CN106152975B - A kind of static state angle measurement calibration device - Google Patents
A kind of static state angle measurement calibration device Download PDFInfo
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- CN106152975B CN106152975B CN201610526005.7A CN201610526005A CN106152975B CN 106152975 B CN106152975 B CN 106152975B CN 201610526005 A CN201610526005 A CN 201610526005A CN 106152975 B CN106152975 B CN 106152975B
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- parallel light
- supporting rack
- light tube
- static state
- angle measurement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
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Abstract
The invention discloses a kind of static state angle measurement calibration devices, including：Devices to test mounting substrate is fixed on horizontal positioned face；M supporting rack is vertically set on the horizontal positioned face, and each supporting rack in the M supporting rack is identical at a distance from the Devices to test mounting substrate, and support frame as described above is hollow out frame, and M is the integer more than or equal to 2；M group parallel light tubes, wherein, i-th group of parallel light tube in the M groups parallel light tube is arranged in the M supporting rack on i-th of supporting rack corresponding with i-th group of parallel light tube, and the optical axis of each parallel light tube is intersected in a bit on the Devices to test mounting substrate in the M groups parallel light tube, i is the integer more than or equal to 1 and less than or equal to M, realizes the light-weight of static state angle measurement calibration device, structure process easy to process and technique effect at low cost.
Description
Technical field
The present invention relates to electronic technology field, more particularly to a kind of static state angle measurement calibration device.
Background technology
With the continuous development of science and technology, photoelectric detection equipment gradually obtains in military and national economy every field
To being widely applied, e.g., industry automatic control, Photometric Measurement, missile guidance, infrared remote sensing etc..
Angle measurement accuracy is an important indicator of photoelectric detection equipment, in radar system, the angle measurement of photoelectric detection equipment
Precision is directly related to target acquisition precision and fire control guiding accuracy.It is divided into static error and dynamic accidentally according to its working condition
Difference, usually in the overall error of equipment, static error occupies major part, thus need to carry out in equipment test calibration and
It is compensated in system.Static state angle measurement calibration device is used to demarcate, examine the static testing angle precision of photoelectric detection equipment.
Static state angle measurement calibration device is made of several parallel light tubes by specific angular distribution and the supporting rack stablized, often
The optical axis direction of a parallel light tube has fixed direction, the optical axis of all parallel light tubes to be intersected in a bit.By examined photoelectricity
The center of the light entrance port of equipment is adjusted to each parallel light tube optical axis and crosses position, can receive each parallel light tube institute mould
Quasi- infinity target, each parallel light tube angle of optical axis are a value determined, can be in the adjustment stage by precision angle instrument
(such as high-accuracy total powerstation) accurate calibration goes out.
In the prior art, for reach static state angle measurement calibration device self structure stability and be not easy by environment heat affecting
Requirement, supporting rack mostly uses vertical and horizontal arm and is all made of overall structure form, and using low coefficient of thermal expansion materials
Design method, there are volume weights for which greatly, processing difficulties, expensive defect.
Further, to ensure that its Angle Calibration precision does not change with variation of ambient temperature, static state angle measurement calibration device one
It has been constant temperature laboratory to its suitable environment temperature requirement since straight, limits its applicable range.
Invention content
The embodiment of the present application provides a kind of static state angle measurement calibration device, for solving static state angle measurement calibration in the prior art
Volume weight existing for device is big, processing difficulties, expensive defect, realizes light-weight, the knot of static state angle measurement calibration device
Structure technique effect easy to process and at low cost.
The embodiment of the present application provides a kind of static state angle measurement calibration device, including：
Devices to test mounting substrate is fixed on horizontal positioned face；
M supporting rack is vertically set on the horizontal positioned face, each supporting rack in the M supporting rack and institute
The distance for stating Devices to test mounting substrate is identical, and each supporting rack is hollow out frame in the M supporting rack, and M is more than or equal to 2
Integer；
M group parallel light tubes, wherein i-th group of parallel light tube in the M groups parallel light tube is arranged in the M supporting rack
In on i-th of supporting rack corresponding with i-th group of parallel light tube, and each parallel light tube in the M groups parallel light tube
Optical axis is intersected in a bit on the Devices to test mounting substrate, and i is the integer more than or equal to 1 and less than or equal to M.
Optionally, when the M is 3, the first supporting rack in the M supporting rack and the Devices to test mounting substrate
The first line is formed, the second supporting rack in the M supporting rack forms the second line, institute with the Devices to test mounting substrate
State third supporting rack in M supporting rack and the Devices to test mounting substrate and form third line, and first line with
The first angle between second line is equal to the second angle between first line and the third line.
Optionally, first angle is 80 °.
Optionally, first group of parallel light tube in the M groups parallel light tube has the first parallel light tube, and setting is described the
On two supporting racks, second group of parallel light tube in the M groups parallel light tube has the second parallel light tube, is arranged in the third branch
On support, the third group parallel light tube in M group parallel light tubes has third parallel light tube, the 4th parallel light tube, the 5th directional light
Pipe and the 6th parallel light tube, are separately positioned on first supporting rack.
Optionally, first parallel light tube, second parallel light tube and the third parallel light tube be located at it is described
In the first parallel plane of horizontal positioned face, optical axis and first plane of the 4th parallel light tube are in third angle, institute
The optical axis and first plane for stating the 5th parallel light tube are in fourth angle different with the third angle, and the described 6th is parallel
The optical axis of light pipe is in fiveth angle different and different with the 4th angle with the third angle from first plane.
Optionally, the third angle is+60 °, and the 4th angle is+30 °, and the 5th angle is -15 °.
Optionally, the static state angle measurement calibration device further includes：
Six three-dimensional perspective regulating platforms are arranged in the M supporting rack, for the static state angle measurement calibration device
Calibration is adjusted；
Wherein, include locking device in each three-dimensional perspective regulating platform in six three-dimensional perspective regulating platforms, be used for
The M groups parallel light tube is fixed in the M supporting rack.
Optionally, each supporting rack is specially girder in the M supporting rack.
Optionally, the making material of the Devices to test mounting substrate is identical as the making material of M supporting rack.
Optionally, the making material is specially stainless steel material.
Optionally, each parallel light tube in the M groups parallel light tube is specially to be less than predetermined threshold value by the coefficient of expansion
Indium Steel material is made.
Said one in the embodiment of the present application or multiple technical solutions at least have following one or more technology effects
Fruit：
One, due to the technical solution in the embodiment of the present application, using Devices to test mounting substrate, the level of being fixed at is put
It sets on face；M supporting rack is vertically set on the horizontal positioned face, each supporting rack in the M supporting rack with it is described
The distance of Devices to test mounting substrate is identical, and each supporting rack is hollow out frame in the M supporting rack, and M is whole more than or equal to 2
Number；M group parallel light tubes, wherein i-th group of parallel light tube in the M groups parallel light tube is arranged in the M supporting rack and institute
It states on corresponding i-th of the supporting rack of i-th group of parallel light tube, and the optical axis of each parallel light tube is handed in the M groups parallel light tube
It is compiled in a bit on the Devices to test mounting substrate, i is the technological means of the integer more than or equal to 1 and less than or equal to M, this
Sample, static state angle measurement calibration device use the trailing arm design method being independently made of M supporting rack, eliminate the prior art
In transverse arm, process is simple and reduces the weight of whole device；And each supporting rack is hollow out frame, to reduce
The materials of single supporting rack, further mitigate the weight of device, and the connection type of welding can be used in hollow out frame, to make
Make advantage of lower cost, volume weight existing for static state angle measurement calibration device in the prior art is big, adds to efficiently solve
Work is difficult, expensive defect, realizes the light-weight of static state angle measurement calibration device, structure process easy to process and at low cost
Technique effect.
Two, due to the technical solution in the embodiment of the present application, using the Devices to test mounting substrate making material with
The identical technological means of making material of the M supporting rack works as static state angle measurement in this way, using same material even inflation principle
When calibration device causes to thermally expand due to environment temperature, since the thermal expansion state of all devices is all identical, at this point, whole device
Relative angle it is constant, it is in the prior art to efficiently solve therefore, it is possible to be useful in more wide in range temperature difference environment
Static state angle measurement calibration device realizes broadening static state angle measurement calibration to the limitation that its suitable environment temperature requirement is constant temperature laboratory
The technique effect of the use environment of device.
Three, due to the technical solution in the embodiment of the present application, using the Devices to test mounting substrate making material with
The identical technological means of making material of the M supporting rack, in this way, static state angle measurement calibration device only needs primary device calibration,
It achieves that continuously for a long time to equipment angle measurement, solves in high-precision static state angle measurement, caused by variation of ambient temperature
Error improves the calibration efficiency and calibration precision of static state angle measurement.
Four, due to the technical solution in the embodiment of the present application, further include using the static state angle measurement calibration device：Six three
Wei Jiaodutiaojietai is arranged in the M supporting rack, for being adjusted to the calibration of the static state angle measurement calibration device；Wherein,
In each three-dimensional perspective regulating platform include locking device in six three-dimensional perspective regulating platforms, for the M groups is parallel
Light pipe is fixed on the technological means in the M supporting rack, in this way, facilitating each parallel light tube in static state angle measurement calibration device
Itself irregular calibration and angle keep, while also allowing for the adjustment of static state angle measurement calibration device during the installation process.
Description of the drawings
In order to illustrate the technical solutions in the embodiments of the present application or in the prior art more clearly, will be described below to embodiment
Needed in attached drawing be briefly described, it should be apparent that, the accompanying drawings in the following description be only the present invention some
Embodiment.
Figure 1A is the structural schematic diagram at the first visual angle of static state angle measurement calibration device in the embodiment of the present application one；
Figure 1B is the structural schematic diagram at the second visual angle of static state angle measurement calibration device in the embodiment of the present application one；
Fig. 1 C are the structural schematic diagram at the third visual angle of static state angle measurement calibration device in the embodiment of the present application one；
Fig. 2A is the first position view of the supporting rack when M is 3 in the embodiment of the present application one；
Fig. 2 B are second of position view of the supporting rack when M is 3 in the embodiment of the present application one；
Fig. 3 A are the frontage dimension schematic diagram of each parallel light tube in M group parallel light tubes described in the embodiment of the present application one；
Fig. 3 B are the lateral dimension schematic diagram of each parallel light tube in M group parallel light tubes described in the embodiment of the present application one；
Fig. 4 A are connection signal of the parallel light tube with three-dimensional perspective regulating platform at the first visual angle in the embodiment of the present application one
Figure；
Fig. 4 B are connection signal of the parallel light tube with three-dimensional perspective regulating platform at second of visual angle in the embodiment of the present application one
Figure.
Specific implementation mode
The embodiment of the present application provides a kind of static state angle measurement calibration device, for solving static state angle measurement calibration in the prior art
Volume weight existing for device is big, processing difficulties, expensive defect, realizes light-weight, the knot of static state angle measurement calibration device
Structure process easy to process and technique effect at low cost.
In order to solve the above technical problems, general thought is as follows for technical solution in the embodiment of the present application：
A kind of static state angle measurement calibration device, including：
Devices to test mounting substrate is fixed on horizontal positioned face；
M supporting rack is vertically set on the horizontal positioned face, each supporting rack in the M supporting rack and institute
The distance for stating Devices to test mounting substrate is identical, and support frame as described above is hollow out frame, and M is the integer more than or equal to 2；
M group parallel light tubes, wherein i-th group of parallel light tube in the M groups parallel light tube is arranged in the M supporting rack
In on i-th of supporting rack corresponding with i-th group of parallel light tube, and each parallel light tube in the M groups parallel light tube
Optical axis is intersected in a bit on the Devices to test mounting substrate, and i is the integer more than or equal to 1 and less than or equal to M.
In the above-mentioned technical solutions, it using Devices to test mounting substrate, is fixed on horizontal positioned face；M support
Frame is vertically set on the horizontal positioned face, and each supporting rack in the M supporting rack installs base with the Devices to test
The distance at bottom is identical, and each supporting rack is hollow out frame in the M supporting rack, and M is the integer more than or equal to 2；M group directional lights
Pipe, wherein i-th group of parallel light tube setting in the M groups parallel light tube is parallel with described i-th group in the M supporting rack
On corresponding i-th of the supporting rack of light pipe, and in the M groups parallel light tube optical axis of each parallel light tube be intersected in it is described to be measured
On equipment mounting substrate a bit, i be more than or equal to 1 and less than or equal to M integer technological means, in this way, static state angle measurement mark
Calibration device uses the trailing arm design method being independently made of M supporting rack, eliminates transverse arm in the prior art, adds
Work process is simple and reduces the weight of whole device；And each supporting rack is hollow out frame, to reduce single supporting rack
Materials, the weight of device is further mitigated, and hollow out frame cost of manufacture is relatively low, to efficiently solve the prior art
In static state angle measurement calibration device existing for volume weight is big, processing difficulties, expensive defect, realize static state angle measurement calibration
The light-weight of device, structure process easy to process and technique effect at low cost.
In order to better understand the above technical scheme, below by attached drawing and specific embodiment to technical solution of the present invention
It is described in detail, it should be understood that the specific features in the embodiment of the present application and embodiment are to the detailed of technical solution of the present invention
Thin explanation, rather than to the restriction of technical solution of the present invention, in the absence of conflict, the embodiment of the present application and embodiment
In technical characteristic can be combined with each other.
Embodiment one
A- Fig. 1 C are please referred to Fig.1, a kind of structure of static state angle measurement calibration device to be provided in the embodiment of the present application one is shown
It is intended to, the static state angle measurement calibration device includes：
Devices to test mounting substrate 10 is fixed on horizontal positioned face；
M supporting rack 20 is vertically set on the horizontal positioned face, each supporting rack in M supporting rack 20 and institute
The distance for stating Devices to test mounting substrate is identical, and each supporting rack is hollow out frame in M supporting rack 20, and M is whole more than or equal to 2
Number；
M groups parallel light tube 30, wherein i-th group of parallel light tube in M groups parallel light tube 30 is arranged in M supporting rack 20
On i-th of supporting rack corresponding with i-th group of parallel light tube, and in M groups parallel light tube 30 each parallel light tube optical axis
It is intersected in a bit on Devices to test mounting substrate 10, i is the integer more than or equal to 1 and less than or equal to M.
In specific implementation process, the static state angle measurement calibration device specifically can be applied to demarcate or examine photodetection
The static testing angle precision of equipment one schematically illustrates here, just differing.It in the embodiment of the present application, will be with the static state angle measurement calibration
Device is applied for carrying out calibration to the angle measurement accuracy of photoelectric detection equipment, is carried out to the device in the embodiment of the present application detailed
Thin description.
In specific implementation process, the number of supporting rack can be set according to actual needs, can be 3 e.g.
It is a or 4 etc., it is not restricted in the embodiment of the present application；The number of parallel light tube can also carry out according to actual needs
Selection, but need to ensure needing that one is at least arranged on each supporting rack, it is parallel such as when the number of supporting rack is 3
The quantity of light pipe can be 5 or 6, can also be 7 etc., be not restricted in the embodiment of the present application.In following tool
In body description, by with the number of support frame as described above, for 3, the number of the parallel light tube illustrates for being 6.
In the embodiment of the present application one, when the M is 3, the first supporting rack 201 in M supporting rack 20 is set with to be measured
Standby mounting substrate 10 forms the first line, the second supporting rack 202 in M supporting rack 20 and the formation of Devices to test mounting substrate 10
Second line, the third supporting rack 203 in M supporting rack 20 form third line with Devices to test mounting substrate 10, and described
The first angle α between first line and second line is equal to second between first line and the third line
Angle β.
In specific implementation process, above-mentioned example is continued to use, the horizontal positioned mask body can be special shockproof substrate,
The shockproof substrate is horizontal positioned on the ground.First supporting rack 201, the second supporting rack 202 and third supporting rack 203 are specific
Can be arranged the shockproof substrate with Devices to test mounting substrate 10 for the center of circle, a pre-determined distance value be radius circumference
On, e.g., the radius can be 2m, 2.5m etc., and the first supporting rack 201 can be arranged in 1 o'clock side of the circumference that radius is 2m
Upwards, at this point, the second supporting rack 202 and third supporting rack 203 are then separately positioned on 201 both sides of the first supporting rack, such as Fig. 2A institutes
Show；When the position of the first supporting rack 201 changes, the position of the second supporting rack 202 and third supporting rack 203 is also corresponding
Change, as shown in Figure 2 B, and keep the first supporting rack 201 and the second supporting rack 202 angle and the first supporting rack 201
It is identical as the angle of third supporting rack 203.Such as, when the angle of the first supporting rack 201 and the second supporting rack 202 is 60 °, first
The angle of supporting rack 201 and third supporting rack 203 is also 60 °.Preferably, first angle is 80 °, the first supporting rack 201
12 o'clock in the circumference that radius is 2m is set on direction.
In order to mitigate the quality of static state angle measurement calibration device, in the embodiment of the present application, each propped up in the M supporting rack
Support is specially girder.Girder is structure made of one kind is hinged at both ends each other by rod piece.Truss is made of straight-bar
General plane or space structure with triangular element, truss member is primarily subjected to axial tension or pressure, so as to fill
Divide the intensity using material, material is saved than solid web girder when span is larger, mitigating dead weight and increase rigidity can e.g. adopt
It is welded to be formed with angle steel, as shown in figures 1A-c.
In order to realize that relative angle of the entire static state angle measurement calibration device in measurement process is constant, in the embodiment of the present application
In, the making material of Devices to test mounting substrate 10 is identical as the making material of M supporting rack 20.Such as it is all Steel material, is all
Low heat expansion alloy material etc., preferably, the making material is specially stainless steel material.In the embodiment of the present application, the M
Height of a supporting rack 20 apart from horizontal positioned face is 3500mm, and certainly, those skilled in the art can also be according to actual use
Demand is arranged to other sizes, is not restricted in the embodiment of the present application.
In the embodiment of the present application, first group of parallel light tube in M groups parallel light tube 30 has the first parallel light tube 301,
It is arranged on the second supporting rack 202, second group of parallel light tube in M groups parallel light tube 30 has the second parallel light tube 302, setting
On third supporting rack 203, the third group parallel light tube in M groups parallel light tube 30 has third parallel light tube the 303, the 4th parallel
Light pipe 304, the 5th parallel light tube 305 and the 6th parallel light tube 306 are separately positioned on the first supporting rack 201.
First parallel light tube 301, the second parallel light tube 302 and third parallel light tube 303 are located at and the horizontal positioned face
In the first parallel plane, the optical axis of the 4th parallel light tube 304 is in third angle α with first plane1, the 5th parallel light tube
305 optical axis and first plane are in and third angle α1The 4th different angle αs2, the optical axis of the 6th parallel light tube 306 with
First plane be in and third angle α1It is different and with the 4th angle α2The 5th different angle αs3。
In specific implementation process, A- Figure 1B is please referred to Fig.1,3 groups of parallel light tubes are made of 6 parallel light tubes altogether,
In, three light pipes parallel with horizontal plane are set in -80 °, 0 ° and+80 ° three orientation of Devices to test mounting substrate 10, are realized
The orientation of photoelectric detection equipment carries out calibration, if the luminous point that enters of photoelectric detection equipment is that distance is placed at substrate 0.5m, then the
One parallel light tube 301, the second parallel light tube 302 and third parallel light tube 303 must also be separately positioned on three supporting racks away from
At placement substrate 0.5m；Meanwhile setting the other three parallel light tube is also needed on the first supporting rack 201, and the other three is flat
Row light pipe and the angle for entering the horizontal plane where luminous point are different.Such as, the 4th parallel light tube 304, the 5th parallel light tube 305 and
6th parallel light tube 306 can be respectively set to be in+65 ° ,+45 ° ,+15 ° with the angle for entering the horizontal plane where luminous point；Also may be used
To be respectively set to be in+45 ° ,+30 ° ,+15 °, preferably, the third angle is+60 °, the 4th angle is+30 °, institute
It is -15 ° to state the 5th angle, to pass through+60 ° ,+30 °, 0 °, pitching of -15 ° of four representative locations to photoelectric detection equipment
To progress calibration.
In the embodiment of the present application, the size of parallel light tube is relatively small, considers the collimation of its own and the thermalization that disappears, M
Each parallel light tube in group parallel light tube 30 is specially that the indium Steel material by the coefficient of expansion less than predetermined threshold value is made, the M
The size of each parallel light tube is as shown in Fig. 3 A- Fig. 3 B in group parallel light tube 30, unit mm.Those skilled in the art can root
Factually border use demand is configured, and is not restricted in the embodiment of the present application.
In the embodiment of the present application, it is kept in order to facilitate the irregular calibration of device itself and angle, when convenient for device installation
Adjustment, the static state angle measurement calibration device further includes：
Six three-dimensional perspective regulating platforms are arranged in M supporting rack 20；
Wherein, include locking device in each three-dimensional perspective regulating platform in six three-dimensional perspective regulating platforms, be used for
M groups parallel light tube 30 is fixed in M supporting rack 20.
In specific implementation process, relative angle lasting accuracy caused by thermally expanding in order to prevent is poor, six three-dimensionals
Angular adjustment platform can also use material identical with supporting rack, and such as stainless steel material, the three-dimensional perspective regulating platform is for filling
Set the conciliation during adjustment, and after not using for a long time, itself calibration of device is reconciled.The locking device specifically can be with
It is card slot and bayonet combination, buckle is set such as in parallel light tube, card slot is set in the locking device, when in parallel light tube
When buckle is engaged in the card slot, parallel light tube is just fixed on three-dimensional perspective regulating platform.In the embodiment of the present application, described
Locking device can be solid with the X-type holder of arch between three-dimensional perspective regulating platform and parallel light tube as shown in Fig. 3 A- Fig. 4 B
Fixed, the bottom surface of the X-type holder of the arch is fixed with parallel light tube, arch peak and the three-dimensional of the X-type holder of the arch
Angular adjustment platform is fixed；Meanwhile pedestal is set in the lower part of three-dimensional perspective regulating platform, as shown in fig. 4 a and fig. 4b, it is used for and branch
Support connects, and is specifically as follows X-type shown in figure, can also be triangular form, rectangle etc., the size of the pedestal can root
It is configured according to the size of supporting rack, certainly, those skilled in the art can also use other locking devices, implement in the application
It is not restricted in example.
Within the temperature range of ± 10 DEG C, each structure of the static state angle measurement calibration device in the embodiment of the present application is carried out
Deformation is tested, and experimental data shows that it is 3 to take M, when 3 supporting racks are arranged apart from the circumference position of Devices to test mounting substrate 2m
When setting, 0 ° of position, the minimum 2000mm of distance between parallel light tube and Devices to test, deformation within the temperature range of ± 10 DEG C
Maximum value about 14um is to calculate static testing angle precision：Actan (14/2000000)=2 " (rms), it can be seen that, this
Apply for that the applicable for temperature width of the static state angle measurement calibration device in embodiment is ± 10 DEG C, angle measurement accuracy is up to 2 " (rms).
By one or more of the embodiment of the present application technical solution, following one or more technology effects may be implemented
Fruit：
One, due to the technical solution in the embodiment of the present application, using Devices to test mounting substrate, the level of being fixed at is put
It sets on face；M supporting rack is vertically set on the horizontal positioned face, each supporting rack in the M supporting rack with it is described
The distance of Devices to test mounting substrate is identical, and each supporting rack is hollow out frame in the M supporting rack, and M is whole more than or equal to 2
Number；M group parallel light tubes, wherein i-th group of parallel light tube in the M groups parallel light tube is arranged in the M supporting rack and institute
It states on corresponding i-th of the supporting rack of i-th group of parallel light tube, and the optical axis of each parallel light tube is handed in the M groups parallel light tube
It is compiled in a bit on the Devices to test mounting substrate, i is the technological means of the integer more than or equal to 1 and less than or equal to M, this
Sample, static state angle measurement calibration device use the trailing arm design method being independently made of M supporting rack, eliminate the prior art
In transverse arm, process is simple and reduces the weight of whole device；And each supporting rack is hollow out frame, to reduce
The materials of single supporting rack, further mitigate the weight of device, and hollow out frame cost of manufacture is relatively low, to effectively solve
Volume weight existing for static state angle measurement calibration device in the prior art of having determined is big, processing difficulties, expensive defect, realizes
The light-weight of static state angle measurement calibration device, structure process easy to process and technique effect at low cost.
Two, due to the technical solution in the embodiment of the present application, using the Devices to test mounting substrate making material with
The identical technological means of making material of the M supporting rack works as static state angle measurement in this way, using same material even inflation principle
When calibration device causes to thermally expand due to environment temperature, since the thermal expansion state of all devices is all identical, at this point, whole device
Relative angle it is constant, it is in the prior art to efficiently solve therefore, it is possible to be useful in more wide in range temperature difference environment
Static state angle measurement calibration device realizes broadening static state angle measurement calibration to the limitation that its suitable environment temperature requirement is constant temperature laboratory
The technique effect of the use environment of device.
Three, due to the technical solution in the embodiment of the present application, using the Devices to test mounting substrate making material with
The identical technological means of making material of the M supporting rack, in this way, static state angle measurement calibration device only needs primary device calibration,
It achieves that continuously for a long time to equipment angle measurement, solves in high-precision static state angle measurement, caused by variation of ambient temperature
Error improves the calibration efficiency and calibration precision of static state angle measurement.
Four, due to the technical solution in the embodiment of the present application, further include using the static state angle measurement calibration device：Six three
Wei Jiaodutiaojietai is arranged in the M supporting rack, for being adjusted to the calibration of the static state angle measurement calibration device；Wherein,
In each three-dimensional perspective regulating platform include locking device in six three-dimensional perspective regulating platforms, for the M groups is parallel
Light pipe is fixed on the technological means in the M supporting rack, in this way, facilitating each parallel light tube in static state angle measurement calibration device
Itself irregular calibration and angle keep, while also allowing for the adjustment of static state angle measurement calibration device during the installation process.
Although preferred embodiments of the present invention have been described, it is created once a person skilled in the art knows basic
Property concept, then additional changes and modifications may be made to these embodiments.So it includes excellent that the following claims are intended to be interpreted as
It selects embodiment and falls into all change and modification of the scope of the invention.
Obviously, various changes and modifications can be made to the invention without departing from essence of the invention by those skilled in the art
God and range.In this way, if these modifications and changes of the present invention belongs to the range of the claims in the present invention and its equivalent technologies
Within, then the present invention is also intended to include these modifications and variations.
Claims (11)
1. a kind of static state angle measurement calibration device, including M supporting rack, which is characterized in that the static state angle measurement calibration device also wraps
Devices to test mounting substrate and M group parallel light tubes are included, wherein：
The Devices to test mounting substrate, is fixed on horizontal positioned face；
The M supporting rack is vertically set on the horizontal positioned face, each supporting rack in the M supporting rack and institute
The distance for stating Devices to test mounting substrate is identical, and each supporting rack is hollow out frame in the M supporting rack, and M is more than or equal to 2
Integer；
The M groups parallel light tube, wherein i-th group of parallel light tube in the M groups parallel light tube is arranged in the M supporting rack
In on i-th of supporting rack corresponding with i-th group of parallel light tube, and each parallel light tube in the M groups parallel light tube
Optical axis is intersected in a bit on the Devices to test mounting substrate, and i is the integer more than or equal to 1 and less than or equal to M.
2. static state angle measurement calibration device as described in claim 1, which is characterized in that when the M is 3, the M supporting rack
In the first supporting rack and the Devices to test mounting substrate form the first line, the second supporting rack in the M supporting rack
The second line is formed with the Devices to test mounting substrate, the third supporting rack in the M supporting rack and the Devices to test
Mounting substrate forms third line, and the first angle between first line and second line is equal to described first and connects
The second angle between line and the third line.
3. static state angle measurement calibration device as claimed in claim 2, which is characterized in that first angle is 80 °.
4. static state angle measurement calibration device as claimed in claim 2 or claim 3, which is characterized in that first in the M groups parallel light tube
Group parallel light tube has the first parallel light tube, is arranged on second supporting rack, and second group in the M groups parallel light tube is flat
Row light pipe has the second parallel light tube, is arranged on the third supporting rack, the third group parallel light tube tool in M group parallel light tubes
There are third parallel light tube, the 4th parallel light tube, the 5th parallel light tube and the 6th parallel light tube, is separately positioned on first support
On frame.
5. static state angle measurement calibration device as claimed in claim 4, which is characterized in that first parallel light tube, described second
Parallel light tube and the third parallel light tube are located in the first plane parallel with the horizontal positioned face, the 4th directional light
The optical axis of pipe and first plane are in third angle, the optical axis of the 5th parallel light tube and first plane in it is described
The 4th different angle of third angle, the optical axis of the 6th parallel light tube and first plane be in the third angle not
Same and fiveth angle different from the 4th angle.
6. static state angle measurement calibration device as claimed in claim 5, which is characterized in that the third angle is+60 °, described
Four angles are+30 °, and the 5th angle is -15 °.
7. static state angle measurement calibration device as claimed in claim 6, which is characterized in that the static state angle measurement calibration device also wraps
It includes：
Six three-dimensional perspective regulating platforms are arranged in the M supporting rack, for the calibration to the static state angle measurement calibration device
It adjusts；
Wherein, include locking device in each three-dimensional perspective regulating platform in six three-dimensional perspective regulating platforms, be used for institute
M group parallel light tubes are stated to be fixed in the M supporting rack.
8. static state angle measurement calibration device as claimed in claim 7, which is characterized in that each supporting rack in the M supporting rack
Specially girder.
9. static state angle measurement calibration device as claimed in claim 8, which is characterized in that the making of the Devices to test mounting substrate
Material is identical as the making material of M supporting rack.
10. static state angle measurement calibration device as claimed in claim 9, which is characterized in that the making material is specially stainless steel
Material.
11. static state angle measurement calibration device as claimed in claim 10, which is characterized in that each of described M groups parallel light tube
Parallel light tube is specially that the indium Steel material by the coefficient of expansion less than predetermined threshold value is made.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610526005.7A CN106152975B (en) | 2016-07-04 | 2016-07-04 | A kind of static state angle measurement calibration device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610526005.7A CN106152975B (en) | 2016-07-04 | 2016-07-04 | A kind of static state angle measurement calibration device |
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| Publication Number | Publication Date |
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| CN106152975A CN106152975A (en) | 2016-11-23 |
| CN106152975B true CN106152975B (en) | 2018-08-21 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610526005.7A Active CN106152975B (en) | 2016-07-04 | 2016-07-04 | A kind of static state angle measurement calibration device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113406585A (en) * | 2021-07-01 | 2021-09-17 | 四川九洲电器集团有限责任公司 | Dynamic target simulator and phased array system |
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|---|---|---|---|---|
| US3953033A (en) * | 1974-10-10 | 1976-04-27 | Kelly Norman A | Golfer's putting stance analyzing device |
| US4043167A (en) * | 1976-01-23 | 1977-08-23 | Sidro Kg Ludwig Moller Fabrik Fur Rohrbogen | Process and machine for finishing a 15° to 180° pipe bend which has been preformed on a pipe bending press |
| CN103743344A (en) * | 2014-01-20 | 2014-04-23 | 长春理工大学 | Object motion track measuring system |
| CN203672321U (en) * | 2014-01-26 | 2014-06-25 | 湖南航天机电设备与特种材料研究所 | Vision measurement system of large flexible capsule size |
| CN104964696A (en) * | 2015-06-12 | 2015-10-07 | 南京市计量监督检测院 | Total station electronic tacheometer automatic wireless remote control and calibration device and method |
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2016
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3953033A (en) * | 1974-10-10 | 1976-04-27 | Kelly Norman A | Golfer's putting stance analyzing device |
| US4043167A (en) * | 1976-01-23 | 1977-08-23 | Sidro Kg Ludwig Moller Fabrik Fur Rohrbogen | Process and machine for finishing a 15° to 180° pipe bend which has been preformed on a pipe bending press |
| CN103743344A (en) * | 2014-01-20 | 2014-04-23 | 长春理工大学 | Object motion track measuring system |
| CN203672321U (en) * | 2014-01-26 | 2014-06-25 | 湖南航天机电设备与特种材料研究所 | Vision measurement system of large flexible capsule size |
| CN104964696A (en) * | 2015-06-12 | 2015-10-07 | 南京市计量监督检测院 | Total station electronic tacheometer automatic wireless remote control and calibration device and method |
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| CN106152975A (en) | 2016-11-23 |
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