CN106206858A - The chalker of many sub-batteries is made before a kind of thin-film solar cells I V test - Google Patents
The chalker of many sub-batteries is made before a kind of thin-film solar cells I V test Download PDFInfo
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- CN106206858A CN106206858A CN201610801387.XA CN201610801387A CN106206858A CN 106206858 A CN106206858 A CN 106206858A CN 201610801387 A CN201610801387 A CN 201610801387A CN 106206858 A CN106206858 A CN 106206858A
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- chalker
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- 239000010409 thin film Substances 0.000 title claims abstract description 21
- 238000012360 testing method Methods 0.000 title abstract description 15
- 239000010408 film Substances 0.000 claims description 6
- 229910000831 Steel Inorganic materials 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 239000010959 steel Substances 0.000 claims description 4
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 4
- 238000002372 labelling Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract description 9
- 238000010276 construction Methods 0.000 abstract description 2
- 238000005516 engineering process Methods 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 238000011161 development Methods 0.000 description 2
- 229910052799 carbon Inorganic materials 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000011056 performance test Methods 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000001172 regenerating effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 238000006748 scratching Methods 0.000 description 1
- 230000002393 scratching effect Effects 0.000 description 1
- 238000007650 screen-printing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/186—Particular post-treatment for the devices, e.g. annealing, impurity gettering, short-circuit elimination, recrystallisation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K26/00—Working by laser beam, e.g. welding, cutting or boring
- B23K26/36—Removing material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
The invention discloses a kind of thin-film solar cells before I V tests, make the chalker of many sub-batteries, before being primarily adapted for use in I V test, large stretch of thin-film solar cells is separated into the sub-battery of multiple mutually insulated, in order to the electric property of battery diverse location is carried out mass test more accurately.Described chalker includes: line base, locating clip, line support, scribe member four part, its simple in construction, and line speed is fast, and line area is accurate, durable in use, with low cost.Described device overcomes locating bias, area inaccurate that conventional manual scribble method easily produces, easily scratches electrode, affects the problems such as I V test result, is suitable for laboratory high-volume thin-film solar cells test and uses.
Description
Technical field
The invention belongs to technical field of thin-film solar, before being specifically related to a kind of film solar cell I-V test
Make the chalker of many sub-batteries, be mainly used in machinery line and the performance test of each based thin film solar cell.
Background technology
Recently as severe contamination and the exhaustion of fossil energy of environment, the exploitation of clean energy resource of future generation is increasingly subject to
The concern of people.Solar electrical energy generation as a kind of low-carbon (LC) regenerative resource, due to its pollution-free, inexhaustible, nexhaustible and
Become the first-selection of new forms of energy.The most multiple countries all using the commercial development of solar electrical energy generation and utilize as important development
Direction.Owing to the thickness of thin-film solar cells is little, consumption of materials is few, lightweight, and therefore it has boundless application
Prospect.
In all properties characterization method of solar photovoltaic device, I-V characteristic test is the research of photovoltaic device, quality inspection
And application provides reliable foundation, it it is a kind of method the most directly perceived, most effective, that be widely used most.In order to experiment system
Standby large stretch of film photovoltaic cell carries out the Electrical of local, needs to enter the big cell piece after evaporation or silk screen printing
Row manually line is fabricated to multiple independent sub-battery, improves thin film solar by analyzing the electric property of each sub-battery
The processing technology of battery.The method of many sub-batteries of existing making generally uses manual hatched manner.Ruler or template are placed
On cell piece, draw point is used to rule against ruler or template.Ruler or template that this traditional method uses easily are damaged
Bad thin film, and then affect battery performance.Using draw point manually to rule also and force inequality easily occur, absorbed layer is drawn impermeable, and
Exert a force the excessive phenomenon causing Mo layer to damage.Thin film solar cell sheet with glass as matrix is easy after experience high-temperature technology
Producing warpage, during traditional method line, ruler or template are susceptible to mobile, can cause scribing each sub-cell area out
Size is uneven, affects test and the result of calculation of battery performance.
Summary of the invention
It is an object of the invention to provide a kind of solution and before I-V tests, sheet hull cell is delineated into multiple little area
The new method of sub-battery, the shortcoming overcoming traditional method, it is simple to operate, speed is fast, with low cost, can be used for laboratory in line
High-volume sample preparation, be conducive to improving work efficiency, improve the accuracy of test result.
For reaching above-mentioned purpose, the present invention is realized by following design:
A kind of film solar cell I-V makes the chalker of many sub-batteries before testing, including line base 1, determine
Position folder 2, line support 3, scribe member 4；It is characterized in that:
Described line base 1 left and right sides is respectively mounted a longitudinal rail 6；
The longitudinal rail 6 of every side is each slidably connected with stroke line bracket 3, sets above left and right sides line support 3
Put a cross slide way 5；
Be slidably connected on cross slide way 5 scribe member 4, installs marking-off pin 14 in scribe member 4 bottom；
By locating clip 2, thin-film solar cells to be tested and marking-off pin 14 are relatively fixed on line base 1.
The present invention farther includes following preferred version:
Described locating clip 2 is made up of fixed screw 10, fixed block 11, location intermediate plate (12)；
Described location intermediate plate 12 is triangle, triangle base contact fixed block 11, upper vertex and thin film to be tested
The labelling point 13 of solaode coincides；
Fixed screw 10 compresses location intermediate plate 12 and thin film solar cell sheet；
The fixed block 11 of described locating clip 2 is fixed on line base, and circular hole is left for fixed screw 10 in centre.
Between location fixed block 11 thickness 0.2mm to the 3mm thinner than thin film solar cell sheet of described locating clip 2.
Location intermediate plate 12 has elasticity, and it is tight with cell piece that adjustment fixed screw degree of tightness and up and down force are capable of intermediate plate
Contact.
Longitudinal rail 6 is slidably connected by the longitudinal sliding block 9 being arranged on longitudinal rail 6 with corresponding line support 3.
Installing transverse slider 8 on cross slide way 5, transverse slider 8 is connected by axostylus axostyle with scribe member 4.
Scribe member bottom arranges 4 marking-off pins 14 altogether, and syringe needle is downward, and the distance between 4 marking-off pins 14 can adjust.
Described marking-off pin 14 uses wolfram steel material, in order to not damage bottom Mo electrode, it is desirable to enter four marking-off pin tops
Row grinding process, marking-off pin hardness is the highest, and its tip need to be polished the most.
Described line support 3 vertically moves on guide rail and realizes the insulation of sub-battery Y-axis, and slide block carries out horizontal stroke on support guide
The insulation of sub-battery X-axis is realized to movement.
The spacing of described marking-off pin 14 is adjusted according to the size of electrode, the two the most standardized bar insulations of marking-off pin 14
Line.
The line of described device can continuously or discontinuously, and sub-battery figure can be rectangle or the square of arbitrary dimension
Grid.
Described marking-off pin 14 uses wolfram steel material, according to the hardness of wolfram steel, syringe needle is carried out sanding and polishing, and syringe needle hardness is more
Height, polishes round.
The invention have the advantage that simple in construction, durable in use, with low cost, line efficiency is high, it is many to be suitable for electrode size,
Line area is accurate, is conducive to improving work efficiency, improves the accuracy of test result.
Accompanying drawing explanation
Fig. 1 is the chalker schematic diagram of the present invention；
Fig. 2 is the chalker top view of the present invention；
Fig. 3 is the locating clip structure using chalker of the present invention delineation
Fig. 4 is the scribe member structure using chalker of the present invention delineation
Fig. 5 is the square electrode network using chalker of the present invention delineation；
Fig. 6 is the discontinuous independent square shape structure using chalker of the present invention delineation；
Fig. 7 is the Rectangular grid structure using chalker of the present invention delineation.
Description of reference numerals: 1 line base, 2 locating clips, 3 line supports, 4 scribe member, 5 horizontal (X-axis) guide rails, 6 indulge
To (Y-axis) guide rail, 7 electrode patterns, 8 horizontal (X-axis) slide blocks, 9 longitudinal (Y-axis) slide blocks, 10 fixed screws, 11 fixed blocks, 12 is fixed
Position intermediate plate, 13 cell piece telltale mark points, 14 marking-off pins.
Detailed description of the invention
Hereby technical scheme is combined and closes accompanying drawing, describe in detail as follows:
As shown in Figure 1, 2, the chalker making many sub-batteries before film solar cell I-V test includes the end of ruling
Seat 1, locating clip 2, line support 3,4 four parts of scribe member.
Described line base 1 left and right sides is respectively mounted a longitudinal rail 6；The longitudinal rail 6 of every side is each via one
Longitudinal sliding block 9 is connected with stroke line bracket 3 respectively, and left and right sides line support 3 is connected by a cross slide way 5 of top；
Installing transverse slider 8 on cross slide way 5, scribe member 4 is connected by axostylus axostyle with transverse slider, installs four below scribe member
Individual marking-off pin 14.
As it is shown on figure 3, described locating clip 2 is made up of fixed screw 10, fixed block 11, location intermediate plate 12.Described locating clip
Sheet 12 is in triangular form, and triangle base contacts the labelling point of fixed block 11, upper vertex and thin-film solar cells to be tested
13 coincide.The fixed block 11 of described locating clip 2 is fixed on line base, and circular hole is left for fixed screw 10 in centre.Fixing
Screw 10 compresses location intermediate plate 12 and cell piece, prevents from offseting in cell piece scratching process.Location intermediate plate 12 has elasticity,
Adjust fixed screw degree of tightness and the realization that exerts a force up and down adjusts and battery contact height.
Shown in Fig. 4, scribe member 4 is made up of 4 marking-off pins 14, stator, axostylus axostyles, and 4 marking-off pin 14 spacing are adjustable.Will
A sheet of thin-film solar cells is fixed on line base 1, makes battery mark select 13 and overlaps with intermediate plate 12 top, location；Then
(14 times pressures of marking-off pin, d) to meeting electrode size requirement, are contacted regulation marking-off pin 14 spacing by l with face；Mobile line subsequently
Support 9 and slide block 8 drive the horizontal and vertical movement of marking-off pin, thus realize the line to face, by sheet thin film solar every
Become the sub-battery of multiple mutually insulated；Finally the chip that face remains is purged or blot clean.Below in conjunction with being embodied as case
The present invention will be further described.
Case study on implementation 1
Fig. 5 is the square electrode network using chalker of the present invention delineation.Adjust longitudinal sliding block 9, laterally slide
The position of block 8, four pin, makes marking-off pin be placed in the corner of square electrode or omit outer position (between 0.1mm to 1mm).Fixing
Slide block 9 is at different rows, transverse shifting slide block 8.Fix slide block 8 again in different lines, vertically move slide block 9.
Case study on implementation 2
Fig. 6 is the discontinuous independent square shape structure using chalker of the present invention delineation.Adjust longitudinal sliding block 9, laterally
The position of slide block 8, four pin, makes marking-off pin be placed in the corner of square electrode or omit outer position (between 0.1mm to 1mm).Gu
Pin, at different rows, transverse shifting slide block 8, is lifted by fixed slider 9 in the non-line interval of electrode gap.Fix slide block 8 again not
Same column, vertically moves slide block 9, is lifted by pin in the non-line interval of electrode gap.Finally depict discontinuous independent square shape
Structure.
Case study on implementation 3
Fig. 7 is the Rectangular grid structure using chalker of the present invention delineation.Adjust longitudinal sliding block 9, transverse slider 8,
The spacing of four marking-off pins 14, makes marking-off pin 4 be placed in the corner of electrode or omit outer position (between 0.1mm to 1mm).Fixing sliding
Block 9 is at different rows, transverse shifting slide block 8.Fix slide block 8 again in different lines, vertically move slide block 9.
Described above, it is merely exemplary for the purpose of the present invention, nonrestrictive, those of ordinary skill in the art understand,
In the case of the spirit and scope limited without departing from claim, can modify, change or equivalence, but fall within this
Within the protection domain of invention.
Claims (9)
1. make a chalker for many sub-batteries before film solar cell I-V is tested, including line base (1), determine
Position folder (2), line support (3), scribe member (4)；It is characterized in that:
Described line base (1) left and right sides is respectively mounted a longitudinal rail (6)；
The longitudinal rail (6) of every side is each slidably connected with stroke line bracket (3), in top, left and right sides line support (3)
One cross slide way (5) is set；
Be slidably connected on cross slide way (5) scribe member (4), installs marking-off pin (14) in scribe member (4) bottom.
By locating clip (2), thin-film solar cells to be tested and marking-off pin (14) are relatively fixed at line base (1)
On.
The chalker of many sub-batteries of making the most according to claim 1, it is characterised in that:
Described locating clip (2) is made up of fixed screw (10), fixed block (11), location intermediate plate (12)；
Described location intermediate plate (12) is triangle, triangle base contact fixed block (11), upper vertex and thin film to be tested
Labelling point (13) of solaode coincides；
Fixed screw (10) compresses location intermediate plate (12) and thin film solar cell sheet；
The fixed block (11) of described locating clip (2) is fixed on line base, and circular hole is left for fixed screw (10) in centre.
The chalker of many sub-batteries of making the most according to claim 2, it is characterised in that:
Between location fixed block (11) thickness 0.2mm to the 3mm thinner than thin film solar cell sheet of described locating clip (2).
The chalker of many sub-batteries of making the most according to claim 3, it is characterised in that:
Location intermediate plate (12) has elasticity, and adjustment fixed screw degree of tightness and up and down force are capable of intermediate plate and closely connect with cell piece
Touch.
The chalker of many sub-batteries of making the most according to claim 1 and 2, it is characterised in that:
Longitudinal rail (6) is slided even by the longitudinal sliding block (9) being arranged on longitudinal rail (6) with corresponding line support (3)
Connect.
The chalker of many sub-batteries of making the most according to claim 1 and 2, it is characterised in that:
Installing transverse slider (8) on cross slide way (5), transverse slider (8) is connected by axostylus axostyle with scribe member (4).
The chalker of many sub-batteries of making the most according to claim 6, it is characterised in that:
Scribe member (4) bottom arranges 4 marking-off pins (14) altogether, and syringe needle is downward, and the distance between 4 marking-off pins (14) can be adjusted
Whole.
8. according to the chalker making many sub-batteries described in claim 1 or 7, it is characterised in that:
Described marking-off pin uses wolfram steel material.
The chalker of many sub-batteries of making the most according to claim 1, it is characterised in that:
Mutually insulated between many sub-batteries, wherein covered wire can continuously or discontinuously, and sub-battery figure can be arbitrary dimension
Rectangle or square net.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610801387.XA CN106206858A (en) | 2016-09-05 | 2016-09-05 | The chalker of many sub-batteries is made before a kind of thin-film solar cells I V test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610801387.XA CN106206858A (en) | 2016-09-05 | 2016-09-05 | The chalker of many sub-batteries is made before a kind of thin-film solar cells I V test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106206858A true CN106206858A (en) | 2016-12-07 |
Family
ID=58066378
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610801387.XA Pending CN106206858A (en) | 2016-09-05 | 2016-09-05 | The chalker of many sub-batteries is made before a kind of thin-film solar cells I V test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106206858A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019100474A1 (en) * | 2017-11-22 | 2019-05-31 | 陈善元 | Electrode scribing machine tool |
| AU2018409644A1 (en) * | 2018-11-23 | 2020-04-23 | Tongwei Solar (Hefei) Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
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| CN201769010U (en) * | 2010-08-18 | 2011-03-23 | 武汉钢铁(集团)公司 | Combined laser processing device |
| CN102047392A (en) * | 2008-05-26 | 2011-05-04 | 三星钻石工业股份有限公司 | Scribe apparatus for thin film solar cell |
| CN102217057A (en) * | 2008-11-19 | 2011-10-12 | 应用材料股份有限公司 | Laser scribing platform with moving gantry |
| CN103151307A (en) * | 2011-12-07 | 2013-06-12 | 财团法人工业技术研究院 | Channel scribing device and channel scribing method |
| CN103341691A (en) * | 2013-07-15 | 2013-10-09 | 东莞市铭丰包装品制造有限公司 | Multi-head laser die cutting device |
| CN204848653U (en) * | 2015-08-07 | 2015-12-09 | 东莞晶石光学有限公司 | Novel automatic material equipment of opening of high strength glass |
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2016
- 2016-09-05 CN CN201610801387.XA patent/CN106206858A/en active Pending
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|---|---|---|---|---|
| CN102047392A (en) * | 2008-05-26 | 2011-05-04 | 三星钻石工业股份有限公司 | Scribe apparatus for thin film solar cell |
| CN102217057A (en) * | 2008-11-19 | 2011-10-12 | 应用材料股份有限公司 | Laser scribing platform with moving gantry |
| CN201769010U (en) * | 2010-08-18 | 2011-03-23 | 武汉钢铁(集团)公司 | Combined laser processing device |
| CN103151307A (en) * | 2011-12-07 | 2013-06-12 | 财团法人工业技术研究院 | Channel scribing device and channel scribing method |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019100474A1 (en) * | 2017-11-22 | 2019-05-31 | 陈善元 | Electrode scribing machine tool |
| AU2018409644A1 (en) * | 2018-11-23 | 2020-04-23 | Tongwei Solar (Hefei) Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
| AU2018409644B2 (en) * | 2018-11-23 | 2020-10-01 | Tongwei Solar (Hefei) Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
| US10825742B2 (en) | 2018-11-23 | 2020-11-03 | Chengdu Yefan Science And Technology Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
| AU2018409644C1 (en) * | 2018-11-23 | 2021-03-04 | Tongwei Solar (Hefei) Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
| US10991633B2 (en) | 2018-11-23 | 2021-04-27 | Chengdu Yefan Science And Technology Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
| US10991634B2 (en) | 2018-11-23 | 2021-04-27 | Chengdu Yefan Science And Technology Co., Ltd. | Method and system for manufacturing solar cells and shingled solar cell modules |
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Application publication date: 20161207 |
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