CN105984830A - Manufacturing method of integrated circuit fused MEMS sensor - Google Patents

Manufacturing method of integrated circuit fused MEMS sensor Download PDF

Info

Publication number
CN105984830A
CN105984830A CN201510082377.0A CN201510082377A CN105984830A CN 105984830 A CN105984830 A CN 105984830A CN 201510082377 A CN201510082377 A CN 201510082377A CN 105984830 A CN105984830 A CN 105984830A
Authority
CN
China
Prior art keywords
integrated circuit
metal
layer
window
mems sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201510082377.0A
Other languages
Chinese (zh)
Inventor
田晓丹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wisdom Technology (beijing) Co Ltd
Original Assignee
Wisdom Technology (beijing) Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wisdom Technology (beijing) Co Ltd filed Critical Wisdom Technology (beijing) Co Ltd
Priority to CN201510082377.0A priority Critical patent/CN105984830A/en
Publication of CN105984830A publication Critical patent/CN105984830A/en
Pending legal-status Critical Current

Links

Landscapes

  • Pressure Sensors (AREA)

Abstract

The invention discloses an integrated circuit fused MEMS sensor and a manufacturing method of the integrated circuit fused MEMS sensor. The integrated circuit fused MEMS sensor comprises an integrated circuit and an MEMS sensor. The top of the integrated circuit is fused at the bottom of the MEMS sensor through a key. At least one key fusing area of the integrated circuit is provided with a window metal block for being electrically connected with the MEMS sensor, and a metal perpendicular channel is formed from the MEMS sensor to the window metal block. The top of the metal perpendicular channel is connected with a metal interconnection window of the MEMS sensor. The metal interconnection window of the MEMS sensor and the key fusing area of the integrated circuit are fused together, the area of the device can be narrowed, and production cost is reduced.

Description

Integrated circuit warm MEMS sensor manufacture method
Technical field
The present invention relates to a kind of gyro sensor and manufacture method thereof, especially on to relate to one integrated The warm MEMS sensor of circuit and manufacture method thereof.
Background technology
Traditional integrated circuit and MEMS sensor, it is desirable to cloth on piece of silicon substrate wherein Line, thus realize electrically and signal linkage function, another sheet silicon substrate as vacuum cover plate, this Technique also can realize the function of capacitance-type triaxial gyroscope, but because needs double layer of metal connects up, and And the position connected outside metal substrate back the most on a silicon substrate, integrated circuit merges the key of sensor Distinguish with district and metal interconnection, therefore the light shield number of plies used is many, and one single chip area is big.
Metal interconnection window is merged by this processing technique with key and region, it is possible to reducer The area of part, the production for integrated sensor reduces cost.
Summary of the invention
The technical problem that the invention solves the problems that is to provide a kind of by metal interconnection window and key The sensor construction of MEMS warm with the integrated circuit that district merges.
In order to solve above-mentioned technical problem, the invention provides a kind of warm MEMS of integrated circuit The structure of sensor, including integrated circuit and MEMS sensor, described integrated circuit top Key and bottom MEMS sensor, at least one key of described integrated circuit and region are provided with Be for electrically connecting to the window metal derby of MEMS sensor, from described MEMS sensor to Described window metal derby position is formed with metallic vertical passage, described metallic vertical channel side surface Being coated with insulating protective layer, described metallic vertical channel roof connects the gold of MEMS sensor Belong to interconnection window.
Further, described integrated circuit includes infrabasal plate, described infrabasal plate is formed with integrated The metal derby of circuit, window metal derby and silica glass layer, described metal derby is higher than described window gold Belonging to block, described silica glass layer is contour with described metal derby, and described silica glass layer is covered in described window Mouth metal derby.
Further, described MEMS sensor includes upper substrate, and described upper substrate top becomes Shape has sealer, upper substrate bottom to have the groove at the bottom of a depthkeeping, described groove also to become Shape have movable structure layer, described movable structure layer be positioned at described groove and infrabasal plate top it Between, including silicon epitaxy layer, there is in the middle part of described silicon epitaxy layer comb structure, described groove surface pair Described comb structure, utilizes the projection being positioned at groove both sides, by bonded seal silicon oxide layer, Formed with described comb structure and seal cavity, described silicon epitaxy layer also has metal interconnection window Mouthful, described movable structure layer goes back key and in the silica glass layer of described integrated circuit.
Another technical problem that the invention solves the problems that be to provide a kind of by metal interconnection window with The manufacture of the sensor construction of the warm MEMS of integrated circuit that Jian He district merges Method.
In order to solve above-mentioned technical problem, the invention provides the manufacture method of aforementioned structure, bag Include: (A) shapes integrated circuit;(B) at least one metal derby of selected described integrated circuit, Shape the window metal derby being for electrically connecting to MEMS sensor;(C) in integrated circuit Upper shaping silica glass layer key and region, window metal derby described at least one place's key and region overlay; (D) MEMS sensor is shaped;(E) key and described integrated circuit top pass in MEMS Bottom sensor;(F) shape golden to described window metal derby position from described MEMS sensor Belong to vertical channel.
Further, described step (A) including: (a) is selected and cleans under a wafer is used as Substrate;B () grows metal level by sputtering mode on infrabasal plate;C () passes through photoetching and etching Mode makes integrated circuit metal block in metal level.
Further, described step (B) including: by the gold that photoetching is selected with etching forming Belonging to block is window metal derby, and described metal derby is higher than described window metal derby.
Further, described step (C) including: (a) passes through depositional mode in described integrated electricity Silica glass layer is shaped on road;(b) by the way of cmp, silica glass layer is polished to Metal derby is contour;C silica glass layer is made the figure in order to key sum by photoetching and etching mode by () Shape.
Further, described step (D) including: (a) selectes a silicon substrate upper substrate, cleans And remove surface impurity;(b) bottom upper substrate on grow silicon oxide layer;(c) by photoetching and Etching mode forms cavity in described upper substrate and silicon oxide layer grooving;D () is bottom silicon oxide layer Shape movable structure layer.
Further, described step (E) including: by the silica glass layer key of described integrated circuit With region key and in the movable structure layer of described MEMS sensor.
Further, described step (F) including: (a) passes through photoetching and erosion from described upper substrate Quarter, mode shaped a cylindrical cavity through to window metal derby;B () passes through depositional mode in described circle Post cavity inner surface covers insulating protective layer;C () splash-proofing sputtering metal in described cylindrical cavity forms gold Belong to vertical channel.
Further, described metallic vertical channel roof passes through surface chemical mechanical polishing to upper Substrate top is concordant, in described upper substrate top by depositional mode growing surface protective layer, in Sealer exposes metallic vertical passage by the way of photoetching and etching, cleans and goes remove impurity Grow layer of metal after matter, by the way of photoetching and etching, make metal interconnection window.
The present invention is by the key of the metal interconnection window of MEMS sensor and integrated circuit and region Merge, it is possible to reduce the area of device, reduce production cost.
Accompanying drawing explanation
Fig. 1 is the structural principle schematic diagram of the present invention.
Fig. 2 is the manufacture method flow chart of the present invention.
Fig. 3 is manufacture method step (A) flow chart of the present invention.
Fig. 4 is manufacture method step (C) flow chart of the present invention.
Fig. 5 is manufacture method step (D) flow chart of the present invention.
Fig. 6 is manufacture method step (F) flow chart of the present invention.
In figure: 1, infrabasal plate;2, silica glass layer;3, metal derby;4, window Mouth metal derby;5, metallic vertical passage;6, insulating protective layer;7, upper substrate; 8, silicon oxide layer;9, cavity;10, sealer;11, metal interconnection Window;12, movable structure layer;13, comb structure;14, groove.
Detailed description of the invention
The invention will be further described with specific embodiment below in conjunction with the accompanying drawings, so that this area Technical staff the present invention be may be better understood and can be practiced, but illustrated embodiment is not made For limitation of the invention.
As it is shown in figure 1, the structure of the warm MEMS sensor of a kind of integrated circuit of the present invention, Including integrated circuit and MEMS sensor;Integrated circuit includes infrabasal plate 1, infrabasal plate 1 On be formed with the metal derby 3 of integrated circuit, window metal derby 4 and silica glass layer 2, metal derby 3 are higher than window metal derby 4, and silica glass layer 2 is contour with metal derby 3, and silica glass layer 2 covers In window metal derby 4;MEMS sensor includes upper substrate 7, and described upper substrate 7 top becomes Shape has sealer 10, upper substrate bottom to have the groove 14 at the bottom of a depthkeeping, described recessed Groove 14 is also formed with movable structure layer 12, and described movable structure layer 12 is positioned at described groove 14 And between the top of infrabasal plate 1, including silicon epitaxy layer, in the middle part of described silicon epitaxy layer, there is comb Structure 13, described groove 14, in the face of described comb structure 13, utilizes and is positioned at groove 14 both sides Projection, by bonded seal silicon oxide layer 8, formed with described comb structure and seal cavity 9, Also there is on described silicon epitaxy layer metal interconnection window 3, described movable structure layer 12 go back key and Silica glass layer 2 in described integrated circuit.
The integrated circuit top key of the present invention and bottom MEMS sensor, integrated circuit At least one key and region are provided with the window metal derby 4 being for electrically connecting to MEMS sensor, It is formed with metallic vertical passage 5, metal to window metal derby 4 position from MEMS sensor Vertical channel 5 top connects the metal interconnection window 11 of MEMS sensor.Preferably, gold Belong to vertical channel 5 side surface and be coated with insulating protective layer 6.
Metal derby 3 combination of the present invention constitutes the integrated circuit on integrated circuit, metal derby 3 with Sputtering, photoetching and etching forming are in the infrabasal plate 1 of integrated circuit, at least one place's metal derby 3 warp Photoetching and etching are with shaping window metal derby 4 again, and silica glass layer 2 is shaped by depositional mode In infrabasal plate 1, metal derby 3 and window metal derby 4, silica glass layer 2 is ground by chemical machinery Mill mode polishes to contour with metal derby 3 and be covered in window metal derby 4 with certain thickness.
The upper and lower base plate of the present invention can be selected for the maturing material of this area, it is preferable that infrabasal plate is Wafer infrabasal plate, upper substrate is silicon substrate upper substrate.
The present invention can realize the integrated circuit electrical signal detection as three axles of Detection electrode, and Electrically conducting of integrated circuit and upper substrate sensor is realized, it is achieved annular seal space in key and region Internal portion electrical structure and the connection of the electrical outer connecting structure of containment portion.Integrated circuit infrabasal plate 1 A part as Detection electrode, metal derby 3 and movable structure layer 12 nonbonding and be connected, window Mouth metal derby 4 is connected to form conducting by the sensor of metallic vertical passage 5 with top layer, integrated Circuit is linked together with movable structure layer 12 by silica glass layer 2, and movable structure layer 12 is again It is connected with silicon substrate upper substrate 7 by silicon oxide layer 8, has in the outside of metallic vertical passage 5 Insulating protective layer 6 is to ensure the connectedness of metal passage and metal derby, and this insulating protective layer ensures Metal in metallic vertical passage does not contacts with silicon substrate upper substrate and movable structure layer.
Fig. 2 show the manufacture method flow chart of the present invention, comprises the following steps:
S10, shapes integrated circuit;
S20, at least one metal derby 3 of selected integrated circuit, shaping is for electrically connecting to The window metal derby 4 of MEMS sensor;Preferably, the present invention passes through photoetching and is etched into The metal derby that shape is selected is window metal derby, and metal derby 3 is higher than window metal derby 4.
S30, shapes silica glass layer 2 key and region, at least one Chu Jianhe district on integrated circuit Territory covers window metal derby 4;
S40, shapes MEMS sensor;
S50, key and integrated circuit top are bottom MEMS sensor;In more detail, will The silica glass layer 2 of integrated circuit is as strong and region key with in the movable knot of MEMS sensor Structure layer 12.
S60, from MEMS sensor to window metal derby 4 position form metal vertical channel 5.
Step S10, the preferred implementation shaping integrated circuit sees Fig. 3, including:
S101, selectes and cleans a wafer and be used as infrabasal plate 1;
S102, grows metal level by sputtering mode on infrabasal plate 1;
S103, makes integrated circuit metal block 3 by photoetching and etching mode in metal level.
The present invention selects IC wafers sheet as infrabasal plate 1, is first carried out it, goes Except the impurity on surface, then grow metal level on the integrated, so by the method for sputtering By the way of photoetching and etching, metal being made figure afterwards, the most all of metal derby 3 is high Degree is the same, then by the way of photoetching, blocks some metal derbies, exposes some metal derbies, Being etched, now the height of metal derby occurs as soon as gradient difference again.At collection by the way of deposition Become silicon growth layer glassy layer 2 on circuit, then carry out the cleaning on surface, remove for next step Impurity, by the way of cmp, silica glass layer 2 is polished to high metal derby 3 Xiang Qi, then by the way of photoetching and etching, silica glass layer 2 is made figure key later With.
Step S30, shapes silica glass layer key and region on integrated circuit, at least one place's key and The preferred implementation of region overlay window metal derby 4 sees Fig. 4, including:
S301, shapes silica glass layer 2 by depositional mode on integrated circuit;
S302, by the way of cmp, silica glass layer 2 is polished to metal derby 3 Contour;
S303, makes the figure in order to key sum by photoetching and etching mode by silica glass layer 2.
Step S40, the preferred implementation shaping MEMS sensor sees Fig. 5, including:
S401, a selected silicon substrate upper substrate 7, cleans and removes surface impurity;
S402, bottom upper substrate 7 on grow silicon oxide layer;
S403, forms chamber by photoetching and etching mode in upper substrate 7 and silicon oxide layer 8 grooving Body 9;
S404, in silicon oxide layer 8 bottom movable structure layer 12.
First the silicon substrate upper substrate 7 selected is carried out, and removes the impurity on surface, growth One layer of silicon oxide layer 8, then form groove in its surface grooving by the way of photoetching and etching 14, collectively form cavity 9 with infrabasal plate 1, by the whole movable structure layer 12 not having figure, Couple together in silicon oxide layer 8 position with silicon substrate upper substrate 7, clean movable structure layer 12 Surface, goes the removal of impurity, then forms comb structure 13 by the way of photoetching and etching, is formed Required movable structure figure.
Step S60, vertical to window metal derby 4 position form metal from MEMS sensor The preferred implementation of passage 5 sees Fig. 6, including:
S601, shapes a cylindrical cavity through to window from upper substrate 7 by photoetching and etching mode Mouth metal derby 4;
S602, covers insulating protective layer 6 by depositional mode in cylindrical cavity inner surface;
S603, in cylindrical cavity, splash-proofing sputtering metal forms metallic vertical passage 5.
After metallic vertical passage 5 shapes, more preferably in embodiment, the present invention is in upper substrate 7 Depositional mode growing surface protective layer 10 is passed through at top, in sealer by photoetching and erosion The mode carved exposes metallic vertical passage 5, grows layer of metal after cleaning and going the removal of impurity, logical The mode crossing photoetching and etching makes metal interconnection window 11.
Key and time, first by integrated circuit and movable structure layer 12 key with get up, silica glass layer 2 is key and position, and metal derby 3 is formed with movable structure layer 12 and is connected, and passes through lithographic definition Formed certain on the mode of figure and etching substrate 7 on a silicon substrate and movable structure layer 12 The cylindrical cavity of the degree of depth, this cavity is through to window metal derby 4, at this by the way of deposition One layer of insulating protective layer 6 of cylindrical cavity internal deposition, then splash-proofing sputtering metal forms metallic vertical passage 5, by surface chemical mechanical polishing technique, metal is ground off, then grow by the way of deposition Layer of surface protective layer 10, makes graphical window on this surface by the way of photoetching and etching, Metallic vertical passage 5 is exposed, cleans surface and go the removal of impurity, in superficial growth layer of metal, Metal interconnection window 11, now metal interconnection window 11 is made by the way of photoetching and etching Electric connection is defined with window metal derby 4.
Present invention is generally applicable to the warm, as being applied to of various integrated circuit and sensor Integrated circuit warm MEMS gyroscope sensor, realizes the skill of metal interconnection in Jian He district Art, integrated circuit as sensing infrabasal plate, and and unconventional integrated circuit merge sensor key Distinguish with district and metal interconnection.This integrated circuit fusion sensor manufacturing techniques, compatible single shaft, Twin shaft, three axle gyroscope and accelerometers, wherein integrated circuit self top-level metallic conduct A part for capacitance detecting pole plate, it is achieved trunnion axis detects, movable structure layer comb structure realizes Z axis detection and driving.
Embodiment described above is only the preferred embodiment lifted by absolutely proving the present invention, Protection scope of the present invention is not limited to this.Those skilled in the art are on the basis of the present invention The equivalent made substitutes or conversion, all within protection scope of the present invention.The protection of the present invention Scope is as the criterion with claims.

Claims (11)

1. a structure for the warm MEMS sensor of integrated circuit, including integrated circuit and MEMS sensor, it is characterised in that described integrated circuit top key and in MEMS sense Bottom device, at least one key of described integrated circuit and region are provided with and are for electrically connecting to MEMS The window metal derby of sensor, from described MEMS sensor to described window metal derby position Being formed with metallic vertical passage, described metallic vertical channel side surface is coated with insulating protective layer, Described metallic vertical channel roof connects the metal interconnection window of MEMS sensor.
The structure of the warm MEMS sensor of integrated circuit the most according to claim 1, It is characterized in that, described integrated circuit includes infrabasal plate, and described infrabasal plate is formed with integrated electricity The metal derby on road, window metal derby and silica glass layer, described metal derby is higher than described window metal Block, described silica glass layer is contour with described metal derby, and described silica glass layer is covered in described window Metal derby.
The structure of the warm MEMS sensor of integrated circuit the most according to claim 2, It is characterized in that, described MEMS sensor includes upper substrate, and described upper substrate is top formed Sealer, upper substrate bottom is had to have the groove at the bottom of a depthkeeping, described groove also to shape Have movable structure layer, described movable structure layer between described groove and the top of infrabasal plate, Including silicon epitaxy layer, having comb structure in the middle part of described silicon epitaxy layer, described groove surface is to described Comb structure, utilizes the projection being positioned at groove both sides, by bonded seal silicon oxide layer, with institute State comb structure and form sealing cavity, described silicon epitaxy layer also has metal interconnection window, institute State movable structure layer and go back key and in the silica glass layer of described integrated circuit.
4. a manufacture method for structure according to any one of claims 1 to 3, its feature exists In, including:
(A) integrated circuit is shaped;
(B) at least one metal derby of selected described integrated circuit, shaping is for electrically connecting to The window metal derby of MEMS sensor;
(C) on integrated circuit, silica glass layer key and region, at least one place's key and region are shaped Cover described window metal derby;
(D) MEMS sensor is shaped;
(E) key and described integrated circuit top are bottom MEMS sensor;
(F) vertical to described window metal derby position form metal from described MEMS sensor Passage.
Manufacture method the most according to claim 4, it is characterised in that described step (A) Including:
A () is selected and clean a wafer as infrabasal plate;
B () grows metal level by sputtering mode on infrabasal plate;
C () makes integrated circuit metal block by photoetching and etching mode in metal level.
Manufacture method the most according to claim 5, it is characterised in that described step (B) Including:
The metal derby selected with etching forming by photoetching is window metal derby, and described metal derby is high In described window metal derby.
Manufacture method the most according to claim 6, it is characterised in that described step (C) Including:
A () shapes silica glass layer by depositional mode on described integrated circuit;
B silica glass layer is polished to contour with metal derby by the way of cmp by ();
C silica glass layer is made the figure in order to key sum by photoetching and etching mode by ().
Manufacture method the most according to claim 7, it is characterised in that described step (D) Including:
A () selectes a silicon substrate upper substrate, clean and remove surface impurity;
(b) bottom upper substrate on grow silicon oxide layer;
C () forms cavity by photoetching and etching mode in described upper substrate and silicon oxide layer grooving;
D () is in silicon oxide layer bottom movable structure layer.
Manufacture method the most according to claim 8, it is characterised in that described step (E) Including:
By the silica glass layer key of described integrated circuit and region key with in described MEMS sensor Movable structure layer.
Manufacture method the most according to claim 9, it is characterised in that described step (F) Including:
A () shapes a cylindrical cavity through to window from described upper substrate by photoetching and etching mode Mouth metal derby;
B () covers insulating protective layer by depositional mode in described cylindrical cavity inner surface;
C () splash-proofing sputtering metal in described cylindrical cavity forms metallic vertical passage.
11. manufacture methods according to claim 10, it is characterised in that described metal Vertical channel top is the most concordant with upper substrate top, on described by surface chemical mechanical polishing Depositional mode growing surface protective layer is passed through at substrate top, in sealer by photoetching and The mode of etching exposes metallic vertical passage, grows layer of metal after cleaning and going the removal of impurity, logical The mode crossing photoetching and etching makes metal interconnection window.
CN201510082377.0A 2015-02-15 2015-02-15 Manufacturing method of integrated circuit fused MEMS sensor Pending CN105984830A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510082377.0A CN105984830A (en) 2015-02-15 2015-02-15 Manufacturing method of integrated circuit fused MEMS sensor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510082377.0A CN105984830A (en) 2015-02-15 2015-02-15 Manufacturing method of integrated circuit fused MEMS sensor

Publications (1)

Publication Number Publication Date
CN105984830A true CN105984830A (en) 2016-10-05

Family

ID=57042566

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510082377.0A Pending CN105984830A (en) 2015-02-15 2015-02-15 Manufacturing method of integrated circuit fused MEMS sensor

Country Status (1)

Country Link
CN (1) CN105984830A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110905787A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110902644A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110905786A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110905785A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110905789A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 MEMS pump
CN113167662A (en) * 2018-09-17 2021-07-23 哈钦森技术股份有限公司 Integrated sensor and circuit

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102050418A (en) * 2010-09-30 2011-05-11 北京大学 Three-dimensional integrated structure and production methods thereof
CN102583219A (en) * 2012-03-29 2012-07-18 江苏物联网研究发展中心 Vacuum package structure and vacuum packaging method for wafer-level MEMS (micro-electromechanical system) devices
CN103373697A (en) * 2012-04-25 2013-10-30 罗伯特·博世有限公司 Hybrid integrated component and method for the manufacture thereof
CN103424107A (en) * 2012-05-14 2013-12-04 罗伯特·博世有限公司 Micromechanical inertial sensor and method for manufacturing same
CN103922273A (en) * 2014-04-30 2014-07-16 安徽北方芯动联科微***技术有限公司 Method for manufacturing laminated composite MEMS(Micro-electromechanical Systems)chips and laminated composite MEMS chip
CN103922267A (en) * 2013-01-10 2014-07-16 深迪半导体(上海)有限公司 Inertial sensor production and wafer level package process based on MEMS (micro-electromechanical system)
US20140329362A1 (en) * 2005-09-16 2014-11-06 Tsmc Solid State Lighting Ltd QFN/SON-Compatible Package
CN104249991A (en) * 2013-06-26 2014-12-31 中芯国际集成电路制造(上海)有限公司 MEMS (micro-electromechanical systems) device and manufacturing method thereof

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140329362A1 (en) * 2005-09-16 2014-11-06 Tsmc Solid State Lighting Ltd QFN/SON-Compatible Package
CN102050418A (en) * 2010-09-30 2011-05-11 北京大学 Three-dimensional integrated structure and production methods thereof
CN102583219A (en) * 2012-03-29 2012-07-18 江苏物联网研究发展中心 Vacuum package structure and vacuum packaging method for wafer-level MEMS (micro-electromechanical system) devices
CN103373697A (en) * 2012-04-25 2013-10-30 罗伯特·博世有限公司 Hybrid integrated component and method for the manufacture thereof
CN103424107A (en) * 2012-05-14 2013-12-04 罗伯特·博世有限公司 Micromechanical inertial sensor and method for manufacturing same
CN103922267A (en) * 2013-01-10 2014-07-16 深迪半导体(上海)有限公司 Inertial sensor production and wafer level package process based on MEMS (micro-electromechanical system)
CN104249991A (en) * 2013-06-26 2014-12-31 中芯国际集成电路制造(上海)有限公司 MEMS (micro-electromechanical systems) device and manufacturing method thereof
CN103922273A (en) * 2014-04-30 2014-07-16 安徽北方芯动联科微***技术有限公司 Method for manufacturing laminated composite MEMS(Micro-electromechanical Systems)chips and laminated composite MEMS chip

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110905787A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110902644A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110905786A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110905785A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump
CN110905789A (en) * 2018-09-17 2020-03-24 研能科技股份有限公司 MEMS pump
CN113167662A (en) * 2018-09-17 2021-07-23 哈钦森技术股份有限公司 Integrated sensor and circuit
CN110905785B (en) * 2018-09-17 2023-01-10 研能科技股份有限公司 Method for manufacturing micro-electromechanical pump

Similar Documents

Publication Publication Date Title
CN105984830A (en) Manufacturing method of integrated circuit fused MEMS sensor
CN103575260B (en) A kind of gyroscope and its machining manufacture
JP4768205B2 (en) Micromachined absolute pressure sensor
CN103121658A (en) Silicon epitaxy manufacturing method of capacitive triaxial micro gyroscope
US7629657B2 (en) Episeal pressure sensor
CN101858928B (en) Capacitance-type triaxial accelerator for micromotor system
US6318175B1 (en) Micromechanical sensor and method for the manufacture thereof
CN102030302B (en) Micro mechanical structure and the method for the manufacture of micro mechanical structure
CN105091730A (en) DSOI (Double Silicon Oxide Insulation) strain gage and manufacturing method thereof
CN101339202B (en) Semiconductor device and manufacturing method of the same
KR100574575B1 (en) Micromechanical component
US9908771B2 (en) Inertial and pressure sensors on single chip
CN102367165B (en) Method for interconnecting electrodes of MEMS (micro electro mechanical system) device based on SOI (silicon-on-insulator)
JP2003329702A5 (en)
CN104062464A (en) MEMS piezoresistive accelerated speed and pressure integration sensor and manufacturing method
JP2006210731A (en) Hall element and its manufacturing method
CN100516883C (en) Acceleration sensor and method of manufacturing acceleration sensor
CN104062463A (en) Piezoresistive acceleration sensor and manufacturing method thereof
CN105097809A (en) Mechanical stress-decoupling in semiconductor device
CN105621348A (en) MEMS inertial sensor device and preparation method thereof
CN102122935B (en) Micro-mechanical resonator having submicron clearances and manufacturing method thereof
CN104422547A (en) Resonant pressure sensor and manufacturing method therefor
CN104062462A (en) MEMS piezoresistive accelerated speed sensor and manufacturing method thereof
CN204788239U (en) DSOI strainometer
CN104089642A (en) Piezoresistive acceleration and pressure integrated sensor and method for manufacturing piezoresistive acceleration and pressure integrated sensor

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20161005