CN106301218A - A kind of test device for many main grids cell piece - Google Patents
A kind of test device for many main grids cell piece Download PDFInfo
- Publication number
- CN106301218A CN106301218A CN201610933842.1A CN201610933842A CN106301218A CN 106301218 A CN106301218 A CN 106301218A CN 201610933842 A CN201610933842 A CN 201610933842A CN 106301218 A CN106301218 A CN 106301218A
- Authority
- CN
- China
- Prior art keywords
- testing stand
- cell piece
- test
- gold
- test device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 105
- 239000000523 sample Substances 0.000 claims abstract description 25
- 238000009413 insulation Methods 0.000 claims abstract description 20
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 241000218202 Coptis Species 0.000 claims 1
- 235000002991 Coptis groenlandica Nutrition 0.000 claims 1
- 238000007747 plating Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 2
- 230000007547 defect Effects 0.000 description 3
- 238000011161 development Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 238000012216 screening Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/14—Measuring as part of the manufacturing process for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
Abstract
The present invention relates to a kind of test device for many main grids cell piece, including: gripper shoe and the testing stand being arranged in gripper shoe, electric insulation between testing stand and gripper shoe, it is characterized in that: described testing stand has good electric conductivity, and internal having Packed air flue, airway open is in the work surface of testing stand and can adsorb cell piece to be measured under the influence of air pressure；Being provided with several probe on testing stand, electric insulation between probe and testing stand, probe exceeds test surfaces 3 5mm of testing stand；The upper pressure network structure being provided above for compressing mesuring battary sheet at testing stand, the overall rectangular frame-shaped of upper pressure network structure, surrounding has frame, some gold-plated lines it are provided with in frame, gold-plated line comprises some test voltage lines and the test electric current line of test voltage line twice quantity, during test, by probe at the back side of mesuring battary sheet applying voltage.The present invention has the more accurate advantage of measurement result.
Description
Technical field
The present invention relates to the test device of a kind of solar cell, particularly relate to a kind of test for many main grids cell piece and fill
Put, belong to solar cell piece technical field of measurement and test.
Background technology
Socio-economic development at any time, energy demand quickly increases, and energy problem has been increasingly becoming restriction development of all countries economy
One of key factor.Cleaning that solar energy is well recognized as and regenerative resource, have great development and utilization prospect.According in advance
Surveying, to the year two thousand fifty, solar energy uses more than the 35% of the energy by accounting for the mankind.
Solar battery sheet the most easily forms the impalpable defect of various naked eyes.The existence of defect can be dropped
The conversion efficiency of low solaode and service life, cause bigger economic loss.The defect of cell piece can cause battery
There is bucket effect in chip module characteristic.Improve qualification rate, it is to avoid defective cell piece enters solar photovoltaic assembly.Use and close
The silicon chip of lattice is most important for the effectiveness ensureing subsequent treatment link.Various cell slice test technology are arisen at the historic moment.
At present, conventional solar battery sheet measuring technology is all based on measuring 3-5 bar main grid, and anelectrode is all to use to visit
The method of testing of faller gill measures the efficiency of cell piece.For many main grids cell piece (10-20 bar main grid), as still used this kind of knot
Structure mode, then cannot realize: is on the one hand to think that needs are arranged at many main grids cell piece 10-20 arranged above bar probe, without enough
Space arrange, on the other hand be because so many probe row and blocked cell piece sensitive surface, affect cell slice test result
Accuracy.
Summary of the invention
The present invention is in order to overcome the deficiencies in the prior art, it is provided that a kind of test device for many main grids cell piece, is used for
The test of many main grids cell piece, and test result is accurate.
To this end, the present invention adopts the following technical scheme that
A kind of test device for many main grids cell piece, including: gripper shoe and the testing stand being arranged in gripper shoe, survey
Electric insulation between test stand face and gripper shoe, it is characterised in that: described testing stand has good electric conductivity, and inside has
The air flue sealed, airway open is in the work surface of testing stand and can adsorb cell piece to be measured under the influence of air pressure；
Being provided with several probe on testing stand, electric insulation between probe and testing stand, probe exceeds the test surfaces 3-of testing stand
5mm；In the upper pressure network structure being provided above for compressing mesuring battary sheet of testing stand, upper pressure network structure entirety is rectangular
Frame-shaped, surrounding has frame, is provided with some gold-plated lines in frame, comprises some test voltage lines and survey in gold-plated line
The test electric current line of examination pressure-wire twice quantity, during test, by probe at the back side of mesuring battary sheet applying voltage.
Further, upper pressure network structure is provided with the tensioner knot for regulating each gold-plated line tightness respectively
Structure.
Further, one end of described gold-plated line is fixed in pressure network structure, and the other end is connected with Tensioning structure.
Further, described Tensioning structure is for adjusting screw and adjustment block, and the one ends wound of gold-plated line is adjusting on screw,
Rotate adjustment screw by adjustment block thus gold-plated line is carried out tensioner.
Further, electric insulation between described each gold-plated line and the frame of upper pressure network structure.
Further, described probe is connected on testing stand by the insulation sleeve being arranged on testing stand.
Further, described air flue opening on testing stand is some parallel strips or regular distribution equally spacedly
Point-like.
Further, described testing stand has the radian arched upward to gold-plated line direction, make testing stand can preferably with
Mesuring battary sheet is fitted.
Further, described testing stand has the radian of 0.1-0.3 degree.
Further, between testing stand and gripper shoe, it is provided with the cushion block of insulation.
The test device for many main grids cell piece of the present invention, is realized to be measured by the vacuum way in testing stand
The absorption of cell piece, upper pressure network structure is down pressed from the top in cell piece front, makes the gold-plated line in pressure network completely attach to extremely
On cell piece front, during test, by probe at the back side of mesuring battary sheet applying voltage.Relative to traditional test structure, pressure
Web frame can significantly subtract the shielded area in cell piece front, thus tests the device screening to cell piece front in test process
Block face is long-pending to be substantially reduced, and improves the accuracy of test result.
Accompanying drawing explanation
Fig. 1 is the structural representation of the present invention；
Fig. 2 is the structural representation sealing air flue on testing stand of the present invention；
Fig. 3 is the structural representation that middle probe of the present invention is arranged on testing stand；
Fig. 4 is the structural representation of upper pressure network structure in the present invention；
In figure, 1 is gripper shoe；2 is testing stand；21 is air flue；3 is cushion block；4 is probe；5 is insulation sleeve, and 6 is upper pressure network
Structure, 61 is frame, and 62 is gold-plated line, and 63 is Tensioning structure.
Detailed description of the invention
In order to make those skilled in the art be better understood from scheme of the invention, below in conjunction with specific embodiment and accompanying drawing,
The technical scheme of invention is carried out clear, complete description.
As Figure 1-4, the test device for many main grids cell piece of the present invention, including: gripper shoe 1 and be arranged at
Testing stand 2 in gripper shoe 1, electric insulation between testing stand 2 and gripper shoe 1, specifically, can be by testing stand 2
And the cushion block 3 arranging insulation between gripper shoe 1 realizes；It is of course also possible to use other mode, make testing stand 2 and prop up
Insulating between fagging 1, the mode of insulation is prior art, is not repeated herein.
Testing stand 2 has good electric conductivity, can use conductive material, as the material such as copper, ferrum makes testing stand
Make it have good electric conductivity；Testing stand 2 is internal has Packed air flue 21, and airway open is in the work of testing stand
Cell piece to be measured also can be adsorbed by face under the influence of air pressure；During test, connect with source of the gas by air flue, thus to be measured
Cell piece produces adsorption, prevents cell piece in test process be subjected to displacement or drop.Air flue opening on testing stand
In some parallel strips；Or the point-like of regular distribution equally spacedly.
Being provided with several probe 4 on testing stand 2, in the present embodiment, number of probes is four, probe 4 and testboard
Electric insulation between face 2, specifically, probe 4 is connected on testing stand by the insulation sleeve 5 being arranged on testing stand 2；Probe
The 4 test surfaces 3-5mm exceeding testing stand 2；Herein, " test surfaces " refers to during measuring towards the one of mesuring battary sheet
Face.In the upper pressure network structure 6 being provided above for compressing mesuring battary sheet of testing stand 2, upper pressure network structure is overall in square
Shape frame-shaped, surrounding has frame 61, is provided with some gold-plated lines in frame, and in the present embodiment, gold-plated line 62 is 18, its
In, 12 gold-plated lines are as the electric current line in cell piece front, and 6 gold-plated lines are as the pressure-wire in cell piece front.During test, logical
Cross probe 4 at cell piece back side making alive.
As it is shown in figure 1, be provided with the tensioner for regulating each gold-plated line tightness respectively in upper pressure network structure
Structure 63.
One end of gold-plated line 62 is fixed in pressure network structure, and the other end is connected with Tensioning structure.Specifically, such as Fig. 4 institute
Showing, Tensioning structure 63 is for adjusting screw and adjustment block, and the one ends wound of gold-plated line is adjusting on screw, is rotated by adjustment block and adjusts
Whole screw thus gold-plated line is carried out tensioner.Thus each gold-plated line can individually adjust and tensioner.
Electric insulation between each gold-plated line 62 and the frame 61 of upper pressure network structure；And be also electric insulation between each gold-plated line
's.
Described testing stand has the radian arched upward to gold-plated line direction, make testing stand can preferably with mesuring battary sheet
Laminating.In the present embodiment, described testing stand has the radian of 0.1 degree.
Claims (10)
1. for a test device for many main grids cell piece, including: gripper shoe and the testing stand being arranged in gripper shoe,
Electric insulation between testing stand and gripper shoe, it is characterised in that: described testing stand has good electric conductivity, and internal tool
Packed air flue, airway open is in the work surface of testing stand and can inhale cell piece to be measured under the influence of air pressure
Attached；Being provided with several probe on testing stand, electric insulation between probe and testing stand, probe exceeds the test surfaces of testing stand
3-5mm；In the upper pressure network structure being provided above for compressing mesuring battary sheet of testing stand, upper pressure network structure is overall in square
Shape frame-shaped, surrounding has frame, is provided with some gold-plated lines in frame, gold-plated line comprises some test voltage lines and
The test electric current line of test voltage line twice quantity, during test, by probe at the back side of mesuring battary sheet applying voltage.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: in upper pressure network structure
It is provided with the Tensioning structure for regulating each gold-plated line tightness respectively.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: the one of described gold-plated line
End is fixed in pressure network structure, and the other end is connected with Tensioning structure.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: described Tensioning structure is
Adjusting screw and adjustment block, the one ends wound of gold-plated line is adjusting on screw, is rotated by adjustment block and adjusts screw thus to plating
Gold thread carries out tensioner.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: described each gold-plated
Electric insulation between the frame of line and upper pressure network structure.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: described probe is by setting
The insulation sleeve being placed on testing stand is connected on testing stand.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: described air flue is in test
Opening on table top is the point-like of some parallel strips or regular distribution equally spacedly.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: described testboard mask
The radian arched upward in oriented gold-plated line direction, makes testing stand preferably to fit with mesuring battary sheet.
Test device for many main grids cell piece the most according to claim 8, it is characterised in that: described testboard mask
There is the radian of 0.1-0.3 degree.
Test device for many main grids cell piece the most according to claim 1, it is characterised in that: testing stand with
The cushion block of insulation it is provided with between gripper shoe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610933842.1A CN106301218A (en) | 2016-11-01 | 2016-11-01 | A kind of test device for many main grids cell piece |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610933842.1A CN106301218A (en) | 2016-11-01 | 2016-11-01 | A kind of test device for many main grids cell piece |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106301218A true CN106301218A (en) | 2017-01-04 |
Family
ID=57719674
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610933842.1A Pending CN106301218A (en) | 2016-11-01 | 2016-11-01 | A kind of test device for many main grids cell piece |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106301218A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108206671A (en) * | 2018-02-10 | 2018-06-26 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1356727A (en) * | 2000-11-30 | 2002-07-03 | 三菱电机株式会社 | Semiconductor device including bipolar transistor elements |
| US20070068567A1 (en) * | 2005-09-23 | 2007-03-29 | Rubin Leonid B | Testing apparatus and method for solar cells |
| CN102445668A (en) * | 2010-10-11 | 2012-05-09 | 财团法人工业技术研究院 | Wafer-level light-emitting diode chip detection method, detection device and transparent probe card |
| CN104769838A (en) * | 2012-09-05 | 2015-07-08 | 康斯坦茨大学 | Device for non-permanent electrical contacting of solar cells in order to measure electrical properties |
| CN206412987U (en) * | 2016-11-01 | 2017-08-15 | 常州天合光能有限公司 | A kind of test device for many main grid cell pieces |
-
2016
- 2016-11-01 CN CN201610933842.1A patent/CN106301218A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1356727A (en) * | 2000-11-30 | 2002-07-03 | 三菱电机株式会社 | Semiconductor device including bipolar transistor elements |
| US20070068567A1 (en) * | 2005-09-23 | 2007-03-29 | Rubin Leonid B | Testing apparatus and method for solar cells |
| CN102445668A (en) * | 2010-10-11 | 2012-05-09 | 财团法人工业技术研究院 | Wafer-level light-emitting diode chip detection method, detection device and transparent probe card |
| CN104769838A (en) * | 2012-09-05 | 2015-07-08 | 康斯坦茨大学 | Device for non-permanent electrical contacting of solar cells in order to measure electrical properties |
| CN206412987U (en) * | 2016-11-01 | 2017-08-15 | 常州天合光能有限公司 | A kind of test device for many main grid cell pieces |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108206671A (en) * | 2018-02-10 | 2018-06-26 | 泰州隆基乐叶光伏科技有限公司 | A kind of MBB solar cell tests platform |
| CN108206671B (en) * | 2018-02-10 | 2024-04-09 | 泰州隆基乐叶光伏科技有限公司 | MBB solar cell testboard |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information |
Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant after: TRINA SOLAR Co.,Ltd. Applicant after: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant before: trina solar Ltd. Applicant before: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. Address after: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant after: trina solar Ltd. Applicant after: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. Address before: Solar photovoltaic industry park Tianhe Road 213031 north of Jiangsu Province, Changzhou City, No. 2 Applicant before: CHANGZHOU TRINA SOLAR ENERGY Co.,Ltd. Applicant before: TRINA SOLAR( CHANGZHOU) TECHNOLOGY Co.,Ltd. |
|
| CB02 | Change of applicant information | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20170104 |
|
| RJ01 | Rejection of invention patent application after publication |