CN106018978A - Method for studying micro-perturbation of electromagnetic field probe by changing the power of radiation source - Google Patents
Method for studying micro-perturbation of electromagnetic field probe by changing the power of radiation source Download PDFInfo
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- CN106018978A CN106018978A CN201610537770.9A CN201610537770A CN106018978A CN 106018978 A CN106018978 A CN 106018978A CN 201610537770 A CN201610537770 A CN 201610537770A CN 106018978 A CN106018978 A CN 106018978A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
- G01R35/02—Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
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Abstract
The invention provides a method for studying micro-perturbation of electromagnetic field probe by changing the power of radiation source, comprising the following steps: 1) obtaining an electromagnetic field strength matrix Fi of an electromagnetic field probe under different radiation power of a radiation source; 2) using simulation software to simulate the electromagnetic field distribution of the radiation source in the observation plane Pz on the condition with a probe; obtaining a simulation electromagnetic field strength matrix with a probe (illustrated in the figure); comparing the electromagnetic field strength matrix Fi to the simulation electromagnetic field strength matrix for the final simulation model; and 4) using simulation software to simulate the electromagnetic field distribution of the radiation source in the observation plane Pz on the condition without a probe; obtaining a simulation electromagnetic field strength matrix without a probe (illustrated in the figure); comparing the matrix (illustrated in the figure) to the matrix (illustrate in the figure). The difference between the two comparisons is used as an importance basis for the correction of test data. The data obtained by the invention can correct the data of an electromagnetic field probe test in a project, improve the reliability of the electromagnetic field probe test result, guarantee the modeling accuracy in the simulation process and ensure that the result data is only affected by the radiated power of the radiation source.
Description
[technical field]
The present invention relates to a kind of method to emf probe micro-disturbance Journal of Sex Research, refer in particular to one and radiated by change
The method of source power research emf probe micro-disturbance, studies emf probe in application process specifically due to spoke
Penetrate the radiant power difference in source and then produce different micro-disturbance.
[background technology]
Along with the developing rapidly of science and technology, extensively application and the circuit of large scale integrated circuit operating frequency increasingly
Height, the most each section of cabling of each module in electrical equipment is probably the source producing electromagnetic interference.Electromagnetic interference is not only
Affect the normal work of system, and be likely to result in serious accident in severe cases.In system-level EMC Design
During the emf probe electromagnetic field intensity that equipment under test is radiated that often uses that index is verified measure.
The most often have ignored and due to the metal structure of probe, the magnetic distribution of equipment under test radiation is caused and disturbs
Dynamic, the field distribution that probe records not is actual field distribution value, and this is the key factor of impact probe using effect.In difference
Radiant power under the conditions of, the change that radiation source magnetic distribution occurs when by the disturbance of emf probe is different,
Use probe test the disturbance in error allowed band of the field intensity data can ignore, other can not ignore disturbance then need right
The data that emf probe records are modified.
[summary of the invention]
In order to revise perturbation equipment under test magnetic distribution produced due to emf probe and the measured deviation caused,
The present invention proposes a kind of method by changing power of radiation source research emf probe micro-disturbance.
A kind of method by changing power of radiation source research emf probe micro-disturbance of the present invention, includes following
Step:
The first step: obtain emf probe test electromagnetic field intensity matrix Fi；
The radiant power that radiation source is different is set, at viewing plane PzOn randomly select M point of observation and measure, measure
Obtain electromagnetic field radiation intensity according to sequencing matrix Fi(i=1,2 ...) represent, wherein i represents that radiation source is at i-th kind
The field intensity matrix recorded by probe under radiant power, this matrix has 1 × M element.
Second step: obtain and emulate electromagnetic field intensity matrix in the case of having probe
Utilize simulation software to radiation source at viewing plane PzOn magnetic distribution carry out having the emulation in the case of probe,
The position of point of observation and selecting sequence are consistent with the position of point of observation in the first step with selecting sequence, obtain radiant intensity square
Battle arraySimulation result in the case of wherein subscript eh1 indicates probe, subscript i represents the radiant power that radiation source is different, should
Matrix has 1 × M element.
3rd step: contrast matrix FiWith
By contrast FiWithCarry out judging the fitting degree of simulation modeling, determine phantom.
4th step: obtain without emulating electromagnetic field intensity matrix in the case of probe
Utilize simulation software to radiation source at viewing plane PzOn magnetic distribution carry out without probe in the case of emulation,
The position of point of observation is consistent with selecting sequence with position and the selecting sequence of point of observation in the first step, obtains radiant intensity square
Battle arraySimulation result in the case of wherein subscript eh0 indicates without probe, subscript i represents the radiant power that radiation source is different, should
Matrix has 1 × M element.
5th step: contrast matrixWith
By to comparisonWithRadiation source magnetic distribution under i-th kind of radiant power can be obtained due to electricity
The introducing of magnet field probe and the perturbation that produces, the difference of two groups of electromagnetic field intensity contrasts is be modified test data important
Foundation.
To sum up, for radiation source pop one's head under different radiant powers introduce disturbance be different, may make test
It is worth bigger than normal than actual value, test value may be made less than normal than actual value.Produced by radiation source under the conditions of the different radiant power of contrast
Raw magnetic distribution micro-disturbance, this is the powerful support being modified probe test data in practical engineering application.
A kind of method by changing power of radiation source research emf probe micro-disturbance of the present invention, has an advantage in that:
(1) tradition utilize emf probe to carry out testing the magnetic distribution generation often ignoring probe to radiation source
Perturbation so that there is deviation in test data and truthful data, and this deviation is likely to result in the consequence being difficult to estimate.The present invention
Providing a kind of method studying the micro-disturbance of probe, emf probe in engineering can be tested by the data obtained
Data be modified, hence it is evident that improve the credibility of emf probe test result.
(2) surveyed by utilization and emulate two groups of data and contrast, it is ensured that the accuracy of modeling in simulation process.Profit
Science control variate method is met, it is ensured that result data is only by spoke with having to pop one's head in and carry out contrast without simulation result during probe
Penetrate the impact that the radiant power in source is the most different.
[accompanying drawing explanation]
Fig. 1 is the structure chart of emf probe testing radiation source magnetic distribution.
Figure 1A is that emulation has the structure chart of radiation source magnetic distribution in the case of probe.
Figure 1B is that emulation is without the structure chart of radiation source magnetic distribution in the case of probe.
Fig. 2 is the perturbation that electric field probe introduces with radiant power difference.
Fig. 2 A is the perturbation that magnet field probe introduces with radiant power difference.
Fig. 3 is that the present invention studies electromagnetic field micro-disturbance flow chart.
[detailed description of the invention]
Below in conjunction with drawings and Examples, the present invention is described in further detail.
A kind of method by changing power of radiation source research emf probe micro-disturbance of the present invention, the equipment of its application
Magnetic distribution test platform shown in Figure 1, including computer, probe gripper, emf probe, radiation source and frequency
Spectrometer.Probe gripper is used for clamping emf probe, it is ensured that emf probe measures the precision of radiation source field distribution data
And accuracy.Emf probe, spectrum analyzer are connected with computer, in order that ensureing the normal work of system.
1. emf probe is for obtaining the electromagnetic field intensity distributed intelligence of radiation source.
2. spectrum analyzer is for carrying out showing and storing by the electromagnetic field intensity information that probe obtains.
3. computer is for the electromagnetic field intensity information processed and computing spectrum analyzer is stored.
A kind of method by changing power of radiation source research emf probe micro-disturbance of the present invention, concrete steps are such as
Under:
The first step: obtain emf probe test electromagnetic field intensity matrix Fi；
At viewing plane PzOn randomly select M point of observation and measure, wherein viewing plane PzIt is above radiation source distance
ForzPlane.Point of observation position coordinates use (x, y, z)mRepresent, subscript m (m=1,2 ..., M) represent that point of observation is test for elder generation
Rear order.Make to pop one's head in and be positioned at different points of observation by controlling probe gripper and measure, measure that to obtain electromagnetic field radiation strong
Degree is according to sequencing matrix Fi(i=1,2 ...) represent, wherein i represents radiation source quilt under the conditions of i-th kind of radiant power
The field intensity that probe records, this matrix has 1 × M element.Corresponding different subscript i of radiation source of different radiant power is set,
The first radiant power correspondence subscript i=1.
Second step: obtain and emulate electromagnetic field intensity matrix in the case of having probe
Seeing has probe simulation architecture, including a radiation source and an emf probe shown in Figure 1A.By electromagnetic field
Pop one's head according to the selecting sequence in the first step and point of observation (x, y, z)mIt is configured, obtains and have the strong of probe situation given viewpoint
Field information, obtains matrixFor the radiation source of different radiant powers, corresponding different matrix
3rd step: contrast matrix FiWith
The field intensity matrix obtained in the first step and second step is grouped according to subscript i, carrying out for a group of same index
Contrast, by field intensity F of paired observation pointiWithObtain fitting degree, use
Represent degree of fitting, if meeting inequalityRepresent that modeling is correct, credible result.Instead
Then will modeling and simulating again, repeat second step until meeting this inequality.Wherein Fi(n, 1) representing matrix FiIn n-th yuan
Element,Representing matrixIn nth elements, meet n=1,2 ..., M.In Quan Wen | | represent taking definitely
Value.
4th step: obtain without emulating electromagnetic field intensity matrix in the case of probe
Seeing has probe simulation architecture shown in Figure 1B, including a radiation source and an emf probe, wherein models
Model is consistent with the model in second step.Emulation without probe in the case of given viewpoint (x, y, z)mHigh field information, obtain
MatrixFor the radiation source under different radiant powers, corresponding different matrix
5th step: contrast matrixWith
The field intensity matrix obtained in second step and the 4th step is grouped according to subscript i, same index for one group
Contrast.MatrixIn each element be the disturbing of the field distribution that causes due to the introducing of probe
Dynamic, by DiTest data are modified when testing i-th kind of radiant power by record storage to emf probe.
Embodiment
Arranging radiation source is 50 Ω microstrip lines, and its operating frequency is 1.0GHz, the observation at distance radiant source plane 1mm
Plane randomly selects 3 points of observation, and its coordinate is respectively (-1,0,1)1、(0,0,1)2(1,0,1)3, the spoke of radiation source is set
Penetrate power and be respectively 0.1mW, 1mW, 1W.Electric field probe and magnet field probe is utilized to measure electric field intensity and magnetic field intensity one by one, profit
With simulation software, different operating frequency is emulated in the case of having probe, contrast fitting degree.Utilize simulation software to not
Emulating with operating frequency with less than in the case of probe, seeing Fig. 2 and Fig. 2 A is radiation source under the conditions of different radiant powers
The micro-disturbance produced due to electric field probe and the introducing of magnet field probe, its numerical result is as shown in table 1.
Table 1 micro-strip line source under different radiant powers with electric field and the characteristic of magnet field probe disturbance
In the case of can be seen that different radiant power according to numerical result, micro-strip line source is due to electric field and magnet field probe introducing
Perturbation level be different, and along with the change of radiant power meets certain rule, will be for difference in actual application
Probe carry out the correction that responds.
Claims (1)
1., by the method changing power of radiation source research emf probe micro-disturbance, it is characterised by: the method includes
Following steps:
The first step: obtain emf probe test electromagnetic field intensity matrix Fi:
The radiant power that radiation source is different is set, at viewing plane PzOn randomly select M point of observation and measure, measurement obtains
Electromagnetic field radiation intensity is according to sequencing matrix Fi(i=1,2 ...) represent, wherein i represents that radiation source is i-th kind of radiation
The field intensity matrix recorded by probe under power, this matrix has 1 × M element；
Second step: obtain and emulate electromagnetic field intensity matrix F in the case of having probei eh1:
Utilize simulation software to radiation source at viewing plane PzOn magnetic distribution carry out having the emulation in the case of probe, observe
Position and the selecting sequence of point is consistent with the position of point of observation in the first step with selecting sequence, obtains radiant intensity matrix
Fi eh1, simulation result in the case of wherein subscript eh1 indicates probe, subscript i represents the radiant power that radiation source is different, this square
Battle array has 1 × M element；
3rd step: contrast matrix FiAnd Fi eh1:
By contrast FiAnd Fi eh1Carry out judging the fitting degree of simulation modeling, determine phantom；
4th step: obtain without emulating electromagnetic field intensity matrix F in the case of probei eh0:
Utilize simulation software to radiation source at viewing plane PzOn magnetic distribution carry out without probe in the case of emulation, observe
The position of point is consistent with selecting sequence with position and the selecting sequence of point of observation in the first step, obtains radiant intensity matrix
Fi eh0, wherein subscript eh0 indicates that subscript i represents the radiant power that radiation source is different, this square without the simulation result in the case of popping one's head in
Battle array has 1 × M element；
5th step: contrast matrix Fi eh1And Fi eh0:
By to comparison Fi eh1And Fi eh0Radiation source magnetic distribution under i-th kind of radiant power can be obtained due to electromagnetic field
The introducing of probe and the perturbation that produces, the difference of two groups of electromagnetic field intensity contrasts is that be modified test data important depends on
According to.
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| CN201610537770.9A CN106018978B (en) | 2016-07-08 | 2016-07-08 | A method of emf probe micro-disturbance is studied by changing power of radiation source |
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| CN105527598A (en) * | 2015-12-17 | 2016-04-27 | 北京无线电计量测试研究所 | Field sensor calibration system and method |
| JP5939887B2 (en) * | 2012-05-25 | 2016-06-22 | 三菱電機株式会社 | Electromagnetic noise detector |
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| CN103135086A (en) * | 2013-02-20 | 2013-06-05 | 华北电力大学 | Calibration device and calibration and verification method for direct current electric field measuring apparatus |
| CN104569622A (en) * | 2014-12-24 | 2015-04-29 | 复旦大学 | Efficient microwave polarization detection device based on photonic spin Hall effect |
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