CN106323178A - Manufacturing method for device for measuring height of measurement instrument - Google Patents

Manufacturing method for device for measuring height of measurement instrument Download PDF

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Publication number
CN106323178A
CN106323178A CN201610656960.2A CN201610656960A CN106323178A CN 106323178 A CN106323178 A CN 106323178A CN 201610656960 A CN201610656960 A CN 201610656960A CN 106323178 A CN106323178 A CN 106323178A
Authority
CN
China
Prior art keywords
module
housing
height
instrument
range
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610656960.2A
Other languages
Chinese (zh)
Inventor
唐诗华
覃泽颖
李保
黄鹰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guilin University of Technology
Original Assignee
Guilin University of Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guilin University of Technology filed Critical Guilin University of Technology
Priority to CN201610656960.2A priority Critical patent/CN106323178A/en
Publication of CN106323178A publication Critical patent/CN106323178A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0608Height gauges

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

The invention discloses a manufacturing method for a device for measuring the height of a measurement instrument. The method comprises the steps: 1, manufacturing a telescoping measurement rod (1), a housing (2), and a display screen (3); 2, manufacturing a range-finding system (4), which comprises a microcontroller, a setting module, a display module, a power supply, and a laser range-finding module, wherein the setting module, the display module, the laser range-finding module and the power supply are respectively connected with the microcontroller; 3, enabling the telescoping measurement rod (1) to be installed at the center of the top of the housing (2); 4, enabling the displays screen (3) to be installed at the upper part of the housing (2), and enabling the range-finding system (4) to be installed at the lower part of the housing (2). The device structure is simple, and the production cost is low. The method effectively irons out the defects that a measurement instrument in the prior art is bigger in error and is not convenient, and can conveniently and accurately measure the height of the measurement instrument through the combination of the telescoping measurement rod (1) and the laser range-finding module.

Description

A kind of manufacture method of the measurement apparatus of measuring instrument height
Technical field
The present invention relates to the manufacture method of a kind of height measuring device in Surveying Engineering, the survey of a kind of measuring instrument height The manufacture method of amount device.
Background technology
At present, when measuring height of instrument, generally use ribbon and measure, when height of instrument set up higher or When control point is positioned at protection well, measures height of instrument and be difficult to individually be completed by a people;The most existing method is by foot rest And the impact of instrument so that can not be straightened during measuring at steel ruler, the numerical value of reading is equivalent to the distance of one section of curve, Even if repetitive measurement is averaged also can there is the mode of measuring, the impact of reading error.Obviously, traditional method is used to measure instrument The most inconvenient, and there is unnecessary error impact.It is thus desirable to a kind of can the device of accurate measuring instrument height, To facilitate the precision using and improving measurement result.
Summary of the invention
It is an object of the invention to overcome above-mentioned deficiency of the prior art, it is provided that the measurement dress of a kind of measuring instrument height Put.This measurement apparatus effectively overcomes in prior art and measures the deficiency that instrument height error is bigger and inconvenient, utilizes scalable Measuring staff uses with laser ranging block combiner, can measure height of instrument easily and accurately.
Concretely comprise the following steps:
(1) scalable measuring staff, housing and display screen are made.
(2) making range-measurement system, range-measurement system includes microcontroller, arranges module, display module, power supply and laser ranging Module;Arrange module, display module, laser ranging module and power supply to be connected with microcontroller respectively.
(2) scalable measuring staff is arranged on the centre position, top of housing.
(3) display screen is arranged on the top of housing, and range-measurement system is arranged on the bottom of housing.
Scalable measuring staff is the elongate rod by spider top through hole, and a length of fixed value is stretched to the longest during use, Can shrink when not using, be convenient for carrying, it act as measuring instrument (or pedestal) bottom and measures dress to described instrument height The level altitude put.
Display screen is high for display instrument.
Range-measurement system is used for measuring described instrument height measurement apparatus to topocentric height;Microcontroller is used for controlling whole LDMS;Arrange module for arrange different model instrument measure position to instrument (or pedestal) bottom fixing height Degree;Power supply is that whole device is powered;Laser ranging module is used for measuring described device to topocentric height.
Assembly of the invention simple in construction, production cost is low, effectively overcomes and measures instrument height error in prior art relatively Big and inconvenient deficiency, utilizes scalable measuring staff to use with laser ranging block combiner, can measure measurement easily and accurately The height of instrument.
Accompanying drawing explanation
Fig. 1 is apparatus of the present invention structural representation.
Fig. 2 is range-measurement system block diagram of the present invention.
Fig. 3 is that display screen of the present invention shows schematic diagram.
Fig. 4 is that assembly of the invention uses schematic diagram.
Accompanying drawing illustrates: the scalable measuring staff of 1-, 2-housing, 3-display screen, 4-range-measurement system.
Detailed description of the invention
Embodiment:
One, scalable measuring staff 1, housing 2, display screen 3 are made.
Two, range-measurement system 4 is made, as in figure 2 it is shown, arrange module 6, display module 7, laser ranging module 8 and power supply 9 points It is not connected with microcontroller 5.
Three, scalable measuring staff 1 is arranged on the centre position, top of housing 2, and display screen 3 is arranged on the top of housing 2, range finding System 4 is arranged on the bottom of housing 2.
Fig. 3 is that display screen shows schematic diagram, and its Instrumental level altitude h1 is that instrument measures position to its instrument (or base Seat) bottom height;Measuring height h2 is that instrument height measurement apparatus is to topocentric height;Instrument height H is for through being calculated True instrument high.

Claims (1)

1. the manufacture method of the measurement apparatus of a measuring instrument height, it is characterised in that concretely comprise the following steps:
One, scalable measuring staff (1), housing (2) and display screen (3) are made;
Two, making range-measurement system (4), range-measurement system includes microcontroller, arranges module, display module, power supply and laser ranging Module;Arrange module, display module, laser ranging module and power supply to be connected with microcontroller respectively;
Three, scalable measuring staff (1) is arranged on the centre position, top of housing (2);
Display screen (3) four, is arranged on the top of housing (2), and range-measurement system (4) is arranged on the bottom of housing (2).
CN201610656960.2A 2016-08-11 2016-08-11 Manufacturing method for device for measuring height of measurement instrument Pending CN106323178A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610656960.2A CN106323178A (en) 2016-08-11 2016-08-11 Manufacturing method for device for measuring height of measurement instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610656960.2A CN106323178A (en) 2016-08-11 2016-08-11 Manufacturing method for device for measuring height of measurement instrument

Publications (1)

Publication Number Publication Date
CN106323178A true CN106323178A (en) 2017-01-11

Family

ID=57740853

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610656960.2A Pending CN106323178A (en) 2016-08-11 2016-08-11 Manufacturing method for device for measuring height of measurement instrument

Country Status (1)

Country Link
CN (1) CN106323178A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106918815A (en) * 2017-04-12 2017-07-04 李良杰 Laser measuring apparatus
CN108645346A (en) * 2018-06-15 2018-10-12 河海大学 A kind of tree height measurement device and its measurement method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19958543C1 (en) * 1999-12-04 2001-05-23 Nestle & Fischer Gmbh & Co Kg Ground level measuring method uses laser beam defining horizontal reference plane and measuring device determining its distance from ground surface
CN201666786U (en) * 2010-08-17 2010-12-08 中冶建工有限公司 Height measuring device of room space
CN202188829U (en) * 2011-08-09 2012-04-11 上海市政工程设计研究总院(集团)有限公司 Apparatus for measuring instrument height

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19958543C1 (en) * 1999-12-04 2001-05-23 Nestle & Fischer Gmbh & Co Kg Ground level measuring method uses laser beam defining horizontal reference plane and measuring device determining its distance from ground surface
CN201666786U (en) * 2010-08-17 2010-12-08 中冶建工有限公司 Height measuring device of room space
CN202188829U (en) * 2011-08-09 2012-04-11 上海市政工程设计研究总院(集团)有限公司 Apparatus for measuring instrument height

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106918815A (en) * 2017-04-12 2017-07-04 李良杰 Laser measuring apparatus
CN108645346A (en) * 2018-06-15 2018-10-12 河海大学 A kind of tree height measurement device and its measurement method

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Application publication date: 20170111