CN106055443A - Multichannel DC circulation test system - Google Patents
Multichannel DC circulation test system Download PDFInfo
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- CN106055443A CN106055443A CN201610397069.1A CN201610397069A CN106055443A CN 106055443 A CN106055443 A CN 106055443A CN 201610397069 A CN201610397069 A CN 201610397069A CN 106055443 A CN106055443 A CN 106055443A
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- test
- main frame
- control
- controller module
- singlechip controller
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- 238000012360 testing method Methods 0.000 title claims abstract description 58
- 238000000034 method Methods 0.000 claims abstract description 5
- 238000004891 communication Methods 0.000 claims description 3
- 238000012544 monitoring process Methods 0.000 abstract description 4
- 230000005540 biological transmission Effects 0.000 description 2
- 241000196324 Embryophyta Species 0.000 description 1
- 235000012364 Peperomia pellucida Nutrition 0.000 description 1
- 240000007711 Peperomia pellucida Species 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2284—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by power-on test, e.g. power-on self test [POST]
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention discloses a multipath DC circulation test system, which comprises: the control host machine sets a plurality of channels of tested machine tables, testing cycle times and cycle time interval parameters through programs and outputs control information to the single chip microcomputer controller module according to input information; the single chip microcomputer controller module receives the information input by the control host and then respectively sends startup and shutdown signals to the plurality of tested servers through the multi-way switch module; the structure of the multi-way switch module comprises multi-way relays, and each relay sends out a control signal according to the single chip microcomputer controller module to complete the on-off action of the power button of the corresponding test machine. The system can realize the simultaneous test of a plurality of machines to be tested at one time, has no mutual interference, has independent test results, does not need manual participation, can monitor the test condition of each machine in time, can achieve the effects of multi-path monitoring and multi-path control, and can effectively improve the test efficiency and simplify the test process.
Description
Technical field
The present invention relates to server stability/reliability testing technical field, be specifically related to a kind of multichannel DC loop test
System, a kind of Auto-Test System that multiple servers can carry out DC switching on and shutting down loop test simultaneously respectively, especially with respect to one
Plant and be applied to server at functional and reliability automatic test approach.
Background technology
At server, in the test of the product such as storage, DC switching on and shutting down loop test is in the electronic product tests such as computer
The project that must survey, it is related to the reliability and stability of product, but test equipment can only be carried out product is man-to-man at present
Test, when product is a lot, owing to test number of devices is limited, easily causes the conflict of device resource, and different product needs row
Team tests, and the extended testing system time, can increase the research and development test period of product.
Summary of the invention
The technical problem to be solved in the present invention is: in place of the present invention is directed to the deficiencies in the prior art, it is provided that a kind of multichannel DC
Loop test system, can carry out DC switching on and shutting down loop test respectively simultaneously to multiple servers.
The technical solution adopted in the present invention is:
A kind of multichannel DC loop test system, described system includes controlling main frame, singlechip controller module, variable connector mould
Block, wherein:
Control main frame, by parameters such as the tested board of program setting multichannel, test loop number of times, circulation time intervals, and according to
The information of input, output control information, to singlechip controller module, also has display test mode and and controller in real time concurrently
The function of transmission information;
Singlechip controller module, after accepting to control the information that main frame inputs, sends control letter respectively by variable connector module
Number give the tested server of multiple stage;
The structure of variable connector module includes multicircuit relay, and every road relay sends control letter according to singlechip controller module
Number complete the switching on and shutting down action of corresponding tester table power knob Power Button.
Controlling main frame by native system, unit can carry out the automatic of DC switching on and shutting down circulation respectively simultaneously to multiple stage tester table
Test, it is not necessary to manually participate in, and the test status of each board can be monitored in time, multi-path monitoring can be reached, multi-channel control
Effect.
Described system operation is as follows:
1) first control main frame is coupled by serial port data line with singlechip controller module, then variable connector module
Switching on and shutting down holding wire couples with the switching on and shutting down holding wire of server;
2) run the control program of control main frame, first activate serial ports, if successfully representing and controlling main frame and singlechip controller mould
Block communication is normal, then sets the parameter such as number of times and time delay of loop test, then start corresponding tested machine that
Road control signal, controls main frame and the information set up is sent to singlechip controller module;
3) after singlechip controller module receives the configuration information of correspondence, that road relay corresponding is controlled according to the information arranged
Device closes once, is equivalent to press the power knob Power Button of tester table, and tester table starts, and sends out after starting successfully
Information is given and is controlled main frame, controls main frame photos and sending messages again and closes once to controller, that road relay of control correspondence, test machine quilt
Close Shutdown, so far complete once to circulate.
Described control main frame passes through software records in test process and shows state, until the cycle-index set is complete
Become, and show test result.
The invention have the benefit that
Present system is by controlling main frame, and unit can carry out oneself of DC switching on and shutting down circulation respectively simultaneously to multiple stage tester table
Dynamic test, thus reach to carry out the test of the tested machine of multiple stage the most simultaneously, and do not interfere with each other, test result is independent, it is not necessary to
Artificial participation, and the test status of each board can be monitored in time, multi-path monitoring can be reached, the effect of multi-channel control, can have
Effect promotes testing efficiency and simplifies testing process, it is adaptable to current all of server product, improve the automatization of test
Degree, and can guarantee that real user environment, it is ensured that product quality.
Accompanying drawing explanation
Fig. 1 is present system operational flowchart.
Detailed description of the invention
Below in conjunction with Figure of description, according to detailed description of the invention, the present invention is further described:
Embodiment 1:
A kind of multichannel DC loop test system, described system includes controlling main frame, singlechip controller module, variable connector mould
Block, wherein:
Control main frame, by parameters such as the tested board of program setting multichannel, test loop number of times, circulation time intervals, and according to
The information of input, output control information, to singlechip controller module, also has display test mode and and controller in real time concurrently
The function of transmission information;
Singlechip controller module, after accepting to control the information that main frame inputs, sends control letter respectively by variable connector module
Number give the tested server of multiple stage;
The structure of variable connector module includes multicircuit relay, and every road relay sends control letter according to singlechip controller module
Number complete the switching on and shutting down action of corresponding tester table power knob Power Button.
By native system, control main frame and can multiple stage tester table be carried out respectively the automatic survey of DC switching on and shutting down circulation simultaneously
Examination, it is not necessary to manually participate in, and the test status of each board can be monitored in time, multi-path monitoring can be reached, the effect of multi-channel control
Really.
Embodiment 2
As it is shown in figure 1, on the basis of embodiment 1, described in the present embodiment, system operation is as follows:
1) first control main frame is coupled by serial port data line with singlechip controller module, then variable connector module
Switching on and shutting down holding wire couples with the switching on and shutting down holding wire of server;
2) run the control program of control main frame, first activate serial ports, if successfully representing and controlling main frame and singlechip controller mould
Block communication is normal, then sets the parameter such as number of times and time delay of loop test, then start corresponding tested machine that
Road control signal, controls main frame and the information set up is sent to singlechip controller module;
3) after singlechip controller module receives the configuration information of correspondence, that road relay corresponding is controlled according to the information arranged
Device closes once, is equivalent to press the power knob Power Button of tester table, and tester table starts, and sends out after starting successfully
Information is given and is controlled main frame, controls main frame photos and sending messages again and closes once to controller, that road relay of control correspondence, test machine quilt
Close Shutdown, so far complete once to circulate.
Embodiment 3
On the basis of embodiment 1 or 2, control main frame described in the present embodiment and in test process, pass through software records and show shape
State, until the cycle-index set completes, and shows test result.
Embodiment is merely to illustrate the present invention, and not limitation of the present invention, about the ordinary skill of technical field
Personnel, without departing from the spirit and scope of the present invention, it is also possible to make a variety of changes and modification, the most all equivalents
Technical scheme fall within scope of the invention, the scope of patent protection of the present invention should be defined by the claims.
Claims (3)
1. a multichannel DC loop test system, it is characterised in that: described system includes controlling main frame, singlechip controller mould
Block, variable connector module, wherein:
Control main frame, by the tested board of program setting multichannel, test loop number of times, circulation time spacing parameter, and according to defeated
The information entered, output control information is to singlechip controller module;
Singlechip controller module, after accepting to control the information that main frame inputs, gives multiple stage tested respectively by variable connector module
Server sends switching on and shutting down signal;
The structure of variable connector module includes multicircuit relay, and every road relay sends control letter according to singlechip controller module
Number complete the switching on and shutting down action of corresponding tester table power knob.
A kind of multichannel DC loop test system the most according to claim 1, it is characterised in that described system operation is such as
Under:
1) first control main frame is coupled by serial port data line with singlechip controller module, then variable connector module
Switching on and shutting down holding wire couples with the switching on and shutting down holding wire of server;
2) run the control program of control main frame, first activate serial ports, if successfully representing and controlling main frame and singlechip controller mould
Block communication is normal, then sets number of times and the delay time parameter of loop test, then starts corresponding that road of tested machine
Control signal, controls main frame and the information set up is sent to singlechip controller module;
3) after singlechip controller module receives the configuration information of correspondence, that road relay corresponding is controlled according to the information arranged
Device close once, tester table start, after starting successfully photos and sending messages give control main frame, control main frame photos and sending messages again to controller,
Controlling that road relay corresponding to close once, test machine is closed, and so far completes once to circulate.
A kind of multichannel DC loop test system the most according to claim 1 and 2, it is characterised in that: described control main frame exists
Test process pass through software records and shows state, until the cycle-index set completes, and showing test result.
Priority Applications (1)
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CN201610397069.1A CN106055443A (en) | 2016-06-07 | 2016-06-07 | Multichannel DC circulation test system |
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CN201610397069.1A CN106055443A (en) | 2016-06-07 | 2016-06-07 | Multichannel DC circulation test system |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107589818A (en) * | 2017-09-13 | 2018-01-16 | 上海摩软通讯技术有限公司 | The self-starting test system and its method of testing of mobile terminal |
CN107908510A (en) * | 2017-11-09 | 2018-04-13 | 郑州云海信息技术有限公司 | The wireless test system of multiple servers and electronic product stability can be tested at the same time |
CN109828877A (en) * | 2019-01-22 | 2019-05-31 | 山东华芯半导体有限公司 | A kind of batch system disk SSD power failure test method based on mainboard |
CN109840171A (en) * | 2019-01-22 | 2019-06-04 | 山东华芯半导体有限公司 | A kind of simple SSD power failure test method |
CN111665412A (en) * | 2019-12-11 | 2020-09-15 | 重庆芯讯通无线科技有限公司 | Method and system for testing aging of module on/off |
CN112115008A (en) * | 2020-09-16 | 2020-12-22 | 天津津航计算技术研究所 | Method and system for testing one-to-many data recorder |
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CN201159852Y (en) * | 2007-08-01 | 2008-12-03 | 樊亚涛 | Programmable remote control duplex sequence switch power source wiring board |
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US20120293014A1 (en) * | 2011-05-19 | 2012-11-22 | Hon Hai Precision Industry Co., Ltd. | Power supply |
CN203299742U (en) * | 2013-06-14 | 2013-11-20 | 东北农业大学成栋学院 | Device for timing startup and shutdown of computer |
CN103455399A (en) * | 2013-09-25 | 2013-12-18 | 浪潮电子信息产业股份有限公司 | Multichannel server on-off fatigue testing method based on single-chip microcomputer |
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Patent Citations (6)
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CN1484147A (en) * | 2002-09-20 | 2004-03-24 | 联想(北京)有限公司 | System and method for realizing automatic on/off test of computer |
CN201159852Y (en) * | 2007-08-01 | 2008-12-03 | 樊亚涛 | Programmable remote control duplex sequence switch power source wiring board |
TW201216042A (en) * | 2010-10-14 | 2012-04-16 | Hon Hai Prec Ind Co Ltd | Power supply apparatus and method of AC power cycle test for a motherboard |
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Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
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CN107589818A (en) * | 2017-09-13 | 2018-01-16 | 上海摩软通讯技术有限公司 | The self-starting test system and its method of testing of mobile terminal |
CN107908510A (en) * | 2017-11-09 | 2018-04-13 | 郑州云海信息技术有限公司 | The wireless test system of multiple servers and electronic product stability can be tested at the same time |
CN109828877A (en) * | 2019-01-22 | 2019-05-31 | 山东华芯半导体有限公司 | A kind of batch system disk SSD power failure test method based on mainboard |
CN109840171A (en) * | 2019-01-22 | 2019-06-04 | 山东华芯半导体有限公司 | A kind of simple SSD power failure test method |
CN111665412A (en) * | 2019-12-11 | 2020-09-15 | 重庆芯讯通无线科技有限公司 | Method and system for testing aging of module on/off |
CN112115008A (en) * | 2020-09-16 | 2020-12-22 | 天津津航计算技术研究所 | Method and system for testing one-to-many data recorder |
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