CN106228923A - A kind of drive circuit, driving method and display floater - Google Patents

A kind of drive circuit, driving method and display floater Download PDF

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Publication number
CN106228923A
CN106228923A CN201610627187.7A CN201610627187A CN106228923A CN 106228923 A CN106228923 A CN 106228923A CN 201610627187 A CN201610627187 A CN 201610627187A CN 106228923 A CN106228923 A CN 106228923A
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China
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signal
test
module
control module
switching
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CN106228923B (en
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喻娟
刘陈曦
赛加坐
晏斌
邢建国
王凤
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BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
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BOE Technology Group Co Ltd
Beijing BOE Display Technology Co Ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)

Abstract

The invention discloses a kind of drive circuit, driving method and display floater, when normal displaying mode, control module output driven display floater carries out the data signal shown, data signal can be exported each data wire by output module, it is achieved the normal display of display floater;When test pattern, the external power supply signal being used for test is exported output module by control module, and then the power supply signal being used for test is input to each data wire by output module, it is achieved the test of the driving voltage brightness of display floater.It addition, the method that the present invention realizes test need not tear the chip on film of data access end compared with conventional test methodologies and causes destroying test sample;And arbitrfary point on display floater can be tested, it is not limited in traditional test mode to test and tears the region that the incoming end of chip on film is corresponding, can also normally show and carry out follow-up bad analysis after having tested, improve the accuracy of failure analysis and save testing cost.

Description

A kind of drive circuit, driving method and display floater
Technical field
The present invention relates to Display Technique field, particularly relate to a kind of drive circuit, driving method and display floater.
Background technology
In prior art, usually, can gather and each driving voltage by changing the driving voltage driving display floater The brightness of corresponding display floater, thus obtain the driving voltage of display floater and the corresponding relation curve of brightness, i.e. to display Panel carries out the test of voltage-brightness, and then can obtain the characteristic curve of the voltage-transmitance of display floater.Prior art In when display floater being carried out the characteristic test of voltage-transmitance, data voltage signal is (i.e. for the driving electricity carrying out testing Pressure signal) need additional power source to provide, specifically, as it is shown in figure 1, by tearing covering of data access end M on display floater Brilliant thin film, then coat elargol extraction wire at the incoming end tearing thin film, so that additional DC source can be to display surface Plate provides the drive voltage signal of AC or DC.And can only testing correspondence during test, to tear the data access end of thin film corresponding Region, has tested rear sample the most damaged, it is impossible to reuse, it is impossible to proceed follow-up analysis work and input Use, so will result in waste, also improve testing cost.
Therefore, how on the premise of not damaging test sample, it is achieved the voltage of display floater-light transmission rate curve Test, is those skilled in the art's technical problems urgently to be resolved hurrily.
Summary of the invention
Embodiments provide a kind of drive circuit, driving method and display floater, do not damage survey in order to realizing On the premise of test agent, it is achieved the test of the voltage of display floater-light transmission rate curve.
Embodiments provide a kind of drive circuit, including: handover module, control module and output module;Wherein,
Described handover module is connected between the first power supply signal end and second source signal end;Described handover module is used for Control described control module to the input of described control module and carry out display pattern and the switching signal of test pattern switching;
Described control module, for when receiving the switching signal switching to display pattern, inputs to described output module First control signal and the data signal for display;When receiving the switching signal switching to test pattern, to described defeated Go out module and input the second control signal and the data signal for test;Wherein, the described data signal for test is external The d. c. voltage signal of power supply or ac voltage signal;
The data signal being used for display, for when receiving described first control signal, is input to by described output module Each data wire;When receiving described second control signal, the data signal being used for test is input to each described data wire.
In a kind of possible embodiment, in the above-mentioned drive circuit that the embodiment of the present invention provides, described control module, It is additionally operable to:
When receiving the switching signal switching to test pattern, accessed outside test by test voltage access point Power up signal.
In a kind of possible embodiment, in the above-mentioned drive circuit that the embodiment of the present invention provides, described control module, It is additionally operable to: provide and drive display floater to carry out scanning signal and the public voltage signal shown.
In a kind of possible embodiment, in the above-mentioned drive circuit that the embodiment of the present invention provides, described handover module, Including: the first resistance and the second resistance;Wherein,
One end of described first resistance is electrical connected with described first power supply signal, the other end respectively with described second resistance One end and outfan be electrical connected;The other end of described second resistance is electrical connected with described second source signal end;Wherein, When described first resistance disconnects with described second resistance, described outfan is for switching to display mould to the input of described control module The switching signal of formula;When described first resistance is connected with described second resistance, described outfan is for defeated to described control module Enter to switch to the switching signal of test pattern.
In a kind of possible embodiment, in the above-mentioned drive circuit that the embodiment of the present invention provides, described control module For clock controller.
In a kind of possible embodiment, in the above-mentioned drive circuit that the embodiment of the present invention provides, described output module For source drive chip.
A kind of display floater, the above-mentioned drive circuit provided including the embodiment of the present invention are be provided.
Embodiments provide the driving method of the above-mentioned drive circuit that a kind of embodiment of the present invention provides, including:
Described handover module when the input of described control module switches to the switching signal of display pattern, described control module The first control signal and the data signal for display is inputted to described output module;Described output module is receiving described During one control signal, the data signal being used for display is input to each data wire;
Described handover module when the input of described control module switches to the switching signal of test pattern, described control module The second control signal and the data signal for test is inputted to described output module;Described output module is receiving described During two control signals, the data signal being used for test is input to each described data wire;Wherein, for the described data letter of test Number it is d. c. voltage signal or the ac voltage signal of external power supply.
The beneficial effect of the embodiment of the present invention includes:
Embodiments providing a kind of drive circuit, driving method and display floater, this drive circuit includes: switching Module, control module and output module;Wherein, handover module be connected to the first power supply signal end and second source signal end it Between;Handover module carries out the switching letter of display pattern and test pattern switching for controlling control module to control module input Number;Control module, for when receiving the switching signal switching to display pattern, inputs the first control signal to output module And the data signal for display;When receiving the switching signal switching to test pattern, to output module input the second control Signal processed and the data signal for test;Wherein, for test the d. c. voltage signal that data signal is external power supply or Ac voltage signal;The data signal being used for display, for when receiving the first control signal, is input to respectively by output module Data wire;When receiving the second control signal, the data signal being used for test is input to each data wire.
Specifically, the above-mentioned drive circuit that the embodiment of the present invention provides, can realize controlling display mould by handover module Formula and the switching of test pattern.When normal displaying mode, control module output driven display floater carries out the number shown The number of it is believed that, data signal can be exported each data wire by output module, it is achieved the normal display of display floater;At test pattern Time, the external power supply signal being used for test is exported output module by control module, and then output module will be used for test Power supply signal is input to each data wire, it is achieved the test of the driving voltage-brightness of display floater.It addition, the embodiment of the present invention carries The drive circuit of confession realize the method for test need not to tear the chip on film of data access end compared with conventional test methodologies and Cause destroying test sample;And arbitrfary point on display floater can be tested, it is not limited in traditional test mode to test Tear the region that the incoming end of chip on film is corresponding, advantageously in bad analysis;Can also normally show also after having tested Carry out follow-up bad analysis, improve the accuracy of failure analysis and save testing cost.
Accompanying drawing explanation
Fig. 1 is the structural representation of display floater external test power supply in prior art;
The structural representation of the drive circuit that Fig. 2 provides for the embodiment of the present invention;
The structural representation of the display floater external test power supply that Fig. 3 provides for the embodiment of the present invention;
The external test ac supply signal schematic diagram that Fig. 4 provides for the embodiment of the present invention;
The external test DC power signal schematic diagram that Fig. 5 provides for the embodiment of the present invention;
The concrete structure schematic diagram of the drive circuit that Fig. 6 provides for the embodiment of the present invention;
The structural representation of the source drive chip that Fig. 7 provides for the embodiment of the present invention.
Detailed description of the invention
Below in conjunction with the accompanying drawings, the concrete reality to drive circuit, driving method and the display floater that the embodiment of the present invention provides The mode of executing is described in detail.
Embodiments provide a kind of drive circuit, as in figure 2 it is shown, may include that handover module 01, control module 02 and output module 03;Wherein,
Handover module 01 is connected between the first power supply signal end VDD and second source signal end GND;Handover module 01 is used Display pattern and the switching signal of test pattern switching is carried out in controlling control module 02 to control module 02 input;
Control module 02, for when receiving the switching signal switching to display pattern, inputs first to output module 03 Control signal and the data signal for display;When receiving the switching signal switching to test pattern, to output module 03 Input the second control signal and the data signal for test;Wherein, for the direct current that data signal is external power supply of test Voltage signal or ac voltage signal;
The data signal being used for display, for when receiving the first control signal, is input to each data by output module 03 Line;When receiving the second control signal, the data signal being used for test is input to each data wire.
The above-mentioned drive circuit that the embodiment of the present invention provides, can realize controlling display pattern and test by handover module The switching of pattern.When normal displaying mode, control module output driven display floater carries out the data signal shown, defeated Go out module and data signal can be exported each data wire, it is achieved the normal display of display floater;When test pattern, control mould The external power supply signal being used for test is exported output module by block, and then output module is by defeated for the power supply signal being used for test Enter to each data wire, it is achieved the test of the driving voltage-brightness of display floater.It addition, the driving electricity that the embodiment of the present invention provides Road realizes the method for test and need not tear the chip on film of data access end compared with conventional test methodologies and cause destroying survey Test agent;And arbitrfary point on display floater can be tested, it is not limited in traditional test mode to test that to tear flip thin The region that the incoming end of film is corresponding, advantageously in bad analysis;Can also normally show after having tested and carry out follow-up Bad analysis, improves the accuracy of failure analysis and saves testing cost.
In the specific implementation, in the above-mentioned drive circuit that the embodiment of the present invention provides, control module can be also used for: is connecing When receiving the switching signal switching to test pattern, access the additional power source signal for test by test voltage access point. Specifically, the above-mentioned drive circuit that the embodiment of the present invention provides is when testing, as it is shown on figure 3, control module can be passed through The additional power source signal being used for test is accessed by test voltage access point P, thus additional power source signal is defeated by output module Go out to each data wire, and then realize driving display floater to show under the driving of Test driver voltage, it is thus achieved that corresponding driving voltage The display brightness of display floater.Additionally, the external power supply signal that control module is accessed by test voltage access point can be Ac supply signal, as shown in Figure 4, it is also possible to for DC power signal, as shown in Figure 5.Wherein, DC power signal or exchange The magnitude of voltage of power supply signal meets Gamma voltage range, and i.e. when testing, the external test voltage for test can generation Display floater is driven to show for Gamma voltage.
In the specific implementation, in the above-mentioned drive circuit that the embodiment of the present invention provides, control module can be also used for: provides Display floater is driven to carry out scanning signal and the public voltage signal shown.Specifically, above-mentioned the driving of embodiment of the present invention offer In galvanic electricity road, control module is required for providing two mode of operations and drives display floater to carry out the scanning signal that shows and public The control signals such as voltage signal, to realize the display floater normal display under two mode of operations.
In the specific implementation, in the above-mentioned drive circuit that the embodiment of the present invention provides, as shown in Figure 6, handover module is permissible Including: the first resistance R1 and the second resistance R2;Wherein, one end of the first resistance R1 is electrical connected, separately with the first power supply signal VDD One end one end and outfan Out with the second resistance R2 respectively is electrical connected;Wherein, outfan Out is for control module 02 Input switching signal;The other end of the second resistance R2 is electrical connected with second source signal end GND.
Specifically, handover module can realize the function of output switching signal, wherein, the first resistance R1 by two resistance Resistance can be 1-10K Ω, the resistance of the second resistance R2 can be 0.When the first resistance R1 is 4.7K Ω, the second resistance R2 When being in the state of disconnection, outfan Out can export high level signal to control module, so that control module work Making at normal displaying mode, now control module can export the data signal for driving display floater normally to show, public Voltage signal and scanning signal;When the first resistance R1 is 4.7K Ω, the second resistance R2 is that 0 Ω that is second resistance R2 is in connection State (or R1 is in the state of disconnection, R2 is 4.7K Ω) time, outfan Out can be with output low level signal to controlling mould Block so that control module is operated in test pattern, now control module using external power supply signal as test display floater Data signal output, simultaneously normal output is for the public voltage signal driving display floater to carry out showing and scanning letter Number.
In the specific implementation, in the above-mentioned drive circuit that the embodiment of the present invention provides, as shown in Figure 6, control module is permissible For clock controller, output module can be source drive chip.Wherein, the structural representation of source drive chip is as it is shown in fig. 7, be Realizing source drive chip and complete the function of correspondence in display pattern and test pattern, it adds two relative to prior art Signal input port, one is test voltage input Vtest, and one is the control signal end of control mode switch Operation;Other each ports of source drive chip and the cache module included, D/A converter module, latch module, displacement The operation principle of each modules such as depositor, data register, level switch module, Low Voltage Differential Signal receptor all with existing skill Art is identical, is not described in detail here.
Specifically, clock controller receive handover module output the switching signal switching to display pattern time, time Clock controller will enter and normally show mode of operation, to the control signal end Operation input high level of source drive chip Control signal so that source drive chip works in the normal mode of operation that driven display floater carries out showing, source simultaneously Driving chip receives the clock signal of clock controller output and for the data letter driving display floater normally to show Number Data, and then data signal exports each data wire of display floater by source drive chip, it is achieved display floater normal aobvious Show;Clock controller is when receiving the switching signal switching to test pattern of handover module output, and clock controller will Enter test job pattern, to the control signal of the control signal end Operation input low level of source drive chip so that source Driving chip is also into test job pattern, and now clock controller is powered up being used for the outer of test by test voltage access point Source signal accesses, and test voltage exports the test voltage input Vtest of source drive chip, and source drive chip is also simultaneously Receive the clock signal of carrying out test needs of clock controller output, control signal etc..Wherein test voltage is multiple fixing Being worth, and this fixed value exports each data wire as driving voltage by source drive chip, the brightness of display floater can be along with survey The magnitude of voltage of examination voltage changes and changes, and finally realizes the characteristic curve test of the driving voltage-brightness of display floater.Test The signal of handover module outfan switch to after one-tenth control clock controller normally show the switching signal of mode of operation, Display floater is made to be switched to normal displaying mode, follow-up bad analysis.
Based on same inventive concept, embodiments provide a kind of display floater, provide including the embodiment of the present invention Above-mentioned drive circuit.This display floater can apply to mobile phone, panel computer, television set, display, notebook computer, number Any product with display function or the parts such as code-phase frame, navigator.Due to this display floater solve problem principle with drive Galvanic electricity road is similar, and therefore the enforcement of this display floater may refer to the enforcement of above-mentioned drive circuit, repeats no more in place of repetition.
Based on same inventive concept, embodiments provide the above-mentioned drive circuit that a kind of embodiment of the present invention provides Driving method, may include that
Handover module is when control module input switches to the switching signal of display pattern, and control module is defeated to output module Enter the first control signal and the data signal for display;Output module, when receiving the first control signal, will be used for showing Data signal be input to each data wire;
Handover module is when control module input switches to the switching signal of test pattern, and control module is defeated to output module Enter the second control signal and the data signal for test;Output module, when receiving the second control signal, will be used for testing Data signal be input to each data wire;Wherein, for the d. c. voltage signal that data signal is external power supply or the friendship of test Stream voltage signal.
The above-mentioned driving method that the embodiment of the present invention provides, when normal displaying mode, control module output driven Display floater carries out the data signal shown, data signal can be exported each data wire by output module, it is achieved display floater Normal display;When test pattern, the external power supply signal being used for test is exported output module by control module, and then The power supply signal being used for test is input to each data wire by output module, it is achieved driving voltage and the survey of brightness to display floater Examination.It addition, the method that the drive circuit that the embodiment of the present invention provides realizes test need not tear compared with conventional test methodologies The chip on film of data access end and cause destroying test sample;And arbitrfary point on display floater can be tested, it is not limited to Traditional test mode can only be tested and tear the region that the incoming end of chip on film is corresponding, advantageously in bad analysis;Test Can also normally show and carry out follow-up bad analysis after completing, the accuracy and the saving that improve failure analysis are tested into This.
Embodiments providing a kind of drive circuit, driving method and display floater, this drive circuit includes: switching Module, control module and output module;Wherein, handover module be connected to the first power supply signal end and second source signal end it Between;Handover module carries out the switching letter of display pattern and test pattern switching for controlling control module to control module input Number;Control module, for when receiving the switching signal switching to display pattern, inputs the first control signal to output module And the data signal for display;When receiving the switching signal switching to test pattern, to output module input the second control Signal processed and the data signal for test;Wherein, for test the d. c. voltage signal that data signal is external power supply or Ac voltage signal;The data signal being used for display, for when receiving the first control signal, is input to respectively by output module Data wire;When receiving the second control signal, the data signal being used for test is input to each data wire.
Specifically, the above-mentioned drive circuit that the embodiment of the present invention provides, can realize controlling display mould by handover module Formula and the switching of test pattern.When normal displaying mode, control module output driven display floater carries out the number shown The number of it is believed that, data signal can be exported each data wire by output module, it is achieved the normal display of display floater;At test pattern Time, the external power supply signal being used for test is exported output module by control module, and then output module will be used for test Power supply signal is input to each data wire, it is achieved driving voltage and the test of brightness to display floater.It addition, the embodiment of the present invention The drive circuit provided realizes the method for test and need not tear the chip on film of data access end compared with conventional test methodologies And cause destroying test sample;And arbitrfary point on display floater can be tested, it is not limited in traditional test mode to survey The region that the incoming end of chip on film is corresponding is torn in examination, advantageously in bad analysis;Can also normally show after having tested And carry out follow-up bad analysis, improve the accuracy of failure analysis and save testing cost.
Obviously, those skilled in the art can carry out various change and the modification essence without deviating from the present invention to the present invention God and scope.So, if these amendments of the present invention and modification belong to the scope of the claims in the present invention and equivalent technologies thereof Within, then the present invention is also intended to comprise these change and modification.

Claims (8)

1. a drive circuit, it is characterised in that including: handover module, control module and output module;Wherein,
Described handover module is connected between the first power supply signal end and second source signal end;Described handover module is for institute State the control module input described control module of control and carry out display pattern and the switching signal of test pattern switching;
Described control module, for when receiving the switching signal switching to display pattern, inputs first to described output module Control signal and the data signal for display;When receiving the switching signal switching to test pattern, to described output mould Block inputs the second control signal and the data signal for test;Wherein, the described data signal for test is external power supply D. c. voltage signal or ac voltage signal;
The data signal being used for display, for when receiving described first control signal, is input to each number by described output module According to line;When receiving described second control signal, the data signal being used for test is input to each described data wire.
2. drive circuit as claimed in claim 1, it is characterised in that described control module, is additionally operable to:
When receiving the switching signal switching to test pattern, accessed by test voltage access point and power up for the outer of test Source signal.
3. drive circuit as claimed in claim 1, it is characterised in that described control module, is additionally operable to: provide and drive display surface Plate carries out scanning signal and the public voltage signal shown.
4. the drive circuit as described in any one of claim 1-3, it is characterised in that described handover module, including: the first resistance With the second resistance;Wherein,
One end of described first resistance is electrical connected with described first power supply signal, the other end respectively with the one of described second resistance End and outfan are electrical connected;The other end of described second resistance is electrical connected with described second source signal end;Wherein, described When first resistance disconnects with described second resistance, described outfan is for switching to display pattern to the input of described control module Switching signal;When described first resistance is connected with described second resistance, described outfan is for cutting to the input of described control module It is changed to the switching signal of test pattern.
5. the drive circuit as described in any one of claim 1-3, it is characterised in that described control module is clock controller.
6. the drive circuit as described in any one of claim 1-3, it is characterised in that described output module is source drive chip.
7. a display floater, it is characterised in that include the drive circuit as described in any one of claim 1-6.
8. the driving method of the drive circuit as described in any one of claim 1-6, it is characterised in that including:
Described handover module is when the input of described control module switches to the switching signal of display pattern, and described control module is to institute State output module and input the first control signal and the data signal for display;Described output module is receiving described first control During signal processed, the data signal being used for display is input to each data wire;
Described handover module is when the input of described control module switches to the switching signal of test pattern, and described control module is to institute State output module and input the second control signal and the data signal for test;Described output module is receiving described second control During signal processed, the data signal being used for test is input to each described data wire;Wherein, the described data signal for test is The d. c. voltage signal of external power supply or ac voltage signal.
CN201610627187.7A 2016-08-02 2016-08-02 A kind of driving circuit, driving method and display panel Active CN106228923B (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106504687A (en) * 2016-12-16 2017-03-15 惠科股份有限公司 Display panel detection method and display panel detection device
CN107038985A (en) * 2017-06-02 2017-08-11 京东方科技集团股份有限公司 For the drive module of display panel, display panel and display device
CN110875001A (en) * 2019-11-29 2020-03-10 京东方科技集团股份有限公司 Test circuit, display substrate, display panel and test method

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1321963A (en) * 2000-03-31 2001-11-14 三洋电机株式会社 Driving device for display device
CN101902855A (en) * 2009-05-27 2010-12-01 登丰微电子股份有限公司 LED driving circuit and backlight module
CN102737570A (en) * 2011-04-14 2012-10-17 联咏科技股份有限公司 Control driver of display panel
CN102832805A (en) * 2011-05-18 2012-12-19 三星显示有限公司 DC-DC converter, display device including the same and method of controlling driving voltage
US20150008964A1 (en) * 2013-07-05 2015-01-08 Infineon Technologies Ag Test System for Semiconductor Array

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1321963A (en) * 2000-03-31 2001-11-14 三洋电机株式会社 Driving device for display device
CN101902855A (en) * 2009-05-27 2010-12-01 登丰微电子股份有限公司 LED driving circuit and backlight module
CN102737570A (en) * 2011-04-14 2012-10-17 联咏科技股份有限公司 Control driver of display panel
CN102832805A (en) * 2011-05-18 2012-12-19 三星显示有限公司 DC-DC converter, display device including the same and method of controlling driving voltage
US20150008964A1 (en) * 2013-07-05 2015-01-08 Infineon Technologies Ag Test System for Semiconductor Array

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106504687A (en) * 2016-12-16 2017-03-15 惠科股份有限公司 Display panel detection method and display panel detection device
US10733923B2 (en) 2016-12-16 2020-08-04 HKC Corporation Limited Display panel test detection method and device for storing a picture for detection in a source driver circuit board
CN107038985A (en) * 2017-06-02 2017-08-11 京东方科技集团股份有限公司 For the drive module of display panel, display panel and display device
WO2018219136A1 (en) * 2017-06-02 2018-12-06 京东方科技集团股份有限公司 Driving module used for display panel, display panel and display device
US10977971B2 (en) 2017-06-02 2021-04-13 Hefei Boe Optoelectronics Technology Co., Ltd. Driving module used for display panel, display panel and display device
CN110875001A (en) * 2019-11-29 2020-03-10 京东方科技集团股份有限公司 Test circuit, display substrate, display panel and test method

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