CN106154138B - A kind of locating connector applied to integrated circuit detection - Google Patents
A kind of locating connector applied to integrated circuit detection Download PDFInfo
- Publication number
- CN106154138B CN106154138B CN201610462455.4A CN201610462455A CN106154138B CN 106154138 B CN106154138 B CN 106154138B CN 201610462455 A CN201610462455 A CN 201610462455A CN 106154138 B CN106154138 B CN 106154138B
- Authority
- CN
- China
- Prior art keywords
- stud
- clamp plate
- integrated circuit
- telescopic rod
- telescoping tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610462455.4A CN106154138B (en) | 2016-06-20 | 2016-06-20 | A kind of locating connector applied to integrated circuit detection |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610462455.4A CN106154138B (en) | 2016-06-20 | 2016-06-20 | A kind of locating connector applied to integrated circuit detection |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106154138A CN106154138A (en) | 2016-11-23 |
CN106154138B true CN106154138B (en) | 2018-08-17 |
Family
ID=57353625
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610462455.4A Expired - Fee Related CN106154138B (en) | 2016-06-20 | 2016-06-20 | A kind of locating connector applied to integrated circuit detection |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106154138B (en) |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19741352A1 (en) * | 1997-09-19 | 1999-04-15 | Mci Computer Gmbh | Test socket for testing integrated circuit structural elements having connecting legs |
CN200953371Y (en) * | 2006-09-06 | 2007-09-26 | 罗贯诚 | Battery charge |
DE102006053006A1 (en) * | 2006-11-10 | 2008-05-15 | Ratzky, Christian | Circuit testing device, has contact unit for connecting circuit with testing device, and fixation unit for fixing circuit, where contact unit is connected with fixation unit by frame, which is attached detachably to contact unit |
CN102508487A (en) * | 2011-11-11 | 2012-06-20 | 扬州新海电气自动化有限公司 | Efficient detection device for motor control modules |
CN102778593A (en) * | 2011-05-12 | 2012-11-14 | 亚旭电脑股份有限公司 | Detection device for transmitting signal by using probe contact |
CN102854453A (en) * | 2012-08-17 | 2013-01-02 | 苏州启智机电技术有限公司 | Probe-type test fixture |
CN103063959A (en) * | 2012-12-29 | 2013-04-24 | 北京德天泉机电设备有限公司 | Bed-of-nails tool for detecting circuit board |
CN103149388A (en) * | 2013-02-06 | 2013-06-12 | 深圳欧菲光科技股份有限公司 | Integrated circuit test connecting device and integrated circuit test connecting method |
CN203365492U (en) * | 2013-07-26 | 2013-12-25 | 英利能源(中国)有限公司 | Probe assembly and solar cell module tester possessing same |
-
2016
- 2016-06-20 CN CN201610462455.4A patent/CN106154138B/en not_active Expired - Fee Related
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19741352A1 (en) * | 1997-09-19 | 1999-04-15 | Mci Computer Gmbh | Test socket for testing integrated circuit structural elements having connecting legs |
CN200953371Y (en) * | 2006-09-06 | 2007-09-26 | 罗贯诚 | Battery charge |
DE102006053006A1 (en) * | 2006-11-10 | 2008-05-15 | Ratzky, Christian | Circuit testing device, has contact unit for connecting circuit with testing device, and fixation unit for fixing circuit, where contact unit is connected with fixation unit by frame, which is attached detachably to contact unit |
CN102778593A (en) * | 2011-05-12 | 2012-11-14 | 亚旭电脑股份有限公司 | Detection device for transmitting signal by using probe contact |
CN102508487A (en) * | 2011-11-11 | 2012-06-20 | 扬州新海电气自动化有限公司 | Efficient detection device for motor control modules |
CN102854453A (en) * | 2012-08-17 | 2013-01-02 | 苏州启智机电技术有限公司 | Probe-type test fixture |
CN103063959A (en) * | 2012-12-29 | 2013-04-24 | 北京德天泉机电设备有限公司 | Bed-of-nails tool for detecting circuit board |
CN103149388A (en) * | 2013-02-06 | 2013-06-12 | 深圳欧菲光科技股份有限公司 | Integrated circuit test connecting device and integrated circuit test connecting method |
CN203365492U (en) * | 2013-07-26 | 2013-12-25 | 英利能源(中国)有限公司 | Probe assembly and solar cell module tester possessing same |
Also Published As
Publication number | Publication date |
---|---|
CN106154138A (en) | 2016-11-23 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right |
Effective date of registration: 20181224 Address after: 221113 Huangji Town Industrial Park, Tongshan District, Xuzhou City, Jiangsu Province Patentee after: Xuzhou Guhan Fragrance Industry Co., Ltd. Address before: 523000 productivity building 406, high tech Industrial Development Zone, Songshan Lake, Dongguan, Guangdong Patentee before: Dongguan Lianzhou Intellectual Property Operation Management Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20190711 Address after: 221000 Academy of Agricultural Sciences, Damiao Street Office, Xuzhou Economic and Technological Development Zone, Jiangsu Province Patentee after: Jiangsu Xuhai Environmental Monitoring Co., Ltd. Address before: 221113 Huangji Town Industrial Park, Tongshan District, Xuzhou City, Jiangsu Province Patentee before: Xuzhou Guhan Fragrance Industry Co., Ltd. |
|
TR01 | Transfer of patent right | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20180817 Termination date: 20210620 |
|
CF01 | Termination of patent right due to non-payment of annual fee |