CN106290432A - A kind of low-temperatureX-ray induction thermoluminescence spectral measurement device - Google Patents
A kind of low-temperatureX-ray induction thermoluminescence spectral measurement device Download PDFInfo
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- CN106290432A CN106290432A CN201510289400.3A CN201510289400A CN106290432A CN 106290432 A CN106290432 A CN 106290432A CN 201510289400 A CN201510289400 A CN 201510289400A CN 106290432 A CN106290432 A CN 106290432A
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Abstract
The present invention relates to a kind of low-temperatureX-ray induction thermoluminescence spectral measurement device, described measurement apparatus includes x-ray source, temperature control unit, the sample stage being arranged in temperature control unit, light collecting system and grating spectrograph, and described temperature control unit includes insulation shell and the temperature sensor being arranged in insulation shell and heating cooler.The X-Ray that the present invention provides induces thermoluminescence spectral measurement device, introduce grating spectrograph, this grating spectrograph uses the reflective flat field grating that glitters to realize the dispersion to optical signal, imageing sensor is used disposably to capture full spectral wavelength flashlight spectrum, obtaining the time cycle the shortest (can reach 1ms) of spectrum, can realize the Real-time Collection of spectrum, spectrum is reproducible, and some transient state characteristics of optical signal can be utilized, moreover it is possible to reduce device overall volume, reduce device overall power.
Description
Technical field
The present invention relates to X-Ray ray, high/low temperature controls and spectral detection field, particularly to a kind of X-Ray induction heat
Stimulating spectrum detection device.
Background technology
Electron-hole pair can be produced after material is by high energy particle (such as X-ray, gamma-rays etc.) irradiation.In material system
During Bei, various defect (electron trap, hole trap, antisite defect can be there is unavoidably owing to preparation technology limits
Deng), after high-energy ray irradiation, the electronics or the hole that are in excited state can be temporary by emittance by the defect capture in material
Time be stored in trap.But these energy levels are the most unstable, and when heated, the energy in trap discharges the most in the form of light,
This phenomenon is referred to as thermoluminescence.Thermoluminescence is significant for investigation of materials and Knowing material luminescence process.With flicker
As a example by material, scintillation material is a kind of will to be incident on high-energy ray thereon (X/ gamma-rays) or particle is converted to ultraviolet or can
See the crystalline state energy transfer medium of light, be widely used in high-energy physics and nuclear physics experiment, nuclear medical imaging (Computed
Tomography, is called for short CT and Positron Emission Tomography, is called for short PET), industry CT examines online
Survey, oil well exploration, safety random check and anti-terrorism application etc..Defect in scintillation material shows as at band gap in band structure
Middle formation trap.The existence of defect has a strong impact on scintillation material carrier transport process, causes luminous slow component, reduces light and produce
Volume, the reduction of these scintillation properties can have a strong impact on the practical application effect of material, causes detection efficient and imaging resolution significantly
Reduce.Thermoluminescence spectrogrph is the powerful of research solid defects, trap depth, trap etc. can be analyzed table
Levy.According to result, preparation technology can be designed and optimize by we, improves luminescent properties.Additionally, we can basis
Trap level position, is designed the energy level of scintillation material calculating, and this anticipates to prepare novel High Light Output scintillation material of decaying soon
Justice is great.The trap depth of material is closely related with thermoluminescent temperature, this is because, when material is heated, carrier first by
Discharging in shallower trap, when the carrier stored in these traps all releases, light intensity reduces, and forms heat and releases
First peak in light collection of illustrative plates.Along with the increase of heating-up temperature, the deeper carrier in trap is released.Therefore, thermoluminescence
The temperature range that instrument can reach directly determines its trap depth that can detect.Low temperature only used by the trap being in shallow energy level
Thermoluminescence just can detect.
Thermoluminescence test system can be additionally used in thermoluminescence Ding Nianfa and judges the ancient pottery and porcelain age, mainly by thermoluminescence signal
Intensity carries out age judgement.Because from the point of view of ceramic, wherein contain substantial amounts of mineral crystal, as quartz, Anhydrite and
Calcites etc., these crystal by the effect of radioprotective (such as α, β and γ), have accumulated suitable energy for a long time, if therefore
Ceramic heat, will have observed that thermoluminescence phenomenon, the number of the nuclear radiation that thermoluminescent intensity is accepted to it is directly proportional.Due to
Radioprotective suffered by pottery comes from the radioimpurity radioactive impurity of the pettiness contained by natural environment and pottery itself (such as uranium, thorium and potassium
40 etc.).Its radioactive dosage relative constancy, the most thermoluminescent intensity just and is directly proportional by the length of spoke time.At pottery
Thermoluminescence energy original in sintering procedure all can discharge because of high temperature, and hereafter pottery heat accumulation again releases optical signal, institute
With the thermoluminescence signal obtained measured by last, it is that the age of firing to pottery is directly proportional, here it is thermoluminescence dating is the most former
Reason.Similarly, according to the power of thermoluminescence signal, it is also possible to carry out the mensuration of irradiation dose, can be made into irradiation agent with this principle
Amount instrument.
It addition, luminescent spectrum is to be determined by the level structure of material itself, therefore can be according to light produced by material
Spectrum, carries out qualitative analysis discriminating to light emitting ionic, plays an important role in the field such as biology, chemistry, environment.
At present, the domestic low temperature X-Ray that there is no induces thermoluminescence spectral measurement device, and existing thermoluminescence instrument is only capable of test cabinet
The thermoluminescence signal that temperature is above, main reason is that: realize the low temperature control of sample and X-ray irradiation and light the most simultaneously
Spectrum receives the most difficult.But, as it was previously stated, the trap depth of material internal is the most relevant to temperature, such as scintillation material
Position defect is generally present between 100K-200K, so these shallow energy level defects cannot be visited by existing thermoluminescence
Surveying, its measurement scope limits this technology in investigation of materials and the application of context of detection.And lure carrying out similar X-Ray
Leading in fluorescence spectrum measuring apparatus, such device is made up of X-Ray source, fluorescent probe, monochromator, and such device is used for receiving
The spectroscopic data of collection X-Ray induced fluorescence.X-Ray source therein is as exciting light sources, and fluorescent probe is used for collecting fluorescence
The fluorescence that material produces after being excited, monochromator is used for detecting fluorescence spectrum, carries out during fluoroscopic examination (see Fig. 2), and fluorescence is visited
The fluorescence that head is collected first passes through the slit 21 on monochromator and enters monochromator, then reflexes to grating 23 by a reflecting mirror 22
On, reflex on single point detector 25, due to the angle from grating of different wave length by another reflecting mirror 24 after grating dispersion
Degree difference, controls grating 23 order rotation, and the light order of the different wave length after grating dispersion can be made to be irradiated to single point detector
On 25, one all after date of grating 23 order rotation, the scanning to fluorescence spectrum can be realized, and then obtain fluorescence spectrum.
The defect of such X-Ray induced fluorescence spectral measurement device is:
1. needing the driver part that configuration driven grating rotates in monochromator, therefore its volume, power consumption are the biggest, cause whole device
Volume, power consumption the hugest, and the time cycle obtaining fluorescence spectrum is longer, it is impossible to realize adopting in real time of fluorescence spectrum
Collection, thus also cannot some transient state characteristics of analysis of fluorescence signal, spectrum repeatability is the most poor；
The most only X-Ray induced fluorescence spectrum is measured, X-Ray in the range of longer wavelength induction thermoluminescence spectrum without
Method measures, and have impact on the information content of analysis；
Existing thermoluminescence instrument only has room temperature above thermoluminescence test system, main reason is that prior art does not has integrated can carry out
Liquid nitrogen or the sample room of liquid helium cooling.
Thus, thermoluminescence spectral measurement device is induced in the urgent need to the low temperature X-Ray of a kind of excellent performance in this field.
Summary of the invention
It is contemplated that fill up the technological gap of low temperature X-Ray induction thermoluminescence spectral measurement device, the invention provides one
Plant low-temperatureX-ray induction thermoluminescence spectral measurement device.
The invention provides a kind of low-temperatureX-ray induction thermoluminescence spectral measurement device, described measurement apparatus includes X-ray
Source, temperature control unit, the sample stage being arranged in temperature control unit, light collecting system and grating spectrograph, described
Temperature control unit includes insulation shell and the temperature sensor being arranged in insulation shell and heating cooler, wherein,
Hole that described x-ray source is set to be emitted through on the insulation shell of temperature control unit, it is incident on the sample of sample stage
X-ray；
Described temperature sensor is set to detect the temperature of sample on sample stage, and described heating cooler is set to respond temperature sensor and surveys
The sample temperature of amount also regulates sample temperature to design temperature, described insulation shell is provided with and releases for the heat making sample send
Optical signal transmission is to the hole outside insulation shell；
Described opto-collection system is set to gather the thermoluminescence signal that sends of sample and thermoluminescence signal is delivered to grating spectrograph；
Described grating spectrograph is set to accept the thermoluminescence signal of opto-collection system conveying and thermoluminescence signal is delivered to its inside
Imageing sensor.
System of testing in the present invention includes X-Ray source, temperature control unit, the sample that is arranged in temperature control unit
Platform, light collecting system, grating spectrograph.Luminescent material (sample) loads the sample stage in temperature control unit and through temperature control system
System is down to assigned temperature, carries out irradiation with X-Ray source by doses afterwards, and after irradiation stops, sample is fast according to setting intensification
Rate heats up, and can collect, during heating up, the thermoluminescence signal that material produces due to variations in temperature.
It is preferred that described x-ray source is can the X-ray tube of directional transmissions X-ray；
X-ray tube passes through the threshold value needed for directional transmissions X-ray, the irradiation dose specimen material to be reached of X-ray.
It is preferred that described temperature control unit is configured to regulate sample temperature to 77K.
Sample temperature can be down to liquid nitrogen temperature (77K) by temperature control unit, such that it is able to measure defect to occur in 100-
Scintillation material between 200K.
It is preferred that described opto-collection system includes collimating lens, condenser lens, conduction optical fiber, wherein,
Collimating lens is set to the thermoluminescence signal collimation that will gather；
Condenser lens is set to collimated thermoluminescence signal focus to conducting optical fiber；
Described conduction optical fiber is set to carry thermoluminescence signal to grating spectrograph.
The opto-collection system possessing above-mentioned composition can realize thermoluminescence signals collecting, transmission well.
Described grating spectrograph includes slit device, flashlight reflecting mirror, reflective flat field grating, the reflecting condensation of glittering
Mirror, imageing sensor, wherein,
Described slit device is provided for by thermoluminescence signal；
Described flashlight reflecting mirror is set to the acceptance thermoluminescence signal by slit device and by thermoluminescence signaling reflex to reflective sudden strain of a muscle
Credit flat field grating；
The described reflective flat field grating that glitters is set to accept thermoluminescence signal and by thermoluminescence signaling reflex to mirror condenser；
Described mirror condenser is set to accept thermoluminescence signal and by thermoluminescence signaling reflex to imageing sensor.
It is preferred that described temperature sensor is embedded in described sample stage.
Beneficial effects of the present invention:
The X-Ray that the present invention provides induces thermoluminescence spectral measurement device, introduces grating spectrograph, and this grating spectrograph uses anti-
The formula of the penetrating flat field grating that glitters realizes dispersion to optical signal, uses imageing sensor disposably to capture full spectral wavelength flashlight light
Spectrum, obtains the time cycle the shortest (can reach 1ms) of spectrum, can realize the Real-time Collection of spectrum, and spectrum is reproducible, and
Some transient state characteristics of optical signal can be utilized, moreover it is possible to reduce device overall volume, reduce device overall power；Relative to tradition
X-Ray fluorescence spectrum measuring apparatus, this device adds sample temperature control system, can not only detect X-Ray fluorescence spectrum,
The X-Ray that can also detect wider range induces thermoluminescence spectrum, and to sample analysis more comprehensively, accurately, data message is richer
Rich.
Accompanying drawing explanation
Fig. 1 is the structural representation of X-Ray induction thermoluminescence spectral measurement device in one embodiment of the present invention；
Fig. 2 is the structural representation of existing monochromator；
Fig. 3 is the structural representation of the temperature control box in one embodiment of the present invention in X-Ray induction thermoluminescence spectral measurement device
Figure；
Fig. 4 is the structural representation of the light collecting system in one embodiment of the present invention in X-Ray induction thermoluminescence spectral measurement device
Figure；
Fig. 5 is the structural representation of the grating spectrograph in one embodiment of the present invention in X-Ray induction thermoluminescence spectral measurement device
Figure；
Fig. 6 is the X-Ray induction thermoluminescence spectrogrph test system architecture figure of embodiment 1；
Fig. 7 is that Pr:LuAG scintillating ceramic (adds Sc2O3,La2O3Sintering aid) Thermo-luminescence (left: gram calorie is compared in Milan
University's test result, right: embodiment 1 tests the result that system obtains)；
Fig. 8 is the Ce, Pr:Gd that employing embodiment 1 tests prepared by the different process of system acquisition2O2S pottery Thermo-luminescence；
Fig. 9 is the Ce, Pr:Gd of document report2O2The typical Thermo-luminescence of S (Optical Materials 33 (2011) 1514
1518)。
Detailed description of the invention
The present invention is further illustrated, it should be appreciated that accompanying drawing and following embodiment are only below in conjunction with accompanying drawing and following embodiment
For the present invention is described, and the unrestricted present invention.
For defect present in above-mentioned prior art, the technical problem to be solved is to provide a kind of X-Ray and lures
Lead Low Temperature Thermal stimulating spectrum detection device, it is achieved X-Ray fluorescence spectrum and X-Ray are induced adopting in real time of thermoluminescence spectrum
Collection, minimizing device overall volume, reduction device overall power.This invention solves low temperature X-Ray induction thermoluminescence spectrum
Test problems, significant to research luminescent material internal flaw especially shallow energy level defect, instrument can be used for heat and releases simultaneously
Light Ding Nianfa judges ancient pottery and porcelain age and irradiation metering assessment.
The invention provides a kind of low-temperatureX-ray induction thermoluminescence spectral measurement device, described measurement apparatus includes X-ray
Source, temperature control unit, the sample stage being arranged in temperature control unit, light collecting system and grating spectrograph, described
Temperature control unit includes insulation shell and the temperature sensor being arranged in insulation shell and heating cooler, wherein,
Hole that described x-ray source is set to be emitted through on the insulation shell of temperature control unit, it is incident on the sample of sample stage
X-ray；
Described temperature sensor is set to detect the temperature of sample on sample stage, and described heating cooler is set to respond temperature sensor and surveys
The sample temperature of amount also regulates sample temperature to design temperature, described insulation shell is provided with and releases for the heat making sample send
Optical signal transmission is to the hole outside insulation shell；
Described opto-collection system is set to gather the thermoluminescence signal that sends of sample and thermoluminescence signal is delivered to grating spectrograph；
Described grating spectrograph is set to accept the thermoluminescence signal of opto-collection system conveying and thermoluminescence signal is delivered to its inside
Imageing sensor.
Test system includes X-Ray source, temperature control box, sample stage, light collecting system, grating spectrograph.Luminous material
Material loads temperature control box and is down to assigned temperature through temperature control system, carries out irradiation, spoke with X-Ray source by doses afterwards
Heat up according to setting heating rate according to sample after stopping, material can be collected during heating up due to variations in temperature product
Raw thermoluminescence signal.
As shown in Fig. 1 and Fig. 3 to Fig. 5, a kind of X-Ray that the embodiment of the present invention is provided induces thermoluminescence spectral measurement
Device, including X-Ray source 1, temperature control box 2, sample stage 31, light collecting system 3, grating spectrograph 4.
Described X-Ray source 1 is a kind of X-Ray pipe, can persistently launch the X-Ray bundle of orientation.The irradiation agent of its X-ray
Threshold value needed for amount material emission to be reached.
Described temperature control box 2 (see Fig. 3) includes insulation shell 34, temperature sensor 33, heating cooler 32.
Temperature transition can be become the signal of telecommunication by described temperature sensor 33, thus perception sample temperature information, this temperature passes
Sensor 33 is embedded within sample stage 31, for the temperature information of test sample.
Described heating cooler 32 can be by sample stage 31 heat temperature raising and refrigeration cool-down, according to temperature sensor 33 feedback
Temperature information carries out heating or lowering the temperature with the difference of setting value, makes sample stage 31 temperature reach design temperature.And in order to protect
Demonstrate,proving whole sample to be heated evenly, sample and specimen heating holder need to fit together.
The low temperature range that can reach is determined by insulation shell, as to liquid helium (absolute zero) or liquid nitrogen temperature
(77K)。
Described sample stage 31, temperature sensor 33, heating cooler 32 are all placed in insulation shell 34, to reduce
The operating power of temperature controller 32.
Described X-Ray source 1 and temperature control box 2 constitute excitation light path, and the X-Ray that X-Ray source 1 is launched enters temperature
Controlling box 2, get to the sample on sample stage 31, sample is heated refrigerator 32 and is heated to design temperature, sample afterwards
Launch X-Ray and induce thermoluminescence signal.
Described light collecting system 3 (see Fig. 4) includes collimating lens 41, condenser lens 42, conduction optical fiber 43；
The X-Ray of electromagnetic radiation is induced thermoluminescence signal to collimate by described collimating lens 41, focuses on through described condenser lens 42
To described conduction optical fiber 43, enter grating spectrograph 4 through conduction optical fiber 43.
Further, described grating spectrograph 4 (see Fig. 5) includes slit device 51, flashlight reflecting mirror 52, reflection
Formula is glittered flat field grating 53, mirror condenser 54, imageing sensor 55；
The described X-Ray induction thermoluminescence signal entering grating spectrograph 4 through conduction optical fiber 43, initially passes through slit device 51, then depends on
Secondary reflexed to the reflective flat field grating 53 that glitters by flashlight reflecting mirror 52, the reflective flat field grating 53 that glitters reflex to instead
Penetrate condenser lens 54, mirror condenser 54 reflex to imageing sensor 55.
Described light collecting system 3, grating spectrograph 4 constitute optical signal and receive loop.
In the embodiment of the present invention, described imageing sensor 45 uses the linear array CCD image that model is ILX511B and passes
Sensor, in other embodiments of the present invention, described imageing sensor can also use and can realize capturing full spectral wavelength fluorescence spectrum
Other imageing sensor.
The operation principle of the embodiment of the present invention is as follows:
X-Ray source 1 launch X-Ray through insulation shell 34, be radiated at the sample being fixed on sample stage 31, post-heating system
Sample is heated to design temperature according to the signal of temperature sensor 33 by cooler 32, and now, X-Ray induction i.e. launched by sample
Thermoluminescence signal；
The part X-Ray induction thermoluminescence signal exit portal by insulation shell 34, enters the collimating lens 41 of light collecting system 3,
The X-Ray of electromagnetic radiation is induced thermoluminescence signal to collimate by collimating lens 41, focuses on biography through described condenser lens 42
Guiding fiber 43, through the slit device 51 of the flashlight entrance grating spectrograph 4 of conduction optical fiber 43, through slit device 51,
Being reflexed to the reflective flat field grating 53 that glitters by flashlight reflecting mirror 52 the most successively, produce dispersion, dispersed light is glittered by reflective
Flat field grating 53 reflexes to mirror condenser 54, mirror condenser 54 dispersed light Signal Compression is reflexed to imageing sensor
55, imageing sensor 55 changed by mould electricity after capturing, the X-Ray forming a full spectral wavelength induces thermoluminescence light
Spectrum.The embodiment of the present invention is particularly well-suited to the X-Ray of the materials such as pottery and induces thermoluminescence spectral measurement.
The X-Ray that the present invention provides induces thermoluminescence spectral measurement device, introduces grating spectrograph, this grating spectrograph
Use the reflective flat field grating that glitters to realize the dispersion to optical signal, use imageing sensor disposably to capture full spectral wavelength letter
Number spectrum, obtains the time cycle the shortest (can reach 1ms) of spectrum, can realize the Real-time Collection of spectrum, spectrum repeatability
Good, and some transient state characteristics of optical signal can be utilized, moreover it is possible to reduce device overall volume, reduce device overall power；Relative to
Traditional X-ray-Ray fluorescence spectrum measuring apparatus, this device adds sample temperature control system, can not only detect X-Ray fluorescence
Spectrum, moreover it is possible to the X-Ray of detection wider range induces thermoluminescence spectrum, to sample analysis more comprehensively, accurately, data message
More rich.
Enumerate embodiment further below to describe the present invention in detail.It will similarly be understood that following example are served only for this
Bright it is further described, it is impossible to being interpreted as limiting the scope of the invention, those skilled in the art is according to the present invention's
Some nonessential improvement and adjustment that foregoing is made belong to protection scope of the present invention.The technique ginseng that following example is concrete
Number etc. is the most only an example in OK range, in the range of i.e. those skilled in the art can be done suitably by explanation herein
Select, and do not really want to be defined in the concrete numerical value of hereafter example.
Embodiment 1
Fig. 6 is the schematic diagram of X-Ray induced low temperature thermoluminescence test system, and wherein the ceiling voltage of X-Ray light source is 90Kv, electricity
Stream is 2-2.5mA；The temperature range of sample room is 77K (liquid nitrogen temperature)-500K, heating rate < 6K/min (adjustable)；Spectrum
Instrument detectivity is 26 photons (@250nm).The leading indicator of final test system is as shown in the table:
Test result 1:
Test material: Pr:LuAG scintillating ceramic (adds Sc2O3,La2O3Sintering aid)；
Material source: prepared by Shanghai silicate institute.
Red curve in Fig. 7 is with Sc2O3And La2O3Thermoluminescence for Pr:LuAG scintillating ceramic prepared by sintering aid
Curve.Exposure time is 5min；Irradiation dose is 70kv, 2.5mA；77K is 0.1k/min. to the heating rate of design temperature
Left figure is the Milan, ITA test result than card university, it can be seen that this sample has an obvious heat to release near 200K
Photopeak, the international well-known periodical of correlated results Yi obtains and delivers (J.Am.Ceram.Soc.2012,95 (7): 2130-2132.)
Right figure is to same sample, tests, by embodiment 1, the Thermo-luminescence that system obtains, it can be seen that result and Italy can
More consistent than the result of card university, illustrate that this instrument can obtain thermoluminescence signal accurately.
Test result 2:
Test material: Ce, Pr:Gd2O2S pottery；
Material source: Shanghai silicate institute.
Fig. 8 is the test system using embodiment 1 to build, to Ce, Pr:Gd2O2The thermoluminescence that S ceramic test obtains is bent
Line.Exposure time is 10min；Irradiation dose is 60kv, 2.2mA；The heating rate of 77K to 480K design temperature is
0.15k/min.As can be seen from the figure the thermoluminescence intensity of different process acquisition material has notable difference, intensity height to mean defect
Concentration is high, thus can cause reducing and the increase of slow component of photoyield.Preparation technology can be carried out accordingly preferably to obtain height
The scintillation material of performance.Test data obtain international counterparts accreditation, result that this result is reported for work with document consistent (see Fig. 9,
Optical Materials 33 (2011) 1,514 1518), illustrate that the low temperature thermoluminescence instrument developed according to embodiment 1 can obtain
Accurately test signal.
Claims (6)
1. a low-temperatureX-ray induction thermoluminescence spectral measurement device, it is characterized in that, described measurement apparatus includes x-ray source, temperature control unit, the sample stage being arranged in temperature control unit, light collecting system and grating spectrograph, described temperature control unit includes insulation shell and the temperature sensor being arranged in insulation shell and heating cooler, wherein
Described x-ray source is set to the hole being emitted through on the insulation shell of temperature control unit, the X-ray being incident on the sample of sample stage；
Described temperature sensor is set to detect the temperature of sample on sample stage, described heating cooler is set to respond the sample temperature of temperature sensor measurement and regulates sample temperature to design temperature, described insulation shell is provided with the thermoluminescence signal for making sample send and transmits to the hole outside insulation shell；
Described opto-collection system is set to gather the thermoluminescence signal that sends of sample and thermoluminescence signal is delivered to grating spectrograph；
Described grating spectrograph includes the thermoluminescence signal being set to accept opto-collection system conveying and thermoluminescence signal is delivered to its internal imageing sensor.
Measurement apparatus the most according to claim 1, it is characterised in that described x-ray source is can the X-ray tube of directional transmissions X-ray.
Measurement apparatus the most according to claim 1 and 2, it is characterised in that described temperature control unit is configured to regulate sample temperature to 77K.
Measurement apparatus the most according to claim 1 and 2, it is characterised in that described opto-collection system includes collimating lens, condenser lens, conduction optical fiber, wherein,
Collimating lens is set to the thermoluminescence signal collimation that will gather；
Condenser lens is set to collimated thermoluminescence signal focus to conducting optical fiber；
Described conduction optical fiber is set to carry thermoluminescence signal to grating spectrograph.
Measurement apparatus the most according to claim 1 and 2, it is characterised in that described grating spectrograph also includes slit device, flashlight reflecting mirror, reflective flat field grating, the mirror condenser of glittering, wherein,
Described slit device is provided for by thermoluminescence signal；
Described flashlight reflecting mirror is set to the acceptance thermoluminescence signal by slit device and by thermoluminescence signaling reflex to the reflective flat field grating that glitters；
The described reflective flat field grating that glitters is set to accept thermoluminescence signal and by thermoluminescence signaling reflex to mirror condenser；
Described mirror condenser is set to accept thermoluminescence signal and by thermoluminescence signaling reflex to imageing sensor.
Measurement apparatus the most according to claim 1 and 2, it is characterised in that described temperature sensor is embedded in described sample stage.
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| CN110006875A (en) * | 2019-05-06 | 2019-07-12 | 黄淮学院 | Utilize the method for Raman spectroscopy biphenyl crystalline melting point |
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