog-digital converter
CN107070455A (en) Mix successive approximation register analog-digital converter and the method for performing analog-to-digital conversion
CN105306059B (en) Successive approximation analog-to-digital converter device
CN102571094A (en) Successive approximation register analog-to-digital converter and analog-to-digital conversion method using the same
CN109687872A (en) High-speed digital logic circuit and sampling adjustment method for SAR_ADC
CN207518571U (en) Analog-digital converter
CN107040260B (en) Asynchronous successive approximation type analog-to-digital conversion circuit
US8339302B2 (en) Analog-to-digital converter having a comparator for a multi-stage sampling circuit and method therefor
EP3707566B1 (en) Time-to-digital converter
CN110401443B (en) Metastable state detection elimination circuit of synchronous clock ADC circuit
CN110995264A (en) Calibration system for capacitance mismatch of CDAC and successive approximation ADC
CN104396145A (en) Method and apparatus for analog-to-digital converter
EP1563606A1 (en) Pulse width modulation analog to digital conversion
CN101394183B (en) A/D direct computing conversion, A/D cascade converter and use thereof
CN106253900A (en) Gradually-appoximant analog-digital converter
US5068662A (en) Neural network analog-to-digital converter
CN110401444A (en) Circuit is eliminated in the metastable detection of asynchronous clock adc circuit
CN109698700A (en) Continuous approximation register analog is to digital quantizer and its operation method
CN106656190A (en) Continuous approximation type analog-to-digital conversion circuit and method therefor
CN105991138B (en) Asynchronous successive approximation modulus conversion circuit
CN104980158A (en) Successive approximation analog-to-digital converter and calibration method thereof

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant