CN106291333B - A kind of circuit board detecting system - Google Patents

A kind of circuit board detecting system Download PDF

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Publication number
CN106291333B
CN106291333B CN201610885231.4A CN201610885231A CN106291333B CN 106291333 B CN106291333 B CN 106291333B CN 201610885231 A CN201610885231 A CN 201610885231A CN 106291333 B CN106291333 B CN 106291333B
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CN
China
Prior art keywords
circuit board
under test
board under
test
electrode
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Expired - Fee Related
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CN201610885231.4A
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Chinese (zh)
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CN106291333A (en
Inventor
王准
张雷
陆恒
陈启程
刘洋
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BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
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BOE Technology Group Co Ltd
Hefei Xinsheng Optoelectronics Technology Co Ltd
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Priority to CN201610885231.4A priority Critical patent/CN106291333B/en
Publication of CN106291333A publication Critical patent/CN106291333A/en
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Publication of CN106291333B publication Critical patent/CN106291333B/en
Expired - Fee Related legal-status Critical Current
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/281Specific types of tests or tests for a specific type of fault, e.g. thermal mapping, shorts testing
    • G01R31/2812Checking for open circuits or shorts, e.g. solder bridges; Testing conductivity, resistivity or impedance

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)

Abstract

The present invention provides a kind of circuit board detecting system, by the way that circuit board under test being waited for, each electrode of binding region is immersed in test solution, utilize the conductive characteristic of test solution, realize the electrode conduction to binding region, by sending test voltage to the control unit of circuit board under test, detection circuit board under test waits for the adjacent two interelectrode impedance of binding region, and waits for the conductivity of adjacent two interelectrode impedance detection value and test solution in binding region judges whether circuit board under test is qualified according to circuit board under test;On the one hand, it is no longer necessary to quality of circuit board detection can be realized with the matched dedicated test circuit plate of circuit board under test, to reduce circuit board detecting cost;On the other hand, it as long as guaranteeing that circuit board under test waits for that each electrode of binding region is immersed in the conducting that electrode can be realized in test solution, is aligned one by one without each electrode, improves detection efficiency.

Description

A kind of circuit board detecting system
Technical field
The present invention relates to field of display technology, and in particular to a kind of circuit board detecting system.
Background technique
As SMT (Surface Mount Technology, surface mounting technology) technique is widely used, according to the work The circuit board product Quality Detection that skill is produced becomes a most important problem.
Circuit board include: FPCA (Flexible Printed Circuit Assembly, flexible circuit board finished product) and PCBA (Printed Circuit Board+Assembly, finished printed circuit board product), existing quality of circuit board detection scheme It need to be realized using dedicated test fixture (i.e. with the matched dedicated test circuit plate of circuit board under test).Carrying out Quality Detection When, test circuit board waits for that each electrode of binding region needs to wait for that each electrode of binding region aligns one by one with circuit board under test, because This detection efficiency is low, becomes the bottleneck of Quality Detection.Moreover, the circuit board under test for different model needs offer corresponding special Test circuit board increases FPCA and PCBA product quality testing cost.
Therefore, a kind of circuit board detecting system is needed to solve the above technical problems.
Summary of the invention
The present invention aiming at the above shortcomings existing in the prior art, provides a kind of circuit board detecting system, at least portion Decompose the problem that certainly circuit board detecting is at high cost, detection efficiency is low.
The present invention is in order to solve the above technical problems, adopt the following technical scheme that
The present invention provides a kind of circuit board detecting system, comprising: controller tests solution and holds the test solution Container, circuit board under test wait for that each electrode of binding region is immersed in the test solution;
The controller is connected with the control unit of circuit board under test, for sending test voltage to described control unit, So that described control unit, which detects circuit board under test according to the test voltage, waits for adjacent two interelectrode impedance in binding region, And wait for that adjacent two interelectrode impedance detection value is sentenced in binding region according to the conductivity and circuit board under test of the test solution Whether disconnected circuit board under test is qualified.
Preferably, the test solution is the inner wall that electrode and the container in binding region are not waited for circuit board under test The solution chemically reacted.
Preferably, the volume of a container can accommodate multiple circuit board under test simultaneously.
Preferably, the test voltage includes first voltage and second voltage;
The controller is specifically used for, and sends first voltage signal and second voltage signal to described control unit, so that Described control unit respectively waits for the first voltage signal and second voltage signal loading in binding region in circuit board under test Each adjacent two electrode on;The adjacent two interelectrode impedance detection value of each group that described control unit is sent is received, respectively by institute The adjacent two interelectrode impedance detection value of each group is stated compared with the conductivity of the test solution, and is judged according to comparison result Whether circuit board under test is qualified.
Preferably, the controller is specifically used for, when at least one set of adjacent two interelectrode impedance detection value is greater than described When testing the conductivity of solution, the circuit board under test open circuit is determined;When at least one set of adjacent two interelectrode impedance detection value When less than the conductivity for testing solution, the circuit board under test short circuit is determined.
Preferably, the controller is specifically used for, when each adjacent two interelectrode impedance value is equal to the test solution Conductivity when, determine that the circuit board under test is qualified.
Further, the circuit board detecting system further includes signal generator, the signal generator and circuit under test The control unit of plate is connected, for sending pulse signal to described control unit, so that described control unit believes the pulse It number loads on the electrode that circuit board under test waits in binding region;
The container waits for that the opposite inner wall of the electrode in binding region is made of metal material with the circuit board under test, And wait for that the electrode in binding region forms electrolytic capacitor with the circuit board under test;
The controller is connected with the inner wall of the container, is also used to receive the third electricity that the electrolytic capacitor is sent Signal u is pressed, and according to the tertiary voltage signal u and preset voltage threshold U, determines the quality etc. of the circuit board under test Grade;Alternatively, receiving the tertiary voltage signal u that the electrolytic capacitor is sent, reception delay time t is determined, and according to the reception Delay time t and preset time threshold T determines the quality grade of the circuit board under test, and reception delay time t is institute State signal generator send the pulse signal time and the controller receive the tertiary voltage signal time difference.
Further, the circuit board detecting system further includes display device, the display device and the controller phase Even, for showing the waveform or reception delay time t of the tertiary voltage signal.
Preferably, the controller is specifically used for, and calculates the difference DELTA u between tertiary voltage signal u and voltage threshold U, Δ u=│ u-U │, calculates ratio p, p=the Δ u/U of Δ u and U, and according to p and preset quality grade threshold value Q determine it is described to The quality grade of slowdown monitoring circuit plate;Alternatively, difference DELTA t, the Δ t=│ t-T │ between reception delay time t and time threshold T are calculated, Ratio m, m=the Δ t/T of Δ t and T are calculated, and determines the product of the circuit board under test according to m and preset quality grade threshold value Q Matter grade.
Preferably, the quality grade threshold value Q includes at least the first quality grade threshold value q1 and the second quality grade threshold value q2;
The controller is specifically used for, as 0≤p < q1, alternatively, determining the quality of the circuit board under test when 0≤m < q1 Grade is excellent;As q1≤p < q2, alternatively, determining that the quality grade of the circuit board under test is medium when q1≤m < q2;Work as p >=q2, alternatively, determining that the quality grade of the circuit board under test is difference etc. when m >=q2.
The present invention can be realized it is following the utility model has the advantages that
Circuit board detecting system provided by the invention, by the way that circuit board under test is waited for that each electrode of binding region is immersed in survey It tries in solution, using the conductive characteristic of test solution, realizes the electrode conduction to binding region, pass through the control to circuit board under test Unit processed sends test voltage, and detection circuit board under test waits for the adjacent two interelectrode impedance of binding region, and according to circuit under test Plate waits for whether the conductivity of adjacent two interelectrode impedance detection value and test solution in binding region judges circuit board under test It is qualified;On the one hand, it is no longer necessary to quality of circuit board detection can be realized with the matched dedicated test circuit plate of circuit board under test, from And reduce circuit board detecting cost;On the other hand, as long as guaranteeing that circuit board under test waits for that each electrode of binding region is immersed in test The conducting that electrode can be realized in solution aligns one by one without each electrode, improves detection efficiency.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of circuit board detecting system provided by the invention;
Fig. 2 is top view of the circuit board detecting system provided by the invention in the quality grade of detection circuit board;
Fig. 3 is the schematic diagram of the quality grade of detection circuit board provided by the invention.
Marginal data:
1, controller 2, container 3, test solution 4, circuit board under test
5, signal generator 41, electrode 42, control unit 21, inner wall
Specific embodiment
Below in conjunction with the attached drawing in the present invention, clear, complete description is carried out to the technical solution in the present invention, is shown So, described embodiment is a part of the embodiments of the present invention, instead of all the embodiments.Based on the implementation in the present invention Example, those of ordinary skill in the art's every other embodiment obtained without making creative work, all belongs to In the scope of protection of the invention.
Below in conjunction with attached drawing 1, the solution of the present invention is described in detail.
The embodiment of the present invention provides a kind of circuit board detecting system, for testing whether wiring board product quality to be measured closes Lattice.As shown in Figure 1, circuit board under test 4 includes binding region and unbundling region, it is provided with electrode 41 in binding region, it is to be measured Circuit board 4 is bound by the non-display area of electrode 41 and display panel in binding region and is connected, the unbundling of circuit board under test 4 Control unit 42 (i.e. control chip) is provided in area, control unit 42 is connected with each electrode 41 in binding region respectively.? In the embodiment of the present invention, circuit board under test 4 is FPCA or PCBA.
The circuit board detecting system includes: controller 1, container 2 and test solution 3, and test solution 3 is contained in container 2 It is interior.At least one circuit board under test 4 can be accommodated in container 2, circuit board under test waits for that each electrode 41 of binding region is immersed in survey It tries in solution 3, i.e., circuit board under test waits for that each electrode 41 in binding region is located at the liquid level of test solution 3 or less.
Controller 1 is connected with the control unit 42 of circuit board under test 4, for sending test voltage to control unit 42, with Control unit 42 is set to wait for the impedance in binding region between adjacent two electrode 41 according to test voltage detection circuit board under test, and According to test solution 3 conductivity and circuit board under test wait for the impedance detection value in binding region between adjacent two electrode 41 judge to Whether slowdown monitoring circuit plate 4 is qualified.
Specifically, be provided with jack interface on circuit board under test 4, controller 1 by data line and the jack interface and to Slowdown monitoring circuit plate 4 connects, to be connected with control unit 42.
The present invention is molten using testing by the way that circuit board under test is waited for that each electrode in binding region is immersed in test solution The conductive characteristic of liquid realizes the electrode conduction to binding region, and by sending test electricity to the control unit of circuit board under test Pressure, detection circuit board under test wait for adjacent two interelectrode impedance in binding region, are waited in binding region according to circuit board under test Adjacent two interelectrode impedance detection value and the conductivity of test solution judge whether circuit board under test is qualified;On the one hand, no longer Need to can be realized quality of circuit board detection with the matched dedicated test circuit plate of circuit board under test, to reduce circuit board detecting Cost;On the other hand, as long as guaranteeing that circuit board under test waits for that each electrode of binding region is immersed in test solution and electricity can be realized The conducting of pole aligns one by one without each electrode, improves detection efficiency.
Product quality in order to guarantee circuit board under test is not damaged, and the test selection of solution 3 does not wait tying up with circuit board under test Determine the solution that the inner wall of electrode 41 and container 2 in region chemically reacts.For example, test solution can be NaCl solution, Certainly, skilled person will appreciate that, test solution 3 is not limited to NaCl solution, any not wait for binding region with circuit board under test The solution that the inner wall of interior electrode 41 and container 2 chemically reacts, and conductivity meets the solution of testing requirements in this hair Within bright protection scope.
It should be noted that the conductivity of test solution 3 can need to be adjusted and be arranged according to detection, for example, can To be realized by the concentration for changing test solution 3, proportion, before the circuit board detecting system starts, first measurement is surveyed The conductivity of solution 3 is tried, and measurement result is stored in controller 1, is sentenced so as to subsequent as circuit board under test product quality Disconnected foundation.
Preferably, the volume of container 2 can accommodate multiple circuit board under test 4 simultaneously, that is to say, that multiple circuit board under test 4 can be accommodated in simultaneously in container 2 to the electrode in binding region, to realize detection while multiple circuit boards.At this In inventive embodiments, as shown in Figure 1, container 2 can accommodate 3 circuit board under test simultaneously.By the way that foot is arranged in the volume of container 2 It is enough big, multiple circuit board under test 4 can be accommodated simultaneously, to realize the synchronous detection of multiple circuit boards, further increase detection effect Detection time is greatly decreased in rate.
Below in conjunction with Fig. 1, elaborate to the course of work of circuit board detecting system of the invention.
Controller 1 includes first voltage and second voltage to the test voltage that control unit 42 is sent, and first voltage is height Voltage, second voltage are low-voltage.
Controller 1 is specifically used for, and sends first voltage signal and second voltage signal to control unit 42, so that control is single Member 42 respectively waits for the first voltage signal and second voltage signal loading in circuit board under test each adjacent in binding region On two electrodes 41;Impedance detection value between each adjacent two electrode 41 that reception control unit 42 is sent, respectively will be described each adjacent Two interelectrode impedance detection values judge that circuit board under test is according to comparison result compared with the conductivity of test solution 3 No qualification.
That is, the control unit 42 of circuit board under test 4 is respectively by first voltage signal and second voltage signal loading It waits on each adjacent two electrode 41 in binding region in circuit board under test, in adjacent two electrode 41, adds on an electrode 41 It carries first voltage signal (i.e. high-voltage signal), loads second voltage signal (i.e. low-voltage signal) on another electrode 41, i.e., it will be to be measured Circuit board waits for that each electrode 41 of binding region is divided into multiple groups and is detected.Due to circuit board under test wait for it is each in binding region Electrode 41 is immersed in the liquid level of test solution 3 hereinafter, each electrode 41 can be connected in test solution 3, in this way, control unit 42 It can be detected out the impedance between adjacent two electrode 41.The impedance detection value and preset that controller 1 sends control unit 42 The conductivity of test solution 3 compare, and can judge whether circuit board under test qualified according to comparison result.
Specifically, that is, each group is adjacent when each adjacent two interelectrode impedance value is equal to the conductivity of test solution 3 When impedance detection value between two electrodes 41 is equal with test 3 conductivity of solution, the circuit board under test is qualified.Work as at least one set Whens impedance value and test 3 conductivity of solution between adjacent two electrode 41 do not wait, circuit board under test 4 is unqualified.
Further, in embodiments of the present invention, when controller 1 judges that circuit board under test 4 is unqualified, additionally it is possible to sentence Disconnected underproof reason out.Specifically, controller 1 is specifically used for, the impedance detection value between at least one set of adjacent two electrode 41 When greater than the conductivity for testing solution 3,4 open circuit of circuit board under test is determined;When at least one set of adjacent two interelectrode impedance detection When value is less than the conductivity of test solution 3,4 short circuit of circuit board under test is determined.
Further, circuit board detecting system provided in an embodiment of the present invention can also make further qualified circuit board Detection, to determine the product quality grade of qualified circuit board.
In conjunction with shown in Fig. 2 and Fig. 3, the circuit board detecting system further includes signal generator 5, signal generator 5 with to The control unit 42 of slowdown monitoring circuit plate 4 is connected, for sending pulse signal to control unit 42, so that control unit 42 is by the arteries and veins It rushes on the electrode 41 that signal loading is waited in circuit board under test in binding region.
Container 2 waits for that the opposite inner wall 21 of the electrode 41 in binding region is made of metal material with circuit board under test, and Wait for that the electrode 41 in binding region forms electrolytic capacitor (as shown in phantom in Figure 2) with circuit board under test.
Controller 1 is connected with the inner wall 21 of container 2, is also used to receive the tertiary voltage signal u that the electrolytic capacitor is sent, And according to the tertiary voltage signal u and preset voltage threshold U, the quality grade of circuit board under test 4 is determined;Alternatively, receiving The tertiary voltage signal u that the electrolytic capacitor is sent, determines the reception delay time t of tertiary voltage signal, and prolong according to reception When time t and preset time threshold T, determine the quality grade of circuit board under test 4.
It should be noted that in embodiments of the present invention, the pulse signal that signal generator 5 generates is square-wave signal.When When electrode 41 in circuit board under test binding region is immersed in test solution 3, the inner wall 21 and circuit board under test of container 2 are bound Electrode 41 in region is oppositely arranged, and the two forms electrolytic capacitor.The pulse signal that signal generator 5 generates is loaded in electricity to be measured On electrode 41 (i.e. a pole plate of electrolytic capacitor) in the plate binding region of road, in the inner wall 21 of container 2, (i.e. electrolytic capacitor is another One pole plate) on generate tertiary voltage signal, tertiary voltage signal is sent to controller 1.Controller 1 can be according to third electricity Pressure signal determines the quality grade of circuit board under test 4.
Further, the circuit board detecting system can also include display device (not being painted in figure), display device with Controller 1 is connected, for showing the waveform or reception delay time t of the tertiary voltage signal.The reception delay time, t referred to, Signal generator 5 send the pulse signal time and controller 1 receive the tertiary voltage signal time difference.Display Device can be oscillograph.
Specifically, being preset with voltage threshold U or time threshold T in controller 1, voltage threshold U is the generation of signal generator 5 Pulse signal maximum voltage value.The side that time threshold T can be averaged by the testing result to multiple circuit board under test Formula determines, in order to guarantee the accuracy of detection, in general, time threshold T is the detection knot according to 30 or more circuit board under test What fruit was calculated.
Controller 1 can judge the quality grade of circuit board under test 4 by any one in following 2 kinds of modes:
1, according to tertiary voltage signal u and preset voltage threshold U, the quality grade of the circuit board under test is determined.
2, according to reception delay time t and preset time threshold T, the quality grade of the circuit board under test is determined.
The scheme of the quality grade of above two judgement circuit board under test 4 is described in detail individually below.
For scheme 1, controller 1 is specifically used for, and calculates the difference between tertiary voltage signal u and voltage threshold U Δ u, Δ u=│ u-U │, calculate ratio p, p=the Δ u/U of Δ u and U, and according to p and preset quality grade threshold value Q determine to The quality grade of slowdown monitoring circuit plate 4.
Specifically, quality grade threshold value Q is preset in controller 1, the first quality grade threshold value q1 and second is included at least Quality grade threshold value q2, q1 < q2.The size of q1 and q2 can carry out certainly according to the requirement standard of the circuit board product quality of user Row setting, requirement of the user to circuit board product quality is higher, then the value of q1 and q2 is smaller, and user is to circuit board product quality Requirement it is lower, then the value of q1 and q2 is bigger.In general, q1 can be set to 3%-5%, q2 may be configured as 8%-10%.
Controller 1 is specifically used for, and as 0≤p < q1, determines that the quality grade of circuit board under test 4 is excellent;When q1≤p < When q2, determine that the quality grade of circuit board under test 4 is medium;As p >=q2, determine that the quality grade of circuit board under test 4 is poor Deng.
That is, p is smaller, illustrate that the size of tertiary voltage signal and voltage threshold U are closer, the production of circuit board under test Product quality is higher.
It should be noted that the quantity of quality grade threshold value Q can determine according to actual needs, quality grade threshold value Q's Quantity is more, then product quality grade classification is more careful.
For scheme 2, controller 1 is specifically used for, and calculates the difference between reception delay time t and time threshold T Δ t, Δ t=│ t-T │, calculate ratio m, m=the Δ t/T of Δ t and T, and determine circuit under test according to m and quality grade threshold value Q The quality grade of plate 4.
Controller 1 is specifically used for, and as 0≤m < q1, determines that the quality grade of circuit board under test 4 is excellent;When q1≤m < When q2, determine that the quality grade of circuit board under test is medium;As m >=q2, determine that the quality grade of circuit board under test 4 is poor Deng.
The present invention is not only able to detect whether circuit board is qualified by circuit kit plate detection system, additionally it is possible to detect The quality grade of qualified circuit board, further decreases testing cost.
FPCA or PCBA circuit board is waited for that the electrode in binding region immerses in test solution by the present invention, is surveyed by allotment The concentration of solution, the conductivity of proportion adjustment test solution are tried, and is passed through test to the control unit of FPCA or PCBA circuit board Voltage signal can be detected out the whether qualified of FPCA or PCBA.Compared to existing test fixture, circuit board detecting of the invention System has the advantage that
In detection process, only circuit board under test need to be immersed test solution to binding region, without contraposition, improve detection Efficiency;Multiple circuit boards can be once tested, detection efficiency is further increased;In addition to can detecte circuit board whether other than qualification, The voltage or reception delay that test signal can also be received by detection, detect the quality grade of qualified circuit board;The detection System is suitable for the detection of the circuit board of various models, without the matched special test electricity of circuit board fabrication for every kind of model Road plate reduces testing cost.
It is understood that the principle that embodiment of above is intended to be merely illustrative of the present and the exemplary implementation that uses Mode, however the present invention is not limited thereto.For those skilled in the art, essence of the invention is not being departed from In the case where mind and essence, various changes and modifications can be made therein, these variations and modifications are also considered as protection scope of the present invention.

Claims (7)

1. a kind of circuit board detecting system characterized by comprising controller, test solution and for hold it is described test it is molten The container of liquid, circuit board under test wait for that each electrode of binding region is immersed in the test solution;
The controller is connected with the control unit of circuit board under test, for described control unit send first voltage signal and Second voltage signal, so that described control unit is respectively by the first voltage signal and second voltage signal loading in electricity to be measured Road plate waits on each adjacent two electrode in binding region;Receive the adjacent two interelectrode impedance of each group that described control unit is sent Detected value respectively compares the adjacent two interelectrode impedance detection value of each group with the conductivity of the test solution, and Judge whether circuit board under test is qualified according to comparison result;Wherein, when each adjacent two interelectrode impedance value is equal to the survey When trying the conductivity of solution, determine that the circuit board under test is qualified;
It further include signal generator, the signal generator is connected with the control unit of circuit board under test, is used for the control Unit sends pulse signal, waits in binding region so that the pulse signal is loaded on circuit board under test by described control unit On electrode;
The container waits for that the opposite inner wall of the electrode in binding region is made of metal material with the circuit board under test, and with The circuit board under test waits for that the electrode in binding region forms electrolytic capacitor;
The controller is connected with the inner wall of the container, is also used to receive the tertiary voltage letter that the electrolytic capacitor is sent Number u, and according to the tertiary voltage signal u and preset voltage threshold U, determine the quality grade of the circuit board under test;Or Person receives the tertiary voltage signal u that the electrolytic capacitor is sent, determines reception delay time t, and when according to the reception delay Between t and preset time threshold T, determine the quality grade of the circuit board under test, reception delay time t is the signal Generator send the pulse signal time and the controller receive the tertiary voltage signal time difference.
2. circuit board detecting system as described in claim 1, which is characterized in that the test solution be not with circuit board under test The solution that inner wall to electrode and the container in binding region chemically reacts.
3. circuit board detecting system as described in claim 1, which is characterized in that the volume of a container can accommodate more simultaneously A circuit board under test.
4. circuit board detecting system as described in any one of claims 1-3, which is characterized in that the controller is specifically used for, When at least one set of adjacent two interelectrode impedance detection value is greater than the conductivity of the test solution, the circuit under test is determined Plate open circuit;When at least one set of adjacent two interelectrode impedance detection value is less than the conductivity of the test solution, described in determination Circuit board under test short circuit.
5. circuit board detecting system as described in claim 1, which is characterized in that it further include display device, the display device It is connected with the controller, for showing the waveform or reception delay time t of the tertiary voltage signal.
6. circuit board detecting system as described in claim 1, which is characterized in that the controller is specifically used for, and calculates third Difference DELTA u between voltage signal u and voltage threshold U, Δ u=│ u-U │ calculate ratio p, p=the Δ u/U of Δ u and U, and root The quality grade of the circuit board under test is determined according to p and preset quality grade threshold value Q;Alternatively, calculate reception delay time t and Difference DELTA t between time threshold T, Δ t=│ t-T │ calculate ratio m, m=the Δ t/T of Δ t and T, and according to m and preset Quality grade threshold value Q determines the quality grade of the circuit board under test.
7. circuit board detecting system as claimed in claim 6, which is characterized in that the quality grade threshold value Q includes at least the One quality grade threshold value q1 and the second quality grade threshold value q2;
The controller is specifically used for, as 0≤p < q1, alternatively, determining the quality grade of the circuit board under test when 0≤m < q1 It is excellent;As q1≤p < q2, alternatively, determining that the quality grade of the circuit board under test is medium when q1≤m < q2;As p >=q2, Alternatively, determining that the quality grade of the circuit board under test is difference etc. when m >=q2.
CN201610885231.4A 2016-10-10 2016-10-10 A kind of circuit board detecting system Expired - Fee Related CN106291333B (en)

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CN107607858B (en) * 2017-09-22 2020-08-28 信利光电股份有限公司 Method, system and device for determining open circuit position of module and readable storage medium
CN109164311A (en) * 2018-07-13 2019-01-08 智车优行科技(上海)有限公司 Fault detection method and device, electronic equipment
CN110596616A (en) * 2019-10-12 2019-12-20 上海泽丰半导体科技有限公司 Power supply impedance test method and circuit board
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