CN106033093A - Auxiliary device for testing - Google Patents
Auxiliary device for testing Download PDFInfo
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- CN106033093A CN106033093A CN201510106822.2A CN201510106822A CN106033093A CN 106033093 A CN106033093 A CN 106033093A CN 201510106822 A CN201510106822 A CN 201510106822A CN 106033093 A CN106033093 A CN 106033093A
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Abstract
The invention discloses an auxiliary device for testing. The auxiliary device comprises a testing board and a switch board. A testing resource selection channel is arranged on the switch board and needed testing resources can be selected according to a type of a to-be-tested product. According to the invention, the independent switch board is arranged and the testing resource selection channel is arranged on the switch board to select testing resources on a testing machine, so that a problem that a testing board only carries out specific item testing on products with specific types because pins of to-be-tested products and testing resources of a testing machine match each other only by a few of fixed ways due to the fixed connecting mode between the testing board and the testing machine according to the correlation techniques can be solved. Therefore, the pins of to-be-tested products and the testing resources can be matched freely to test various products under the limited testing resources.
Description
Technical field
The present invention relates to electronic test equipment field, in particular to a kind of testing auxiliary device.
Background technology
IT product, such as: SRAM, FLASH memory, logical device and power supply
Chips etc. need to test before use.Mainly test the DC parameter of these products such as: open circuit,
Short circuit current, leakage current, standby current, power supply DC parameter, resistance etc., and some exchanges
Parameter is such as: reading and writing electric current.In correlation technique, it would be desirable to be test for product to be measured and be arranged on test
On plate, and by test board is connected with the TCH test channel of test machine, test corresponding for TCH test channel is provided
Source introduces test board and is attached testing Related product, but, the test resource of most of test machines
Limited, but product category is various, and the connected mode between test board and the TCH test channel of test machine is
Fix, so cause the product pin of product to be measured to have very with the collocation of the test resource of test machine
Big limitation, so that test board can only test certain types of product, but, great majority test
Resource-constrained, but product category is various, and relevant test board cannot meet the survey of multiple types product
The requirement of examination.
For present in prior art owing to fixing due to connected mode between test board and test machine
The technical problem cannot tested multiple types product caused, the most not yet proposes effective solution
Scheme.
Summary of the invention
Embodiments provide a kind of testing auxiliary device, at least to solve correlation technique exists
Due between test board and test machine due to connected mode fix cause cannot be to multiple types product
Carry out the technical problem tested.
An aspect according to embodiments of the present invention, it is provided that a kind of testing auxiliary device, including: survey
Test plate (panel), is provided with the first port for being connected with product to be measured；And keyset, it is provided with test
Resource selection passage, is used for the type according to described product to be measured and is selected by described test resource logical
Road selects test resource, and wherein, described test resource selector channel includes for described test board even
The second port of connecing and for the 3rd port being connected with test machine, described first port is by described the
Two-port netwerk is connected with described test resource selector channel.
Alternatively, described test resource selector channel includes: multiple test resources select unit, each
Described test resource selects unit second port described with respectively and described 3rd port even
Connect.
Alternatively, be provided with in described first port multiple for being connected with described product to be measured first
Pin, is provided with multiple the second pin for being connected with described first pin in described second port,
It is provided with, in described 3rd port, the three-prong that multiple and described test machine is connected.
Alternatively, described testing auxiliary device also includes switching device, and described test resource selects unit
Including: the first junction point, wherein, the quantity of described first junction point is multiple, multiple described first
Junction point is arranged in columns, and is connected with each other and is connected to described second end described in each column between the first junction point
On described second pin of one of them in Kou；And second junction point, wherein, described second connects
The quantity of point is multiple, and multiple described second junction points are arranged in a row, and, described in multiple row, first even
Contact is matrix form interlaced arrangement with the second junction point described in multirow, often goes between described second junction point
It is connected with each other and is connected on one of them the described three-prong in described 3rd port, each described
Between first junction point with adjacent side described second junction point by described switching device even
Connect.
Alternatively, described keyset includes: top plate, and wherein, multiple described first junction points are arranged
On described top plate；And lower plywood, wherein, multiple described second junction points be arranged on described under
On laminate.
Alternatively, described top plate includes: via, is arranged on each described second junction point described
The orthographic projection position of top plate；And connection conductor, it is arranged in described via, wherein, described
One end of switching device is directly connected with described first junction point, and the other end of described switching device passes through
Described connection conductor is connected with described second junction point.
Alternatively, described switching device includes: multiple toggle switch, and each described toggle switch is respectively
Multiple described second junction point of multiple described first junction points and adjacent side is linked together.
Alternatively, described test resource selector channel also includes power port, and described test resource selects
Unit includes: power supply terminal, and wherein, the quantity of described power supply terminal is multiple, multiple described power supplys
Terminal is linearly arranged in described test resource and selects one side of unit, the one of each described power supply terminal
End is connected with described power port, and the other end of each described power supply terminal passes through a described derailing switch
Part is connected with the first junction point described in string；Ground terminal, wherein, the quantity of described ground terminal is
Multiple, multiple described ground terminals are linearly arranged in described test resource and select unit another side, often
One end of individual described ground terminal is connected with described power port, the other end of each described power supply terminal
It is connected with the first junction point described in string by a described switching device.
Alternatively, described test board is provided with the 4th port being connected with described first port, described
First port is connected with described second port by described 4th port.
Alternatively, winding displacement is used to be connected between described 4th port and described second port, described winding displacement
Including coaxial cable.
Alternatively, described test board is provided with the signal detection port being connected with described first port,
Wherein said signal detection port is multiple, and each described signal detection port has and sets with external detection
The standby union joint matched.
The embodiment of the present invention is by arranging independent keyset, and provides by arranging test on keyset
The test resource of test machine is selected by selector channel, source, solves test board and survey in correlation technique
Fixing connected mode is used to cause the product pin of product to be measured and the test of test machine between test-run a machine
Several collocation modes that resource is the most fixing, so that test board can only enter for certain types of product
Row specific project test problem, reached under limited test resource, make product pin to be measured with
Test resource carries out free collocation, the technique effect testing multiple types product.
Accompanying drawing explanation
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the one of the application
Part, the schematic description and description of the present invention is used for explaining the present invention, is not intended that this
Bright improper restriction.In the accompanying drawings:
Fig. 1 is optional a kind of testing auxiliary device structure chart according to embodiments of the present invention；
Fig. 2 is optional a kind of adapter plate structure schematic diagram according to embodiments of the present invention；
Fig. 3 is optional a kind of test plate structure schematic diagram according to embodiments of the present invention；
Fig. 4 is that optional a kind of test resource selects cellular construction schematic diagram according to embodiments of the present invention；
Fig. 5 is optional a kind of toggle switch structural representation according to embodiments of the present invention；
Fig. 6 is optional keyset partial structurtes schematic diagram according to embodiments of the present invention.
Detailed description of the invention
In order to make those skilled in the art be more fully understood that the present invention program, below in conjunction with the present invention
Accompanying drawing in embodiment, is clearly and completely described the technical scheme in the embodiment of the present invention,
Obviously, described embodiment is only the embodiment of a present invention part rather than whole enforcement
Example.Based on the embodiment in the present invention, those of ordinary skill in the art are not making creative work
The every other embodiment obtained under premise, all should belong to the scope of protection of the invention.
Fig. 1 is optional a kind of testing auxiliary device structure chart according to embodiments of the present invention.
As it is shown in figure 1, the testing auxiliary device of the embodiment of the present invention includes test board 1 and keyset 2,
First port 11 being provided centrally with being connected with product to be measured of test board 1, product to be measured is drawn by it
Foot is connected in the pin of the first port 11；Test resource selector channel 21 it is provided with on keyset 2,
Test resource selector channel 21 include the second port 22 for being connected with test board 1 and for survey
The 3rd port 23 that test-run a machine connects, the first port of test board 1 is by connecting cable and keyset 2
The second port 22 connect, thus be connected to test resource selector channel 21 by the second port 22
On.During product test, product to be measured is fixedly connected on the first port 11 of test board 1
On, the TCH test channel of test machine is connected with the 3rd port 23 of keyset 2 and is incorporated into by test resource
In keyset 2, selected by test resource according to the type of product to be measured and the project of required test
Passage 21 selects from the test resource introduced, and selected test resource passes through keyset 2
The second port 22 be sent on the first port 11 of test board 1 for testing product to be measured.
The embodiment of the present invention is by arranging independent keyset 2, and passes through to arrange survey on keyset 2
The test resource of test machine is selected by examination resource selection passage 21, it is possible to according to product to be measured
Type and test event unrestricted choice test resource, solve in correlation technique test board and test machine it
Between use fixing connected mode only to cause the test resource of the product pin of product to be measured and test machine
There are fixing several collocation modes, so that test board can only carry out specific for certain types of product
The problem of project testing, has reached under limited test resource, makes product pin to be measured and test money
Source carries out free collocation, the technique effect testing multiple types product.
Fig. 2 is optional a kind of adapter plate structure schematic diagram according to embodiments of the present invention.
As in figure 2 it is shown, test resource selector channel 21 can be divided into multiple test resource as required
Selecting unit 211, test resource is selected the number of unit 211 to be not construed as limiting by the present invention.This enforcement
The preferred test resource of example select unit 211 be four, each test resource select unit 211 respectively with
One the second port 22 and the 3rd port 23 connect.To have the test of 128 TCH test channels
Illustrating as a example by machine, each test resource selects unit 211 to connect 32 TCH test channels respectively,
Wherein, every TCH test channel provides a test resource, and the most each test resource selects on unit 211
There are 32 test resources.Correspondingly, the 3rd be connected with each test resource selection unit 211
There is in port 23 three-prong 2302 of 32 and the 32 of test machine articles of corresponding connections of TCH test channel
Thus 32 test resources are introduced test resource and selects unit 211.
Fig. 3 is optional a kind of test plate structure schematic diagram according to embodiments of the present invention.
As shown in Figure 3, it is preferable that on the present embodiment test board 1, be provided with four and the first port 11
The 4th port 12 connected, winding displacement that each 4th port 12 uses coaxial cable to form and keyset
Second port 22 of 2 connects thus each test resource selects 32 test moneys on unit 211
Source is incorporated on the first port 11 of test board 1.Alternatively, on the present embodiment test board 1
The first pin 1102 number being connected with product to be measured in Single port 11 is 144, the most permissible
Test 144 pins of products signals, thus each 4th port 12 needs with 36 pins of products even
Connect, therefore, have in each 4th port 12 36 the 4th pins 1202 respectively with the first pin
1102 connect, and correspondingly, the second port 22 of keyset 2 also has 36 for the 4th port
11 the second pins 2202 connected.
Fig. 4 is that optional a kind of test resource selects cellular construction schematic diagram according to embodiments of the present invention.
Fig. 5 is optional a kind of toggle switch structural representation according to embodiments of the present invention.
Fig. 6 is optional keyset partial structurtes schematic diagram according to embodiments of the present invention.
As shown in Figure 4, each test resource select unit 211 includes multiple be arranged in columns the
One junction point 2111 and multiple the second junction point 2112 being arranged in a row, wherein, each column first connects
One of them second pin 2202 being connected with each other and be connected in the second port 22 between point 2111
On, and be connected with a pins of products by the second pin 2202, therefore, the second pin 2202
The columns of number and the first junction point 2111 is identical, and the most each test resource selects to be had on unit 211
There are 36 row the first junction points 2111；Often it is connected with each other and is connected between row the second junction point 2112
Wherein giving on a three-prong 2302 in three ports 23, and by three-prong 2302 and
Individual test resource connects, therefore, and the number of the second pin 2302 and the line number of the second junction point 2112
Identical, the most each test resource selects have 32 row the second junction points, each test on unit 211
36 row the first junction point 2111 and 32 row the second junction points 2112 on resource selection unit 211 in
The interlaced layout of matrix form.Wherein, of each first junction point 2111 and adjacent side
Connected by switching device 24 between two junction points 2112.As it is shown in figure 5, the dial-up of the present embodiment
Switch 2402 preferably employs eight toggle switch, and each eight toggle switch are respectively by eight first even
Contact 2111 and eight the second junction points 2112 link together for control test resource open and
Close, therefore, string the first junction point 2111 in unit 211 is selected for a TCH test channel, need
Four toggle switch 2402 are wanted first junction point 2111 and the second junction point 2112 to be connected.In order to
Make interconnective string the first junction point 2111 and interconnective a line the second junction point 2112 phase
Interlocking mutually and will not cross, as shown in Figure 6, keyset 2 is divided into top plate 25 and lower plywood 26,
First junction point 2111 is arranged in columns on top plate 25, and the second junction point 2112 is arranged in a row
On lower plywood 26, each second junction point 2112 on lower plywood 26 is in the orthographic projection position of top plate
The place of putting is provided with a via 2113, is provided with connection conductor 2114 in via 2113.Toggle switch
2402 are arranged on top plate 25, and each one of them pin of toggle switch 2402 is directly with the
One junction point 2111 connects, and another pin is by the connection conductor 2114 in via 2113 and position
The second junction point 2112 on lower plywood 26 connects.For string the first junction point 2111, due to
Its pins of products corresponding with one connects, and therefore, a pins of products may be selected by 32 kinds not
Same test resource, keyset 2 has four test resources and selects unit 211, it is possible to achieve produce
Product pin is 36 × 32 × 4=4608 kind with the compound mode of test resource, by stirring dial-up
The realization of opening and close of 2402 corresponding positions is introduced into the test resource of test resource selection unit 211
The first port 11 being optionally input to test board 1 is needed according to product type to be measured and test
On, in order to meet multiple different product and test.
When selecting test resource, in addition it is also necessary to the power supply of test machine is connected to the first end of test board 1
On the product to be measured of mouthfuls 11, specifically, as in figure 2 it is shown, test machine power supply with on keyset 2
Power port 27 connects, power port 27 with select the electricity of unit 211 with each test resource respectively
Source terminal 2115 and ground terminal 2116 connect, and as shown in Figure 4, each test resource selects unit
211 have 36 power supply terminals 2115 and 36 ground terminals 2116, pass through switching device respectively
24 connections corresponding with 36 row the first junction points 2111, are transported to the first of test board 1 by power supply signal
On port 11 on each first pin 1102.
In the debugging stage of product test, need on test board 1 connect oscillograph, logic analyser,
Product signal is detected by the equipment such as circuit tester, correspondingly, as it is shown on figure 3, on test board 1
Being provided with multiple signal detection port 13 being connected with the first port 11, the present embodiment is preferably in test
Four signal detection ports 13 it are provided with on plate 1, corresponding with the number of the 4th port 12, Mei Gexin
Number detection port 13 have the union joint that matches with external detection equipment for external detection equipment
Connect.
The above is only the preferred embodiment of the present invention, it is noted that for the art
For those of ordinary skill, under the premise without departing from the principles of the invention, it is also possible to make some improvement
And retouching, these improvements and modifications also should be regarded as protection scope of the present invention.
Claims (11)
1. a testing auxiliary device, it is characterised in that including:
Test board, is provided with the first port for being connected with product to be measured；And
Keyset, is provided with test resource selector channel, for the class according to described product to be measured
Type also selects test resource, wherein, described test resource by described test resource selector channel
Selector channel includes the second port for being connected with described test board and for being connected with test machine
The 3rd port, described first port selects logical by described second port and described test resource
Road connects.
Device the most according to claim 1, it is characterised in that described test resource selector channel is wrapped
Include:
Multiple test resources select unit, each described test resource select unit respectively with one
Described second port and described 3rd port connect.
Device the most according to claim 2, it is characterised in that
Multiple the first pin for being connected it is provided with described product to be measured in described first port,
Multiple the second pin for being connected, institute it is provided with described first pin in described second port
The three-prong that multiple and described test machine is connected it is provided with in stating the 3rd port.
Device the most according to claim 3, it is characterised in that described testing auxiliary device also includes
Switching device, described test resource selects unit to include:
First junction point, wherein, the quantity of described first junction point is multiple, multiple described
One junction point is arranged in columns, and is connected with each other and is connected to described described in each column between the first junction point
On one of them described second pin in second port；And
Second junction point, wherein, the quantity of described second junction point is multiple, multiple described
Two junction points are arranged in a row, and, the first junction point described in multiple row is connected with described in multirow second
Point, in matrix form interlaced arrangement, is often gone and is connected with each other and is connected to institute between described second junction point
State on one of them the described three-prong in the 3rd port, each described first junction point and phase
Connected by described switching device between one described second junction point of adjacent side.
Device the most according to claim 4, it is characterised in that described keyset includes:
Top plate, wherein, multiple described first junction points are arranged on described top plate；And
Lower plywood, wherein, multiple described second junction points are arranged on described lower plywood.
Device the most according to claim 5, it is characterised in that described top plate includes:
Via, is arranged on each described second junction point in the orthographic projection position of described top plate；
And
Connecting conductor, be arranged in described via, wherein, one end of described switching device is direct
Be connected with described first junction point, the other end of described switching device by described connection conductor with
Described second junction point connects.
7. according to described device arbitrary in claim 4 to 6, it is characterised in that described switching device
Including:
Multiple toggle switch, each described toggle switch respectively by multiple described first junction points and
Multiple described second junction point of adjacent side links together.
8. according to the device according to any one of claim 2 to 6, it is characterised in that described test provides
Selector channel, source also includes power port, and described test resource selects unit to include:
Power supply terminal, wherein, the quantity of described power supply terminal is multiple, multiple described power ends
Son is linearly arranged in described test resource and selects one side of unit, each described power supply terminal
One end is connected with described power port, and the other end of each described power supply terminal is by described in one
Switching device is connected with the first junction point described in string；
Ground terminal, wherein, the quantity of described ground terminal is multiple, multiple described earth terminals
Son is linearly arranged in described test resource and selects unit another side, each described ground terminal
One end is connected with described power port, and the other end of each described power supply terminal is by described in one
Switching device is connected with the first junction point described in string.
Device the most according to claim 1, it is characterised in that be provided with on described test board and institute
Stating the 4th port that the first port connects, described first port passes through described 4th port with described
Second port connects.
Device the most according to claim 9, it is characterised in that
Using winding displacement to be connected between described 4th port and described second port, described winding displacement includes
Coaxial cable.
11. devices according to claim 10, it is characterised in that
The signal detection port being connected with described first port it is provided with, wherein on described test board
Described signal detection port is multiple, and each described signal detection port has and sets with external detection
The standby union joint matched.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510106822.2A CN106033093A (en) | 2015-03-10 | 2015-03-10 | Auxiliary device for testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510106822.2A CN106033093A (en) | 2015-03-10 | 2015-03-10 | Auxiliary device for testing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106033093A true CN106033093A (en) | 2016-10-19 |
Family
ID=57151092
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510106822.2A Pending CN106033093A (en) | 2015-03-10 | 2015-03-10 | Auxiliary device for testing |
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| Country | Link |
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| CN (1) | CN106033093A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106249001A (en) * | 2016-05-05 | 2016-12-21 | 苏州能讯高能半导体有限公司 | A kind of test board |
| CN109212270A (en) * | 2017-06-30 | 2019-01-15 | 嘉兴鹏武电子科技有限公司 | A kind of test device |
| CN112630678A (en) * | 2020-12-11 | 2021-04-09 | 浪潮电子信息产业股份有限公司 | Test system of mainboard core power supply |
| CN113358902A (en) * | 2021-06-08 | 2021-09-07 | 广东利扬芯片测试股份有限公司 | Signal adapter plate, chip testing device and testing method |
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| CN106249001A (en) * | 2016-05-05 | 2016-12-21 | 苏州能讯高能半导体有限公司 | A kind of test board |
| CN106249001B (en) * | 2016-05-05 | 2019-06-14 | 苏州能讯高能半导体有限公司 | A kind of test board |
| CN109212270A (en) * | 2017-06-30 | 2019-01-15 | 嘉兴鹏武电子科技有限公司 | A kind of test device |
| CN112630678A (en) * | 2020-12-11 | 2021-04-09 | 浪潮电子信息产业股份有限公司 | Test system of mainboard core power supply |
| CN113358902A (en) * | 2021-06-08 | 2021-09-07 | 广东利扬芯片测试股份有限公司 | Signal adapter plate, chip testing device and testing method |
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Application publication date: 20161019 |