CN106291181A - A kind of electric automobile VCU comprehensive intelligent test system and method - Google Patents
A kind of electric automobile VCU comprehensive intelligent test system and method Download PDFInfo
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- CN106291181A CN106291181A CN201610629014.9A CN201610629014A CN106291181A CN 106291181 A CN106291181 A CN 106291181A CN 201610629014 A CN201610629014 A CN 201610629014A CN 106291181 A CN106291181 A CN 106291181A
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- 238000012360 testing method Methods 0.000 title claims abstract description 191
- 238000000034 method Methods 0.000 title claims description 9
- 230000005611 electricity Effects 0.000 claims description 7
- 238000010998 test method Methods 0.000 claims description 5
- 238000004891 communication Methods 0.000 claims description 4
- 238000011156 evaluation Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 claims description 2
- 238000004088 simulation Methods 0.000 claims 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/005—Testing of electric installations on transport means
- G01R31/006—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks
- G01R31/007—Testing of electric installations on transport means on road vehicles, e.g. automobiles or trucks using microprocessors or computers
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- Microelectronics & Electronic Packaging (AREA)
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- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention discloses a kind of electric automobile VCU comprehensive intelligent test system, including the test equipment frock being connected with VCU and host computer；Described test equipment frock is for producing the condition required for VCU work；Described upper PC is connected with test equipment frock and VCU；Duty for Treatment Analysis VCU.It is the most qualified that the electric automobile VCU comprehensive intelligent test system that the present invention provides can quickly detect electric automobile VCU, is used for quickly detecting electric automobile VCU by different TCH test channels.
Description
Technical field
The present invention relates to electric automobile field, particularly a kind of electric automobile VCU comprehensive intelligent test system.
Background technology
Electric automobile VCU is the most important electronic unit of electric automobile, and the most qualified in order to enable quickly to detect product, having must
Design a kind of electric automobile VCU comprehensive intelligent test system to meet factory, electric automobile VCU comprehensive intelligent test system
Unite by computer virtual technology, produce electric automobile VCU and normally work required various conditions, be that electric automobile VCU is in
Duty, and automatically test, evaluate its indices.
Accordingly, it would be desirable to a kind of electric automobile VCU comprehensive intelligent test system.
Summary of the invention
The purpose of the present invention is to propose to electric automobile VCU comprehensive intelligent test system.
It is an object of the invention to be achieved through the following technical solutions:
The electric automobile VCU comprehensive intelligent test system that the present invention provides, including the test equipment frock being connected with VCU
And host computer；
Described test equipment frock is for producing the condition required for VCU work；Described upper PC and test equipment work
Dress and VCU connect；Duty for Treatment Analysis VCU.
Further, described test equipment frock includes at TCH test channel, signal pickup assembly, signal transmitting apparatus, signal
Reason device；
Described signal pickup assembly and TCH test channel are connected to the test signal of collecting test passage, and will test signal
Host computer is returned to by serial ports；
Described test signal is transferred in processor；Data after processor processes are passed by described signal transmitting apparatus
It is passed in host computer.
Further, described TCH test channel includes analog input channel and digital input channel；
Described analog input channel, for driving test equipment frock output analogue signal single to VCU by host computer
Analog input end mouth, slave computer is tested the voltage of corresponding ports and returns host computer；
Described digital input channel: for driving test equipment frock to input height to the single port of VCU by host computer
Low level value and frequency values, send instructions under host computer, and VCU gathers level and the frequency of all digital input channels after receiving instruction
Rate information, is uploaded to host computer, and host computer judges to test whether to pass through according to information of uploading.
The electric automobile VCU comprehensive intelligent method of testing that the present invention provides, comprises the following steps:
Input normal piezoelectric voltage；
By host computer test voltage point: first close key switch host computer test each electrical voltage point within VCU, then
Opening key switch, host computer test each electrical voltage point within VCU again, host computer judges that the voltage of test is the most qualified；
Being tested by VCU monitoring voltage: host computer transmitting order to lower levels, it is each that VCU receives after instruction within oneself test VCU
Individual electrical voltage point, is uploaded to host computer by CAN-A passage, and host computer judges to test whether to pass through；
Operating power consumption is tested: host computer test input supply voltage and electric current, evaluation work power consumption；
EEPROM writes read test: send instructions under host computer, EEPROM write internal after receiving instruction for VCU and reading
Fetch data, VCU feedback write and the state read, and return write and the data read to host computer, host computer is according to uploading
Information judges to test whether to pass through；
Analog input channel is tested: host computer drives the test equipment single port input analog voltage to VCU or resistance
Signal, sends instructions under host computer, and VCU gathers the information of voltage of all analog input channels after receiving instruction, be uploaded to upper
Machine, host computer judges to test whether to pass through according to information of uploading；
Digital input channel is tested: host computer drives test equipment to input low and high level value and frequency to the single port of VCU
Rate value, sends instructions under host computer, and VCU gathers level and the frequency information of all digital input channels after receiving instruction, upload
To host computer, host computer judges to test whether to pass through according to information of uploading；
Low limit drives and flash drives test: host computer drives test equipment to drive to the single low limit of VCU or flash drives
Port is switched on or off load, sends instructions under host computer, and VCU gathers all low limits after receiving instruction and flash drives passage
Level value, is uploaded to host computer, the voltage of host computer test load, and host computer judges to test whether to pass through according to information of uploading；
H bridge drives test: host computer drives test equipment to drive port to be switched on or off load to the H bridge in VCU, upper
Sending instructions under machine, VCU drives forward channel according to instruction unpack or closedown H bridge after receiving instruction, opens or closes H bridge and drives
Backward channel, VCU gathers H bridge supply voltage and the level value of OUTB, is uploaded to host computer, the voltage of host computer test load,
Host computer judges to test whether to pass through according to information of uploading；
Under key switch electricity: host computer drive test equipment close key switch, after time delay host computer test VCU in each
Individual electrical voltage point voltage, host computer judges to test whether to pass through；
Outside rigid line controls power-on and power-off test: send instructions under host computer, outside host computer is opened and closed by test equipment
Portion's rigid line control signal, each electrical voltage point voltage in host computer test VCU after time delay, host computer judges to test whether to pass through；
Communication test: host computer sends appointment data by CAN B, CAN C, CAN-S passage to VCU, and VCU passes through CAN
B, CAN C, CAN-S passage returns to host computer and specifies data, and host computer judges to test whether to pass through；
Detection terminates.
Further, further comprising the steps of:
Secondary cpu function test: include that analog input channel drives test with low limit；
Force lower electrical testing: host computer sends instructions by under CAN channel S, and secondary CPU closes power supply lower electric tube foot, time delay
Each electrical voltage point voltage in host computer test VCU after 300mS, host computer judges to test whether to pass through；
Electrical testing in pressure: host computer sends instructions by under CAN channel S, and secondary CPU turns on the power the pin that powers on, time delay
Each electrical voltage point voltage in host computer test VCU after 300mS, host computer judges to test whether to pass through.
Owing to have employed technique scheme, present invention have the advantage that:
It is the most qualified that the electric automobile VCU comprehensive intelligent test system that the present invention provides can quickly detect electric automobile VCU,
By different TCH test channels, electric automobile VCU is used for quickly detecting.
Other advantages, target and the feature of the present invention will be illustrated to a certain extent in the following description, and
And to a certain extent, will be apparent to those skilled in the art based on to investigating hereafter, or can
To be instructed from the practice of the present invention.The target of the present invention and other advantages can be realized by description below and
Obtain.
Accompanying drawing explanation
The accompanying drawing of the present invention is described as follows.
Fig. 1 is the electric automobile VCU comprehensive intelligent test principle schematic diagram of the present invention.
Fig. 2 is the electric automobile VCU comprehensive intelligent method of testing flow chart of the present invention.
Detailed description of the invention
The invention will be further described with embodiment below in conjunction with the accompanying drawings.
Embodiment 1
As it is shown in figure 1, a kind of electric automobile VCU comprehensive intelligent test system that the present embodiment provides, it is connected including with VCU
The test equipment frock connect and host computer；
Described test equipment frock is for producing the condition required for VCU work；Described upper PC and test equipment work
Dress and VCU connect；Duty for Treatment Analysis VCU.
State test equipment frock and include TCH test channel, signal pickup assembly, signal transmitting apparatus, signal processor；
Described signal pickup assembly and TCH test channel are connected to the test signal of collecting test passage, and will test signal
Host computer is returned to by serial ports；
Described test signal is transferred in processor；Data after processor processes are passed by described signal transmitting apparatus
It is passed in host computer.
Described TCH test channel includes analog input channel and digital input channel；
Described analog input channel, for driving test equipment frock output analogue signal single to VCU by host computer
Analog input end mouth, slave computer is tested the voltage of corresponding ports and returns host computer；
Described digital input channel: for driving test equipment frock to input height to the single port of VCU by host computer
Low level value and frequency values, send instructions under host computer, and VCU gathers level and the frequency of all digital input channels after receiving instruction
Rate information, is uploaded to host computer, and host computer judges to test whether to pass through according to information of uploading.
Embodiment 2
A kind of electric automobile VCU comprehensive intelligent method of testing that the present embodiment provides, test device includes test equipment work
Dress and two parts of host computer (PC), described test equipment frock is connected with VCU, and produce VCU work required for various
Technical conditions, make VCU in running order；Host computer is used for controlling whole system work.
Described VCU includes lower wire testing method, and detailed process is as follows:
Host computer sends serial ports instruction to slave computer, after slave computer receives instruction, simulates letter accordingly according to instruction output
Number, digital signal, resistance signal, load signal waits until dependence test passage in VCU.
The signals such as the voltage of dependence test passage are detected by slave computer, and are returned to upper by serial ports by numerical value
Machine.
Host computer by test equipment to VCU send CAN instruct, after VCU receives instruction, according to agreement regulation concrete
Implication, performs concrete test assignment, and VCU issues host computer the information data communication protocol according to a preconcerted arrangement gathered.
The collection information that the numerical value that slave computer is returned by host computer and VCU return compares judgement and draws test result.
Wherein, test including analog input channel, after referring to that VCU normally works, host computer drive slave computer output 0V
Or 5V analogue signal is to VCU single analog input end mouth, the voltage of slave computer test corresponding ports also returns host computer, host computer
Issuing CAN instruction, VCU gathers the signal of all analog input channels that host CPU controls after receiving instruction, then pass through CAN-
A channel is uploaded to host computer the data gathered.Two groups of numerical value that host computer contrast receives judge test result.
Testing process is as in figure 2 it is shown, detailed process is as follows:
Host computer test voltage point: first close key switch host computer test each electrical voltage point within VCU, beat the most again
Opening key switch, host computer test each electrical voltage point within VCU, host computer judges that the voltage of test is the most qualified.
VCU monitoring voltage is tested: host computer transmitting order to lower levels, and VCU oneself tests each electricity within VCU after receiving instruction
Pressure point, is uploaded to host computer by CAN-A passage, and host computer judges to test whether to pass through.
Operating power consumption is tested: host computer test input supply voltage and electric current, evaluation work power consumption.
EEPROM writes read test: send instructions under host computer, EEPROM write internal after receiving instruction for VCU and reading
Fetch data, VCU feedback write and the state read, and return write and the data read to host computer, host computer is according to uploading
Information judges to test whether to pass through.
Analog input channel is tested: host computer drives the test equipment single port input analog voltage to VCU or resistance
Signal, sends instructions under host computer, and VCU gathers the information of voltage of all analog input channels after receiving instruction, be uploaded to upper
Machine, host computer judges to test whether to pass through according to information of uploading.
Digital input channel is tested: host computer drives test equipment to input low and high level value and frequency to the single port of VCU
Rate value, sends instructions under host computer, and VCU gathers level and the frequency information of all digital input channels after receiving instruction, upload
To host computer, host computer judges to test whether to pass through according to information of uploading.
Low limit drives and flash drives test: host computer drives test equipment to drive to the single low limit of VCU or flash drives
Port is switched on or off load, sends instructions under host computer, and VCU gathers all low limits after receiving instruction and flash drives passage
Level value, is uploaded to host computer, the voltage of host computer test load, and host computer judges to test whether to pass through according to information of uploading.
H bridge drives test: host computer drives test equipment to drive port to be switched on or off load to the H bridge in VCU, upper
Sending instructions under machine, VCU drives forward channel according to instruction unpack or closedown H bridge after receiving instruction, opens or closes H bridge and drives
Backward channel, VCU gathers H bridge supply voltage and the level value of OUTB, is uploaded to host computer, the voltage of host computer test load,
Host computer judges to test whether to pass through according to information of uploading.
Electricity under key switch: host computer drives test equipment to close key switch, host computer test VCU after time delay 300mS
In each electrical voltage point voltage, host computer judge test whether to pass through.
Outside rigid line controls power-on and power-off test: send instructions under host computer, outside host computer is opened and closed by test equipment
Portion's rigid line control signal, each electrical voltage point voltage in host computer test VCU after time delay 300mS, host computer judges to test whether
Pass through.
CAN B, CAN C, CAN-S communication test: host computer is referred to VCU transmission by CAN B, CAN C, CAN-S passage
Given data, VCU returns appointment data by CAN B, CAN C, CAN-S passage to host computer, and host computer judges to test whether to lead to
Cross.
Secondary cpu function test: include that analog input channel and low limit drive test, identical with upper.
Force lower electrical testing: host computer sends instructions by under CAN channel S, and secondary CPU closes power supply lower electric tube foot, time delay
Each electrical voltage point voltage in host computer test VCU after 300mS, host computer judges to test whether to pass through.
Electrical testing in pressure: host computer sends instructions by under CAN channel S, and secondary CPU turns on the power the pin that powers on, time delay
Each electrical voltage point voltage in host computer test VCU after 300mS, host computer judges to test whether to pass through.
Finally illustrating, above example is only in order to illustrate technical scheme and unrestricted, although with reference to relatively
The present invention has been described in detail by good embodiment, it will be understood by those within the art that, can be to the skill of the present invention
Art scheme is modified or equivalent, and without deviating from objective and the scope of the technical program, it all should be contained in the present invention
Protection domain in the middle of.
Claims (5)
1. an electric automobile VCU comprehensive intelligent test system, it is characterised in that: include the test equipment work being connected with VCU
Dress and host computer；
Described test equipment frock is for producing the condition required for VCU work；Described upper PC with test equipment frock and
VCU connects；Duty for Treatment Analysis VCU.
2. electric automobile VCU comprehensive intelligent test system as claimed in claim 1, it is characterised in that: described test equipment work
Dress includes TCH test channel, signal pickup assembly, signal transmitting apparatus and signal processor；
Described signal pickup assembly and TCH test channel are connected to the test signal of collecting test passage, and are passed through by test signal
Serial ports returns to host computer；
Described test signal is transferred in processor；Data after processor processes are transferred to by described signal transmitting apparatus
In host computer.
3. electric automobile VCU comprehensive intelligent test system as claimed in claim 1, it is characterised in that: described TCH test channel bag
Include analog input channel and digital input channel；
Described analog input channel, for driving test equipment frock output analogue signal to the single simulation of VCU by host computer
Input port, slave computer is tested the voltage of corresponding ports and returns host computer；
Described digital input channel: for driving test equipment frock to input height electricity to the single port of VCU by host computer
Level values and frequency values, send instructions under host computer, and VCU gathers level and the frequency letter of all digital input channels after receiving instruction
Breath, is uploaded to host computer, and host computer judges to test whether to pass through according to information of uploading.
4. an electric automobile VCU comprehensive intelligent method of testing, it is characterised in that: comprise the following steps:
Input normal piezoelectric voltage；
By host computer test voltage point: first close key switch host computer test each electrical voltage point within VCU, beat the most again
Opening key switch, host computer test each electrical voltage point within VCU, host computer judges that the voltage of test is the most qualified；
Being tested by VCU monitoring voltage: host computer transmitting order to lower levels, VCU oneself tests each electricity within VCU after receiving instruction
Pressure point, is uploaded to host computer by CAN-A passage, and host computer judges to test whether to pass through；
Operating power consumption is tested: host computer test input supply voltage and electric current, evaluation work power consumption；
EEPROM writes read test: send instructions under host computer, EEPROM write internal after receiving instruction for VCU and reading number
According to, VCU feedback write and the state read, and return write and the data read to host computer, host computer is according to uploading information
Judge to test whether to pass through；
Analog input channel is tested: host computer drives the test equipment single port input analog voltage to VCU or resistance signal,
Sending instructions under host computer, VCU gathers the information of voltage of all analog input channels after receiving instruction, be uploaded to host computer, on
Position machine judges to test whether to pass through according to information of uploading；
Digital input channel is tested: host computer drives test equipment to input low and high level value and frequency values to the single port of VCU,
Sending instructions under host computer, VCU gathers level and the frequency information of all digital input channels after receiving instruction, be uploaded to upper
Machine, host computer judges to test whether to pass through according to information of uploading；
Low limit drives and flash drives test: host computer drives test equipment to drive to the single low limit of VCU or flash drives port
Being switched on or off load, send instructions under host computer, VCU gathers all low limits and the level of flash driving passage after receiving instruction
Value, is uploaded to host computer, the voltage of host computer test load, and host computer judges to test whether to pass through according to information of uploading；
H bridge drives test: host computer drives test equipment to drive port to be switched on or off load, under host computer to the H bridge in VCU
Sending instructions, VCU drives forward channel according to instruction unpack or closedown H bridge after receiving instruction, opens or closes H bridge and drives reversely
Passage, VCU gathers H bridge supply voltage and the level value of OUTB, is uploaded to host computer, and the voltage of host computer test load is upper
Machine judges to test whether to pass through according to information of uploading；
Electricity under key switch: host computer drives test equipment to close key switch, each electricity in host computer test VCU after time delay
Pressure point voltage, host computer judges to test whether to pass through；
Outside rigid line controls power-on and power-off test: send instructions under host computer, and host computer opens and closes outside hard by test equipment
Line control signal, each electrical voltage point voltage in host computer test VCU after time delay, host computer judges to test whether to pass through；
Communication test: host computer by CAN B, CAN C, CAN-S passage to VCU send specify data, VCU by CAN B,
CAN C, CAN-S passage returns to host computer and specifies data, and host computer judges to test whether to pass through；
Detection terminates.
5. electric automobile VCU comprehensive intelligent method of testing as claimed in claim 4, it is characterised in that: further comprising the steps of:
Secondary cpu function test: include that analog input channel drives test with low limit；
Force lower electrical testing: host computer sends instructions by under CAN channel S, and secondary CPU closes power supply lower electric tube foot, time delay 300mS
Each electrical voltage point voltage in rear host computer test VCU, host computer judges to test whether to pass through；
Electrical testing in pressure: host computer sends instructions by under CAN channel S, and secondary CPU turns on the power the pin that powers on, time delay 300mS
Each electrical voltage point voltage in rear host computer test VCU, host computer judges to test whether to pass through.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610629014.9A CN106291181A (en) | 2016-08-03 | 2016-08-03 | A kind of electric automobile VCU comprehensive intelligent test system and method |
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| CN201610629014.9A CN106291181A (en) | 2016-08-03 | 2016-08-03 | A kind of electric automobile VCU comprehensive intelligent test system and method |
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| CN108919784A (en) * | 2018-07-25 | 2018-11-30 | 重庆长安汽车股份有限公司 | A kind of detection system and method for new-energy automobile remote monitoring system terminal |
| CN109213110A (en) * | 2017-06-29 | 2019-01-15 | 长城汽车股份有限公司 | The test device and test macro of entire car controller |
| CN109388126A (en) * | 2018-10-16 | 2019-02-26 | 南京越博动力***股份有限公司 | A kind of vehicle material object loading functional test platform |
| CN109991958A (en) * | 2019-04-28 | 2019-07-09 | 广州小鹏汽车科技有限公司 | Electric test method up and down, device and the electric vehicle of electric vehicle |
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Application publication date: 20170104 |
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